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STC53K30Q38

更新时间：2025-07-09 22:42:11

品牌：SUNTSU

描述：Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO

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STC53K30Q38 概述

Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO

STC53K30Q38 数据手册

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Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO

STC53K Series

5.0mm x 3.2mm

Features

• ± ±10ppm (Frequency Stability) Available

• Clipped Sinewave

Applications

• Base Stations

• IP Networking

• (VC)TCXO

• Cellular and Cordless Phones

• Tape and Reel

Part Numbering Guide

STC 53 K 33 R 48 V E A - 19.440M

SUNTSU TCXO

FREQUENCY

MHz

COMPENSATION

BLANK : Digital

5.0mm x 3.2mm

A : Analog

PULLABILITY

BLANK : TCXO

E : ± ±2100ppm

F : ± 810ppm

CLIPPED SINEWAVE

TCXO/VCTCXO

BLANK : TCXO

V : VCTCXO

OPERATING

TEMPERATURE

RANGE

07 : 0°C - +70°C

±6 : -±0°C - +60°C

±7 : -±0°C - +70°C

27 : -20°C - +70°C

38 : -30°C - +85°C

48 : -40°C - +85°C

SUPPLY VOLTAGE

25 : 215V± 5%

FREQUENCY STABILITY

G : ± 510ppm

27 : 217V± 5%

30 : 310V± 5%

33 : 313V± 5%

N : ± 510ppm

O : ± 215ppm

P : ± 210ppm

Q : ± ±15ppm

R : ± ±10ppm

COMPLIANT

Cage Code: 4GUT4

To customize your parameters contact a Suntsu representative1

Electrical Parameters

Units

Minimum

Typical

Maximum

Remarks

Frequency Range

MHz

Frequency Tolerance at +25ºC

Freq1 Stability vs1 Op Temp1

Freq1 Stability vs1 Supply Voltage

Freq1 Stability vs1 Load

ppm

-±15

-±10

-013

-012

+±15

+±10

+013

+012

± Hour after reﬂow

See part numbering guide for options1

VDD± 5% change1

± 5% change

Freq1 Stability vs1 Aging

Operating Temperature

Storage Temperature

Supply Voltage (VDD)

Current (IDD)

ppm

°C

-±10

-40

-55

+±10

+85

+±25

31465

± Year, ± 31±ppm for ±0 Years

See part numbering guide for options1

°C

31±35

313

See part numbering guide for options1

Control Current (VC, VCTCXO)

VDD

Center Voltage : VDD*50%

Pullability (VCTCXO)

ppm

± 510

± ±210

±0

See part numbering guide for options1

Linearity (VCTCXO)

Output Load (Clipped Sinewave)

Output Logic Levels

kΩ//pF

VP-P

±0//±0

018

Symmetry (Duty Cycle)

Start-Up Time

VC Input Impedance (VCTCXO)

Phase Noise (Typical) ±0Hz Offset

Phase Noise (Typical) ±00Hz Offset

Phase Noise (Typical) ±KHz Offset

Phase Noise (Typical) ±0KHz Offset

Phase Noise (Typical) ±00KHz Offset

kΩ

±00

dBc/Hz

-85

-±±5

-±35

-±45

-±50

Suntsu Electronics, Inc.

142 TECHNOLOGY DR., SUITE 150

IRVINE, CA 92618

www.suntsu.com

Speciﬁcations are subject

to change without notice.

Call: +1-949-783-7300 | Fax: +1-949-783-7301

Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO

STC53K Series

5.0mm x 3.2mm

Outline Drawing

All dimensions are in millimeters (mm) unless otherwise noted1 Drawings are not to scale1

Test Circuit (Clipped Sinewave)

Waveform (Clipped Sinewave)

Typical Phase Noise (Measured By Agilent E5052A)

Frequency - 19.440MHz

Frequency - 40.000MHz

Suntsu Electronics, Inc.

142 TECHNOLOGY DR., SUITE 150

IRVINE, CA 92618

www.suntsu.com

Speciﬁcations are subject

to change without notice.

Call: +1-949-783-7300 | Fax: +1-949-783-7301

Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO

STC53K Series

5.0mm x 3.2mm

Jitter Performance (Measured By Agilent E5052A)

Frequency - 19.440MHz

Frequency - 40.000MHz

Tape And Reel Dimensions

All dimensions are in millimeters (mm) unless otherwise noted1 Drawings are not to scale1

3,000pcs/Reel

Reﬂow Proﬁle & Part Marking

Tp (Time At 260°C. 20-40 Sec)

260

Rup (Ramp Up, 3°C/Sec Max)

217

200

TI (Time Above 217°C.

60-150Sec)

150

Rdn (Ramp Down,

6°C/Sec Max)

Ts (Preheat Time.

60-180Sec)

T 25°C to Peak (480Sec Max)

Time (sec)

Suntsu Electronics, Inc.

142 TECHNOLOGY DR., SUITE 150

IRVINE, CA 92618

www.suntsu.com

Speciﬁcations are subject

to change without notice.

Call: +1-949-783-7300 | Fax: +1-949-783-7301

Ceramic SMT 4 Pad Clipped Sinewave (VC)TCXO

STC53K Series

5.0mm x 3.2mm

Environmental Speciﬁcations

Mechanical Speciﬁcations

Temperature Cycling

MIL-STD-883, Method ±0±0, Condition B

Mechanical Shock

MIL-STD-202, Method 2±3, Condition B

MIL-STD-883, Method 2007, Condition A

MIL-STD-883, Method ±004

Fine Leak Test

MIL-STD-883, Method ±0±4, Condition A

MIL-STD-883, Method ±0±4, Condition C

Vibration

Gross Leak Test

Moisture Resistance

Solderability

MIL-STD-883, Method 2003

J-STD-020, MSL ±

Resistance to Solvents

MIL-STD-202, Method 2±5

Moisture Sensitivity

Resistance to Soldering Heat

MIL-STD-202, Method 2±0, Condition K

Suntsu Electronics, Inc.

142 TECHNOLOGY DR., SUITE 150

IRVINE, CA 92618

www.suntsu.com

Speciﬁcations are subject

to change without notice.

Call: +1-949-783-7300 | Fax: +1-949-783-7301

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