ADN2890ACP-RL7 [ADI]

3.3 V 2.7 Gb/s Limiting Amplifier; 3.3 V 2.7 Gb / s的限幅放大器
ADN2890ACP-RL7
型号: ADN2890ACP-RL7
厂家: ADI    ADI
描述:

3.3 V 2.7 Gb/s Limiting Amplifier
3.3 V 2.7 Gb / s的限幅放大器

放大器
文件: 总12页 (文件大小:263K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
3.3 V 2.7 Gb/s  
Limiting Amplifier  
ADN2890  
GENERAL DESCRIPTION  
FEATURES  
SFP reference design available  
Input sensitivity: 3 mV p-p  
80 ps rise/fall times  
CML outputs: 700 mV p-p differential  
Programmable LOS detector: 2 mV to 13 mV  
Rx signal strength indicator (RSSI):  
SFF-8472 compliant average power measurement  
Single-supply operation: 3.3 V  
The ADN2890 is a high gain, limiting amplifier optimized for  
use in SONET, Gigabit Ethernet (GbE), and Fibre Channel  
optical receivers that accept input levels of up to 2.0 V p-p  
differential and have 3 mV p-p differential input sensitivity. The  
ADN2890 provides the receiver functions of quantization and  
loss of signal (LOS) detection. The ADN2890 can easily operate  
at up to 3.2 Gb/s to support LX4 transceivers.  
The limiting amplifier also measures average received power  
based on a direct measurement of the photodiode current with  
better than 1 dB of accuracy over the entire input range of the  
receiver. This eliminates the need for external average Rx power  
detection circuitry in SFF-8472 compliant optical transceivers.  
Low power dissipation: 130 mW  
Available in space-saving 3 mm × 3 mm 16-lead LFCSP  
APPLICATIONS  
SFP/SFF/GBIC optical transceivers  
OC-3/12/48, GbE, Fibre Channel receivers  
10GBASE-LX4 transceivers  
WDM transponders  
The ADN2890 limiting amplifier operates from a single 3.3 V  
supply, has low power dissipation, and is available in a space-  
saving 3 mm × 3 mm 16-lead lead frame chip scale package  
(LFCSP).  
FUNCTIONAL BLOCK DIAGRAM  
AVCC  
AVEE  
DRVCC DRVEE  
DRVCC  
ADN2890  
50  
50Ω  
C
R
F
PIN  
NIN  
OUTP  
OUTN  
+V  
F
ADN2880  
50Ω  
50Ω  
3kΩ  
V
REF  
10k  
LOS  
PD_VCC  
RSSI/LOS  
DETECTOR  
ADuC7020  
RSSI_OUT  
PD_CATHODE  
CAZ1  
CAZ2  
THRADJ SQUELCH  
0.01µF  
Figure 1.  
Rev. 0  
Information furnished by Analog Devices is believed to be accurate and reliable.  
However, no responsibility is assumed by Analog Devices for its use, nor for any  
infringements of patents or other rights of third parties that may result from its use.  
Specifications subject to change without notice. No license is granted by implication  
or otherwise under any patent or patent rights of Analog Devices. Trademarks and  
registered trademarks are the property of their respective owners.  
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.  
Tel: 781.329.4700  
Fax: 781.326.8703  
www.analog.com  
© 2004 Analog Devices, Inc. All rights reserved.  
ADN2890  
TABLE OF CONTENTS  
Specifications..................................................................................... 3  
Loss of Signal (LOS) Detector .....................................................8  
Received Signal Strength Indicator (RSSI).................................8  
Squelch Mode ................................................................................8  
Applications Information.................................................................9  
PCB Design Guidelines ................................................................9  
Outline Dimensions....................................................................... 11  
Ordering Guide .......................................................................... 11  
Absolute Maximum Ratings............................................................ 5  
Thermal Resistance ...................................................................... 5  
ESD Caution.................................................................................. 5  
Pin Configuration and Function Descriptions............................. 6  
Typical Performance Characteristics ............................................. 7  
Theory of Operation ........................................................................ 8  
LIMAMP ....................................................................................... 8  
REVISION HISTORY  
Revision 0: Initial Version  
Rev. 0 | Page 2 of 12  
ADN2890  
SPECIFICATIONS  
VCC = VMIN to VMAX, VEE = 0 V, TA = TMIN to TMAX, unless otherwise noted.  
Table 1.  
Parameter  
Min  
Typ  
Max  
Unit  
Test Conditions/Comments  
QUANTIZER DC CHARACTERISTICS  
Input Voltage Range  
Input Common Mode  
Peak-to-Peak Differential Input Range  
Input Sensitivity  
1.8  
2.1  
2.8  
2.7  
2.0  
V p-p  
V
V p-p  
mV p-p  
µV  
@ PIN or NIN, dc-coupled  
DC-coupled  
PIN − NIN, ac-coupled  
PIN − NIN, BER 1 × 10−10  
4
3
Input Offset Voltage  
Input RMS Noise  
Input Resistance  
100  
235  
50  
µV rms  
Single-ended  
Input Capacitance  
QUANTIZER AC CHARACTERISTICS  
Input Data Rate  
Small Signal Gain  
S11  
S22  
Random Jitter  
Deterministic Jitter  
Low Frequency Cutoff  
0.65  
pF  
155  
2700  
Mb/s  
dB  
dB  
57  
Differential  
−10  
−10  
2.4  
13.7  
30  
Differential, f < 2.7 GHz  
Differential, f < 2.7 GHz  
Input > 10 mV p-p, OC-48, PRBS 223 − 1  
Input > 10 mV p-p, OC-48, PRBS 223 − 1  
CAZ = Open  
dB  
5
19  
ps rms  
ps p-p  
kHz  
kHz  
dB  
1.0  
45  
CAZ = 0.0 1 µF  
100 kHz < f < 10 MHz  
Power Supply Rejection  
LOSS OF SIGNAL DETECTOR (LOS)  
LOS Assert Level  
0.5  
7.0  
2.5  
12.0  
3.0  
4.0  
16.0  
6.0  
mV p-p  
mV p-p  
dB  
RTHRADJ = 100 kΩ  
RTHRADJ = 0 Ω  
Hysteresis  
OC-3, PRBS 223 − 1, RTHRADJ = 0 Ω  
OC-3, PRBS 223 − 1, RTHRADJ = 10 kΩ  
OC-48, PRBS 223 − 1, RTHRADJ = 0 Ω  
OC-48, PRBS 223 − 1, RTHRADJ = 100 kΩ  
DC-coupled  
2.0  
2.5  
3.0  
4.5  
4.5  
600  
100  
dB  
dB  
dB  
ns  
7.5  
LOS Assert Time  
LOS De-Assert Time  
RSSI  
ns  
DC-coupled  
Input Current Range  
RSSI Output Accuracy  
5
1000  
15%  
10%  
µA  
IIN 20 µA  
IIN > 20 µA  
IRSSI/IPD  
Gain  
Offset  
Compliance Voltage  
POWER SUPPLIES  
VCC  
1.0  
50  
mA/mA  
nA  
V
VCC − 1.05  
3.0  
VCC − 0.3  
@ PD_CATHODE  
3.3  
39  
3.6  
54  
V
mA  
°C  
ICC  
OPERATING TEMPERATURE RANGE  
CML OUTPUT CHARACTERISTICS  
Output Impedance  
Output Voltage Swing  
Output Rise and Fall Time  
LOGIC INPUTS (SQUELCH)  
VIH, Input High Voltage  
VIL, Input Low Voltage  
Input Current  
−40  
+25  
+85  
TMIN to TMAX  
50  
700  
80  
V p-p  
ps  
Single-ended  
Differential  
20% to 80%  
650  
800  
100  
2.0  
V
V
nA  
nA  
0.8  
−100  
IINH, VIN = 2.4 V  
IINL, VIN = 0.4 V  
100  
Rev. 0 | Page 3 of 12  
ADN2890  
Parameter  
Min  
Typ  
Max  
Unit  
Test Conditions/Comments  
LOGIC OUTPUTS (LOS)  
VOH, Output High Voltage  
2.4  
V
V
Open drain output, 4.7 kΩ − 10 kΩ  
pull-up resistor to VCC  
Open drain output, 4.7 kΩ − 10 kΩ  
pull-up resistor to VCC  
VOL, Output Low Voltage  
0.4  
Rev. 0 | Page 4 of 12  
ADN2890  
ABSOLUTE MAXIMUM RATINGS  
Table 2.  
Stresses above those listed under Absolute Maximum Ratings  
may cause permanent damage to the device. This is a stress  
rating only and functional operation of the device at these or  
any other conditions above those indicated in the operational  
section of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect  
device reliability.  
Parameter  
Rating  
Supply Voltage  
4.2 V  
Minimum Input Voltage (All Inputs)  
Maximum Input Voltage (All Inputs)  
Storage Temperature  
Operating Temperature Range  
Lead Temperature Range (Soldering 10 s)  
Junction Temperature  
VEE − 0.4 V  
VCC + 0.4 V  
−65°C to +155°C  
−40°C to +85°C  
300°C  
THERMAL RESISTANCE  
125°C  
θJA is specified for 4-layer PCB with exposed paddle soldered  
to GND.  
Table 3.  
Package Type  
Unit  
θJA  
16-lead 3 mm × 3 mm LFCSP  
28  
°C/W  
ESD CAUTION  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on  
the human body and test equipment and can discharge without detection. Although this product features  
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy  
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance  
degradation or loss of functionality.  
Rev. 0 | Page 5 of 12  
ADN2890  
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS  
16 15 14 13  
AVCC  
PIN  
1
2
3
4
12 DRVCC  
ADN2890 11 OUTP  
TOP VIEW  
NIN  
10 OUTN  
(Not To Scale)  
AVEE  
9 DRVEE  
5
6
7
8
Figure 2. Pin Configuration  
Note: There is an exposed pad on the bottom of the package that must be connected to the GND plane with filled vias.  
Table 4. Pin Function Descriptions  
Pin No.  
Mnemonic  
I/O  
Description  
1
2
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
16  
AVCC  
PIN  
NIN  
AVEE  
THRADJ  
CAZ1  
CAZ2  
LOS  
DRVEE  
OUTN  
Power  
Input  
Input  
Power  
Input  
Analog Power  
Differential Data Input  
Differential Data Input  
Analog Ground  
LOS Threshold Adjust Resistor  
Offset Correction Loop Capacitor  
Offset Correction Loop Capacitor  
LOS Detector Output  
Output Buffer Ground  
Differential Data Output  
Differential Data Output  
Output Buffer Power  
Output  
Power  
Output  
Output  
Power  
Input  
Output  
Power  
Output  
Power  
OUTP  
DRVCC  
SQUELCH  
RSSI_OUT  
PD_VCC  
PD_CATHODE  
Pad  
Disable Outputs  
Average Current Output  
Power Input for RSSI Measurement  
Photodiode Bias Voltage  
Connect to Ground  
Exposed Pad  
Rev. 0 | Page 6 of 12  
ADN2890  
TYPICAL PERFORMANCE CHARACTERISTICS  
0.96  
0.88  
0.80  
0.72  
0.64  
0.56  
0.48  
0.40  
0.32  
0.24  
0.16  
0.08  
0
VERTICAL SCALE: 100mV/DIV  
0
0.1  
0.2  
0.3  
0.4  
0.5  
0.6  
0.7  
0.8  
0.9  
1.0  
RSSI_IN (mA)  
Figure 3. RSSI Output vs. Average PIN Photodiode Current  
Figure 6. Eye Diagram at 3.2 Gb/s  
0.014  
VERTICAL SCALE: 100mV/DIV  
0.012  
0.010  
0.008  
0.006  
0.004  
0.002  
0
10  
100  
1k  
()  
10k  
100k  
R
TH  
Figure 7. Eye Diagram at 2.488 Gb/s  
Figure 4. LOS Trip Point vs. Threshold Adjust Resistor  
70  
60  
50  
40  
30  
20  
10  
0
100k  
1M  
10M  
SUPPLY-NOISE FREQUENCY (Hz)  
Figure 5. Typical PSRR vs. Supply-Noise Frequency  
Rev. 0 | Page 7 of 12  
ADN2890  
THEORY OF OPERATION  
LIMAMP  
RECEIVED SIGNAL STRENGTH INDICATOR (RSSI)  
Input Buffer  
The ADN2890 has an on-chip RSSI circuit that automatically  
detects the average received power based on a direct measure-  
ment of the PIN photodiodes current. The photodiode bias is  
supplied by the ADN2890, which allows a very accurate, on-  
chip, average power measurement based on the amount of  
current supplied to the photodiode. The output of the RSSI is a  
current that is directly proportional to the average amount of  
PIN photodiode current. Placing a resistor between the  
RSSI_OUT pin and GND converts the current to a GND  
referenced voltage. This function eliminates the need for  
external RSSI circuitry in SFF-8472 compliant optical receivers.  
The limiting amplifier has differential inputs (PIN/NIN), with  
an internal 50 Ω termination. The ROSA (receive optical sub-  
assembly) is typically ac-coupled to the ADN2890 inputs,  
although dc coupling is possible.  
An internal offset correction loop requires that a capacitor be  
connected between the CAZ1 and CAZ2 pins. A 0.01 µF  
capacitor provides a low frequency cutoff of 2 kHz.  
CML Output Buffer  
The ADN2890 provides CML outputs, OUTP/OUTN. The  
outputs are internally terminated with 50 Ω to VCC.  
SQUELCH MODE  
The outputs can be kept at a static voltage by driving the  
SQUELCH pin to a logic high. The SQUELCH pin can be  
driven directly by the LOS pin, which automatically disables the  
LIMAMP outputs in situations with no data input.  
Driving the SQUELCH input to a logic high disables the  
limiting amplifier outputs. The SQUELCH input can be  
connected to the LOS output to keep the limiting amplifier  
outputs at a static voltage level anytime the input level to the  
limiting amplifier drops below the programmed LOS threshold.  
LOSS OF SIGNAL (LOS) DETECTOR  
The receiver front-end LOS detector circuit indicates when the  
input signal level has fallen below the user-adjustable threshold.  
The threshold is set by a resistor connected between the  
THRADJ pin and VEE. The ADN2890 LOS circuit has a trip  
point down to <3.0 mV with >3 dB electrical hysteresis to  
prevent chatter at the LOS output. The LOS output is an open-  
collector output that must be pulled up externally with a 4.7 kΩ  
to 10 kΩ resistor.  
Rev. 0 | Page 8 of 12  
ADN2890  
APPLICATIONS INFORMATION  
PCB DESIGN GUIDELINES  
greatly enhances the reliability of the connectivity of the  
exposed pad to the GND plane during reflow.  
Proper RF PCB design techniques must be used for optimal  
performance.  
Use of a 10 µF electrolytic capacitor between VCC and VEE is  
recommended at the location where the 3.3 V supply enters the  
PCB. When using 0.1 µF and 1 nF ceramic chip capacitors, they  
should be placed between the IC power supply VCC and VEE,  
as close as possible to the ADN2890 VCC pins.  
Power Supply Connections and Ground Planes  
Use of one low impedance ground plane is recommended. The  
VEE pins should be soldered directly to the ground plane to  
reduce series inductance. If the ground plane is an internal  
plane and connections to the ground plane are made through  
vias, multiple vias can be used in parallel to reduce the series  
inductance, especially on Pin 9, which is the ground return for  
the output buffers. The exposed pad should be connected to the  
GND plane using filled vias so that solder does not leak through  
the vias during reflow. Using filled vias under the package  
If connections to the supply and ground are made through vias,  
the use of multiple vias in parallel helps to reduce series  
inductance, especially on Pin 12, which supplies power to the  
high speed OUTP/OUTN output buffers. Refer to the schematic  
in Figure 8 for recommended connections.  
VCC  
C9  
VCC  
RSSI MEASUREMENT  
TO ADC  
R1  
C10  
0.1µF  
200Ω  
VCC  
VCC  
C8  
C5  
C6  
16  
15  
14  
13  
C7  
AVCC  
PIN  
DRVCC  
1
2
3
4
12  
11  
10  
9
C1  
C2  
OUTP C3  
OUTN C4  
DRVEE  
CONNECT  
EXPOSED  
PAD TO  
GND  
TO HOST  
BOARD  
NIN  
ADN2880  
AVEE  
5
6
7
8
C1–C4, C11: 0.01µF X5R/X7R DIELECTRIC, 0201 CASE  
C5, C7, C9, C10, C12: 0.1µF X5R/X7R DIELECTRIC, 0402 CASE  
C6, C8: 1nF X5R/X7R DIELECTRIC, 0201 CASE  
C11  
R3  
4.7kTO 10kΩ  
ON HOST BOARD  
C12  
R2  
VCC  
Figure 8. Typical ADN2890 Applications Circuit  
Rev. 0 | Page 9 of 12  
 
ADN2890  
PCB Layout  
chip with 50 Ω resistors connected between the output pin and  
VCC. The high speed inputs, PIN and NIN, are internally  
terminated with 50 Ω to an internal reference voltage.  
Figure 9 shows a recommended PC board layout. Use of 50 Ω  
transmission lines is required for all high frequency input and  
output signals to minimize reflections: PIN, NIN, OUTP and  
OUTN. It is also necessary for the PIN/NIN input traces to be  
matched in length, and OUTP/OUTN output traces to be  
matched in length to avoid skew between the differential traces.  
C1, C2, C3, and C4 are ac-coupling capacitors in series with the  
high speed I/O. It is recommended that components be used  
such that the pad for the capacitor is the same width as the  
transmission line in order to minimize the mismatch in the 50  
Ω transmission line at the capacitors pads. It is recommended  
that the transmission lines not change layers through vias, if  
possible. For supply decoupling, the 1 nF decoupling capacitor  
should be placed on the same layer as the ADN2890 as close as  
possible to the VCC pin. The 0.1 µF capacitor can be placed on  
the bottom of the PCB directly underneath the 1 nF decoupling  
capacitor. All high speed CML outputs are back-terminated on  
As with any high speed mixed-signal design, take care to keep  
all high speed digital traces away from sensitive analog nodes.  
Soldering Guidelines for Chip Scale Package  
The lands on the 16 LFCSP are rectangular. The printed circuit  
board pad for these should be 0.1 mm longer than the package  
land length and 0.05 mm wider than the package land width.  
The land should be centered on the pad. This ensures that the  
solder joint size is maximized. The bottom of the chip scale  
package has a central exposed pad. The pad on the printed  
circuit board should be at least as large as this exposed pad. The  
user must connect the exposed pad to VEE using filled vias so  
that solder does not leak through the vias during reflow. This  
ensures a solid connection from the exposed pad to VEE.  
R1, C9, C10 ON BOTTOM  
TO ROSA  
DOUBLE-VIAS TO REDUCE  
INDUCTANCE TO SUPPLY  
AND GND  
PLACE C7 ON  
BOTTOM OF BOARD  
UNDERNEATH C8  
PLACE C5 ON  
BOTTOM OF BOARD  
UNDERNEATH C6  
1
EXPOSED PAD  
C6  
C8  
C1  
C3  
PIN  
NIN  
OUTP  
VIAS TO  
GND  
4mm  
OUTN  
C2  
C4  
DOUBLE-VIA TO GND  
TO REDUCE INDUCTANCE  
VIA TO C12, R2  
ON BOTTOM  
C11  
VIA TO BOTTOM  
Figure 9. Recommended ADN2890 PCB Layout  
Rev. 0 | Page 10 of 12  
 
ADN2890  
OUTLINE DIMENSIONS  
0.50  
0.40  
0.30  
3.00  
0.60 MAX  
BSC SQ  
PIN 1 INDICATOR  
1.65  
13  
16  
5
0.45  
1
4
*
12  
1.50 SQ  
1.35  
PIN 1  
INDICATOR  
2.75  
BSC SQ  
BOTTOM  
VIEW  
TOP VIEW  
9
8
0.50  
BSC  
0.25 MIN  
1.50 REF  
0.80 MAX  
0.65 TYP  
12° MAX  
1.00  
0.85  
0.80  
0.05 MAX  
0.02 NOM  
SEATING  
PLANE  
0.30  
0.23  
0.18  
0.20 REF  
*
COMPLIANTTO JEDEC STANDARDS MO-220-VEED-2  
EXCEPT FOR EXPOSED PAD DIMENSION  
Figure 10. 16-Lead Lead Frame Chip Scale Package [LFCSP]  
3 mm × 3 mm Body  
(CP-16-3)  
Dimensions shown in millimeters  
ORDERING GUIDE  
Model  
Temperature Range  
–40°C to +85°C  
Package Description  
16-LFCSP  
Package Option  
CP-16-3  
Branding  
F02  
ADN2890ACP  
ADN2890ACP-RL  
ADN2890ACP-RL7  
–40°C to +85°C  
–40°C to +85°C  
16-LFCSP  
16-LFCSP  
CP-16-3  
CP-16-3  
F02  
F02  
Rev. 0 | Page 11 of 12  
ADN2890  
NOTES  
©
2004 Analog Devices, Inc. All rights reserved. Trademarks and  
registered trademarks are the property of their respective owners.  
D04509–0–5/04(0)  
Rev. 0 | Page 12 of 12  

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