AD53040KRP [ADI]

Ultrahigh Speed Pin Driver with Inhibit Mode; 超高速引脚驱动器,具有抑制模式
AD53040KRP
型号: AD53040KRP
厂家: ADI    ADI
描述:

Ultrahigh Speed Pin Driver with Inhibit Mode
超高速引脚驱动器,具有抑制模式

驱动器
文件: 总7页 (文件大小:118K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Ultrahigh Speed Pin Driver  
with Inhibit Mode  
a
AD53040  
FUNCTIONAL BLOCK DIAGRAM  
FEATURES  
500 MHz Driver Operation  
Driver Inhibit Function  
V
V
V
EE  
V
CC  
CC  
EE  
100 ps Edge Matching  
Guaranteed Industry Specifications  
50 Output Impedance  
39nF  
39nF  
V
H
V
V
V
DATA  
DATA  
INH  
HDCPL  
>1.5 V/ns Slew Rate  
50  
Variable Output Voltages for ECL, TTL and CMOS  
High Speed Differential Inputs for Maximum Flexibility  
Ultrasmall 20-Lead SOP Package with Built-In Heat Sink  
DRIVER  
OUT  
INH  
LDCPL  
V
L
TV  
CC  
APPLICATIONS  
Automatic Test Equipment  
Semiconductor Test Systems  
Board Test Systems  
THERM  
AD53040  
1.0A/K  
GND GND GND GND GND  
Instrumentation and Characterization Equipment  
PRODUCT DESCRIPTION  
The AD53040 transition from HI/LO or to inhibit is controlled  
through the data and inhibit inputs. The input circuitry uses  
high speed differential inputs with a common-mode range of  
±3 V. This allows for direct interface to precision differential  
ECL timing or the simplicity of stimulating the pin driver from a  
single ended TTL or CMOS logic source. The analog logic HI/LO  
inputs are equally easy to interface. Typically requiring 10 µA of  
bias current, the AD53040 can be directly coupled to the  
output of a digital-to-analog converter.  
The AD53040 is a complete high speed pin driver designed for  
use in digital or mixed-signal test systems. Combining a high  
speed monolithic process with a unique surface mount package,  
this product attains superb electrical performance while preserv-  
ing optimum packaging densities and long-term reliability in an  
ultrasmall 20-lead, SOP package with built-in heat sink.  
Featuring unity gain programmable output levels of –3 V to  
+8 V, with output swing capability of less than 100 mV to 9 V,  
the AD53040 is designed to stimulate ECL, TTL and CMOS  
logic families. The 500 MHz data rate capacity and matched  
output impedance allows for real-time stimulation of these  
digital logic families. To test I/O devices, the pin driver can  
be switched into a high impedance state (Inhibit Mode), electri-  
cally removing the driver from the path. The pin driver leakage  
current inhibit is typically 100 nA and output charge transfer  
entering inhibit is typically less than 20 pC.  
The AD53040 is available in a 20-lead, SOP package with a  
built-in heat sink and is specified to operate over the ambient  
commercial temperature range of –25°C to +85°C.  
REV. B  
Information furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assumed by Analog Devices for its  
use, nor for any infringements of patents or other rights of third parties  
which may result from its use. No license is granted by implication or  
otherwise under any patent or patent rights of Analog Devices.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781/329-4700  
Fax: 781/326-8703  
World Wide Web Site: http://www.analog.com  
© Analog Devices, Inc., 1999  
(All specifications are at TJ = +85؇C ؎ 5؇C, +VS = +12 V ؎ 3%, –VS = –7 V ؎  
3% unless otherwise noted. All temperature coefficients are measured at TJ = +75؇C–95؇C). (A 39 nF capacitor must be connected between  
AD53040–SPECIFICATIONS  
VCC and VHDCPL and between VEE and VLDCPL.)  
Parameter  
Min  
Typ  
Max Units  
Test Conditions  
DIFFERENTIAL INPUT CHARACTERISTICS  
Input Swing (Data to DATA, INH to INH)  
Max (DATA, DATA) to Min (INH, INH)  
Max (INH, INH) to Min (Data, DATA)  
Bias Current  
ECL  
2
2
Volts  
Volts  
µA  
±10  
VIN = –2 V, 0.0 V  
REFERENCE INPUTS  
Bias Currents  
–50  
–2  
+50  
+8  
µA  
VL, VH = 5 V  
OUTPUT CHARACTERISTICS  
Logic High Range  
Volts  
DATA = H, VH = –2 V to +8 V  
V
V
L = –3 V (VH = –2 V to +6 V)  
L = –1 V (VH = +6 V to +8 V)  
Logic Low Range  
Amplitude (VH and VL)  
–3  
0.1  
+5  
9
Volts  
Volts  
DATA = L, VL = –3 V to +5 V, VH = +6 V  
VL = –0.05 V, VH = +0.05 V and  
V
L = –2 V, VH = +7 V  
Absolute Accuracy  
V
V
H Offset  
H Gain + Linearity Error  
–100  
–100  
+100 mV  
% of VH + mV  
+100 mV  
% of VL + mV  
DATA = H, VH = –2 V to +8 V, VL = –3 V  
DATA = H, VH = –2 V to +8 V, VL = –3 V  
DATA = L, VL = –3 V to +5 V, VH = +6 V  
DATA = L, VL = –3 V to +5 V, VH = +6 V  
VL, VH = 0 V, +5 V and –3 V, 0 V  
DATA = H, VH = +3 V, VL = 0 V,  
IOUT = 30 mA  
±0.3 ±5  
VL Offset  
L Gain + Linearity Error  
V
±0.3 ±5  
0.5  
47  
Offset TC, VH or VL  
Output Resistance  
mV/°C  
45  
49  
Output Leakage  
Dynamic Current Limit  
Static Current Limit  
–1.0  
+1.0 µA  
mA  
VOUT = –3 V to +8 V  
150  
±65  
CBYP = 39 nF, VH = +7 V, VL = –2 V  
Output to –3 V, VH = +8 V, VL = –1 V,  
DATA = H and Output to +8 V, VH = +6 V,  
mA  
V
L = –3 V, DATA = L  
PSRR, Drive Mode  
35  
dB  
VS = VS ± 3%  
DYNAMIC PERFORMANCE, DRIVE  
(VH and VL)  
Propagation Delay Time  
1.5  
2
ns  
Measured at 50%, VH = +400 mV,  
V
L = –400 mV  
Measured at 50%, VH = +400 mV,  
L = –400 mV  
Measured at 50%, VH = +400 mV,  
L = –400 mV  
Propagation Delay TC  
ps/°C  
V
Delay Matching, Edge to Edge  
100  
ps  
V
Rise and Fall Time  
1 V Swing  
3 V Swing  
0.8  
1.7  
2.4  
ns  
ns  
ns  
Measured 20%–80%, VL = 0 V, VH = 1 V  
Measured 10%–90%, VL = 0 V, VH = 3 V  
Measured 10%–90%, VL = 0 V, VH = 5 V  
5 V Swing  
Rise and Fall Time TC  
1 V Swing  
3 V Swing  
±1  
±2  
±3  
ps/°C  
ps/°C  
ps/°C  
Measured 20%–80%, VL = 0 V, VH = 1 V  
Measured 10%–90%, VL = 0 V, VH = 3 V  
Measured 10%–90%, VL = 0 V, VH = 5 V  
5 V Swing  
Overshoot, Undershoot and Preshoot  
±(1% +50 mV)  
% of Step + mV a. VL, VH = 0.0 V, 1.0 V  
b. VL, VH = 0.0 V, 3.0 V  
c. VL, VH = 0.0 V, 5.0 V  
Settling Time  
to 15 mV  
to 4 mV  
Delay Change vs. Pulsewidth  
40  
8
50  
ns  
µs  
ps  
VL = 0 V, VH = 0.5 V  
L = 0 V, VH = 0.5 V  
VL = 0 V, VH = 2 V,  
V
Pulsewidth = 2.5 ns/7.5 ns, 30 ns/100 ns  
REV. B  
–2–  
AD53040  
Parameter  
Min  
Typ  
Max  
Units  
Test Conditions  
DYNAMIC PERFORMANCE, DRIVE  
(VH and VL) (Continued)  
Minimum Pulsewidth  
3 V Swing  
1.7  
2.6  
500  
ns  
4.0 ns Input, 10%/90% Output,  
L = 0 V, VH = 3 V  
6.0 ns Input, 10%/90% Output,  
VL = 0 V, VH = 5 V  
V
5 V Swing  
ns  
Toggle Rate  
MHz  
VL = –1.8 V, VH = –0.8 V,  
VOUT > 600 mV p-p  
DYNAMIC PERFORMANCE, INHIBIT  
Delay Time, Active to Inhibit  
2
2
5
5
ns  
ns  
Measured at 50%, VH = +2 V,  
V
L = –2 V  
Delay Time, Inhibit to Active  
Measured at 50%, VH = +2 V,  
V
V
L = –2 V  
H = 0 V, VL = 0 V  
I/O Spike  
Output Capacitance  
<200  
5
mV, p-p  
pF  
Driver Inhibited  
POWER SUPPLIES  
Total Supply Range  
19  
V
Positive Supply  
Negative Supply  
+12  
–7  
V
V
Positive Supply Current  
Negative Supply Current  
Total Power Dissipation  
Temperature Sensor Gain Factor  
75  
75  
1.43  
mA  
mA  
W
1.15  
1.0  
µA/K  
RLOAD = 10 K, VSOURCE = +12 V  
NOTES  
Connecting or shorting the decoupling capacitors to ground will result in the destruction of the device.  
Specifications subject to change without notice.  
ABSOLUTE MAXIMUM RATINGS1  
NOTES  
1Stresses above those listed under Absolute Maximum Ratings may cause perma-  
nent damage to the device. This is a stress rating only; functional operation of the  
device at these or any other conditions above those indicated in the operational  
sections of this specification is not implied. Absolute maximum limits apply  
individually, not in combination. Exposure to absolute maximum rating conditions  
for extended periods may affect device reliability.  
Power Supply Voltage  
+VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V  
–VS to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –8 V  
+VS to –VS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +20 V  
Inputs  
2Output short circuit protection is guaranteed as long as proper heat sinking is  
employed to ensure compliance with the operating temperature limits.  
3To ensure lead coplanarity (±0.002 inches) and solderability, handling with bare  
hands should be avoided and the device should be stored in environments at 24°C  
± 5°C (75°F ± 10°F) with relative humidity not to exceed 65%.  
DATA, DATA, INH, INH . . . . . . . . . . . . . . . . +5 V, –3 V  
DATA to DATA, INH to INH . . . . . . . . . . . . . . . . . . ±3 V  
VH, VL to GND . . . . . . . . . . . . . . . . . . . . . . . . . +9 V, –4 V  
VH to VL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +11 V, 0 V  
Outputs  
V
OUT Short Circuit Duration . . . . . . . . . . . . . . . .Indefinite2  
ORDERING GUIDE  
Shipment Method,  
VOUT Range in Inhibit Mode  
VHDCPL . . . . . Do Not Connect Except for Capacitor to VCC  
VLDCPL . . . . . Do Not Connect Except for Capacitor to VEE  
THERM . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +13 V, 0 V  
Environmental  
Operating Temperature (Junction) . . . . . . . . . . . . . .+175°C  
Storage Temperature . . . . . . . . . . . . . . . . –65°C to +150°C  
Lead Temperature (Soldering, 10 sec)3 . . . . . . . . . .+260°C  
Package  
Quantity Per  
Package  
Model  
Description  
Shipping Container Option  
AD53040KRP 20-Lead Power SOIC Tube, 38 Pieces  
RP-20  
CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the AD53040 features proprietary ESD protection circuitry, permanent damage may  
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD  
precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
REV. B  
–3–  
AD53040  
PIN CONFIGURATION  
PIN FUNCTION DESCRIPTIONS  
Pin  
Name  
Pin  
1
2
V
V
20 THERM  
CC  
Number Pin Functional Description  
19 TV  
CC  
CC  
VCC  
1, 2  
Positive Power Supply. Both pins  
should be connected to minimize in-  
ductance and allow maximum speed of  
operation. VCC should be decoupled to  
GND with a low inductance 0.1 µF  
capacitor.  
Negative Power Supply. Both pins  
should be connected to keep the induc-  
tance down and allow maximum speed  
of operation. VEE should be decoupled  
to GND with a low inductance 0.1 µF  
capacitor.  
3
18  
V
V
V
H
HDCPL  
4
17 GND  
GND  
AD53040  
5
16  
15  
14  
13  
12  
11  
GND  
V
TOP VIEW  
OUT  
(Not to Scale)  
6
GND  
V
L
7
GND  
DATA  
DATA  
INH  
COPPER  
SLUG UP  
LDCPL  
8
V
EE  
VEE  
8, 9  
9
V
EE  
10  
INH  
Table I. Pin Driver Truth Table  
GND  
4, 6, 14,  
16, 17  
Output  
State  
Device Ground. These pins should be  
connected to the circuit board’s ground  
plane at the pins.  
Analog Input that sets the voltage level  
of a Logic 0 of the driver. Determines  
the driver output for DATA > DATA.  
Analog input that sets the voltage level  
of a Logic 1 of the driver. Determines  
the driver output for DATA > DATA.  
The Driver Output. The nominal out-  
put impedance is 50 .  
Internal supply decoupling for the  
output stage. This pin is connected  
to VCC through a 39 nF minimum  
capacitors.  
DATA  
DATA  
INH  
INH  
0
1
0
1
1
0
1
0
0
0
1
1
1
1
0
0
VL  
VH  
Hi-Z  
Hi-Z  
VL  
15  
18  
VH  
Table II. Package Thermal Characteristics  
Air Flow, FM  
JC, ؇C/W  
JA, ؇C/W  
VOUT  
5
3
0
50  
400  
4
4
4
50  
49  
34  
VHDCPL  
VLDCPL  
7
Internal supply decoupling for the  
output stage. This pin is connected  
to VEE through a 39 nF minimum  
capacitors.  
INH, INH 10, 11  
ECL compatible input that control the  
high impedance state of the driver.  
When INH > INH, the driver goes into  
a high impedance state.  
DATA,  
DATA  
13, 12  
ECL compatible inputs that determines  
the high and low state of the driver.  
Driver output is high for DATA >  
DATA.  
TVCC  
19  
20  
Temperature Sensor Start-Up Pin. This  
pin should be connected to VCC  
.
THERM  
Temperature Sensor Output Pin. A  
resistor (10K) should be connected  
between THERM and VCC. The ap-  
proximate die temperature can be de-  
termined by measuring the current  
through the resistor. The typical scale  
factor is 1 µA/K.  
REV. B  
–4–  
AD53040  
APPLICATION INFORMATION  
Several points about the current-limit circuitry should be noted.  
First, the limiting currents are not tightly controlled, as they are  
functions of both absolute transistor VBES and junction tem-  
perature; higher dc output current is available at lower junction  
temperatures. Second, it is essential to connect the VHDCPL  
capacitor to the positive supply (and the VLDCPL capacitor to  
the negative supply)—failure to do so causes considerable ther-  
mal stress in the current-limiting resistor(s) during normal sup-  
ply sequencing and may ultimately cause them to fail, rendering  
the part nonfunctional. Finally, the AD53040 may appear to  
function normally for small output steps (less than 3 V or so) if  
one or both of these capacitors is absent, but it will exhibit  
excessive rise or fall times for steps of larger amplitude.  
Power Supply Distribution, Bypassing and Sequencing  
The AD53040 draws substantial transient currents from its  
power supplies when switching between states and careful design  
of the power distribution and bypassing is key to obtaining speci-  
fied performance. Supplies should be distributed using broad,  
low inductance traces or (preferably) planes in a multilayered  
board with a dedicated ground-plane layer. All of the device’s  
power supply pins should be used to minimize the internal in-  
ductance presented by the part’s bond wires. Each supply must  
be bypassed to ground with at least one 0.1 µF capacitor; chip-  
style capacitors are preferable as they minimize inductance. One  
or more 10 µF (or greater) Tantalum capacitors per board are  
also advisable to provide additional local energy storage.  
The AD53040 does not require special power-supply sequencing.  
However, good design practice dictates that digital and analog  
control signals not be applied to the part before the supplies are  
stable. Violating this guideline will not normally destroy the  
part, but the active inputs can draw considerable current until  
the main supplies are applied.  
The AD53040’s current-limit circuitry also requires external  
bypass capacitors. Figure 1 shows a simplified schematic of the  
positive current-limit circuit. Excessive collector current in out-  
put transistor Q49 creates a voltage drop across the 10 resis-  
tor, which turns on PNP transistor Q48. Q48 diverts the rising-  
edge slew current, shutting down the current mirror and remov-  
ing the output stage’s base drive. The VHDCPL pin should be  
bypassed to the positive supply with a 0.039 µF capacitor, while  
the VLDCPL pin (not shown) requires a similar capacitor to the  
negative supply- these capacitors ensure that the AD53040  
doesn’t current limit during normal output transitions up the its  
full 9 V rated step size. Both capacitors must have minimum-  
length connections to the AD53040. Here again, chip capacitors  
are ideal.  
Digital Input Range Restrictions  
Total range amongst all digital signals (DATA, DATA, INH,  
and INH) has to be less than or equal to 2 V to meet specified  
timing. The device will function above 2 V with reduced perfor-  
mance up to the absolute maximum limit. This performance  
degradation might not be noticed in all modes of operation. Of  
all the six possible transitions (VH v VL, VL v VH, VH v INH,  
INH v VH, VL v INH and INH v VL), there may be only one  
that would show a degradation, usually in delay time. Taken to  
the extreme, the driver may fail to achieve a proper output volt-  
age, output impedance or may fail to fully inhibit.  
VPOS  
10⍀؎10%  
An example of a scenario that would not work for the AD53040  
is if the part is driven using 5 V single-ended CMOS. One pin of  
each differential input would be tied to a +2.5 V reference level  
and the logic voltages would be applied to the other. This would  
meet the Absolute Maximum Rating of ±3 V because the max  
differential is ±2.5 V. It is however possible, for example for  
0.0 V to be applied to the INH input and +5 V to be applied to  
the DATA input. This 5 V difference far exceeds the 2.0 V  
limitation given above. Even using 3 V CMOS or TTL the  
difference between logic high and logic low is greater than or  
equal to 3 V which will not properly work. The only solution is  
to use resistive dividers or equivalent to reduce the voltage levels.  
V
Q48  
HDCPL  
RISING-EDGE SLEW  
CONTROL CURRENT  
LEVEL-SHIFTED  
LOGIC DRIVE  
V
H
VNEG  
Q49  
Q50  
OUT  
5.12V  
550mV  
/DIV  
Figure 1. Simplified Schematic of the AD53040 Output  
Stage and Positive Current Limit Circuitry  
–380mV  
66.25ns  
500ps/DIV  
71.25ns  
Figure 2. 5 V Output Swing  
REV. B  
–5–  
AD53040  
NOTE:  
1. 50TERMINATION TO BE AS CLOSE TO RECEIVER  
AS POSSIBLE. (END OF TRACE MARKED BY *). THROUGH  
SMA CONNECTS BETWEEN MC10EL16 OUTPUTS AND DUT.  
2. NO VIAS ALLOWED ON VOUT LINE.  
3. SMA ON V  
IMPEDANCE MATCH.  
TO BE MOUNTED ON ITS SIDE FOR BEST  
OUT  
4. ONE DIMENSION OF BOARD TO BE 4-1/2 INCHES.  
5. DUT PACKAGE IS TO BE CENTERED ON BOARD.  
6. ALL RESISTORS AND NONELECTROLYTIC CAPS ARE  
0805-SIZE SURFACE MOUNT.  
7. SEE DATA SHEET FOR HIDDEN POWER AND GROUND PINS  
ON LOGIC GATES.  
8. ALL 100nF BYPASS CAPACITORS TO BE LOCATED CLOSE  
TO PACKAGE.  
V
LOW  
9. PCB IS TO BE 4-LAYER WITH POWER GND ( ) AND –2V AS  
INNER PLANES.  
V
HIGH  
50⍀  
50⍀  
DATA  
J1  
SMB  
SMB  
C1  
0.1F  
+V  
S
C2  
0.1F  
U1  
MC10EL16  
J4  
1
8
50⍀  
R6  
2
3
7
C19  
0.1F  
6
50⍀  
J8  
5
SIDESMB  
–5.2V  
SMB  
R4  
R3  
J3  
C12  
0.01F  
C21  
0.1F  
TEST_LD  
5050⍀  
R7  
50⍀  
C18  
5pF  
THERM  
TV  
CC  
C16  
0.039F  
HQG1  
+V  
–2V  
C14  
0.1F  
S
TH  
50⍀  
IL+  
VH  
VL  
J7  
G2H  
G2L  
INH  
J2  
SMB  
SMB  
U2  
MC10EL16  
SIDESMB  
V
OUT  
J5  
U 3  
50⍀  
1
8
V
AD53040  
OUT  
50⍀  
2
3
7
DATA  
R5  
50⍀  
6
50⍀  
IL–  
5
–5.2V  
SMB  
INH  
–V  
S
R1  
5050⍀  
R2  
J6  
C13  
0.01F  
JP1  
1
C22  
0.1F  
C17  
0.039F  
GND  
TP  
–2V  
JP2  
C15  
0.1F  
PWR  
GND  
+V  
S
1
C3  
0.1F  
TP  
JP3  
1
–V  
S
P1  
TP  
–V  
1
S
V
LOW  
9
2
10  
–2V  
V
–5.2V  
V
EE  
HIGH  
3
11  
4
12  
5
13  
6
–V  
V
S
CC  
THERM  
–5.2V  
C9  
0.1F  
C10  
0.1F  
C11  
0.1F  
GND  
+V  
S
+
C5  
1F  
C4  
1F  
C7  
1F  
C6  
1F  
C8  
0.1F  
14  
7
15  
8
DB15  
Figure 3. Evaluation Board Schematic  
REV. B  
–6–  
AD53040  
OUTLINE DIMENSIONS  
Dimensions shown in inches and (mm).  
20-Lead Thermally Enhanced Small Outline Package (PSOP)  
(RP-20)  
0.5118 (13.00)  
0.4961 (12.60)  
20  
11  
0.1890 (4.80) 0.4193 (10.65)  
0.1791 (4.55) 0.3937 (10.00)  
HEAT  
SINK  
0.2992 (7.60)  
0.2914 (7.40)  
1
10  
PIN 1  
0.3340 (8.61)  
0.3287 (8.35)  
0.1043 (2.65)  
0.0926 (2.35)  
8°  
0°  
0.0500  
(1.27)  
BSC  
0.0201 (0.51)  
0.0118 (0.30)  
0.0295 (0.75)  
0.0098 (0.25)  
SEATING  
PLANE  
0.0500 (1.27)  
0.0057 (0.40)  
x 45°  
0.0130 (0.33)  
0.0040 (0.10)  
STANDOFF  
REV. B  
–7–  

相关型号:

AD53040KRPZ

IC PIN DRIVER W/INHIBIT 20-PWRSO
ADI

AD53041

High Speed Active Load with Inhibit Mode
ADI

AD53041G

AD53041G: High Speed Active Load with Inhibit Mode Datasheet (Rev.A. 11/98)
ETC

AD53041KRP

High Speed Active Load with Inhibit Mode
ADI

AD53042

High Speed Window Comparator
ADI

AD53042KRP

High Speed Window Comparator
ADI

AD5304ACPZ-REEL7

2.5 V to 5.5 V, 500 μA, Quad Voltage Output 8-/10-/12-Bit DACs in 10-Lead Packages
ADI

AD5304ACPZ-WP

IC SERIAL INPUT LOADING, 6 us SETTLING TIME, 8-BIT DAC, DSO10, LEAD FREE, 3 X 3 MM, LFCSP-10, Digital to Analog Converter
ADI

AD5304ARM

2.5 V to 5.5 V, 500 μA, Quad Voltage Output 8-/10-/12-Bit DACs in 10-Lead Packages
ADI

AD5304ARM-REEL7

2.5 V to 5.5 V, 500 μA, Quad Voltage Output 8-/10-/12-Bit DACs in 10-Lead Packages
ADI

AD5304ARMZ

2.5 V to 5.5 V, 500 μA, Quad Voltage Output 8-/10-/12-Bit DACs in 10-Lead Packages
ADI

AD5304ARMZ-REEL7

2.5 V to 5.5 V, 500 μA, Quad Voltage Output 8-/10-/12-Bit DACs in 10-Lead Packages
ADI