IRF8736 [INFINEON]
30V 单个 N 通道 HEXFET Power MOSFET, 采用 SO-8 封装;型号: | IRF8736 |
厂家: | Infineon |
描述: | 30V 单个 N 通道 HEXFET Power MOSFET, 采用 SO-8 封装 |
文件: | 总10页 (文件大小:257K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
PD - 97120
IRF8736PbF
HEXFET® Power MOSFET
Applications
l Synchronous MOSFET for Notebook
Processor Power
VDSS
30V
RDS(on) max
Qg Typ.
17nC
4.8m @VGS = 10V
l Synchronous Rectifier MOSFET for
Isolated DC-DC Converters in
Networking Systems
A
A
D
1
8
S
2
7
Benefits
S
D
3
6
l Very Low RDS(on) at 4.5V VGS
l Low Gate Charge
l Fully Characterized Avalanche Voltage
and Current
S
D
4
5
G
D
SO-8
Top View
l 100% Tested for RG
l Lead -Free
Absolute Maximum Ratings
Parameter
Max.
30
Units
V
VDS
Drain-to-Source Voltage
Gate-to-Source Voltage
Continuous Drain Current, VGS @ 10V
Continuous Drain Current, VGS @ 10V
Pulsed Drain Current
V
± 20
18
GS
I
I
I
@ TA = 25°C
D
D
@ TA = 70°C
14.4
144
2.5
A
DM
Power Dissipation
P
P
@TA = 25°C
@TA = 70°C
W
D
D
Power Dissipation
1.6
Linear Derating Factor
Operating Junction and
0.02
-55 to + 150
W/°C
°C
T
J
T
Storage Temperature Range
STG
Thermal Resistance
Parameter
Junction-to-Drain Lead
Junction-to-Ambient
Typ.
–––
Max.
20
Units
°C/W
RθJL
RθJA
–––
50
Notes through ꢀ are on page 9
www.irf.com
1
08/1/07
IRF8736PbF
Static @ TJ = 25°C (unless otherwise specified)
Parameter
Drain-to-Source Breakdown Voltage
Min. Typ. Max. Units
30 ––– –––
Conditions
VGS = 0V, ID = 250µA
BVDSS
∆Β
V
∆
VDSS/ TJ
Breakdown Voltage Temp. Coefficient ––– 0.022 ––– V/°C Reference to 25°C, ID = 1mA
RDS(on)
Static Drain-to-Source On-Resistance
–––
–––
1.35
–––
–––
–––
–––
–––
52
3.9
5.5
1.8
-6.1
–––
–––
–––
–––
–––
17
4.8
6.8
V
GS = 10V, ID = 18A
VGS = 4.5V, ID = 14.4A
VDS = VGS, ID = 50µA
mΩ
VGS(th)
Gate Threshold Voltage
2.35
V
∆
VGS(th)
Gate Threshold Voltage Coefficient
Drain-to-Source Leakage Current
––– mV/°C
IDSS
1.0
150
100
-100
–––
26
µA VDS = 24V, VGS = 0V
V
DS = 24V, VGS = 0V, TJ = 125°C
GS = 20V
IGSS
Gate-to-Source Forward Leakage
Gate-to-Source Reverse Leakage
Forward Transconductance
Total Gate Charge
nA
S
V
VGS = -20V
gfs
Qg
VDS = 15V, ID = 14.4A
–––
–––
–––
–––
–––
–––
–––
Qgs1
Pre-Vth Gate-to-Source Charge
Post-Vth Gate-to-Source Charge
Gate-to-Drain Charge
4.4
1.9
5.8
4.9
7.7
7.1
–––
–––
–––
–––
–––
–––
VDS = 15V
Qgs2
Qgd
nC VGS = 4.5V
ID = 14.4A
Qgodr
Gate Charge Overdrive
Switch Charge (Qgs2 + Qgd)
See Fig. 16
Qsw
Qoss
Output Charge
nC VDS = 10V, VGS = 0V
RG
td(on)
tr
Gate Resistance
Turn-On Delay Time
Rise Time
–––
–––
–––
–––
–––
1.3
12
2.2
–––
–––
–––
–––
Ω
V
DD = 15V, VGS = 4.5V
ID = 14.4A
R = 1.8
15
td(off)
tf
Turn-Off Delay Time
Fall Time
13
ns
pF
Ω
G
7.5
See Fig. 14
VGS = 0V
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
––– 2315 –––
–––
–––
449
219
–––
–––
VDS = 15V
ƒ = 1.0MHz
Avalanche Characteristics
Parameter
Typ.
–––
–––
Max.
126
Units
mJ
Single Pulse Avalanche Energy
EAS
IAR
Avalanche Current
14.4
A
Diode Characteristics
Parameter
Min. Typ. Max. Units
Conditions
IS
Continuous Source Current
–––
–––
3.1
MOSFET symbol
(Body Diode)
Pulsed Source Current
A
showing the
integral reverse
ISM
–––
–––
144
(Body Diode)
Diode Forward Voltage
p-n junction diode.
VSD
trr
–––
–––
–––
–––
16
1.0
24
29
V
T = 25°C, I = 14.4A, V = 0V
J S GS
Reverse Recovery Time
Reverse Recovery Charge
Forward Turn-On Time
ns T = 25°C, I = 14.4A, VDD = 10V
J F
Qrr
ton
di/dt = 300A/µs
19
nC
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)
2
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IRF8736PbF
1000
100
10
1000
100
10
VGS
10V
VGS
10V
TOP
TOP
5.0V
4.5V
3.5V
3.0V
2.7V
2.5V
2.3V
5.0V
4.5V
3.5V
3.0V
2.7V
2.5V
2.3V
BOTTOM
BOTTOM
1
0.1
1
2.3V
0.01
0.001
2.3V
1
60µs PULSE WIDTH
≤
60µs PULSE WIDTH
Tj = 25°C
≤
Tj = 150°C
0.1
0.1
10
100
0.1
1
10
100
V
, Drain-to-Source Voltage (V)
V
, Drain-to-Source Voltage (V)
DS
DS
Fig 1. Typical Output Characteristics
Fig 2. Typical Output Characteristics
1000
100
10
2.0
I
= 18A
D
V
= 10V
GS
1.5
1.0
0.5
T
= 150°C
J
1
0.1
T
= 25°C
J
V
= 15V
DS
≤ 60µs PULSE WIDTH
0.01
1.0
2.0
3.0
4.0
5.0
-60 -40 -20
T
0
20 40 60 80 100 120 140 160
V
, Gate-to-Source Voltage (V)
GS
, Junction Temperature (°C)
J
Fig 3. Typical Transfer Characteristics
Fig 4. Normalized On-Resistance
Vs. Temperature
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3
IRF8736PbF
10000
5
4
3
2
1
0
V
C
= 0V,
f = 1 MHZ
GS
I = 14.4A
D
= C + C , C SHORTED
iss
gs
gd ds
V
V
= 24V
= 15V
C
= C
DS
DS
rss
gd
C
= C + C
oss
ds
gd
Ciss
1000
Coss
Crss
100
0
4
8
12
16
20
1
10
100
Q , Total Gate Charge (nC)
g
V
, Drain-to-Source Voltage (V)
DS
Fig 6. Typical Gate Charge Vs.
Fig 5. Typical Capacitance Vs.
Gate-to-Source Voltage
Drain-to-Source Voltage
1000
1000
100
10
OPERATION IN THIS AREA
LIMITED BY R
(on)
DS
100
10
1
100µsec
1msec
T
= 150°C
J
10msec
T
= 25°C
J
1
T
= 25°C
A
Tj = 150°C
Single Pulse
V
GS
= 0V
0.1
0.1
0.2
0.4
0.6
0.8
1.0
1.2
0.1
1
10
100
V
, Drain-to-Source Voltage (V)
V
, Source-to-Drain Voltage (V)
DS
SD
Fig 8. Maximum Safe Operating Area
Fig 7. Typical Source-Drain Diode
Forward Voltage
4
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IRF8736PbF
20
16
12
8
2.4
2.2
2.0
1.8
1.6
1.4
1.2
1.0
0.8
I
= 50µA
D
4
0
25
50
75
100
125
150
-75 -50 -25
0
25
50
75 100 125 150
T , Ambient Temperature (°C)
T , Temperature ( °C )
A
J
Fig 10. Threshold Voltage Vs. Temperature
Fig 9. Maximum Drain Current Vs.
Ambient Temperature
100
D = 0.50
10
1
0.20
0.10
0.05
R1
R1
R2
R2
R3
R3
R4
R4
τι
(sec)
1.396574 0.000246
Ri (°C/W)
0.02
0.01
τJ
τa
τJ
τ1
7.206851 0.037927
τ
τ
3τ3
τ4
2 τ2
τ1
τ4
27.1278
14.26877
1.0882
30.3
Ci= τi/Ri
0.1
Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthja + Tc
SINGLE PULSE
( THERMAL RESPONSE )
0.01
1E-006
1E-005
0.0001
0.001
0.01
0.1
1
10
100
t , Rectangular Pulse Duration (sec)
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient
www.irf.com
5
IRF8736PbF
600
500
400
300
200
100
0
15V
I
D
TOP
1.28A
1.75A
14.4A
DRIVER
+
L
V
BOTTOM
DS
D.U.T
R
G
V
DD
-
I
A
AS
20V
Ω
t
0.01
p
Fig 12a. Unclamped Inductive Test Circuit
V
(BR)DSS
t
p
25
50
75
100
125
150
Starting T , Junction Temperature (°C)
J
Fig 12c. Maximum Avalanche Energy
Vs. Drain Current
RD
I
AS
VDS
Fig 12b. Unclamped Inductive Waveforms
VGS
D.U.T.
RG
+VDD
-
Current Regulator
Same Type as D.U.T.
VGS
PulseWidth ≤ 1 µs
Duty Factor ≤ 0.1 %
50KΩ
.2µF
12V
.3µF
Fig 14a. Switching Time Test Circuit
+
V
DS
V
DS
D.U.T.
-
90%
V
GS
3mA
10%
I
I
D
G
V
GS
Current Sampling Resistors
t
t
r
t
t
f
d(on)
d(off)
Fig 13. Gate Charge Test Circuit
Fig 14b. Switching Time Waveforms
6
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IRF8736PbF
Driver Gate Drive
P.W.
P.W.
D =
D.U.T
Period
Period
+
-
*
=10V
V
GS
Circuit Layout Considerations
• Low Stray Inductance
• Ground Plane
• Low Leakage Inductance
Current Transformer
D.U.T. I Waveform
SD
+
-
Reverse
Recovery
Current
Body Diode Forward
Current
di/dt
-
+
D.U.T. V Waveform
DS
Diode Recovery
dv/dt
V
DD
VDD
Re-Applied
Voltage
• dv/dt controlled by RG
RG
+
-
Body Diode
Forward Drop
• Driver same type as D.U.T.
• ISD controlled by Duty Factor "D"
• D.U.T. - Device Under Test
Inductor Curent
I
SD
Ripple ≤ 5%
* VGS = 5V for Logic Level Devices
Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel
HEXFET® Power MOSFETs
Id
Vds
Vgs
Vgs(th)
Qgs1
Qgs2
Qgodr
Qgd
Fig 16. Gate Charge Waveform
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7
IRF8736PbF
SO-8 Package Outline
Dimensions are shown in milimeters (inches)
SO-8 Part Marking Information
Note: For the most current drawing please refer to IR website at http://www.irf.com/package
8
www.irf.com
IRF8736PbF
SO-8 Tape and Reel
Dimensions are shown in milimeters (inches)
TERMINAL NUMBER 1
12.3 ( .484 )
11.7 ( .461 )
8.1 ( .318 )
7.9 ( .312 )
FEED DIRECTION
NOTES:
1. CONTROLLING DIMENSION : MILLIMETER.
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES).
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.
330.00
(12.992)
MAX.
14.40 ( .566 )
12.40 ( .488 )
NOTES :
1. CONTROLLING DIMENSION : MILLIMETER.
2. OUTLINE CONFORMS TO EIA-481 & EIA-541.
Note: For the most current drawing please refer to IR website at http://www.irf.com/package
Notes:
Repetitive rating; pulse width limited by max. junction temperature.
Starting TJ = 25°C, L = 1.21mH, RG = 25Ω, IAS = 14.4A.
Pulse width ≤ 400µs; duty cycle ≤ 2%.
When mounted on 1 inch square copper board
ꢀ
Rθ is measured at TJ approximately 90°C
Data and specifications subject to change without notice.
This product has been designed and qualified for the Consumer market.
Qualification Standards can be found on IR’s Web site.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.8/2007
www.irf.com
9
IMPORTANT NOTICE
The information given in this document shall in no For further information on the product, technology,
event be regarded as a guarantee of conditions or delivery terms and conditions and prices please
characteristics (“Beschaffenheitsgarantie”) .
contact your nearest Infineon Technologies office
(www.infineon.com).
With respect to any examples, hints or any typical
values stated herein and/or any information
regarding the application of the product, Infineon
Technologies hereby disclaims any and all
warranties and liabilities of any kind, including
without limitation warranties of non-infringement
of intellectual property rights of any third party.
WARNINGS
Due to technical requirements products may
contain dangerous substances. For information on
the types in question please contact your nearest
Infineon Technologies office.
In addition, any information given in this document
is subject to customer’s compliance with its
obligations stated in this document and any
applicable legal requirements, norms and
standards concerning customer’s products and any
use of the product of Infineon Technologies in
customer’s applications.
Except as otherwise explicitly approved by Infineon
Technologies in a written document signed by
authorized
representatives
of
Infineon
Technologies, Infineon Technologies’ products may
not be used in any applications where a failure of
the product or any consequences of the use thereof
can reasonably be expected to result in personal
injury.
The data contained in this document is exclusively
intended for technically trained staff. It is the
responsibility of customer’s technical departments
to evaluate the suitability of the product for the
intended application and the completeness of the
product information given in this document with
respect to such application.
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