IDT02S60C [INFINEON]

2ndGeneration thinQ!TM SiC Schottky Diode; 2ndGeneration的thinQ ! TM SiC肖特基二极管
IDT02S60C
型号: IDT02S60C
厂家: Infineon    Infineon
描述:

2ndGeneration thinQ!TM SiC Schottky Diode
2ndGeneration的thinQ ! TM SiC肖特基二极管

整流二极管 肖特基二极管 局域网
文件: 总7页 (文件大小:293K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
IDT02S60C  
2ndGeneration thinQ!TM SiC Schottky Diode  
Features  
Product Summary  
V DC  
Q c  
I F  
600  
3.2  
2
V
• Revolutionary semiconductor material - Silicon Carbide  
• No reverse recovery/ no forward recovery  
• Temperature independent switching behavior  
• High surge current capability  
nC  
A
PG-TO220-2-2  
• Qualified according to JEDEC1) for target applications  
• Breakdown voltage tested at 5mA2)  
• Optimized for high temperature operation  
thinQ! 2G Diode specially designed for fast switching applications like:  
• CCM PFC  
Type  
Package  
Marking  
Pin 1  
Pin 2  
IDT02S60C  
PG-TO220-2-2  
D02S60C  
C
A
Maximum ratings  
Parameter  
Value  
Symbol Conditions  
Unit  
I F  
T C<120 °C  
T C<70 °C  
f =50 Hz  
Continuous forward current  
2
3
A
I F,RMS  
I F,SM  
RMS forward current  
2.8  
11.5  
9.7  
T C=25 °C, t p=10 ms  
T C=150°C, t p=10 ms  
Surge non-repetitive forward current,  
sine halfwave  
T j=150 °C,  
T C=100 °C, D =0.1  
I F,RM  
Repetitive peak forward current  
7.3  
I F,max  
T C=25 °C, t p=10 µs  
T C=25 °C, t p=10 ms  
T C=150°C, t p=10 ms  
T j=25 °C  
Non-repetitive peak forward current  
100  
0.61  
0.44  
600  
50  
i 2dt  
A2s  
i ²t value  
V RRM  
dv/ dt  
P tot  
Repetitive peak reverse voltage  
Diode dv/dt ruggedness  
Power dissipation  
V
V
R = 0….480V  
V/ns  
W
T C=25 °C  
18  
T j, T stg  
Operating and storage temperature  
Mounting torque  
-55 ... 175  
60  
°C  
M3 and M3.5 screws  
page 1  
Mcm  
Rev. 2.0  
2007-04-25  
IDT02S60C  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Thermal characteristics  
R thJC  
Thermal resistance, junction - case  
-
-
-
-
8.5  
62  
K/W  
Thermal resistance,  
junction - ambient  
R thJA  
leaded  
Soldering temperature,  
wavesoldering only allowed at leads  
1.6mm (0.063 in.) from  
case for 10s  
T sold  
-
-
260 °C  
Electrical characteristics  
Static characteristics  
V DC  
V F  
I R=0.05mA, T j=25°C  
I F=2 A, T j=25 °C  
I F=2 A, T j=150 °C  
I F=3 A, T j=25 °C  
I F=3 A, T j=150 °C  
V R=600 V, T j=25 °C  
DC blocking voltage  
Diode forward voltage  
600  
-
-
V
-
-
-
-
-
1.7  
2.1  
2.1  
2.8  
0.23  
1.9  
2.6  
2.4  
3.7  
15  
I R  
Reverse current  
µA  
nC  
V R=600 V, T j=150 °C  
-
1
150  
AC characteristics  
V R=400 V,I FI F,max  
di F/dt =200 A/µs,  
T j=150 °C  
,
Q c  
t c  
Total capacitive charge  
Switching time3)  
-
-
-
-
-
3.2  
-
-
<10 ns  
V R=1 V, f = MHz  
C
60  
8
-
-
-
pF  
V R=300 V, f =1 MHz  
V R=600 V, f =1 MHz  
8
1) J-STD20 and JESD22  
2) All devices tested under avalanche condition, for a time periode of 5ms, at 5mA.  
3) tc is the time constant for the capacitive displacement current waveform (independent from Tj, ILOAD and  
di/dt), different from trr, which is dependent on Tj, ILOAD, di/dt. No reverse recovery time constant trr due to  
absence of minority carrier injection.  
4) Only capacitive charge occuring, guaranteed by design.  
Rev. 2.0  
page 2  
2007-04-25  
IDT02S60C  
1 Power dissipation  
tot=f(T C)  
2 Diode forward current  
I F=f(T C); T j175 °C  
parameter: D=t P /T  
P
parameter: RthJC(max)  
20  
14  
12  
0.1  
16  
12  
8
10  
8
0.3  
6
0.5  
0.7  
4
1
4
2
0
0
25  
75  
125  
175  
25  
75  
125  
175  
T
C [°C]  
T C [°C]  
3 Typ. forward characteristic  
I F=f(V F); t p=400 µs  
parameter: T j  
4 Typ. forward characteristic in surge current  
mode  
I F=f(V F); t p=400 µs; parameter: Tj  
3
15  
150ºC  
25ºC  
-55ºC  
100ºC  
12  
175ºC  
2
1
0
175ºC  
9
-55ºC  
25ºC  
150ºC  
6
3
0
100ºC  
0
1
2
3
4
0
2
4
6
8
V F[V]  
V F[V]  
Rev. 2.0  
page 3  
2007-04-25  
IDT02S60C  
6 Typ. reverse current vs. reverse voltage  
5 Typ. capacitance charge vs. current slope  
Q C=f(di F/dt )4); T j=150 °C; I FI F,max  
I R=f(V R)  
parameter: T j  
10-5  
10-6  
10-7  
10-8  
10-9  
4
3
2
1
0
175 °C  
150 °C  
100 °C  
25 °C  
-55 °C  
10-10  
100  
200  
300  
400  
500  
600  
100  
400  
700  
1000  
di F/d t [A/µs]  
V R [V]  
7 Transient thermal impedance  
thJC=f(t p)  
8 Typ. capacitance vs. reverse voltage  
Z
C =f(V R); T C=25 °C, f =1 MHz  
parameter: D =t p/T  
101  
60  
45  
30  
15  
0
0.5  
0.2  
100  
0.1  
0.05  
0.02  
0
10-1  
10-2  
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
102  
103  
V
R [V]  
t
P [s]  
Rev. 2.0  
page 4  
2007-04-25  
IDT02S60C  
9 Typ. C stored energy  
E C=f(V R)  
1.8  
1.5  
1.3  
1.0  
0.8  
0.5  
0.3  
0.0  
0
100  
200  
300  
400  
500  
600  
V
R [V]  
Rev. 2.0  
page 5  
2007-04-25  
IDT02S60C  
Package Outline:PG-TO220-2-2  
Rev. 2.0  
page 6  
2007-04-25  
IDT02S60C  
Published by  
Infineon Technologies AG  
81726 München, Germany  
© Infineon Technologies AG 2006.  
All Rights Reserved.  
Attention please!  
The information given in this data sheet shall in no event be regarded as a guarantee of conditions o  
characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein, any typica  
values stated herein and/or any information regarding the application of the device, Infineon Technologies  
hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties o  
non-infringement of intellectual property rights of any third party  
Information  
For further information on technology, delivery terms and conditions and prices please contact your neares  
Infineon Technologies Office (www.infineon.com ).  
Warnings  
Due to technical requirements components may contain dangerous substances. For information on the types  
in question please contact your nearest Infineon Technologies Office.  
Infineon Technologies Components may only be used in life-support devices or systems with the express  
written approval of Infineon Technologies, if a failure of such components can reasonably be expected to  
cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or  
system. Life support devices or systems are intended to be implanted in the human body, or to support and/or  
maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the  
user or other persons may be endangered.  
Rev. 2.0  
page 7  
2007-04-25  

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