FDB6696 [FAIRCHILD]

Power Field-Effect Transistor, 52A I(D), 30V, 0.01ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB;
FDB6696
型号: FDB6696
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Power Field-Effect Transistor, 52A I(D), 30V, 0.01ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB

开关 脉冲 晶体管
文件: 总5页 (文件大小:68K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
January 2002  
PRELIMINARY  
FDP6696 / FDB6696  
N-Channel Logic Level PowerTrenchÒ MOSFET  
General Description  
Features  
This N-Channel MOSFET has been designed  
specifically to improve the overall efficiency of DC/DC  
converters using either synchronous or conventional  
switching PWM controllers. It has been optimized for  
low gate charge, low RDS(ON) and fast switching speed.  
· 52 A, 30 V  
RDS(ON) = 10 mW @ VGS = 10 V  
RDS(ON) = 12.5 mW @ VGS = 4.5 V  
· Critical DC electrical parameters specified at  
elevated temperature  
Applications  
· High performance trench technology for extremely  
low RDS(ON)  
· Synchronous rectifier  
· DC/DC converter  
· 175°C maximum junction temperature rating  
D
D
G
G
G
S
TO-263AB  
FDB Series  
TO-220  
FDP Series  
D
S
S
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
VDSS  
Parameter  
Drain-Source Voltage  
Ratings  
Units  
30  
V
V
A
VGSS  
ID  
Gate-Source Voltage  
± 16  
Drain Current – Continuous  
– Pulsed  
(Note 1)  
(Note 1)  
52  
150  
PD  
Total Power Dissipation @ TC = 25°C  
58  
W
W/°C  
°C  
Derate above 25°C  
Operating and Storage Junction Temperature Range  
0.4  
TJ, TSTG  
–65 to +175  
Thermal Characteristics  
RqJC  
Thermal Resistance, Junction-to-Case  
2.6  
°C/W  
°C/W  
RqJA  
Thermal Resistance, Junction-to-Ambient  
62.5  
Package Marking and Ordering Information  
Device Marking  
Device  
FDB6696  
FDP6696  
Re el Size  
Tape width  
24mm  
Quantity  
FDB6696  
13’’  
800 units  
45  
FDP6696  
Tube  
n/a  
Ó2002 Fairchild Semiconductor Corporation  
FDP6696 Rev B(W)  
Electrical Characteristics  
TA= 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Drain-Source Avalanche Ratings (Note 1)  
WDSS  
IAR  
Single Pulse Drain-Source  
Avalanche Energy  
VDD = 15 V, ID = 13 A  
165  
13  
mJ  
A
Maximum Drain-Source Avalanche  
Current  
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage VGS = 0 V,  
ID = 250 mA  
30  
V
Breakdown Voltage Temperature  
22  
DBVDSS  
ID = 250 mA, Referenced to 25°C  
mV/°C  
Coefficient  
DTJ  
IDSS  
Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
VDS = 24 V, VGS = 0 V  
VGS = 16 V, VDS = 0 V  
VGS = –16 V VDS = 0 V  
10  
mA  
nA  
nA  
IGSSF  
IGSSR  
100  
–100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
VDS = VGS  
,
ID = 250 mA  
1
1.9  
3
V
Gate Threshold Voltage  
Temperature Coefficient  
–5.4  
DVGS(th)  
DTJ  
ID = 250 mA, Referenced to 25°C  
mV/°C  
RDS(on)  
Static Drain–Source On–  
Resistance  
VGS = 10 V,  
VGS = 4.5 V, ID = 24 A  
VGS= 10 V, ID = 26 A, TJ=125°C  
ID = 26 A  
7.7  
9.5  
10.8  
10  
12.5  
15  
mW  
ID(on)  
gFS  
On–State Drain Current  
VGS = 10 V,  
VDS = 10V,  
VDS = 5 V  
ID = 26 A  
60  
A
S
Forward Transconductance  
84  
Dynamic Characteristics  
C
Input Capacitance  
1510  
394  
pF  
pF  
iss  
VDS = 15 V,  
f = 1.0 MHz  
V GS = 0 V,  
Coss  
Output Capacitance  
C
rss  
Reverse Transfer Capacitance  
141  
pF  
Switching Characteristics (Note 2)  
VDD = 15 V,  
VGS = 4.5 V, RGEN = 6 W  
ID = 1 A,  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
11  
10  
32  
13  
15  
4
34  
32  
96  
48  
20  
ns  
ns  
ns  
ns  
VDS = 15 V,  
VGS = 5 V  
ID = 26 A,  
Qg  
nC  
nC  
nC  
Qgs  
Qgd  
5
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
52  
1.3  
A
V
Drain–Source Diode Forward  
Voltage  
VGS = 0 V,  
IS = 26 A (Note 1)  
0.9  
VSD  
trr  
Diode Reverse Recovery Time  
IF = 26 A,  
diF/dt = 100 A/µs  
29  
68  
nS  
nC  
Qrr  
Diode Reverse Recovery Charge  
Notes:  
1. Pulse Test: Pulse Width < 300ms, Duty Cycle < 2.0%  
FDP6696 Rev B(W)  
Typical Characteristics  
2
1.8  
1.6  
1.4  
1.2  
1
120  
VGS = 10V  
5.0V  
6.0V  
4.5V  
VGS = 3.5V  
4.0V  
90  
60  
30  
0
4.0V  
3.5V  
4.5V  
5.0V  
6.0V  
10V  
3.0V  
0.8  
0
30  
60  
ID, DRAIN CURRENT (A)  
90  
120  
0
1
2
3
4
5
VDS , DRAIN-SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
1.8  
1.6  
1.4  
1.2  
1
0.024  
ID = 26A  
ID = 26A  
VGS =10V  
0.019  
0.014  
0.009  
0.004  
TA = 125oC  
TA = 25oC  
0.8  
0.6  
2
4
6
8
10  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
175  
VGS, GATE TO SOURCE VOLTAGE (V)  
TJ, JUNCTION TEMPERATURE (oC)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
100  
80  
VGS = 0V  
VDS = 10V  
10  
1
TA = 125oC  
60  
25oC  
40  
-55oC  
TA = 125oC  
20  
0.1  
0.01  
25o  
-55oC  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
1.5  
2
2.5  
3
3.5  
4
VSD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDP6696 Rev B(W)  
Typical Characteristics  
2000  
1500  
1000  
500  
0
10  
VDS = 10V  
f = 1MHz  
VGS = 0 V  
ID = 26A  
15V  
CISS  
8
6
4
2
0
20V  
COSS  
CRSS  
0
10  
20  
30  
0
5
10  
15  
20  
25  
30  
Qg, GATE CHARGE (nC)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
1000  
2500  
2000  
1500  
1000  
500  
SINGLE PULSE  
RqJC = 2.6°C/W  
TA = 25°C  
10µs  
100  
10  
1
RDS(ON) LIMIT  
100µs  
1ms  
10ms  
100ms  
DC  
VGS = 10V  
SINGLE PULSE  
Rq = 2.6oC/W  
JC  
TA = 25oC  
0
0.01  
0.1  
1
10  
100  
1000  
0.1  
1
10  
100  
t1, TIME (sec)  
VDS, DRAIN-SOURCE VOLTAGE (V)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
RqJC(t) = r(t) * RqJC  
RqJC = 2.6 °C/W  
0.2  
0.1  
P(pk  
0.1  
0.05  
t1  
t2  
0.02  
TJ - Tc = P * RqJC(t)  
0.01  
Duty Cycle, D = t1 / t2  
SINGLE PULSE  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
FDP6696 Rev B(W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
â
SMART START™  
STAR*POWER™  
Stealth™  
VCX™  
FAST  
ACEx™  
Bottomless™  
CoolFET™  
OPTOLOGIC™  
OPTOPLANAR™  
PACMAN™  
FASTr™  
FRFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MicroPak™  
MICROWIRE™  
CROSSVOLT™  
DenseTrench™  
DOME™  
POP™  
Power247™  
PowerTrenchâ  
QFET™  
EcoSPARK™  
E2CMOSTM  
TinyLogic™  
QS™  
EnSignaTM  
TruTranslation™  
UHC™  
QT Optoelectronics™  
Quiet Series™  
SILENTSWITCHERâ  
FACT™  
FACT Quiet Series™  
UltraFETâ  
STAR*POWER is used under license  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOT ASSUME ANY LIABILITYARISING OUT OF THE APPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICESORSYSTEMSWITHOUTTHEEXPRESSWRITTENAPPROVALOFFAIRCHILDSEMICONDUCTORCORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H4  

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