EDI8F32256C-MM [ETC]

SRAM Modules ; SRAM模块\n
EDI8F32256C-MM
型号: EDI8F32256C-MM
厂家: ETC    ETC
描述:

SRAM Modules
SRAM模块\n

静态存储器
文件: 总8页 (文件大小:135K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
EDI8F32256C  
256Kx32 SRAM Module  
Features  
256Kx32 Static RAM  
CMOS, High Speed Module  
256Kx32 bit CMOS Static  
Random Access Memory  
Access Times  
The EDI8F32256C is a high speed 8 megabit Static RAM  
module organized as 256K words by 32 bits. This module is  
constructedfromeight256Kx4Static RAMs inSOJ packages  
on an epoxy laminate (FR4) board.  
BiCMOS: 10 and 12ns  
CMOS: 15, 20, 25, and 35ns  
Individual Byte Selects  
• Fully Static, No Clocks  
TTL Compatible I/O  
Four chip enables (EØ-E3) are used to independently enable  
the four bytes. Reading or writing can be executed on  
individual bytes or any combination of multiple bytes through  
proper use of selects.  
High Density Package with JEDEC Standard Pinouts  
• 64 Pin ZIP, No. 85  
The EDI8F32256C is offered in 64 pin ZIP/SIMM package  
which enables eight megabits of memory to be placed in less  
than 1.4 square inches of board space.  
• 64 Lead Angled SIMM, No. 32  
• 64 Lead SIMM, No. 333  
• 64 ZIP Low Profile, No. 188  
All inputs and outputs are TTL compatible and operate from a  
single 5V supply. Fully asynchronous circuitry requires no  
clocks or refreshing for operation and provides equal access  
and cycle times for ease of use.  
• Common Data Inputs and Outputs  
Single +5V (±10%) Supply Operation  
The ZIP and SIMM modules contain two pins, PD1 and PD2,  
which are used to identify module memory density in applica-  
tions where alternate modules can be interchanged.  
Pin Configurations and Block Diagram  
Pin Names  
AØ-A17  
EØ-E3  
W,  
Address Inputs  
Chip Enables  
Write Enables  
Output Enable  
Common Data Input/Output  
Power(+5V±10%)  
1
3
5
7
9
VSS  
PD2  
DQ8  
DQ9  
DQ10  
PD1  
DQØ  
DQ1  
DQ2  
DQ3 10  
VCC 12  
A7 14  
A8 16  
A9 18  
DQ4 20  
DQ5 22  
DQ6 24  
DQ7 26  
2
4
6
8
G
11 DQ11  
13 AØ  
15 A1  
DQØ-DQ31  
VCC  
17 A2  
19 DQ12  
21 DQ13  
23 DQ14  
25 DQ15  
27 VSS  
29 A15  
31 E1  
VSS  
Ground  
W
G
W
28  
DQØ-DQ3  
DQ4-DQ7  
A14 30  
32  
4
4
4
4
64 Pin  
PD1 - VSS  
PD2 - VSS  
EØ  
E1  
E2  
E3  
33 E3  
35 A17  
37  
39 DQ24  
41 DQ25  
43 DQ26  
45 DQ27  
47 A3  
49 A4  
51 A5  
53 VCC  
55 A6  
57 DQ28  
59 DQ29  
61 DQ30  
63 DQ31  
E2 34  
A16 36  
G
DQ8-DQ11  
DQ16-DQ19  
DQ24-DQ27  
DQ12-DQ15  
DQ20-DQ23  
DQ28-DQ31  
VSS 38  
DQ16 40  
DQ17 42  
DQ18 44  
DQ19 46  
A10 48  
A11 50  
A12 52  
A13 54  
DQ20 56  
DQ21 58  
DQ22 60  
DQ23 62  
VSS 64  
4
4
4
4
Electronic Designs, Inc.  
• One Research Drive • Westborough, MA 01581USA • 508-366-5151 • FAX 508-836-4850 •  
http://www.electronic-designs.com  
1
EDI8F32256C Rev. 12 9/98 ECO #10816  
Absolute Maximum Ratings*  
Recommended DC Operating Conditions  
Parameter  
Supply Voltage  
Supply Voltage  
Input High Voltage VIH 2.2  
Input Low Voltage VIL -0.3  
Sym Min Typ Max Units  
Voltage on any pin relative to VSS  
Operating Temperature TA (Ambient)  
Commercial.  
Industrial  
Storage Temperature, Plastic  
Power Dissipation  
-0.5V to 7.0V  
VCC 4.5  
VSS  
5.0  
0
5.5  
0
V
V
0
0°C to +70°C  
-40°C to +85°C  
-55°C to +125°C  
8.0 Watt  
-- VCC+0.3V V  
-- 0.8  
V
Output Current.  
20 mA  
AC Test Conditions  
*Stress greater than those listed under "Absolute Maximum Ratings" may cause  
permanent damage to the device. This is a stress rating only and functional  
operation of the device at these or any other conditions greater than those indicated  
in the operational sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect reliability.  
Input Pulse Levels  
VSS to 3.0V  
5ns  
1.5V  
1TTL, CL = 30pF  
Input Rise and Fall Times  
Input and Output Timing Levels  
Output Load  
(note: For TEHQZ,TGHQZ and TWLQZ, CL = 5pF)  
DC Electrical Characteristics  
Parameter  
Sym  
Conditions  
Min Max Max Max Max Units  
10-12 15ns 20 25-35 ns  
1360 1280 1440 1280 mA  
480 240 200 200 mA  
Operating Power Supply Current  
ICC1  
W, E = VIL, II/O = 0mA, Min Cycle  
E • VIH, VIN - VIL or VIN • VIH  
E • VCC-0.2V  
VIN • VCC-0.2V or VIN - 0.2V  
VIN = 0V to VCC  
Standby (TTL) Power Supply Current ICC2  
Full Standby Power Supply Current ICC3  
CMOS  
Input Leakage Current  
Output Leakage Current  
Output High Voltage  
Output Low Voltage  
80 80 40  
40 mA  
ILI  
ILO  
VOH  
VOL  
--  
--  
±80 ±80 ±80 ±80 µA  
±20 ±20 ±20 ±20 µA  
V I/O = 0V to VCC  
IOH = -4.0mA  
IOL = 8.0mA  
2.4  
V
V
0.4 0.4 0.4 0.4  
*Typical: TA = 25°C, VCC = 5.0V  
Capacitance  
Truth Table  
(f=1.0MHz, VIN=VCC or VSS)  
E
H
L
L
L
W
X
H
L
G
X
L
X
H
Mode  
Standby  
Read  
Output  
Power  
ICC3  
ICC1  
ICC1  
ICC1  
HIGH Z  
DOUT  
DIN  
Parameter  
Address Lines  
Data Lines  
Chip Enable Line  
Write Control Line  
Sym  
CI  
CD/Q  
CC  
Max  
60  
20  
20  
60  
Unit  
pF  
pF  
pF  
pF  
Write  
H
Output Deselect HIGH Z  
CN  
These parameters are sampled, not 100% tested.  
EDI8F32256C  
256Kx32 SRAM Module  
2
EDI8F32256C Rev. 12 9/98 ECO #10816  
EDI8F32256C  
256Kx32 SRAM Module  
AC Characteristics Read Cycle  
Symbol  
JEDEC Alt.  
10ns*  
Min Max  
10  
10  
10  
3
12ns*  
Min Max  
12  
12  
12  
3
15ns  
Min Max  
15  
15  
15  
3
Parameter  
Read Cycle Time  
Address Access Time  
Chip Enable Access  
Chip Enable to Output in Low Z (1)  
Chip Disable to Output in High Z (1)  
Output Hold from Address Change  
Output Enable to Output Valid  
Units  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
TAVAV TRC  
TAVQV TAA  
TELQV TACS  
TELQX TCLZ  
TEHQZ TCHZ  
TAVQX TOH  
TGLQV TOE  
5
6
8
3
3
3
5
5
8
Output Enable to Output in Low Z (1) TGLQX TOLZ  
Output Disable to Output in High Z (1) TGHQZ TOHZ  
0
0
0
ns  
ns  
4
4
5
Note 1: Parameter guaranteed, but not tested.  
*BICMOS  
Read Cycle 1 - W High, G, E Low  
TAVAV  
ADDRESS 1  
TAVQV  
A
Q
ADDRESS 2  
TAVQX  
DATA 1  
DATA 2  
Read Cycle 2 - W High  
TAVAV  
A
TAVQV  
E
TELQV  
TELQX  
TEHQZ  
TGHQZ  
G
Q
TGLQV  
TGLQX  
3
EDI8F32256C Rev. 12 9/98 ECO #10816  
AC Characteristics Read Cycle  
Symbol  
JEDEC Alt.  
20ns  
Min Max  
25ns  
Min Max  
35ns  
Min Max  
Parameter  
Read Cycle Time  
Address Access Time  
Chip Enable Access  
Chip Enable to Output in Low Z (1)  
Chip Disable to Output in High Z (1)  
Output Hold from Address Change  
Output Enable to Output Valid  
Units  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
TAVAV TRC  
TAVQV TAA  
TELQV TACS  
TELQX TCLZ  
TEHQZ TCHZ  
TAVQX TOH  
TGLQV TOE  
20  
20  
20  
3
10  
3
25  
25  
25  
3
12  
3
35  
35  
35  
3
15  
3
13  
0
15  
0
20  
0
Output Enable to Output in Low Z (1) TGLQX TOLZ  
Output Disable to Output in High Z(1) TGHQZ TOHZ  
8
10  
12  
ns  
Note 1: Parameter guaranteed, but not tested.  
Read Cycle 1 - W High, G, E Low  
TAVAV  
ADDRESS 1  
TAVQV  
A
Q
ADDRESS 2  
TAVQX  
DATA 1  
DATA 2  
Read Cycle 2 - W High  
TAVAV  
A
E
TAVQV  
TELQV  
TELQX  
TEHQZ  
G
Q
TGLQV  
TGLQX  
TGHQZ  
EDI8F32256C  
256Kx32 SRAM Module  
4
EDI8F32256C Rev. 12 9/98 ECO #10816  
EDI8F32256C  
256Kx32 SRAM Module  
AC Characteristics Write Cycle  
Symbol  
JEDEC Alt.  
TAVAV TWC  
TELWH TCW  
TWLEH TCW  
TAVWL TAS  
10ns*  
Min Max  
12ns*  
Min Max  
15ns  
Min Max  
Parameter  
Write Cycle Time  
Chip Enable to End of Write  
Units  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
10  
7
7
0
0
7
7
7
7
0
0
3
3
12  
8
8
0
0
8
8
8
8
0
0
3
3
15  
12  
10  
0
Address Setup Time  
Address Valid to End of Write  
Write Pulse Width  
TAVEL  
TAS  
0
TAVWH TAW  
TAVEH TAW  
TWLWH TWP  
TELEH TWP  
TWHAX TWR  
TEHAX TWR  
TWHDX TDH  
TEHDX TDH  
TWLQZ TWHZ  
TDVWH TDW  
TDVEH TDW  
TWHQX TWLZ  
10  
10  
10  
10  
0
0
3
3
0
7
7
3
Write Recovery Time  
Data Hold Time  
Write to Output in High Z (1)  
Data to Write Time  
0
5
5
3
5
0
6
6
3
6
9
Output Active from End of Write (1)  
Note 1: Parameter guaranteed, but not tested.  
*BICMOS  
AC Characteristics Write Cycle  
Symbol  
20ns  
25ns  
35ns  
Parameter  
Write Cycle Time  
Chip Enable to End of Write  
JEDEC  
Alt.  
Min Max  
Min Max  
Min Max  
Units  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
TAVAV TWC  
TELWH TCW  
TWLEH TCW  
TAVWL TAS  
20  
15  
15  
0
25  
20  
20  
0
35  
30  
30  
0
Address Setup Time  
Address Valid to End of Write  
Write Pulse Width  
TAVEL  
TAS  
0
0
0
TAVWH TAW  
TAVEH TAW  
TWLWH TWP  
TELEH TWP  
TWHAX TWR  
TEHAX TWR  
TWHDX TDH  
TEHDX TDH  
TWLQZ TWHZ  
TDVWH TDW  
TDVEH TDW  
TWHQX TWLZ  
15  
15  
15  
15  
0
0
3
3
20  
20  
20  
20  
0
0
3
3
30  
30  
30  
30  
0
0
3
3
Write Recovery Time  
Data Hold Time  
Write to Output in High Z (1)  
Data to Write Time  
0
12  
12  
3
10  
0
15  
15  
3
12  
0
20  
20  
3
15  
Output Active from End of Write (1)  
Note 1: Parameter guaranteed, but not tested.  
5
EDI8F32256C Rev. 12 9/98 ECO #10816  
Write Cycle 1 - W Controlled  
TAVAV  
TELWH  
A
E
TWHAX  
TAVWH  
TWLWH  
W
TAVWL  
TWHDX  
TWHQX  
TDVWH  
D
Q
DATA VALID  
TWLQZ  
HIGH Z  
Write Cycle 2 - E Controlled  
TAVAV  
A
TAVEL  
TELEH  
TWLEH  
E
W
TEHAX  
TAVEH  
TDVEH  
DATA VALID  
TEHDX  
D
Q
HIGH Z  
EDI8F32256C  
256Kx32 SRAM Module  
6
EDI8F32256C Rev. 12 9/98 ECO #10816  
EDI8F32256C  
256Kx32 SRAM Module  
Ordering Information  
Part Number.  
Speed  
(ns)  
Package  
No.  
Part Number  
Speed  
(ns)  
Package  
No.  
BICMOS  
BICMOS  
EDI8F32256B10MZC  
EDI8F32256B12MZC  
CMOS  
10  
12  
85  
85  
EDI8G32256B10MNC  
EDI8G32256B12MNC  
CMOS  
10  
12  
32  
32  
EDI8F32256C15MZC  
EDI8F32256C20MZC  
EDI8F32256C25MZC  
EDI8F32256C35MZC  
15  
20  
25  
35  
85  
85  
85  
85  
EDI8F32256C15MNC  
EDI8F32256C20MNC  
EDI8F32256C25MNC  
EDI8F32256C35MNC  
BICMOS  
15  
20  
25  
35  
32  
32  
32  
32  
EDI8G32256B10MMC  
EDI8G32256B12MMC  
CMOS  
10  
12  
333  
333  
Part Number.  
Speed  
(ns)  
Package  
No.  
CMOS  
EDI8F32256C15MMC  
EDI8F32256C20MMC  
EDI8F32256C25MMC  
EDI8F32256C35MMC  
15  
20  
25  
35  
333  
333  
333  
333  
EDI8F32257C20MZC  
EDI8F32257C25MZC  
20  
25  
188  
188  
NOTE: 1. For Gold SIMM change form EDI8F to EDI8G.  
2. The BICMOS 10 & 12ns SIMMs available with Gold Contacts only.  
Package Description  
Package No. 32  
64 Lead Angled SIMM  
3.855 MAX.  
3.584  
.360  
MAX.  
.680  
MAX.  
.400  
.250  
P1  
.250  
.050  
1.845  
.125  
MIN.  
.225  
MIN.  
3.350  
1.792  
R.062. (2x)  
Package No. 85  
64 Pin ZIP  
3.665  
MAX.  
.360  
MAX.  
.050  
.580  
MAX.  
.050  
.250  
TYP.  
.100  
TYP.  
.022  
.018  
.050  
TYP.  
.165  
.135  
.100  
TYP.  
.175  
.125  
7
EDI8F32256C Rev. 12 9/98 ECO #10816  
Package No. 333  
64 Lead SIMM  
3.855 MAX.  
3.584  
.125  
MIN.  
.615  
MAX.  
#
.400  
.250  
.250  
3.350  
.050 TYP.  
.062 R.  
.360  
MAX.  
.062 R.  
1.845  
1.792  
Package No. 188  
64 ZIP Low Profile  
3.665 MAX.  
.360  
MAX.  
.050  
.470  
MAX.  
.050  
.175  
.125  
.170  
.130  
.021  
.017  
.100 TYP.  
.050  
TYP.  
.100  
TYP.  
Electronic Designs, Inc.  
• One Research Drive • Westborough, MA 01581USA • 508-366-5151 • FAX 508-836-4850 •  
http://www.electronic-designs.com  
ElectronicDesignsInc. reservestherighttochangespecificationswithoutnotice. CAGENo. 66301  
8
EDI8F32256C Rev. 12 9/98 ECO #10816  

相关型号:

EDI8F32256C-MN

SRAM Modules
ETC

EDI8F32256C15MMC

x32 SRAM Module
ETC

EDI8F32256C15MNC

x32 SRAM Module
ETC

EDI8F32256C15MZC

x32 SRAM Module
ETC

EDI8F32256C20MMC

x32 SRAM Module
ETC

EDI8F32256C20MNC

SRAM Module, 256KX32, 20ns, CMOS, SIMM-64
WEDC

EDI8F32256C20MZC

SRAM Module, 256KX32, 20ns, CMOS, ZIP-64
WEDC

EDI8F32256C25MMC

x32 SRAM Module
ETC

EDI8F32256C25MNC

x32 SRAM Module
ETC

EDI8F32256C25MZC

x32 SRAM Module
ETC

EDI8F32256C35MMC

x32 SRAM Module
ETC

EDI8F32256C35MNC

x32 SRAM Module
ETC