IRLIZ44NPBF [INFINEON]

HEXFET㈢ Power MOSFET; HEXFET㈢功率MOSFET
IRLIZ44NPBF
型号: IRLIZ44NPBF
厂家: Infineon    Infineon
描述:

HEXFET㈢ Power MOSFET
HEXFET㈢功率MOSFET

晶体 晶体管 功率场效应晶体管 开关 脉冲 局域网
文件: 总8页 (文件大小:253K)
中文:  中文翻译
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PD - 95456  
IRLIZ44NPbF  
HEXFET® Power MOSFET  
l Logic-Level Gate Drive  
l Advanced Process Technology  
l IsolatedPackage  
D
VDSS = 55V  
l High Voltage Isolation = 2.5KVRMS  
l Sink to Lead Creepage Dist. = 4.8mm  
l Fully Avalanche Rated  
RDS(on) = 0.022Ω  
G
l Lead-Free  
ID = 30A  
Description  
S
Fifth Generation HEXFETs from International Rectifier  
utilize advanced processing techniques to achieve  
extremely low on-resistance per silicon area. This  
benefit, combined with the fast switching speed and  
ruggedized device design that HEXFET Power MOSFETs  
arewellknownfor, providesthedesignerwithanextremely  
efficient and reliable device for use in a wide variety of  
applications.  
The TO-220 Fullpak eliminates the need for additional  
insulating hardware in commercial-industrial applications.  
The moulding compound used provides a high isolation  
capability and a low thermal resistance between the tab  
and external heatsink. This isolation is equivalent to using  
a 100 micron mica barrier with standard TO-220 product.  
The Fullpak is mounted to a heatsink using a single clip or  
by a single screw fixing.  
TO-220 FULLPAK  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
ID @ TC = 25°C  
ID @ TC = 100°C  
IDM  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current †  
30  
22  
A
160  
PD @TC = 25°C  
Power Dissipation  
45  
0.3  
W
W/°C  
V
Linear Derating Factor  
VGS  
EAS  
IAR  
Gate-to-Source Voltage  
± 16  
Single Pulse Avalanche Energy‚†  
Avalanche Current†  
210  
mJ  
25  
A
EAR  
dv/dt  
TJ  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt ƒ†  
Operating Junction and  
4.5  
mJ  
5.0  
V/ns  
-55 to + 175  
TSTG  
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
Mounting torque, 6-32 or M3 screw  
°C  
300 (1.6mm from case )  
10 lbf•in (1.1N•m)  
Thermal Resistance  
Parameter  
Junction-to-Case  
Typ.  
–––  
Max.  
3.3  
Units  
RθJC  
RθJA  
°C/W  
Junction-to-Ambient  
–––  
65  
6/23/04  
IRLIZ44NPbF  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max. Units  
55 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
Drain-to-Source Breakdown Voltage  
V
V(BR)DSS/TJ Breakdown Voltage Temp. Coefficient ––– 0.070 ––– V/°C Reference to 25°C, ID = 1mA†  
––– ––– 0.022  
––– ––– 0.025  
––– ––– 0.035  
VGS = 10V, ID = 17A „  
GS = 5.0V, ID = 17A „  
RDS(on)  
Static Drain-to-Source On-Resistance  
V
VGS = 4.0V, ID = 14A „  
VDS = VGS, ID = 250µA  
VDS = 25V, ID = 25A†  
VDS = 55V, VGS = 0V  
VDS = 44V, VGS = 0V, TJ = 150°C  
VGS = 16V  
VGS(th)  
gfs  
Gate Threshold Voltage  
1.0  
21  
––– 2.0  
––– –––  
V
S
Forward Transconductance  
––– ––– 25  
––– ––– 250  
––– ––– 100  
––– ––– -100  
––– ––– 48  
––– ––– 8.6  
––– ––– 25  
µA  
nA  
IDSS  
IGSS  
Drain-to-Source Leakage Current  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
VGS = -16V  
Qg  
ID = 25A  
Qgs  
Qgd  
td(on)  
tr  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
Rise Time  
nC VDS = 44V  
VGS = 5.0V, See Fig. 6 and 13 „†  
–––  
–––  
–––  
–––  
11 –––  
84 –––  
26 –––  
15 –––  
VDD = 28V  
ID = 25A  
ns  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
RG = 3.4Ω, VGS = 5.0V  
RD = 1.1Ω, See Fig. 10 „†  
Between lead,  
D
S
LD  
LS  
Internal Drain Inductance  
Internal Source Inductance  
––– 4.5 –––  
––– 7.5 –––  
6mm (0.25in.)  
nH  
pF  
G
from package  
and center of die contact  
VGS = 0V  
Ciss  
Coss  
Crss  
C
Input Capacitance  
––– 1700 –––  
––– 400 –––  
––– 150 –––  
Output Capacitance  
VDS = 25V  
Reverse Transfer Capacitance  
Drain to Sink Capacitance  
ƒ = 1.0MHz, See Fig. 5†  
ƒ = 1.0MHz  
–––  
12 –––  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Min. Typ. Max. Units  
Conditions  
MOSFET symbol  
showing the  
D
S
IS  
30  
––– –––  
A
G
ISM  
Pulsed Source Current  
(Body Diode) †  
integral reverse  
––– ––– 160  
p-n junction diode.  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse RecoveryCharge  
Forward Turn-On Time  
––– ––– 1.3  
––– 80 120  
––– 210 320  
V
TJ = 25°C, IS = 17A, VGS = 0V „  
ns  
TJ = 25°C, IF = 25A  
Qrr  
ton  
µC di/dt = 100A/µs „†  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
„ Pulse width 300µs; duty cycle 2%.  
 Repetitive rating; pulse width limited by  
max. junction temperature. ( See fig. 11 )  
‚ VDD = 15V, starting TJ = 25°C, L = 470µH  
RG = 25, IAS = 25A. (See Figure 12)  
ƒ ISD 25A, di/dt 270A/µs, VDD V(BR)DSS  
TJ 175°C  
t=60s, ƒ=60Hz  
† Uses IRLZ44N data and test conditions  
,
IRLIZ44NPbF  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
VGS  
15V  
TOP  
TOP  
12V  
10V  
8.0V  
6.0V  
4.0V  
3.0V  
12V  
10V  
8.0V  
6.0V  
4.0V  
3.0V  
BOTTOM 2.5V  
BOTTOM 2.5V  
2.5V  
2.5V  
20µs PULSE WIDTH  
20µs PULSE WIDTH  
T
= 25°C  
J
T
= 175°C  
J
1
A
1
0.1  
A
0.1  
1
10  
100  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
3.0  
1000  
I
= 41A  
D
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
TJ= 25°C  
100  
10  
1
TJ = 175°C  
V DS= 25V  
20µs PULSE WIDTH  
V
= 10V  
GS  
A
A
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
2.0  
3.0  
4.0  
5.0  
6.0  
7.0  
8.0  
9.0  
T , Junction Temperature (°C)  
VGS , Gate-to-Source Voltage (V)  
J
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
Vs. Temperature  
IRLIZ44NPbF  
15  
12  
9
2800  
I
= 25A  
V
C
C
C
= 0V,  
f = 1MHz  
D
GS  
iss  
rss  
oss  
= C + C  
,
C
SHORTED  
V
V
= 44V  
= 28V  
gs  
gd  
ds  
DS  
DS  
= C  
gd  
2400  
2000  
1600  
1200  
800  
400  
0
= C + C  
ds  
gd  
C
iss  
C
oss  
6
3
C
rss  
FOR TEST CIRCUIT  
SEE FIGURE 13  
0
A
A
0
10  
20  
30  
40  
50  
60  
70  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
Q
, Total Gate Charge (nC)  
DS  
G
Fig 5. Typical Capacitance Vs.  
Fig 6. Typical Gate Charge Vs.  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
1000  
1000  
100  
10  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
10µs  
100  
100µs  
T = 175°C  
J
1ms  
T = 25°C  
J
10ms  
T
T
= 25°C  
= 175°C  
C
J
V
= 0V  
Single Pulse  
GS  
A
10  
1
A
0.4  
0.8  
1.2  
1.6  
2.0  
2.4  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Source-to-Drain Voltage (V)  
SD  
DS  
Fig 7. Typical Source-Drain Diode  
Fig 8. Maximum Safe Operating Area  
Forward Voltage  
IRLIZ44NPbF  
35  
30  
25  
20  
15  
10  
5
RD  
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
5.0V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 10a. Switching Time Test Circuit  
V
DS  
90%  
0
25  
50  
75  
100  
125  
150  
175  
°
, Case Temperature ( C)  
T
C
10%  
V
GS  
Fig 9. Maximum Drain Current Vs.  
t
t
r
t
t
f
d(on)  
d(off)  
Case Temperature  
Fig 10b. Switching Time Waveforms  
10  
D = 0.50  
0.20  
1
0.10  
0.05  
P
2
DM  
0.02  
0.01  
0.1  
t
1
SINGLE PULSE  
(THERMAL RESPONSE)  
t
2
Notes:  
1. Duty factor D =  
t / t  
1
2. Peak T = P  
J
x Z  
+ T  
C
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
t , Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
IRLIZ44NPbF  
500  
400  
300  
200  
100  
0
L
I
D
V
DS  
TOP  
10A  
17A  
BOTTOM 25A  
D.U.T.  
R
+
-
G
V
DD  
I
5.0 V  
AS  
t
p
0.01Ω  
Fig 12a. Unclamped Inductive Test Circuit  
V
= 25V  
50  
DD  
A
175  
V
(BR)DSS  
25  
75  
100  
125  
150  
Starting T , Junction Temperature (°C)  
t
J
p
V
Fig 12c. Maximum Avalanche Energy  
DD  
Vs. Drain Current  
V
DS  
I
AS  
Fig 12b. Unclamped Inductive Waveforms  
Current Regulator  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
Q
G
.3µF  
+
5.0 V  
V
DS  
D.U.T.  
-
Q
Q
GD  
GS  
V
GS  
V
G
3mA  
I
I
D
G
Charge  
Current Sampling Resistors  
Fig 13a. Basic Gate Charge Waveform  
Fig 13b. Gate Charge Test Circuit  
IRLIZ44NPbF  
Peak Diode Recovery dv/dt Test Circuit  
+
ƒ
-
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
D.U.T  
+
‚
-
„
-
+

RG  
dv/dt controlled by RG  
+
-
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
VDD  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
V
=10V  
*
GS  
D.U.T. I Waveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 14. For N-Channel HEXFETS  
IRLIZ44NPbF  
TO-220 Full-Pak Package Outline  
Dimensions are shown in millimeters (inches)  
TO-220 Full-Pak Part Marking Information  
E XAMP L E : T H IS IS AN IR F I840G  
W IT H AS S E MB L Y  
P AR T N U MB E R  
DAT E CODE  
L OT CODE 3432  
IN T E R N AT IONAL  
R E CT IF IE R  
L OGO  
IR F I8 40G  
924 K  
AS S E MB L E D ON W W 24 1999  
IN T H E AS S E MB L Y L IN E "K "  
34  
32  
Note: "P" in assembly line  
position indicates "Lead-Free"  
YE AR  
WE E K 24  
L IN E  
9 = 1999  
AS S E MB L Y  
L OT CODE  
K
Data and specifications subject to change without notice.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.06/04  

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