LM5109ASD/NOPB [NSC]

IC 1 A HALF BRDG BASED MOSFET DRIVER, PDSO8, 4 X 4 MM, LEAD FREE, LLP-8, MOSFET Driver;
LM5109ASD/NOPB
型号: LM5109ASD/NOPB
厂家: National Semiconductor    National Semiconductor
描述:

IC 1 A HALF BRDG BASED MOSFET DRIVER, PDSO8, 4 X 4 MM, LEAD FREE, LLP-8, MOSFET Driver

驱动 光电二极管 接口集成电路 驱动器
文件: 总9页 (文件大小:648K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
April 2006  
LM5109A  
High Voltage 1A Peak Half Bridge Gate Driver  
n Bootstrap supply voltage to 108V DC  
n Fast propagation times (30 ns typical)  
n Drives 1000 pF load with 15ns rise and fall times  
n Excellent propagation delay matching (2 ns typical)  
n Supply rail under-voltage lockout  
General Description  
The LM5109A is a cost effective, high voltage gate driver  
designed to drive both the high-side and the low-side  
N-Channel MOSFETs in a synchronous buck or a half bridge  
configuration. The floating high-side driver is capable of  
working with rail voltages up to 90V. The outputs are inde-  
pendently controlled with TTL compatible input thresholds.  
The robust level shift technology operates at high speed  
while consuming low power and providing clean level tran-  
sitions from the control input logic to the high-side gate  
driver. Under-voltage lockout is provided on both the low-  
side and the high-side power rails. The device is available in  
the SOIC-8 and the thermally enhanced LLP-8 packages.  
n Low power consumption  
n Pin compatible with ISL6700  
Typical Applications  
n Current Fed push-pull converters  
n Half and Full Bridge power converters  
n Solid state motor drives  
n Two switch forward power converters  
Features  
Package  
n Drives both a high-side and low-side N-Channel  
MOSFET  
n SOIC-8  
n LLP-8 (4 mm x 4 mm)  
n 1A peak output current (1.0A sink / 1.0A source)  
n
Independent TTL compatible inputs  
Simplified Block Diagram  
20170201  
FIGURE 1.  
© 2006 National Semiconductor Corporation  
DS201702  
www.national.com  
Connection Diagrams  
20170202  
20170203  
FIGURE 2.  
Ordering Information  
Ordering Number  
Package Type  
NSC Package Drawing  
M08A  
Supplied As  
LM5109AMA  
SOIC-8  
95 Units in anti static rails  
2500 Units on Tape & Reel  
1000 Units on Tape & Reel  
4500 Units on Tape & Reel  
LM5109AMAX  
LM5109ASD  
SOIC-8  
M08A  
LLP-8  
SDC08A  
LM5109ASDX  
LLP-8  
SDC08A  
Pin Descriptions  
Pin #  
Name  
Description  
Application Information  
SO-8  
LLP-8  
1
1
VDD  
HI  
Positive gate drive supply  
High side control input  
Low side control input  
Locally decouple to VSS using low ESR/ESL capacitor located  
as close to IC as possible.  
2
3
2
3
The HI input is compatible with TTL input thresholds. Unused  
HI input should be tied to ground and not left open  
The LI input is compatible with TTL input thresholds. Unused  
LI input should be tied to ground and not left open.  
All signals are referenced to this ground.  
LI  
4
5
6
4
5
6
VSS  
LO  
Ground reference  
Low side gate driver output  
High side source connection  
Connect to the gate of the low-side N-MOS device.  
Connect to the negative terminal of the bootstrap capacitor  
and to the source of the high-side N-MOS device.  
Connect to the gate of the high-side N-MOS device.  
HS  
7
8
7
8
HO  
HB  
High side gate driver output  
High side gate driver positive Connect the positive terminal of the bootstrap capacitor to HB  
supply rail  
and the negative terminal of the bootstrap capacitor to HS.  
The bootstrap capacitor should be placed as close to IC as  
possible.  
Note: For LLP-8 package it is recommended that the exposed pad on the bottom of the package be soldered to ground plane on the PCB and the ground  
plane should extend out from underneath the package to improve heat dissipation.  
www.national.com  
2
Absolute Maximum Ratings (Note 1)  
Storage Temperature Range  
ESD Rating HBM (Note 2)  
−55˚C to +150˚C  
1.5 kV  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
Recommended Operating  
Conditions  
VDD to VSS  
-0.3V to 18V  
−0.3V to 18V  
HB to HS  
VDD  
8V to 14V  
LI or HI to VSS  
LO to VSS  
−0.3V to VDD +0.3V  
−0.3V to VDD +0.3V  
VHS −0.3V to VHB +0.3V  
−5V to 90V  
HS (Note 6)  
−1V to 90V  
HB  
VHS +8V to VHS +14V  
HO to VSS  
<
HS Slew Rate  
Junction Temperature  
50 V/ns  
HS to VSS (Note 6)  
HB to VSS  
−40˚C to +125˚C  
108V  
Junction Temperature  
-40˚C to +150˚C  
Electrical Characteristics  
Specifications in standard typeface are for TJ = +25˚C, and those in boldface type apply over the full operating junction tem-  
perature range. Unless otherwise specified, VDD = VHB = 12V, VSS = VHS = 0V, No Load on LO or HO (Note 4).  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
SUPPLY CURRENTS  
IDD  
VDD Quiescent Current  
LI = HI = 0V  
f = 500 kHz  
LI = HI = 0V  
f = 500 kHz  
0.3  
1.8  
0.6  
2.9  
0.2  
2.8  
10  
mA  
mA  
mA  
mA  
µA  
IDDO  
IHB  
VDD Operating Current  
Total HB Quiescent Current  
Total HB Operating Current  
HB to VSS Current, Quiescent  
HB to VSS Current, Operating  
0.06  
1.4  
IHBO  
IHBS  
IHBSO  
VHS = VHB = 90V  
f = 500 kHz  
0.1  
0.5  
mA  
INPUT PINS LI and HI  
VIL  
VIH  
RI  
Low Level Input Voltage Threshold  
0.8  
100  
6.0  
5.7  
1.8  
1.8  
200  
V
V
High Level Input Voltage Threshold  
Input Pulldown Resistance  
2.2  
500  
kΩ  
UNDER VOLTAGE PROTECTION  
VDDR  
VDDH  
VHBR  
VHBH  
VDD Rising Threshold  
VDD Threshold Hysteresis  
HB Rising Threshold  
VDDR = VDD - VSS  
VHBR = VHB - VHS  
6.7  
0.5  
6.6  
0.4  
7.4  
7.1  
V
V
V
V
HB Threshold Hysteresis  
LO GATE DRIVER  
VOLL Low-Level Output Voltage  
ILO = 100 mA  
VOHL = VLO – VSS  
ILO = −100 mA,  
VOHL = VDD– VLO  
VLO = 0V  
0.38  
0.72  
0.65  
1.20  
V
V
VOHL  
High-Level Output Voltage  
IOHL  
IOLL  
Peak Pullup Current  
1.0  
1.0  
A
A
Peak Pulldown Current  
VLO = 12V  
HO GATE DRIVER  
VOLH Low-Level Output Voltage  
IHO = 100 mA  
VOLH = VHO– VHS  
IHO = −100 mA  
VOHH = VHB– VHO  
VHO = 0V  
0.38  
0.72  
0.65  
1.20  
V
V
VOHH  
High-Level Output Voltage  
IOHH  
IOLH  
Peak Pullup Current  
1.0  
1.0  
A
A
Peak Pulldown Current  
VHO = 12V  
THERMAL RESISTANCE  
θJA Junction to Ambient  
SOIC-8 (Note 3), (Note 5)  
LLP-8 (Note 3), (Note 5)  
160  
40  
˚C/W  
3
www.national.com  
Switching Characteristics  
Specifications in standard typeface are for TJ = +25˚C, and those in boldface type apply over the full operating junction tem-  
perature range. Unless otherwise specified, VDD = VHB = 12V, VSS = VHS = 0V, No Load on LO or HO.  
Symbol  
LM5109A  
tLPHL  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
Lower Turn-Off Propagation Delay (LI  
Falling to LO Falling)  
30  
30  
32  
32  
2
56  
56  
56  
56  
15  
ns  
ns  
ns  
ns  
ns  
tHPHL  
tLPLH  
tHPLH  
tMON  
tMOFF  
Upper Turn-Off Propagation Delay (HI  
Falling to HO Falling)  
Lower Turn-On Propagation Delay (LI  
Rising to LO Rising)  
Upper Turn-On Propagation Delay (HI  
Rising to HO Rising)  
Delay Matching: Lower Turn-On and  
Upper Turn-Off  
Delay Matching: Lower Turn-Off and  
Upper Turn-On  
2
15  
ns  
ns  
ns  
tRC, tFC  
tPW  
Either Output Rise/Fall Time  
Minimum Input Pulse Width that  
Changes the Output  
CL = 1000 pF  
15  
50  
-
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the component may occur. Operating Ratings are conditions under which operation of  
the device is guaranteed. Operating Ratings do not imply guaranteed performance limits. For guaranteed performance limits and associated test conditions, see the  
Electrical Characteristics tables.  
Note 2: The human body model is a 100 pF capacitor discharged through a 1.5kresistor into each pin.  
Note 3: 4 layer board with Cu finished thickness 1.5/1/1/1.5 oz. Maximum die size used. 5x body length of Cu trace on PCB top. 50 x 50mm ground and power  
planes embedded in PCB. See Application Note AN-1187.  
Note 4: Min and Max limits are 100% production tested at 25˚C. Limits over the operating temperature range are guaranteed through correlation using Statistical  
Quality Control (SQC) methods. Limits are used to calculate National’s Average Outgoing Quality Level (AOQL).  
Note 5: The θ is not a constant for the package and depends on the printed circuit board design and the operating conditions.  
JA  
Note 6: In the application the HS node is clamped by the body diode of the external lower N-MOSFET, therefore the HS voltage will generally not exceed -1V.  
However in some applications, board resistance and inductance may result in the HS node exceeding this stated voltage transiently.  
If negative transients occur on HS, the HS voltage must never be more negative than V - 15V. For example, if V = 10V, the negative transients at HS must not  
DD  
DD  
exceed -5V.  
www.national.com  
4
Typical Performance Characteristics  
VDD Operating Current vs Frequency  
HB Operating Current vs Frequency  
20170204  
20170205  
Operating Current vs Temperature  
Quiescent Current vs Temperature  
20170206  
20170207  
Quiescent Current vs Voltage  
Propagation Delay vs Temperature  
20170209  
20170208  
5
www.national.com  
Typical Performance Characteristics (Continued)  
LO and HO High Level Output Voltage vs Temperature  
LO and HO Low Level Output Voltage vs Temperature  
20170210  
20170211  
Undervoltage Rising Thresholds vs Temperature  
Undervoltage Hysteresis vs Temperature  
20170214  
20170215  
Input Thresholds vs Temperature  
Input Thresholds vs Supply Voltage  
20170217  
20170216  
www.national.com  
6
Timing Diagram  
20170218  
FIGURE 3.  
and involves high peak current. Minimizing this loop  
length and area on the circuit board is important to  
ensure reliable operation.  
Layout Considerations  
Optimum performance of high and low-side gate drivers  
cannot be achieved without taking due considerations during  
circuit board layout. The following points are emphasized:  
HS Transient Voltages Below  
Ground  
The HS node will always be clamped by the body diode of  
the lower external FET. In some situations, board resis-  
tances and inductances can cause the HS node to tran-  
siently swing several volts below ground. The HS node can  
swing below ground provided:  
1. Low ESR / ESL capacitors must be connected close to  
the IC between VDD and VSS pins and between HB and  
HS pins to support high peak currents being drawn from  
VDD and HB during the turn-on of the external MOS-  
FETs.  
2. To prevent large voltage transients at the drain of the top  
MOSFET, a low ESR electrolytic capacitor and a good  
quality ceramic capacitor must be connected between  
the MOSFET drain and ground (VSS).  
1. HS must always be at a lower potential than HO. Pulling  
HO more than -0.3V below HS can activate parasitic  
transistors resulting in excessive current flow from the  
HB supply, possibly resulting in damage to the IC. The  
same relationship is true with LO and VSS. If necessary,  
a Schottky diode can be placed externally between HO  
and HS or LO and GND to protect the IC from this type  
of transient. The diode must be placed as close to the IC  
pins as possible in order to be effective.  
3. In order to avoid large negative transients on the switch  
node (HS) pin, the parasitic inductances between the  
source of the top MOSFET and the drain of the bottom  
MOSFET (synchronous rectifier) must be minimized.  
4. Grounding considerations:  
a) The first priority in designing grounding connections is  
to confine the high peak currents that charge and dis-  
charge the MOSFET gates to a minimal physical area.  
This will decrease the loop inductance and minimize  
noise issues on the gate terminals of the MOSFETs. The  
gate driver should be placed as close as possible to the  
MOSFETs.  
2. HB to HS operating voltage should be 15V or less.  
Hence, if the HS pin transient voltage is -5V, VDD should  
be ideally limited to 10V to keep HB to HS below 15V.  
3. Low ESR bypass capacitors from HB to HS and from  
VDD to VSS are essential for proper operation. The  
capacitor should be located at the leads of the IC to  
minimize series inductance. The peak currents from LO  
and HO can be quite large. Any series inductances with  
the bypass capacitor will cause voltage ringing at the  
leads of the IC which must be avoided for reliable  
operation.  
b) The second consideration is the high current path that  
includes the bootstrap capacitor, the bootstrap diode,  
the local ground referenced bypass capacitor, and the  
low-side MOSFET body diode. The bootstrap capacitor  
is recharged on a cycle-by-cycle basis through the boot-  
strap diode from the ground referenced VDD bypass  
capacitor. The recharging occurs in a short time interval  
7
www.national.com  
Physical Dimensions inches (millimeters) unless otherwise noted  
Controlling dimension is inch. Values in [ ] are millimeters.  
Notes: Unless otherwise specified.  
1. Standard lead finish to be 200 microinches/5.08 micrometers minimum lead/tin (solder) on copper.  
2. Dimension does not include mold flash.  
3. Reference JEDEC registration MS-012, Variation AA, dated May 1990.  
SOIC-8 Outline Drawing  
NS Package Number M08A  
www.national.com  
8
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
Notes: Unless otherwise specified.  
1. For solder thickness and composition, see “Solder Information” in the packaging section of the National Semiconductor web  
page (www.national.com).  
2. Maximum allowable metal burr on lead tips at the package edges is 76 microns.  
3. No JEDEC registration as of May 2003.  
LLP-8 Outline Drawing  
NS Package Number SDC08A  
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves  
the right at any time without notice to change said circuitry and specifications.  
For the most current product information visit us at www.national.com.  
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NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS  
WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR  
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which, (a) are intended for surgical implant into the body, or  
(b) support or sustain life, and whose failure to perform when  
properly used in accordance with instructions for use  
provided in the labeling, can be reasonably expected to result  
in a significant injury to the user.  
2. A critical component is any component of a life support  
device or system whose failure to perform can be reasonably  
expected to cause the failure of the life support device or  
system, or to affect its safety or effectiveness.  
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