IRFPS40N50LPBF [INFINEON]

HEXFET㈢Power MOSFET; HEXFET㈢Power MOSFET
IRFPS40N50LPBF
型号: IRFPS40N50LPBF
厂家: Infineon    Infineon
描述:

HEXFET㈢Power MOSFET
HEXFET㈢Power MOSFET

晶体 晶体管 功率场效应晶体管 开关 脉冲 局域网
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PD- 95141  
IRFPS40N50LPbF  
SMPS MOSFET  
HEXFET® Power MOSFET  
Applications  
Zero Voltage Switching SMPS  
Telecom and Server Power Supplies  
Uninterruptible Power Supplies  
Motor Control applications  
Lead-Free  
Trr typ.  
VDSS RDS(on)  
ID  
typ.  
500V  
170ns 46A  
0.087Ω  
Features and Benefits  
SuperFast body diode eliminates the need for external  
diodes in ZVS applications.  
Lower Gate charge results in simpler drive requirements.  
Enhanced dv/dt capabilities offer improved ruggedness.  
Higher Gate voltage threshold offers improved noise  
immunity.  
Super-247™  
Absolute Maximum Ratings  
Parameter  
Max.  
46  
Units  
A
ID @ TC = 25°C Continuous Drain Current, VGS @ 10V  
ID @ TC = 100°C Continuous Drain Current, VGS @ 10V  
29  
IDM  
180  
540  
Pulsed Drain Current  
PD @TC = 25°C  
Power Dissipation  
W
Linear Derating Factor  
Gate-to-Source Voltage  
4.3  
W/°C  
V
VGS  
±30  
dv/dt  
TJ  
Peak Diode Recovery dv/dt  
Operating Junction and  
34  
V/ns  
-55 to + 150  
TSTG  
Storage Temperature Range  
°C  
Soldering Temperature, for 10 seconds  
300 (1.6mm from case )  
Diode Characteristics  
Symbol  
Parameter  
Min. Typ. Max. Units  
––– ––– 46  
Conditions  
I
S
Continuous Source Current  
MOSFET symbol  
(Body Diode)  
A
showing the  
I
Pulsed Source Current  
––– ––– 180  
integral reverse  
SM  
(Body Diode)  
p-n junction diode.  
V
t
T = 25°C, I = 46A, V = 0V  
J S GS  
Diode Forward Voltage  
Reverse Recovery Time  
––– ––– 1.5  
––– 170 250  
––– 220 330  
V
SD  
T = 25°C, I = 46A  
ns  
rr  
J
F
TJ = 125°C, di/dt = 100A/µs  
Q
T = 25°C, I = 46A, V = 0V  
––– 705 1060 nC  
Reverse Recovery Charge  
rr  
J
S
GS  
TJ = 125°C, di/dt = 100A/µs  
––– 1.3  
2.0  
IRRM  
T = 25°C  
J
Reverse Recovery Current  
Forward Turn-On Time  
––– 9.0 –––  
A
t
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
on  
www.irf.com  
1
09/14/04  
IRFPS40N50LPbF  
Static @ TJ = 25°C (unless otherwise specified)  
Symbol  
Parameter  
Min. Typ. Max. Units  
Conditions  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
500  
–––  
–––  
V
VGS = 0V, ID = 250µA  
V(BR)DSS/TJ  
RDS(on)  
Breakdown Voltage Temp. Coefficient ––– 0.60 –––  
Static Drain-to-Source On-Resistance ––– 0.087 0.100  
V/°C  
Reference to 25°C, ID = 1mA  
V
GS = 10V, ID = 28A  
V
VGS(th)  
Gate Threshold Voltage  
3.0  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
5.0  
50  
VDS = VGS, ID = 250µA  
IDSS  
Drain-to-Source Leakage Current  
µA  
mA  
nA  
VDS = 500V, VGS = 0V  
2.0  
100  
VDS = 400V, VGS = 0V, TJ = 125°C  
IGSS  
RG  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Internal Gate Resistance  
VGS = 30V  
––– -100  
VGS = -30V  
––– 0.90 –––  
f = 1MHz, open drain  
Dynamic @ TJ = 25°C (unless otherwise specified)  
Symbol  
gfs  
Parameter  
Forward Transconductance  
Total Gate Charge  
Min. Typ. Max. Units  
Conditions  
VDS = 50V, ID = 46A  
ID = 46A  
21  
–––  
–––  
–––  
–––  
27  
–––  
380  
80  
S
Qg  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
Qgs  
Qgd  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC  
VDS = 400V  
190  
–––  
–––  
–––  
–––  
VGS = 10V, See Fig. 7 & 15  
VDD = 250V  
td(on)  
tr  
170  
50  
ns  
ID = 46A  
td(off)  
Turn-Off Delay Time  
Fall Time  
RG = 0.85Ω  
GS = 10V, See Fig. 14a & 14b  
tf  
69  
V
Ciss  
Input Capacitance  
––– 8110 –––  
VGS = 0V  
Coss  
Output Capacitance  
Reverse Transfer Capacitance  
Output Capacitance  
Output Capacitance  
Effective Output Capacitance  
Effective Output Capacitance  
–––  
–––  
960  
130  
–––  
–––  
V
DS = 25V  
Crss  
ƒ = 1.0MHz, See Fig. 5  
Coss  
VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz  
VGS = 0V, VDS = 400V, ƒ = 1.0MHz  
VGS = 0V,VDS = 0V to 400V  
––– 11200 –––  
pF  
Coss  
–––  
–––  
–––  
240  
440  
310  
–––  
–––  
–––  
Coss eff.  
Coss eff. (ER)  
(Energy Related)  
Avalanche Characteristics  
Parameter  
Typ.  
–––  
–––  
–––  
Max.  
920  
46  
Units  
mJ  
A
Symbol  
Single Pulse Avalanche Energy  
EAS  
Avalanche Current  
IAR  
Repetitive Avalanche Energy  
EAR  
54  
mJ  
Thermal Resistance  
Symbol  
Parameter  
Typ.  
–––  
Max.  
0.23  
–––  
40  
Units  
Junction-to-Case  
RθJC  
RθCS  
RθJA  
Case-to-Sink, Flat, Greased Surface  
Junction-to-Ambient  
0.24  
–––  
°C/W  
Notes:  
„ Pulse width 400µs; duty cycle 2%.  
Coss eff. is a fixed capacitance that gives the same charging time  
as Coss while VDS is rising from 0 to 80% VDSS  
Coss eff.(ER) is a fixed capacitance that stores the same energy  
 Repetitive rating; pulse width limited by  
max. junction temperature. (See Fig. 11).  
‚ Starting TJ = 25°C, L = 0.86mH, RG = 25,  
IAS = 46A. (See Figure 12).  
.
as Coss while VDS is rising from 0 to 80% VDSS  
.
† Rθ is measured at TJ approximately 90°C  
ƒ ISD 46A, di/dt 550A/µs, VDD V(BR)DSS  
TJ 150°C.  
,
2
www.irf.com  
IRFPS40N50LPbF  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
TOP  
TOP  
15V  
10V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
BOTTOM4.5V  
BOTTOM4.5V  
4.5V  
1
4.5V  
1
0.1  
20µs PULSE WIDTH  
20µs PULSE WIDTH  
°
T = 150 C  
J
°
T = 25 C  
J
0.1  
0.1  
0.01  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1000  
3.0  
47A  
=
I
D
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
100  
10  
1
°
T = 150 C  
J
°
T = 25 C  
J
V
= 50V  
DS  
20µs PULSE WIDTH  
V
=10V  
GS  
0.1  
-60 -40 -20  
0
20 40 60 80 100 120 140 160  
°
4
5
6
7
8
9
10  
11  
T , Junction Temperature ( C)  
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
vs. Temperature  
www.irf.com  
3
IRFPS40N50LPbF  
40  
35  
30  
25  
20  
15  
10  
5
1000000  
V
= 0V, f = 1 MHZ  
= C + C , C  
GS  
C
SHORTED  
iss  
gs  
gd ds  
C
= C  
100000  
10000  
1000  
100  
rss  
gd  
C
= C + C  
ds gd  
oss  
Ciss  
Coss  
Crss  
10  
0
1
10  
100  
1000  
0
100  
V
200  
300  
400  
500  
600  
V
, Drain-to-Source Voltage (V)  
Drain-to-Source Voltage (V)  
DS  
DS,  
Fig 5. Typical Capacitance vs.  
Fig 6. Typ. Output Capacitance  
Drain-to-Source Voltage  
Stored Energy vs. VDS  
1000  
100  
10  
20  
15  
10  
5
I = 47A  
D
V
V
V
= 400V  
= 250V  
= 100V  
DS  
DS  
DS  
°
T = 150 C  
J
°
T = 25 C  
J
1
V
= 0 V  
GS  
0.1  
0.2  
0
0.7  
1.2  
1.7  
2.2  
0
100  
200  
300  
400  
V
,Source-to-Drain Voltage (V)  
SD  
Q , Total Gate Charge (nC)  
G
Fig 8. Typical Source-Drain Diode  
Fig 7. Typical Gate Charge vs.  
Forward Voltage  
Gate-to-Source Voltage  
4
www.irf.com  
IRFPS40N50LPbF  
RD  
50  
40  
30  
20  
10  
0
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
25  
50  
75  
100  
125  
150  
°
T , Case Temperature ( C)  
C
10%  
V
GS  
t
t
r
t
t
f
Fig 9. Maximum Drain Current vs.  
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
1
D = 0.50  
0.20  
0.1  
0.10  
0.05  
P
2
DM  
0.01  
0.001  
0.02  
0.01  
t
1
SINGLE PULSE  
(THERMAL RESPONSE)  
t
2
Notes:  
1. Duty factor D =t / t  
1
2. Peak T =P  
x Z  
+ T  
C
J
DM  
thJC  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRFPS40N50LPbF  
1000  
2000  
1500  
1000  
500  
0
I
D
OPERATION IN THIS AREA LIMITED  
TOP  
21A  
30A  
BY R  
DS(on)  
BOTTOM 46A  
100  
10  
1
10us  
100us  
1ms  
°
T = 25 C  
10ms  
C
J
°
T = 150 C  
Single Pulse  
10  
100  
1000  
25  
50  
75  
100  
125  
150  
V
, Drain-to-Source Voltage (V)  
DS  
°
Starting T , Junction Temperature( C)  
J
Fig 13. Maximum Avalanche Energy  
Fig 12. Maximum Safe Operating  
vs. Drain Current  
Area  
15V  
V
(BR)DSS  
t
p
DRIVER  
L
V
DS  
D.U.T  
AS  
R
G
+
-
V
DD  
I
A
20V  
0.01Ω  
t
p
I
AS  
Fig 14b. Unclamped Inductive Waveforms  
Fig 14a. Unclamped Inductive Test Circuit  
Current Regulator  
Same Type as D.U.T.  
Q
G
50KΩ  
.2µF  
12V  
VGS  
.3µF  
Q
Q
GD  
GS  
+
V
DS  
D.U.T.  
-
V
V
GS  
G
3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 15b. Basic Gate Charge Waveform  
Fig 15a. Gate Charge Test Circuit  
6
www.irf.com  
IRFPS40N50LPbF  
Peak Diode Recovery dv/dt Test Circuit  
+
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
ƒ
-
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 16. For N-Channel HEXFET® Power MOSFETs  
www.irf.com  
7
IRFPS40N50LPbF  
Case Outline and Dimensions — Super-247  
Super-247 (TO-274AA) Part Marking Information  
EXAMPLE: THIS IS AN IRFPS37N50A WITH  
ASSEMBLY LOT CODE 1789  
ASSEMBLED ON WW 19, 1997  
IN THE ASSEMBLY LINE "C"  
PART NUMBER  
INTERNATIONAL RECTIFIER  
LOGO  
IRFPS37N50A  
719C  
17  
89  
DATE CODE  
YEAR 7 = 1997  
WEEK 19  
LINE C  
ASSEMBLY LOT CODE  
Note: "P" in assembly line position  
indicates "Lead-Free"  
TOP  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.09/04  
8
www.irf.com  

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