LMX321AXK [MAXIM]
PLASTIC ENCAPSULATED DEVICES; 塑封器件
| 型号： | LMX321AXK |
| 厂家： | 
MAXIM INTEGRATED PRODUCTS |
| 描述： | PLASTIC ENCAPSULATED DEVICES |
| 文件： | 总9页 (文件大小：91K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
LMX321AxK
Rev. A
RELIABILITY REPORT
FOR
LMX321AxK
PLASTIC ENCAPSULATED DEVICES
May 26, 2002
MAXIM INTEGRATED PRODUCTS
120 SAN GABRIEL DR.
SUNNYVALE, CA 94086
Written by
Reviewed by
Jim Pedicord
Quality Assurance
Reliability Lab Manager
Bryan J. Preeshl
Quality Assurance
Executive Director
Conclusion
The LMX321 successfully meets the quality and reliability standards required of all Maxim products. In addition,
Maxim’s continuous reliability monitoring program ensures that all outgoing product will continue to meet Maxim’s quality
and reliability standards.
Table of Contents
I. ........Device Description
II. ........Manufacturing Information
III. .......Packaging Information
IV. .......Die Information
V. ........Quality Assurance Information
VI. .......Reliability Evaluation
......Attachments
I. Device Description
A. General
The LMX321 is a single, low-cost, low-voltage, pin-to-pin compatible upgrade to the LMV321 general-purpose op
amp. This device offers Rail-to-Rail® outputs and an input common-mode range that extends below ground. This op
amp draws only 105µA of quiescent current per amplifier, operates from a single +2.3V to +7V supply, and drives
2k resistive loads to within 40mV of either rail. The LMX321 is unity-gain stable with a 1.3MHz gain-bandwidth
product capable of driving capacitive loads up to 400pF. The combination of low voltage, low cost, and small package
size makes this amplifier ideal for portable/battery-powered equipment.
The LMX321 single op amp is available in ultra-small 5-pin SC70 and space-saving 5-pin SOT23 packages.
B. Absolute Maximum Ratings
Item
Rating
Supply Voltage (VCC to VEE)
Differential Input Voltage (VIN+ - VIN-)
OUT_ to VEE
Short-Circuit Duration (OUT_ shorted to VCC or VEE)
Continuous Power Dissapation (TA = +700C)
Storage Temp.
Junction Temperature
Lead Temp. (10 sec.)
Power Dissipation
-0.3V to +8V
VEE to VCC
-0.3V to (VCC + 0.3V)
Continuous
-65°C to +150°C
+150°C
+300°C
5 Lead SOT23
5 Lead SC70
571mW
247mW
Derates above +70°C
5 Lead SOT-23
5 Lead SC70
7.1mW/°C
3.1mW/°C
II. Manufacturing Information
A. Description/Function:
B. Process:
Single, General Purpose, Low-Voltage, Rail-to-Rail Op Amp
CB20 (High Speed Complementary Bipolar Process)
C. Number of Device Transistors:
88
D. Fabrication Location:
E. Assembly Location:
F. Date of Initial Production:
Oregon, USA
Philippines, Malaysia or Thailand
July, 2001
III. Packaging Information
A. Package Type:
B. Lead Frame:
5 Lead SOT-23
5-Lead SC70
Copper
Alloy 42
C. Lead Finish:
Solder Plate
Solder Plate
D. Die Attach:
Silver-filled Epoxy
Gold (1 mil dia.)
Epoxy with silica filler
Buildsheet # 05-2501-0167
Class UL94-V0
Silver-filled Epoxy
Gold (1 mil dia.)
Epoxy with silica filler
Buildsheet # 05-2501-0168
Class UL94-V0
E. Bondwire:
F. Mold Material:
G. Assembly Diagram:
H. Flammability Rating:
I. Classification of Moisture Sensitivity per JEDEC standard JESD22-A112: Level 1
IV. Die Information
A. Dimensions:
31 x 30 mils
B. Passivation:
Si3N4/SiO2 (Silicon nitride/ Silicon dioxide)
C. Interconnect:
Gold
D. Backside Metallization:
E. Minimum Metal Width:
F. Minimum Metal Spacing:
G. Bondpad Dimensions:
H. Isolation Dielectric:
I. Die Separation Method:
None
2 microns (as drawn)
2 microns (as drawn)
5 mil. Sq.
SiO2
Wafer Saw
V. Quality Assurance Information
A. Quality Assurance Contacts:
Jim Pedicord
Bryan Preeshl
Kenneth Huening
(Reliability Lab Manager)
(Executive Director)
(Vice President)
B. Outgoing Inspection Level: 0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate: < 50 ppm
D. Sampling Plan: Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135°C biased (static) life test are shown in Table 1. Using these results, the Failure
Rate (l ) is calculated as follows:
l =
1
=
1.83
(Chi square value for MTTF upper limit)
MTTF
192 x 4389 x 79 x 2
Temperature Acceleration factor assuming an activation energy of 0.8eV
l = 13.76 x 10-9
l = 13.76 F.I.T. (60% confidence level @ 25°C)
This low failure rate represents data collected from Maxim’s reliability monitor program. In addition to
routine production Burn-In, Maxim pulls a sample from every fabrication process three times per week and subjects
it to an extended Burn-In prior to shipment to ensure its reliability. The reliability control level for each lot to be
shipped as standard product is 59 F.I.T. at a 60% confidence level, which equates to 3 failures in an 80 piece
sample. Maxim performs failure analysis on any lot that exceeds this reliability control level. Attached Burn-In
Schematic (Spec. # 06-5662) shows the static Burn-In circuit. Maxim also performs quarterly 1000 hour life test
monitors. This data is published in the Product Reliability Report (RR-1L).
B. Moisture Resistance Tests
Maxim pulls pressure pot samples from every assembly process three times per week. Each lot sample
must meet an LTPD = 20 or less before shipment as standard product. Additionally, the industry standard
85°C/85%RH testing is done per generic device/package family once a quarter.
C. E.S.D. and Latch-Up Testing
The OX63 die type has been found to have all pins able to withstand a transient pulse of ±25000V, per Mil-
Std-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device
withstands a current of ±250mA.
Table 1
Reliability Evaluation Test Results
LMX321AxK
TEST ITEM
TEST CONDITION
FAILURE
IDENTIFICATION
SAMPLE
SIZE
NUMBER OF
FAILURES
PACKAGE
Static Life Test (Note 1)
Ta = 135°C
Biased
DC Parameters
& functionality
79
0
Time = 192 hrs.
Moisture Testing (Note 2)
Pressure Pot
Ta = 121°C
P = 15 psi.
DC Parameters
& functionality
SC70
SOT23
77
99
0
0
RH= 100%
Time = 168hrs.
85/85
Ta = 85°C
RH = 85%
Biased
DC Parameters
& functionality
77
77
0
Time = 1000hrs.
Mechanical Stress (Note 2)
Temperature
Cycle
-65°C/150°C
1000 Cycles
Method 1010
DC Parameters
0
Note 1: Life Test Data may represent plastic D.I.P. qualification lots for the package.
Note 2: Generic package/process data
Attachment #1
TABLE II. Pin combination to be tested. 1/ 2/
Terminal A
Terminal B
(The common combination
of all like-named pins
(Each pin individually
connected to terminal A
with the other floating)
connected to terminal B)
All pins except VPS1 3/
All input and output pins
All VPS1 pins
1.
2.
All other input-output pins
1/ Table II is restated in narrative form in 3.4 below.
2/ No connects are not to be tested.
3/ Repeat pin combination I for each named Power supply and for ground
(e.g., where VPS1 is VDD, VCC, VSS, VBB, GND, +VS, -VS, VREF, etc).
Pin combinations to be tested.
3.4
a.
Each pin individually connected to terminal A with respect to the device ground pin(s) connected
to terminal B. All pins except the one being tested and the ground pin(s) shall be open.
b.
Each pin individually connected to terminal A with respect to each different set of a combination
of all named power supply pins (e.g., VSS1, or V
or V
or VCC1, or VCC2) connected to
SS2
SS3
terminal B. All pins except the one being tested and the power supply pin or set of pins shall be
open.
c.
Each input and each output individually connected to terminal A with respect to a combination of all the
other input and output pins connected to terminal B. All pins except the input or output pin being tested and the
combination of all the other input and output pins shall be open.
TERMINAL C
R2
R1
S1
TERMINAL A
REGULATED
HIGH VOLTAGE
SUPPLY
DUT
S2
SHORT
SOCKET
C1
CURRENT
PROBE
(NOTE 6)
TERMINAL B
R = 1.5kW
C = 100pf
TERMINAL D
Mil Std 883D
Method 3015.7
Notice 8
ONCE PER BOARD
ONCE PER SOCKET
10 K
+5V
10 OHMS
1.0 uA
0.1uF
1
2
3
6
5
2 K
4
6 - SOT
18 K
10 K
DEVICES: MAX 4464/4470/4400/4401/4480/4481/
DRAWN BY: TODD BEJSOVEC
4490/4291/4465/4466/4335/4336/4245/LMX321/4231
MAX CURRENT: MAX4481/MAX4291/LMX321= 800uA / MAX4464/4470/
4480/4465/4466= 400uA / MAX4400/4401/4245=1.2mA / MAX4490=2.5mA
MAX4435/4436/4231/4230=3.4mA
DOCUMENT I.D. 06-5662
REVISION E
MAXIM TITLE: BI Circuit
PAGE 2 OF 3
(MAX4464/4470/4465/4466/4400/4401/4480/4481/4490/4291/4335/4336/4245/LMX321/
4231/4230)
相关型号：
©2020 ICPDF网 联系我们和版权申明