AOZ8005CI [AOS]
Plastic Encapsulated Device; 塑料封装的器件
| 型号： | AOZ8005CI |
| 厂家： | 
ALPHA & OMEGA SEMICONDUCTORS |
| 描述： | Plastic Encapsulated Device |
| 文件： | 总4页 (文件大小：87K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
AOS Semiconductor
Product Reliability Report
AOZ8005CI, rev 1
Plastic Encapsulated Device
ALPHA & OMEGA Semiconductor, Inc
495 Mercury Drive
Sunnyvale, CA 94085
U.S.
Tel: (408) 830-9742
www.aosmd.com
Mar 26, 2007
1
This AOS product reliability report summarizes the qualification result for AOZ8005CI.
Review of the electrical test results confirm that AOZ8005CI pass AOS quality and reliability
requirements for product release. The continuous qualification testing and reliability monitoring
program ensure that all outgoing products will continue to meet AOS quality and reliability standards.
Table of Contents:
I.
Product Description
II.
Package and Die information
Qualification Test Requirements
Qualification Tests Result
Quality Assurance Information
III.
IV.
V.
I. Product Description:
The AOZ8005CI is a transient voltage suppressor array designed to protect high speed data lines from ESD and
lightning. The product comes in RoHS compliant, SOT-23 package and is rated over a -40°C to +85°C ambient
temperature range.
.
Absolute Maximum Ratings
Parameter
VP-VN
6V
5A
Peak Pulse Current (Ipp), tp=8/20uS
Peak Power Dissipation (8x20mS@ 25°C)
SOT-23
TBD
Storage Temperature (TS)
-65°C to +150°C
±12kV
±15kV
±15kV
-40°C to +125°C
ESD Rating per IEC61000-4-2, contact (1)
ESD Rating per IEC61000-4-2, air (2)
ESD Rating per Human Body Model (2)
Junction Temperature (Tj)
Notes:
(1) IEC-61000-4-2 discharge with CDischarge=150pF, RDischarge=330Ω
(2) Human Body Discharge per MIL-STD-883, Method 3015 CDischarge=100pF, RDischarge=1.5kΩ
II. Package and Die Information:
AOZ8005CI
UMC 0.5um 5/18V 2P3M process
SOT-23
Product ID
Process
Package Type
Die
UE003A3 (size: 716 x 616 um)
Copper A194FH
84-3J epoxy
Au, 1mil
MP8005CIH4
Pure Tin
L/F material
Die attach material
Die bond wire
Mold Material
Plating Material
2
III. Qualification Tests Requirments
•
•
2 lots of AOZ8005CI up to 168 hrs of B/I for New Product release.
2 lots of package qual testing (PCT, 250 cycles TC) for SOT-23 for package release to manufacturing.
IV. Qualification Tests Result
Test Item
Test Condition
Sample Size
2 lot (82 /lot)
Result Comment
pass
Per JESD 22-A113
85 C0/85%RH, 3 cyc
reflow@260 0C
Pkg. Qual by extension using AOZ8000C.
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 82 units, passed pre-conditioning.
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 82 units, passed pre-conditioning.
Pre-
Conditioning
pass
Per JESD 22-A108_B
Vdd=6V
Pkg. Qual by extension using AOZ8000C.
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 80 units, passed 500 hrs .
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 80 units, passed 500 hrs .
2 lot (80 /lot)
HTOL
(pkg qual
burn-in )
Temp = 125 0C
pass
pass
Per JESD 22-A108_B
Vdd=6V
Lot 1 (wafer lot# FN2MT.01-12, marking:
AC001), 80 units, passed 500 hrs .
Lot 2 (wafer lot# FN646.03-4 marking:
AC003), 80 units, passed 168 hrs .
2 lot (80 /lot)
2 lot (60 /lot)
HTOL
(new UI_EPI
process)
Temp = 125 0C
'130 +/- 2 0C, 85%RH, 33.3
psi, at VCC min power
dissapation
Pkg. Qual by extension using AOZ8000C.
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 60 units, passed HAST 100 hrs .
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 60 units, passed HAST 100 hrs .
HAST
'-65 0C to +150 0C, air to
air (2cyc/hr)
Pkg. Qual by extension using AOZ8000C.
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 82 units, passed TC 500 cycles.
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 82 units, passed TC 500 cycles.
pass
pass
2 lot (82 /lot)
2 lot (82 /lot)
Temperature
Cycle
121C, 15+/-1 PSIG,
RH= 100%
Pkg. Qual by extension using AOZ8000C.
Lot 1 (wafer lot# F162T.51-20, marking:
A02), 82 units, passed PCT 96 hrs.
Pressure Pot
Lot 2 (wafer lot# F162T.51-20, marking:
A03), 82 units, passed PCT 96 hrs.
pass
pass
pass
Per IEC-61000-4-2,
contact
Lot 1 (wafer lot# FN646.03-4 , marking:
AC003 ), 3 units passed ±12kV
3 units
3 units
3 units
ESD Rating
ESD Rating
Latch-up
Per IEC-61000-4-2, air
Lot 1 (wafer lot#FN646.03-4 , marking:
AC003 ), 3 units passed ±15kV
Per JESD78A
Lot 1 (wafer lot# FN646.03-4 , marking:
AC003 ), 3 units passed Latch-up.
The qualification test results confirm that AOZ8005CI pass AOS quality and reliability
requirements for product release.
3
V. Quality Assurance Information
Acceptable Quality Level for outgoing inspection: 0.1% for electrical and visual. Guaranteed
Outgoing Defect Rate: < 50 ppm
Quality Sample Plan: conform to Mil-Std-105D
4
相关型号：
©2020 ICPDF网 联系我们和版权申明