MAX1190ECM [MAXIM]
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC with Internal Reference and Parallel Outputs; 双路10位, 120Msps , 3.3V ,低功耗ADC ,内置电压基准及并行输出型号: | MAX1190ECM |
厂家: | MAXIM INTEGRATED PRODUCTS |
描述: | Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC with Internal Reference and Parallel Outputs |
文件: | 总21页 (文件大小:737K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
19-2524; Rev 0; 7/02
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
General Description
Features
The MAX1190 is a 3.3V, dual 10-bit analog-to-digital con-
verter (ADC) featuring fully differential wideband track-
and-hold (T/H) inputs, driving two ADCs. The MAX1190 is
optimized for low power, small size, and high-dynamic
performance for applications in imaging, instrumentation,
and digital communications. This ADC operates from a
single 2.8V to 3.6V supply, consuming only 492mW while
delivering a typical signal-to-noise and distortion (SINAD)
of 57dB at an input frequency of 60MHz and a sampling
rate of 120Msps. The T/H driven input stages incorporate
400MHz (-3dB) input amplifiers. The converters can also
be operated with single-ended inputs. In addition to low
operating power, the MAX1190 features a 3mA sleep
mode, as well as a 1µA power-down mode to conserve
power during idle periods.
ꢀ Single 3.3V Operation
ꢀ Excellent Dynamic Performance
57dB SINAD at f = 60MHz
IN
64dBc SFDR at f = 60MHz
IN
ꢀ -71dBc Interchannel Crosstalk at f = 60MHz
IN
ꢀ Low Power
492mW (Normal Operation)
10mW (Sleep Mode)
3.3µW (Shutdown Mode)
ꢀ 0.08dB Gain and 0.8° Phase Matching
ꢀ Wide 1V
Differential Analog Input Voltage
P-P
Range
ꢀ 400MHz -3dB Input Bandwidth
An internal 2.048V precision bandgap reference sets the
full-scale range of the ADC. A flexible reference structure
allows the use of this internal or an externally applied ref-
erence, if desired, for applications requiring increased
accuracy or a different input voltage range.
ꢀ On-Chip 2.048V Precision Bandgap Reference
ꢀ User-Selectable Output Format—Two’s Complement
or Offset Binary
ꢀ Pin-Compatible, Lower-Speed, 10-Bit and 8-Bit
Versions Available
The MAX1190 features parallel, CMOS-compatible three-
state outputs. The digital output format can be set to two’s
complement or straight offset binary through a single con-
trol pin. The device provides for a separate output power
supply of 1.7V to 3.6V for flexible interfacing with various
logic families. The MAX1190 is available in a 7mm ✕
7mm, 48-pin TQFP-EP package, and is specified for the
extended industrial (-40°C to +85°C) temperature range.
Ordering Information
PART
TEMP RANGE
PIN-PACKAGE
MAX1190ECM
-40°C to +85°C
48 TQFP-EP*
*EP = Exposed paddle.
Functional Diagram appears at end of data sheet.
Pin-compatible lower speed versions of the MAX1190 are
also available. Refer to the MAX1180–MAX1184 data
sheets for 105Msps/80Msps/65Msps/40Msps. In addition
to these speed grades, this family includes two multi-
plexed output versions (MAX1185/MAX1186 for
20Msps/40Msps), for which digital data is presented
time-interleaved and on a single, parallel 10-bit output
port.
Pin Configuration
COM
1
2
36 D1A
35 D0A
34 OGND
V
DD
For lower speed, pin-compatible, 8-bit versions of the
MAX1190, refer to the MAX1195–MAX1198 data sheets.
GND
INA+
INA-
3
4
33 OV
32 OV
DD
DD
5
Applications
V
6
31 OGND
30 D0B
29 D1B
DD
MAX1190
Baseband I/Q Sampling
Multichannel IF Sampling
Ultrasound and Medical Imaging
Battery-Powered Instrumentation
WLAN, WWAN, WLL, MMDS Modems
Set-Top Boxes
GND
INB-
INB+
GND
7
8
D2B
D3B
D4B
D5B
9
28
27
26
25
10
11
12
V
DD
CLK
VSAT Terminals
TQFP-EP
________________________________________________________________ Maxim Integrated Products
1
For pricing, delivery, and ordering information, please contact Maxim/Dallas Direct! at
1-888-629-4642, or visit Maxim’s website at www.maxim-ic.com.
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
ABSOLUTE MAXIMUM RATINGS
V
, OV
to GND ...............................................-0.3V to +3.6V
Continuous Power Dissipation (T = +70°C)
DD
DD
A
OGND to GND.......................................................-0.3V to +0.3V
48-Pin TQFP (derate 12.5mW/°C above +70°C)........1000mW
Operating Temperature Range ...........................-40°C to +85°C
Junction Temperature......................................................+150°C
Storage Temperature Range.............................-60°C to +150°C
Lead Temperature (soldering, 10s) .................................+300°C
INA+, INA-, INB+, INB- to GND ...............................-0.3V to V
REFIN, REFOUT, REFP, REFN, COM,
DD
CLK to GND............................................-0.3V to (V
+ 0.3V)
DD
OE, PD, SLEEP, T/B,
D9A–D0A, D9B–D0B to OGND ...........-0.3V to (OV
+ 0.3V)
DD
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
ELECTRICAL CHARACTERISTICS
(V
= 3.3V; OV
= 2V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND, REFOUT connected to REFIN through a
DD
DD
10kΩ resistor; V
= 2.048V; V = 2V
(differential with respect to COM); C = 10pF at digital outputs; f
= 120MHz; T =
CLK A
REFIN
IN
P-P
L
T
MIN
to T
, unless otherwise noted; ≥+25°C guaranteed by production test, <+25°C guaranteed by design and characterization;
MAX
typical values are at T = +25°C.)
A
PARAMETER
DC ACCURACY
Resolution
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
10
Bits
LSB
Integral Nonlinearity
INL
f
f
= 7.47MHz
0.75
0.4
3
IN
IN
= 7.47MHz, no missing codes
Differential Nonlinearity
DNL
-1
+1.5
LSB
guaranteed
Offset Error
< 1
0
1.8
2
%FS
%FS
Gain Error
ANALOG INPUT
Differential Input Voltage Range
V
Differential or single-ended inputs
Switched capacitor load
1.0
V
V
DIFF
Common-Mode Input Voltage
Range
V
/ 2
DD
0.5
V
CM
Input Resistance
R
20
kΩ
IN
Input Capacitance
C
5
pF
IN
CONVERSION RATE
Maximum Clock Frequency
f
120
MHz
CLK
Clock
Cycles
Data Latency
5
DYNAMIC CHARACTERISTICS (f
= 120MHz, 4096-point FFT)
CLK
f
T
= 20.01MHz at -0.5dB FS,
= +25°C
INA or B
55
58.5
A
Signal-to-Noise Ratio
SNR
dB
dB
f
f
f
= 30.09MHz at -0.5dB FS
= 59.74MHz at -0.5dB FS
= 20.01MHz at -0.5dB FS,
58.2
58
INA or B
INA or B
INA or B
54.5
57.5
T
= +25°C
A
Signal-to-Noise and Distortion
SINAD
f
f
= 30.09MHz at -0.5dB FS
= 59.74MHz at -0.5dB FS
57
57
INA or B
INA or B
2
_______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
ELECTRICAL CHARACTERISTICS (continued)
(V
= 3.3V; OV
= 2V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND, REFOUT connected to REFIN through a
DD
DD
10kΩ resistor; V
= 2.048V; V = 2V
(differential with respect to COM); C = 10pF at digital outputs; f
= 120MHz; T =
CLK A
REFIN
IN
P-P
L
T
MIN
to T
, unless otherwise noted; ≥+25°C guaranteed by production test, <+25°C guaranteed by design and characterization;
MAX
typical values are at T = +25°C.)
A
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
f
T
= 20.01MHz at -0.5dB FS,
= +25°C
INA or B
58
67
A
Spurious-Free Dynamic Range
SFDR
dBc
f
f
= 30.09MHz at -0.5dB FS
= 59.74MHz at -0.5dB FS
67
64
INA or B
INA or B
f
T
= 20.01MHz at -0.5dB FS,
= +25°C
INA or B
-67
A
Third-Harmonic
Distortion
HD3
dBc
f
f
= 30.09MHz at -0.5dB FS
= 59.74MHz at -0.5dB FS
-67
-64
INA or B
INA or B
f
f
= 43.393MHz at -6.5dB FS,
= 48.9017MHz at -6.5dB FS
IN1(A or B)
Intermodulation Distortion
(First Five Odd-Order IMDs)
IMD
IM3
-73
IN2(A or B)
dBc
dBc
(Note 1)
f
f
= 43.393MHz at -6.5dB FS,
= 48.9017MHz at -6.5dB FS
IN1(A or B)
IN2(A or B)
Third-Order Intermodulation
Distortion
-83
-65
(Note 1)
f
= 20.01MHz at -0.5dB FS,
= +25°C
INA or B
-58
T
A
Total Harmonic Distortion
(First Four Harmonics)
THD
dBc
f
f
= 30.09MHz at -0.5dB FS
= 59.74MHz at -0.5dB FS
-65
-63
500
400
1
INA or B
INA or B
Small-Signal Bandwidth
Full-Power Bandwidth
Aperture Delay
Input at -20dB FS, differential inputs
Input at -0.5dB FS, differential inputs
MHz
MHz
ns
FPBW
t
AD
Aperture Jitter
t
2
ps
RMS
AJ
Overdrive Recovery Time
INTERNAL REFERENCE
For 1.5 × full-scale input
2
ns
2.048
3%
Reference Output Voltage
V
V
REFOUT
Load Regulation
1.25
mV/mA
ppm/°C
Reference Temperature
Coefficient
TC
60
REF
BUFFERED EXTERNAL REFERENCE (V
= 2.048V)
(Note 2)
REFIN
Positive Reference Output
V
2.162
V
REFP
Voltage
Negative Reference Output
Voltage
V
(Note 2)
(Note 2)
1.138
1.651
1.024
>50
V
V
REFN
Common-Mode Level
V
COM
Differential Reference Output
Voltage Range
∆V
∆V
= V
- V
REFN
0.95
1.09
V
REF
REF
REFP
REFIN Resistance
R
MΩ
REFIN
_______________________________________________________________________________________
3
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
ELECTRICAL CHARACTERISTICS (continued)
(V
= 3.3V; OV
= 2V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND, REFOUT connected to REFIN through a
DD
DD
10kΩ resistor; V
= 2.048V; V = 2V
(differential with respect to COM); C = 10pF at digital outputs; f
= 120MHz; T =
CLK A
REFIN
IN
P-P
L
T
MIN
to T
, unless otherwise noted; ≥+25°C guaranteed by production test, <+25°C guaranteed by design and characterization;
MAX
typical values are at T = +25°C.)
A
PARAMETER
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
Maximum REFP, COM Source
Current
I
5
mA
SOURCE
Maximum REFP, COM Sink
Current
I
-250
µA
SINK
Maximum REFN Source Current
I
250
-5
µA
SOURCE
Maximum REFN Sink Current
I
mA
SINK
UNBUFFERED EXTERNAL REFERENCE (V
= AGND, reference voltage applied to REFP, REFN, and COM)
REFIN
R
R
,
Measured between REFP and COM, and
REFN and COM
REFP
REFP, REFN Input Resistance
3.4
kΩ
REFN
Differential Reference Input
Voltage Range
1.024
10%
∆V
∆V
= V
- V
REFN
V
REF
REF
REFP
COM Input Voltage Range
REFP Input Voltage
V
V
V
/ 2 10%
DD
V
V
V
COM
REFP
REFN
V
+ ∆V
/ 2
/ 2
COM
REF
REF
REFN Input Voltage
V
V
- ∆V
COM
DIGITAL INPUTS (CLK, PD, OE, SLEEP, T/B)
0.8 ×
CLK
V
DD
Input High Threshold
Input Low Threshold
V
IH
V
0.8 ×
OV
PD, OE, SLEEP, T/B
CLK
DD
0.2 ×
V
DD
V
IL
V
V
0.2 ×
OV
PD, OE, SLEEP, T/B
DD
Input Hysteresis
Input Leakage
V
0.1
5
HYST
V
V
V
= V
(CLK)
DD
5
5
5
IH
IH
IL
I
IH
= OV
(PD, OE, SLEEP, T/B)
µA
pF
DD
I
IL
= 0
Input Capacitance
C
IN
DIGITAL OUTPUTS (D9A–D0A, D9B–D0B)
Output Voltage Low
V
I
I
= -200µA
0.2
10
V
V
OL
SINK
OV
0.2
-
DD
Output Voltage High
V
= 200µA
SOURCE
OH
Three-State Leakage Current
Three-State Output Capacitance
POWER REQUIREMENTS
Analog Supply Voltage Range
Output Supply Voltage Range
I
OE = OV
OE = OV
µA
pF
LEAK
DD
C
5
OUT
DD
V
2.8
1.7
3.3
2.5
3.6
3.6
V
V
DD
OV
DD
4
_______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
ELECTRICAL CHARACTERISTICS (continued)
(V
= 3.3V; OV
= 2V; 0.1µF and 1.0µF capacitors from REFP, REFN, and COM to GND, REFOUT connected to REFIN through a
DD
DD
10kΩ resistor; V
= 2.048V; V = 2V
(differential with respect to COM); C = 10pF at digital outputs; f
= 120MHz; T =
CLK A
REFIN
IN
P-P
L
T
MIN
to T
, unless otherwise noted; ≥+25°C guaranteed by production test, <+25°C guaranteed by design and characterization;
MAX
typical values are at T = +25°C.)
A
PARAMETER
SYMBOL
CONDITIONS
= 20.01MHz at
MIN
TYP
MAX
UNITS
mA
Operating, f
-0.5dB FS
INA and B
149
185
Analog Supply Current
I
VDD
Sleep mode
3
1
Shutdown, clock idle, PD = OE = OV
15
µA
DD
Operating, f
= 20.01MHz at -0.5dB
INA and B
FS; see Typical Operating Characteristics
section, Digital Supply Current vs. Analog
Input Frequency
16
mA
Output Supply Current
I
OVDD
Sleep mode
100
2
µA
Shutdown, clock idle, PD = OE = OV
10
DD
Operating, f
-0.5dB FS
= 20.01MHz at
INA and B
492
611
mW
Analog Power Dissipation
PDISS
PSRR
Sleep mode
10
mW
µW
Shutdown, clock idle, PD = OE = OV
Offset, V 5%
3.3
3.4
0.81
50
DD
mV/V
%/V
DD
Power-Supply Rejection Ratio
Gain, V
5%
DD
TIMING CHARACTERISTICS
CLK Rise to Output Data Valid
Time
t
C = 20pF (Note 3)
L
4.8
7.4
ns
DO
OE Fall to Output Enable Time
OE Rise to Output Disable Time
t
4.7
1.2
ns
ns
ENABLE
t
DISABLE
Clock period: 8.34ns; see Typical Operating
Characteristics section, AC Performance vs.
Clock Duty Cycle
Clock period: 8.34ns; see Typical Operating
Characteristics section, AC Performance vs.
Clock Duty Cycle
CLK Pulse Width High
t
4.17
4.17
ns
CH
CLK Pulse Width Low
Wake-Up Time
t
ns
µs
CL
Wake up from sleep mode (Note 4)
0.65
1.2
t
WAKE
Wake up from shutdown mode (Note 4)
CHANNEL-TO-CHANNEL MATCHING
Crosstalk
f
f
f
= 20.01MHz at -0.5dB FS
-71
0.08
0.8
dBc
dB
INA or B
INA or B
INA or B
Gain Matching
= 20.01MHz at -0.5dB FS (Note 5)
= 20.01MHz at -0.5dB FS (Note 6)
0.2
Phase Matching
Degrees
Note 1: Intermodulation distortion is the total power of the intermodulation products relative to the total input power.
Note 2: REFP, REFN, and COM should be bypassed to GND with a 0.1µF (min) or 1µF (typ) capacitor.
Note 3: Digital outputs settle to V , V . Parameter guaranteed by design.
IH IL
Note 4: With REFIN driven externally, REFP, COM, and REFN are left floating while powered down.
Note 5: Amplitude matching is measured by applying the same signal to each channel and comparing the magnitude of the funda-
mental of the calculated FFT. The data from both ADC channels must be captured simultaneously during this test.
Note 6: Phase matching is measured by applying the same signal to each channel and comparing the phase of the fundamental of
the calculated FFT. The data from both ADC channels must be captured simultaneously during this test.
_______________________________________________________________________________________
5
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Typical Operating Characteristics
(V = 3.3V, OV = 2.5V, V
= 2.048V, differential input at -0.5dB FS, f
= 120MHz, C ≈ 10pF, T = +25°C, unless otherwise noted.)
DD
DD
REFIN
CLK L A
FFT PLOT CHA (8192-POINT RECORD,
DIFFERENTIAL INPUT)
FFT PLOT CHB (8192-POINT RECORD,
DIFFERENTIAL INPUT)
FFT PLOT CHA (8192-POINT RECORD,
DIFFERENTIAL INPUT)
0
0
-25
0
-25
f
f
f
= 20.0119MHz
= 12.9799MHz
= 120.0128MHz
INA
INB
CLK
f
f
f
= 12.9799MHz
= 20.0119MHz
= 120.0128MHz
INA
INB
CLK
CHA
CHB
CHA
= 31.0873MHz
f
INA
f
-25
-50
= 23.9967MHz
= 120.0128MHz
INB
AINA/AINB = -0.52dB FS
AINA/AINB = -0.52dB FS
f
CLK
f
f
AINA/AINB = -0.52dB FS
f
INA
INA
INB
-50
-50
-75
-75
-75
-100
-125
-100
-125
-100
-125
0
12
24
36
48
60
0
12
24
36
48
60
0
12
24
36
48
60
ANALOG INPUT FREQUENCY (MHz)
ANALOG INPUT FREQUENCY (MHz)
ANALOG INPUT FREQUENCY (MHz)
FFT PLOT CHA (8192-POINT RECORD,
DIFFERENTIAL INPUT)
FFT PLOT CHB (8192-POINT RECORD,
DIFFERENTIAL INPUT)
FFT PLOT CHB (8192-POINT RECORD,
DIFFERENTIAL INPUT)
0
-25
0
-25
0
-25
CHA
CHB
INA
CHB
f
f
f
= 59.7427MHz
= 49.0189MHz
= 120.0128MHz
f
f
f
= 49.0189MHz
= 59.7427MHz
= 120.0128MHz
f
= 23.9967MHz
= 31.0873MHz
= 120.0128MHz
INA
INB
CLK
INA
INB
CLK
f
INB
f
CLK
AINA/AINB = -0.52dB FS
AINA/AINB = -0.52dB FS
AINA/AINB = -0.52dB FS
f
INB
-50
-50
-50
f
INA
f
INB
-75
-75
-75
-100
-125
-100
-125
-100
-125
0
12
24
36
48
60
0
12
24
36
48
60
0
12
24
36
48
60
ANALOG INPUT FREQUENCY (MHz)
ANALOG INPUT FREQUENCY (MHz)
ANALOG INPUT FREQUENCY (MHz)
TWO-TONE IMD PLOT
(8192-POINT RECORD, DIFFERENTIAL INPUT)
SIGNAL-TO-NOISE RATIO
vs. ANALOG INPUT FREQUENCY
SIGNAL-TO-NOISE + DISTORTION
vs. ANALOG INPUT FREQUENCY
0
60
58
56
54
52
50
60
58
56
54
52
50
f
f
f
= 43.3933MHz
= 48.9017MHz
= 120.0128MHz
IN1
IN2
CLK
CHB
CHB
CHA
-25
-50
AIN = -6.5dB FS
f
IN1
f
IN2
CHA
-75
-100
-125
0
12
24
36
48
60
0
20
40
60
80
100
120
0
20
40
60
80
100
120
ANALOG INPUT FREQUENCY (MHz)
ANALOG INPUT FREQUENCY (MHz)
ANALOG INPUT FREQUENCY (MHz)
6
_______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Typical Operating Characteristics (continued)
(V = 3.3V, OV = 2.5V, V
= 2.048V, differential input at -0.5dB FS, f
= 120MHz, C ≈ 10pF, T = +25°C, unless otherwise noted.)
DD
DD
REFIN
CLK L A
SPURIOUS-FREE DYNAMIC RANGE
vs. ANALOG INPUT FREQUENCY
TOTAL HARMONIC DISTORTION
vs. ANALOG INPUT FREQUENCY
SNR/SINAD, THD/SFDR
vs. CLOCK DUTY CYCLE
80
72
64
56
48
40
-40
100
80
60
40
20
0
SFDR
CHB
-48
-56
-64
-72
-80
THD
SNR
CHA
CHA
SINAD
CHB
f
= 20.02536MHz
INA/B
0
20
40
60
80
100
120
0
20
40
60
80
100
120
40
44
48
52
56
60
ANALOG INPUT FREQUENCY (MHz)
ANALOG INPUT FREQUENCY (MHz)
CLOCK DUTY CYCLE (%)
FULL-POWER INPUT BANDWIDTH
vs. ANALOG INPUT FREQUENCY
SIGNAL-TO-NOISE RATIO
vs. INPUT POWER (f = 20.02536MHz)
SMALL-SIGNAL INPUT BANDWIDTH
vs. ANALOG INPUT FREQUENCY
IN
5
2
60
56
52
48
44
40
6
4
2
-1
0
-2
-4
-6
-8
-4
-7
V
= 100mV
IN
P-P
10
-10
1
10
100
1000
-20
-16
-12
-8
-4
0
1
100
1000
ANALOG INPUT FREQUENCY (MHz)
INPUT POWER (dB FS)
ANALOG INPUT FREQUENCY (MHz)
SIGNAL-TO-NOISE + DISTORTION
TOTAL HARMONIC DISTORTION
SPURIOUS-FREE DYNAMIC RANGE
vs. INPUT POWER (f = 20.02536MHz)
vs. INPUT POWER (f = 20.02536MHz)
vs. INPUT POWER (f = 20.02536MHz)
IN
IN
IN
60
56
52
48
44
40
-50
-56
-62
-68
-74
-80
80
74
68
62
56
50
-20
-16
-12
-8
-4
0
-20
-16
-12
-8
-4
0
-20
-16
-12
-8
-4
0
INPUT POWER (dB FS)
INPUT POWER (dB FS)
INPUT POWER (dB FS)
_______________________________________________________________________________________
7
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Typical Operating Characteristics (continued)
(V = 3.3V, OV = 2.5V, V
= 2.048V, differential input at -0.5dB FS, f
= 120MHz, C ≈ 10pF, T = +25°C, unless otherwise noted.)
DD
DD
REFIN
CLK
L
A
INTEGRAL NONLINEARITY
vs. DIGITAL OUTPUT CODE
DIFFERENTIAL NONLINEARITY
vs. DIGITAL OUTPUT CODE
GAIN ERROR vs. TEMPERATURE,
EXTERNAL REFERENCE
0.6
0.3
0.1
0.5
0.3
CHB
CHA
0.2
-0.2
-0.6
0.1
-0.1
-0.3
-0.1
-0.3
0
341
682
1023
0
341
682
1023
-40
-15
10
35
60
85
DIGITAL OUTPUT CODE
DIGITAL OUTPUT CODE
TEMPERATURE (°C)
OFFSET ERROR vs. TEMPERATURE,
EXTERNAL REFERENCE
ANALOG SUPPLY CURRENT
vs. TEMPERATURE
DIGITAL SUPPLY CURRENT
vs. ANALOG INPUT FREQUENCY
0.8
0.3
180
170
160
150
140
130
120
30
25
20
15
10
5
CHB
-0.2
-0.7
-1.2
CHA
0
-40
-15
10
35
60
85
-40
-15
10
35
60
85
0
6
12 18 24 30 36 42 48 54 60
ANALOG INPUT FREQUENCY (MHz)
TEMPERATURE (°C)
TEMPERATURE (°C)
INTERNAL REFERENCE VOLTAGE
vs. TEMPERATURE
INTERNAL REFERENCE VOLTAGE
vs. ANALOG SUPPLY VOLTAGE
2.038
2.034
2.030
2.026
2.022
2.018
2.014
2.010
2.035
2.030
2.025
2.020
2.015
-40
-15
10
35
60
85
2.70 2.85 3.00 3.15 3.30 3.45 3.60
TEMPERATURE (°C)
V
(V)
DD
8
_______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Pin Description
PIN
NAME
FUNCTION
1
COM
Common-Mode Voltage I/O. Bypass to GND with a ≥0.1µF capacitor.
2, 6, 11,
14, 15
V
Analog Supply Voltage. Bypass to GND with a capacitor combination of 2.2µF in parallel with 0.1µF.
Analog Ground
DD
3, 7, 10,
13, 16
GND
4
5
INA+
INA-
INB-
INB+
CLK
Channel A Positive Analog Input. For single-ended operation, connect signal source to INA+.
Channel A Negative Analog Input. For single-ended operation, connect INA- to COM.
Channel B Negative Analog Input. For single-ended operation, connect INB- to COM.
Channel B Positive Analog Input. For single-ended operation, connect signal source to INB+.
Converter Clock Input
8
9
12
T/B selects the ADC Digital Output Format:
High: Two’s complement
Low: Straight offset binary
17
18
19
20
T/B
SLEEP
PD
Sleep-Mode Input:
High: Disables both quantizers, but leaves the reference bias circuit active
Low: Normal operation
High-Active Power-Down Input:
High: Power-down mode
Low: Normal operation
Low-Active Output Enable Input:
High: Digital outputs disabled
Low: Digital outputs enabled
OE
21
22
D9B
D8B
D7B
D6B
D5B
D4B
D3B
D2B
D1B
D0B
OGND
Three-State Digital Output, Bit 9 (MSB), Channel B
Three-State Digital Output, Bit 8, Channel B
Three-State Digital Output, Bit 7, Channel B
Three-State Digital Output, Bit 6, Channel B
Three-State Digital Output, Bit 5, Channel B
Three-State Digital Output, Bit 4, Channel B
Three-State Digital Output, Bit 3, Channel B
Three-State Digital Output, Bit 2, Channel B
Three-State Digital Output, Bit 1, Channel B
Three-State Digital Output, Bit 0, Channel B
Output Driver Ground
23
24
25
26
27
28
29
30
31, 34
Output Driver Supply Voltage. Bypass to OGND with a capacitor combination of 2.2µF in parallel with
0.1µF.
32, 33
OV
DD
35
36
37
38
39
D0A
D1A
D2A
D3A
D4A
Three-State Digital Output, Bit 0, Channel A
Three-State Digital Output, Bit 1, Channel A
Three-State Digital Output, Bit 2, Channel A
Three-State Digital Output, Bit 3, Channel A
Three-State Digital Output, Bit 4, Channel A
_______________________________________________________________________________________
9
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Pin Description (continued)
PIN
40
41
42
43
44
45
46
47
48
NAME
D5A
D6A
D7A
D8A
D9A
FUNCTION
Three-State Digital Output, Bit 5, Channel A
Three-State Digital Output, Bit 6, Channel A
Three-State Digital Output, Bit 7, Channel A
Three-State Digital Output, Bit 8, Channel A
Three-State Digital Output, Bit 9 (MSB), Channel A
REFOUT Internal Reference Voltage Output. Can be connected to REFIN through a resistor or a resistor-divider.
REFIN
REFP
REFN
Reference Input. V
= 2 × (V
- V
REFN
). Bypass to GND with a >0.1µF capacitor.
REFIN
REFP
Positive Reference I/O. Conversion range is (V
- V
REFN
). Bypass to GND with a >0.1µF capacitor.
REFP
Negative Reference I/O. Conversion range is (V
- V
REFN
). Bypass to GND with a >0.1µF capacitor.
REFP
Input Track-and-Hold Circuits
Detailed Description
Figure 2 displays a simplified functional diagram of the
input T/H circuits in both track and hold mode. In track
mode, switches S1, S2a, S2b, S4a, S4b, S5a, and S5b
are closed. The fully differential circuits sample the input
signals onto the two capacitors (C2a and C2b) through
switches S4a and S4b. S2a and S2b set the common
mode for the amplifier input, and open simultaneously
with S1, sampling the input waveform. Switches S4a,
S4b, S5a, and S5b are then opened before switches
S3a and S3b connect capacitors C1a and C1b to the
output of the amplifier and switch S4c is closed. The
resulting differential voltages are held on capacitors
C2a and C2b. The amplifiers are used to charge capac-
itors C1a and C1b to the same values originally held on
C2a and C2b.
The MAX1190 uses a nine-stage, fully differential,
pipelined architecture (Figure 1) that allows for high-
speed conversion while minimizing power consump-
tion. Samples taken at the inputs move progressively
through the pipeline stages every half-clock cycle.
Including the delay through the output latch, the total
clock-cycle latency is five clock cycles.
Flash ADCs convert the held input voltages into a digi-
tal code. Internal MDACs convert the digitized results
back into analog voltages, which are then subtracted
from the original held input signals. The resulting error
signals are then multiplied by 2, and the residues are
passed along to the next pipeline stages, where the
process is repeated until the signals have been
processed by all nine stages.
2-BIT FLASH
ADC
2-BIT FLASH
ADC
STAGE 1
STAGE 2
STAGE 8
STAGE 9
STAGE 1
STAGE 2
STAGE 8
STAGE 9
DIGITAL ALIGNMENT LOGIC
10
DIGITAL ALIGNMENT LOGIC
10
T/H
T/H
D9A–D0A
D9B–D0B
V
V
INB
INA
V
INA
V
INB
= INPUT VOLTAGE BETWEEN INA+ AND INA- (DIFFERENTIAL OR SINGLE ENDED)
= INPUT VOLTAGE BETWEEN INB+ AND INB- (DIFFERENTIAL OR SINGLE ENDED)
Figure 1. Pipelined Architecture—Stage Blocks
10 ______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
INTERNAL
COM
S5a
BIAS
S2a
C1a
S3a
S4a
S4b
INA+
INA-
OUT
OUT
C2a
C2b
S4c
S1
C1b
S3b
S5b
COM
S2b
INTERNAL
BIAS
CLK
INTERNAL
NONOVERLAPPING
CLOCK SIGNALS
HOLD
HOLD
INTERNAL
BIAS
TRACK
TRACK
COM
S5a
S2a
C1a
S3a
S4a
S4b
INB+
INB-
OUT
OUT
C2a
C2b
S4c
S1
MAX1190
C1b
S3b
S5b
COM
S2b
INTERNAL
BIAS
Figure 2. MAX1190 T/H Amplifiers
These values are then presented to the first-stage quan-
tizers and isolate the pipelines from the fast-changing
inputs. The wide input bandwidth T/H amplifiers allow the
MAX1190 to track and sample/hold analog inputs of high
frequencies (>Nyquist). Both ADC inputs (INA+, INB+,
INA- and INB-) can be driven either differentially or sin-
gle ended. Match the impedance of INA+ and INA-, as
well as INB+ and INB-, and set the common-mode volt-
age to midsupply (V /2) for optimum performance.
DD
______________________________________________________________________________________ 11
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
these nodes become high-impedance inputs and can be
driven through separate, external reference sources.
Analog Inputs and Reference
Configurations
The full-scale range of the MAX1190 is determined by the
internally generated voltage difference between REFP
For detailed circuit suggestions and how to drive this
dual ADC in buffered/unbuffered external reference
mode, see the Applications Information section.
(V /2 + V
/4) and REFN (V /2 - V
/4). The full-
REFIN
DD
REFIN
DD
scale range for both on-chip ADCs is adjustable through
the REFIN pin, which is provided for this purpose.
Clock Input (CLK)
The MAX1190’s CLK input accepts a CMOS-compati-
ble clock signal. Since the interstage conversion of the
device depends on the repeatability of the rising and
falling edges of the external clock, use a clock with low
jitter and fast rise and fall times (<2ns). In particular,
sampling occurs on the rising edge of the clock signal,
requiring this edge to provide the lowest possible jitter.
Any significant aperture jitter would limit the SNR per-
formance of the on-chip ADCs as follows:
The MAX1190 provides three modes of reference oper-
ation:
• Internal reference mode
• Buffered external reference mode
• Unbuffered external reference mode
In internal reference mode, connect the internal refer-
ence output REFOUT to REFIN through a resistor (e.g.,
10kΩ) or resistor-divider, if an application requires a
reduced full-scale range. For stability and noise filtering
purposes, bypass REFIN with a >10nF capacitor to
GND. In internal reference mode, REFOUT, COM,
REFP, and REFN become low-impedance outputs.
1
SNR = 20 × log
2 × π × f × t
IN AJ
where f represents the analog input frequency and t
IN
AJ
In buffered external reference mode, adjust the refer-
ence voltage levels externally by applying a stable and
accurate voltage at REFIN. In this mode, COM, REFP,
and REFN are outputs. REFOUT can be left open or
connected to REFIN through a >10kΩ resistor.
In unbuffered external reference mode, connect REFIN to
GND. This deactivates the on-chip reference buffers for
REFP, COM, and REFN. With their buffers shut down,
is the time of the aperture jitter. Clock jitter is especially
critical for undersampling applications. The clock input
should always be considered as an analog input and
routed away from any analog input or other digital signal
lines. The MAX1190 clock input operates with a voltage
threshold set to V /2. Clock inputs with a duty cycle
DD
other than 50%, must meet the specifications for high and
low periods as stated in the Electrical Characteristics.
5-CLOCK-CYCLE LATENCY
N
N + 1
N + 2
N + 3
N + 4
N + 5
N + 6
ANALOG INPUT
CLOCK INPUT
t
AD
t
t
CH
t
DO
CL
DATA OUTPUT
N - 6
N - 5
N - 4
N - 4
N - 3
N - 3
N - 2
N - 1
N - 1
N
N
N + 1
D9A–D0A
DATA OUTPUT
N - 6
N - 5
N - 2
N + 1
D9B–D0B
Figure 3. System Timing Diagram
12 ______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
System Timing Requirements
Figure 3 depicts the relationship between the clock
OE
input, analog input, and data output. The MAX1190
samples at the rising edge of the input clock. Output
t
t
DISABLE
ENABLE
data for channels A and B is valid on the next rising
edge of the input clock. The output data has an internal
latency of five clock cycles. Figure 3 also determines
the relationship between the input clock parameters
and the valid output data on channels A and B.
OUTPUT
HIGH-Z
HIGH-Z
HIGH-Z
HIGH-Z
VALID DATA
VALID DATA
D9A–D0A
OUTPUT
D9B–D0B
Digital Output Data (D0A/B–D9A/B), Output
Data Format Selection (T/B), Output
Figure 4. Output Timing Diagram
Enable (OE)
All digital outputs, D0A–D9A (channel A) and D0B–D9B
(channel B), are TTL/CMOS-logic compatible. There is
a five-clock-cycle latency between any particular sam-
ple and its corresponding output data. The output cod-
ing can be chosen to be either straight offset binary or
two’s complement (Table 1) controlled by a single pin
(T/B). Pull T/B low to select offset binary and high to
activate two’s complement output coding. The capaci-
tive load on digital outputs D0A–D9A and D0B–D9B
should be kept as low as possible (<15pF) to avoid
large digital currents that could feed back into the ana-
log portion of the MAX1190, thereby degrading its
dynamic performance. Using buffers on the digital out-
puts of the ADCs can further isolate the digital outputs
from heavy capacitive loads. To further improve the
dynamic performance of the MAX1190, small series
resistors (e.g., 100Ω) can be added to the digital output
paths, close to the MAX1190.
(both ADCs are disabled), and current consumption is
reduced to 3mA.
To enter full power-down mode, pull PD high. With OE
simultaneously low, all outputs are latched at the last
value prior to the power down. Pulling OE high forces
the digital outputs into a high-impedance state.
Applications Information
Figure 5 depicts a typical application circuit containing
two single-ended to differential converters. The internal
reference provides a V /2 output voltage for level-
DD
shifting purposes. The input is buffered and then split
to a voltage follower and inverter. One lowpass filter per
amplifier suppresses some of the wideband noise
associated with high-speed operational amplifiers. The
user can select the R
and C values to optimize the
IN
ISO
filter performance to suit a particular application. For
the application in Figure 5, a R of 50Ω is placed
ISO
Figure 4 displays the timing relationship between out-
put enable and data output valid, as well as power-
down/wakeup and data output valid.
before the capacitive load to prevent ringing and oscil-
lation. The 22pF C capacitor acts as a small filter
IN
capacitor.
Power-Down (PD) and Sleep
(SLEEP) Modes
The MAX1190 offers two power-save modes—sleep
mode and full power-down mode. In sleep mode
(SLEEP = 1), only the reference bias circuit is active
Table 1. MAX1190 Output Codes For Differential Inputs
DIFFERENTIAL INPUT
VOLTAGE*
STRAIGHT OFFSET BINARY
TWO’S COMPLEMENT
DIFFERENTIAL INPUT
T/B = 0
T/B = 1
V
× 512/512
+FULL SCALE - 1LSB
+1LSB
11 1111 1111
10 0000 0001
10 0000 0000
01 1111 1111
00 0000 0001
00 0000 0000
01 1111 1111
00 0000 0001
00 0000 0000
11 1111 1111
10 0000 0001
10 0000 0000
REF
V
× 1/512
0
REF
Bipolar Zero
-V
× 1/512
-1LSB
REF
-V
× 511/512
× 512/512
-FULL SCALE + 1LSB
-FULL SCALE
REF
REF
-V
*V
REF
= V
- V
REFP REFN
______________________________________________________________________________________ 13
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
+5V
0.1µF
LOWPASS FILTER
INA-
MAX4108
300Ω
R
IS0
50Ω
0.1µF
C
IN
22pF
0.1µF
-5V
600Ω
600Ω
300Ω
+5V
COM
INA+
0.1µF
+5V
0.1µF
0.1µF
600Ω
INPUT
0.1µF
0.1µF
LOWPASS FILTER
MAX4108
300Ω
300Ω
MAX4108
R
IS0
C
IN
22pF
50Ω
-5V
-5V
+5V
300Ω
300Ω
600Ω
MAX1190
0.1µF
0.1µF
LOWPASS FILTER
INB-
MAX4108
300Ω
R
IS0
50Ω
0.1µF
C
IN
22pF
-5V
600Ω
+5V
600Ω
600Ω
300Ω
0.1µF
0.1µF
0.1µF
+5V
INPUT
LOWPASS FILTER
0.1µF
MAX4108
300Ω
300Ω
INB+
MAX4108
R
IS0
50Ω
C
IN
22pF
-5V
0.1µF
-5V
300Ω
300Ω
600Ω
Figure 5. Typical Application for Single-Ended to Differential Conversion
14 ______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
25Ω
INA+
22pF
0.1µF
6
5
4
1
2
T1
V
IN
N.C.
COM
2.2µF
0.1µF
3
MINICIRCUITS
TT1–6-KK81
25Ω
INA-
INB+
22pF
22pF
MAX1190
25Ω
0.1µF
6
5
4
1
2
3
T1
V
IN
N.C.
2.2µF
0.1µF
MINICIRCUITS
TT1-6-KK81
25Ω
INB-
22pF
Figure 6. Transformer-Coupled Input Drive
Using Transformer Coupling
An RF transformer (Figure 6) provides an excellent solu-
tion to convert a single-ended source signal to a fully dif-
ferential signal, required by the MAX1190 for optimum
performance. Connecting the center tap of the trans-
Single-Ended AC-Coupled Input Signal
Figure 7 shows an AC-coupled, single-ended applica-
tion. Amplifiers like the MAX4108 provide high speed,
high bandwidth, low noise, and low distortion to main-
tain the integrity of the input signal.
former to COM provides a V /2 DC level shift to the
DD
Buffered External Reference Drives
Multiple ADCs
Multiple-converter systems based on the MAX1190 are
well suited for use with a common reference voltage.
The REFIN pin of those converters can be connected
directly to an external reference source.
input. Although a 1:1 transformer is shown, a step-up
transformer can be selected to reduce the drive require-
ments. A reduced signal swing from the input driver, such
as an op amp, can also improve the overall distortion.
In general, the MAX1190 provides better SFDR and
THD with fully differential input signals than single-
ended drive, especially for very high input frequencies.
In differential input mode, even-order harmonics are
lower as both inputs (INA+, INA- and/or INB+, INB-) are
balanced, and each of the ADC inputs only requires
half the signal swing compared to single-ended mode.
A precision bandgap reference like the MAX6062 gen-
erates an external DC level of 2.048V (Figure 8), and
exhibits a noise voltage density of 150nV/√Hz. Its output
passes through a 1-pole lowpass filter (with 10Hz cutoff
frequency) to the MAX4250, which buffers the reference
before its output is applied to a second 10Hz lowpass
filter. The MAX4250 provides a low offset voltage (for
______________________________________________________________________________________ 15
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
REFP
1kΩ
1kΩ
R
ISO
50Ω
V
IN
0.1µF
INA+
COM
INA-
MAX4108
C
IN
22pF
100Ω
100Ω
REFN
0.1µF
R
ISO
50Ω
C
IN
22pF
REFP
MAX1190
R
1kΩ
ISO
50Ω
V
IN
0.1µF
INB+
MAX4108
C
IN
22pF
100Ω
100Ω
1kΩ
REFN
0.1µF
R
ISO
50Ω
INB-
C
IN
22pF
Figure 7. Using an Op Amp for Single-Ended, AC-Coupled Input Drive
high-gain accuracy) and a low noise level. The passive
10Hz filter following the buffer attenuates noise pro-
duced in the voltage reference and buffer stages. This
filtered noise density, which decreases for higher fre-
quencies, meets the noise levels specified for preci-
sion-ADC operation.
Those three voltages are buffered by the MAX4252,
which provides low noise and low DC offset. The indi-
vidual voltage followers are connected to 10Hz lowpass
filters, which filter both the reference voltage and ampli-
fier noise to a level of 3nV/√Hz. The 2.0V and 1.0V refer-
ence voltages set the differential full-scale range of the
associated ADCs at 2V . The 2.0V and 1.0V buffers
P-P
Unbuffered External Reference Drives
Multiple ADCs
drive the ADCs’ internal ladder resistances between
them. Note that the common power supply for all active
components removes any concern regarding power-
supply sequencing when powering up or down.
Connecting each REFIN to analog ground disables the
internal reference of each device, allowing the internal
reference ladders to be driven directly by a set of exter-
nal reference sources. Followed by a 10Hz lowpass fil-
ter and precision voltage-divider, the MAX6066
generates a DC level of 2.500V. The buffered outputs of
this divider are set to 2.0V, 1.5V, and 1.0V, with an
accuracy that depends on the tolerance of the divider
resistors (Figure 9).
With the outputs of the MAX4252 matching better than
0.1%, the buffers and subsequent lowpass filters can
be replicated to support as many as 32 ADCs. For
applications that require more than 32 matched ADCs,
a voltage reference and divider string common to all
converters is highly recommended.
16 ______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
3.3V
3.3V
0.1µF
N.C.
29
31
32
1
REFOUT
REFIN
REFP
2.048V
0.1µF
1
MAX6062
3
0.1µF
16.2kΩ
REFN
N = 1
5
2
3
4
2
162Ω
COM
1
MAX1190
MAX4250
2
1µF
100µF
10Hz LOWPASS
FILTER
0.1µF 0.1µF 0.1µF
10Hz LOWPASS
FILTER
2.2µF
10V
NOTE: ONE FRONT-END REFERENCE CIRCUIT DESIGN MAY BE USED WITH UP TO 1000 ADCs.
0.1µF
29
31
32
1
N.C.
REFOUT
REFIN
REFP
N = 1000
0.1µF
REFN
MAX1190
2
COM
0.1µF 0.1µF 0.1µF
Figure 8. External Buffered (MAX4250) Reference Drive Using a MAX6062 Bandgap Reference
MAX1190, the mixed-down signal components can be
filtered by matched analog filters, such as Nyquist or
pulse-shaping filters, which remove unwanted images
from the mixing process, thereby enhancing the overall
SNR performance and minimizing intersymbol interfer-
ence.
Typical QAM Demodulation Application
A frequently used modulation technique in digital com-
munications applications is quadrature amplitude modu-
lation (QAM). Typically found in spread-spectrum-based
systems, a QAM signal represents a carrier frequency
modulated in both amplitude and phase. At the transmit-
ter, modulating the baseband signal with quadrature
outputs, a local oscillator followed by subsequent
upconversion can generate the QAM signal. The result
is an in-phase (I) and a quadrature (Q) carrier compo-
nent, where the Q component is 90° phase shifted with
respect to the in-phase component. At the receiver, the
QAM signal is divided down into its I and Q compo-
nents, essentially representing the modulation process
reversed. Figure 10 displays the demodulation process
performed in the analog domain, using the dual-
matched 3.3V, 10-bit ADC MAX1190 and the MAX2451
quadrature demodulator to recover and digitize the I
and Q baseband signals. Before being digitized by the
Grounding, Bypassing, and
Board Layout
The MAX1190 requires high-speed board layout design
techniques. Locate all bypass capacitors as close to the
device as possible, preferably on the same side as the
ADC, using surface-mount devices for minimum induc-
tance. Bypass V , REFP, REFN, and COM with two
DD
parallel 0.1µF ceramic capacitors and a 2.2µF bipolar
capacitor to GND. Follow the same rules to bypass the
digital supply (OV ) to OGND. Multilayer boards with
DD
separated ground and power planes produce the
______________________________________________________________________________________ 17
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
3.3V
0.1µF
N.C.
29
31
32
1
REFOUT
REFIN
REFP
1
MAX6066
3
2.0V
3.3V
4
4
4
21.5kΩ
REFN
N = 1
2.0V AT 8mA
2
3
2
1/4 MAX4252
1
47Ω
MAX1190
2
COM
10µF
6V
330µF
6V
11
21.5kΩ
1.47kΩ
0.1µF 0.1µF 0.1µF
1.5V
3.3V
1.5V AT 0mA
5
6
1/4 MAX4252
7
47Ω
1µF
10µF
330µF
11
6V
6V
21.5kΩ
2.2µF
10V
1.47kΩ
0.1µF
3.3V
0.1µF
1.0V
3.3V
1.0V AT -8mA
10
9
1/4 MAX4252
8
47Ω
21.5kΩ
21.5kΩ
330µF
6V
29
31
32
1
N.C.
10µF
11
REFOUT
REFIN
REFP
MAX4254 POWER-SUPPLY
6V
BYPASSING. PLACE CAPACITOR
AS CLOSE AS POSSIBLE TO
THE OP AMP.
1.47kΩ
N = 32
REFN
MAX1190
2
COM
0.1µF 0.1µF 0.1µF
NOTE: ONE FRONT-END REFERENCE CIRCUIT DESIGN MAY BE USED WITH UP TO 32 ADCs.
Figure 9. External Unbuffered Reference Drive with MAX4252 and MAX6066
MAX2451
INA+
INA-
0°
DSP
90°
POST-
MAX1190
PROCESSING
INB+
INB-
DOWNCONVERTER
÷
8
Figure 10. Typical QAM Application Using the MAX1190
18 ______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
highest level of signal integrity. Consider the use of a split
Dynamic Parameter Definitions
ground plane arranged to match the physical location of
Aperture Jitter
the analog ground (GND) and the digital output driver
ground (OGND) on the ADC’s package. The two ground
planes should be joined at a single point such that the
noisy digital ground currents do not interfere with the ana-
log ground plane. The ideal location of this connection
can be determined experimentally at a point along the
gap between the two ground planes, which produces
optimum results. Make this connection with a low-value,
surface-mount resistor (1Ω to 5Ω), a ferrite bead, or a
direct short. Alternatively, all ground pins could share the
same ground plane if the ground plane is sufficiently iso-
lated from any noisy, digital systems ground plane (e.g.,
downstream output buffer or DSP ground plane). Route
high-speed digital signal traces away from the sensitive
analog traces of either channel. Make sure to isolate the
analog input lines to each respective converter to mini-
mize channel-to-channel crosstalk. Keep all signal lines
short and free of 90° turns.
Figure 11 depicts the aperture jitter (t ), which is the
AJ
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (t ) is the time defined between the
AD
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 11).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantiza-
tion error only and results directly from the ADC’s reso-
lution (N bits):
SNR
= 6.02 ✕ N + 1.76
dB dB
dB[max]
Static Parameter Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best-straight-line fit or a line drawn
between the endpoints of the transfer function, once off-
set and gain errors have been nullified. The static linearity
parameters for the MAX1190 are measured using the
best-straight-line fit method.
In reality, there are other noise sources besides quanti-
zation noise: thermal noise, reference noise, clock jitter,
etc. SNR is computed by taking the ratio of the RMS
signal to the RMS noise, which includes all spectral
components minus the fundamental, the first five har-
monics, and the DC offset.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS sig-
nal to all spectral components minus the fundamental
and the DC offset.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an actu-
al step width and the ideal value of 1LSB. A DNL error
specification of less than 1LSB guarantees no missing
codes and a monotonic transfer function.
Effective Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC at a
specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB for
a full-scale sinusoidal input waveform is computed from:
CLK
SINAD−1.76
ENOB=
6.02
ANALOG
INPUT
t
AD
t
AJ
SAMPLED
DATA (T/H)
HOLD
TRACK
TRACK
T/H
Figure 11. T/H Aperture Timing
______________________________________________________________________________________ 19
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Total Harmonic Distortion (THD)
THD is typically the ratio of the RMS sum of the first four
harmonics of the input signal to the fundamental itself.
This is expressed as:
Intermodulation Distortion (IMD)
The two-tone IMD is the ratio expressed in decibels of
either input tone to the worst 3rd-order (or higher) inter-
modulation products. The individual input tone levels are
at -6.5dB full scale and their envelope is at -0.5dB full
scale.
2
2
2
2
V
+ V + V + V
3 4 5
2
THD = 20 × log
V
1
Chip Information
TRANSISTOR COUNT: 10,811
where V is the fundamental amplitude, and V through
1
2
V
are the amplitudes of the 2nd- through 5th-order
harmonics.
PROCESS: CMOS
5
Spurious-Free Dynamic Range (SFDR)
SFDR is the ratio expressed in decibels of the RMS
amplitude of the fundamental (maximum signal compo-
nent) to the RMS value of the next largest spurious
component, excluding DC offset.
Functional Diagram
V
DD
OGND
OV
GND
DD
INA+
10
10
OUTPUT
DRIVERS
D9A–D0A
ADC
DEC
T/H
INA-
CONTROL
CLK
OE
INB+
INB-
10
10
OUTPUT
DRIVERS
DEC
T/H
ADC
D9B–D0B
T/B
PD
SLEEP
REFERENCE
MAX1190
REFOUT
REFN COM REFP
REFIN
20 ______________________________________________________________________________________
Dual 10-Bit, 120Msps, 3.3V, Low-Power ADC
with Internal Reference and Parallel Outputs
Package Information
(The package drawing(s) in this data sheet may not reflect the most current specifications. For the latest package outline information,
go to www.maxim-ic.com/packages.)
Maxim cannot assume responsibility for use of any circuitry other than circuitry entirely embodied in a Maxim product. No circuit patent licenses are
implied. Maxim reserves the right to change the circuitry and specifications without notice at any time.
Maxim Integrated Products, 120 San Gabriel Drive, Sunnyvale, CA 94086 408-737-7600 ____________________ 21
© 2002 Maxim Integrated Products
Printed USA
is a registered trademark of Maxim Integrated Products.
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