FDS2670D84Z [FAIRCHILD]

Small Signal Field-Effect Transistor, 3A I(D), 200V, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, SOIC-8;
FDS2670D84Z
型号: FDS2670D84Z
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Small Signal Field-Effect Transistor, 3A I(D), 200V, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, SOIC-8

开关 光电二极管 晶体管 功率场效应晶体管
文件: 总6页 (文件大小:107K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
August 2001  
FDS2670  
200V N-Channel PowerTrench MOSFET  
General Description  
Features  
This N-Channel MOSFET has been designed  
specifically to improve the overall efficiency of DC/DC  
converters using either synchronous or conventional  
switching PWM controllers.  
3.0 A, 200 V. RDS(ON) = 130 m@ VGS = 10 V  
Low gate charge  
Fast switching speed  
These MOSFETs feature faster switching and lower  
gate charge than other MOSFETs with comparable  
RDS(ON) specifications.  
High performance trench technology for extremely  
low RDS(ON)  
The result is a MOSFET that is easy and safer to drive  
(even at very high frequencies), and DC/DC power  
supply designs with higher overall efficiency.  
High power and current handling capability  
D
D
D
5
6
7
8
4
3
2
1
D
G
S
S
SO-8  
S
Absolute Maximum Ratings TA=25oC unless otherwise noted  
Symbol  
VDSS  
Parameter  
Drain-Source Voltage  
Ratings  
Units  
V
200  
VGSS  
ID  
Gate-Source Voltage  
V
A
±20  
3.0  
20  
Drain Current – Continuous  
– Pulsed  
(Note 1a)  
PD  
Power Dissipation for Single Operation  
(Note 1a)  
(Note 1b)  
2.5  
1.2  
1.0  
3.2  
W
(Note 1c)  
(Note 3)  
dv/dt  
Peak Diode Recovery dv/dt  
V/ns  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
55 to +150  
°C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
(Note 1a)  
(Note 1c)  
(Note 1)  
50  
125  
25  
RθJA  
RθJA  
RθJC  
°C/W  
°C/W  
°C/W  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
FDS2670  
FDS2670  
13’’  
12mm  
2500 units  
FDS2670 Rev C1(W)  
2001 Fairchild Semiconductor Corporation  
Electrical Characteristics  
TA = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Drain-Source Avalanche Ratings (Note 1)  
WDSS  
IAR  
Single Pulse Drain-Source  
Avalanche Energy  
Maximum Drain-Source Avalanche  
Current  
VDD = 100 V, ID = 3.0 A  
375  
3.0  
mJ  
A
Off Characteristics  
BVDSS  
Drain–Source Breakdown Voltage  
200  
V
VGS = 0 V,  
ID = 250 µA  
Breakdown Voltage Temperature  
Coefficient  
214  
BVDSS  
TJ  
ID = 250 µA, Referenced to 25°C  
mV/°C  
IDSS  
Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
VDS = 160 V, VGS = 0 V  
1
µA  
nA  
nA  
IGSSF  
IGSSR  
VGS = 20 V,  
VGS = –20 V  
VDS = 0 V  
VDS = 0 V  
100  
–100  
On Characteristics  
(Note 2)  
VGS(th)  
Gate Threshold Voltage  
2
4
4.5  
V
V
DS = VGS  
,
ID = 250 µA  
Gate Threshold Voltage  
Temperature Coefficient  
–10  
VGS(th)  
TJ  
ID = 250 µA, Referenced to 25°C  
mV/°C  
RDS(on)  
Static Drain–Source  
On–Resistance  
VGS = 10 V,  
VGS =10 V, ID =3.0 A, TJ =125°C  
ID = 3.0 A  
100  
205  
130  
275  
mΩ  
ID(on)  
gFS  
On–State Drain Current  
VGS = 10 V,  
VDS = 10 V,  
VDS = 10 V  
ID = 3.0 A  
20  
A
S
Forward Transconductance  
15  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
1228  
112  
17  
pF  
pF  
pF  
V
DS = 100 V, V GS = 0 V,  
Output Capacitance  
f = 1.0 MHz  
Reverse Transfer Capacitance  
Switching Characteristics (Note 2)  
td(on)  
tr  
td(off)  
tf  
Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
13  
8
23  
16  
48  
40  
43  
ns  
ns  
V
DD = 100 V, ID = 1 A,  
VGS = 10 V, RGEN = 6 Ω  
30  
25  
27  
7
ns  
ns  
Qg  
Qgs  
Qgd  
nC  
nC  
nC  
V
DS = 100 V, ID = 3 A,  
VGS = 10 V  
10  
Drain–Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain–Source Diode Forward Current  
2.1  
1.2  
A
V
Drain–Source Diode Forward  
VSD  
VGS = 0 V,  
IS = 2.1 A (Note 2)  
0.7  
Voltage  
FDS2670 Rev C1(W)  
Notes:  
1. RθJA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins. RθJC is guaranteed by design while RθCA is determined by the user's board design.  
a) 50°/W when  
b) 105°/W when  
mounted on a 0.04  
in2 pad of 2 oz  
copper  
c) 125°/W when mounted on a  
minimum pad.  
mounted on a 1in2  
pad of 2 oz copper  
Scale 1 : 1 on letter size paper  
2. Pulse Test: Pulse Width < 300µs, Duty Cycle < 2.0%  
3. ISD 3A, di/dt 100A/µs, VDD BVDSS, Starting TJ = 25°C  
FDS2670 Rev C1(W)  
Typical Characteristics  
1.6  
1.4  
1.2  
1
20  
VGS = 10V  
6.5V  
VGS = 5.5V  
15  
10  
5
6.0V  
6.0V  
6.5V  
10.0V  
5.5V  
0.8  
0
0
4
8
12  
16  
20  
0
2
4
6
8
10  
ID, DRAIN CURRENT (A)  
VDS, DRAIN-SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
0.4  
0.3  
0.2  
0.1  
0
2.5  
ID = 3.0A  
ID = 1.5 A  
VGS = 10V  
2
1.5  
1
TA = 125oC  
TA = 25oC  
0.5  
0
-50  
-25  
0
25  
50  
75  
100  
125  
150  
4
5
6
7
8
9
10  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
100  
30  
24  
18  
12  
6
VGS = 0V  
VDS = 15V  
TA = 125oC  
10  
1
25oC  
-55oC  
TA = 125oC  
0.1  
25oC  
-55oC  
0.01  
0.001  
0
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
3
4
5
6
7
8
V
SD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDS2670 Rev C1(W)  
Typical Characteristics  
15  
2000  
1500  
1000  
500  
0
f = 1MHz  
GS = 0 V  
ID = 3.0 A  
VDS = 40V  
V
70  
12  
9
100 V  
CISS  
6
3
COSS  
CRSS  
0
0
5
10  
15  
20  
25  
30  
35  
40  
0
20  
40  
60  
80  
100  
Qg, GATE CHARGE (nC)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
100  
100  
80  
60  
40  
20  
0
RDS(ON) LIMIT  
SINGLE PULSE  
RθJA = 125°C/W  
µ
100  
s
10  
1
TA = 25°C  
10ms  
100ms  
1s  
10s  
DC  
0.1  
VGS = 10V  
SINGLE PULSE  
RθJA = 125oC/W  
T
A = 25oC  
0.01  
0.001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t1, TIME (sec)  
0.1  
1
10  
100  
1000  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
RθJA(t) = r(t) + Rθ  
JA  
RθJA = 125°C/W  
0.2  
0.1  
P(pk)  
0.1  
t1  
0.05  
t2  
0.02  
0.01  
TJ - TA = P * RθJA(t)  
Duty Cycle, D = t1 / t2  
SINGLE PULSE  
0.01  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t1, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1c.  
Transient thermal response will change depending on the circuit board design.  
FDS2670 Rev C1(W)  
TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
â
SMART START™  
STAR*POWER™  
Stealth™  
VCX™  
FAST  
ACEx™  
Bottomless™  
CoolFET™  
OPTOLOGIC™  
OPTOPLANAR™  
PACMAN™  
FASTr™  
FRFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MicroPak™  
MICROWIRE™  
CROSSVOLT™  
DenseTrench™  
DOME™  
POP™  
Power247™  
PowerTrenchâ  
QFET™  
EcoSPARK™  
E2CMOSTM  
TinyLogic™  
QS™  
EnSignaTM  
TruTranslation™  
UHC™  
QT Optoelectronics™  
Quiet Series™  
SILENTSWITCHERâ  
FACT™  
FACT Quiet Series™  
UltraFETâ  
STAR*POWER is used under license  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD  
DOES NOT ASSUME ANY LIABILITYARISING OUT OF THE APPLICATION OR USE OFANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICESORSYSTEMSWITHOUTTHEEXPRESSWRITTENAPPROVALOFFAIRCHILDSEMICONDUCTORCORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H4  

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