APT13F120B_09 [MICROSEMI]
N-Channel FREDFET; N沟道FREDFET型号: | APT13F120B_09 |
厂家: | Microsemi |
描述: | N-Channel FREDFET |
文件: | 总4页 (文件大小:118K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
APT13F120B
APT13F120S
1200V, 14A, 1.2Ω Max t , ≤250ns
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N-Channel FREDFET
Power MOS 8™ is a high speed, high voltage N-channel switch-mode power MOSFET.
D3PAK
This 'FREDFET' version has a drain-source (body) diode that has been optimized for
high reliability in ZVS phase shifted bridge and other circuits through reduced t , soft
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recovery, and high recovery dv/dt capability. Low gate charge, high gain, and a greatly
reduced ratio of C /C result in excellent noise immunity and low switching loss. The
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APT13F120B
APT13F120S
intrinsic gate resistance and capacitance of the poly-silicon gate structure help control
di/dt during switching, resulting in low EMI and reliable paralleling, even when switching
at very high frequency.
D
S
Single die FREDFET
G
FEATURES
TYPICAL APPLICATIONS
• ZVS phase shifted and other full bridge
• Fast switching with low EMI
• Half bridge
• Low t for high reliability
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• PFC and other boost converter
• Buck converter
• Ultra low C
for improved noise immunity
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• Low gate charge
• Single and two switch forward
• Flyback
• Avalanche energy rated
• RoHS compliant
Absolute Maximum Ratings
Symbol Parameter
Unit
Ratings
Continuous Drain Current @ TC = 25°C
14
9
ID
Continuous Drain Current @ TC = 100°C
A
Pulsed Drain Current 1
IDM
VGS
EAS
IAR
50
±±0
1070
7
V
mJ
A
Gate-Source Voltage
Single Pulse Avalanche Energy 2
Avalanche Current, Repetitive or Non-Repetitive
Thermal and Mechanical Characteristics
Symbol Characteristic
Min
Typ
Max
625
Unit
PD
Total Power Dissipation @ TC = 25°C
W
RθJC
0.20
Junction to Case Thermal Resistance
°C/W
°C
RθCS
0.11
Case to Sink Thermal Resistance, Flat, Greased Surface
TJ,TSTG
-55
150
±00
Operating and Storage Junction Temperature Range
TL
Soldering Temperature for 10 Seconds (1.6mm from case)
oz
g
0.22
6.2
WT
Package Weight
in·lbf
N·m
10
Torque
Mounting Torque ( TO-247 Package), 6-±2 or M± screw
1.1
MicrosemiWebsite-http://www.microsemi.com
Static Characteristics
T = 25°C unless otherwise specified
J
APT13F120B_S
Parameter
Test Conditions
Min
Typ
Max
Unit
V
Symbol
VBR(DSS)
V
= 0V, I = 250µA
Drain-Source Breakdown Voltage
Breakdown Voltage Temperature Coefficient
Drain-Source On Resistance ±
Gate-Source Threshold Voltage
Threshold Voltage Temperature Coefficient
1200
GS
D
ΔVBR(DSS)/ΔTJ
Reference to 25°C, I = 250µA
D
V/°C
Ω
V
1.41
.91
4
V
= 10V, I = 7A
D
RDS(on)
VGS(th)
1.2
5
GS
2.5
V
= VDS, I = 1mA
D
GS
ΔVGS(th)/ΔTJ
mV/°C
-10
V
= 1200V
= 0V
T = 25°C
J
250
1000
±100
DS
IDSS
IGSS
Zero Gate Voltage Drain Current
Gate-Source Leakage Current
µA
nA
V
T = 125°C
J
GS
V
= ±±0V
GS
Dynamic Characteristics
T = 25°C unless otherwise specified
J
Symbol
Parameter
Test Conditions
Min
Typ
15
Max
Unit
gfs
V
= 50V, I = 7A
S
Forward Transconductance
Input Capacitance
DS
D
Ciss
Crss
Coss
4765
55
V
= 0V, V = 25V
DS
GS
Reverse Transfer Capacitance
Output Capacitance
f = 1MHz
±50
pF
4
Co(cr)
1±5
Effective Output Capacitance, Charge Related
Effective Output Capacitance, Energy Related
V
= 0V, V = 0V to 800V
DS
GS
V
5
Co(er)
70
Qg
Qgs
Qgd
td(on)
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Current Rise Time
Turn-Off Delay Time
Current Fall Time
145
24
70
26
15
85
24
= 0 to 10V, I = 7A,
GS
D
nC
ns
V
= 600V
DS
Resistive Switching
V = 800V, I = 7A
DD
tr
td(off)
tf
D
R
= 4.7Ω 6 , V
= 15V
GG
G
Source-Drain Diode Characteristics
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
Continuous Source Current
(Body Diode)
D
S
MOSFET symbol
showing the
integral reverse p-n
junction diode
(body diode)
IS
14
A
G
Pulsed Source Current
(Body Diode) 1
ISM
VSD
trr
50
I
= 7A, T = 25°C, V
= 0V
GS
Diode Forward Voltage
1.0
250
520
V
SD
J
T = 25°C
J
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
Peak Recovery dv/dt
ns
T = 125°C
J
±
I
= 7A
T = 25°C
J
1.12
±.0±
10
SD
Qrr
µC
A
diSD/dt = 100A/µs
= 100V
T = 125°C
J
V
T = 25°C
J
DD
Irrm
T = 125°C
J
1±.5
I
≤ 7A, di/dt ≤1000A/µs, V = 800V,
SD
DD
dv/dt
V/ns
25
T = 125°C
J
1
2
±
Repetitive Rating: Pulse width and case temperature limited by maximum junction temperature.
Starting at TJ = 25°C, L = 4±.59mH, RG = 25Ω, IAS = 7A.
Pulse test: Pulse Width < ±80µs, duty cycle < 2%.
4
5
Co(cr) is defined as a fixed capacitance with the same stored charge as COSS with VDS = 67% of V(BR)DSS.
Co(er) is defined as a fixed capacitance with the same stored energy as COSS with VDS = 67% of V(BR)DSS. To calculate Co(er) for any value of
VDS less than V(BR)DSS, use this equation: Co(er) = -2.17E-7/VDS^2 + 2.6±E-8/VDS + ±.74E-11.
6
RG is external gate resistance, not including internal gate resistance or gate driver impedance. (MIC4452)
Microsemi reserves the right to change, without notice, the specifications and information contained herein.
APT13F120B_S
12
10
8
±5
±0
25
20
15
10
V
= 10V
T
= 125°C
GS
J
TJ = -55°C
V
GS= 6, 7, 8 & 9V
6
5V
TJ = 25°C
4
4.5V
±0
2
0
5
0
TJ = 125°C
TJ = 150°C
0
5
10
15
20
25
±0
0
0
0
5
10
15
20
25
V
, DRAIN-TO-SOURCE VOLTAGE (V)
V
, DRAIN-TO-SOURCE VOLTAGE (V)
DS(ON)
DS
Figure 1, Output Characteristics
Figure 2, Output Characteristics
±.0
2.5
2.0
1.5
1.0
50
40
±0
20
NORMALIZED TO
= 10V 7A
VDS> ID(ON)
x RDS(ON) MAX.
250µSEC. PULSE TEST
@ <0.5 % DUTY CYCLE
V
@
GS
TJ = -55°C
TJ = 25°C
TJ = 125°C
10
0
0.5
0
-55 -25
0
25 50 75 100 125 150
T , JUNCTION TEMPERATURE (°C)
1
2
±
4
5
6
7
8
V
, GATE-TO-SOURCE VOLTAGE (V)
J
GS
Figure 3, R
vs Junction Temperature
Figure 4, Transfer Characteristics
DS(ON)
6,000
1,000
18
16
14
12
10
8
Ciss
TJ = -55°C
TJ = 25°C
TJ = 125°C
100
10
6
Coss
4
2
Crss
800 1000 1200
0
0
2
4
6
8
200
V , DRAIN-TO-SOURCE VOLTAGE (V)
DS
400
600
I , DRAIN CURRENT (A)
D
Figure 5, Gain vs Drain Current
Figure 6, Capacitance vs Drain-to-Source Voltage
16
14
12
10
8
50
I
= 7A
D
45
40
±5
±0
VDS = 240V
VDS = 600V
25
TJ = 25°C
20
6
TJ = 150°C
VDS = 960V
15
4
10
2
5
0
0
0
20 40 60 80 100 120 140 160 180 200
0
0.2
V , SOURCE-TO-DRAIN VOLTAGE (V)
SD
0.4
0.6
0.8
1.0
1.2
Q , TOTAL GATE CHARGE (nC)
g
Figure 7, Gate Charge vs Gate-to-Source Voltage
Figure 8, Reverse Drain Current vs Source-to-Drain Voltage
APT13F120B_S
100
10
100
10
I
I
DM
DM
R
1±µs
ds(on)
100µs
1ms
1±µs
100µs
10ms
100ms
1ms
T
T
J = 150°C
C = 25°C
1
1
DC line
10ms
R
ds(on)
J = 125°C
C = 75°C
Scaling for Different Case & Junction
Temperatures:
100ms
DC line
T
T
I
D = ID(T = 25°C)*(T - TC)/125
J
C
0.1
0.1
1
10
100
1200
1
10
, DRAIN-TO-SOURCE VOLTAGE (V)
DS
100
1200
V
, DRAIN-TO-SOURCE VOLTAGE (V)
V
DS
Figure 9, Forward Safe Operating Area
Figure 10, Maximum Forward Safe Operating Area
0.25
0.20
0.15
0.10
D = 0.9
0.7
Note:
0.5
t
1
t
2
0.±
t
= Pulse Duration
t
1
0.05
0
1
t
/
2
Duty Factor D =
SINGLE PULSE
0.1
Peak T = P
x Z
+ T
θJC C
J
DM
0.05
10-5
10-4
10-±
10-2
10-1
1.0
RECTANGULAR PULSE DURATION (seconds)
Figure 11. Maximum Effective Transient Thermal Impedance Junction-to-Case vs Pulse Duration
3
D PAK Package Outline
TO-247 (B) Package Outline
e± 100% Sn Plated
4.98 (.196)
4.69 (.185)
5.±1 (.209)
15.95 (.628)
16.05(.6±2)
1±.41 (.528)
1±.51(.5±2)
5.08 (.200)
15.49 (.610)
16.26 (.640)
1.04 (.041)
1.15(.045)
1.49 (.059)
2.49 (.098)
1.47 (.058)
1.57 (.062)
5.±8 (.212)
6.15 (.242) BSC
6.20 (.244)
Revised
8/29/97
11.51 (.45±)
11.61 (.457)
1±.79 (.54±)
1±.99(.551)
20.80 (.819)
21.46 (.845)
±.50 (.1±8)
±.81 (.150)
0.46 (.018)
0.56 (.022)
{± Plcs}
1.27 (.050)
1.40 (.055)
0.020 (.001)
0.178 (.007)
2.87 (.11±)
±.81 (.150)
4.50 (.177) Max.
±.12 (.12±)
1.98 (.078)
2.08 (.082)
4.06 (.160)
2.67 (.105)
2.84 (.112)
(Base of Lead)
1.65 (.065)
2.1± (.084)
1.22 (.048)
1.±2 (.052)
0.40 (.016)
0.79 (.0±1)
19.81 (.780)
20.±2 (.800)
Heat Sink (Drain)
and Leads
are Plated
5.45 (.215) BSC
{2 Plcs.}
1.01 (.040)
1.40 (.055)
Gate
Drain
Source
Source
Drain
Gate
Dimensions in Millimeters (Inches)
2.21 (.087)
2.59 (.102)
5.45 (.215) BSC
2-Plcs.
Dimensions in Millimeters and (Inches)
Microsemi's products are covered by one or more of U.S.patents 4,895,810 5,045,90± 5,089,4±4 5,182,2±4 5,019,522 5,262,±±6 6,50±,786
5,256,58± 4,748,10± 5,28±,202 5,2±1,474 5,4±4,095 5,528,058 and foreign patents. US and Foreign patents pending. All Rights Reserved.
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