CY62126EV30LL-55ZSXET [CYPRESS]

Standard SRAM, 64KX16, 55ns, CMOS, PDSO44, LEAD FREE, TSOP2-44;
CY62126EV30LL-55ZSXET
型号: CY62126EV30LL-55ZSXET
厂家: CYPRESS    CYPRESS
描述:

Standard SRAM, 64KX16, 55ns, CMOS, PDSO44, LEAD FREE, TSOP2-44

静态存储器 光电二极管 内存集成电路
文件: 总16页 (文件大小:300K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CY62126EV30 MoBL  
1-Mbit (64K x 16) Static RAM  
advanced circuit design to provide ultra low active current. This  
is ideal for providing More Battery Life(MoBL®) in portable  
applications such as cellular telephones. The device also has an  
automatic power down feature that significantly reduces power  
consumption when addresses are not toggling. Placing the  
device in standby mode reduces power consumption by more  
than 99 percent when deselected (CE HIGH). The input and  
output pins (I/O0 through I/O15) are placed in a high impedance  
state when the device is deselected (CE HIGH), the outputs are  
disabled (OE HIGH), both Byte High Enable and Byte Low  
Enable are disabled (BHE, BLE HIGH) or during a write  
operation (CE LOW and WE LOW).  
Features  
High speed: 45 ns  
Temperature ranges  
Industrial: –40 °C to +85 °C  
Automotive: –40 °C to +125 °C  
Wide voltage range: 2.2 V to 3.6 V  
Pin compatible with CY62126DV30  
Ultra low standby power  
Typical standby current: 1 A  
Maximum standby current: 4 A  
To write to the device, take Chip Enable (CE) and Write Enable  
(WE) inputs LOW. If Byte Low Enable (BLE) is LOW, then data  
from I/O pins (I/O0 through I/O7) is written into the location  
specified on the address pins (A0 through A15). If Byte High  
Enable (BHE) is LOW, then data from I/O pins (I/O8 through  
I/O15) is written into the location specified on the address pins  
(A0 through A15).  
Ultra low active power  
Typical active current: 1.3 mA at f = 1 MHz  
Easy memory expansion with CE and OE features  
Automatic power down when deselected  
To read from the device, take Chip Enable (CE) and Output  
Enable (OE) LOW while forcing the Write Enable (WE) HIGH. If  
Byte Low Enable (BLE) is LOW, then data from the memory  
location specified by the address pins appear on I/O0 to I/O7. If  
Byte High Enable (BHE) is LOW, then data from memory  
appears on I/O8 to I/O15. See the “Truth Table” on page 11 for a  
complete description of read and write modes.  
Complementary metal oxide semiconductor (CMOS) for  
optimum speed and power  
OfferedinPb-free48-ballveryfinepitchballgridarray(VFBGA)  
and 44-pin thin small outline package (TSOP) II packages  
Functional Description  
For best practice recommendations, refer to the Cypress  
application note AN1064, SRAM System Guidelines.  
The CY62126EV30 is a high performance CMOS static RAM  
organized as 64K words by 16 bits. This device features  
Logic Block Diagram  
DATA IN DRIVERS  
A10  
A9  
A8  
A7  
A6  
A5  
A4  
A3  
64K x 16  
I/O0–I/O7  
RAM Array  
I/O8–I/O15  
A2  
A1  
A0  
COLUMN DECODER  
BHE  
WE  
CE  
OE  
BLE  
Cypress Semiconductor Corporation  
Document #: 38-05486 Rev. *H  
198 Champion Court  
San Jose, CA 95134-1709  
408-943-2600  
Revised December 17, 2010  
CY62126EV30 MoBL  
Contents  
Pin Configuration ............................................................. 3  
Maximum Ratings............................................................. 4  
Operating Range............................................................... 4  
Electrical Characteristics................................................. 4  
Capacitance ...................................................................... 5  
Thermal Resistance.......................................................... 5  
Data Retention Characteristics ....................................... 6  
Switching Characteristics................................................ 7  
Switching Waveforms ...................................................... 8  
Truth Table...................................................................... 11  
Ordering Information...................................................... 12  
Ordering Code Definitions......................................... 12  
Package Diagrams.......................................................... 13  
Acronyms........................................................................ 14  
Document History Page................................................. 15  
Sales, Solutions, and Legal Information ...................... 16  
Worldwide Sales and Design Support....................... 16  
Products.................................................................... 16  
PSoC Solutions......................................................... 16  
Document #: 38-05486 Rev. *H  
Page 2 of 16  
 
CY62126EV30 MoBL  
Pin Configuration  
Figure 1. 48-Ball VFBGA (Top View)  
Figure 2. 44-Pin TSOP II (Top View) [1]  
1
4
2
5
3
6
NC  
I/O  
A
A
A
A
A
7
OE  
BHE  
BLE  
I/O  
15  
I/O  
I/O  
13  
I/O  
1
2
3
4
5
6
7
8
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
4
3
5
6
A
A
A
A
A
A
OE  
2
1
BLE  
0
1
2
A
B
C
0
A
A
I/O BHE  
CE  
I/O  
4
3
0
8
CE  
I/O  
I/O  
I/O  
I/O  
0
A
A
6
I/O  
I/O  
2
I/O  
1
2
3
14  
5
10  
1
9
9
10  
11  
12  
13  
14  
15  
16  
12  
V
A
V
I/O  
I/O  
3
NC  
NC  
cc  
D
E
F
SS  
7
11  
V
V
SS  
CC  
V
SS  
I/O  
I/O  
I/O  
I/O  
V
CC  
I/O  
I/O  
I/O  
I/O  
Vss  
NC  
V
4
I/O  
I/O  
CC  
11  
10  
12  
4
5
6
7
9
A
A
15  
I/O  
I/O  
5
I/O  
I/O  
14  
13  
14  
6
8
WE 17  
NC  
A
A
15  
A
14  
A
13  
A
12  
18  
19  
20  
21  
22  
8
A
A
G
H
I/O  
NC  
WE  
I/O  
7
13  
12  
15  
A
9
A
10  
A
A
A
A
NC  
A
11  
NC  
NC  
10  
9
11  
8
NC  
Table 1. Product Portfolio  
Power Dissipation  
Operating, ICC (mA)  
VCC Range (V)  
Speed  
(ns)  
Product  
Range  
Standby, ISB2 (A)  
f = 1 MHz  
f = fmax  
Min  
Typ[2]  
3.0  
Max  
3.6  
Typ[2] Max Typ[2] Max  
Typ[2]  
Max  
4
CY62126EV30LL Industrial  
CY62126EV30LL Automotive  
2.2  
2.2  
45  
55  
1.3  
1.3  
2
4
11  
11  
16  
35  
1
1
3.0  
3.6  
30  
Notes  
1. NC pins are not connected on the die.  
2. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V = V  
, T = 25 °C.  
A
CC  
CC(typ)  
Document #: 38-05486 Rev. *H  
Page 3 of 16  
 
 
CY62126EV30 MoBL  
DC input voltage[3, 4] 0.3 V to 3.6 V (VCCmax + 0.3 V)  
Maximum Ratings  
Output current into outputs (LOW) .............................. 20 mA  
Exceeding maximum ratings may shorten the battery life of the  
device. These user guidelines are not tested.  
Static discharge voltage.......................................... > 2001 V  
(MIL-STD-883, Method 3015)  
Storage temperature ................................ –65 °C to +150 °C  
Latch up current..................................................... > 200 mA  
Ambient temperature with  
power applied ........................................... –55 °C to +125 °C  
Operating Range  
Supply voltage to ground  
Ambient  
potential..............................0.3 V to 3.6 V (VCCmax + 0.3 V)  
[5]  
Device  
Range  
VCC  
Temperature  
DC voltage applied to outputs  
in High Z state[3, 4] ..............0.3 V to 3.6 V (VCCmax + 0.3 V)  
CY62126EV30LL  
Industrial –40 °C to +85 °C 2.2 V to  
3.6 V  
Automotive –40 °C to +125 °C  
Electrical Characteristics  
(Over the Operating Range)  
45 ns (Industrial)  
55 ns (Automotive)  
Parameter  
Description  
Test Conditions  
IOH = –0.1 mA  
Unit  
Min Typ[6]  
Max  
Min Typ[6]  
Max  
VOH  
Output high voltage  
2.0  
2.4  
2.0  
2.4  
V
V
IOH = –1.0 mA, VCC > 2.70V  
IOL = 0.1 mA  
VOL  
VIH  
VIL  
Output low voltage  
Input high voltage  
Input low voltage  
0.4  
0.4  
0.4  
V
IOL = 2.1mA, VCC > 2.70V  
VCC = 2.2 V to 2.7 V  
VCC = 2.7 V to 3.6 V  
VCC = 2.2 V to 2.7 V  
VCC = 2.7 V to 3.6 V  
0.4  
V
1.8  
2.2  
–0.3  
–0.3  
–1  
VCC + 0.3 1.8  
VCC + 0.3 2.2  
VCC + 0.3  
VCC + 0.3  
0.6  
V
V
0.6  
0.8  
+1  
–0.3  
–0.3  
–4  
–4  
V
0.8  
V
IIX  
Input leakage current GND < VI < VCC  
+4  
A  
A  
mA  
IOZ  
ICC  
Output leakage current GND < VO < VCC, Output Disabled –1  
VCC operating supply f = fmax = 1/tRC VCC = VCCmax  
+1  
+4  
11  
1.3  
16  
11  
1.3  
35  
current  
IOUT = 0 mA  
CMOS levels  
f = 1 MHz  
2.0  
4.0  
ISB1  
Automatic CE power CE > VCC 0.2 V,  
1
4
1
35  
A  
down current —CMOS  
inputs  
VIN > VCC – 0.2 V, VIN < 0.2 V)  
f = fmax (Address and Data Only),  
f = 0 (OE, BHE, BLE and WE),  
VCC = 3.60V  
[7]  
ISB2  
Automatic CE power CE > VCC – 0.2 V,  
1
4
1
30  
A  
down current —CMOS  
inputs  
V
IN > VCC – 0.2 V or VIN < 0.2 V,  
f = 0, VCC = 3.60V  
Notes  
3.  
4.  
V
= –2.0 V for pulse durations less than 20 ns.  
IL(min)  
V
= V +0.75 V for pulse durations less than 20 ns.  
IH(max)  
CC  
5. Full device AC operation assumes a 100 s ramp time from 0 to V (min) and 200 s wait time after V stabilization.  
cc  
cc  
6. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V = V  
, T = 25 °C.  
A
CC  
CC(typ)  
7. Chip enable (CE) needs to be tied to CMOS levels to meet the I  
/ I  
spec. Other inputs can be left floating.  
SB2 CCDR  
Document #: 38-05486 Rev. *H  
Page 4 of 16  
 
 
 
 
 
CY62126EV30 MoBL  
Capacitance  
For all packages. Tested initially and after any design or process changes that may affect these parameters.  
Parameter  
CIN  
COUT  
Description  
Input capacitance  
Output capacitance  
Test Conditions  
Max  
10  
Unit  
pF  
TA = 25 °C, f = 1 MHz, VCC = VCC(typ)  
10  
pF  
Thermal Resistance  
Tested initially and after any design or process changes that may affect these parameters.  
VFBGA  
TSOP II  
Parameter  
JA  
Description  
Test Conditions  
Unit  
Package Package  
Thermal resistance  
(Junction to ambient)  
Still Air, soldered on a 4.25 × 1.125 inch,  
two-layer printed circuit board  
58.85  
17.01  
28.2  
3.4  
°C/W  
°C/W  
JC  
Thermal resistance  
(Junction to case)  
Figure 3. AC Test Loads and Waveforms  
R1  
ALL INPUT PULSES  
90%  
10%  
VCC  
OUTPUT  
VCC  
GND  
90%  
10%  
R2  
30 pF  
Rise Time = 1 V/ns  
Fall Time = 1 V/ns  
INCLUDING  
JIG AND  
SCOPE  
Equivalent to: THÉVENIN EQUIVALENT  
RTH  
OUTPUT  
VTH  
Parameters  
2.2 V - 2.7 V  
16600  
15400  
8000  
2.7 V - 3.6 V  
1103  
Unit  
R1  
R2  
1554  
RTH  
VTH  
645  
1.2  
1.75  
V
Document #: 38-05486 Rev. *H  
Page 5 of 16  
CY62126EV30 MoBL  
Data Retention Characteristics  
Over the Operating Range  
Parameter  
Description  
Conditions  
Min  
1.5  
Typ[8]  
Max  
Unit  
V
VDR  
VCC for data retention  
Data retention current  
[9]  
ICCDR  
VCC= VDR, CE > VCC – 0.2 V,  
IN > VCC – 0.2 V or VIN < 0.2 V  
Industrial  
3
A  
A  
ns  
V
Automotive  
30  
[10]  
tCDR  
Chip deselect to data  
retention time  
0
[10]  
tR  
Operation recovery time  
tRC  
ns  
Figure 4. Data Retention Waveform  
DATA RETENTION MODE  
VCC(min)  
VCC(min)  
V
> 1.5 V  
VCC  
DR  
t
t
CDR  
R
CE  
Notes  
8. Typical values are included for reference only and are not guaranteed or tested. Typical values are measured at V = V  
, T = 25 °C.  
A
CC  
CC(typ)  
9. Tested initially and after any design or process changes that may affect these parameters.  
10. Full device AC operation requires linear V ramp from V to V > 100 s.  
CC  
DR  
CC(min)  
Document #: 38-05486 Rev. *H  
Page 6 of 16  
 
 
 
CY62126EV30 MoBL  
Switching Characteristics  
Over the Operating Range [11, 12]  
45 ns (Industrial)  
55 ns (Automotive)  
Parameter  
Description  
Unit  
Min  
Max  
Min  
Max  
Read Cycle  
tRC  
Read cycle time  
45  
45  
55  
55  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tAA  
Address to data valid  
tOHA  
Data hold from address change  
CE LOW to data valid  
10  
10  
tACE  
45  
22  
55  
25  
tDOE  
OE LOW to data valid  
OE LOW to Low Z [13]  
OE HIGH to High Z [13, 14]  
CE LOW to Low Z [13]  
CE HIGH to High Z [13, 14]  
tLZOE  
tHZOE  
tLZCE  
tHZCE  
tPU  
5
5
18  
20  
10  
10  
18  
20  
CE LOW to power up  
0
0
tPD  
CE HIGH to power down  
BHE / BLE LOW to data valid  
BHE / BLE LOW to Low Z [13]  
BHE / BLE HIGH to High Z [13, 14]  
45  
22  
55  
25  
tDBE  
tLZBE  
tHZBE  
Write Cycle [15]  
tWC  
5
5
18  
20  
Write cycle time  
45  
55  
ns  
tSCE  
tAW  
tHA  
CE LOW to write end  
35  
35  
0
40  
40  
0
ns  
ns  
ns  
ns  
Address setup to write end  
Address hold from write end  
Address setup to write start  
tSA  
0
0
tPWE  
tBW  
tSD  
WE pulse width  
35  
35  
25  
0
40  
40  
25  
0
ns  
ns  
ns  
ns  
BHE / BLE pulse width  
Data setup to write end  
Data hold from write end  
tHD  
WE LOW to High Z [13, 14]  
WE HIGH to Low Z [13]  
18  
20  
ns  
ns  
tHZWE  
tLZWE  
10  
10  
Notes  
11. Test conditions assume signal transition time of 3 ns or less, timing reference levels of V  
/2, input pulse levels of 0 to V  
, and output loading of the specified  
CC(typ)  
CC(typ)  
I
/I and 30-pF load capacitance.  
OL OH  
12. AC timing parameters are subject to byte enable signals (BHE or BLE) not switching when chip is disabled. See application note AN13842 for further clarification.  
13. At any temperature and voltage condition, t is less than t , t is less than t , t is less than t , and t is less than t for any device.  
HZCE  
LZCE HZBE  
LZBE HZOE  
LZOE  
HZWE  
LZWE  
14. t  
, t  
, t  
, and t  
transitions are measured when the outputs enter a high impedance state.  
HZOE HZCE HZBE  
HZWE  
15. The internal write time of the memory is defined by the overlap of WE, CE = V , BHE, BLE or both = V . All signals must be active to initiate a write and any of these  
IL  
IL  
signals can terminate a write by going inactive. The data input setup and hold timing must refer to the edge of signal that terminates write.  
Document #: 38-05486 Rev. *H  
Page 7 of 16  
 
 
 
 
CY62126EV30 MoBL  
Switching Waveforms  
Figure 5. Read Cycle No. 1(Address transition controlled)[16, 17]  
tRC  
ADDRESS  
tAA  
tOHA  
PREVIOUS DATA VALID  
DATA VALID  
DATA OUT  
[17, 18]  
Figure 6. Read Cycle No. 2 (OE controlled)  
ADDRESS  
CE  
t
RC  
t
PD  
HZCE  
t
t
ACE  
OE  
t
HZOE  
t
DOE  
t
LZOE  
BHE/BLE  
t
HZBE  
t
DBE  
t
LZBE  
HIGH  
IMPEDANCE  
HIGHIMPEDANCE  
DATA VALID  
DATA OUT  
t
LZCE  
t
PU  
V
50%  
50%  
CC  
I
SUPPLY  
SB  
CURRENT  
Notes  
16. The device is continuously selected. OE, CE = V , BHE, BLE, or both = V  
.
IL  
IL  
17. WE is high for read cycle.  
18. Address valid before or similar to CE and BHE, BLE transition LOW.  
Document #: 38-05486 Rev. *H  
Page 8 of 16  
 
 
 
CY62126EV30 MoBL  
Switching Waveforms (continued)  
Figure 7. Write Cycle No. 1 (WE controlled)[19, 20, 21]  
t
WC  
ADDRESS  
CE  
tSCE  
t
t
HA  
AW  
t
SA  
t
PWE  
WE  
t
BW  
BHE/BLE  
OE  
t
HD  
t
SD  
NOTE 22  
DATAIN  
DATA I/O  
t
HZOE  
[
, 20, 21]  
Figure 8. Write Cycle No. 2 (CE controlled) 19  
t
WC  
ADDRESS  
CE  
t
SCE  
tSA  
t
t
HA  
AW  
tPWE  
WE  
t
BW  
BHE/BLE  
OE  
t
t
SD  
HD  
DATAIN  
DATA I/O  
NOTE 22  
t
HZOE  
Notes  
19. The internal write time of the memory is defined by the overlap of WE, CE = V , BHE, BLE or both = V . All signals must be active to initiate a write and any of  
IL  
IL  
these signals can terminate a write by going inactive. The data input setup and hold timing must refer to the edge of signal that terminates write.  
20. Data I/O is high impedance if OE = V  
.
IH  
21. If CE goes high simultaneously with WE = V , the output remains in a high impedance state.  
IH  
22. During this period, the I/Os are in output state. Do not apply input signals.  
Document #: 38-05486 Rev. *H  
Page 9 of 16  
 
 
 
 
CY62126EV30 MoBL  
Switching Waveforms (continued)  
[23]  
Figure 9. Write Cycle No. 3 (WE controlled, OE LOW  
t
WC  
ADDRESS  
CE  
t
SCE  
t
BW  
BHE/BLE  
t
t
HA  
AW  
t
SA  
t
PWE  
WE  
t
HD  
t
SD  
DATA I/O  
NOTE 24  
DATAIN  
t
LZWE  
t
HZWE  
[23]  
Figure 10. Write Cycle No. 4 (BHE/BLE controlled, OE LOW)  
t
WC  
ADDRESS  
CE  
t
SCE  
t
t
HA  
AW  
tBW  
BHE/BLE  
WE  
t
SA  
tPWE  
tHZWE  
t
HD  
t
SD  
NOTE 24  
DATAIN  
DATA I/O  
tLZWE  
Note  
23. If CE goes high simultaneously with WE = V , the output remains in a high impedance state.  
IH  
24. During this period, the I/Os are in output state. Do not apply input signals.  
Document #: 38-05486 Rev. *H  
Page 10 of 16  
 
 
CY62126EV30 MoBL  
Truth Table  
CE[25]  
WE  
X
OE  
X
BHE  
X
BLE  
X
Inputs/Outputs  
High Z  
Mode  
Power  
H
L
L
L
Deselect/power down  
Output disabled  
Read  
Standby (ISB)  
X
X
H
H
High Z  
Active (ICC  
Active (ICC  
Active (ICC  
)
)
)
H
L
L
L
Data out (I/O0–I/O15)  
H
L
H
L
Data out (I/O0–I/O7);  
I/O8–I/O15 in High Z  
Read  
L
H
L
L
H
Data out (I/O8–I/O15);  
I/O0–I/O7 in High Z  
Read  
Active (ICC  
)
L
L
L
L
L
H
H
H
L
H
H
H
X
X
L
H
L
L
L
H
L
L
High Z  
High Z  
High Z  
Output disabled  
Output disabled  
Output disabled  
Write  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
Active (ICC  
)
)
)
)
)
L
Data in (I/O0–I/O15)  
L
H
Data in (I/O0–I/O7);  
I/O8–I/O15 in High Z  
Write  
L
L
X
L
H
Data in (I/O8–I/O15);  
I/O0–I/O7 in High Z  
Write  
Active (ICC  
)
Note  
25. Chip enable must be at CMOS levels (not floating). Intermediate voltage levels on this pin is not permitted.  
Document #: 38-05486 Rev. *H  
Page 11 of 16  
 
 
CY62126EV30 MoBL  
Ordering Information  
Speed  
(ns)  
Package  
Diagram  
Operating  
Range  
Package Type  
Ordering Code  
45  
CY62126EV30LL-45BVXI  
CY62126EV30LL-45ZSXI  
CY62126EV30LL-45ZSXA  
CY62126EV30LL-55BVXE  
CY62126EV30LL-55ZSXE  
51-85150 48-ball VFBGA (Pb-free)  
51-85087 44-pin TSOP II (Pb-free)  
51-85087 44-pin TSOP II (Pb-free)  
51-85150 48-ball VFBGA (Pb-free)  
51-85087 44-pin TSOP II (Pb-free)  
Industrial  
Industrial  
Automotive-A  
Automotive-E  
Automotive-E  
55  
Contact your local Cypress sales representative for availability of other parts.  
Ordering Code Definitions  
Temperature Grades:  
I = Industrial  
45/55 XXX  
V30 LL  
E
X
CY 621 2  
6
A = Auto-A  
E = Auto-E  
Package type:  
BVX: VFBGA (Pb-free)  
ZSX: TSOP II (Pb-free)  
Speed grade  
Low Power  
Voltage Range = 3 V Typical  
E = Process Technology 90 nm  
Bus Width = x16  
Density = 1 Mbit  
621 = MoBL SRAM Family  
Cypress  
CY =  
Company ID:  
Document #: 38-05486 Rev. *H  
Page 12 of 16  
 
 
CY62126EV30 MoBL  
Package Diagrams  
Figure 11. 48-Ball VFBGA (6 x 8 x 1 mm), 51-85150  
51-85150 *F  
Document #: 38-05486 Rev. *H  
Page 13 of 16  
 
CY62126EV30 MoBL  
Figure 12. 44-Pin TSOP II, 51-85087  
PIN 1 I.D.  
22  
1
Z
Z
Z
Z
Z
X
AA  
EJECTOR MARK  
(OPTIONAL)  
23  
44  
CAN BE LOCATED  
ANYWHERE IN THE  
BOTTOM PKG  
BOTTOM VIEW  
TOP VIEW  
0.400(0.016)  
0.300 (0.012)  
0.800 BSC  
(0.0315)  
BASE PLANE  
10.262 (0.404)  
10.058 (0.396)  
0.10 (.004)  
0°-5°  
0.210 (0.0083)  
0.120 (0.0047)  
18.517 (0.729)  
18.313 (0.721)  
SEATING  
PLANE  
0.597 (0.0235)  
0.406 (0.0160)  
DIMENSION IN MM (INCH)  
MAX  
MIN.  
51-85087-*C  
Acronyms  
Acronym  
BHE  
Description  
byte high enable  
BLE  
byte low enable  
CMOS  
CE  
complementary metal oxide semiconductor  
chip enable  
I/O  
input/output  
OE  
output enable  
SRAM  
TSOP  
VFBGA  
WE  
static random access memory  
thin small outline package  
very fine ball gird array  
write enable  
Document #: 38-05486 Rev. *H  
Page 14 of 16  
CY62126EV30 MoBL  
Document History Page  
Document Title: CY62126EV30 MoBL®, 1-Mbit (64K x 16) Static RAM  
Document Number: 38-05486  
Submission  
Date  
Orig. of  
Change  
Rev.  
ECN No.  
Description of Change  
**  
202760  
300835  
See ECN  
See ECN  
AJU  
SYT  
New data sheet  
*A  
Converted from Advance Information to Preliminary  
Specified Typical standby power in the Features Section  
Changed E3 ball from DNU to NC in the Pin Configuration for the FBGA Package  
and removed the footnote associated with it on page #2  
Changed tOHA from 6 ns to 10 ns for both 35- and 45-ns speed bins, respectively  
Changed tDOE, tSD from 15 to 18 ns for 35-ns speed bin  
Changed tHZOE, tHZBE, tHZWE from 12 and 15 ns to 15 and 18 ns for the 35- and  
45-ns speed bins, respectively  
Changed tHZCE from 12 and 15 ns to 18 and 22 ns for the 35- and 45-ns speed  
bins, respectively  
Changed tSCE,tBW from 25 and 40 ns to 30 and 35 ns for the 35- and 45-ns speed  
bins, respectively  
Changed tAW from 25 to 30 ns and 40 to 35 ns for 35 and 45-ns speed bins respec-  
tively  
Changed tDBE from 35 and 45 ns to 18 and 22 ns for the 35 and 45 ns speed bins  
respectively  
Removed footnote that read “BHE.BLE is the AND of both BHE and BLE. Chip can  
be deselected by either disabling the chip enable signals or by disabling both BHE  
and BLE” on page # 4  
Removed footnote that read “If both BHE and BLE are toggled together, then tLZBE  
is 10 ns” on page # 5  
Added Pb-free package information  
*B  
461631  
See ECN  
NXR  
Converted from Preliminary to Final  
Removed 35 ns Speed Bin  
Removed “L” version of CY62126EV30  
Changed ICC (Typ) from 8 mA to 11 mA and ICC (max) from 12 mA to 16 mA for f = fmax  
Changed ICC (max) from 1.5 mA to 2.0 mA for f = 1 MHz, ISB1, ISB2 (max) from 1 A  
to 4 A, ISB1, ISB2 (Typ) from 0.5 A to 1 A, ICCDR (max) from 1.5 A to 3 A, AC Test  
load Capacitance value from 50 pF to 30 pF, tLZOE from 3 to 5 ns, tLZCE from 6 to  
10 ns, tHZCE from 22 to 18 ns, tLZBE from 6 to 5 ns, tPWE from 30 to 35 ns, tSD from  
22 to 25 ns, tLZWE from 6 to 10 ns, and updated the Ordering Information table.  
*C  
*D  
*E  
*F  
925501  
1045260  
2631771  
See ECN  
See ECN  
01/07/09  
VKN  
VKN  
Added footnote #7 related to ISB2 and ICCDR  
Added footnote #11 related AC timing parameters  
Added Automotive information  
Updated Ordering Information table  
NXR/PYRS Changed CE condition from X to L in Truth table for Output Disable mode  
Updated template  
2944332 06/04/2010  
VKN  
Added Contents  
Removed byte enable from footnote #2 in Electrical Characteristics  
Added footnote related to chip enable in Truth Table  
Updated Package Diagrams  
Updated links in Sales, Solutions, and Legal Information  
*G  
*H  
2996166 07/29/2010  
3113864 12/17/2010  
AJU  
Added CY62126EV30LL-45ZSXA part in Ordering Information.  
Added Ordering Code Definitions.  
Modified table footnote format.  
PRAS  
Updated Figure 1 and Package Diagram, and fixed Typo in Figure 3..  
Document #: 38-05486 Rev. *H  
Page 15 of 16  
CY62126EV30 MoBL  
Sales, Solutions, and Legal Information  
Worldwide Sales and Design Support  
Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office  
closest to you, visit us at Cypress Locations.  
Products  
PSoC Solutions  
Automotive  
cypress.com/go/automotive  
cypress.com/go/clocks  
cypress.com/go/interface  
cypress.com/go/powerpsoc  
cypress.com/go/plc  
psoc.cypress.com/solutions  
PSoC 1 | PSoC 3 | PSoC 5  
Clocks & Buffers  
Interface  
Lighting & Power Control  
Memory  
cypress.com/go/memory  
cypress.com/go/image  
cypress.com/go/psoc  
Optical & Image Sensing  
PSoC  
Touch Sensing  
USB Controllers  
Wireless/RF  
cypress.com/go/touch  
cypress.com/go/USB  
cypress.com/go/wireless  
© Cypress Semiconductor Corporation, 2008-2010. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of  
any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for  
medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as  
critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems  
application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign),  
United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of,  
and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress  
integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without  
the express written permission of Cypress.  
Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES  
OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not  
assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where  
a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer  
assumes all risk of such use and in doing so indemnifies Cypress against all charges.  
Use may be limited by and subject to the applicable Cypress software license agreement.  
Document #: 38-05486 Rev. *H  
Revised December 17, 2010  
Page 16 of 16  
MoBL is a registered trademark, and More Battery Life is a trademark, of Cypress Semiconductor. All products and company names mentioned in this document may be the trademarks of their respective  
holders.  

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