X8R/X8L Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
X8R/X8L Specification Limits
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 kHz 10ꢀ
ꢁ55ºC to +150ºC
Within specified tolerance
≤ 2.5ꢀ for ≥ 50V DC rating
≤ 3.5ꢀ for 25V DC and 16V DC rating
100,000MΩ or 1000MΩ ꢁ μF,
whichever is less
Voltage: 1.0Vrms .2V
Dissipation Factor
Charge device with rated voltage for
120 5 secs ꢃ room tempꢂhumidity
Charge device with 250ꢀ of rated voltage for
1ꢁ5 seconds, wꢂcharge and discharge current
limited to 50 mA (max)
Insulation Resistance
Dielectric Strength
No breakdown or visual defects
Note: Charge device with 150ꢀ of rated
voltage for 500V devices.
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
No defects
Deflection: 2mm
Test Time: 30 seconds
≤
12ꢀ
Resistance to
Flexure
1mm/sec
Meets Initial Values (As Above)
≥ Initial Value x 0.3
Stresses
90 mm
≥ 95ꢀ of each terminal should be covered
with fresh solder
No defects, <25ꢀ leaching of either end terminal
Dip device in eutectic solder at 230 5ºC
for 5.0 0.5 seconds
Solderability
Appearance
Capacitance
Variation
≤
7.5ꢀ
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24
hours before measuring electrical properties.
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
2
Resistance to
Solder Heat
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
Appearance
Capacitance
Variation
Step 1: ꢁ55ºC 2º
Step 2: Room Temp
30 3 minutes
≤ 3 minutes
≤
7.5ꢀ
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Thermal
Shock
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Step 3: +125ºC 2º
Step 4: Room Temp
30 3 minutes
≤ 3 minutes
Repeat for 5 cycles and measure after
24 2 hours at room temperature
Meets Initial Values (As Above)
No visual defects
Charge device with 1.5 rated voltage (≤ 10V) in
test chamber set at 150ºC 2ºC
for 1000 hours (+48, ꢁ0)
≤
12.5ꢀ
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Load Life
Remove from test chamber and stabilize
at room temperature for 24 2 hours
before measuring.
Meets Initial Values (As Above)
No visual defects
Store in a test chamber set at 85ºC 2ºCꢂ
85ꢀ 5ꢀ relative humidity for 1000 hours
(+48, ꢁ0) with rated voltage applied.
≤
12.5ꢀ
Load
Humidity
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Remove from chamber and stabilize at
room temperature and humidity for
24 2 hours before measuring.
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