T6817_09 [ATMEL]

Dual Triple DMOS Output Driver with Serial Input Control; 带串行输入控制三双DMOS输出驱动器
T6817_09
型号: T6817_09
厂家: ATMEL    ATMEL
描述:

Dual Triple DMOS Output Driver with Serial Input Control
带串行输入控制三双DMOS输出驱动器

驱动器
文件: 总16页 (文件大小:377K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Features  
Three High-side and Three Low-side Drivers  
Outputs Freely Configurable as Switch, Half Bridge or H-bridge  
Capable of Switching All Kinds of Loads Such as DC Motors, Bulbs, Resistors,  
Capacitors and Inductors  
0.6A Continuous Current Per Switch  
Low-side: RDSon < 1.5Ω Versus Total Temperature Range  
High-side: RDSon < 2.0Ω Versus Total Temperature Range  
Very Low Quiescent Current IS < 20 µA in Standby Mode  
Outputs Short-circuit Protected  
Overtemperature Prewarning and Protection  
Undervoltage and Overvoltage Protection  
Various Diagnosis Functions Such as Shorted Output, Open Load, Overtemperature  
and Power Supply Fail  
Dual Triple  
DMOS Output  
Driver with  
Serial Input  
Control  
Serial Data Interface  
Daisy Chaining Possible  
SSO20 Package  
1. Description  
The T6817 is a fully protected driver interface designed in 0.8-µm BCDMOS technol-  
ogy. It can be used to control up to 6 different loads by a microcontroller in automotive  
and industrial applications.  
T6817  
Each of the 3 high-side and 3 low-side drivers is capable of driving currents up to  
600 mA. The drivers are freely configurable and can be controlled separately from a  
standard serial data interface. Therefore, all kinds of loads such as bulbs, resistors,  
capacitors and inductors can be combined. The IC design is especially supportive of  
H-bridges applications to drive DC motors.  
Protection is guaranteed in terms of short-circuit conditions, overtemperature, under-  
and overvoltage. Various diagnosis functions and a very low quiescent current in  
standby mode open a wide range of applications. Meeting automotive qualifications in  
the area of conducted interferences, EMC protection and 2 kV ESD protection provide  
added value and enhanced quality for the exacting requirements of automotive  
applications.  
4670E–BCD–04/09  
Figure 1-1. Block Diagram  
HS3  
HS2  
HS1  
12  
14  
16  
Osc  
VS  
VS  
Fault  
detect  
Fault  
detect  
Fault  
detect  
6
7
DI  
V
S
2
4
OV  
protection  
-
S
C
T
O
H
S
3
L
S
3
H
S
2
L
S
2
H
S
1
L
S
1
S
R
R
n.  
n. n. n. n. n.  
CLK  
L
S
I
u. u. u. u. u. u.  
D
V
S
Vcc  
VCC  
Input register  
Control  
logic  
UV  
protection  
-
CS  
19  
Serial interface  
3
5
Output register  
INH  
n. n. n. n. n. n.  
u. u. u. u. u. u.  
P
S
F
I
N
H
S
C
D
H
S
3
L
S
3
H
S
2
L
S
2
H
S
1
L
S
1
T
P
GND  
GND  
Power-on  
reset  
1
DO  
Vcc  
10  
18  
GND  
GND  
GND  
11  
13  
20  
Fault  
detect  
Fault  
detect  
Fault  
detect  
Thermal  
protection  
8
15  
17  
LS3  
LS2  
LS1  
2
T6817  
4670E–BCD–04/09  
T6817  
2. Pin Configuration  
Figure 2-1. Pinning SSO20  
GND  
DI  
1
2
3
4
5
6
7
8
9
20 GND  
19 VCC  
18 DO  
CS  
CLK  
INH  
VS  
17 LS1  
16 HS1  
15 LS2  
14 HS2  
13 GND  
12 HS3  
11 GND  
VS  
LS3  
n.c.  
GND 10  
Table 2-1.  
Pin Description  
Pin  
Symbol  
Function  
Ground; reference potential; internal connection to pin 10, 11, 13 and 20; cooling tab  
1
GND  
Serial data input; 5-V CMOS logic level input with internal pull-down; receives serial data from the control  
device, DI expects a 16-bit control word with LSB being transferred first  
2
3
4
DI  
CS  
Chip-select input; 5-V CMOS logic level input with internal pull-up;  
low = serial communication is enabled, high = disabled  
Serial clock input; 5-V CMOS logic level input with internal pull down;  
controls serial data input interface and internal shift register (fmax = 2 MHz)  
CLK  
5
INH  
VS  
Inhibit input; 5-V logic input with internal pull-down; low = standby, high = normal operating  
Power supply output stages HS1, HS2 and HS3  
6, 7  
Low-side driver output 3; power-MOS open drain with internal reverse diode: overvoltage protection by  
active zenering; short-circuit protection; diagnosis for short and open load  
8
LS3  
9
n.c.  
Not connected  
10  
11  
GND  
GND  
Ground (see pin 1) be consistent  
Ground (see pin 1)  
High-side driver output 3; power-MOS open drain with internal reverse diode: overvoltage protection by  
active zenering; short-circuit protection; diagnosis for short and open load  
12  
HS3  
13  
14  
15  
16  
17  
GND  
HS2  
LS2  
HS1  
LS1  
Ground (see pin 1)  
High-side driver output 2 (see pin 12) be consistent  
Low-side driver output 2 (see pin 8)  
High-side driver output 1 (see pin 12)  
Low-side driver output 1 (see pin 8)  
Serial data output; 5-V CMOS logic level tri-state output for output (status) register data; sends 16-bit  
status information to the microcontroller (LSB is transferred first); output will remain tri-stated unless  
device is selected by CS = low, therefore, several ICs can operate on only one data output line only.  
18  
DO  
19  
20  
VCC  
GND  
Logic supply voltage (5V)  
Ground (see pin 1)  
3
4670E–BCD–04/09  
3. Functional Description  
3.1  
Serial Interface  
Data transfer starts with the falling edge of the CS signal. Data must appear at DI synchronized  
to CLK and are accepted on the falling edge of the CLK signal. LSB (bit 0, SRR) has to be trans-  
ferred first. Execution of new input data is enabled on the rising edge of the CS signal. When CS  
is high, pin DO is in tri-state condition. This output is enabled on the falling edge of CS. Output  
data will change their state with the rising edge of CLK and stay stable until the next rising edge  
of CLK appears. LSB (bit 0, TP) is transferred first.  
Figure 3-1. Data Transfer Input Data Protocol  
CS  
DI  
SRR  
0
LS1 HS1 LS2 HS2 LS3 HS3 n.u.  
n.u.  
n.u.  
n.u.  
10  
n.u.  
11  
n.u.  
12  
OLD SCT SI  
13 14 15  
1
2
3
4
5
6
7
8
9
CLK  
DO  
TP  
SLS1 SHS1 SLS2 SHS2 SLS3 SHS3 n.u.  
n.u.  
n.u.  
n.u.  
n.u.  
n.u. SCD INH  
PSF  
Table 3-1.  
Bit  
Input Data Protocol  
Input Register  
Function  
Status register reset (high = reset; the bits PSF, SCD and overtemperature  
shutdown in the output data register are set to low)  
0
SRR  
1
2
LS1  
HS1  
LS2  
HS2  
LS3  
HS3  
n.u.  
n.u.  
n.u.  
n.u.  
n.u.  
n.u.  
OLD  
Controls output LS1 (high = switch output LS1 on)  
Controls output HS1 (high = switch output HS1 on)  
3
See LS1  
4
See HS1  
5
See LS1  
6
See HS1  
7
Not used  
8
Not used  
9
Not used  
10  
11  
12  
13  
Not used  
Not used  
Not used  
Open load detection (low = on)  
Programmable time delay for short circuit and overvoltage shutdown (short  
circuit shutdown delay high/low = 100 ms/12.5 ms, overvoltage shutdown  
delay high/low = 14 ms/3.5 ms  
14  
15  
SCT  
SI  
Software inhibit; low = standby, high = normal operation  
(data transfer is not affected by standby function because the digital part is  
still powered)  
4
T6817  
4670E–BCD–04/09  
T6817  
Table 3-2.  
Output Data Protocol  
Output (Status)  
Bit  
Register  
Function  
Temperature prewarning: high = warning (overtemperature shut-down,  
see remark below)  
0
TP  
Normal operation: high = output is on, low = output is off  
1
2
Status LS1  
Status HS1  
Open-load detection: high = open load, low = no open load (correct  
load condition is detected if the corresponding output is switched off)  
Normal operation: high = output is on, low = output is off  
Open-load detection: high = open load, low = no open load (correct  
load condition is detected if the corresponding output is switched off)  
3
4
Status LS2  
Status HS2  
Status LS3  
Status HS3  
n.u.  
Description, see LS1  
Description, see HS1  
Description, see LS1  
Description, see HS1  
Not used  
5
6
7
8
n.u.  
Not used  
9
n.u.  
Not used  
10  
11  
12  
n.u.  
Not used  
n.u.  
Not used  
n.u.  
Not used  
Short circuit detected: set high, when at least one output is switched off  
by a short circuit condition  
13  
SCD  
Inhibit: this bit is controlled by software (bit SI in input register) and  
hardware inhibit (pin 17). High = standby, low = normal operation  
14  
15  
INH  
PSF  
Power supply fail: over- or undervoltage at pin VS detected  
Note:  
Bit 0 to 15 = high: overtemperature shutdown  
Table 3-3.  
Status of the Input Register after Power on Reset  
Bit 15 Bit 14 Bit 13 Bit 12 Bit 11 Bit 10 Bit 9  
(SI) (SCT) (OLD)  
Bit 8  
Bit 7  
Bit 6  
Bit 5  
Bit 4  
Bit 3 Bit 2 Bit 1  
Bit 0  
(HS3) (LS3) (HS2) (LS2) (HS1) (LS1) (SRR)  
H
H
H
n.u.  
n.u.  
n.u.  
n.u.  
n.u.  
n.u.  
L
L
L
L
L
L
L
5
4670E–BCD–04/09  
3.2  
3.3  
Power-supply Fail  
In case of over- or undervoltage at pin VS, an internal timer is started. When the undervoltage  
delay time (tdUV, tdOV) programmed by the SCT bit is reached, the power supply fail bit (PSF) in  
the output register is set and all outputs are disabled. When normal voltage is present again, the  
outputs are enabled immediately. The PSF bit remains high until it is reset by the SRR bit in the  
input register.  
Open-load Detection  
If the open-load detection bit (OLD) is set to low, a pull-up current for each high-side switch and  
a pull-down current for each low-side switch is turned on (open-load detection current IHS1-3  
LS1-3). If VVS-VHS1-3 or VLS1-3 is lower than the open-load detection threshold (open-load condi-  
,
I
tion), the corresponding bit of the output in the output register is set to high. Switching on an  
output stage with the OLD bit set to low disables the open-load function for this output. If bit SI is  
set to low, the open-load function is also switched off.  
3.4  
Overtemperature Protection  
If the junction temperature exceeds the thermal prewarning threshold, TjPW set, the temperature  
prewarning bit (TP) in the output register is set. When the temperature falls below the thermal  
prewarning threshold, TjPW reset, the bit TP is reset. The TP bit can be read without transferring a  
complete 16-bit data word: with CS = high to low, the state of TP appears at pin DO. After the  
microcontroller has read this information, CS is set high and the data transfer is interrupted with-  
out affecting the state of the input and output registers.  
If the junction temperature exceeds the thermal shutdown threshold, Tj switch off, the outputs are  
disabled and all bits in the output register are set high. The outputs can be enabled again when  
the temperature falls below the thermal shutdown threshold, Tj switch on, and when a high has  
been written to the SRR bit in the input register. Thermal prewarning and shutdown threshold  
have hysteresis.  
3.5  
Short-circuit Protection  
The output currents are limited by a current regulator. Current limitation takes place when the  
overcurrent limitation and shutdown threshold (IHS1-3, ILS1-3) are reached. Simultaneously, an  
internal timer is started. The shorted output is disabled when during a permanent short the delay  
time (tdSd) programmed by the short-circuit timer bit (SCT) is reached. Additionally, the short-cir-  
cuit detection bit (SCD) is set. If the temperature prewarning bit TP in the output register is set  
during a short, the shorted output is disabled immediately and SCD bit is set. By writing a high to  
the SRR bit in the input register, the SCD bit is reset and the disabled outputs are enabled.  
3.6  
Inhibit  
There are two ways to inhibit the T6817:  
1. Set bit SI in the input register to zero  
2. Switch pin 5 (INH) to 0V  
In both cases, all output stages are turned off but the serial interface stays active. The output  
stages can be activated again by bit SI = 1 and by pin 5 (INH) switched back to 5V.  
6
T6817  
4670E–BCD–04/09  
T6817  
4. Absolute Maximum Ratings  
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating  
only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this  
specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.  
All values refer to GND pins.  
Parameter  
Pin  
6, 7  
6, 7  
Symbol  
Value  
–0.3 to +40  
–1  
Unit  
V
Supply voltage  
VVS  
Supply voltage t < 0.5s; IS > –2A  
Supply voltage difference |VS_Pin6 – VS_Pin7  
Supply current  
VVS  
V
|
ΔVVS  
150  
mV  
A
6, 7  
6, 7  
19  
IVS  
IVS  
1.4  
Supply current t < 200 ms  
Logic supply voltage  
Input voltage  
2.6  
A
VVCC  
–0.3 to 7  
–0.3 to 17  
–0.3 to VVCC +0.3  
–0.3 to VVCC +0.3  
–10 to +10  
–10 to +10  
V
5
VINH  
V
Logic input voltage  
Logic output voltage  
Input current  
2 to 4  
18  
VDI, VCLK, VCS  
VDO  
IINH, IDI, ICLK, ICS  
IDO  
LS1 to ILS3  
V
V
5, 2 to 4  
18  
mA  
mA  
Output current  
I
Internal limited, see  
output specification  
Output current  
Output voltage  
8, 12, 14 to 17  
IHS1 to IHS3  
HS1 to HS3  
LS1 to LS3  
12, 14, 16  
8, 15, 17  
–0.3 to +40  
17  
V
A
12, 14, 16  
towards 6, 7  
Reverse conducting current (tPulse = 150 µs)  
IHS1 to IHS3  
Junction temperature range  
Storage temperature range  
Tj  
–40 to +150  
–55 to +150  
°C  
°C  
TSTG  
5. Thermal Resistance  
All values refer to GND pins  
Parameter  
Test Conditions  
Measured to GND Pins 1, 10, 11, 13 and 20  
Symbol  
RthJP  
RthJA  
Value  
25  
65  
Unit  
K/W  
K/W  
Junction pin  
Junction ambient  
6. Operating Range  
All values refer to GND pins  
Parameter  
Test Conditions  
Pins 6, 7  
Symbol  
Min.  
Typ.  
Max.  
40(2)  
5.5  
Unit  
V
(1)  
Supply voltage  
VVS  
VUV  
4.5  
Logic supply voltage  
Pin 19  
VVCC  
5
V
Logic input voltage  
Pin 2 to 4 and 5  
Pin 4  
VINH, VDI, VCLK, VCS  
–0.3  
VVCC  
2
V
Serial interface clock frequency  
Junction temperature range  
fCLK  
Tj  
MHz  
°C  
–40  
150  
Notes: 1. Threshold for undervoltage detection  
2. Outputs disabled for VVS > VOV (threshold for overvoltage detection)  
7
4670E–BCD–04/09  
7. Noise and Surge Immunity  
Parameter  
Test Conditions  
Value  
Level 4(1)  
Level 5  
2 kV  
Conducted interferences  
Interference Suppression  
ESD (Human Body Model)  
ESD (Machine Model)  
ISO 7637–1  
VDE 0879 Part 2  
MIL-STM 5.1 – 1998  
JEDEC EIA / JESD 22 – A115-A  
150V  
Note:  
1. Test pulse 5: VSmax = 40V  
8. Electrical Characteristics  
7.5V < VVS < VOV; 4.5V < VVCC < 5.5V; INH = High; –40°C < Tj < 150°C; unless otherwise specified, all values refer to GND pins.  
No.  
1
Parameters  
Test Conditions  
Pin  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Type*  
Current Consumption  
Quiescent current  
(VS)  
VVS < 16V, INH or  
bit SI = low  
1.1  
1.2  
6, 7  
19  
IVS  
40  
20  
µA  
µA  
A
A
Quiescent current  
(VCC)  
4.5V < VVCC < 5.5V,  
INH or bit SI = low  
IVCC  
VVS < 16V normal  
1.3  
1.4  
Supply current (VS)  
operating, all output  
stages off,  
6, 7  
IVS  
0.8  
1.2  
mA  
A
VVS < 16V normal  
operating, all output  
stages on, no load  
Supply current (VS)  
Supply current (VCC)  
6, 7  
19  
IVS  
10  
mA  
µA  
A
A
4.5V < VVCC < 5.5V,  
normal operating pin  
1.5  
2
IVCC  
150  
Internal Oscillator Frequency  
Frequency (time  
base for delay timers)  
2.1  
3
fOSC  
19  
45  
kHz  
A
Over- and Undervoltage Detection, Power-on Reset  
Power-on reset  
19  
3.1  
VVCC  
tdPor  
VUV  
3.4  
30  
3.9  
95  
4.4  
160  
7.0  
V
µs  
V
A
A
A
A
A
A
A
threshold  
Power-on reset delay  
time  
After switching on  
VVCC  
3.2  
3.3  
3.4  
3.6  
3.7  
3.8  
19  
Undervoltage  
detection threshold  
6, 7  
6, 7  
6, 7  
6, 7  
6, 7  
5.5  
Undervoltage  
detection hysteresis  
ΔVUV  
tdUV  
0.4  
V
Undervoltage  
detection delay  
7
21  
ms  
V
Overvoltage  
detection threshold  
VOV  
18.0  
22.5  
Overvoltage  
detection hysteresis  
ΔVOV  
1
V
Input register  
bit 14 (SCT) = high  
bit 14 (SCT) = low  
Undervoltage  
detection delay  
3.9  
tdOV  
tdOV  
7
1.75  
21  
5.25  
ms  
ms  
A
*) Type means: A =100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter  
Note:  
1. Delay time between rising edge of CS after data transmission and switch on/off output stages to 90% of final level  
8
T6817  
4670E–BCD–04/09  
T6817  
8. Electrical Characteristics (Continued)  
7.5V < VVS < VOV; 4.5V < VVCC < 5.5V; INH = High; –40°C < Tj < 150°C; unless otherwise specified, all values refer to GND pins.  
No.  
4
Parameters  
Test Conditions  
Pin  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Type*  
Thermal Prewarning and Shutdown  
Thermal prewarning  
4.1  
4.2  
TjPWset  
125  
105  
145  
125  
165  
145  
°C  
°C  
A
A
Thermal prewarning  
TjPWreset  
Thermal prewarning  
hysteresis  
4.3  
ΔTjPW  
3
20  
K
A
4.4  
4.5  
Thermal shutdown  
Thermal shutdown  
Tj switch off  
Tj switch on  
150  
130  
170  
150  
190  
170  
°C  
°C  
A
A
Thermal shutdown  
hysteresis  
4.6  
ΔTj switch off  
3
20  
K
A
Ratio thermal  
shutdown/thermal  
prewarning  
Tj switch off/  
TjPW set  
4.7  
1.05  
1.17  
A
Ratio thermal  
shutdown/thermal  
prewarning  
Tj switch on/  
TjPW reset  
4.8  
1.05  
1.2  
A
5
Output Specification (LS1-LS6, HS1-HS6) 7.5V < VVS < VOV  
8, 15,  
17  
5.1  
On resistance  
On resistance  
IOut = 600 mA  
IOut = –600 mA  
RDS OnL  
RDS OnH  
VLS1-3  
1.5  
2.0  
60  
Ω
Ω
A
A
A
A
12, 14,  
16  
5.2  
5.3  
5.4  
Output clamping  
voltage  
8, 15,  
17  
ILS1-3 = 50 mA  
40  
V
Output leakage  
current  
VLS1–3 = 40V  
all output stages off  
8, 15,  
17  
ILS1–3  
10  
µA  
2, 3,  
12, 13,  
15, 28  
Output leakage  
current  
VHS1-3 = 0V  
all output stages off  
5.5  
5.7  
IHS1–3  
–10  
µA  
mJ  
A
D
A
A
A
8, 12,  
14 to  
17  
Inductive shutdown  
energy  
Woutx  
15  
8, 12,  
14 to  
17  
Output voltage edge  
steepness  
dVLS1–3/dt  
dVHS1–3/dt  
5.8  
50  
650  
200  
950  
400  
mV/µs  
mA  
Overcurrentlimitation  
and shutdown  
threshold  
8, 15,  
17  
5.9  
ILS1–3  
1250  
–650  
Overcurrentlimitation  
and shutdown  
threshold  
12, 14,  
16  
5.10  
IHS1–3  
–1250  
–950  
100  
mA  
Input register  
bit 14 (SCT) = high  
bit 14 (SCT) = low  
Overcurrent  
shutdown delay time  
5.11  
5.12  
tdSd  
tdSd  
70  
8.75  
140  
17.5  
ms  
ms  
A
A
Open load detection  
current  
Input register bit 13  
(OLD) = low, output off  
8, 15,  
17  
ILS1–3  
60  
200  
µA  
A
*) Type means: A =100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter  
Note: 1. Delay time between rising edge of CS after data transmission and switch on/off output stages to 90% of final level  
9
4670E–BCD–04/09  
8. Electrical Characteristics (Continued)  
7.5V < VVS < VOV; 4.5V < VVCC < 5.5V; INH = High; –40°C < Tj < 150°C; unless otherwise specified, all values refer to GND pins.  
No.  
Parameters  
Test Conditions  
Pin  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Type*  
Open load detection  
current  
Input register bit 13  
(OLD) = low, output off  
12, 14,  
16  
5.13  
IHS1–3  
–150  
–30  
µA  
A
Open load detection  
current ratio  
ILS1–3/  
IHS1–3  
5.14  
5.15  
5.16  
5.17  
1.2  
0.6  
0.6  
A
A
A
A
A
Open load detection  
threshold  
Input register bit 13  
(OLD) = low, output off  
8, 15,  
17  
VLS1–3  
2
2
V
V
Open load detection  
threshold  
Input register bit 13  
(OLD) = low, output off  
12, 14,  
16  
VVS–  
VHS1–3  
Output switch on  
delay(1)  
RLoad = 1 kΩ  
RLoad = 1 kΩ  
tdon  
tdoff  
0.5  
1
ms  
ms  
Output switch off  
delay(1)  
5.18  
6
Inhibit Input  
Input voltage low  
level threshold  
0.3 ×  
VVCC  
6.1  
5
5
VIL  
VIH  
V
V
A
A
Input voltage high  
level threshold  
0.7 ×  
VVCC  
6.2  
6.3  
Hysteresis of input  
voltage  
5
5
ΔVI  
100  
10  
700  
80  
mV  
µA  
A
A
6.4  
Pull-down current  
VINH = VVCC  
IPD  
7
Serial Interface – Logic Inputs DI, CLK, CS  
Input voltage  
low-level threshold  
0.3 ×  
VVCC  
7.1  
7.2  
7.3  
7.4  
2-4  
2-4  
2-4  
2, 4  
3
VIL  
VIH  
V
V
A
A
A
A
A
Input voltage  
high-level threshold  
0.7 ×  
VVCC  
Hysteresis of input  
voltage  
ΔVI  
50  
2
500  
50  
mV  
µA  
µA  
Pull-down current pin  
VDI, VCLK = VVCC  
DI, CLK  
IPDSI  
IPUSI  
Pull-up current  
VCS = 0V  
7.5  
8
–50  
–2  
pin CS  
Serial Interface - Logic Output DO  
Output voltage low  
level  
8.1  
I
I
OL = 3 mA  
18  
18  
18  
VDOL  
VDOH  
IDO  
0.5  
V
V
A
A
A
Output voltage high  
level  
VVCC  
–1V  
8.2  
8.3  
OL = –2 mA  
Leakage current  
(tri-state)  
VCS = VVCC,  
0 V < VDO < VVCC  
–10  
10  
µA  
*) Type means: A =100% tested, B = 100% correlation tested, C = Characterized on samples, D = Design parameter  
Note:  
1. Delay time between rising edge of CS after data transmission and switch on/off output stages to 90% of final level  
10  
T6817  
4670E–BCD–04/09  
T6817  
9. Serial Interface - Timing  
Timing  
Parameters  
Test Conditions  
Chart No.  
Symbol  
tENDO  
tDISDO  
tDOf  
Min.  
Typ.  
Max.  
Unit  
ns  
DO enable after CS falling edge  
DO disable after CS rising edge  
DO fall time  
CDO = 100 pF  
CDO = 100 pF  
CDO = 100 pF  
CDO = 100 pF  
CDO = 100 pF  
1
2
200  
200  
100  
100  
200  
ns  
ns  
DO rise time  
tDOr  
ns  
DO valid time  
10  
4
tDOVal  
tCSSethl  
tCSSetlh  
ns  
CS setup time  
225  
225  
ns  
CS setup time  
8
ns  
Input register bit 14  
(SCT) = high  
CS high time  
CS high time  
9
9
tCSh  
tCSh  
140  
ms  
ms  
Input register bit 14  
(SCT) = low  
17.5  
CLK high time  
CLK low time  
CLK period time  
CLK setup time  
CLK setup time  
DI setup time  
DI hold time  
5
6
tCLKh  
tCLKl  
225  
225  
500  
225  
225  
40  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tCLKp  
7
tCLKSethl  
tCLKSetlh  
tDIset  
3
11  
12  
tDIHold  
40  
11  
4670E–BCD–04/09  
Figure 9-1. Serial Interface Timing with Chart Numbers  
1
2
CS  
DO  
9
CS  
4
7
CLK  
5
3
6
8
DI  
11  
CLK  
10  
12  
DO  
Inputs DI, CLK, CS: High level = 0.7 VCC, low level = 0.3 VCC  
Output DO: High level = 0.8 VCC, low level = 0.2 VCC  
12  
T6817  
4670E–BCD–04/09  
T6817  
10. Application  
Figure 10-1. Application Circuit  
Vcc  
Enable  
U5021M  
Watchdog  
M
M
HS3  
HS2  
HS1  
Vs  
12  
14  
16  
BYT41D  
Osc  
Fault  
detect  
Fault  
detect  
Fault  
detect  
VS  
VS  
6
7
V
Batt  
13 V  
+
+
DI  
V
S
2
4
OV-  
protection  
S
O
H
S
3
L
S
3
H
S
2
L
S
2
H
L
S
1
S
R
R
n. n. n. n. n. n.  
u. u. u. u. u. u.  
CLK  
C
T
L
S
S
I
D
1
Vcc  
Vcc  
19  
V
S
VCC  
Input register  
Control  
logic  
5 V  
UV-  
CS  
Serial interface  
protection  
3
5
Output register  
μC  
INH  
n. n. n. n. n. n.  
P
S
F
I
S
C
D
H
S
3
L
S
3
H
S
2
L
S
2
H
L
T
P
u. u. u. u. u. u.  
N
H
S
S
GND  
GND  
Power-on  
reset  
1
1
1
DO  
Vcc  
10  
18  
GND  
GND  
GND  
11  
13  
20  
Fault  
detect  
Fault  
detect  
Fault  
detect  
Thermal  
protection  
8
15  
17  
LS3  
LS2  
LS1  
10.1 Application Notes  
It is strongly recommended that the blocking capacitors at VCC and VS be connected as close as  
possible to the power supply and GND pins.  
Recommended value for capacitors at VS:  
Electrolythic capacitor C > 22 µF in parallel with a ceramic capacitor C = 100 nF. Value for elec-  
trolytic capacitor depends on external loads, conducted interferences and reverse conducting  
current IHSX (see: Absolute Maximum Ratings).  
Recommended value for capacitors at VCC  
:
Electrolythic capacitor C > 10 µF in parallel with a ceramic capacitor C = 100 nF.  
To reduce thermal resistance it is recommended that cooling areas be placed on the PCB as  
close as possible to GND pins.  
13  
4670E–BCD–04/09  
11. Ordering Information  
Extended Type Number  
Package  
Remarks  
T6817-TKSY  
SSO20  
SSO20  
Power package, tube, Pb-free  
Power package, taped and reeled, Pb-free  
T6817-TKQY  
12. Package Information  
5.4±0.2  
4.4±0.1  
6.75-0.25  
6.45±0.15  
0.25±0.05  
0.65±0.05  
5.85±0.05  
20  
11  
Package: SSO20  
Dimensions in mm  
technical drawings  
according to DIN  
specifications  
1
10  
Drawing-No.: 6.543-5056.01-4  
Issue: 1; 10.03.04  
14  
T6817  
4670E–BCD–04/09  
T6817  
13. Revision History  
Please note that the following page numbers referred to in this section refer to the specific revision  
mentioned, not to this document.  
Revision No.  
History  
Put datasheet in a new template  
Maximum Ratings table changed  
4670E-BCD-04/09  
Put datasheet in a new template  
4670D-BCD-04/07  
Pb-free logo on page 1 deleted  
Table 8 “Electrical Characteristics” number 5.11 on page 9 changed  
Pb-free logo on page 1 added  
4670C-BCD-09/05  
4670B-BCD-05/05  
Table “Ordering Information” on page 14 changed  
Put datasheet in a new template  
Table “Electrical Characteristics” rows 5.15 and 5.16 changed  
15  
4670E–BCD–04/09  
Headquarters  
International  
Atmel Corporation  
2325 Orchard Parkway  
San Jose, CA 95131  
USA  
Tel: 1(408) 441-0311  
Fax: 1(408) 487-2600  
Atmel Asia  
Atmel Europe  
Le Krebs  
8, Rue Jean-Pierre Timbaud  
BP 309  
Atmel Japan  
Unit 1-5 & 16, 19/F  
BEA Tower, Millennium City 5  
418 Kwun Tong Road  
Kwun Tong, Kowloon  
Hong Kong  
9F, Tonetsu Shinkawa Bldg.  
1-24-8 Shinkawa  
Chuo-ku, Tokyo 104-0033  
Japan  
78054  
Saint-Quentin-en-Yvelines Cedex Tel: (81) 3-3523-3551  
Tel: (852) 2245-6100  
Fax: (852) 2722-1369  
France  
Tel: (33) 1-30-60-70-00  
Fax: (33) 1-30-60-71-11  
Fax: (81) 3-3523-7581  
Product Contact  
Web Site  
Technical Support  
Sales Contact  
www.atmel.com  
auto_control@atmel.com  
www.atmel.com/contacts  
Literature Requests  
www.atmel.com/literature  
Disclaimer: The information in this document is provided in connection with Atmel products. No license, express or implied, by estoppel or otherwise, to any  
intellectual property right is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN ATMELS TERMS AND CONDI-  
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and product descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Unless specifically provided  
otherwise, Atmel products are not suitable for, and shall not be used in, automotive applications. Atmel’s products are not intended, authorized, or warranted for use  
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4670E–BCD–04/09  

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