AOD454A [AOS]

N-Channel Enhancement Mode Field Effect Transistor; N沟道增强型网络场效晶体管
AOD454A
型号: AOD454A
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

N-Channel Enhancement Mode Field Effect Transistor
N沟道增强型网络场效晶体管

晶体 晶体管
文件: 总6页 (文件大小:215K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
AOD454A  
N-Channel Enhancement Mode Field Effect Transistor  
General Description  
Features  
The AOD454A uses advanced trench technology and  
design to provide excellent RDS(ON) with low gate  
charge. With the excellent thermal resistance of the  
DPAK package, this device is well suited for high  
current load applications.  
VDS (V) = 40V  
ID = 12A  
(VGS = 10V)  
RDS(ON) < 30m(VGS = 10V)  
DS(ON) < 40m(VGS = 4.5V)  
R
100% UIS Tested!  
100% Rg Tested!  
-RoHS Compliant  
-Halogen Free*  
TO-252  
D-PAK  
Bottom View  
Top View  
D
D
G
G
S
S
S
G
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Maximum  
Units  
Drain-Source Voltage  
VDS  
40  
±20  
12  
V
Gate-Source Voltage  
Continuous Drain  
Current B,H  
Pulsed Drain CurrentC  
Avalanche Current C  
VGS  
V
TC=25°C  
TC=100°C  
ID  
10  
A
IDM  
IAR  
EAR  
40  
14  
Repetitive avalanche energy L=0.1mHC  
9.8  
mJ  
W
°C  
TC=25°C  
37  
PD  
Power Dissipation B  
TC=100°C  
18  
TA=25°C  
2.5  
PDSM  
Power Dissipation A  
1.6  
TA=70°C  
Junction and Storage Temperature Range  
TJ, TSTG  
-55 to 175  
Thermal Characteristics  
Parameter  
Symbol  
Typ  
16.7  
40  
Max  
25  
50  
4
Units  
°C/W  
°C/W  
°C/W  
Maximum Junction-to-Ambient A,G  
t ≤ 10s  
RθJA  
Maximum Junction-to-Ambient A,G  
Maximum Junction-to-Case F  
Steady-State  
Steady-State  
RθJC  
3
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD454A  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Units  
STATIC PARAMETERS  
ID=250µA, VGS=0V  
BVDSS  
Drain-Source Breakdown Voltage  
40  
V
V
DS=40V, VGS=0V  
1
IDSS  
Zero Gate Voltage Drain Current  
µA  
5
TJ=55°C  
VDS=0V, VGS= ±20V  
DS=VGS ID=250µA  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
±100  
3
nA  
V
V
VGS(th)  
ID(ON)  
1.7  
40  
2.5  
VGS=10V, VDS=5V  
VGS=10V, ID=12A  
A
24  
37  
30  
46  
40  
RDS(ON)  
Static Drain-Source On-Resistance  
TJ=125°C  
mΩ  
VGS=4.5V, ID=8A  
VDS=5V, ID=12A  
IS=1A,VGS=0V  
30  
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
25  
S
V
A
0.76  
1
Maximum Body-Diode Continuous Current  
2.5  
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
516  
82  
650  
pF  
pF  
pF  
V
GS=0V, VDS=20V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
43  
VGS=0V, VDS=0V, f=1MHz  
4.6  
SWITCHING PARAMETERS  
Qg  
Qgs  
Qgd  
tD(on)  
tr  
Total Gate Charge  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
8.3  
2.3  
1.6  
6.4  
3.6  
16.2  
6.6  
18  
10.8  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
V
GS=10V, VDS=20V,  
ID=12A  
V
GS=10V, VDS=20V, RL=1.6,  
RGEN=3Ω  
tD(off)  
tf  
trr  
IF=12A, dI/dt=100A/µs  
IF=12A, dI/dt=100A/µs  
24  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
ns  
Qrr  
10  
nC  
A: The value of RθJA is measured with the device in a still air environment with T A =25°C. The power dissipation PDSM and current rating IDSM  
are based on TJ(MAX)=150°C, using t 10s junction-to-ambient thermal resistance.  
B. The power dissipation PD is based on TJ(MAX)=175°C, using junction-to-case thermal resistance, and is more useful in setting the upper  
dissipation limit for cases where additional heatsinking is used.  
C: Repetitive rating, pulse width limited by junction temperature T J(MAX)=175°C.  
D. The RθJA is the sum of the thermal impedence from junction to case R θJC and case to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-case thermal impedence which is measured with the device mounted to a large heatsink, assuming  
a maximum junction temperature of TJ(MAX)=175°C. The SOA curve provides a single pulse rating.  
G. These tests are performed with the device mounted on 1 in2 FR-4 board with 2oz. Copper, in a still air environment with TA=25°C.  
H. The maximum current rating is limited by bond-wires.  
*This device is guaranteed green after data code 8X11 (Sep 1ST 2008).  
Rev2: Oct 2008  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD454A  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
40  
30  
20  
10  
0
40  
30  
20  
10  
0
VDS=5V  
10V  
4.0V  
4.5V  
4.0V  
125°C  
3.5V  
25°C  
4
VGS=3.0V  
0
1
2
3
4
5
1.5  
2
2.5  
3
3.5  
4.5  
5
VDS (Volts)  
VGS(Volts)  
Figure 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
38  
36  
34  
32  
30  
28  
26  
24  
22  
2
1.8  
1.6  
1.4  
1.2  
1
VGS=10V  
ID=12A  
VGS=4.5V  
VGS=4.5V  
ID=8A  
VGS=10V  
0.8  
0.6  
0
5
10  
15  
20  
-50 -25  
0
25 50 75 100 125 150 175 200  
ID (A)  
Temperature (°C)  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage  
Figure 4: On-Resistance vs. Junction  
Temperature  
80  
70  
60  
50  
40  
30  
20  
10  
100  
10  
ID=12A  
1
0.1  
125°  
125°C  
25°C  
0.01  
25°C  
0.001  
0.0001  
0.00001  
0.0  
0.2  
0.4  
0.6  
VSD (Volts)  
Figure 6: Body-Diode Characteristics  
0.8  
1.0  
1.2  
3
4
5
6
7
8
9
10  
V
GS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD454A  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
1000  
100  
10  
10  
8
Ciss  
VDS=20V  
ID=12A  
Coss  
6
4
Crss  
2
0
0
5
10  
15  
20  
25  
30  
35  
40  
0
1
2
3
4
5
6
7
8
9
Qg (nC)  
Figure 7: Gate-Charge Characteristics  
V
DS (Volts)  
Figure 8: Capacitance Characteristics  
10000  
1000  
100  
100  
TJ(Max)=175°C  
TC=25°C  
10µs  
100
µ
s  
10  
1
RDS(ON)  
limited  
1ms  
10ms  
100ms  
DC  
TJ(Max)=175°C  
TC=25°C  
0.1  
10  
1
10  
100  
0.00001 0.0001  
0.001  
0.01  
0.1  
1
VDS (Volts)  
Pulse Width (s)  
Figure 9: Maximum Forward Biased  
Safe Operating Area (Note F)  
Figure 10: Single Pulse Power Rating Junction-to-  
Case (Note F)  
10  
D=Ton/T  
J,PK=Tc+PDM.ZθJC.RθJC  
RθJC=3°C/W  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
T
1
PD  
0.1  
Ton  
T
Single Pulse  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD454A  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
60  
50  
40  
30  
20  
10  
0
50  
40  
30  
20  
10  
0
0
25  
50  
75  
TCASE (°C)  
Figure 12: Power De-rating (Note B)  
100  
125  
150  
175  
0
25  
50  
75  
100  
125  
150  
175  
TCASE (°C)  
Figure 13: Current De-rating (Note B)  
1000  
TJ(Max)=150°C  
TA=25°C  
100  
10  
1
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 14: Single Pulse Power Rating Junction-to-Ambient (Note G)  
10  
1
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
0.1  
PD  
0.01  
D=Ton/T  
J,PK=TA+PDM.ZθJA.RθJA  
RθJA=40°C/W  
T
Ton  
10  
T
Single Pulse  
0.0001  
0.001  
0.00001  
0.001  
0.01  
0.1  
1
100  
1000  
Pulse Width (s)  
Figure 15: Normalized Maximum Transient Thermal Impedance (Note G)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AOD454A  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
td(on)  
t
r
td(off)  
t
f
ton  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
EAR= 1/2 LIA2R  
BVDSS  
Vds  
Id  
Vgs  
Vds  
+
Vgs  
Vdd  
I AR  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode Recovery Test Circuit & Waveforms  
Q rr = - Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
trr  
L
Isd  
I F  
Isd  
Vgs  
dI/dt  
I RM  
+
Vdd  
VDC  
Vdd  
-
Vds  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  

相关型号:

AOD454L

N-Channel Enhancement Mode Field Effect Transistor
AOS

AOD454Y

N-Channel Enhancement Mode Field Effect Transistor
AOS

AOD454YL

N-Channel Enhancement Mode Field Effect Transistor
AOS

AOD454_08

N-Channel Enhancement Mode Field Effect Transistor
AOS

AOD456

N-Channel Enhancement Mode Field Effect Transistor
AOS

AOD456

N-Channel Enhancement Mode Field Effect Transistor
FREESCALE

AOD456A

Plastic Encapsulated Device
AOS

AOD456AL

Plastic Encapsulated Device
AOS

AOD456L

N-Channel Enhancement Mode Field Effect Transistor
AOS

AOD456_08

N-Channel Enhancement Mode Field Effect Transistor
AOS

AOD458

N-Channel Enhancement Mode Field Effect Transistor
AOS

AOD458L

N-Channel Enhancement Mode Field Effect Transistor
AOS