LM3641 [NSC]

Lithium-Ion Battery Pack Protection Circuit; 锂离子电池保护电路
LM3641
型号: LM3641
厂家: National Semiconductor    National Semiconductor
描述:

Lithium-Ion Battery Pack Protection Circuit
锂离子电池保护电路

电池
文件: 总17页 (文件大小:331K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
January 1999  
LM3641  
Lithium-Ion Battery Pack Protection Circuit  
General Description  
Features  
n Automatic battery disconnect when the cell is  
over-charged or over-discharged.  
The LM3641 Lithium Protection Integrated Circuit resides in-  
side a 3.6V Lithium-Ion battery pack consisting of a single  
cell or multiple parallel cells. The IC controls the ON/OFF  
state of a pair of low threshold N-channel power MOSFETs  
placed in series with the battery cell(s). The purpose of this  
MOSFET pair is to protect the cell(s) from inadvertent elec-  
trical over-stress. The IC compares the cell voltage against  
internally programmed minimum and maximum limits. Tran-  
sient voltage faults of approximately 1.25 seconds are toler-  
ated.  
n Maximum cell voltage for MOSFET conduction is factory  
programmable between 4.0V and 4.4V with a 25 mV  
tolerance (0˚C to +60˚C).  
n Minimum cell voltage for MOSFET conduction =  
±
±
0.57VMAX 3.5% (0˚C to +60˚C).  
±
n Internal 4 mcurrent sense resistor provides 0.5A  
maximum accuracy for detection of overcurrent faults.  
The maximum charge and discharge current is factory  
programmable between 1A and 5A. A single overcurrent  
fault event opens and protects the MOSFET pair.  
n Automatic detection of safe pack conditions for recovery  
(MOSFET pair ON) from a fault condition (over/under  
discharged or overcurrent).  
The IC also monitors the bi-directional current flow in the bat-  
tery pack by measuring the voltage across a robust 4 mΩ  
current sensing resistor internal to the protection IC pack-  
age. The IC turns OFF the MOSFET pair whenever any fault  
limit is exceeded. Momentary current surges 4 ms are tol-  
erated.  
<
n Average current drain = 1.2 µA typical.  
The Enable pin allows external ON/OFF control of the MOS-  
FET pair and resets the IC after the MOSFET pair is turned  
OFF and the pack is safe to operate again.  
n Optional Enable pack terminal can be used to prevent  
accidental short circuit of pack and for maximizing the  
shelf life of the pack (IC powers down when the pack is  
not in use).  
n Over-current events cause connection of an internal  
50 k“FET-Bypass” resistance across OFF MOSFET  
The limits for overcharge and overdischarge voltage, as well  
as independent limits for each direction of overcurrent are  
factory adjusted employing EEPROM.  
>
pair. Loads 3–7 Mare required for return to  
conduction mode.  
n Over-charged states cause connection of a 5 kΩ  
“Cell-Bypass” resistor to ensure that the cell is not  
allowed to be overcharged by leakage paths.  
Typical Application  
DS012931-1  
TRI-STATE® is a registered trademark of National Semiconductor Corporation.  
© 1999 National Semiconductor Corporation  
DS012931  
www.national.com  
Connection Diagram and Ordering Information  
Top View  
8-Lead SOIC (M08A)  
DS012931-2  
Actual Size  
DS012931-3  
Order Number LM3641M  
See NS Package Number M08A  
This device is factory programmable. Contact your local NSC sales office for ordering information.  
www.national.com  
2
Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
ESD Susceptibility  
2 kV  
Human Body Model (Note 3)  
Lead Temperature  
(Soldering, 10s)  
260˚C  
Maximum Input Supply Voltage  
Operating Range (Note 1)  
(VDD  
)
−0.3V to 5.5V  
V+ or GATE or Full Pin Voltage  
Enable or V− Pin Current  
Power Dissipation (Note 2)  
−0.3V to VDD + 0.3V  
Ambient Temperature Range  
Junction Temperature Range  
0˚C to +60˚C  
−40˚C to +125˚C  
±
200 µA  
Internally limited  
LM3641  
Electrical Characteristics  
Specifications with standard type face for TJ = 25˚C, and those with bold type apply over full Operating Temperature Range.  
Unless otherwise specified, VSS = 0V, VDD = 3.6V, VENABLE = VDD  
.
Symbol  
Parameter  
Conditions  
Typical  
(Note 4)  
Limit  
(Note 5)  
Units  
VMAX  
Overcharge Protection  
Accuracy  
0˚C to +60˚C  
A.S.(Note 6)  
V
±
25  
mV(max)  
<
@
VMAX-85  
Overcharge Protection  
Accuracy  
Temp = 85˚C  
VMAX 25˚C  
VMAX-RANGE  
Overcharge Protection  
Program Range  
4.2  
V
4.0  
4.4  
V(max)  
V(min)  
V
VSAFE  
VMIN  
Max Cell Voltage Overshoot  
VMAX + 100 mV  
0.57VMAX  
(referred to VMAX  
)
Overdischarge Protection  
Accuracy  
V
V(max)  
V(min)  
V
+0.04 VMAX  
−0.04 VMAX  
VGATE-FETS-ON  
IGATE-FETS-ON  
Gate Pin High  
1 MLoad  
VDD −50 mV  
2
Gate Pin FET Turn-on  
Impedence  
kΩ  
IGATE-FETS-OFF  
IMAX-CHG  
Gate Pin OFF Current  
VGate = 0V  
10  
nA  
A
Overcurrent Protection  
Accuracy — Charging  
A.S.(Note 6)  
+0.5  
−0.5  
A(max)  
A(min)  
IMAX-DIS  
Overcurrent Protection  
Accuracy — Disharging  
A.S.(Note 6)  
A
+0.5  
−0.5  
A(max)  
A(min)  
ISUPPLY  
Supply Current (VDD, V+,  
control pins) (Note 7)  
normal mode  
120  
1
µApeak  
µA rms  
=
VDD 3.6V  
excludes IR2  
4
µA rms(max)  
IENABLE PIN  
IV+  
Enable Pin Current (sink)  
VENABLE = VDD  
400  
40  
1
nA  
nA rms  
s
Cell Sense Pin Current (sink) VDD = 3.6V  
<
V+ VMAX  
tSAMPLE  
Cell Voltage Sampling  
Period — Normal and  
Overdischarge Modes  
0.75  
1.5  
s(min)  
s(max)  
s
>
tSAMPLE-OVERCHARGED  
Cell Voltage Sampling  
Period — Overcharged  
V+ VMAX  
0.25  
4
0.19  
0.28  
s(min)  
s(max)  
NSAMPLE  
Number of consecutive  
samples for overcharge or  
overdischarge prior to  
disconnect  
3
www.national.com  
LM3641  
Electrical Characteristics (Continued)  
Specifications with standard type face for TJ = 25˚C, and those with bold type apply over full Operating Temperature Range.  
Unless otherwise specified, VSS = 0V, VDD = 3.6V, VENABLE = VDD  
.
Symbol  
Parameter  
Conditions  
Typical  
(Note 4)  
Limit  
(Note 5)  
Units  
tOVERCHARGE  
Overcharge Transient  
1.6  
s
Rejection Time (Note 8)  
0.57  
2.64  
s(min)  
s(max)  
s
tOVERDISCHARGE  
Overdischarge Transient  
Rejection Time (Note 8)  
4
3
6
s(min)  
s(max)  
ms  
tOVERCURRENT  
DC  
Overcurrent Transient  
Rejection Time  
6
<
Duty Cycle of Pulse Charging VMAX VCELL  
87.5  
%
<
VSAFE  
>
VCELL VSAFE  
50  
%
tENABLE-DELAY  
Delay from Rising/Falling  
Enable pin to FETs ON/OFF  
(Note 9)  
L
H
H
L
5
3
ms  
±
VRECOVERY  
MOSFET Threshold Voltage  
36  
mV  
V
VMIN-CHARGE  
Minimum Cell Voltage that  
0
can be charged, VGATE  
VDD (Note 10)  
>
VFULL-HIGH  
Maximum High Output  
Voltage of Full Pin  
V+ VMAX  
VDD − 1.2V  
10  
<
IFULL 4 µA  
<
IFULL-OFF  
Source/Sink Current of Full  
Pin in TRI-STATE®  
V+ VMAX  
nA  
VFULL = 0V  
<
IR-SENSE  
RSENSE  
Maximum RSENSE Current  
RSENSE Range  
Duration 6 ms  
60  
4
A
mΩ  
Note 1: Absolute Maximum ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is in-  
tended to be functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see Electrical Characteristics. The guar-  
anteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test  
conditions.  
Note 2: The maximum allowable power dissipation is calculated by using P  
= (T  
JMAX  
− T )/θ , where T = 150˚C, T is the ambient temperature, and θ  
JA JMAX A JA  
DMAX  
A
= 160˚C/W.  
Note 3: The human body model is a 100 pF capacitor discharged through a 1.5 kresistor into each pin.  
Note 4: Typical numbers are at 25˚C and represent the most likely parametric norm.  
Note 5: Limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlation using Statistical Quality Control  
(SQC) methods. The limits are used to calculate National’s Averaging Outgoing Quality Level (AOQL).  
Note 6: Application Specific. This analog parameter’s value is programmed during National’s production testing of the device. Please contact your local NSC sales  
office to specify the V  
between 1A and 5A. I can be programmed between 1A and 5A.  
, I  
MAX-DIS  
includes V pin peak currents that occur at each t  
and I  
values when ordering this device. V  
can be programmed between 4.0V and 4.4V. I  
MAX-CHG  
can be programmed  
MAX MAX-CHG  
MAX-DIS  
MAX  
Note 7:  
I
period. The I peak current duration is approximately 2.2 ms and the I  
DD VDD  
peak current  
SUPPLY  
is approximately 120 µA.  
DD  
sample  
Note 8: Computed from 4 sample periods of the worst case values of t  
SAMPLE  
and t .  
SAMPLE-OVERCHARGED  
<
<
Note 9: High pulses 3 ms (typ) will be typically ignored and low pulses 5 ms (typ) will be typically ignored.  
Note 10: will be limited by the threshold of M3.  
V
MIN-CHARGE  
www.national.com  
4
Typical Performance Characteristics  
Maximum Current and Normalized  
Maximum Voltage vs. Temperature  
GATE Pin and MOSFET GATE  
Voltage vs CELL Voltage  
DS012931-4  
DS012931-5  
Supply Current  
Supply Current vs Time  
DS012931-7  
DS012931-6  
Pin* Current vs  
Pin* Voltage  
Supply and Enable Current  
vs Enable Voltage  
DS012931-8  
DS012931-9  
5
www.national.com  
Block Diagram  
DS012931-10  
Test Circuit  
DS012931-11  
www.national.com  
6
OVERCURRENT PROTECTION  
Product Description  
The battery current is monitored continuously by measuring  
the voltage across the internal sense resistor. If the terminal  
current exceeds IMAX-CHG (programmable) in the charge  
mode for longer than tOVERCURRENT, the MOSFET pair dis-  
connects. Similarly, if the terminal current exceeds IMAX-DIS  
(programmable) in the discharge mode for longer than  
Normal charging of Li-Ion packs requires Constant Voltage  
Constant Current (CVCC) chargers that terminate charging  
at a voltage value just below the maximum protection volt-  
age (VMAX). Only in the event of an invalid charger or an out  
of compliance charger operation should the protection IC ter-  
minate charging.  
t
OVERCURRENT, the MOSFET pair disconnects. Recovery to  
conduction mode requires either 1) a momentary detach-  
ment of the pack so the Enable pin can be cycled low, then  
high or 2) a direct low to high signal to the Enable pin con-  
trolled from logic.  
OVERCHARGE PROTECTION  
The IC protects the cell(s) against overcharge. Normally, the  
cell voltage is sampled once a second. Four consecutive  
>
samples of VCELL VMAX result in the MOSFET pair turning  
OFF. The transient response for overvoltage requires one  
sample at the tSAMPLE period (1s typical) and three tSAMPLE-  
OVERVOLTAGE periods (0.25s typical). The first overcharge  
event is asynchronous to the 1 second sampling so the delay  
between the actual instance of overcharge and the first  
ENABLE PIN  
The pack can be protected from accidental short circuits  
should the Enable pin be made available as a third battery  
pack terminal. This third pack terminal is tied to the pack’s  
positive terminal through a connection on either a valid  
charger or load. Shorting the high impedance Enable pin to  
the pack’s positive terminal enables all functions of the pro-  
tection circuit. The Enable pin disables the MOSFET pair  
whenever this pin is floating, such as when the battery pack  
is detached from a valid load or charger. Floating the Enable  
pin also forces the protection circuit into FET’s OFF mode to  
maximize the shelf life of the battery pack. When the Enable  
pin is used to recover from overcharge, overdischarge or  
overcurrent events, the voltage measurement system  
memory is cleared of previous results. If the MOSFET by-  
pass resistor is active, and the Enable goes low, the bypass  
resistor turns OFF. A series resistor of 470 kto 1 Mbe-  
tween the Enablel terminal of the pack and the Enable pin of  
the IC, protects the IC from ESD events at the pack’s termi-  
nals.  
sample can result anywhere in the range of zero to tSAMPLE  
.
>
The requirement for 4 consecutive samples of VCELL VMAX  
filters noise from the cell due to transient currents. Should  
the cell voltage exceed VMAX by more than 100 mV (VSAFE),  
the MOSFETs will turn off on the first sample reading. This  
provides an extra measure of safety. The return to conduc-  
tion mode requires that a load be applied to the pack or  
<
VCELL VMAX − 20 mV. Also a L H signal on the Enable pin  
>
will reset the GATE high, but if VCELL VMAX, the GATE will  
go low again after 1.75 seconds. Whenever an overcharge  
disconnect has occurred, a cell bypass resistor (5 k) is  
switched across the VDD and VSS pins and the Full pin pulls  
to near VDD. The cell bypass resistor ensures that the cell is  
discharged even though some component of R1’s current  
will still flow in the cell, if a charger is applied. The cell by-  
<
pass resistor is removed when VCELL VMAX again.  
SLEEPMODE  
ACTIVE RECTIFICATION  
Sleepmode is a reduced current state that occurs when the  
Enable pin is floating or low. The FETs are turned OFF.  
Sleepmode minimizes the artificial self-discharge of the pack  
when the pack is not in use.  
Overcharged cells can be discharged by the application of a  
load to the pack. Active Rectification is the biasing of the  
power MOSFETs GATE so that the VDS = VRECOVERY for dis-  
charge currents. The MOSFETs turn OFF for charge cur-  
rents. The Active Rectification amplifier assures uninter-  
rupted conduction for discharge currents only. The Full pin’s  
INVALID CHARGER  
Assume a charger that exceeds the VMAX rating of the IC is  
applied to the pack. The power MOSFETs will eventually turn  
>
output impedance is 80 kwhen active high (VCELL  
<
VMAX) and TRI-STATE when inactive (VCELL  
VMAX). The  
<
OFF due to overcharge if ICHARGER IMAX-CHG, or turn OFF  
Full pin can optionally supply a small FET current necessary  
to stabilize the Active Rectification loop by maintaining at  
least (VDD−1V)/R6+80k)ID in the MOSFET. The Full pin’s  
overcharge signal could be used in applications where the  
due to overcurrent if the invalid charger’s current exceeds  
I
MAX-CHG. If the charger was applied to the pack with the po-  
larity reversed, then the MOSFETs would eventually turn  
OFF due to either overdischarge or overcurrent depending  
on the magnitude of the charger’s available current. In either  
case, the voltage on the V− pin will be driven by the open cir-  
cuit voltage of the charger. The V− pin is clamped by internal  
diodes to VDD and VSS and the pin’s current limited by R1  
(see the typical curve “Pin Current vs. Pin Voltage”) with R1  
= 100k, the pin current will not exceed the maximum recom-  
charger is logically disabled by the protection circuit,  
a
change time-out circuit is initiated or whenever an over-  
charge signal is otherwise desired. The Full signal will go low  
(TRI-STATE with an external resistor pulldown) and cell by-  
<
pass turns off if a cell decays to VCELL VMAX  
.
OVERDISCHARGE PROTECTION  
±
±
mended value of 200 µA for a 20V invalid charger. Higher  
invalid charger voltages can be tolerated when using higher  
values for R1. Proper LCCE operation is not limited, even by  
values for R1 in excess of 1 M.  
The cell(s) are also protected against overdischarge. Four  
<
consecutive 1 Hz samples of VCELL  
VMIN result in the  
MOSFET pair turning OFF. Cells that have discharged below  
VMIN due to long periods of self-discharge can still be  
charged. Return to conduction mode for overdischarged  
packs automatically occurs if a charger is applied to the  
pack. Also a L H signal on the Enable pin will reset the  
<
GATE high, however if VCELL  
OFF again in 4 seconds.  
VMIN, the GATE will turn  
7
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OFF, the MOSFET pair remain OFF (4). This example exag-  
gerates the rate of these events. The actual operation would  
result in many ON/OFF cycles at a decreasing duty cycle  
prior to complete termination of charge.  
Product Description (Continued)  
NORMAL TERMINATION OF CHARGING  
As you can see in Figure 1, the cell voltage must exceed  
VMAX for 4 consecutive samples before the MOSFET pair is  
turned OFF (1). Once VMAX is exceeded, the sampling rate  
increases to 4 Hz. The sampling rate will return to 1 Hz only  
LOAD APPLIED IN OVERCHARGED STATE  
If a load is momentarily applied while the cell is in over-  
charged state, then the MOSFET pair is momentarily turned  
ON, see Figure 4. The MOSFET pair will stay ON only as  
long as the load is applied. The MOSFET pair will stay ON  
after the load is removed only if the cell voltage remains be-  
low VMAX for 4 consecutive samples. Possible events are  
shown as examples of operation:  
<
after 4 consecutive samples result in VCELL  
VMAX. After  
the MOSFET pair is OFF (2), the voltage across the cell(s)  
relax and the cell voltage will drop below VMAX. On the next  
sample, (3), the MOSFET pair will turn ON. As long as the  
charger is applied and the MOSFET pair turn ON, the cell  
voltage will exceed VMAX again. The cycle of 4 samples ON  
a 1 samples OFF will continue until the cell voltage equals  
(1) A momentary load is applied to an overcharged cell, the  
MOSFET pair stay ON only as long as the load is applied.  
The gate drive is limited so that the MOSFET pair ON volt-  
age will match a bias voltage generated internal to the IC,  
V
MAX after the MOSFET pair is OFF, (4). This example exag-  
gerates the rate of these events. The actual operation would  
result in many ON/OFF cycles at a decreasing duty cycle  
prior to complete termination of charge. The cell bypass re-  
sistor will discharge the cell enough to turn on the GATE over  
a period of minutes.  
V
RECOVERY. This bias voltage is the minimum MOSFET ON  
voltage that allows for the detection of a load. This mode of  
operation is Active Rectification. Note that the MOSFET pair  
do not turn ON for the momentary application of a charger.  
NORMAL TERMINATION OF DISCHARGING  
(2) A load is applied for less than 4 samples. The MOSFET  
pair is ON for the load period, but turn OFF after the load is  
The cell voltage must go below VMIN for 4 consecutive  
samples before the MOSFET pair is turned OFF (1), which is  
shown in Figure 2. Once the MOSFET pair is OFF and the  
current is interrupted, the voltage across the cell(s) will in-  
crease and the cell voltage could exceed VMIN (2). The  
MOSFET pair remain off until a charger is applied to the  
pack (3). The presence of a charger turns the MOSFET pair  
ON. Deeply discharged cells will be charged, although for  
some narrow bands of VCELL, the GATE may occasionally  
pulse OFF momentarily.  
<
removed. Only after the 4th sample of VCELL VMAX will the  
MOSFET pair turn ON, this time will full drive potential.  
(3) Assume the application of a charger. Conduction is al-  
lowed because the FETs are ON, but the MOSFET pair will  
stay ON only for 4 consecutive overcharge samples. See the  
diagram for the “Normal Termination of Charging”.  
(4) The MOSFET pair will turn OFF after the 4 consecutive  
overcharge samples.  
<
(5) A load is applied and after VCELL VMAX for 4 consecu-  
TERMINATION OF ILLEGALLY HIGH CHARGING  
tive samples, the MOSFET pair turn ON full. As long as  
VCELL stays below VMAX, the MOSFET pair will stay ON.  
Should a high charge current be applied to the pack near the  
end of charge, the cell voltage could exceed VSAFE, which is  
approximately 100 mV greater than VMAX (1), see Figure 3.  
On the first detection of a cell voltage in excess of VSAFE-  
OVERCHARGE, the MOSFET pair will be turned OFF (2). The  
sample rate increases to 4 Hz after the first detection of  
Should a load be applied that exceeds the overcurrent-  
discharge current limit while the IC is in active rectification  
mode, the MOSFET pair will turn OFF. Recovery requires  
that either the IC detects a load greater than 3–7 Mor that  
the cell voltage remains under VMAX for 4 samples. If the  
load that caused overcurrent remains after the cell voltage  
drops under VMAX for 4 samples, then the MOSFET pair will  
turn ON once more and normal overcurrent mode is entered.  
>
VCELL VMAX. It is desirable under these circumstances for  
the MOSFET pair to turn ON for only the shortest allowed  
time period, which is 0.25 seconds. Each sample exceeding  
V
SAFE causes the MOSFET pair to turn OFF (3). Should the  
cell voltage not drop below VMAX after the MOSFET pair turn  
DS012931-12  
FIGURE 1. Normal Termination of Charging  
www.national.com  
8
Product Description (Continued)  
DS012931-13  
FIGURE 2. Normal Termination of Discharging  
DS012931-14  
FIGURE 3. Termination of Illegally High Charging  
DS012931-15  
FIGURE 4. Load Applied in Overcharged State  
The maximum cell voltage limit is trimmed by EEPROM  
and offers optimal accuracy. Each EEPROM cell has re-  
dundant EEPROM transistors for additional reliability.  
The EEPROM register also contains a parity check bit. In  
the rare event that an EEPROM bit would change state,  
the power MOSFETs will be turned OFF rather than allow  
the IC to operate out of specification.  
Fail Safe Features  
The safety provided by the LM3641 goes beyond the normal  
operation of the IC. The design of the IC includes many as-  
pects that continue to assure protection of the cells even  
when malfunctions occur.  
A rugged internal sense resistor offers precise overcur-  
rent response (magnitude and time) which allows smaller  
volume power MOSFETs to be used. If the internal resis-  
tor’s sense circuitry’s input open circuit (very unlikely),  
the MOSFET pair will turn OFF. The IC will fail safe.  
The external MOSFETs are specified to provide ad-  
equate illegal charger withstand capability. Because of  
M3, the IC is designed to never be exposed to more than  
the actual cell voltage. Therefore the IC’s maximum rated  
supply voltage does not limit the magnitude of illegal  
charger voltages that can be protected by the IC. M3’s Vt  
also guarantees that shorted cells can not be charged.  
If any pin becomes detached from the PCB, either the  
MOSFETs will turn OFF or the part will continue to protect  
the Cell.  
9
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Disconnect  
Charging  
Battery pack mode of operation where  
the MOSFET pair is OFF.  
Fail Safe Features (Continued)  
In the event of an extremely high charge current, the cell  
voltage could exceed the maximum supply rating of the  
IC. The IC is protected by internal voltage clamps and the  
external 100resistors R3 and R4.  
State of current conduction into positive  
terminal of battery pack from a current  
limited voltage source that does not ex-  
ceed the maximum voltage rating of the  
MOSFET pair.  
The external MOSFET pair turn-off resistor R2 aids in fail  
safe operation in the rare event that the IC fails. Dual in-  
dependently controlled series switches internal to the IC  
must both turn on to allow the MOSFET pair to conduct.  
If either control signal is in error, the external resistor R2  
will ensure that the MOSFET pair turn OFF.  
Discharging  
IC Enabled  
IC Disabled  
State of current conduction out of the  
positive terminal of battery pack into a  
load.  
The state when the Enable pin potential  
is set to the V+ potential. The IC operates  
with full functionality.  
The LM3641 is 100  
% tested for all aspects of operation.  
The digital design-for-test methodology allows the cir-  
cuitry to be tested at a greatly accelerated rate while  
maintaining near perfect fault coverage.  
The IC state when the Enable pin is float-  
ing or pulled low, such as in a detached  
pack. The Enable pin will be pulled to VSS  
with an internal current source,  
IENABLE PIN. The IC will go into power-  
down and the MOSFET pair is turned  
OFF to protect the pack from accidental  
short circuits, invalid chargers or invalid  
loads.  
The cell bypass resistor prevents leakage current from  
continuing to charge overcharged cells.  
PCB Safety Considerations  
The power MOSFET turn-OFF resistor R2 is critical for  
proper turn-OFF of the MOSFETs during a fault condition.  
Precaution is necessary so that this resistor or its con-  
tacts to the FET terminals is not interrupted by defects  
during and after the PCB assembly. The most robust de-  
sign is to replicate this resistor and its connections (see  
Figure 6).  
Recovery  
The ability to safely return to conduction  
mode after a fault condition has caused  
the MOSFET pair to turn OFF. Recovery  
is accomplished with a low to high signal  
on the Enable pin for overcharge, over-  
discharge and overcurrent.  
The IC bypass capacitor, C1, maintains stable operation  
of the IC’s analog functions. This component’s presence  
can be assured with a redundant capacitor (see Figure  
6).  
Recovery from overdischarge is auto-  
matic with the application of a charger.  
Recovery from overcharge is automatic  
with the application of a load. Recovery  
from overcurrent is automatic when the  
impedance at the terminal pack exceeds  
4–7 M.  
Pin Description  
tFET-TURN-OFF  
The turn-off time of the MOSFET pair.  
This parameter is dependent on the ex-  
ternal components used, however the  
typical time is 1–4 ms.  
Power-down  
A reduced power state resulting from a  
floating Enable. The MOSFET pair is al-  
ways OFF.  
DS012931-16  
FIGURE 5. Connection Diagram  
Cell-Bypass  
resistor  
A resistor that is connected across the  
cell(s) whenever overcharge conditions  
are detected. If the MOSFET pair is OFF  
and a charger applied, then some of the  
current in the V− pin would flow through  
the cell. This resistor ensures that the cell  
is discharged and not charged during  
such an event. This resistor also com-  
pensates for the possibility of leaking  
OFF MOSFET pair overcharging the  
cell(s).  
Rsense Terminal of the internal current sensing resistor.  
VSS  
Negative IC supply and sense pin for the cell’s  
negative terminal.  
Enable Enable/Disable for MOSFET drive and power-  
down mode. Also used to recover from fault condi-  
tions.  
V+  
Sense pin for the cell’s positive terminal.  
Positive IC supply.  
VDD  
Full  
High impedance pull-up signal indicating that the  
overcharge transition has occurred.  
MOSFET Bypass A resistor that is connected across the  
resistor  
MOSFETs after overcurrent fault. When  
the pack impedance 3–7 M, the MOS-  
FET bypass resistor reduces the MOS-  
FET voltage to less than VRECOVERY and  
the MOSFET turns ON. If the MOSFET  
bypass resistor is active, and the Enable  
goes low, the bypass resistor turns OFF.  
V−  
Pin used to monitor the negative terminal potential  
of the battery pack.  
GATE  
Gate drive for the external MOSFET pair. This pin  
is switched to VDD in the ON condition and is high  
impedance for the OFF condition.  
LCCE  
Return to conduction mode for overdis-  
charged packs does not require a low to  
high edge on the Enable pin. The appli-  
cation of a charger will turn on the FETs.  
Glossary of Terms  
Conduction  
Battery pack mode of operation when the  
MOSFET pair is ON.  
www.national.com  
10  
charger is applied to the pack.  
This current is limited by the V−  
pin’s external resistor, R1.  
Glossary of Terms (Continued)  
This is also defined as the Low Cell  
Charge Enable (LCCE). This way, deeply  
discharged packs can be charged even if  
the cell voltage is too low to enable the  
logic to operate. See also, the M3 section  
in the “Component Selection”.  
IENABLE PIN  
The internal pulldown current for  
the Enable pin; terminated at  
VSS  
.
tSAMPLE  
The time period between cell  
voltage measurements.  
tSAMPLE-4X  
The time period between cell  
Glossary of Specification  
voltage measurements after  
1
overcharge measurement and  
before 4 normal cell voltage mea-  
surements.  
Parameters  
VMAX  
The maximum steady state cell  
voltage for disconnect mode.  
tOVERCURRENT  
The time period for which the bat-  
tery current must be greater than  
the maximum current limit prior to  
turning the MOSFET pair OFF.  
VSAFE-OVER-CHARGE  
The maximum cell voltage over-  
shoot for conduction mode, re-  
ferred to VMAX  
.
VMIN  
The minimum steady state cell  
voltage for conduction mode.  
tFET-TURN-ON  
Turn-on time (MOSFET pair VGS  
>
Vt) with 1 Mand 2 nF load at  
VMIN-CELL-CHARGE  
The minimum cell voltage for  
which conduction mode for  
charging is guaranteed. Cell volt-  
ages below this value will not be  
charged, that is the MOSFET pair  
will remain OFF. This feature en-  
sures that very deeply dis-  
charged cells will be chargeable.  
the GATE pin.  
tENABLE-RECOVERY  
The delay time after the Enable  
pin is reconnected to V+ before  
the MOSFET pair is allowed to  
turn-on. This prevents switching  
“chatter” of the MOSFET pair  
during insertion to a charger or  
load.  
VGATE-FETS-ON  
The maximum pull-up voltage of  
the GATE pin in conduction  
mode.  
Component Selection  
IGATE-FETS-ON  
The pull-up current available  
from the GATE pin in transition to  
the conduction mode. This cur-  
rent collapses to zero at GATE =  
M1 & M2  
The power N-MOSFETs must be able to isolate the cell from  
invalid charge voltages, when the MOSFETs are OFF. The  
breakdown voltage from drain to source determines the  
maximum charger or reversed charger voltage tolerated. In-  
valid chargers that exceed this breakdown voltage will allow  
unlimited charge currents and therefore it is recommended  
to provide secondary protection with passive thermal and/or  
current fuses.  
VDD  
.
IGATE-FETS-OFF  
VRECOVERY  
The leakage current of the GATE  
pin in disconnect mode.  
The voltage across the MOSFET  
pair that is used to detect if a  
charger or a load is connected to  
the battery pack. This voltage is  
the difference between the V−  
and VSS pins. The voltage be-  
tween these pins is forced to  
The maximum gate to source DC voltage is the cell voltage.  
The VGS may peak momentarily during the MOSFETs turn  
ON from an OFF condition with a charger applied. This  
causes the charger voltage to appear across the gate to  
source voltage. So, choose MOSFETs than can withstand  
this voltage.  
equal VRECOVERY after  
a load  
has been applied to an over-  
charged pack in order to dis-  
charge the pack without the  
MOSFET cycling ON/OFF.  
The LM3641 has limited gate pin drive current and therefore,  
the maximum VGS rating of the MOSFETs must be higher  
than the illegal charger voltage. The selection of the MOS-  
FETs’ ON impedance is a pack power efficiency consider-  
ation.  
IMAX-CHG  
IMAX-DIS  
ISUPPLY  
The maximum magnitude termi-  
nal current allowed during charge  
mode.  
The MOSFETs maximum DC current operation should ex-  
ceed the maximum rating of the LM3641’s overcurrent pro-  
tection. Junction thermal conditions of the MOSFETs are of  
prime importance in designing a reliable system. For ex-  
ample, a dual MOSFET can have an IMAX rating of 5A. This  
rating however is valid when either one of the MOSFETs is  
ON. If both MOSFETs are ON, the rating for IMAX is less than  
2.5A, because you have twice the RDSON, so twice the  
power dissipation. Two single MOSFETs might give you a  
better solution.  
The maximum magnitude termi-  
nal current allowed during dis-  
charge mode.  
The IC supply excluding the cur-  
rent needed to supply the MOS-  
FET turn-on current. The MOS-  
FET turn-on current is calculated  
by VCELL/R2 4 µA. The IC sup-  
ply current flows between the  
The peak currents encountered during short circuit are of  
prime consideration in specifying the MOSFETs. The peak  
current of parallel connected cells will be greater. Different  
cell chemistries give different peak currents. The ON resis-  
V
DD and VSS pins. Additional cur-  
rent can flow from the VDD and  
VSS pins to the V− pin when the  
MOSFET pair is OFF and  
a
11  
www.national.com  
The operating VGSmax VCELL. The Vt of M3 has signifi-  
cance in that it determines what minimum value of cell volt-  
age is allowed for charging. When the cell voltage is lower  
than the VGSM3 required to conduct VCELL/R2, M1 and M2  
can not be turned ON and the pack is unchargeable. This is  
useful for preventing the charging of shorted cells, while re-  
viving packs that have become deeply discharged during ex-  
tended storage.  
Component Selection (Continued)  
tance of the MOSFETs ultimately determines the peak cur-  
rent in short circuit and therefore is a useful parameter for  
determining if the MOSFETs are compatible for the applica-  
tion. The proper pack design dictates that the MOSFETs are  
capable of withstanding repeated short circuit events over  
the life of the pack without developing opens or shorts be-  
tween the drain and source.  
R’s and C’s  
M3  
For the resistors and capacitors used in the application cir-  
This P-MOSFET is necessary for isolating the IC from invalid  
chargers. Its drain to source voltage breakdown should ex-  
ceed that of M1 and M2. The on conductance and gm can be  
very poor and serve the purpose of driving the power MOS-  
FETs M1 and M2 as the steady state drive is only VCELL/R2.  
cuit, Table 1 will give the acceptable value range and the ef-  
fected parameters. The function of each of these compo-  
nents is described in the “Application Circuit” section.  
TABLE 1. Component Acceptable Value Range and Effected Parameters  
Component  
Acceptable Value Range  
100 k–1 MΩ  
1 MΩ  
Parameters Effected  
Tolerated magnitude of invalid charger  
R1  
R2  
ISUPPLY vs. MOSFET turnoff delay  
R3, R4  
R5  
50–500Ω  
Current limit in extreme over voltage condition vs. IR drop of ISUPPLY  
Current limit in pack ESD event vs. IR drop of IENABLE  
IOL vs. VOH of Full signal  
100 k–1 MΩ  
100 k–1 MΩ  
0.01 µF–0.1 µF  
0.01 µF–0.1 µF  
0.01 µF–0.1 µF  
220 pF–1 nF  
R6  
C1  
Depends on frequency of noise loading the pack  
Depends on impedance spectrum of Cells  
C2  
C3  
Depends on MOSFET/Cell behavior during pack short circuit  
Equally effective during pack short circuit  
C4  
www.national.com  
12  
Application Circuit  
DS012931-17  
FIGURE 6. Application Circuit  
The pack current flows through the series path of the cell, the  
sense resistor and the power MOSFETs, M1 and M2. M3  
isolates the IC against high compliance voltage chargers  
when the power MOSFETs are OFF. The V− pin detects the  
polarity of voltage across the power MOSFETs. R1 limits the  
current into the V− pin when a charger is applied and the  
MOSFETs are OFF. R3 and R4 limit the current into the IC in  
the event of extreme charge current. They also prevent the  
cell to be shorted when the VDD or V+ pin becomes shorted,  
either internally or externally. R5 provides ESD protection of  
the IC from the pack terminal “E”. C1 bypasses transient Cell  
currents so that the IC supply current is not interrupted. The  
bypass of VDD is critical for stable operation, therefore it is  
advised that 2 parallel bypass capacitors C1A and C1B be  
used for redundancy. C2 is necessary to prevent the power  
MOSFETs from oscillating when the pack is short circuited.  
C3 suppresses possible oscillation of the MOSFETs during  
pack short circuit. C3 can be duplicated for extra safety. The  
same can be said for R2, which is used for proper turn OFF  
of the MOSFETs during a fault condition. C4 isolates the En-  
able pin from false reset signals during a pack short circuit  
event. Series C2 and C3 also provide high frequency bypass  
of the Cells which exhibit large impedance increase beyond  
10–100 kHz. R6 has to be added to pull up the Full pin. The  
Enable section is optional. R5 and C4 are only needed if the  
3rd terminal of the pack is used for the Enable function (see  
Product Description, “Enable Pin” section). If not used, short  
the Enable pin to the VDD pin.  
13  
www.national.com  
State Diagram  
DS012931-19  
FIGURE 7. State Diagram for LM3641 Operation  
www.national.com  
14  
15  
Physical Dimensions inches (millimeters) unless otherwise noted  
8-Lead SOIC (M08A)  
Order Number LM3641M  
NS Package Number M08A  
This device is factory programmable. Contact your local NSC sales office for ordering information.  
LIFE SUPPORT POLICY  
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DE-  
VICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMI-  
CONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or sys-  
tems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, and whose fail-  
ure to perform when properly used in accordance  
with instructions for use provided in the labeling, can  
be reasonably expected to result in a significant injury  
to the user.  
2. A critical component is any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
National Semiconductor  
Corporation  
Americas  
Tel: 1-800-272-9959  
Fax: 1-800-737-7018  
Email: support@nsc.com  
National Semiconductor  
Europe  
National Semiconductor  
Asia Pacific Customer  
Response Group  
Tel: 65-2544466  
Fax: 65-2504466  
National Semiconductor  
Japan Ltd.  
Tel: 81-3-5639-7560  
Fax: 81-3-5639-7507  
Fax: +49 (0) 1 80-530 85 86  
Email: europe.support@nsc.com  
Deutsch Tel: +49 (0) 1 80-530 85 85  
English Tel: +49 (0) 1 80-532 78 32  
Français Tel: +49 (0) 1 80-532 93 58  
Italiano Tel: +49 (0) 1 80-534 16 80  
Email: sea.support@nsc.com  
www.national.com  
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.  
This datasheet has been download from:  
www.datasheetcatalog.com  
Datasheets for electronics components.  

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