HMT84GR7MMR4A-G7 [HYNIX]
DDR3L SDRAM Registered DIMM Based on 4Gb M-die; 基于4Gb的M-模具DDR3L SDRAM DIMM注册
| 型号： | HMT84GR7MMR4A-G7 |
| 厂家： | 
HYNIX SEMICONDUCTOR |
| 描述： | DDR3L SDRAM Registered DIMM Based on 4Gb M-die |
| 文件： | 总71页 (文件大小：1712K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
240pin DDR3L SDRAM Registered DIMM
DDR3L SDRAM Registered DIMM
Based on 4Gb M-die
HMT451R7MFR8A
HMT41GR7MFR8A
HMT41GR7MFR4A
HMT42GR7MFR4A
HMT84GR7MMR4A
*SK hynix reserves the right to change products or specifications without notice.
Rev. 1.0 /Aug. 2013
1
Revision History
Revision No.
History
Draft Date
Aug.2011
Mar.2012
Aug.2013
Remark
0.1
Initial Release
0.2
1.0
Latest JEDEC Spec and Product Line-up Updated
Change module maximum thickness
to reflect the measure maximum
Rev. 1.0 / Aug. 2013
2
Description
SK hynix Registered DDR3L SDRAM DIMMs (Registered Double Data Rate Synchronous DRAM Dual In-Line
Memory Modules) are low power, high-speed operation memory modules that use DDR3L SDRAM devices.
These Registered SDRAM DIMMs are intended for use as main memory when installed in systems such as
servers and workstations.
Features
• Power Supply: VDD=1.35V (1.283V to 1.45V)
• VDDQ = 1.35V (1.283V to 1.45V)
• VDDSPD=3.0V to 3.6V
• Backward compatible with 1.5V DDR3 Memory Module
• 8 internal banks
• Data transfer rates: PC3-12800, PC3-10600, PC3-8500
• Bi-Directional Differential Data Strobe
• 8 bit pre-fetch
• Burst Length (BL) switch on-the-fly BL8 or BC4(Burst Chop)
• Supports ECC error correction and detection
• On-Die Termination (ODT)
• Temperature sensor with integrated SPD
• This product is in compliance with the RoHS directive.
Ordering Information
# of
ranks
Part Number
Density Organization
Component Composition
FDHS
HMT451R7MFR8A-G7/H9/PB
HMT41GR7MFR8A-G7/H9/PB
HMT41GR7MFR4A-G7/H9/PB
HMT42GR7MFR8A-G7/H9/PB
HMT84GR7MMR4A-G7/H9
4GB
8GB
512Mx72
1Gx72
1Gx72
2Gx72
4Gx72
512Mx8(H5TC4G83MFR)*9
512Mx8(H5TC4G83MFR)*18
1Gx4(H5TC4G43MFR)*18
1Gx4(H5TC4G43MFR)*36
DDP 2Gx4(H5TC8G43MMR)*36
1
2
1
2
4
X
X
8GB
X
16GB
32GB
O
O
* In order to uninstall FDHS, please contact sales administrator
Rev. 1.0 / Aug. 2013
3
Key Parameters
CAS
Latency
(tCK)
tCK
(ns)
tRCD
(ns)
tRP
(ns)
tRAS
(ns)
tRC
(ns)
MT/s
Grade
CL-tRCD-tRP
DDR3L-1066
DDR3L-1333
-G7
-H9
1.875
1.5
7
9
13.125
13.5
13.125
13.5
37.5
36
50.625
7-7-7
9-9-9
49.5
(49.125)*
(13.125)* (13.125)*
13.75 13.75
(13.125)* (13.125)*
48.75
(48.125)*
DDR3L-1600
-PB
1.25
11
35
11-11-11
*SK hynix DRAM devices support optional downbinning to CL9 and CL7. SPD setting is programmed to match.
Speed Grade
Frequency [MHz]
Grade
Remark
CL6
CL7
CL8
CL9
CL10
CL11
-G7
-H9
-PB
800
800
800
1066
1066
1066
1066
1066
1066
1333
1333
1333
1333
1600
Address Table
4GB(1Rx8)
8GB(1Rx4)
8GB(2Rx8)
16GB(2Rx4)
32GB(4Rx4)
Refresh Method
Row Address
Column Address
Bank Address
Page Size
8K/64ms
A0-A15
A0-A9
8K/64ms
A0-A15
8K/64ms
A0-A15
A0-A9
8K/64ms
A0-A15
8K/64ms
A0-A15
A0-A9,A11
BA0-BA2
1KB
A0-A9,A11
BA0-BA2
1KB
A0-A9,A11
BA0-BA2
1KB
BA0-BA2
1KB
BA0-BA2
1KB
Rev. 1.0 / Aug. 2013
4
Pin Descriptions
Num
ber
Num
ber
Pin Name
Description
Pin Name
Description
CK0
CK0
Clock Input, positive line
Clock Input, negative line
Clock Input, positive line
Clock Input, negative line
Clock Enables
1
1
1
1
2
ODT[1:0]
DQ[63:0]
CB[7:0]
On Die Termination Inputs
Data Input/Output
2
64
8
CK1
Data check bits Input/Output
Data strobes
CK1
DQS[8:0]
DQS[8:0]
9
CKE[1:0]
Data strobes, negative line
9
DM[8:0]/
DQS[17:9],
TDQS[17:9]
Data Masks / Data strobes,
Termination data strobes
RAS
Row Address Strobe
1
1
9
9
Data strobes, negative line,
Termination data strobes
DQS[17:9],
TDQS[17:9]
CAS
WE
Column Address Strobe
Reserved for optional hardware
temperature sensing
Write Enable
Chip Selects
Address Inputs
1
4
EVENT
TEST
1
1
1
Memory bus test tool (Not Con-
nected and Not Usable on DIMMs)
S[3:0]
A[9:0],A11,
A[15:13]
14
RESET
Register and SDRAM control pin
VDD
VSS
A10/AP
A12/BC
BA[2:0]
Address Input/Autoprecharge
Address Input/Burst chop
SDRAM Bank Addresses
1
1
3
Power Supply
22
59
1
Ground
VREFDQ
Reference Voltage for DQ
Serial Presence Detect (SPD)
Clock Input
VREFCA
SCL
1
Reference Voltage for CA
1
VTT
SDA
SPD Data Input/Output
SPD Address Inputs
1
3
Termination Voltage
SPD Power
4
1
VDDSPD
SA[2:0]
Parity bit for the Address and
Control bus
Par_In
1
1
Parity error found on the
Address and Control bus
Err_Out
Rev. 1.0 / Aug. 2013
5
Input/Output Functional Descriptions
Symbol
Type
Polarity
Function
Positive
Line
Positive line of the differential pair of system clock inputs that drives input to the on-
DIMM Clock Driver.
CK0
IN
Negative Negative line of the differential pair of system clock inputs that drives the input to the
CK0
CK1
CK1
IN
IN
IN
Line
on-DIMM Clock Driver.
Positive
Line
Terminated but not used on RDIMMs.
Negative
Line
Terminated but not used on RDIMMs.
CKE HIGH activates, and CKE LOW deactivates internal clock signals, and device input
buffers and output drivers of the SDRAMs. Taking CKE LOW provides PRECHARGE
POWER-DOWN and SELF REFRESH operation (all banks idle), or ACTIVE POWER DOWN
(row ACTIVE in any bank)
Active
High
CKE[1:0]
IN
Enables the command decoders for the associated rank of SDRAM when low and dis-
ables decoders when high. When decoders are disabled, new commands are ignored
and previous operations continue. Other combinations of these input signals perform
unique functions, including disabling all outputs (except CKE and ODT) of the register(s)
on the DIMM or accessing internal control words in the register device(s). For modules
with two registers, S[3:2] operate similarly to S[1:0] for the second set of register out-
puts or register control words.
Active
Low
S[3:0]
IN
IN
Active
High
ODT[1:0]
On-Die Termination control signals
Active
Low
When sampled at the positive rising edge of the clock, CAS, RAS, and WE define the
operation to be executed by the SDRAM.
RAS, CAS, WE
VREFDQ
IN
Supply
Supply
Reference voltage for DQ0-DQ63 and CB0-CB7.
Reference voltage for A0-A15, BA0-BA2, RAS, CAS, WE, S0, S1, CKE0, CKE1, Par_In,
ODT0 and ODT1.
VREFCA
Selects which SDRAM bank of eight is activated.
BA0 - BA2 define to which bank an Active, Read, Write or Precharge command is being
applied. Bank address also determines mode register is to be accessed during an MRS
cycle.
BA[2:0]
IN
IN
—
Provided the row address for Active commands and the column address
and Auto Precharge bit for Read/Write commands to select one location out of the mem-
ory array in the respective bank. A10 is sampled during a Precharge command to deter-
mine whether the Precharge applies to one bank (A10 LOW) or all banks (A10 HIGH). If
only one bank is to be precharged, the bank is selected by BA. A12 is also utilized for BL
4/8 identification for ‘’BL on the fly’’ during CAS command. The address inputs also pro-
vide the op-code during Mode Register Set commands.
A[15:13,
12/BC,11,
10/AP,[9:0]
—
—
DQ[63:0],
CB[7:0]
I/O
IN
Data and Check Bit Input/Output pins
Active
High
DM[8:0]
Masks write data when high, issued concurrently with input data.
V
DD, VSS
VTT
Supply
Supply
Power and ground for the DDR SDRAM input buffers and core logic.
Termination Voltage for Address/Command/Control/Clock nets.
Rev. 1.0 / Aug. 2013
6
Symbol
Type
Polarity
Function
Positive
Edge
DQS[17:0]
I/O
Positive line of the differential data strobe for input and output data.
Negative
Edge
DQS[17:0]
I/O
Negative line of the differential data strobe for input and output data.
TDQS/TDQS is applicable for X8 DRAMs only. When enabled via Mode Register A11=1 in
MR1,DRAM will enable the same termination resistance function on TDQS/TDQS that is
applied to DQS/DQS. When disabled via mode register A11=0 in MR1, DM/TDQS will
provide the data mask function and TDQS is not used. X4 DRAMs must disable the TDQS
function via mode register A11=0 in MR1
TDQS[17:9]
TDQS[17:9]
OUT
These signals are tied at the system planar to either VSS or VDDSPD to configure the
serial SPD EEPROM address range.
SA[2:0]
SDA
IN
I/O
IN
—
—
—
This bidirectional pin is used to transfer data into or out of the SPD EEPROM. A resistor
must be connected from the SDA bus line to VDDSPD on the system planar to act as a
pullup.
This signal is used to clock data into and out of the SPD EEPROM. A resistor may be con-
nected from the SCL bus time to VDDSPD on the system planar to act as a pullup.
SCL
This signal indicates that a thermal event has been detected in the thermal sensing
device.The system should guarantee the electrical level requirement is met for the
EVENT pin on TS/SPD part.
OUT
(open
drain)
EVENT
VDDSPD
Active Low
No pull-up resister is provided on DIMM.
Serial EEPROM positive power supply wired to a separate power pin at the connector
which supports from 3.0 Volt to 3.6 Volt (nominal 3.3V) operation.
Supply
The RESET pin is connected to the RESET pin on the register and to the RESET pin on
the DRAM.
RESET
Par_In
IN
IN
Parity bit for the Address and Control bus. (“1 “: Odd, “0 “: Even)
OUT
(open
drain)
Parity error detected on the Address and Control bus. A resistor may be connected from
Err_Out bus line to VDD on the system planar to act as a pull up.
Err_Out
TEST
Used by memory bus analysis tools (unused (NC) on memory DIMMs)
Rev. 1.0 / Aug. 2013
7
Pin Assignments
Front Side
(left 1–60)
Back Side
(right 121–180)
Front Side
(left 61–120)
Back Side
(right 181–240)
Pin #
Pin #
Pin #
Pin #
1
2
3
4
VREFDQ
121
122
123
124
V
SS
61
62
63
64
A2
181
182
183
184
A1
VSS
DQ4
DQ5
VDD
VDD
VDD
CK0
DQ0
DQ1
NC, CK1
NC, CK1
VSS
DM0,DQS9,
TDQS9
5
6
V
SS
125
126
65
66
VDD
VDD
185
186
CK0
VDD
NC,DQS9,
TDQS9
DQS0
DQS0
7
8
127
128
129
130
131
132
133
VSS
67
68
69
70
71
72
73
VREFCA
Par_In, NC
VDD
187
188
189
190
191
192
193
EVENT, NC
A0
VSS
DQ6
DQ7
9
DQ2
DQ3
VDD
10
11
12
13
VSS
A10 / AP
BA0
BA1
VSS
DQ12
DQ13
VDD
DQ8
DQ9
VDD
RAS
VSS
WE
S0
DM1,DQS10,
TDQS10
14
15
V
SS
134
135
74
75
CAS
VDD
194
195
VDD
NC,DQS10,
TDQS10
DQS1
DQS1
ODT0
16
17
18
19
20
21
22
136
137
138
139
140
141
142
VSS
76
77
78
79
80
81
82
S1, NC
ODT1, NC
VDD
196
197
198
199
200
201
202
A13
VDD
VSS
DQ14
DQ15
DQ10
DQ11
S3, NC
VSS
S2, NC
VSS
VSS
DQ20
DQ21
VSS
DQ36
DQ37
DQ16
DQ17
DQ32
DQ33
VSS
VSS
DM2,DQS11,
TDQS11
DM4,DQS13,
TDQS13
23
24
V
SS
143
144
83
84
V
SS
203
204
NC,DQS11,
TDQS11
NC,DQS13,
TDQS13
DQS2
DQS2
DQS4
DQS4
25
26
27
28
29
30
31
145
146
147
148
149
150
151
VSS
85
86
87
88
89
90
91
205
206
207
208
209
210
211
VSS
VSS
DQ22
DQ23
VSS
DQ38
DQ39
DQ18
DQ19
DQ34
DQ35
VSS
VSS
VSS
DQ28
DQ29
VSS
DQ44
DQ45
DQ24
DQ25
DQ40
DQ41
VSS
VSS
NC = No Connect; RFU = Reserved Future Use
Rev. 1.0 / Aug. 2013
8
Front Side
(left 1–60)
Back Side
Front Side
Back Side
Pin #
32
Pin #
152
Pin #
92
Pin #
212
(right 121–180)
(left 61–120)
(right 181–240)
DM3,DQS12,
TDQS12
DM5,DQS14,
TDQS14
VSS
VSS
NC,DQS12,
TDQS12
NC,DQS14,
TDQS14
33
DQS3
DQS3
153
93
DQS5
DQS5
213
34
35
36
37
38
39
40
154
155
156
157
158
159
160
VSS
94
95
214
215
216
217
218
219
220
VSS
VSS
DQ30
DQ31
VSS
DQ46
DQ47
DQ26
DQ27
96
DQ42
DQ43
VSS
97
VSS
VSS
CB4, NC
CB5, NC
98
VSS
DQ52
DQ53
CB0, NC
CB1, NC
99
DQ48
DQ49
VSS
100
VSS
NC,DM8,DQS17,
TDQS17
DM6,DQS15,
TDQS15
41
42
V
SS
161
162
101
102
V
SS
221
222
NC,DQS17,
TDQS17
NC,DQS15,
TDQS15
DQS8
DQS8
DQS6
DQS6
43
44
45
46
47
48
163
164
165
166
167
168
VSS
103
104
105
106
107
108
109
223
224
225
226
227
228
229
VSS
VSS
CB6, NC
CB7, NC
VSS
DQ54
DQ55
CB2, NC
CB3, NC
DQ50
DQ51
VSS
VSS
VSS
NC(TEST)
RESET
VSS
DQ60
DQ61
VTT, NC
KEY
DQ56
DQ57
KEY
VSS
DM7,DQS16,
TDQS16
49
50
VTT, NC
CKE0
169
170
CKE1, NC
VDD
110
111
V
SS
230
231
NC,DQS16,
TDQS16
DQS7
DQS7
51
52
53
54
55
56
57
58
59
60
VDD
BA2
171
172
173
174
175
176
177
178
179
180
A15
A14
VDD
A12 / BC
A9
112
113
114
115
116
117
118
119
120
232
233
234
235
236
237
238
239
240
VSS
VSS
DQ62
DQ63
Err_Out, NC
VDD
DQ58
DQ59
VSS
A11
VSS
VDDSPD
SA1
A7
VDD
A8
SA0
SCL
SA2
VTT
VDD
SDA
A5
A6
VSS
A4
VDD
A3
VTT
VDD
NC = No Connect; RFU = Reserved Future Use
Rev. 1.0 / Aug. 2013
9
Registering Clock Driver Specifications
Capacitance Values
Symbol
CI
Parameter
Conditions
Min Typ Max Unit
Input capacitance, Data inputs
1.5
1.5
-
-
2.5
2.5
pF
pF
Input capacitance, CK, CK, FBIN, FBIN
(up to DDR3-1600)
Input capacitance, RESET, MIRROR,
QCSEN
CIR
VI = VDD or GND; VDD = 1.5v
-
-
3
pF
Input & Output Timing Requirements
DDR3L-800
1066/1333
DDR3L-1600
Symbol Parameter
Conditions
Unit
Min
Max
Min
Max
Input clock fre- Application fre-
fclock
fTEST
tSU
300
670
300
70
810
Mhz
Mhz
ps
quency
quency
Input clock fre-
quency
Test frequency
70
300
300
Input valid before
CK/CK
Setup time
100
175
-
-
50
-
-
Input to remain
valid after CK/CK
tH
Hold time
125
ps
Propagation
delay, single-bit CK/CK to output
switching
tPDM
tDIS
tEN
0.65
1.0
0.65
1.0
ns
ps
ps
Output disable
Yn/Yn to output
time (1/2-Clock
float
0.5 + tQSK1(min)
-
-
0.5 + tQSK1(min)
0.5 - tQSK1(max)
-
-
prelaunch)
Output enable
Output driving to
time (1/2-Clock
Yn/Yn
0.5 -
tQSK1(max)
prelaunch)
Rev. 1.0 / Aug. 2013
10
On DIMM Thermal Sensor
The DDR3 SDRAM DIMM temperature is monitored by integrated thermal sensor. The integrated thermal
sensor comply with JEDEC “TSE2002av, Serial Presence Detect with Temperature Sensor”.
Connection of Thermal Sensor
EVENT
SCL
SDA
SA0
SA1
SA2
EVENT
SCL
SPD with
Integrated
TS
SA0
SA1
SA2
SDA
Temperature-to-Digital Conversion Performance
Parameter
Temperature Sensor Accuracy (Grade B)
Resolution
Condition
Min
Typ
Max
Unit
Active Range,
75°C < TA < 95°C
-
± 0.5
± 1.0
± 1.0
°C
Monitor Range,
40°C < TA < 125°C
-
-
± 2.0
± 3.0
°C
-20°C < TA < 125°C
± 2.0
°C
°C
0.25
Rev. 1.0 / Aug. 2013
11
Functional Block Diagram
4GB, 512Mx72 Module(1Rank of x8)
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
DQS8
DQS8
DM8/DQS17
DQS17
CB[7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS4
DQS4
DM4/DQS13
DQS13
DQ[39:32]
DQS
DQS
TDQS
TDQS
DQ [7:0]
D8
D3
D2
D4
D5
D6
D7
DQS5
DQS5
DM5/DQS14
DQS14
DQ[47:40]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS3
DQS3
DM3/DQS12
DQS12
DQ[31:24]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS6
DQS6
DM6/DQS15
DQS15
DQ[55:48]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS2
DQS2
DM2/DQS11
DQS11
DQ[23:16]
DQS
DQS
TDQS
TDQS
DQ [7:0]
ZQ
DQS1
DQS1
DM1/DQS10
DQS10
DQ[15:8]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS7
DQS7
DM7/DQS16
DQS16
DQ[63:56]
DQS
DQS
TDQS
TDQS
DQ [7:0]
VDDSPD
SPD
D1
D0
VDD
D0–D8
VTT
VREFCA
VREFDQ
D0–D8
D0–D8
Vtt
ZQ
DQS0
DQS0
DM0/DQS9
DQS9
DQ[7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
VSS
D0–D8
Note:
1.DQ-to-I/O wiring may be changed within byte.
2.ZQ resistors are 240Ω±1%.For all other resistor values refer to the
appropriate wiring diagram.
Vtt
S0
S1
BA[N:0]
RS0A
RS0B
RBA[N:0]A
RBA[N:0]A
RA[N:0]A
RA[N:0]A
→
→
CS0: SDRAMs D[3:0], D8
CS0: SDRAMs D[7:4]
1:
2
R
E
G
I
S
T
E
R
/
→
→
BA[N:0]: SDRAMs D[3:0], D8
BA[N:0]: SDRAMs D[7:4]
A[N:0]
RAS
→
→
A[N:0]: SDRAMs D[3:0], D8
A[N:0]: SDRAMs D[7:4]
RRASA
RRASA
→
→
RAS: SDRAMs D[3:0], D8
RAS: SDRAMs D[7:4]
VDDSPD
EVENT
SCL
VDDSPD
SA0
SA0
SA1
SA2
VSS
CAS
RCASA
RCASA
RWEA
RWEA
RCKE0A
RCKE0B
RODT0A
RODT0B
PCK0A
PCK0B
PCK0A
PCK0B
→
→
CAS: SDRAMs D[3:0], D8
CAS: SDRAMs D[7:4]
EVENT SPD with SA1
Integrated
WE
SCL
SA2
VSS
→
→
WE: SDRAMs D[3:0], D8
WE: SDRAMs D[7:4]
TS
CKE0
SDA
→
CKE0: SDRAMs D[3:0], D8
CKE0: SDRAMs D[7:4]
SDA
→
ODT0
CK0
→
→
ODT0: SDRAMs D[3:0], D8
ODT0: SDRAMs D[7:4]
Plan to use SPD with Integrated TS of Class B and
might be changed on customer’s requests. For more
details of SPD and Thermal sensor, please contact
local SK hynix sales representative
P
L
L
→
→
CK: SDRAMs D[3:0], D8
CK: SDRAMs D[7:4]
120
Ω
±1%
CK0
CK0
→
→
CK: SDRAMs D[3:0], D8
CK: SDRAMs D[7:4]
120
±
Ω
1%
CK0
OERR
RST
PAR_IN
Err_Out
RST: SDRAMs D[8:0]
RESET
S[3:2], CKE1, ODT1, are NC (Unused register inputs ODT1 and CKE1 have a 330
Ω resistor to ground
Rev. 1.0 / Aug. 2013
12
8GB, 1Gx72 Module(1Rank of x4) - page1
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS8
DQS8
VSS
DQS17
DQS17
VSS
DQS4
DQS4
VSS
DQS13
DQS13
VSS
CB[3:0]
D8
D3
D2
D1
D0
CB[7:4]
D17
D12
D11
D10
D9
DQ[35:32]
D4
D5
D6
D7
DQ[39:36]
D13
D14
D15
D16
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS3
DQS3
VSS
DQS12
DQS12
VSS
DQS5
DQS5
VSS
DQS14
DQS14
VSS
DQ[27:24]
DQ[31:28]
DQ[43:40]
DQ[47:44]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS2
DQS2
VSS
DQS11
DQS11
VSS
DQ23:20]
DQS6
DQS6
VSS
DQS15
DQS15
VSS
DQ[55;52]
DQ[19:16]
DQ[51:48]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS1
DQS1
VSS
DQS10
DQS10
VSS
DQS7
DQS7
VSS
DQS16
DQS16
VSS
DQ[11;8]
DQ[15:12]
DQ[59:56]
DQ[63:60]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS0
DQS0
VSS
DQS9
DQS9
VSS
Vtt
DQ[3:0]
DQ[7:4]
Vtt
VDDSPD
EVENT
SCL
VDDSPD
SA0
SA0
Plan to use SPD with Integrated TS of Class B and
might be changed on customer’s requests. For more
details of SPD and Thermal sensor, please contact
local SK hynix sales representative
EVENT SPD with SA1
SA1
SA2
VSS
Integrated
SCL
SA2
VSS
TS
SDA
SDA
VDDSPD
SPD
Note:
VDD
D0–D17
D0–D17
D0–D17
D0–D17
1. DQ-to-I/O wiring may be changed within a nibble.
2. Unless otherwise noted, resistor values are 15%.
3. See the wiring diagrams for all resistors associated with the com-
5
VTT
VREFCA
VREFDQ
mand, address and control bus.
4. ZQ resistors are 240%. Fo1r all other resistor values refer to the appro-
priate wiring diagram.
VSS
D0–D17
Rev. 1.0 / Aug. 2013
13
8GB, 1Gx72 Module(1Rank of x4) - page2
S0
RS0A
RS0B
RS1A
RS1B
→
→
CS0: SDRAMs D[3:0], D[12:8], D17
CS0: SDRAMs D[7:4], D[16:13]
CS1: SDRAMs D[12:9], D17
S1
→
→
RBA[N:0]A
1:2
CS1: SDRAMs D[16:13]
BA[N:0]
A[N:0]
RAS
R
E
G
I
S
T
E
R
/
→
BA[N:0]: SDRAMs D[3:0], D[12:8], D17
BA[N:0]: SDRAMs D[7:4], D[16:13]
RBA[N:0]B
RA[N:0]A
RA[N:0]B
→
→
A[N:0]: SDRAMs D[3:0], D[12:8], D17
→
A[N:0]: SDRAMs D[7:4], D[16:13]
RRASA
RRASB
→
→
RAS: SDRAMs D[3:0], D[12:8], D17
RAS: SDRAMs D[7:4], D[16:13]
CAS
RCASA
RCASB
RWEA
RWEB
RCKE0A
RCKE0B
→
→
CAS: SDRAMs D[3:0], D[12:8], D17
CAS: SDRAMs D[7:4], D[16:13]
WE
→
→
WE: SDRAMs D[3:0], D[12:8], D17
WE: SDRAMs D[7:4], D[16:13]
CKE0
→
CKE0: SDRAMs D[3:0], D[12:8], D17
CKE0: SDRAMs D[7:4], D[16:13]
→
ODT0
P
L
RODT0A
RODT0B
→
→
ODT0: SDRAMs D[3:0], D[12:8]. D17
ODT0: SDRAMs D[7:4], D[16:13]
L
CK0
CK0
PCK0A
PCK0B
→
→
CK: SDRAMs D[3:0], D8
CK: SDRAMs D[7:4]
PCK0A
PCK0B
→
→
CK: SDRAMs D[3:0], D8
CK: SDRAMs D[7:4]
PAR_IN
OERR
Err_Out
RESET
RST
RST: SDRAMs D[17:0]
* S[3:2], CKE1, ODT1, CK1 and CK1 are NC (Unused register inputs ODT1 and CKE1 have a 330
resistor to ground.)
Rev. 1.0 / Aug. 2013
14
8GB, 1Gx72 Module(2Rank of x8) - page1
DQS8
DQS8
DM8/DQS17
DQS17
CB[7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS4
DQS4
DM4/DQS13
DQS13
DQ[39:32]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
D8
D3
D2
D1
D0
D4
D5
D6
D7
D17
D12
D11
D10
D9
D13
D14
D15
D16
ZQ
ZQ
ZQ
ZQ
DQS3
DQS3
DM3/DQS12
DQS12
DQ[31:24]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS5
DQS5
DM5/DQS14
DQS14
DQ[47:40]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
ZQ
ZQ
ZQ
ZQ
DQS2
DQS2
DM2/DQS11
DQS11
DQ[23:16]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS6
DQS6
DM6/DQS15
DQS15
DQ55:48]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
ZQ
ZQ
ZQ
ZQ
DQS1
DQS1
DM1/DQS10
DQS10
DQ[15:8]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS7
DQS7
DM7/DQS16
DQS16
DQ[63:56]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
ZQ
ZQ
ZQ
ZQ
Vtt
DQS0
DQS0
DM0/DQS9
DQS9
DQ[7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
DQS
DQS
TDQS
TDQS
DQ [7:0]
ZQ
ZQ
VDDSPD
EVENT
SCL
VDDSPD
SA0
SA0
SA1
SA2
VSS
EVENT SPD with SA1
Vtt
Integrated
SCL
SA2
VSS
TS
SDA
SDA
Plan to use SPD with Integrated TS of Class B and
might be changed on customer’s requests. For more
details of SPD and Thermal sensor, please contact
local SK hynix sales representative
Note:
1. DQ-to-I/O wiring may be changed within a byte.
2. Unless otherwise noted, resistor values are 15Ω±5%.
3. ZQ resistors are 240Ω±1%. For all other resistor values
refer to the appropriate wiring diagram.
VDDSPD
Serial PD
V
DD
4. See the wiring diagrams for all resistors associated with the
command, address and control bus.
D0–D17
D0–D17
D0–D17
D0–D17
VTT
VREFCA
VREFDQ
VSS
D0–D17
Rev. 1.0 / Aug. 2013
15
8GB, 1Gx72(2Rank of x8) - page2
S0
RS0A
RS0B
RS1A
RS1B
→
→
CS0: SDRAMs D[3:0], D8
CS0: SDRAMs D[7:4]
1:2
S1
→
→
CS1: SDRAMs D[12:9], D17
CS1: SDRAMs D[16:13]
R
E
G
I
S
T
E
R
/
S[3:2] NC
BA[N:0]
RBA[N:0]A
→
BA[N:0]: SDRAMs D[3:0], D[12:8], D17
BA[N:0]: SDRAMs D[7:4], D[16:13]
RBA[N:0]B
→
A[N:0]
RAS
RA[N:0]A
RA[N:0]B
→
A[N:0]: SDRAMs D[3:0], D[12:8], D17
→
A[N:0]: SDRAMs D[7:4], D[16:13]
RRASA
RRASB
→
→
RAS: SDRAMs D[3:0], D[12:8], D17
RAS: SDRAMs D[7:4], D[16:13]
CAS
RCASA
RCASB
RWEA
RWEB
RCKE0A
RCKE0B
RCKE1A
RCKE1B
→
→
CAS: SDRAMs D[3:0], D[12:8], D17
CAS: SDRAMs D[7:4], D[16:13]
WE
→
→
→
→
WE: SDRAMs D[3:0], D[12:8], D17
WE: SDRAMs D[7:4], D[16:13]
CKE0: SDRAMs D[3:0], D8
CKE0: SDRAMs D[7:4]
CKE1: SDRAMs D[12:9], D17
CKE1: SDRAMs D[16:13]
CKE0
CKE1
P
L
L
→
→
ODT0
RODT0A
RODT0B
→
→
ODT0: SDRAMs D[3:0], D8
ODT0: SDRAMs D[7:4]
ODT1
CK0
RODT1A
RODT1A
→
→
ODT1: SDRAMs D[12:9], D17
ODT1: SDRAMs D[16:13]
PCK0A
PCK0B
PCK1A
PCK1B
PCK0A
PCK0B
PCK1A
PCK1B
→
CK: SDRAMs D[3:0], D8
CK: SDRAMs D[7:4]
→
→
→
→
→
→
→
120
±5%
Ω
CK: SDRAMs D[12:9], D17
CK: SDRAMs D[16:13]
CK: SDRAMs D[3:0], D8
CK: SDRAMs D[7:4]
CK: SDRAMs D[12:9], D17
CK: SDRAMs D[16:13
CK0
]
CK1
CK1
120
Ω
±5%
PAR_IN
OERR
Err_Out
RESET
RST
RST: SDRAMs D[17:0]
* S[3:2], CK1 and CK1 are NC
Rev. 1.0 / Aug. 2013
16
16GB, 2Gx72 Module(2Rank of x4) - page1
DQS
DQS
DQS
DQS
DQS17
DQS8
DQS17
VSS
DQS
DM
DQS
DM
DQS8
VSS
DQS
DM
DQS
DM
CB[7:4]
DQ [3:0]
D17
D12
D11
D10
D0
DQ [3:0]
D35
D30
D29
D28
D18
CB[3:0]
DQ [3:0]
D8
D3
D2
D1
D9
DQ [3:0]
D26
D21
D20
D19
D27
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS12
DQS12
VSS
DQS3
DQS3
VSS
DQ[31:28]
DQ[27:24]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS11
DQS11
VSS
DQS2
DQS2
VSS
DQ[23:20]
DQ[19:16]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS10
DQS10
VSS
DQS1
DQS1
VSS
DQ[15:12]
DQ[11:8]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS0
DQS0
VSS
DQS9
DQS9
VSS
DQ[3:0]
DQ[7:4]
Vtt
Vtt
Rev. 1.0 / Aug. 2013
17
16GB, 2Gx72 Module(2Rank of x4) - page2
DQS
DQS
DQS
DQS
DQS14
DQS13
DQS14
VSS
DQS
DM
DQS
DM
DQS13
VSS
DQS
DM
DQS
DM
DQ[47:44]
DQ [3:0]
D14
DQ [3:0]
D32
D22
D34
D25
DQ[39:36]
DQ [3:0]
D13
DQ [3:0]
D31
D23
D33
D24
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS4
DQS4
VSS
DQS5
DQS5
VSS
DQ[35:32]
D4
DQ[43:40]
D5
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS16
DQS16
VSS
DQS15
DQS15
VSS
DQ[63:60]
D16
DQ[55:52]
D15
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS
DQS
DM
DQ [3:0]
DQS7
DQS7
VSS
DQS6
DQS6
VSS
DQ[59:56]
D7
DQ[51:48]
D6
Vtt
Vtt
V
SPD
DDSPD
VDDSPD
EVENT
SCL
VDDSPD
SA0
SA0
SA1
SA2
VSS
V
DD
D0–D35
D0–D35
D0–D35
D0–D35
EVENT SPD with SA1
V
TT
Integrated
SCL
SA2
VSS
VREFCA
VREFDQ
TS
SDA
SDA
V
SS
D0–D35
Plan to use SPD with Integrated TS of Class B and
might be changed on customer’s requests. For more
details of SPD and Thermal sensor, please contact
local SK hynix sales representative
Note:
1. DQ-to-I/O wiring may be changed within a nibble.
2. See wiring diagrams for all resistors values.
3. ZQ pins of each SDRAM are connected to individual RZQ resistors (240+/-1%) ohms.
Rev. 1.0 / Aug. 2013
18
16GB, 2Gx72 Module(2Rank of x4) - page3
S0
S1
RS0A
RS0B
RS1A
RS1B
→
→
CS0: SDRAMs D[3:0], D[12:8], D17
CS0: SDRAMs D[7:4], D[16:13]
1:2
→
→
CS1: SDRAMs D[21:18], D[30:26], D35
CS1: SDRAMs D[25:22], D[34:31]
R
E
G
I
S
T
E
R
/
BA[N:0]
A[N:0]
RBA[N:0]A
→
BA[N:0]: SDRAMs D[3:0], D[12:8], D[21:17], D[30:26], D35
BA[N:0]: SDRAMs D[7:4], D[16:13], D[25:22], D[34:31]
RBA[N:0]B
→
RA[N:0]A
RA[N:0]B
→
A[N:0]: SDRAMs D[3:0], D[12:8], D[21:17], D[30:26], D35
→
A[N:0]: SDRAMs D[7:4], D[16:13], D[25:22], D[34:31]
RAS
CAS
RRASA
RRASB
→
→
RAS: SDRAMs D[3:0], D[12:8], D[21:17], D[30:26], D35
RAS: SDRAMs D[7:4], D[16:13], D[25:22], D[34:31]
RCASA
RCASB
RWEA
RWEB
RCKE0A
RCKE0B
RCKE1A
RCKE1B
→
→
CAS: SDRAMs D[3:0], D[12:8], D[21:17], D[30:26], D35
CAS: SDRAMs D[7:4], D[16:13], D[25:22], D[34:31]
WE
→
→
→
→
WE: SDRAMs D[3:0], D[12:8], D[21:17], D[30:26], D35
WE: SDRAMs D[7:4], D[16:13], D[25:22], D[34:31]
CKE0: SDRAMs D[3:0], D[12:8], D17
CKE0: SDRAMs D[7:4], D[16:13]
CKE1: SDRAMs D[21:18], D[30:26], D35
CKE1: SDRAMs D[25:22], D[34:31]
CKE0
CKE1
P
L
L
→
→
ODT0
RODT0A
RODT0B
→
→
ODT0: SDRAMs D[3:0], D[12:8], D17
ODT0: SDRAMs D[7:4], D[16:13]
ODT1
CK0
RODT1A
RODT1A
→
→
ODT1: SDRAMs D[21:18], D[30:26], D35
ODT1: SDRAMs D[25:22], D[34:31]
PCK0A
PCK0B
PCK1A
PCK1B
PCK0A
PCK0B
PCK1A
PCK1B
→
CK: SDRAMs D[3:0], D[12:8], D17
CK: SDRAMs D[7:4], D[16:13]
→
→
→
→
→
→
→
CK: SDRAMs D[21:18], D[30:26], D35
CK: SDRAMs D[25:22], D[34:31]
CK: SDRAMs D[3:0], D[12:8], D17
CK: SDRAMs D[7:4], D[16:13]
CK: SDRAMs D[21:18], D[30:26], D35
CK: SDRAMs D[25:22], D[34:31]
CK0
CK1
120
Ω
±5%
CK1
PAR_IN
Err_Out
RESET
RST
RST: SDRAMs D[35:0]
* S[3:2], CK1 and CK1 are NC
Rev. 1.0 / Aug. 2013
19
32GB, 4Gx72 Module(4Rank of x4) - page1
VSS
DQS8
DQS8
VSS
ZQ
VSS
VSS
VSS
VSS
VSS
ZQ
VSS
VSS
VSS
VSS
VSS
ZQ
VSS
VSS
VSS
VSS
VSS
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
D9
D7
D5
D3
D1
D8
D6
D4
D2
D0
D45
D47
D49
D51
D53
D44
D46
D48
D50
D52
CB[3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
DQS3
DQS3
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQ[27:24]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS2
DQS2
VSS
DQ[19:16]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS1
DQS1
VSS
DQS
DQS
DM
DQ[11:8]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS0
DQS0
VSS
DQS
DQS
DM
DQ[3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
Vtt
Rev. 1.0 / Aug. 2013
20
32GB, 4Gx72 Module(4Rank of x4) - page2
VSS
DQS17
DQS17
VSS
ZQ
VSS
VSS
VSS
VSS
VSS
ZQ
VSS
VSS
VSS
VSS
VSS
ZQ
VSS
VSS
VSS
VSS
VSS
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
D27
D25
D23
D21
D19
D26
D24
D22
D20
D18
D63
D65
D67
D69
D71
D62
D64
D66
D68
D70
CB[7:4]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
DQS12
DQS12
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQ[31:28]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS11
DQS11
VSS
DQ[23:20]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS10
DQS10
VSS
DQS
DQS
DM
DQ[11:8]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS9
DQS9
VSS
DQS
DQS
DM
DQ[7:4]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
Vtt
Rev. 1.0 / Aug. 2013
21
32GB, 4Gx72 Module(4Rank of x4) - page3
VSS
DQS4
DQS4
VSS
ZQ
VSS
VSS
VSS
VSS
ZQ
VSS
VSS
VSS
VSS
ZQ
VSS
VSS
VSS
VSS
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
D11
D13
D15
D17
D10
D12
D14
D16
D13
D41
D39
D37
D42
D40
D38
D36
DQ[35:32]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
DQS5
DQS5
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQ[43:40]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS6
DQS6
VSS
DQ[51:48]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS7
DQS7
VSS
DQS
DQS
DM
DQ[59:56
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
Vtt
Rev. 1.0 / Aug. 2013
22
32GB, 4Gx72 Module(4Rank of x4) - page4
VSS
DQS13
DQS13
VSS
ZQ
VSS
VSS
VSS
VSS
ZQ
VSS
VSS
VSS
VSS
ZQ
VSS
VSS
VSS
VSS
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
D29
D31
D33
D35
D28
D30
D32
D34
D61
D59
D57
D55
D60
D58
D56
D54
DQ[39:36]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
DQS14
DQS14
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQ[47:44]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS15
DQS15
VSS
DQ[55:52]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
VSS
ZQ
ZQ
ZQ
ZQ
DQS
DQS
DM
DQS
DQS
DM
DQS
DQS
DM
DQS16
DQS16
VSS
DQS
DQS
DM
DQ[63:60]
DQ [3:0]
DQ [3:0]
DQ [3:0]
DQ [3:0]
Vtt
V
SPD
DDSPD
VDDSPD
EVENT
SCL
VDDSPD
SA0
SA0
SA1
SA2
VSS
VDD
D0–D71
EVENT SPD with SA1
V
TT
Integrated
SCL
SA2
VSS
D0–D71
D0–D71
VREFCA
VREFDQ
TS
SDA
SDA
VSS
D0–D71
Plan to use SPD with Integrated TS of Class B and
might be changed on customer’s requests. For more
details of SPD and Thermal sensor, please contact
local Hynix sales representative
Note:
1. DQ-to-I/O wiring may be changed within a nibble.
2. Unless otherwise noted, resistor values are 15 Ohms ±5%.
3. See the wiring diagrams for all resistors associated with the command, address and
control bus.
4. ZQ resistors are 240 Ohms ±1%. For all other resistor values refer to the appropriate
wiring diagram.
Rev. 1.0 / Aug. 2013
23
32GB, 4Gx72 Module(4Rank of x4) - page5
S0
S1
ARS0A
ARS0B
→
→
CS1: SDRAMs D1,D3,D5,D7 D9,
D19, D21, D23, D25, D27
CS1: SDRAMs D11, D13, D15, D17,
D29, D31, D33, D35
S2
S3
BRS2A
BRS2B
→
→
CS1: SDRAMs D45,D47,D49,D51,D53
D63,D65,D67,D69,D71
CS1: SDRAMs D37,D39,D41,D43,
D55,D57,D59,D61
1:2
1:2
R
E
G
I
S
T
E
R
/
R
E
G
I
S
T
E
R
/
ARS1A
ARS1B
→
→
CS0: SDRAMs D0, D2, D4, D6, D8,
D18, D20, D22, D24, D26
CS0: SDRAMs D10, D12, D14, D16,
BRS3A
BRS3B
→
→
CS0: SDRAMs D44.D46,D48,D50,D52,
D62,D64,D66,D68,D70
CS0: SDRAMs D36,D38,D40,D42,
D28, D30, D32, D34
D54,D56,D58,D60
BA[N:0]
A[N:0]
ARBA[N:0]A
ARBA[N:0]B
→
BA[N:0]: SDRAMs D[9:0],D[27:18] BA[N:0]
BA[N:0]: SDRAMs D[17:10],D[35:28]
BRBA[N:0]A
BRBA[N:0]B
→
BA[N:0]: SDRAMs D[53:44],D[71:62]
→
→ BA[N:0]: SDRAMs D[43:36],D[61:54]
ARA[N:0]A
→
A[N:0]: SDRAMs D[9:0],D[27:18]
BRA[N:0]A
→
A[N:0]: SDRAMs D[55:44],D[71:62]
A[N:0]
ARA[N:0]B
→
A[N:0]: SDRAMs D[17:10],D[35:28]
BRA[N:0]B
→ A[N:0]: SDRAMs D[43:36],D[61:54]
RAS
CAS
RAS
ARRASA
ARRASB
→
→
RAS: SDRAMs D[9:0],D[27:18]
RAS: SDRAMs D[17:10],D[35:28]
BRRASA
BRRASB
→
→
RAS: SDRAMs D[53:44],D[71:62]
RAS: SDRAMs D[43:36],D[61:54]
P
L
L
P
L
L
ARCASA
ARCASB
ARWEA
ARWEB
→
→
CAS: SDRAMs D[9:0],D[27:18]
CAS: SDRAMs D[17:10],D[35:28]
BRCASA
BRCASB
BRWEA
→
→
CAS: SDRAMs D[53:44],D[71:62]
CAS: SDRAMs D[43:36],D[61:54]
CAS
→
→
WE: SDRAMs D[9:0],D[27:18]
WE: SDRAMs D[17:10],D[35:28]
→
WE: SDRAMs D[53:44],D[71:62]
WE
WE
BRWEB → WE: SDRAMs D[43:36],D[61:54]
ARCKE0A
ARCKE0B
ARCKE1A
ARCKE1B
→
CKE1: SDRAMs D1,D3,D5,D7,D9,
D19, D21, D23, D25, D27
CKE1: SDRAMs D11,D13,D15,D17,
D29, D31, D33, D35
CKE0: SDRAMs D0,D2,D4,D6,D8,
D18, D20, D22, D24, D26
CKE0: SDRAMs D10,D12,D14,D16,
D28, D30, D32, D34
ODT1: SDRAMs D1,D3,D5,D7,D9,
D19, D21, D23, D25, D27
ODT0: SDRAMs D11,D13,D15,D17,
BRCKE0A
BRCKE0B
BRCKE1A
BRCKE1B
→
CKE1: SDRAMs D45,D47,D49,D51,D53,
D63,D65,D67,D69,D71
CKE1: SDRAMs D37,D39,D41,D43,
D55,D57,D59,D61
CKE0: SDRAMs D44.D46,D48,D50,D52,
D62,D64,D66,D68,D70
CKE0: SDRAMs D36,D38,D40,D42,
D54,D56,D58,D60
ODT1: SDRAMs D45,D47,D49,D51,D53
D63,D65,D67,D69,D71
ODT0: SDRAMs D37,D39,D41,D43
CKE0
CKE0
A
B
→
→
→
→
→
→
CKE1
ODT0
CKE1
ODT1
ARODT0A
ARODT0B
→
BRODT1A
BRODT1B
→
→
→
D29, D31, D33, D35
D55,D57,D59,D61
APCK0A
APCK0B
APCK1A
APCK1B
APCK0A
APCK0B
APCK1A
APCK1B
→
CK: SDRAMs D[9:0]
CK: SDRAMs D[17:10]
CK: SDRAMs D[27:18]
CK: SDRAMs D[35:28]
CK: SDRAMs D[9:0]
CK: SDRAMs D[17:10]
CK: SDRAMs D[27:18]
CK: SDRAMs D[35:28]
BPCK0A
BPCK0B
BPCK1A
BPCK1B
BPCK0A
BPCK0B
BPCK1A
BPCK1B
→
CK: SDRAMs D[53:44]
CK: SDRAMs D[43:36]
CK: SDRAMs D[71:62]
CK: SDRAMs D[61:54]
CK: SDRAMs D[53:44]
CK: SDRAMs D[43:36]
CK: SDRAMs D[71:62]
CK: SDRAMs D[61:54]
CK0
CK0
CK0
CK0
→
→
→
→
→
→
→
→
→
→
→
→
→
→
120
Ω
120
Ω
±5%
±5%
PAR_IN
PAR_IN
Err_Out
Err_Out
RESET
RST
RESET
RST
RST: SDRAMs D[35:0]
CK1
CK1
120
Ω
±5%
1. CK0 and CK0 are differentially terminated with a single 120 Ohms ±5% resistor.
2. CK1 and CK1 are differentially terminated with a single 120 Ohms ±5% resistor, but is not used.
3. Unused register inputs ODT1 for Register A and ODT0 for Register B are tied to ground.
4. The module drawing on this page is not drawn to scale.
Rev. 1.0 / Aug. 2013
24
Absolute Maximum Ratings
Absolute Maximum DC Ratings
Absolute Maximum DC Ratings
Symbol
Parameter
Voltage on VDD pin relative to Vss
Voltage on VDDQ pin relative to Vss
Voltage on any pin relative to Vss
Storage Temperature
Rating
Units
Notes
VDD
- 0.4 V ~ 1.80 V
V
1,3
VDDQ
VIN, VOUT
TSTG
- 0.4 V ~ 1.80 V
- 0.4 V ~ 1.80 V
-55 to +100
V
1,3
1
V
oC
1, 2
Notes:
1. Stresses greater than those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rat-
ing conditions for extended periods may affect reliability.
2. Storage Temperature is the case surface temperature on the center/top side of the DRAM. For the measurement
conditions, please refer to JESD51-2 standard.
3. VDD and VDDQ must be within 300mV of each other at all times; and VREF must not be greater than
0.6XVDDQ,When VDD and VDDQ are less than 500mV; VREF may be equal to or less than 300mV.
DRAM Component Operating Temperature Range
Temperature Range
Symbol
Parameter
Normal Operating Temperature Range
Extended Temperature Range
Rating
Units
oC
Notes
0 to 85
1,2
TOPER
85 to 95
oC
1,3
Notes:
1. Operating Temperature TOPER is the case surface temperature on the center / top side of the DRAM. For mea-
surement conditions, please refer to the JEDEC document JESD51-2.
2. The Normal Temperature Range specifies the temperatures where all DRAM specifications will be supported. Dur-
ing operation, the DRAM case temperature must be maintained between 0 - 85oC under all operating conditions.
3. Some applications require operation of the DRAM in the Extended Temperature Range between 85oC and 95oC
case temperature. Full specifications are guaranteed in this range, but the following additional conditions apply:
a. Refresh commands must be doubled in frequency, therefore reducing the Refresh interval tREFI to 3.9 µs. It
is also possible to specify a component with 1X refresh (tREFI to 7.8µs) in the Extended Temperature Range.
Please refer to the DIMM SPD for option availability
b. If Self-Refresh operation is required in the Extended Temperature Range, then it is mandatory to use the
Manual Self-Refresh mode with Extended Temperature Range capability (MR2 A6 = 0b and MR2 A7 = 1b).
DDR3 SDRAMs support Extended Temperature Range and please refer to component datasheet and/or the
DIMM SPD for tFEFI requirements in the Extended Temperature Range.
Rev. 1.0 / Aug. 2013
25
AC & DC Operating Conditions
Recommended DC Operating Conditions
Recommended DC Operating Conditions - DDR3L (1.35V) operation
Rating
Symbol
Parameter
Units
Notes
Min.
Typ.
Max.
VDD
1.283
1.35
1.45
V
V
1,2,3,4
1,2,3,4
Supply Voltage
Supply Voltage for Output
VDDQ
1.283
1.35
1.45
Notes:
1. Maximum DC value may not be greater than 1.425V. The DC value is the linear average of VDD/VDDQ (t) over a
very long period of time (e.g., 1 sec).
2. If maximum limit is exceeded, input levels shall be governed by DDR3 specifications.
3. Under these supply voltages, the device operates to this DDR3L specification.
4. Once initialized for DDR3L operation, DDR3 operation may only be used if the device is in reset while VDD and
VDDQ are changed for DDR3 operation (see Figure 0).
Recommended DC Operating Conditions - - DDR3 (1.5V) operation
Rating
Parameter
Units
Notes
Min.
Typ.
Max.
VDD
1.425
1.5
1.575
V
V
1,2,3
1,2,3
Supply Voltage
Supply Voltage for Output
VDDQ
1.425
1.5
1.575
Notes:
1. If minimum limit is exceeded, input levels shall be governed by DDR3L specifications.
2. Under 1.5V operation, this DDR3L device operates to the DDR3 specifications under the same speed timings as
defined for this device.
3. Once initialized for DDR3 operation, DDR3L operation may only be used if the device is in reset while VDD and
VDDQ are changed for DDR3L operation (see Figure 0).
Rev. 1.0 / Aug. 2013
26
Ta
Tb
Tc
Td
Te
Tf
Tg
Th
Ti
Tj
Tk
CK,CK#
tCKSRX
Tmin = 10ns
VDD, VDDQ (DDR3)
VDD, VDDQ (DDR3L)
Tmin = 10ns
Tmin = 200us
T = 500us
RESET#
Tmin = 10ns
CKE
VALID
VALID
tDLLK
tIS
tXPR
tMRD
tMRD
tMRD
tMOD
tZQinit
1)
COMMAND
BA
READ
READ
1)
MRS
MR2
MRS
MR3
MRS
MR1
MRS
MR0
ZQCL
VALID
tIS
tIS
ODT
RTT
READ
Static LOW in case RTT_Nom is enabled at time Tg, otherwise static HIGH or LOW
VALID
NOTE 1: From time point “Td” until “Tk” NOP or DES commands must be applied
between MRS and ZQCL commands.
DON’T CARE
TIME BREAK
Figure 0 - VDD/VDDQ Voltage Switch Between DDR3L and DDR3
Rev. 1.0 / Aug. 2013
27
AC & DC Input Measurement Levels
AC and DC Logic Input Levels for Single-Ended Signals
AC and DC Input Levels for Single-Ended Command and Address Signals
Single Ended AC and DC Input Levels for Command and Address
DDR3L-800/1066
DDR3L-1333/1600
Symbol
Parameter
Unit Notes
Min
Max
Min
Max
VIH.CA(DC90) DC input logic high
VIL.CA(DC90) DC input logic low
Vref + 0.09
VDD
Vref - 0.09
Note2
Vref + 0.09
VDD
Vref - 0.09
Note2
V
V
V
V
V
V
V
V
1
VSS
VSS
1
VIH.CA(AC160) AC input logic high
VIL.CA(AC160) AC input logic low
VIH.CA(AC135) AC Input logic high
VIL.CA(AC135) AC input logic low
VIH.CA(AC125) AC Input logic high
VIL.CA(AC125) AC input logic low
Reference Voltage for
Vref + 0.160
Vref + 0.160
1,2,5
1,2,5
1,2,5
1,2,5
1,2,5
1,2,5
Note2
Vref - 0.160
Note2
Note2
Vref - 0.160
Note2
Vref + 0.135
Vref + 0.135
Note2
Vref - 0.135
-
Note2
Vref - 0.135
-
-
-
-
-
-
-
VRefCA(DC
)
0.49 * VDD
0.51 * VDD
0.49 * VDD
0.51 * VDD
V
3,4
ADD, CMD inputs
Notes:
1. For input only pins except RESET, Vref = VrefCA (DC).
2. Refer to "Overshoot and Undershoot Specifications" on page 41.
3. The ac peak noise on VRef may not allow VRef to deviate from VRefCA(DC) by more than +/-1% VDD (for
ence: approx. +/- 13.5 mV).
refer-
4. For reference: approx. VDD/2 +/- 13.5 mV
5. These levels apply for 1.35 volt (see table above) operation only. If the device is operated at 1.5V (table "Single
Ended AC and DC Input Levels for DQ and DM" on page 29), the respective levels in JESD79-3 (VIH/L.CA(DC100),
VIH/L.CA(AC175), VIH/L.CA(AC150), VIH/L.CA(AC135), VIH/L.CA(AC125) etc.) apply. The 1.5V levels (VIH/
L.CA(DC100), VIH/L.CA(AC175), VIH/L.CA(AC150), VIH/L.CA(AC135), VIH/L.CA(AC125) etc.) do not apply when
the device is operated in the 1.35 voltage range.
Rev. 1.0 / Aug. 2013
28
AC and DC Input Levels for Single-Ended Signals
DDR3 SDRAM will support two Vih/Vil AC levels for DDR3-800 and DDR3-1066 as specified in the table
below. DDR3 SDRAM will also support corresponding tDS values (Table 43 and Table 50 in “ DDR3L Device
Operation”) as well as derating tables in Table 46 of “DDR3L Device Operation” depending on Vih/Vil AC
levels.
Single Ended AC and DC Input Levels for DQ and DM
DDR3L-800/1066
DDR3L-1333/1600
Symbol
Parameter
Unit Notes
Min
Max
Min
Max
VIH.DQ(DC90) DC input logic high
VIL.DQ(DC90) DC input logic low
Vref + 0.09
VSS
VDD
Vref - 0.09
Note2
Vref + 0.09
VDD
V
V
V
V
V
V
V
V
1
VSS
Vref - 0.09
1
VIH.DQ(AC160) AC input logic high Vref + 0.160
VIL.DQ(AC160) AC input logic low Note2
VIH.DQ(AC135) AC Input logic high Vref + 0.135
-
-
1, 2, 5
1, 2, 5
1, 2, 5
1, 2, 5
1, 2, 5
1, 2, 5
Vref - 0.160
Note2
-
-
Vref + 0.135
Note2
VIL.DQ(AC135) AC input logic low
VIH.DQ(AC130) AC Input logic high
VIL.DQ(AC130) AC input logic low
Reference Voltage
Note2
Vref - 0.135
-
Note2
Vref - 0.135
-
-
-
-
-
-
-
VRefDQ(DC
)
0.49 * VDD
0.51 * VDD
0.49 * VDD
0.51 * VDD
V
3, 4
for DQ, DM inputs
Notes:
1. Vref = VrefDQ (DC).
2. Refer to "Overshoot and Undershoot Specifications" on page 41.
3. The ac peak noise on VRef may not allow VRef to deviate from VRefDQ(DC) by more than +/-1% VDD (for reference:
approx. +/- 13.5 mV). 4. For reference: approx. VDD/2 +/- 13.5 mV
4. For reference: approx. VDD/2 +/- 13.5 mV
5. These levels apply for 1.35 volt (table "Single Ended AC and DC Input Levels for Command and Address" on
page 28) operation only. If the device is operated at 1.5V (table above), the respective levels in JESD79-3 (VIH/
L.DQ(DC100), VIH/L.DQ(AC175), VIH/L.DQ(AC150), VIH/L.DQ(AC135) etc.) apply. The 1.5V levels (VIH/
L.DQ(DC100), VIH/L.DQ(AC175), VIH/L.DQ(AC150), VIH/L.DQ(AC135) etc.) do not apply when the device is
operated in the 1.35 voltage range. used as simplified symbol for VIL.DQ(AC175), VIL.DQ(AC150), and
VIL.DQ(AC135); VIL.DQ(AC175) value is used when Vref - 0.175V is referenced, VIL.DQ(AC150) value is used
when Vref - 0.150V is referenced, and VIL.DQ(AC135) value is used when Vref - 0.135V is referenced.
Rev. 1.0 / Aug. 2013
29
Vref Tolerances
The dc-tolerance limits and ac-noise limits for the reference voltages
and V
are illustrated in
RefDQ
VRefCA
figure below. It shows a valid reference voltage V (t) as a function of time. (V stands for V and
RefCA
Ref
Ref
V
likewise).
RefDQ
V
(DC) is the linear average of V (t) over a very long period of time (e.g. 1 sec). This average has to
Ref
Ref
meet the min/max requirements in the table "Differential Input Slew Rate Definition" on page 36. Further-
more V (t) may temporarily deviate from V
by no more than +/- 1% VDD.
Ref
Ref (DC)
voltage
VDD
V
(t)
Ref
V
ac-noise
Ref
V
Ref(DC)max
V
Ref(DC)
VDD/2
V
Ref(DC)min
VSS
time
Illustration of V
tolerance and V
ac-noise limits
Ref
Ref(DC)
The voltage levels for setup and hold time measurements V
, V
, V
, and V
are depen-
IL(DC)
IH(AC)
IH(DC)
IL(AC)
dent on V
.
Ref
“V ” shall be understood as V
, as defined in figure above.
Ref
Ref(DC)
This clarifies that dc-variations of V affect the absolute voltage a signal has to reach to achieve a valid
Ref
high or low level and therefore the time to which setup and hold is measured. System timing and voltage
budgets need to account for V
deviations from the optimum position within the data-eye of the input
Ref(DC)
signals.
This also clarifies that the DRAM setup/hold specification and derating values need to include time and
voltage associated with V ac-noise. Timing and voltage effects due to ac-noise on V up to the speci-
Ref
Ref
fied limit (+/- 1% of VDD) are included in DRAM timings and their associated deratings.
Rev. 1.0 / Aug. 2013
30
AC and DC Logic Input Levels for Differential Signals
Differential signal definition
t
DVAC
VIL.DIFF.AC.MIN
VIL.DIFF.MIN
0
half cycle
V
IL.DIFF.MAX
VIL.DIFF.AC.MAX
t
DVAC
time
Definition of differential ac-swing and “time above ac-level” t
DVAC
Rev. 1.0 / Aug. 2013
31
Differential swing requirements for clock (CK - CK) and strobe (DQS-DQS)
Differential AC and DC Input Levels
DDR3L-800, 1066, 1333, 1600
Symbol
Parameter
Unit Notes
Min
Max
VIHdiff
VILdiff
Differential input high
Differential input logic low
Differential input high ac
Differential input low ac
+ 0.180
Note 3
Note 3
- 0.180
V
V
V
V
1
1
2
2
VIHdiff (ac)
VILdiff (ac)
2 x (VIH (ac) - Vref)
Note 3
Note 3
2 x (VIL (ac) - Vref)
Notes:
1. Used to define a differential signal slew-rate.
2. For CK - CK use VIH/VIL (ac) of AADD/CMD and VREFCA; for DQS - DQS, DQSL, DQSL, DQSU, DQSU use VIH/VIL
(ac) of DQs and VREFDQ; if a reduced ac-high or ac-low levels is used for a signal group, then the reduced level
applies also here.
3. These values are not defined; however, the single-ended signals Ck, CK, DQS, DQS, DQSL, DQSL, DQSU, DQSU
need to be within the respective limits (VIH (dc) max, VIL (dc) min) for single-ended signals as well as the limita-
tions for overshoot and undershoot. Refer to "Overshoot and Undershoot Specifications" on page 41.
Allowed time before ringback (tDVAC) for CK - CK and DQS - DQS
DDR3L-800/1066/1333/1600
tDVAC [ps]
@ |VIH/Ldiff (ac)| = 320mV
tDVAC [ps]
@ |VIH/Ldiff (ac)| = 270mV
Slew Rate [V/ns]
min
189
189
162
109
91
max
min
201
201
179
134
119
100
76
max
> 4.0
4.0
-
-
-
-
-
-
-
-
-
-
-
-
-
3.0
2.0
1.8
-
-
-
-
-
-
1.6
69
1.4
40
1.2
note
note
note
44
1.0
note
note
< 1.0
note : Rising input signal shall become equal to or greater than VIH(ac) level and Falling input signal shall become
equal to or less than VIL(ac) level.
Rev. 1.0 / Aug. 2013
32
Single-ended requirements for differential signals
Each individual component of a differential signal (CK, DQS, DQSL, DQSU, CK, DQS, DQSL, of DQSU) has
also to comply with certain requirements for single-ended signals.
CK and CK have to approximately reach VSEHmin / VSELmax (approximately equal to the ac-levels (VIH
(ac) / VIL (ac)) for ADD/CMD signals) in every half-cycle.
DQS, DQSL, DQSU, DQS, DQSL have to reach VSEHmin / VSELmax (approximately the ac-levels (VIH (ac)
/ VIL (ac)) for DQ signals) in every half-cycle preceding and following a valid transition.
Note that the applicable ac-levels for ADD/CMD and DQ’s might be different per speed-bin etc. E.g., if
VIH.CA(AC150)/VIL.CA(AC150) is used for ADD/CMD signals, then these ac-levels apply also for the single-
ended signals CK and CK.
VDD or VDDQ
VSEHmin
VSEH
VDD/2 or VDDQ/2
CK or DQS
VSELmax
VSEL
VSS or VSSQ
time
Single-ended requirements for differential signals.
Note that, while ADD/CMD and DQ signal requirements are with respect to Vref, the single-ended compo-
nents of differential signals have a requirement with respect to VDD / 2; this is nominally the same. the
transition of single-ended signals through the ac-levels is used to measure setup time. For single-ended
components of differential signals the requirement to reach VSELmax, VSEHmin has no bearing on timing,
but adds a restriction on the common mode characteristics of these signals.
Rev. 1.0 / Aug. 2013
33
Single-ended levels for CK, DQS, DQSL, DQSU, CK, DQS, DQSL or DQSU
DDR3L-800, 1066, 1333, 1600
Parameter
Unit Notes
Min
Max
Single-ended high level for strobes
Single-ended high level for Ck, CK
Single-ended low level for strobes
Single-ended low level for CK, CK
(VDD / 2) + 0.175
(VDD /2) + 0.175
Note 3
Note 3
V
V
V
V
1,2
1,2
1,2
1,2
VSEH
VSEL
Note 3
(VDD / 2) - 0.175
(VDD / 2) - 0.175
Note 3
Notes:
1. For CK, CK use VIH/VIL (ac) of ADD/CMD; for strobes (DQS, DQS, DQSL, DQSL, DQSU, DQSU) use VIH/VIL (ac)
of DQs.
2. VIH (ac)/VIL (ac) for DQs is based on VREFDQ; VIH (ac)/VIL (ac) for ADD/CMD is based on VREFCA; if a reduced
ac-high or ac-low level is used for a signal group, then the reduced level applies also here.
3. These values are not defined; however, the single-ended signals Ck, CK, DQS, DQS, DQSL, DQSL, DQSU, DQSU
need to be within the respective limits (VIH (dc) max, VIL (dc) min) for single-ended signals as well as the limita-
tions for overshoot and undershoot. Refer to "Overshoot and Undershoot Specifications" on page 41.
Rev. 1.0 / Aug. 2013
34
Differential Input Cross Point Voltage
To guarantee tight setup and hold times as well as output skew parameters with respect to clock and
strobe, each cross point voltage of differential input signals (CK, CK and DQS, DQS) must meet the
requirements in table below. The differential input cross point voltage VIX is measured from the actual
cross point of true and complement signals to the midlevel between of VDD and VSS
Vix Definition
Cross point voltage for differential input signals (CK, DQS)
DDR3L-800, 1066, 1333, 1600
Parameter
Unit Notes
Min
Max
-150
-175
150
175
mV
mV
2
1
Differential Input Cross Point Voltage
relative to VDD/2 for CK, CK
VIX(CK)
Differential Input Cross Point Voltage
relative to VDD/2 for DQS, DQS
VIX(DQS)
-150
150
mV
2
Notes:
1. Extended range for VIX is only allowed for clock and if single-ended clock input signals CK and CK are monotonic
with a single-ended swing VSEL / VSEH of at least VDD/2 +/-250 mV, and when the differential slew rate of CK -
CK is larger than 3 V/ns.
2. The relation between Vix Min/Max and VSEL/VSEH should satisfy following.
(VDD/2) + Vix (Min) - VSEL 25mV
VSEH - ((VDD/2) + Vix (Max)) 25mV
Rev. 1.0 / Aug. 2013
35
Slew Rate Definitions for Single-Ended Input Signals
See 7.5 “Address / Command Setup, Hold and Derating” on “DDR3L Device Operation” for single-ended
slew rate definitions for address and command signals.
See 7.6 “Data Setup, Hold and Slew Rate Derating” on “DDR3L Device Operation” for single-ended slew
rate definition for data signals.
lew Rate Definitions for Differential Input Signals
Input slew rate for differential signals (CK, CK and DQS, DQS) are defined and measured as shown in table
and figure below.
Differential Input Slew Rate Definition
Measured
Description
Defined by
Max
Min
Differential input slew rate for rising edge
(CK-CK and DQS-DQS)
V
V
[V -V
] / DeltaTRdiff
[V -V ] / DeltaTFdiff
IHdiffmin ILdiffmax
ILdiffmax
IHdiffmin
IHdiffmin ILdiffmax
Differential input slew rate for falling edge
(CK-CK and DQS-DQS)
V
V
IHdiffmin
ILdiffmax
Notes:
The differential signal (i.e. CK-CK and DQS-DQS) must be linear between these thresholds.
Delta
TRdiff
VIHdiffmin
0
VILdiffmax
Delta
TFdiff
Differential Input Slew Rate Definition for DQS, DQS and CK, CK
Rev. 1.0 / Aug. 2013
36
AC & DC Output Measurement Levels
Single Ended AC and DC Output Levels
Table below shows the output levels used for measurements of single ended signals.
Single-ended AC and DC Output Levels
DDR3L-800, 1066,
Symbol
Parameter
Unit
Notes
1333, 1600
VOH(DC)
VOM(DC)
VOL(DC)
VOH(AC)
VOL(AC)
0.8 x VDDQ
V
V
V
V
V
DC output high measurement level (for IV curve linearity)
DC output mid measurement level (for IV curve linearity)
DC output low measurement level (for IV curve linearity)
AC output high measurement level (for output SR)
AC output low measurement level (for output SR)
0.5 x VDDQ
0.2 x VDDQ
V
TT + 0.1 x VDDQ
1
1
VTT - 0.1 x VDDQ
Notes:
1. The swing of ±0.1 x VDDQ is based on approximately 50% of the static single ended output high or low swing with
a driver impedance of 40Ω and an effective test load of 25Ω to VTT = VDDQ / 2.
Differential AC and DC Output Levels
Table below shows the output levels used for measurements of single ended signals.
Differential AC and DC Output Levels
DDR3L-800, 1066,
Symbol
Parameter
Unit
Notes
1333, 1600
VOHdiff (AC)
VOLdiff (AC)
Notes:
+ 0.2 x VDDQ
V
V
1
1
AC differential output high measurement level (for output SR)
AC differential output low measurement level (for output SR)
- 0.2 x VDDQ
1. The swing of ±0.2 x VDDQ is based on approximately 50% of the static differential output high or low swing with
a driver impedance of 40Ω and an effective test load of 25Ω to VTT = VDDQ/2 at each of the differential outputs.
Rev. 1.0 / Aug. 2013
37
Single Ended Output Slew Rate
When the Reference load for timing measurements, output slew rate for falling and rising edges is defined
and measured between V
and V
for single ended signals are shown in table and figure below.
OL(AC)
OH(AC)
Single-ended Output slew Rate Definition
Measured
Description
Defined by
From
VOL(AC)
VOH(AC)
To
VOH(AC)
VOL(AC)
[VOH(AC)-VOL(AC)] / DeltaTRse
[VOH(AC)-VOL(AC)] / DeltaTFse
Single-ended output slew rate for rising edge
Single-ended output slew rate for falling edge
Notes:
1. Output slew rate is verified by design and characterisation, and may not be subject to production test.
Delta TRse
VOH(AC)
V∏
VOl(AC)
Delta TFse
Single Ended Output slew Rate Definition
Output Slew Rate (single-ended)
DDR3L-800 DDR3L-1066 DDR3L-1333 DDR3L-1600
Units
Parameter
Symbol Min
Max
Min
Max
Min
Max
Min
Max
51)
51)
51)
51)
Single-ended Output Slew Rate
SRQse 1.75
1.75
1.75
1.75
V/ns
Description: SR; Slew Rate
Q: Query Output (like in DQ, which stands for Data-in, Query-Output)
se: Single-ended Signals
For Ron = RZQ/7 setting
Note 1): In two cases, a maximum slew rate of 6V/ns applies for a single DQ signal within a byte lane.
Case 1 is a defined for a single DQ signal within a byte lane which is switching into a certain direction (either from high
to low or low to high) while all remaining DQ signals in the same byte lane are static (i.e. they stay at either high or low).
Case 2 is a defined for a single DQ signal within a byte lane which is switching into a certain direction (either from high
to low or low to high) while all remaining DQ signals in the same byte lane switching into the opposite direction (i.e. from
low to high of high to low respectively). For the remaining DQ signal switching in to the opposite direction, the regular
maximum limite of 5 V/ns applies.
Rev. 1.0 / Aug. 2013
38
Differential Output Slew Rate
With the reference load for timing measurements, output slew rate for falling and rising edges is defined
and measured between VOLdiff (AC) and VOHdiff (AC) for differential signals as shown in table and figure
below.
Differential Output Slew Rate Definition
Measured
Description
Defined by
From
To
VOHdiff (AC) [VOHdiff (AC)-VOLdiff (AC)] / DeltaTRdiff
VOLdiff (AC) [VOHdiff (AC)-VOLdiff (AC)] / DeltaTFdiff
VOLdiff (AC)
VOHdiff (AC)
Differential output slew rate for rising edge
Differential output slew rate for falling edge
Notes:
1. Output slew rate is verified by design and characterization, and may not be subject to production test.
Delta
TRdiff
VOHdiff(AC)
O
VOLdiff(AC)
Delta
TFdiff
Differential Output slew Rate Definition
Differential Output Slew Rate
DDR3L-800
DDR3L-1066
DDR3L-1333
DDR3L-1600
Units
Parameter
Symbol Min
Max
Min
Max
Min
Max
Min
Max
Differential Output Slew Rate SRQdiff
3.5
12
3.5
12
3.5
12
3.5
12
V/ns
Description: SR; Slew Rate
Q: Query Output (like in DQ, which stands for Data-in, Query-Output)
se: Single-ended Signals
For Ron = RZQ/7 setting
Rev. 1.0 / Aug. 2013
39
Reference Load for AC Timing and Output Slew Rate
Figure below represents the effective reference load of 25 ohms used in defining the relevant AC timing
parameters of the device as well as output slew rate measurements.
It is not intended as a precise representation of any particular system environment or a depiction of the
actual load presented by a production tester. System designers should use IBIS or other simulation tools to
correlate the timing reference load to a system environment. Manufacturers correlate to their production
test conditions, generally one or more coaxial transmission lines terminated at the tester electronics.
VDDQ
25 Ohm
CK, CK
DQ
DQS
DQS
VTT = VDDQ/2
DUT
Reference Load for AC Timing and Output Slew Rate
Rev. 1.0 / Aug. 2013
40
Overshoot and Undershoot Specifications
Address and Control Overshoot and Undershoot Specifications
AC Overshoot/Undershoot Specification for Address and Control Pins
DDR3L- DDR3L- DDR3L- DDR3L-
Parameter
Units
800
1066
1333
1600
Maximum peak amplitude allowed for overshoot area. (See Figure below)
Maximum peak amplitude allowed for undershoot area. (See Figure below)
Maximum overshoot area above VDD (See Figure below)
0.4
0.4
0.4
0.4
0.5
0.5
0.4
0.4
0.4
0.4
0.4
0.4
V
V
0.67
0.67
0.33 V-ns
0.33 V-ns
Maximum undershoot area below VSS (See Figure below)
(A0-A15, BA0-BA3, CS, RAS, CAS, WE, CKE, ODT)
See figure below for each parameter definition
Maximum Amplitude
Overshoot Area
VDD
VSS
Volts
(V)
Undershoot Area
Maximum Amplitude
Time (ns)
Address and Control Overshoot and Undershoot Definition
Rev. 1.0 / Aug. 2013
41
Clock, Data, Strobe and Mask Overshoot and Undershoot Specifications
AC Overshoot/Undershoot Specification for Clock, Data, Strobe and Mask
DDR3L- DDR3L- DDR3L- DDR3L-
Parameter
Units
800
1066
1333
1600
Maximum peak amplitude allowed for overshoot area. (See Figure below)
Maximum peak amplitude allowed for undershoot area. (See Figure below)
Maximum overshoot area above VDD (See Figure below)
Maximum undershoot area below VSS (See Figure below)
(CK, CK, DQ, DQS, DQS, DM)
0.4
0.4
0.4
0.4
0.4
0.4
0.4
0.4
V
V
0.25
0.25
0.19
0.19
0.15
0.15
0.13 V-ns
0.13 V-ns
See figure below for each parameter definition
Maximum Amplitude
Overshoot Area
VDDQ
VSSQ
Volts
(V)
Undershoot Area
Maximum Amplitude
Time (ns)
Clock, Data, Strobe and Mask Overshoot and Undershoot Definition
Rev. 1.0 / Aug. 2013
42
Refresh parameters by device density
Refresh parameters by device density
Parameter
RTT_Nom Setting
512Mb
90
1Gb
2Gb
4Gb
8Gb
Units Notes
REF command ACT or
REF command time
tRFC
110
160
260
350
ns
us
0 C T
85 C T
85 C
7.8
7.8
3.9
7.8
3.9
7.8
3.9
7.8
3.9
Average periodic
refresh interval
CASE
tREFI
95 C 3.9
us
1
CASE
Notes:
1. Users should refer to the DRAM supplier data sheet and/or the DIMM SPD to determine if DDR3 SDRAM devices
support the following options or requirements referred to in this materia.
Rev. 1.0 / Aug. 2013
43
Standard Speed Bins
DDR3 SDRAM Standard Speed Bins include tCK, tRCD, tRP, tRAS and tRC for each corresponding bin.
DDR3L-800 Speed Bins
For specific Notes See "Speed Bin Table Notes" on page 48.
Speed Bin
DDR3L-800E
6-6-6
Unit
Notes
CL - nRCD - nRP
Parameter
Symbol
min
max
t
15
20
—
—
—
ns
ns
ns
ns
AA
Internal read command to first data
ACT to internal read or write delay time
PRE command period
t
15
15
RCD
t
RP
t
52.5
RC
ACT to ACT or REF command period
ACT to PRE command period
t
37.5
2.5
9 * tREFI
3.3
ns
ns
RAS
t
CK(AVG)
CL = 6
CWL = 5
1,2,3
n
6
5
CK
Supported CL Settings
Supported CWL Settings
n
CK
Rev. 1.0 / Aug. 2013
44
DDR3L-1066 Speed Bins
For specific Notes See "Speed Bin Table Notes" on page 48.
Speed Bin
DDR3L-1066F
7-7-7
Unit
Note
CL - nRCD - nRP
Parameter
Symbol
min
max
Internal read command to
first data
t
13.125
20
ns
ns
ns
ns
ns
AA
ACT to internal read or
write delay time
t
13.125
13.125
50.625
—
—
—
RCD
t
PRE command period
RP
ACT to ACT or REF
command period
t
RC
ACT to PRE command
period
t
37.5
2.5
9 * tREFI
3.3
RAS
t
CWL = 5
CL = 6
ns
ns
ns
ns
ns
ns
1,2,3,6
1,2,3,4
4
CK(AVG)
t
CWL = 6
Reserved
Reserved
CK(AVG)
t
CWL = 5
CL = 7
CK(AVG)
t
CWL = 6
1.875
1.875
< 2.5
< 2.5
1,2,3,4
4
CK(AVG)
t
CWL = 5
CL = 8
Reserved
CK(AVG)
t
CWL = 6
1,2,3
CK(AVG)
n
Supported CL Settings
Supported CWL Settings
6, 7, 8
5, 6
CK
n
CK
Rev. 1.0 / Aug. 2013
45
DDR3L-1333 Speed Bins
For specific Notes See "Speed Bin Table Notes" on page 48.
Speed Bin
DDR3L-1333H
9-9-9
Unit
Note
CL - nRCD - nRP
Parameter
Symbol
min
13.5
(13.125)5,9
max
Internal read
command to first data
t
20
ns
ns
ns
ns
ns
AA
13.5
ACT to internal read or
write delay time
t
—
—
—
RCD
(13.125)5,9
13.5
(13.125)5,9
t
PRE command period
RP
49.5
(49.125)5,9
ACT to ACT or REF
command period
t
RC
ACT to PRE command
period
t
36
9 * tREFI
3.3
RAS
t
t
t
t
CWL = 5
2.5
ns
ns
ns
ns
1,2,3,7
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CL = 6
CL = 7
CL = 8
CWL = 6
CWL = 7
CWL = 5
Reserved
Reserved
Reserved
1,2,3,4,7
4
4
1.875
1.875
< 2.5
< 2.5
t
CWL = 6
ns
1,2,3,4,7
CK(AVG)
(Optional)5,9
Reserved
t
t
t
t
t
t
t
CWL = 7
CWL = 5
ns
ns
ns
ns
ns
ns
ns
1,2,3,4
4
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
Reserved
CWL = 6
1,2,3,7
1,2,3,4
4
CWL = 7
Reserved
Reserved
CWL = 5, 6
CWL = 7
CL = 9
1.5
1.5
<1.875
<1.875
1,2,3,4
4
CWL = 5, 6
Reserved
CL = 10
ns
ns
1,2,3
5
t
CWL = 7
CK(AVG)
(Optional)
n
Supported CL Settings
Supported CWL Settings
6, 7, 8, 9, 10
CK
n
5, 6, 7
CK
Rev. 1.0 / Aug. 2013
46
DDR3L-1600 Speed Bins
For specific Notes See "Speed Bin Table Notes" on page 48.
Speed Bin
DDR3L-1600K
11-11-11
Unit
Note
CL - nRCD - nRP
Parameter
Symbol
min
13.75
(13.125)5,9
max
Internal read
command to first data
t
20
ns
ns
ns
ns
ns
AA
13.75
ACT to internal read or
write delay time
t
—
—
—
RCD
(13.125)5,9
13.75
(13.125)5,9
t
PRE command period
RP
48.75
(48.125)5,9
ACT to ACT or REF
command period
t
RC
ACT to PRE command
period
t
35
9 * tREFI
3.3
RAS
t
t
t
t
CWL = 5
2.5
ns
ns
ns
ns
1,2,3,8
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CL = 6
CWL = 6
CWL = 7
CWL = 5
Reserved
Reserved
Reserved
1,2,3,4,8
4
4
1.875
< 2.5
t
CWL = 6
ns
1,2,3,4,8
CK(AVG)
(Optional)5,9
Reserved
Reserved
Reserved
CL = 7
t
t
t
t
t
t
t
CWL = 7
CWL = 8
CWL = 5
CWL = 6
CWL = 7
CWL = 8
CWL = 5, 6
ns
ns
ns
ns
ns
ns
ns
1,2,3,4,8
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
4
4
1.875
1.5
< 2.5
1,2,3,8
1,2,3,4,8
1,2,3,4
4
CL = 8
CL = 9
Reserved
Reserved
Reserved
<1.875
t
CWL = 7
ns
1,2,3,4,8
CK(AVG)
(Optional)5,9
Reserved
t
t
t
t
t
t
CWL = 8
ns
ns
ns
ns
ns
ns
1,2,3,4
4
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CK(AVG)
CWL = 5, 6
Reserved
CL = 10 CWL = 7
CWL = 8
1.5
<1.875
<1.5
1,2,3,8
1,2,3,4
4
Reserved
Reserved
CWL = 5, 6,7
CL = 11
CWL = 8
1.25
1,2,3
n
Supported CL Settings
Supported CWL Settings
5, 6, 7, 8, 9, 10, 11
5, 6, 7, 8
CK
n
CK
Rev. 1.0 / Aug. 2013
47
Speed Bin Table Notes
Absolute Specification (TOPER; VDDQ = VDD = 1.35V +0.100/- 0.067 V);
1. The CL setting and CWL setting result in tCK(AVG).MIN and tCK(AVG).MAX requirements. When mak-
ing a selection of tCK(AVG), both need to be fulfilled: Requirements from CL setting as well as require-
ments from CWL setting.
2. tCK(AVG).MIN limits: Since CAS Latency is not purely analog - data and strobe output are synchro-
nized by the DLL - all possible intermediate frequencies may not be guaranteed. An application should
use the next smaller JEDEC standard tCK(AVG) value (3.0, 2.5, 1.875, 1.5, or 1.25 ns) when calculat-
ing CL [nCK] = tAA [ns] / tCK(AVG) [ns], rounding up to the next ‘Supported CL’, where tCK(AVG) =
3.0 ns should only be used for CL = 5 calculation.
3. tCK(AVG).MAX limits: Calculate tCK(AVG) = tAA.MAX / CL SELECTED and round the resulting tCK(AVG)
down to the next valid speed bin (i.e. 3.3ns or 2.5ns or 1.875 ns or 1.25 ns). This result is
tCK(AVG).MAX corresponding to CL SELECTED.
4. ‘Reserved’ settings are not allowed. User must program a different value.
5. ‘Optional’ settings allow certain devices in the industry to support this setting, however, it is not a man-
datory feature. Refer to DIMM data sheet and/or the DIMM SPD information if and how this setting is
supported.
6. Any DDR3-1066 speed bin also supports functional operation at lower frequencies as shown in the
table which are not subject to Production Tests but verified by Design/Characterization.
7. Any DDR3-1333 speed bin also supports functional operation at lower frequencies as shown in the
table which are not subject to Production Tests but verified by Design/Characterization.
8. Any DDR3-1600 speed bin also supports functional operation at lower frequencies as shown in the
table which are not subject to Production Tests but verified by Design/Characterization.
9. DDR3 SDRAM devices supporting optional down binning to CL=7 and CL=9, and tAA/tRCD/tRP must
be 13.125 ns or lower. SPD settings must be programmed to match. For example, DDR3-1333H
devices supporting down binning to DDR3-1066F should program 13.125 ns in SPD bytes for tAAmin
(Byte 16), tRCDmin (Byte 18), and tRPmin (Byte 20). DDR3-1600K devices supporting down binning to
DDR3-1333H or DDR3-1600F should program 13.125 ns in SPD bytes for tAAmin (Byte 16), tRCDmin
(Byte 18), and tRPmin (Byte 20). Once tRP (Byte 20) is programmed to 13.125ns, tRCmin (Byte 21,23)
also should be programmed accordingly. For example, 49.125ns (tRASmin + tRPmin = 36 ns + 13.125
ns) for DDR3-1333H and 48.125ns (tRASmin + tRPmin = 35 ns + 13.125 ns) for DDR3-1600K.
Rev. 1.0 / Aug. 2013
48
Environmental Parameters
Symbol
Parameter
Operating temperature
Rating
Units
Notes
T
See Note
3
OPR
H
Operating humidity (relative)
10 to 90
-50 to +100
5 to 95
%
1
1
OPR
o
T
Storage temperature
C
STG
H
Storage humidity (without condensation)
Barometric Pressure (operating & storage)
%
1
STG
P
105 to 69
K Pascal
1, 2
BAR
Note:
1. Stress greater than those listed may cause permanent damage to the device. This is a stress rating only, and
device functional operation at or above the conditions indicated is not implied. Expousure to absolute maximum
rating conditions for extended periods may affect reliablility.
2. Up to 9850 ft.
3. The designer must meet the case temperature specifications for individual module components.
Rev. 1.0 / Aug. 2013
49
IDD and IDDQ Specification Parameters and Test Conditions
IDD and IDDQ Measurement Conditions
In this chapter, IDD and IDDQ measurement conditions such as test load and patterns are defined. Figure
1. shows the setup and test load for IDD and IDDQ measurements.
•
IDD currents (such as IDD0, IDD1, IDD2N, IDD2NT, IDD2P0, IDD2P1, IDD2Q, IDD3N, IDD3P, IDD4R,
IDD4W, IDD5B, IDD6, IDD6ET and IDD7) are measured as time-averaged currents with all VDD balls
of the DDR3 SDRAM under test tied together. Any IDDQ current is not included in IDD currents.
•
IDDQ currents (such as IDDQ2NT and IDDQ4R) are measured as time-averaged currents with all
VDDQ balls of the DDR3 SDRAM under test tied together. Any IDD current is not included in IDDQ cur-
rents.
Attention: IDDQ values cannot be directly used to calculate IO power of the DDR3 SDRAM. They can
be used to support correlation of simulated IO power to actual IO power as outlined in Figure 2. In
DRAM module application, IDDQ cannot be measured separately since VDD and VDDQ are using one
merged-power layer in Module PCB.
For IDD and IDDQ measurements, the following definitions apply:
•
•
”0” and “LOW” is defined as VIN <= VILAC(max).
”1” and “HIGH” is defined as VIN >= VIHAC(max).
•
•
•
•
•
“MID_LEVEL” is defined as inputs are VREF = VDD/2.
Timing used for IDD and IDDQ Measurement-Loop Patterns are provided in Table 1.
Basic IDD and IDDQ Measurement Conditions are described in Table 2.
Detailed IDD and IDDQ Measurement-Loop Patterns are described in Table 3 through Table 10.
IDD Measurements are done after properly initializing the DDR3 SDRAM. This includes but is not lim-
ited to setting
RON = RZQ/7 (34 Ohm in MR1);
Qoff = 0B (Output Buffer enabled in MR1);
RTT_Nom = RZQ/6 (40 Ohm in MR1);
RTT_Wr = RZQ/2 (120 Ohm in MR2);
TDQS Feature disabled in MR1
•
Attention: The IDD and IDDQ Measurement-Loop Patterns need to be executed at least one time
before actual IDD or IDDQ measurement is started.
•
•
Define D = {CS, RAS, CAS, WE}:= {HIGH, LOW, LOW, LOW}
Define D = {CS, RAS, CAS, WE}:= {HIGH, HIGH, HIGH, HIGH}
Rev. 1.0 / Aug. 2013
50
IDDQ (optional)
IDD
VDD
RESET
CK/CK
VDDQ
DDR3L
SDRAM
RTT = 25 Ohm
CKE
CS
DQS, DQS
DQ, DM,
VDDQ/2
RAS, CAS, WE
TDQS, TDQS
A, BA
ODT
ZQ
VSS
VSSQ
Figure 1 - Measurement Setup and Test Load for IDD and IDDQ (optional) Measurements
[Note: DIMM level Output test load condition may be different from above
Application specific
memory channel
environment
IDDQ
Test Load
Channel
IO Power
Simulation
IDDQ
Simulation
IDDQ
Simulation
Correction
Channel IO Power
Number
Figure 2 - Correlation from simulated Channel IO Power to actual Channel IO Power supported
by IDDQ Measurement
Rev. 1.0 / Aug. 2013
51
Table 1 -Timings used for IDD and IDDQ Measurement-Loop Patterns
DDR3L-1066
DDR3L-1333
DDR3L-1600
Symbol
Unit
7-7-7
1.875
7
9-9-9
1.5
9
11-11-11
t
1.25
11
11
39
28
11
24
32
5
ns
CK
CL
nCK
nCK
nCK
nCK
nCK
nCK
nCK
nCK
nCK
nCK
nCK
nCK
nCK
nCK
n
n
n
n
7
9
RCD
RC
27
20
7
33
24
9
RAS
RP
1KB page size
2KB page size
1KB page size
2KB page size
20
27
4
20
30
4
n
n
FAW
RRD
6
5
6
n
n
n
n
n
RFC -512Mb
RFC-1 Gb
48
59
86
139
187
60
74
107
174
234
72
88
128
208
280
RFC- 2 Gb
RFC- 4 Gb
RFC- 8 Gb
Table 2 -Basic IDD and IDDQ Measurement Conditions
Symbol
Description
Operating One Bank Active-Precharge Current
CKE: High; External clock: On; tCK, nRC, nRAS, CL: see Table 1; BL: 8a); AL: 0; CS: High between ACT and
PRE; Command, Address, Bank Address Inputs: partially toggling according to Table 3; Data IO: MID-LEVEL;
DM: stable at 0; Bank Activity: Cycling with one bank active at a time: 0,0,1,1,2,2,... (see Table 3); Output Buf-
IDD0
fer and RTT: Enabled in Mode Registersb); ODT Signal: stable at 0; Pattern Details: see Table 3.
Operating One Bank Active-Precharge Current
CKE: High; External clock: On; tCK, nRC, nRAS, nRCD, CL: see Table 1; BL: 8a); AL: 0; CS: High between ACT,
RD and PRE; Command, Address; Bank Address Inputs, Data IO: partially toggling according to Table 4; DM:
stable at 0; Bank Activity: Cycling with on bank active at a time: 0,0,1,1,2,2,... (see Table 4); Output Buffer and
IDD1
RTT: Enabled in Mode Registersb); ODT Signal: stable at 0; Pattern Details: see Table 4.
Rev. 1.0 / Aug. 2013
52
Symbol
Description
Precharge Standby Current
CKE: High; External clock: On; tCK, CL: see Table 1; BL: 8a); AL: 0; CS: stable at 1; Command, Address, Bank
Address Inputs: partially toggling according to Table 5; Data IO: MID_LEVEL; DM: stable at 0; Bank Activity: all
IDD2N
banks closed; Output Buffer and RTT: Enabled in Mode Registersb); ODT Signal: stable at 0; Pattern Details:
see Table 5.
Precharge Standby ODT Current
CKE: High; External clock: On; tCK, CL: see Table 1; BL: 8a); AL: 0; CS: stable at 1; Command, Address, Bank
Address Inputs: partially toggling according to Table 6; Data IO: MID_LEVEL; DM: stable at 0; Bank Activity: all
IDD2NT
banks closed; Output Buffer and RTT: Enabled in Mode Registersb); ODT Signal: toggling according to Table 6;
Pattern Details: see Table 6.
Precharge Power-Down Current Slow Exit
CKE: Low; External clock: On; tCK, CL: see Table 1; BL: 8a); AL: 0; CS: stable at 1; Command, Address, Bank
Address Inputs: stable at 0; Data IO: MID_LEVEL; DM: stable at 0; Bank Activity: all banks closed; Output Buf-
IDD2P0
IDD2P1
IDD2Q
fer and RTT: Enabled in Mode Registersb); ODT Signal: stable at 0; Precharge Power Down Mode: Slow Exitc)
Precharge Power-Down Current Fast Exit
CKE: Low; External clock: On; tCK, CL: see Table 1; BL: 8a); AL: 0; CS: stable at 1; Command, Address, Bank
Address Inputs: stable at 0; Data IO: MID_LEVEL; DM: stable at 0; Bank Activity: all banks closed; Output Buf-
fer and RTT: Enabled in Mode Registersb); ODT Signal: stable at 0; Precharge Power Down Mode: Fast Exitc)
Precharge Quiet Standby Current
CKE: High; External clock: On; tCK, CL: see Table 1; BL: 8a); AL: 0; CS: stable at 1; Command, Address, Bank
Address Inputs: stable at 0; Data IO: MID_LEVEL; DM: stable at 0; Bank Activity: all banks closed; Output Buf-
fer and RTT: Enabled in Mode Registersb); ODT Signal: stable at 0
Active Standby Current
CKE: High; External clock: On; tCK, CL: see Table 1; BL: 8a); AL: 0; CS: stable at 1; Command, Address, Bank
Address Inputs: partially toggling according to Table 5; Data IO: MID_LEVEL; DM: stable at 0; Bank Activity: all
IDD3N
banks open; Output Buffer and RTT: Enabled in Mode Registersb); ODT Signal: stable at 0; Pattern Details: see
Table 5.
Active Power-Down Current
CKE: Low; External clock: On; tCK, CL: see Table 1; BL: 8a); AL: 0; CS: stable at 1; Command, Address, Bank
Address Inputs: stable at 0; Data IO: MID_LEVEL; DM: stable at 0; Bank Activity: all banks open; Output Buffer
IDD3P
and RTT: Enabled in Mode Registersb); ODT Signal: stable at 0
Rev. 1.0 / Aug. 2013
53
Symbol
Description
Operating Burst Read Current
CKE: High; External clock: On; tCK, CL: see Table 1; BL: 8a); AL: 0; CS: High between RD; Command, Address,
Bank Address Inputs: partially toggling according to Table 7; Data IO: seamless read data burst with different
data between one burst and the next one according to Table 7; DM: stable at 0; Bank Activity: all banks open,
RD commands cycling through banks: 0,0,1,1,2,2,...(see Table 7); Output Buffer and RTT: Enabled in Mode
IDD4R
Registersb); ODT Signal: stable at 0; Pattern Details: see Table 7.
Operating Burst Write Current
CKE: High; External clock: On; tCK, CL: see Table 1; BL: 8a); AL: 0; CS: High between WR; Command, Address,
Bank Address Inputs: partially toggling according to Table 8; Data IO: seamless read data burst with different
data between one burst and the next one according to Table 8; DM: stable at 0; Bank Activity: all banks open,
WR commands cycling through banks: 0,0,1,1,2,2,...(see Table 8); Output Buffer and RTT: Enabled in Mode
IDD4W
Registersb); ODT Signal: stable at HIGH; Pattern Details: see Table 8.
Burst Refresh Current
CKE: High; External clock: On; tCK, CL, nRFC: see Table 1; BL: 8a); AL: 0; CS: High between REF; Command,
Address, Bank Address Inputs: partially toggling according to Table 9; Data IO: MID_LEVEL; DM: stable at 0;
IDD5B
Bank Activity: REF command every nREF (see Table 9); Output Buffer and RTT: Enabled in Mode Registersb);
ODT Signal: stable at 0; Pattern Details: see Table 9.
Self-Refresh Current: Normal Temperature Range
TCASE: 0 - 85 oC; Auto Self-Refresh (ASR): Disabledd);Self-Refresh Temperature Range (SRT): Normale); CKE:
IDD6
Low; External clock: Off; CK and CK: LOW; CL: see Table 1; BL: 8a); AL: 0; CS, Command, Address, Bank
Address Inputs, Data IO: MID_LEVEL; DM: stable at 0; Bank Activity: Self-Refresh operation; Output Buffer
and RTT: Enabled in Mode Registersb); ODT Signal: MID_LEVEL
Self-Refresh Current: Extended Temperature Range (optional)
TCASE: 0 - 95 oC; Auto Self-Refresh (ASR): Disabledd);Self-Refresh Temperature Range (SRT): Extendede);
IDD6ET
CKE: Low; External clock: Off; CK and CK: LOW; CL: see Table 1; BL: 8a); AL: 0; CS, Command, Address, Bank
Address Inputs, Data IO: MID_LEVEL; DM: stable at 0; Bank Activity: Extended Temperature Self-Refresh
operation; Output Buffer and RTT: Enabled in Mode Registersb); ODT Signal: MID_LEVEL
Rev. 1.0 / Aug. 2013
54
Symbol
Description
Operating Bank Interleave Read Current
CKE: High; External clock: On; tCK, nRC, nRAS, nRCD, NRRD, nFAW, CL: see Table 1; BL: 8a),f); AL: CL-1; CS:
High between ACT and RDA; Command, Address, Bank Address Inputs: partially toggling according to Table
10; Data IO: read data burst with different data between one burst and the next one according to Table 10;
DM: stable at 0; Bank Activity: two times interleaved cycling through banks (0, 1,...7) with different address-
IDD7
ing, wee Table 10; Output Buffer and RTT: Enabled in Mode Registersb); ODT Signal: stable at 0; Pattern
Details: see Table 10.
a) Burst Length: BL8 fixed by MRS: set MR0 A[1,0]=00B
b) Output Buffer Enable: set MR1 A[12] = 0B; set MR1 A[5,1] = 01B; RTT_Nom enable: set MR1 A[9,6,2]
= 011B; RTT_Wr enable: set MR2 A[10,9] = 10B
c) Precharge Power Down Mode: set MR0 A12=0B for Slow Exit or MR0 A12 = 1B for Fast Exit
d) Auto Self-Refresh (ASR): set MR2 A6 = 0B to disable
e) Self-Refresh Temperature Range (SRT): set MR2 A7 = 0B for normal or 1B for extended temperature
range
f) Read Burst Type: Nibble Sequential, set MR0 A[3] = 0B
Rev. 1.0 / Aug. 2013
55
a)
Table 3 - IDD0 Measurement-Loop Pattern
Datab)
0
ACT
D, D
D, D
0
1
1
0
0
1
1
0
1
1
0
1
0
0
0
0
0
0
00
00
00
0
0
0
0
0
0
0
0
0
0
0
0
-
-
-
0
1,2
3,4
...
repeat pattern 1...4 until nRAS - 1, truncate if necessary
nRAS
PRE
0
0
1
0
0
0
00
0
0
0
0
-
...
repeat pattern 1...4 until nRC - 1, truncate if necessary
1*nRC+0
1*nRC+1, 2
1*nRC+3, 4
...
ACT
D, D
D, D
0
1
1
0
0
1
1
0
1
1
0
1
0
0
0
0
0
0
00
00
00
0
0
0
0
0
0
F
F
F
0
0
0
-
-
-
repeat pattern 1...4 until 1*nRC + nRAS - 1, truncate if necessary
PRE 00
1*nRC+nRAS
...
0
0
1
0
0
0
0
0
F
0
-
repeat pattern 1...4 until 2*nRC - 1, truncate if necessary
repeat Sub-Loop 0, use BA[2:0] = 1 instead
repeat Sub-Loop 0, use BA[2:0] = 2 instead
repeat Sub-Loop 0, use BA[2:0] = 3 instead
repeat Sub-Loop 0, use BA[2:0] = 4 instead
repeat Sub-Loop 0, use BA[2:0] = 5 instead
repeat Sub-Loop 0, use BA[2:0] = 6 instead
repeat Sub-Loop 0, use BA[2:0] = 7 instead
1
2
3
4
5
6
7
2*nRC
4*nRC
6*nRC
8*nRC
10*nRC
12*nRC
14*nRC
a) DM must be driven LOW all the time. DQS, DQS are MID-LEVEL.
b) DQ signals are MID-LEVEL.
Rev. 1.0 / Aug. 2013
56
a)
Table 4 - IDD1 Measurement-Loop Pattern
Datab)
0
ACT
D, D
D, D
0
1
1
0
0
1
1
0
1
1
0
1
0
0
0
0
0
0
00
00
00
0
0
0
0
0
0
0
0
0
0
0
0
-
-
-
0
1,2
3,4
...
repeat pattern 1...4 until nRCD - 1, truncate if necessary
RD 00
repeat pattern 1...4 until nRAS - 1, truncate if necessary
nRCD
...
0
1
0
1
0
0
0
0
0
0
0
0
00000000
-
nRAS
PRE
0
0
1
0
0
0
00
0
0
...
repeat pattern 1...4 until nRC - 1, truncate if necessary
1*nRC+0
1*nRC+1,2
1*nRC+3,4
...
ACT
D, D
D, D
0
1
1
0
0
1
1
0
1
1
0
1
0
0
0
0
0
0
00
00
00
0
0
0
0
0
0
F
F
F
0
0
0
-
-
-
repeat pattern nRC + 1,...4 until nRC + nRCE - 1, truncate if necessary
RD 00
repeat pattern nRC + 1,...4 until nRC + nRAS - 1, truncate if necessary
PRE 00
1*nRC+nRCD
...
0
1
0
1
0
0
0
0
F
0
00110011
-
1*nRC+nRAS
...
0
0
1
0
0
0
0
0
F
0
repeat pattern nRC + 1,...4 until *2 nRC - 1, truncate if necessary
repeat Sub-Loop 0, use BA[2:0] = 1 instead
repeat Sub-Loop 0, use BA[2:0] = 2 instead
repeat Sub-Loop 0, use BA[2:0] = 3 instead
repeat Sub-Loop 0, use BA[2:0] = 4 instead
repeat Sub-Loop 0, use BA[2:0] = 5 instead
repeat Sub-Loop 0, use BA[2:0] = 6 instead
repeat Sub-Loop 0, use BA[2:0] = 7 instead
1
2
3
4
5
6
7
2*nRC
4*nRC
6*nRC
8*nRC
10*nRC
12*nRC
14*nRC
a) DM must be driven LOW all the time. DQS, DQS are used according to RD Commands, otherwise MID-LEVEL.
b) Burst Sequence driven on each DQ signal by Read Command. Outside burst operation, DQ signals are MID_LEVEL.
Rev. 1.0 / Aug. 2013
57
a)
Table 5 - IDD2N and IDD3N Measurement-Loop Pattern
Datab)
0
D
D
D
D
1
1
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
F
F
0
0
0
0
-
-
-
-
0
1
2
3
1
2
3
4
5
6
7
4-7
repeat Sub-Loop 0, use BA[2:0] = 1 instead
repeat Sub-Loop 0, use BA[2:0] = 2 instead
repeat Sub-Loop 0, use BA[2:0] = 3 instead
repeat Sub-Loop 0, use BA[2:0] = 4 instead
repeat Sub-Loop 0, use BA[2:0] = 5 instead
repeat Sub-Loop 0, use BA[2:0] = 6 instead
repeat Sub-Loop 0, use BA[2:0] = 7 instead
8-11
12-15
16-19
20-23
24-17
28-31
a) DM must be driven LOW all the time. DQS, DQS are MID-LEVEL.
b) DQ signals are MID-LEVEL.
a)
Table 6 - IDD2NT and IDDQ2NT Measurement-Loop Pattern
Datab)
0
0
D
D
D
D
1
1
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
-
-
-
-
1
0
F
F
0
0
0
2
3
1
2
3
4
5
6
7
4-7
repeat Sub-Loop 0, but ODT = 0 and BA[2:0] = 1
repeat Sub-Loop 0, but ODT = 1 and BA[2:0] = 2
repeat Sub-Loop 0, but ODT = 1 and BA[2:0] = 3
repeat Sub-Loop 0, but ODT = 0 and BA[2:0] = 4
repeat Sub-Loop 0, but ODT = 0 and BA[2:0] = 5
repeat Sub-Loop 0, but ODT = 1 and BA[2:0] = 6
repeat Sub-Loop 0, but ODT = 1 and BA[2:0] = 7
8-11
12-15
16-19
20-23
24-17
28-31
a) DM must be driven LOW all the time. DQS, DQS are MID-LEVEL.
b) DQ signals are MID-LEVEL.
Rev. 1.0 / Aug. 2013
58
a)
Table 7 - IDD4R and IDDQ4R Measurement-Loop Pattern
Datab)
0
RD
D
0
1
1
0
1
1
1
0
1
1
0
1
0
0
1
0
0
1
1
0
1
1
0
1
0
0
0
0
0
0
0
0
0
0
0
0
00
00
00
00
00
00
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
F
F
F
0
0
0
0
0
0
00000000
0
1
-
2,3
D,D
RD
D
-
4
00110011
5
-
-
6,7
D,D
1
2
3
4
5
6
7
8-15
16-23
24-31
32-39
40-47
48-55
56-63
repeat Sub-Loop 0, but BA[2:0] = 1
repeat Sub-Loop 0, but BA[2:0] = 2
repeat Sub-Loop 0, but BA[2:0] = 3
repeat Sub-Loop 0, but BA[2:0] = 4
repeat Sub-Loop 0, but BA[2:0] = 5
repeat Sub-Loop 0, but BA[2:0] = 6
repeat Sub-Loop 0, but BA[2:0] = 7
a) DM must be driven LOW all the time. DQS, DQS are used according to RD Commands, otherwise MID-LEVEL.
b) Burst Sequence driven on each DQ signal by Read Command. Outside burst operation, DQ signals are MID-LEVEL.
a)
Table 8 - IDD4W Measurement-Loop Pattern
Datab)
0
0
1
2,3
4
5
6,7
WR
D
D,D
WR
D
0
1
1
0
1
1
1
0
1
1
0
1
0
0
1
0
0
1
0
0
1
0
0
1
1
1
1
1
1
1
0
0
0
0
0
0
00
00
00
00
00
00
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
F
F
F
0
0
0
0
0
0
00000000
-
-
00110011
-
-
D,D
1
2
3
4
5
6
7
8-15
16-23
24-31
32-39
40-47
48-55
56-63
repeat Sub-Loop 0, but BA[2:0] = 1
repeat Sub-Loop 0, but BA[2:0] = 2
repeat Sub-Loop 0, but BA[2:0] = 3
repeat Sub-Loop 0, but BA[2:0] = 4
repeat Sub-Loop 0, but BA[2:0] = 5
repeat Sub-Loop 0, but BA[2:0] = 6
repeat Sub-Loop 0, but BA[2:0] = 7
a) DM must be driven LOW all the time. DQS, DQS are used according to WR Commands, otherwise MID-LEVEL.
b) Burst Sequence driven on each DQ signal by Write Command. Outside burst operation, DQ signals are MID-LEVEL.
Rev. 1.0 / Aug. 2013
59
a)
Table 9 - IDD5B Measurement-Loop Pattern
Datab)
0
1
REF
D, D
D, D
0
1
1
0
0
1
0
0
1
1
0
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
F
0
0
0
-
-
-
0
1.2
00
00
3,4
5...8
repeat cycles 1...4, but BA[2:0] = 1
repeat cycles 1...4, but BA[2:0] = 2
repeat cycles 1...4, but BA[2:0] = 3
repeat cycles 1...4, but BA[2:0] = 4
repeat cycles 1...4, but BA[2:0] = 5
repeat cycles 1...4, but BA[2:0] = 6
repeat cycles 1...4, but BA[2:0] = 7
9...12
13...16
17...20
21...24
25...28
29...32
33...nRFC-1
2
repeat Sub-Loop 1, until nRFC - 1. Truncate, if necessary.
a) DM must be driven LOW all the time. DQS, DQS are MID-LEVEL.
b) DQ signals are MID-LEVEL.
Rev. 1.0 / Aug. 2013
60
a)
Table 10 - IDD7 Measurement-Loop Pattern
ATTENTION! Sub-Loops 10-19 have inverse A[6:3] Pattern and Data Pattern than Sub-Loops 0-9
Datab)
0
1
0
1
2
...
ACT
RDA
D
0
0
1
0
1
0
1
0
0
1
1
0
0
0
0
0
0
0
00
00
00
0
1
0
0
0
0
0
0
0
0
0
0
-
00000000
-
repeat above D Command until nRRD - 1
nRRD
nRRD+1
nRRD+2
...
2*nRRD
3*nRRD
4*nRRD
ACT
RDA
D
0
0
1
0
1
0
1
0
0
1
1
0
0
0
0
1
1
1
00
00
00
0
1
0
0
0
0
F
F
F
0
0
0
-
00110011
-
repeat above D Command until 2* nRRD - 1
repeat Sub-Loop 0, but BA[2:0] = 2
repeat Sub-Loop 1, but BA[2:0] = 3
2
3
D
1
0
0
0
0
3
00
0
0
F
0
-
4
Assert and repeat above D Command until nFAW - 1, if necessary
repeat Sub-Loop 0, but BA[2:0] = 4
repeat Sub-Loop 1, but BA[2:0] = 5
repeat Sub-Loop 0, but BA[2:0] = 6
repeat Sub-Loop 1, but BA[2:0] = 7
5
6
7
8
nFAW
nFAW+nRRD
nFAW+2*nRRD
nFAW+3*nRRD
nFAW+4*nRRD
D
1
0
0
0
0
7
00
0
0
F
0
-
9
Assert and repeat above D Command until 2* nFAW - 1, if necessary
2*nFAW+0
2*nFAW+1
ACT
RDA
D
0
0
1
0
1
0
1
0
0
1
1
0
0
0
0
0
0
0
00
00
00
0
1
0
0
0
0
F
F
F
0
0
0
-
00110011
-
10
2&nFAW+2
Repeat above D Command until 2* nFAW + nRRD - 1
2*nFAW+nRRD
2*nFAW+nRRD+1
ACT
RDA
D
0
0
1
0
1
0
1
0
0
1
1
0
0
0
0
1
1
1
00
00
00
0
1
0
0
0
0
0
0
0
0
0
0
-
00000000
-
11
2&nFAW+nRRD+2
Repeat above D Command until 2* nFAW + 2* nRRD - 1
repeat Sub-Loop 10, but BA[2:0] = 2
repeat Sub-Loop 11, but BA[2:0] = 3
12 2*nFAW+2*nRRD
13 2*nFAW+3*nRRD
D
1
0
0
0
0
3
00
0
0
0
0
-
14 2*nFAW+4*nRRD
Assert and repeat above D Command until 3* nFAW - 1, if necessary
repeat Sub-Loop 10, but BA[2:0] = 4
15 3*nFAW
16 3*nFAW+nRRD
17 3*nFAW+2*nRRD
18 3*nFAW+3*nRRD
repeat Sub-Loop 11, but BA[2:0] = 5
repeat Sub-Loop 10, but BA[2:0] = 6
repeat Sub-Loop 11, but BA[2:0] = 7
D
1
0
0
0
0
7
00
0
0
0
0
-
19 3*nFAW+4*nRRD
Assert and repeat above D Command until 4* nFAW - 1, if necessary
a) DM must be driven LOW all the time. DQS, DQS are used according to RD Commands, otherwise MID-LEVEL.
b) Burst Sequence driven on each DQ signal by Read Command. Outside burst operation, DQ signals are MID-LEVEL.
Rev. 1.0 / Aug. 2013
61
IDD Specifications (Tcase: 0 to 95oC)
* Module IDD values in the datasheet are only a calculation based on the component IDD spec and register power.
The actual measurements may vary according to DQ loading cap.
4GB, 512M x 72 R-DIMM: HMT451R7MFR8A
Symbol
IDD0
DDR3L 1066
1169
1259
989
DDR3L 1333
1169
1259
989
DDR3L 1600
1169
1259
1034
1079
408
Unit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
note
IDD1
IDD2N
IDD2NT
IDD2P0
IDD2P1
IDD2Q
IDD3N
IDD3P
IDD4R
IDD4W
IDD5B
IDD6
1034
408
1034
408
426
426
426
989
1034
1079
453
1034
1079
453
1034
408
1574
1574
2024
408
1709
1709
2069
408
1844
1844
2069
408
IDD6ET
IDD7
426
426
426
2069
2249
2294
8GB, 1G x 72 R-DIMM: HMT41GR7MFR4A
Symbol
IDD0
DDR3L 1066
1574
1754
1214
1304
588
DDR3L 1333
1574
1754
1214
1304
588
DDR3L 1600
1574
1754
1304
1394
588
Unit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
note
IDD1
IDD2N
IDD2NT
IDD2P0
IDD2P1
IDD2Q
IDD3N
IDD3P
IDD4R
IDD4W
IDD5B
IDD6
624
624
624
1214
1304
588
1304
1394
678
1304
1394
678
2204
2204
3284
588
2474
2384
3374
588
2654
2564
3374
588
IDD6ET
IDD7
624
624
624
3284
3644
3734
Rev. 1.0 / Aug. 2013
62
8GB, 1GM x 72 R-DIMM: HMT41GR7MFR8A
Symbol
IDD0
DDR3L 1066
1394
1484
1214
1304
588
DDR3L 1333
1394
1484
1214
1304
588
DDR3L 1600
1484
1574
1304
1394
588
Unit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
note
IDD1
IDD2N
IDD2NT
IDD2P0
IDD2P1
IDD2Q
IDD3N
IDD3P
IDD4R
IDD4W
IDD5B
IDD6
624
624
624
1214
1304
588
1304
1394
678
1304
1394
678
1799
1799
2249
588
1934
1934
2294
588
2159
2159
2384
588
IDD6ET
IDD7
624
624
624
2294
2474
2609
16GB, 2G x 72 R-DIMM: HMT42GR7MFR4A
Symbol
IDD0
DDR3L 1066
2024
2204
1664
1844
948
DDR3L 1333
2024
2204
1664
1844
948
DDR3L 1600
2204
2384
1844
2024
948
Unit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
note
IDD1
IDD2N
IDD2NT
IDD2P0
IDD2P1
IDD2Q
IDD3N
IDD3P
IDD4R
IDD4W
IDD5B
1020
1664
1844
948
1020
1844
2024
1128
2834
2834
3824
948
1020
1844
2024
1128
3194
3194
4004
948
2654
2654
3734
948
IDD6a)
IDD6ET
IDD7
1020
3734
1020
4094
1020
4364
Rev. 1.0 / Aug. 2013
63
32GB, 4G x 72 R-DIMM: HMT84GR7MMR4C
Symbol
IDD0
DDR3L 1066
2924
DDR3L 1333
2924
Unit
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
note
IDD1
3104
3104
IDD2N
IDD2NT
IDD2P0
IDD2P1
IDD2Q
IDD3N
IDD3P
IDD4R
IDD4W
IDD5B
IDD6
2564
2564
2924
2924
1668
1668
1812
1812
2564
2924
2924
3284
1668
2028
3554
3824
3554
3734
4634
4724
1668
1668
IDD6ET
IDD7
1812
1812
4634
4994
Rev. 1.0 / Aug. 2013
64
Module Dimensions
512Mx72 - HMT451R7MFR8A
Front
133.35
128.95
SPD/TS
2.10±0.15
4X3.00±0.10
Detail A
Detail B
Detail C
1
120
1
2X3.00±0.10
47.00
71.00
5.175
5.0
Back
121
240
1
2x R0.75 Max
Side
3.64mm max
Detail of Contacts C
Detail of Contacts A
Detail of Contacts B
1.20
± 0.15
0.80
± 0.05
2.50
3± 0.1
0.3~0.1
1.00
1.50
±0.10
5.00
1.27±010mm
max
Note:
1. 0.13tolerance on all dimensions unless otherwise stated.
Units: millimeters
Rev. 1.0 / Aug. 2013
65
1Gx72 - HMT41GR7MFR4A
Front
133.35
128.95
SPD/TS
2.10±0.15
Detail A
4X3.00 0.10
±
Detail C
Detail B
1
120
1
2X3.00±0.10
47.00
71.00
5.175
5.0
Back
121
240
1
2x R0.75 Max
Side
3.64mm max
Detail of Contacts C
Detail of Contacts A
Detail of Contacts B
1.20± 0.15
0.80
± 0.05
2.50
3± 0.1
0.3+0.1
1.00
1.50
±0.10
5.00
1.27±010mm
max
Note:
1. 0.13tolerance on all dimensions unless otherwise stated.
Units: millimeters
Rev. 1.0 / Aug. 2013
66
1Gx72 - HMT41GR7MFR8A
Front
133.35
128.95
SPD/TS
2.10±0.15
Detail A
4X3.00 0.10
±
Detail C
Detail B
1
120
1
2X3.00±0.10
47.00
71.00
5.175
5.0
Back
121
240
1
2x R0.75 Max
Side
3.64mm max
Detail of Contacts C
Detail of Contacts A
Detail of Contacts B
1.20± 0.15
0.80
± 0.05
2.50
3± 0.1
0.3+0.1
1.00
1.50
±0.10
5.00
1.27±010mm
max
Note:
1. 0.13tolerance on all dimensions unless otherwise stated.
Units: millimeters
Rev. 1.0 / Aug. 2013
67
2Gx72 - HMT42GR7MFR4A
Front
133.35
128.95
Detail B
SPD/TS
2.10±0.15
Detail A
4X3.00±0.10
1
120
1
2X3.00±0.10
47.00
Detail C
71.00
5.175
Detail D
5.0
Back
121
240
1
2x R0.75 Max
Side
3.64mm max
Detail of Contacts D
Detail of Contacts A
Detail of Contacts B
Detail of Contacts C
1.20± 0.15
0.80± 0.05
2.50
14.90
0.4
13.60
3
± 0.1
0.3~0.1
1.00
1.50
±0.10
5.00
1.27±010mm
max
Note:
1. 0.13tolerance on all dimensions unless otherwise stated.
Units: millimeters
Rev. 1.0 / Aug. 2013
68
2Gx72 - HMT42GR7MFR4A - Heat Spreader
Front
133.75
133.35
127
42.7
2.786
20.9
6.35
8
3.69
5.39
7.74
6.3
2.1
120
1
7.36
33.4
33.4
46.46
80.54
119.64
Back
57.2
2.7
121
240
2x R0.75 Max
Side
7.65mm max
1.27±010mm
max
Note:
1. 0.13tolerance on all dimensions unless otherwise stated.
2.In order to uninstall FDHS, please contact sales administrator.
Units: millimeters
Rev. 1.0 / Aug. 2013
69
4Gx72 - HMT84GR7MMR4A
Front
133.35
128.95
Detail B
SPD/TS
2.10±0.15
Detail A
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
4X3.00±0.10
DDP
1
2X3.00±0.10
47.00
71.00
5.175
Detail D
5.0
Detail C
Back
SPD/TS
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
DDP
1
2x R0.75 Max
Side
3.64mm max
Detail of Contacts D
Detail of Contacts A
Detail of Contacts B
Detail of Contacts C
1.20± 0.15
0.80± 0.05
2.50
14.90
0.4
13.60
3± 0.1
0.3~0.1
1.00
1.50
±0.10
5.00
1.27±010mm
max
Note:
1. 0.13tolerance on all dimensions unless otherwise stated.
Units: millimeters
Rev. 1.0 / Aug. 2013
70
4Gx72 - HMT84GR7MMR4A - Heat Spreader
Front
133.75
133.35
127
41.9
3.59
20.9
6.35
8
4.49
5.39
8.04
6.3
2.155
120
1
7.36
33.4
33.4
46.46
80.54
119.64
Back
57.2
2.7
121
240
Side
7.65mm max
1.27±010mm
max
Note:
1. 0.13tolerance on all dimensions unless otherwise stated.
2.In order to uninstall FDHS, please contact sales administrator.
Units: millimeters
Rev. 1.0 / Aug. 2013
71
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