CY7C199_06 [CYPRESS]
32K x 8 Static RAM; 32K x 8静态RAM型号: | CY7C199_06 |
厂家: | CYPRESS |
描述: | 32K x 8 Static RAM |
文件: | 总11页 (文件大小:315K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
CY7C199
32K x 8 Static RAM
Functional Description
Features
• High speed
The CY7C199 is a high-performance CMOS static RAM
organized as 32,768 words by 8 bits. Easy memory expansion
is provided by an active LOW Chip Enable (CE) and active
LOW Output Enable (OE) and tri-state drivers. This device has
an automatic power-down feature, reducing the power
consumption by 81% when deselected. The CY7C199 is in the
standard 300-mil-wide DIP, SOJ, and LCC packages.
— 12 ns
• Fast tDOE
• CMOS for optimum speed/power
• Low active power
— 495 mW (Max, “L” version)
• Low standby power
An active LOW Write Enable signal (WE) controls the
writing/reading operation of the memory. When CE and WE
inputs are both LOW, data on the eight data input/output pins
(I/O0 through I/O7) is written into the memory location
addressed by the address present on the address pins (A0
through A14). Reading the device is accomplished by selecting
the device and enabling the outputs, CE and OE active LOW,
while WE remains inactive or HIGH. Under these conditions,
the contents of the location addressed by the information on
address pins are present on the eight data input/output pins.
— 0.275 mW (Max, “L” version)
• 2V data retention (“L” version only)
• Easy memory expansion with CE and OE features
• TTL-compatible inputs and outputs
• Automatic power-down when deselected
• Available in pb-free 28-pin TSOP I and 28-pin (300-Mil)
Molded DIP
The input/output pins remain in a high-impedance state unless
the chip is selected, outputs are enabled, and Write Enable
(WE) is HIGH. A die coat is used to improve alpha immunity.
Pin Configurations
Logic Block Diagram
DIP
Top View
A
A
V
CC
28
27
26
1
2
3
4
5
6
5
WE
A
4
6
A
A
7
8
A
3
25
24
A
9
A
2
A
10
A
11
23
22
A
1
7
OE
A
A
A
I/O
I/O
I/O
21
20
19
18
17
16
15
A
12
13
14
8
9
10
11
12
13
0
I/O
I/O
I/O
I/O
I/O
I/O
I/O
CE
I/O
I/O
I/O
0
1
2
3
4
5
6
INPUT BUFFER
7
0
1
2
6
5
4
A
0
A
I/O
I/O
1
A
GND
14
2
3
A
3
A
4
22
23
OE
A
32K x 8
ARRAY
21
20
A
0
A
5
1
CE
I/O
I/O
I/O
I/O
I/O
A
6
A
A
A
24
2
3
4
19
18
17
16
7
6
A
7
25
26
27
28
1
A
8
5
4
3
A
9
TSOP I
Top View
(not to scale)
WE
V
CC
15
14
13
A
A
A
A
A
5
6
7
GND
I/O
CE
WE
2
3
POWER
DOWN
2
COLUMN
DECODER
I/O
1
12
11
4
5
8
9
I/O
A
0
14
I/O
7
OE
10
9
A
6
10
A
A
13
12
A
7
11
8
Selection Guide
–12
12
–15
15
–20
20
Unit
ns
Maximum Access Time
Maximum Operating Current
160
155
90
10
150
mA
L
L
Maximum CMOS Standby Current
10
10
mA
0.05
Cypress Semiconductor Corporation
Document #: 38-05160 Rev. *B
•
198 Champion Court
•
San Jose, CA 95134-1709
•
408-943-2600
Revised August 3, 2006
CY7C199
DC Input Voltage[1] ................................ –0.5V to VCC + 0.5V
Output Current into Outputs (LOW)............................. 20 mA
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Static Discharge Voltage.......................................... > 2001V
(per MIL-STD-883, Method 3015)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Latch-up Current.................................................... > 200 mA
Operating Range
Supply Voltage to Ground Potential
(Pin 28 to Pin 14) ........................................... –0.5V to +7.0V
Range
Ambient Temperature[2]
VCC
DC Voltage Applied to Outputs
Commercial
0°C to +70°C
5V ± 10%
in High-Z State[1] ....................................–0.5V to VCC + 0.5V
Electrical Characteristics Over the Operating Range [3]
-12
-15
-20
Parameter
VOH
Description
Output HIGH Voltage
Output LOW Voltage
Input HIGH Voltage
Test Conditions
VCC = Min., IOH=–4.0 mA
VCC = Min., IOL=8.0 mA
Min.
Max.
Min.
Max.
Min.
Max. Unit
2.4
2.4
2.4
V
VOL
0.4
0.4
0.4
V
V
VIH
2.2
VCC
+
2.2
VCC
+
2.2
VCC +
0.3V
0.8
+5
0.3V
0.3V
0.8
+5
VIL
IIX
Input LOW Voltage
–0.5
–5
–0.5
–5
0.8
+5
+5
–0.5
–5
V
Input Leakage Current GND < VI < VCC
µA
µA
IOZ
Output Leakage Current GND < VO < VCC, Output
Disabled
–5
+5
–5
–5
+5
ICC
VCC Operating Supply VCC = Max.,
Com’l
L
160
30
155
90
150
30
mA
mA
Current
I
OUT = 0 mA,
f = fMAX = 1/tRC
ISB1
Automatic CE
Power-down Current—
Max.VCC, CE> VIH, Com’l
30
5
mA
mA
VIN > VIH or
L
TTL Inputs
VIN < VIL, f = fMAX
ISB2
Automatic CE
Max. VCC
,
Com’l
L
10
10
10
mA
mA
Power-down Current— CE > VCC – 0.3V
CMOS Inputs IN > VCC – 0.3V
or VIN < 0.3V, f = 0
0.05
V
Notes:
1. V (min.) = –2.0V for pulse durations of less than 20 ns.
IL
2. T is the “instant on” case temperature.
A
3. See the last page of this specification for Group A subgroup testing information.
Document #: 38-05160 Rev. *B
Page 2 of 11
CY7C199
Capacitance[4]
Parameter
Description
Input Capacitance
Output Capacitance
Test Conditions
Max.
Unit
pF
CIN
TA = 25°C, f = 1 MHz,
CC = 5.0V
8
8
V
COUT
pF
AC Test Loads and Waveforms[5]
R1 481Ω
R1 481Ω
5V
5V
ALL INPUT PULSES
90%
OUTPUT
OUTPUT
3.0V
GND
90%
10%
10%
R2
255 Ω
30 pF
R2
255Ω
5 pF
≤tr
≤tr
INCLUDING
JIG AND
SCOPE
INCLUDING
JIG AND
SCOPE
(a)
(b)
Equivalent to:
THÉVENIN EQUIVALENT
167Ω
OUTPUT
1.73V
Data Retention Characteristics Over the Operating Range (L-version only)
Parameter
VDR
ICCDR
Description
VCC for Data Retention
Conditions[6]
Min.
Max.
Unit
V
2.0
Data Retention Current
VCC = VDR = 2.0V,
CE > VCC – 0.3V,
IN > VCC – 0.3V or VIN < 0.3V
10
µA
ns
[4]
tCDR
Chip Deselect to Data Retention Time
Operation Recovery Time
0
V
[5]
tR
200
µs
Data Retention Waveform
DATA RETENTION MODE
> 2V
3.0V
3.0V
V
V
CC
DR
t
t
R
CDR
CE
Notes:
4. Tested initially and after any design or process changes that may affect these parameters.
5. t < 3 ns for the -12 and the -15 speeds. t < 5 ns for the -20 and slower speeds.
R
R
6. No input may exceed V + 0.5V.
CC
Document #: 38-05160 Rev. *B
Page 3 of 11
CY7C199
Switching Characteristics Over the Operating Range [3,7]
-12
-15
-20
Parameter
Description
Min.
12
Max.
Min.
15
3
Max.
Min.
20
3
Max.
Unit
Read Cycle
tRC
Read Cycle Time
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
tAA
Address to Data Valid
Data Hold from Address Change
CE LOW to Data Valid
OE LOW to Data Valid
OE LOW to Low-Z[8]
OE HIGH to High-Z[8, 9]
CE LOW to Low-Z[8]
CE HIGH to High-Z[8, 9]
CE LOW to Power-up
CE HIGH to Power-down
12
15
20
tOHA
3
tACE
12
5
15
7
20
9
tDOE
tLZOE
0
3
0
0
3
0
0
3
0
tHZOE
5
5
7
7
9
9
tLZCE
tHZCE
tPU
tPD
12
15
20
Write Cycle[10, 11]
tWC
tSCE
tAW
Write Cycle Time
12
9
15
10
10
0
20
15
15
0
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
CE LOW to Write End
Address Set-up to Write End
Address Hold from Write End
Address Set-up to Write Start
WE Pulse Width
9
tHA
0
tSA
0
0
0
tPWE
tSD
8
9
15
10
0
Data Set-up to Write End
Data Hold from Write End
WE LOW to High-Z[9]
8
9
tHD
0
0
tHZWE
7
7
10
tLZWE
WE HIGH to Low-Z[8]
3
3
3
Notes:
7. Test conditions assume signal transition time of 3 ns or less for -12 and -15 speeds and 5 ns or less for -20 and slower speeds, timing reference levels of 1.5V,
input pulse levels of 0 to 3.0V, and output loading of the specified I /I and 30-pF load capacitance.
OL OH
8. At any given temperature and voltage condition, t
is less than t
, t
is less than t
, and t
is less than t
for any given device.
HZCE
LZCE HZOE
LZOE
HZWE
LZWE
9. t
, t
, and t
are specified with C = 5 pF as in part (b) of AC Test Loads. Transition is measured ±500 mV from steady-state voltage.
HZOE HZCE
HZWE L
10. The internal write time of the memory is defined by the overlap of CE LOW and WE LOW. Both signals must be LOW to initiate a write and either signal can terminate a
write by going HIGH. The data input set-up and hold timing should be referenced to the rising edge of the signal that terminates the write.
11. The minimum write cycle time for write cycle #3 (WE controlled, OE LOW) is the sum of t
and t .
SD
HZWE
Document #: 38-05160 Rev. *B
Page 4 of 11
CY7C199
Switching Waveforms
Read Cycle No. 1[12, 13]
t
RC
ADDRESS
t
AA
t
OHA
DATA OUT
PREVIOUS DATA VALID
DATA VALID
Read Cycle No. 2 [13, 14]
t
RC
CE
OE
t
ACE
t
t
HZOE
t
DOE
HZCE
t
LZOE
HIGH
IMPEDANCE
HIGH IMPEDANCE
DATA OUT
DATA VALID
t
LZCE
t
PD
t
PU
V
ICC
CC
SUPPLY
CURRENT
50%
50%
ISB
Notes:
12. Device is continuously selected. OE, CE = V .
IL
13. WE is HIGH for read cycle.
14. Address valid prior to or coincident with CE transition LOW.
Document #: 38-05160 Rev. *B
Page 5 of 11
CY7C199
Switching Waveforms (continued)
Write Cycle No. 1 (WE Controlled)[10, 15, 16]
t
WC
ADDRESS
CE
t
t
HA
AW
t
SA
t
PWE
WE
OE
t
SD
t
HD
DATA VALID
DATA I/O
IN
t
HZOE
Write Cycle No. 2 (CE Controlled)[10, 15, 16]
t
WC
ADDRESS
CE
t
SCE
t
SA
t
t
HA
AW
WE
t
t
HD
SD
DATA I/O
DATA VALID
IN
Notes:
15. Data I/O is high impedance if OE = V
.
IH
16. If CE goes HIGH simultaneously with WE HIGH, the output remains in a high-impedance state.
Document #: 38-05160 Rev. *B
Page 6 of 11
CY7C199
Switching Waveforms (continued)
Write Cycle No. 3 (WE Controlled OE LOW)[11, 16]
t
WC
ADDRESS
CE
t
t
HA
AW
t
SA
WE
t
t
HD
SD
DATA I/O
DATA VALID
IN
t
t
LZWE
HZWE
Typical DC and AC Characteristics
NORMALIZED SUPPLY CURRENT
vs. AMBIENT TEMPERATURE
OUTPUT SOURCE CURRENT
vs. OUTPUT VOLTAGE
NORMALIZED SUPPLY CURRENT
vs. SUPPLY
VOLTAGE
120
100
80
1.4
1.2
1.4
1.2
1.0
0.8
0.6
I
CC
I
CC
1.0
0.8
0.6
V
CC
=5.0V
60
T =25°C
A
V
IN
=5.0V
T =25°C
A
40
V
V
IN
=5.0V
=5.0V
0.4
CC
0.4
20
0
0.2
0.0
0.2
0.0
I
SB
I
SB
–55
25
125
0.0
1.0
2.0
3.0
4.0
4.0
4.5
5.0
5.5
6.0
AMBIENT TEMPERATURE (°C)
OUTPUT VOLTAGE (V)
SUPPLY VOLTAGE (V)
NORMALIZED ACCESS TIME
vs. AMBIENT TEMPERATURE
OUTPUT SINK CURRENT
vs. OUTPUT VOLTAGE
NORMALIZED ACCESS TIME
vs. SUPPLY VOLTAGE
140
120
1.6
1.4
1.4
1.3
1.2
100
80
1.2
1.0
1.1
1.0
60
T =25°C
A
V
CC
=5.0V
T =25°C
A
V
CC
=5.0V
40
0.8
20
0
0.9
0.8
0.6
–55
0.0
1.0
2.0
3.0
4.0
25
125
4.0
4.5
5.0
5.5
6.0
AMBIENT TEMPERATURE (°C)
OUTPUT VOLTAGE (V)
SUPPLY VOLTAGE (V)
Document #: 38-05160 Rev. *B
Page 7 of 11
CY7C199
Typical DC and AC Characteristics (continued)
TYPICALPOWER-ON CURRENT
vs.SUPPLY VOLTAGE
TYPICAL ACCESS TIMECHANGE
vs. OUTPUT LOADING
NORMALIZED I vs. CYCLETIME
CC
3.0
2.5
2.0
1.5
30.0
25.0
20.0
15.0
1.25
1.00
0.75
0.50
V
=5.0V
CC
T =25°C
A
V
IN
=0.5V
V
=4.5V
1.0
0.5
10.0
5.0
CC
T =25°C
A
0.0
0.0
0.0
1.0
2.0
3.0
4.0
5.0
0
200 400
600 800 1000
10
20
30
40
SUPPLY VOLTAGE (V)
CAPACITANCE (pF)
CYCLE FREQUENCY (MHz)
Truth Table
CE
H
L
WE
X
OE
X
Inputs/Outputs
High Z
Mode
Power
Deselect/Power-down
Read
Standby (ISB
Active (ICC
Active (ICC
Active (ICC
)
H
L
Data Out
Data In
High Z
)
L
L
X
Write
)
L
H
H
Deselect, Output disabled
)
Ordering Information
Speed
Package
Diagram
Operating
Range
(ns)
Ordering Code
CY7C199-12ZXC
Package Type
12
51-85071 28-pin TSOP I (Pb-free)
51-85071 28-pin TSOP I (Pb-free)
Commercial
Commercial
15
CY7C199-15ZXC
CY7C199L-15ZXC
CY7C199-20PXC
20
51-85014 28-pin (300-Mil) Molded DIP (Pb-free)
Commercial
Document #: 38-05160 Rev. *B
Page 8 of 11
CY7C199
Package Diagrams
28-pin (300-Mil) PDIP (51-85014)
SEE LEAD END OPTION
14
1
MIN.
DIMENSIONS IN INCHES [MM]
MAX.
REFERENCE JEDEC MO-095
PACKAGE WEIGHT: 2.15 gms
0.260[6.60]
0.295[7.49]
15
28
0.030[0.76]
0.080[2.03]
SEATING PLANE
1.345[34.16]
1.385[35.18]
0.290[7.36]
0.325[8.25]
0.120[3.05]
0.140[3.55]
0.140[3.55]
0.190[4.82]
0.009[0.23]
0.012[0.30]
0.115[2.92]
0.160[4.06]
3° MIN.
0.015[0.38]
0.060[1.52]
0.055[1.39]
0.065[1.65]
0.310[7.87]
0.385[9.78]
0.090[2.28]
0.110[2.79]
0.015[0.38]
0.020[0.50]
SEE LEAD END OPTION
51-85014-*D
LEAD END OPTION
(LEAD #1, 14, 15 & 28)
Document #: 38-05160 Rev. *B
Page 9 of 11
CY7C199
Package Diagrams (continued)
28-pin TSOP Type 1 (8x13.4 mm) (51-85071)
51-85071-*G
All products and company names mentioned in this document are the trademarks of their respective holders.
Document #: 38-05160 Rev. *B
Page 10 of 11
© Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use
of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be
used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its
products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress
products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
CY7C199
Document History Page
Document Title: CY7C199 32K x 8 Static RAM
Document Number: 38-05160
Issue
Date
Orig. of
Change
REV.
**
ECN NO.
109971
121730
492500
Description of Change
Change from Spec number: 38-00239 to 38-05160
Updated Product Offering table
10/28/01
01/09/02
See ECN
SZV
DFP
NXR
*A
*B
Removed 8 ns, 10 ns, 25 ns , 35 ns, 45 ns speed bins
Removed 28-Lead (300-Mil) CerDIP, 28-Pin Rectangular Leadless Chip
Carrier, 28-Lead MoldedSOIC, 28-Lead MoldedSOJ packages fromproduct
offering
Changed the description of IIX from Input Load Current to Input Leakage
Current in DC Electrical Characteristics table
Removed IOS parameter from DC Electrical Characteristics Table
Updated Ordering Information Table
Document #: 38-05160 Rev. *B
Page 11 of 11
相关型号:
CY7C2163KV18
18-Mbit QDR® II SRAM Four-Word Burst Architecture (2.5 Cycle Read Latency) with ODT
CYPRESS
CY7C2165KV18
18-Mbit QDR® II SRAM Four-Word Burst Architecture (2.5 Cycle Read Latency) with ODT
CYPRESS
CY7C2168KV18
18-Mbit DDR II SRAM Two-Word Burst Architecture (2.5 Cycle Read Latency) with ODT
CYPRESS
CY7C21701KV18
18-Mbit DDR II SRAM 2-Word Burst Architecture (2.5 Cycle Read Latency) with ODT
CYPRESS
CY7C21701KV18-400BZXC
18-Mbit DDR II SRAM 2-Word Burst Architecture (2.5 Cycle Read Latency) with ODT
CYPRESS
CY7C2170KV18
18-Mbit DDR II SRAM Two-Word Burst Architecture (2.5 Cycle Read Latency) with ODT
CYPRESS
CY7C2245KV18-450BZXI
QDR SRAM, 1MX36, 0.45ns, CMOS, PBGA165, 13 X 15 MM, 1.40 MM HEIGHT, LEAD FREE, MO-216, FBGA-165
CYPRESS
CY7C225-25DI
OTP ROM, 512X8, 12ns, CMOS, CDIP24, 0.300 INCH, SLIM, HERMETIC SEALED, CERDIP-24
CYPRESS
©2020 ICPDF网 联系我们和版权申明