IRF1104STRR [INFINEON]

Power Field-Effect Transistor, 100A I(D), 40V, 0.009ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-220AB, PLASTIC, D2PAK-3;
IRF1104STRR
型号: IRF1104STRR
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 100A I(D), 40V, 0.009ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-220AB, PLASTIC, D2PAK-3

文件: 总11页 (文件大小:266K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD - 95526  
IRF1104S/LPbF  
HEXFET® Power MOSFET  
l Advanced Process Technology  
l Ultra Low On-Resistance  
l Surface Mount (IRF1104S)  
l Low-profile through-hole (IRF1104L)  
l 175°C Operating Temperature  
l Fast Switching  
D
VDSS = 40V  
RDS(on) = 0.009Ω  
G
l Fully Avalanche Rated  
l Lead-Free  
ID = 100A  
S
Description  
FifthGenerationHEXFETsfromInternationalRectifierutilize  
advancedprocessingtechniquestoachieveextremelylow  
on-resistancepersiliconarea. Thisbenefit,combinedwith  
thefastswitchingspeedandruggedizeddevicedesignthat  
HEXFETPowerMOSFETsarewellknownfor,providesthe  
designerwithanextremelyefficientandreliabledevicefor  
useinawidevarietyofapplications.  
The D2Pak is a surface mount power package capable of  
accommodating die sizes up to HEX-4. It provides the  
highestpowercapabilityandthelowestpossibleon-resistance  
in any existing surface mount package. The D2Pak is  
suitable for high current applications because of its low  
internalconnectionresistanceandcandissipateupto2.0W  
inatypicalsurfacemountapplication.  
2
TO-262  
D
Pak  
Thethrough-holeversion(IRF1104L)isavailableforlow-  
profileapplications.  
Absolute Maximum Ratings  
Parameter  
Max.  
100†  
71†  
400  
2.4  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10Vꢀ  
Continuous Drain Current, VGS @ 10Vꢀ  
Pulsed Drain Current ꢀ  
Power Dissipation  
A
PD @TA = 25°C  
PD @TC = 25°C  
W
W
Power Dissipation  
170  
1.1  
Linear Derating Factor  
W/°C  
V
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
±20  
350  
60  
Single Pulse Avalanche Energy‚ꢀ  
Avalanche Current  
mJ  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒꢀ  
Operating Junction and  
17  
mJ  
V/ns  
5.0  
-55 to + 175  
300 (1.6mm from case )  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
°C  
Thermal Resistance  
Parameter  
Junction-to-Case  
Junction-to-Ambient(PCB Mounted,steady-state)**  
Typ.  
–––  
–––  
Max.  
0.9  
62  
Units  
RθJC  
°C/W  
RθJA  
www.irf.com  
1
7/20/04  
IRF1104S/LPbF  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
40 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.038 ––– V/°C Reference to 25°C, ID = 1mAꢀ  
RDS(on)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance ––– ––– 0.009  
V
S
VGS = 10V, ID = 60A „  
VDS = VGS, ID = 250µA  
VDS = 30V, ID = 60Aꢀ  
VDS = 40V, VGS = 0V  
VDS = 32V, VGS = 0V, TJ = 150°C  
VGS = 20V  
Gate Threshold Voltage  
2.0  
37  
––– 4.0  
––– –––  
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 93  
––– ––– 29  
––– ––– 30  
µA  
IDSS  
Drain-to-Source Leakage Current  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
nA  
IGSS  
VGS = -20V  
Qg  
Qgs  
Qgd  
td(on)  
tr  
ID = 60A  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 32V  
VGS = 10V, See Fig. 6 and 13 „ꢀ  
–––  
15 –––  
VDD = 20V  
––– 114 –––  
ID = 60A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
–––  
–––  
28 –––  
19 –––  
RG = 3.6Ω  
RD = 0.33, See Fig. 10 „ꢀ  
Between lead,  
LS  
Internal Source Inductance  
–––  
–––  
7.5  
nH  
pF  
and center of die contact  
VGS = 0V  
Ciss  
Coss  
Crss  
Input Capacitance  
––– 2900 –––  
––– 1100 –––  
––– 250 –––  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
ƒ = 1.0MHz, See Fig. 5ꢀ  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
MOSFET symbol  
showing the  
D
S
IS  
––– –––  
––– –––  
100†  
A
G
ISM  
Pulsed Source Current  
(Body Diode)   
integral reverse  
400  
p-n junction diode.  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
––– ––– 1.3  
––– 74 110  
––– 188 280  
V
TJ = 25°C, IS =60A, VGS = 0V „  
TJ = 25°C, IF =60A  
ns  
Qrr  
ton  
nC di/dt = 100A/µs „ꢀ  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
 Repetitive rating; pulse width limited by  
„ Pulse width 300µs; duty cycle 2%.  
Uses IRF1104 data and test conditions.  
max. junction temperature. ( See fig. 11 )  
‚ Starting TJ = 25°C, L = 194µH  
RG = 25, IAS = 60A. (See Figure 12)  
† Calculated continuous current based on maximum allowable  
junction temperature;for recommended current-handling of the  
package refer to Design Tip # 93-4  
ƒ ISD 60A, di/dt 304A/µs, VDD V(BR)DSS  
TJ 175°C  
,
** When mounted on 1" square PCB ( FR-4 or G-10 Material ).  
For recommended footprint and soldering techniques refer to application note #AN-994.  
2
www.irf.com  
IRF1104S/LPbF  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
TOP  
TOP  
10V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM 4.5V  
BOTTOM 4.5V  
4.5V  
4.5V  
20µs PULSE WIDTH  
20µs PULSE WIDTH  
°
T = 25 C  
J
°
T = 175 C  
J
1
0.1  
1
0.1  
1
10  
100  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
2.5  
1000  
100A  
=
I
D
2.0  
1.5  
1.0  
0.5  
0.0  
°
T = 175 C  
J
100  
10  
1
°
T = 25 C  
J
V
= 50V  
DS  
20µs PULSE WIDTH  
V
=10V  
GS  
0.1  
4.0  
5.0  
6.0  
7.0  
8.0 9.0  
10.0  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
°
V
, Gate-to-Source Voltage (V)  
T , Junction Temperature( C)  
J
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs.Temperature  
www.irf.com  
3
IRF1104S/LPbF  
5000  
20  
15  
10  
5
V
= 0V,  
f = 1MHz  
C SHORTED  
ds  
I = 60A  
D
GS  
V
V
= 32V  
= 20V  
C
= C + C  
DS  
DS  
iss  
gs  
gd ,  
C
= C  
rss  
gd  
C
= C + C  
4000  
3000  
2000  
1000  
0
oss  
ds  
gd  
C
iss  
C
oss  
FOR TEST CIRCUIT  
SEE FIGURE 13  
C
rss  
0
0
25  
50  
75  
100  
1
10  
100  
Q , Total Gate Charge (nC)  
V
, Drain-to-Source Voltage (V)  
G
DS  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-SourceVoltage  
Drain-to-SourceVoltage  
1000  
100  
10  
10000  
1000  
100  
10  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
°
T = 175 C  
J
10us  
100us  
1ms  
°
T = 25 C  
J
1
10ms  
°
T = 25 C  
C
°
T = 175 C  
Single Pulse  
J
V
= 0 V  
GS  
1
0.1  
0.2  
1
10  
100  
0.8  
1.4  
2.0  
2.6  
V
,Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
SD  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
ForwardVoltage  
4
www.irf.com  
IRF1104S/LPbF  
RD  
100  
80  
60  
40  
20  
0
VDS  
LIMITED BY PACKAGE  
VGS  
D.U.T.  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
75  
100  
125  
150  
175  
°
T , Case Temperature ( C)  
C
10%  
V
GS  
t
t
r
t
t
f
Fig 9. Maximum Drain Current Vs.  
d(on)  
d(off)  
CaseTemperature  
Fig 10b. Switching Time Waveforms  
1
D = 0.50  
0.20  
0.10  
0.05  
0.1  
P
2
DM  
t
0.02  
0.01  
SINGLE PULSE  
(THERMAL RESPONSE)  
1
t
2
Notes:  
1. Duty factor D =  
t / t  
1
2. Peak T =P  
x Z  
+ T  
C
J
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRF1104S/LPbF  
800  
600  
400  
200  
0
I
D
TOP  
24A  
42A  
15V  
BOTTOM 60A  
DRIVER  
+
L
V
DS  
D.U.T  
R
G
V
DD  
-
I
A
AS  
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
25  
50  
75  
100  
125  
150  
175  
°
V
Starting T , Junction Temperature ( C)  
J
(BR)DSS  
t
p
Fig 12c. Maximum Avalanche Energy  
Vs. DrainCurrent  
I
AS  
Current Regulator  
Same Type as D.U.T.  
Fig 12b. Unclamped Inductive Waveforms  
50KΩ  
.2µF  
12V  
Q
G
.3µF  
+
10 V  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
6
www.irf.com  
IRF1104S/LPbF  
Peak Diode Recovery dv/dt Test Circuit  
+
ƒ
-
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
P.W.  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFETS  
www.irf.com  
7
IRF1104S/LPbF  
D2Pak Package Outline  
Dimensions are shown in millimeters (inches)  
D2Pak Part Marking Information (Lead-Free)  
T H IS IS AN IR F 530S WIT H  
P AR T N U MB E R  
L OT COD E 8024  
IN T E R N AT ION AL  
R E CT IF IE R  
L OGO  
AS S E MB L E D ON WW 02, 2000  
IN T H E AS S E MB L Y L IN E "L "  
F 530S  
D AT E CODE  
Y E AR 0 = 2000  
W E E K 02  
N ote: "P " in as s embly line  
pos ition indicates "L ead-F ree"  
AS S E MB L Y  
L OT COD E  
L INE  
L
OR  
P AR T N U MB E R  
IN T E R N AT ION AL  
R E CT IF IE R  
L OGO  
F 530S  
D AT E COD E  
P
=
D E S IGN AT E S L E AD -F R E E  
P R OD U CT (OP T ION AL )  
AS S E MB L Y  
L OT COD E  
YE AR  
W E E K 02  
A = AS S E MB L Y S IT E COD E  
0 = 2000  
8
www.irf.com  
IRF1104S/LPbF  
TO-262 Package Outline  
IGBT  
1- GATE  
2- COLLECTOR  
3- EMITTER  
TO-262 Part Marking Information  
E XAMPLE : THIS IS AN IRL3103L  
LOT CODE 1789  
PART NUMBER  
INTERNATIONAL  
RECTIFIER  
ASSEMBLED ON WW 19, 1997  
IN THE ASSEMBLY LINE "C"  
LOGO  
DATE CODE  
YEAR 7 = 1997  
WEEK 19  
Note: "P" in assembly line  
pos ition indicates "Lead-Free"  
AS S E MBL Y  
LOT CODE  
LINE C  
OR  
PART NUMBER  
INTERNATIONAL  
RECTIFIER  
LOGO  
DATE CODE  
P = DESIGNATES LEAD-FREE  
PRODUCT (OPTIONAL)  
YEAR 7 = 1997  
ASSEMBLY  
LOT CODE  
WE EK 19  
A= ASSEMBLY SITE CODE  
www.irf.com  
9
IRF1104S/LPbF  
D2Pak Tape & Reel Infomation  
TRR  
1.60 (.063)  
1.50 (.059)  
1.60 (.063)  
1.50 (.059)  
4.10 (.161)  
3.90 (.153)  
0.368 (.0145)  
0.342 (.0135)  
FEED DIRECTION  
TRL  
11.60 (.457)  
11.40 (.449)  
1.85 (.073)  
1.65 (.065)  
24.30 (.957)  
23.90 (.941)  
15.42 (.609)  
15.22 (.601)  
1.75 (.069)  
1.25 (.049)  
10.90 (.429)  
10.70 (.421)  
4.72 (.136)  
4.52 (.178)  
16.10 (.634)  
15.90 (.626)  
FEED DIRECTION  
13.50 (.532)  
12.80 (.504)  
27.40 (1.079)  
23.90 (.941)  
4
330.00  
(14.173)  
MAX.  
60.00 (2.362)  
MIN.  
30.40 (1.197)  
MAX.  
NOTES :  
1. COMFORMS TO EIA-418.  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSION MEASURED @ HUB.  
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.  
26.40 (1.039)  
24.40 (.961)  
4
3
Data and specifications subject to change without notice.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.07/04  
10  
www.irf.com  
Note: For the most current drawings please refer to the IR website at:  
http://www.irf.com/package/  

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