FDD6680AS [FAIRCHILD]

30V N-Channel PowerTrench SyncFET; 30V N沟道的PowerTrench SyncFET
FDD6680AS
型号: FDD6680AS
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

30V N-Channel PowerTrench SyncFET
30V N沟道的PowerTrench SyncFET

文件: 总8页 (文件大小:123K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
December 2004  
FDD6680AS  
30V N-Channel PowerTrench® SyncFET™  
General Description  
Features  
The FDD6680AS is designed to replace a single  
MOSFET and Schottky diode in synchronous DC:DC  
power supplies. This 30V MOSFET is designed to  
maximize power conversion efficiency, providing a low  
55 A, 30 V  
RDS(ON) max= 10.5 m@ VGS = 10 V  
RDS(ON) max= 13.0 m@ VGS = 4.5 V  
Includes SyncFET Schottky body diode  
Low gate charge (21nC typical)  
RDS(ON)  
and low gate charge.  
The FDD6680AS  
includes an integrated Schottky diode using Fairchild’s  
monolithic SyncFET technology. The performance of  
the FDD6680AS as the low-side switch in  
a
synchronous rectifier is indistinguishable from the  
High performance trench technology for extremely  
performance of the FDD6680A in parallel with  
Schottky diode.  
a
low RDS(ON)  
High power and current handling capability  
Applications  
DC/DC converter  
Low side notebook  
.
D
D
G
G
S
TO-252  
S
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
Parameter  
Ratings  
Unit  
s
V
V
A
VDSS  
VGSS  
ID  
Drain-Source Voltage  
Gate-Source Voltage  
30  
±20  
Drain Current – Continuous  
– Pulsed  
(Note 3)  
(Note 1a)  
(Note 1)  
55  
100  
PD  
W
Power Dissipation  
60  
(Note 1a)  
(Note 1b)  
3.1  
1.3  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
–55 to +150  
°C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Case  
(Note 1)  
(Note 1a)  
(Note 1b)  
2.1  
40  
96  
RθJC  
RθJA  
RθJA  
°C/W  
°C/W  
°C/W  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Ambient  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
FDD6680AS  
FDD6680AS  
FDD6680AS  
FDD6680AS_NL (Note 4)  
13’’  
13’’  
16mm  
16mm  
2500 units  
2500 units  
FDD6680AS Rev A(X)  
©2004 Fairchild Semiconductor Corporation  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Drain-Source Avalanche Ratings (Note 2)  
Single Pulse, VDD = 15 V,  
ID=13.5A  
WDSS  
IAR  
Drain-Source Avalanche Energy  
Drain-Source Avalanche Current  
54  
205  
mJ  
A
13.5  
Off Characteristics  
Drain–Source Breakdown  
Voltage  
BVDSS  
VGS = 0 V, ID = 1 mA  
30  
V
29  
BVDSS  
TJ  
Breakdown Voltage Temperature ID = 1 mA, Referenced to 25°C  
Coefficient  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current VDS = 24 V,  
Gate–Body Leakage  
VGS = 0 V  
VDS = 0 V  
500  
µA  
IGSS  
nA  
VGS = ±20 V,  
±100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
VDS = VGS, ID = 1 mA  
1
1.4  
–3  
3
V
Gate Threshold Voltage  
Temperature Coefficient  
VGS(th)  
TJ  
ID = 1 mA, Referenced to 25°C  
mV/°C  
RDS(on)  
Static Drain–Source  
On–Resistance  
VGS = 10 V,  
VGS = 4.5 V,  
VGS= 10 V, ID = 12.5A, TJ= 125°C  
ID = 12.5 A  
ID = 10 A  
8.6  
10.3  
12.5  
10.5  
13.0  
16.0  
mΩ  
ID(on)  
gFS  
On–State Drain Current  
VGS = 10 V,  
VDS = 15 V,  
VDS = 5 V  
50  
A
S
Forward Transconductance  
ID = 12.5 A  
44  
Dynamic Characteristics  
V
DS = 15 V,  
V GS = 0 V,  
Ciss  
Input Capacitance  
1200  
pF  
f = 1.0 MHz  
Coss  
Crss  
RG  
Output Capacitance  
350  
120  
1.6  
pF  
pF  
Reverse Transfer Capacitance  
Gate Resistance  
V
GS = 15 mV,  
f = 1.0 MHz  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
10  
6
20  
12  
45  
22  
25  
23  
32  
20  
29  
15  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
nC  
nC  
nC  
nC  
Turn–On Rise Time  
VDD = 15 V,  
VGS = 10 V,  
ID = 1 A,  
RGEN = 6 Ω  
Turn–Off Delay Time  
Turn–Off Fall Time  
28  
12  
14  
13  
20  
11  
21  
11  
3
Turn–On Delay Time  
Turn–On Rise Time  
VDD = 15 V,  
VGS = 4.5 V,  
ID = 1 A,  
RGEN = 6 Ω  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge at Vgs=10V  
Total Gate Charge at Vgs=5V  
Gate–Source Charge  
Gate–Drain Charge  
Qg  
Qg  
(TOT)  
VDD = 15 V, ID = 12.5 A  
Qgs  
Qgd  
4
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
4.4  
0.7  
A
V
VSD  
VGS = 0 V, IS = 4.4 A  
VGS = 0 V, IS = 7 A  
IF = 12.5A,  
(Note 2)  
(Note 2)  
0.5  
0.6  
17  
Drain–Source Diode Forward  
Voltage  
trr  
nS  
nC  
Diode Reverse Recovery Time  
Diode Reverse Recovery Charge  
diF/dt = 300 A/µs  
(Note 3)  
Qrr  
11  
FDD6680AS Rev A (X)  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Notes:  
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.  
a) RθJA = 40°C/W when mounted on a  
1in2 pad of 2 oz copper  
b) RθJA = 96°C/W when mounted  
on a minimum pad.  
Scale 1 : 1 on letter size paper  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%  
PD  
3. Maximum current is calculated as:  
RDS(ON)  
where PD is maximum power dissipation at TC = 25°C and RDS(on) is at TJ(max) and VGS = 10V. Package current limitation is 21A  
4. FDD6680AS_NL is a lead free product. The FDD6680AS_NL marking will appear on the reel label.  
FDD6680AS Rev A (X)  
Typical Characteristics  
100  
2
1.8  
1.6  
1.4  
1.2  
1
VGS = 3.0V  
VGS = 10V  
4.0V  
80  
4.5V  
6.0V  
3.5V  
60  
40  
20  
0
3.5V  
4.0V  
4.5V  
3.0V  
5.0V  
6.0V  
10V  
2.5V  
0.8  
0
20  
40  
60  
80  
100  
0
0.5  
1
1.5  
2
2.5  
3
VDS, DRAIN-SOURCE VOLTAGE (V)  
ID, DRAIN CURRENT (A)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
0.032  
1.6  
ID = 12.5A  
VGS =10V  
ID = 6.3A  
1.4  
1.2  
1
0.026  
0.02  
TA = 125oC  
0.014  
0.008  
0.8  
0.6  
TA =25oC  
2
4
6
8
10  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
100  
100  
VGS = 0V  
VDS = 5V  
80  
60  
40  
20  
0
10  
1
TA = 125oC  
TA = 125oC  
25oC  
-55oC  
-55oC  
0.1  
0.01  
25oC  
3
1
1.5  
2
2.5  
3.5  
4
4.5  
0
0.2  
0.4  
0.6  
0.8  
1
V
GS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDD6680AS Rev A (X)  
Typical Characteristics (continued)  
10  
1800  
1500  
1200  
900  
600  
300  
0
f = 1MHz  
VGS = 0 V  
ID = 12.5A  
VDS = 10V  
8
20V  
6
Ciss  
15V  
4
Coss  
2
0
Crss  
0
5
10  
15  
20  
25  
0
5
10  
15  
20  
25  
30  
Qg, GATE CHARGE (nC)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
100  
1000  
100  
10  
SINGLE PULSE  
RθJA = 96°C/W  
80  
60  
40  
20  
0
T
A = 25°C  
RDS(ON) LIMIT  
100us  
1ms  
10ms  
100ms  
1s  
10s  
1
DC  
VGS = 10V  
SINGLE PULSE  
RθJA = 96oC/W  
TA = 25oC  
0.1  
0.01  
0.01  
0.1  
1
10  
100  
0.001  
0.01  
0.1  
1
10  
100  
1000  
VDS, DRAIN-SOURCE VOLTAGE (V)  
t1, TIME (sec)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
RθJA(t) = r(t) * RθJA  
RθJA = 96 °C/W  
0.2  
0.1  
0.1  
0.05  
P(pk  
0.02  
t1  
t2  
= P * RθJA(t)  
Duty Cycle, D = t1 / t2  
0.01  
0.01  
T - T  
J A  
SINGLE PULSE  
0.001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient thermal response will change depending on the circuit board design.  
FDD6680AS Rev A (X)  
Typical Characteristics (continued)  
SyncFET Schottky Body Diode  
Characteristics  
Fairchild’s SyncFET process embeds a Schottky diode  
in parallel with PowerTrench MOSFET. This diode  
exhibits similar characteristics to a discrete external  
Schottky diode in parallel with a MOSFET. Figure 12  
shows the reverse recovery characteristic of the  
FDD6680AS.  
Schottky barrie diodes exhibit significant leakage at  
high temperature and high reverse voltage. This will  
increase the power in the device.  
0.1  
TA = 125oC  
10nS/div  
0.01  
0.001  
TA = 100oC  
Figure 12. FDD6680AS SyncFET body diode  
reverse recovery characteris  
0.0001  
TA = 25oC  
For comparison purposes, Figure 13 shows the  
reverse recovery characteristics of the body diode  
of an equivalent size MOSFET produced without  
SyncFET (FDD6680).  
0.00001  
0.000001  
0
5
10  
15  
20  
25  
30  
V
DS, REVERSE VOLTAGE (V)  
Figure 14. SyncFET body diode reverse  
leakage versus drain-source voltage and  
temperature.  
10nS/div  
Figure 13. Non-SyncFET (FDD6680) body  
diode reverse recovery characteristic.  
FDD6680AS Rev A (X)  
Typical Characteristics  
L
VDS  
BVDSS  
tP  
VGS  
RGE  
VDS  
VDD  
+
-
IAS  
DUT  
VDD  
0V  
VGS  
vary tP to obtain  
tp  
IAS  
0.01Ω  
required peak IAS  
tAV  
Figure 12. Unclamped Inductive Load Test  
Figure 13. Unclamped Inductive  
Waveforms  
Circuit  
Drain Current  
Same type as  
+
50kΩ  
10V  
10µF  
-
1µF  
+
VDD  
QG(TOT)  
-
VGS  
10V  
VGS  
DUT  
QGD  
QGS  
Ig(REF  
Charge, (nC)  
Figure 14. Gate Charge Test Circuit  
Figure 15. Gate Charge Waveform  
tON  
td(ON)  
tOFF  
td(OFF  
RL  
t
f  
VDS  
t
r  
VDS  
90%  
90%  
+
-
VGS  
RGEN  
10%  
10%  
0V  
DUT  
VDD  
90%  
50%  
VGS  
50%  
VGS  
Pulse Width 1µs  
Duty Cycle 0.1%  
10%  
0V  
Pulse Width  
Figure 16. Switching Time Test  
Circuit  
Figure 17. Switching Time Waveforms  
FDD6680AS Rev A (X)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
ACEx™  
POP™  
SPM™  
Stealth™  
IntelliMAX™  
ISOPLANAR™  
LittleFET™  
MICROCOUPLER™  
MicroFET™  
MicroPak™  
MICROWIRE™  
MSX™  
MSXPro™  
OCX™  
OCXPro™  
OPTOLOGIC  
OPTOPLANAR™  
PACMAN™  
FAST  
FASTr™  
FPS™  
FRFET™  
GlobalOptoisolator™  
GTO™  
ActiveArray™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
DOME™  
EcoSPARK™  
E2CMOS™  
EnSigna™  
FACT™  
Power247™  
PowerEdge™  
PowerSaver™  
PowerTrench  
QFET  
SuperFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
QS™  
HiSeC™  
I2C™  
QT Optoelectronics™ TinyLogic  
Quiet Series™  
RapidConfigure™  
RapidConnect™  
µSerDes™  
TINYOPTO™  
TruTranslation™  
UHC™  
i-Lo™  
ImpliedDisconnect™  
FACT Quiet Series™  
UltraFET  
Across the board. Around the world.™  
The Power Franchise  
ProgrammableActive Droop™  
SILENT SWITCHER UniFET™  
SMART START™  
VCX™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVESTHE RIGHTTO MAKE CHANGES WITHOUTFURTHER NOTICETOANY  
PRODUCTS HEREINTO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOTASSUMEANYLIABILITY  
ARISING OUTOFTHEAPPLICATION OR USE OFANYPRODUCTOR CIRCUITDESCRIBED HEREIN; NEITHER DOES IT  
CONVEYANYLICENSE UNDER ITS PATENTRIGHTS, NORTHE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUTTHE EXPRESS WRITTENAPPROVALOF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. I15  

相关型号:

FDD6680AS_08

30V N-Channel PowerTrench㈢ SyncFET⑩
FAIRCHILD

FDD6680AS_NL

30V N-Channel PowerTrench SyncFET
FAIRCHILD

FDD6680A_NL

Power Field-Effect Transistor, 14A I(D), 30V, 0.0095ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, DPAK-3
FAIRCHILD

FDD6680S

30V N-Channel PowerTrench SyncFET⑩
FAIRCHILD

FDD6680S

55A, 30V, 0.011ohm, N-CHANNEL, Si, POWER, MOSFET, TO-252, DPAK-3
ROCHESTER

FDD6680S_NL

Power Field-Effect Transistor, 55A I(D), 30V, 0.011ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, DPAK-3
FAIRCHILD

FDD6680_NL

Power Field-Effect Transistor, 12A I(D), 30V, 0.01ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, DPAK-3
FAIRCHILD

FDD6682

30V N-Channel PowerTrench MOSFET
FAIRCHILD

FDD6682_NL

Power Field-Effect Transistor, 75A I(D), 30V, 0.0062ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-252, DPAK-3
FAIRCHILD

FDD6685

30V P-Channel PowerTrench MOSFET
FAIRCHILD

FDD6685

30V,P 沟道,PowerTrench® MOSFET,-40A,20mΩ
ONSEMI

FDD6685_11

30V P-Channel PowerTrenchÒ MOSFET
FAIRCHILD