IRFP250N [INFINEON]

Power MOSFET(Vdss = 200 V, Rds(on)=0.075ohm, Id=30A); 功率MOSFET ( VDSS = 200 V, RDS(ON) = 0.075ohm ,ID = 30A )
IRFP250N
型号: IRFP250N
厂家: Infineon    Infineon
描述:

Power MOSFET(Vdss = 200 V, Rds(on)=0.075ohm, Id=30A)
功率MOSFET ( VDSS = 200 V, RDS(ON) = 0.075ohm ,ID = 30A )

晶体 晶体管 功率场效应晶体管 开关 局域网
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PD - 94008  
IRFP250N  
HEXFET® Power MOSFET  
l Advanced Process Technology  
l Dynamic dv/dt Rating  
l 175°C Operating Temperature  
l Fast Switching  
l Fully Avalanche Rated  
l Ease of Paralleling  
D
VDSS = 200V  
R
DS(on) = 0.075Ω  
G
ID = 30A  
S
l Simple Drive Requirements  
Description  
FifthGenerationHEXFETsfromInternationalRectifierutilizeadvancedprocessing  
techniques to achieve extremely low on-resistance per silicon area. This benefit,  
combined with the fast switching speed and ruggedized device design that  
HEXFET Power MOSFETs are well known for, provides the designer with an  
extremely efficient and reliable device for use in a wide variety of applications.  
The TO-247 package is preferred for commercial-industrial applications where  
higher power levels preclude the use of TO-220 devices. The TO-247 is similar  
but superior to the earlier TO-218 package because of its isolated mounting hole.  
TO-247AC  
Absolute Maximum Ratings  
Parameter  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current   
Max.  
30  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
21  
A
120  
214  
1.4  
± 20  
315  
30  
PD @TC = 25°C  
Power Dissipation  
W
W/°C  
V
Linear Derating Factor  
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
Single Pulse Avalanche Energy‚  
Avalanche Current  
mJ  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒ  
Operating Junction and  
21  
mJ  
V/ns  
8.6  
-55 to +175  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
Mounting torque, 6-32 or M3 srew  
°C  
300 (1.6mm from case )  
10 lbf•in (1.1N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
Max.  
Units  
RθJC  
RθCS  
RθJA  
0.7  
–––  
40  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
0.24  
–––  
°C/W  
www.irf.com  
1
10/09/00  
IRFP250N  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
200 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.26 ––– V/°C Reference to 25°C, ID = 1mA  
RDS(on)  
VGS(th)  
gfs  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
––– ––– 0.075  
V
S
VGS = 10V, ID = 18A „  
VDS = VGS, ID = 250µA  
VDS = 50V, ID = 18A „  
VDS = 200V, VGS = 0V  
VDS = 160V, VGS = 0V, TJ = 150°C  
VGS = 20V  
2.0  
17  
––– 4.0  
––– –––  
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 123  
––– ––– 21  
––– ––– 57  
IDSS  
Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
IGSS  
VGS = -20V  
Qg  
ID = 18A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 160V  
VGS = 10V, See Fig. 6 and 13 „  
–––  
–––  
–––  
–––  
14 –––  
43 –––  
41 –––  
33 –––  
VDD = 100V  
ID = 18A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
RG = 3.9Ω  
RD = 5.5, See Fig. 10 „  
Between lead,  
6mm (0.25in.)  
from package  
D
LD  
LS  
Internal Drain Inductance  
Internal Source Inductance  
–––  
–––  
4.5 –––  
nH  
pF  
G
–––  
7.5  
and center of die contact  
VGS = 0V  
S
Ciss  
Coss  
Crss  
Input Capacitance  
––– 2159 –––  
––– 315 –––  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
–––  
83 –––  
ƒ = 1.0MHz, See Fig. 5  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
MOSFET symbol  
showing the  
D
IS  
30  
––– –––  
––– –––  
A
G
ISM  
Pulsed Source Current  
(Body Diode)  
integral reverse  
120  
S
p-n junction diode.  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
––– ––– 1.3  
––– 186 279  
––– 1.3 2.0  
V
TJ = 25°C, IS = 18A, VGS = 0V „  
TJ = 25°C, IF = 18A  
ns  
Qrr  
ton  
µC di/dt = 100A/µs „  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
ƒISD 18A, di/dt 374A/µs, VDD V(BR)DSS  
,
Repetitive rating; pulse width limited by  
max. junction temperature. (See Fig. 11)  
TJ 175°C  
„Pulse width 300µs; duty cycle 2%.  
‚Starting TJ = 25°C, L = 1.9mH  
RG = 25, IAS = 18A. (See Figure 12)  
2
www.irf.com  
IRFP250N  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
TOP  
TOP  
10V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM4.5V  
BOTTOM 4.5V  
4.5V  
4.5V  
1
1
0.1  
20µs PULSE WIDTH  
20µs PULSE WIDTH  
°
T = 175 C  
J
°
T = 25 C  
J
0.1  
0.1  
0.01  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
1000  
30A  
=
I
D
100  
10  
1
°
T = 175 C  
J
°
T = 25 C  
J
V
= 50V  
DS  
20µs PULSE WIDTH  
V
=10V  
GS  
0.1  
4.0  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
°
5.0  
6.0  
7.0  
8.0 9.0 10.0  
T , Junction Temperature( C)  
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 4. Normalized On-Resistance  
Fig 3. Typical Transfer Characteristics  
Vs. Temperature  
www.irf.com  
3
IRFP250N  
5000  
16  
12  
8
V
GS  
= 0V, f = 1 MHZ  
= C + C , C  
I
D
=
18A  
V
V
V
= 160V  
= 100V  
= 40V  
DS  
DS  
DS  
C
SHORTED  
iss  
gs  
gd ds  
C
= C  
rss  
gd  
4000  
3000  
2000  
1000  
0
C
= C + C  
ds gd  
oss  
Ciss  
Coss  
Crss  
4
0
0
20  
40  
60  
80  
100  
1
10  
100  
1000  
Q
, Total Gate Charge (nC)  
G
V
, Drain-to-Source Voltage (V)  
DS  
Fig 5. Typical Capacitance Vs.  
Fig 6. Typical Gate Charge Vs.  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
1000  
100  
10  
1000  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
100  
10  
1
°
T = 175 C  
J
10us  
100us  
1ms  
°
T = 25 C  
J
°
T = 25 C  
C
°
T = 175 C  
Single Pulse  
J
10ms  
V
= 0 V  
GS  
0.1  
0.2  
1
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
1.6  
1
10  
100  
1000  
V
,Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
SD  
DS  
Fig 7. Typical Source-Drain Diode  
Fig 8. Maximum Safe Operating Area  
Forward Voltage  
4
www.irf.com  
IRFP250N  
RD  
VDS  
35  
30  
25  
20  
15  
10  
5
VGS  
10V  
D.U.T.  
RG  
+
-
VDD  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
0
25  
50  
75  
100  
125  
150  
175  
°
, Case Temperature ( C)  
10%  
T
C
V
GS  
t
t
r
t
t
f
d(on)  
d(off)  
Fig 9. Maximum Drain Current Vs.  
Fig 10b. Switching Time Waveforms  
Case Temperature  
1
D = 0.50  
0.20  
0.1  
0.10  
P
2
DM  
0.05  
t
1
SINGLE PULSE  
0.02  
t
(THERMAL RESPONSE)  
0.01  
2
Notes:  
1. Duty factor D = t / t  
1
2. Peak T =P  
x Z  
+ T  
C
J
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRFP250N  
800  
600  
400  
200  
0
I
D
15V  
TOP  
7.3A  
13A  
BOTTOM 18A  
D RIVER  
L
V
D S  
D .U .T  
R
+
G
V
D D  
-
I
A
AS  
20V  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
(BR )D SS  
t
p
25  
50  
75  
100  
125  
150  
175  
°
Starting T , Junction Temperature ( C)  
J
Fig 12c. Maximum Avalanche Energy  
Vs. Drain Current  
I
AS  
Fig 12b. Unclamped Inductive Waveforms  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
Q
G
+
10 V  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Current Sampling Resistors  
Charge  
Fig 13b. Gate Charge Test Circuit  
Fig 13a. Basic Gate Charge Waveform  
6
www.irf.com  
IRFP250N  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFETS  
www.irf.com  
7
IRFP250N  
Package Outline  
TO-247AC Outline  
Dimensions are shown in millimeters (inches)  
- D -  
3.65 (.143)  
3.55 (.140)  
5.30 (.209)  
4.70 (.185)  
15.90 (.626)  
15.30 (.602)  
0.25 (.010)  
D
B
M
M
2.50 (.089)  
- B -  
- A -  
1.50 (.059)  
5.50 (.217)  
4
20.30 (.800)  
19.70 (.775)  
NOTES:  
5.50 (.217)  
4.50 (.177)  
2X  
1
DIMENSIONING & TO LERANCING  
P ER ANSI Y14.5M , 1982.  
1
2
3
2
3
CONTROLLING DIMENSIO N : INCH.  
CONFORMS TO JEDEC OUTLINE  
TO-247-AC.  
- C -  
14.80 (.583)  
14.20 (.559)  
4.30 (.170)  
3.70 (.145)  
LEAD AS SIGNMENTS  
2.40 (.094)  
2.00 (.079)  
2X  
0.80 (.031)  
0.40 (.016)  
1.40 (.056)  
1.00 (.039)  
3X  
3X  
1 - GATE  
2 - DRAIN  
3 - SOURCE  
4 - DRAIN  
2.60 (.102)  
2.20 (.087)  
0.25 (.010)  
C
A
S
M
5.45 (.215)  
3.40 (.133)  
3.00 (.118)  
2X  
Part Marking Information  
TO-247AC  
EXAMPLE : THIS IS AN IRFPE30  
W ITH ASSEMBLY  
A
PART NUMBER  
INTERNATIONAL  
RECTIFIER  
LOGO  
LOT CODE 3A1Q  
IRFPE30  
3A1Q 9302  
DATE CODE  
(YYW W )  
ASSEMBLY  
LOT CODE  
YY  
= YEAR  
W W W EEK  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
IR EUROPEAN REGIONAL CENTRE: 439/445 Godstone Rd, Whyteleafe, Surrey CR3 OBL, UK Tel: ++ 44 (0)20 8645 8000  
IR CANADA: 15 Lincoln Court, Brampton, Ontario L6T3Z2, Tel: (905) 453 2200  
IR GERMANY: Saalburgstrasse 157, 61350 Bad Homburg Tel: ++ 49 (0) 6172 96590  
IR ITALY: Via Liguria 49, 10071 Borgaro, Torino Tel: ++ 39 011 451 0111  
IR JAPAN: K&H Bldg., 2F, 30-4 Nishi-Ikebukuro 3-Chome, Toshima-Ku, Tokyo 171 Tel: 81 (0)3 3983 0086  
IR SOUTHEAST ASIA: 1 Kim Seng Promenade, Great World City West Tower, 13-11, Singapore 237994 Tel: ++ 65 (0)838 4630  
IR TAIWAN:16 Fl. Suite D. 207, Sec. 2, Tun Haw South Road, Taipei, 10673 Tel: 886-(0)2 2377 9936  
Data and specifications subject to change without notice. 10/00  
8
www.irf.com  

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