LMP8358MTX [NSC]

Zero-Drift, Programmable Instrumentation Amplifier with Diagnostics; 零漂移,可编程仪表放大器与诊断
LMP8358MTX
型号: LMP8358MTX
厂家: National Semiconductor    National Semiconductor
描述:

Zero-Drift, Programmable Instrumentation Amplifier with Diagnostics
零漂移,可编程仪表放大器与诊断

仪表放大器
文件: 总32页 (文件大小:966K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
May 5, 2010  
LMP8358  
Zero-Drift, Programmable Instrumentation Amplifier with  
Diagnostics  
General Description  
Features  
Typical Values unless otherwise noted, TA = 25°C  
The LMP8358 is a precision programmable-gain instrumen-  
tation amplifier in National's LMP® precision amplifier family.  
Its gain can be programmed to 10, 20, 50, 100, 200, 500, or  
1000 through an SPI-compatible serial interface or through a  
parallel interface. Alternatively, its gain can be set to an arbi-  
trary value using two external resistors. The LMP8358 uses  
patented techniques to measure and continuously correct its  
input offset voltage, eliminating offset drift over time and tem-  
perature and the effect of 1/f noise. Its ground-sensing CMOS  
input features a high CMRR and low input bias currents. It is  
capable of sensing differential input voltages in a common-  
mode range that extends from 100mV below the negative  
supply to 1.4V below the positive supply, making it an ideal  
solution for interfacing with ground-referenced sensors, sup-  
ply-referenced sensor bridges, and any other application re-  
quiring precision and long-term stability. Additionally, the  
LMP8358 includes fault detection circuitry to detect open and  
shorted inputs and deteriorating connections to the signal  
source. Other features that make the LMP8358 a versatile  
solution for many applications are its rail-to-rail output, low  
input voltage noise and high gain-bandwidth product.  
Supply voltage  
Supply current  
Max gain error  
Max gain drift  
Min CMRR  
Max offset voltage  
Max offset voltage drift  
GBW (gain = 10)  
Max non-linearity  
Operating temperature range  
Input fault detection  
SPI or pin configurable modes  
EMIRR at 1.8GHz  
2.7V to 5.5V  
1.8 mA  
0.15%  
16 ppm/°C  
110 dB  
10 µV  
50 nV/°C  
8 MHz  
100 ppm  
−40°C to 125°C  
92 dB  
14-Pin SOIC and 14-Pin TSSOP Package  
Applications  
Bridge sensor amplifier  
Thermopile amplifier  
Portable instrumentation  
Medical instrumentation  
Precision low-side current sensing  
Typical Application  
300454g1  
LMP® is a registered trademark of National Semiconductor Corporation.  
© 2010 National Semiconductor Corporation  
300454  
www.national.com  
Storage Temperature Range  
Junction Temperature (Note 4)  
For soldering specifications:  
see product folder at www.national.com and  
www.national.com/ms/MS/MS-SOLDERING.pdf  
−65°C to 150°C  
150°C  
Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
ESD Tolerance (Note 2)  
Human Body Model  
Machine Model  
Charge Device  
2kV  
200V  
1kV  
VS  
Operating Ratings (Note 1)  
Temperature Range  
−40°C to 125°C  
Supply Voltage (VS = V+ – V)  
2.7V to 5.5V  
±100mV  
VIN Differential (V+IN − V−IN  
)
VIN Differential (V+IN − V−IN  
)
Output Short Circuit Duration (Note 3)  
Any pin relative to V−  
+IN, −IN, OUT Pins  
Package Thermal Resistance (θJA (Note 4)  
14-Pin SOIC  
14-Pin TSSOP  
6V, −0.3V  
V+ +0.3V, V−0.3V  
±10 mA  
145°C/W  
135°C/W  
+IN, −IN Pins  
3.3V Electrical Characteristics  
Unless otherwise specified, all limits are guaranteed for TA = 25°C. V+ = 3.3V , V= 0V, VREF = V+/2, VCM = V+/2, RL = 10 kto  
VREF, CL = 10 pF; Serial Control Register: G[2:0] = 110b (Gain = 1000x), COMP[2:0] = 000b, MUX[1:0] = 00b, POL, SHDN, FILT,  
PIN = 0b, CUR[2:0] = 000b. Boldface limits apply at the temperature extremes.  
Min  
Typ  
Max  
Symbol  
Parameter  
Input Offset Voltage  
Conditions  
Units  
(Note 6) (Note 5) (Note 6)  
VOS  
VCM = V+/2  
VCM = 0V  
1
1
10  
15  
µV  
10  
15  
TCVOS Input Offset Voltage Temperature Drift VCM = V+/2  
50  
50  
nV/°C  
dB  
(Note 8)  
VCM = 0V  
V− 0.1V VCM V+ − 1.4V  
CMRR Common Mode Rejection Ratio  
110  
105  
139  
CMVR Common Mode Voltage Range  
VREFRR VREF Rejection Ratio  
−0.1  
1.9  
V
CMRR 110 dB  
V+ 0.1V VREFF V+ − 1.4V  
110  
105  
145  
138  
dB  
2.7V V+ 5.5V  
PSRR  
Power supply Rejection Ratio  
112  
105  
dB  
dB  
EMIRR Electro Magnetic Interference  
Rejection Ratio  
+IN / −IN, VRF = 100 mVP, f = 900 MHz  
+IN / −IN, VRF = 100 mVP, f = 1800 MHz  
83  
93  
ZINDM  
ZINCM  
VINDM  
IB  
Differential Input Impedance  
Common Mode Input Impedance  
Differential Mode Input Voltage  
Input Bias Current  
50||1  
50||1  
MΩ ‖ pF  
MΩ ‖ pF  
mV  
±100  
0.006  
1.2  
2
nA  
pA  
IOS  
en  
Input Offset Current  
0.1  
27  
31  
28  
27  
28  
28  
27  
27  
112  
Input Voltage Noise Density  
Gain = 10, f = 1 kHz  
Gain = 20, f = 1 kHz  
Gain = 50, f = 1 kHz  
Gain = 100, f = 1 kHz  
Gain = 200, f = 1 kHz  
Gain = 500, f = 1 kHz  
Gain = 1000, f = 1 kHz  
Gain = External, f = 1 kHz  
nV/  
www.national.com  
2
Min  
Typ  
Max  
Symbol  
Parameter  
Input Voltage Noise  
Conditions  
Units  
(Note 6) (Note 5) (Note 6)  
en  
Gain = 10, 0.1 Hz < f < 10 Hz  
Gain = 20, 0.1 Hz < f < 10 Hz  
Gain = 50, 0.1 Hz < f < 10 Hz  
Gain = 100, 0.1 Hz < f < 10 Hz  
Gain = 200, 0.1 Hz < f < 10 Hz  
Gain = 500, 0.1 Hz < f < 10 Hz  
Gain = 1000, 0.1 Hz < f < 10 Hz  
Gain = External, 0.1 Hz < f < 10 Hz  
Gain = 100, f = 1 kHz  
0.9  
0.6  
0.6  
0.7  
0.6  
0.6  
0.6  
0.6  
0.5  
µVPP  
In  
Input Current Noise Density  
Gain Error  
pA/  
GE  
Gain = 10, 20, 50, 100, 200, 500  
VOUT = VREF + 1V and VOUT = VREF − 1V  
0.03  
0.1  
0.15  
%
%
GE  
GE  
Gain Error  
Gain = 1000  
0.03  
0.15  
0.25  
VOUT = VREF + 1V and VOUT = VREF − 1V  
Gain Error Contribution from Chip  
Gain Error Temperature Coefficient  
VOUT = VREF + 1V and VOUT = VREF − 1V  
0.03  
3
%
For all gain settings (internal and  
external), VOUT = VREF + 1V and  
VOUT = VREF − 1V  
16  
ppm/°C  
NL  
Non-Linearity  
3.3  
8
100  
ppm  
MHz  
GBW  
Gain Bandwidth  
COMP[2:0] =000b, Gain > 10  
COMP[2:0] = 001b, Gain > 30  
COMP[2:0] = 010b, Gain > 200  
COMP[2:0] = 011b, Gain > 300  
COMP[2:0] = 1xxb, Gain > 1  
Gain = 10, COMP[2:0] = 000b  
Gain = 10, COMP[2:0] = 1xxb  
Gain = 20, COMP[2:0] = 000b  
Gain = 20, COMP[2:0] = 1xxb  
Gain = 50, COMP[2:0] = 001b  
Gain = 50, COMP[2:0] = 1xxb  
Gain = 100, COMP[2:0] = 010b  
Gain = 100, COMP[2:0] = 1xxb  
Gain = 200, COMP[2:0] = 010b  
Gain = 200, COMP[2:0] = 1xxb  
Gain = 500, COMP[2:0] = 011b  
Gain = 500, COMP[2:0] = 1xxb  
Gain = 1000, COMP[2:0] = 011b  
Gain = 1000, COMP[2:0] = 1xxb  
24  
80  
240  
0.8  
900  
70  
BW  
−3 dB Bandwidth  
400  
37  
490  
16  
680  
8
kHz  
195  
4
130  
1.5  
89  
0.8  
1.6  
SR  
Slew Rate  
(Note 7)  
COMP[2:0] = 000b, 10% to 90% of Step,  
VOUT = 2 VPP  
COMP[2:0] = 001b, 10% to 90% of Step,  
VOUT = 2 VPP  
3.8  
6.5  
9.3  
0.17  
4
COMP[2:0] = 010b, 10% to 90% of Step,  
VOUT = 2 VPP  
V/µs  
COMP[2:0] = 011b, 10% to 90% of Step,  
VOUT = 2 VPP  
COMP[2:0] = 1xxb, 10% to 90% of Step,  
VOUT = 2 VPP  
ts  
0.01% Settling Time  
2 V Step, CL = 10 pF, COMP[2:0] = 011b  
µs  
3
www.national.com  
Min  
Typ  
Max  
Symbol  
Parameter  
Conditions  
RL = 2 kto V+/2  
Units  
(Note 6) (Note 5) (Note 6)  
VOUT  
Output Voltage Swing High  
32  
40  
RL = 10 kto V+/2  
RL > 1 Mto V+/2  
RL = 2 kto V+/2  
RL = 10 kto V+/2  
RL > 1 Mto V+/2  
VOUT tied to V+/2  
VOUT tied to V+/2  
12  
17  
mV from  
top rail  
7
12  
Output Voltage Swing Low  
28  
38  
mV from  
bottom  
rail  
12  
17  
8
13  
IOUT  
Output Current Sourcing  
Output Current Sinking  
Supply Current  
21  
15  
28  
37  
mA  
32  
25  
IS  
Fault detection off, VIN DIFF = 0V  
Fault detection on, VIN DIFF = 0V  
in Shutdown  
1.8  
1.9  
0.014  
85  
2.1  
2.2  
1
mA  
mA  
µA  
TSD_ON Turn-on time from Shutdown  
µs  
PSE  
Prescaler Error (Offset + Gain Error)  
Prescaler Gain Factor  
VCM = V+/2  
5
15  
mV  
V/V  
0.02  
10  
ITEST  
Fault Detection: Test Current  
Setting 1 (CUR[2:0] = 001b), VCM < V+ −  
nA  
nA  
µA  
µA  
µA  
1.15V  
Setting 2 (CUR[2:0] = 010b), VCM < V+ −  
1.15V  
Setting 3 (CUR[2:0] = 011b), VCM < V+  
100  
1
1.15V  
Setting 4 (CUR[2:0] = 100b), VCM < V+  
10  
1.15V  
Setting 5 (CUR[2:0] = 101b), VCM < V+  
1.15V  
100  
5.0V Electrical Characteristics  
Unless otherwise specified, all limits are guaranteed for TA = 25°C. V+ = 5.0V , V= 0V, VREF = V+/2, VCM = V+/2, RL = 10 kto  
VREF, CL = 10 pF; Serial Control Register: G[2:0] = 110b (Gain = 1000x), COMP[2:0] = 000b, MUX[1:0] = 00b, POL, SHDN, FILT,  
PIN = 0b, CUR[2:0] = 000b. Boldface limits apply at the temperature extremes.  
Min  
Typ  
Max  
Symbol  
Parameter  
Input Offset Voltage  
Conditions  
Units  
(Note 6) (Note 5) (Note 6)  
VOS  
VCM = V+/2  
VCM = 0V  
0.9  
0.9  
10  
15  
µV  
10  
15  
TCVOS Input Offset Voltage Temperature Drift VCM = V+/2  
50  
50  
nV/°C  
dB  
(Note 8)  
VCM = 0V  
V− 0.1V VCM V+ − 1.4V  
V+ 0.1V VREFF V+ − 1.4V  
CMRR 115 dB  
CMRR Common Mode Rejection Ratio  
116  
105  
142  
150  
VREFRR VREF Rejection Ratio  
115  
105  
dB  
V
CMVR Common Mode Voltage Range  
−0.1  
3.6  
www.national.com  
4
Min  
Typ  
Max  
Symbol  
Parameter  
Conditions  
2.7V V+ 5.5V  
Units  
(Note 6) (Note 5) (Note 6)  
PSRR  
Power supply Rejection Ratio  
112  
105  
138  
dB  
EMIRR Electro Magnetic Interference  
Rejection Ratio  
+IN / −IN, VRF = 100 mVP, f = 900 MHz  
+IN / −IN, VRF = 100 mVP, f = 1800 MHz  
83  
93  
dB  
ZINDM  
ZINCM  
VINDM  
IB  
Differential Input Impedance  
Common Mode Input Impedance  
Differential Mode Input Voltage  
Input Bias Current  
50||1  
50||1  
MΩ ‖ pF  
MΩ ‖ pF  
mV  
±100  
0.006  
1.2  
nA  
2
IOS  
en  
Input Offset Current  
0.2  
25  
113  
pA  
Input Voltage Noise Density  
Gain = 10, f = 1 kHz  
Gain = 20, f = 1 kHz  
28  
Gain = 50, f = 1 kHz  
26  
Gain = 100, f = 1 kHz  
25  
nV/  
Gain = 200, f = 1 kHz  
28  
Gain = 500, f = 1 kHz  
26  
Gain = 1000, f = 1 kHz  
25  
Gain = External, f = 1 kHz  
Gain = 10, 0.1 Hz < f < 10 Hz  
Gain = 20, 0.1 Hz < f < 10 Hz  
Gain = 50, 0.1 Hz < f < 10 Hz  
Gain = 100, 0.1 Hz < f < 10 Hz  
Gain = 200, 0.1 Hz < f < 10 Hz  
Gain = 500, 0.1 Hz < f < 10 Hz  
Gain = 1000, 0.1 Hz < f < 10 Hz  
Gain = External, 0.1 Hz < f < 10 Hz  
Gain = 100, f = 1 kHz  
25  
en  
Input Voltage Noise  
0.7  
0.7  
0.5  
0.6  
0.6  
0.5  
0.6  
0.6  
0.5  
µVPP  
In  
Input Current Noise Density  
Gain Error  
pA/  
%
GE  
Gain = 10, 20, 50, 100, 200, 500  
VOUT = VREF + 1V and VOUT = VREF − 1V  
0.03  
0.1  
0.15  
GE  
GE  
Gain Error  
Gain = 1000  
VOUT = VREF + 1V and VOUT = VREF − 1V  
0.03  
0.15  
0.25  
%
Gain Error Contribution from chip  
Gain Error Temperature Coefficient  
VOUT = VREF + 1V and VOUT = VREF − 1V  
0.03  
3
%
For all gain settings (internal and  
external), VOUT = VREF + 1V and  
VOUT = VREF − 1V  
16  
ppm/°C  
NL  
Non-Linearity  
3
8
100  
ppm  
MHz  
GBW  
Gain Bandwidth  
COMP[2:0] = 000b, Gain > 10  
COMP[2:0] = 001b, Gain > 100  
COMP[2:0] = 010b, Gain > 200  
COMP[2:0] = 011b, Gain > 500  
24  
80  
240  
0.8  
COMP[2:0] = 1xxb,  
Gain => 1  
5
www.national.com  
Min  
Typ  
Max  
Symbol  
Parameter  
−3 dB Bandwidth  
Conditions  
Units  
(Note 6) (Note 5) (Note 6)  
BW  
Gain = 10, COMP[2:0] = 000b  
Gain = 10, COMP[2:0] = 1xxb  
Gain = 20, COMP[2:0] = 000b  
Gain = 20, COMP[2:0] = 1xxb  
Gain = 50, COMP[2:0] = 001b  
Gain = 50, COMP[2:0] = 1xxb  
Gain = 100, COMP[2:0] = 010b  
Gain = 100, COMP[2:0] = 1xxb  
Gain = 200, COMP[2:0] = 010b  
Gain = 200, COMP[2:0] = 1xxb  
Gain = 500, COMP[2:0] = 011b  
Gain = 500, COMP[2:0] = 1xxb  
Gain = 1000, COMP[2:0] = 011b  
Gain = 1000, COMP[2:0] = 1xxb  
930  
74  
385  
37  
460  
16  
640  
8
kHz  
195  
4
130  
1.5  
89  
0.8  
1.7  
SR  
Slew Rate  
(Note 7)  
COMP[2:0] = 000b, 10% to 90% of Step,  
VOUT = 2 VPP  
COMP[2:0] = 001b, 10% to 90% of Step,  
VOUT = 2 VPP  
5.0  
9.0  
11.0  
0.16  
4
COMP[2:0] = 010b, 10% to 90% of Step,  
VOUT = 2 VPP  
V/µs  
COMP[2:0] = 011b, 10% to 90% of Step,  
VOUT = 2 VPP  
COMP[2:0] = 1xxb, 10% to 90% of Step,  
VOUT = 2 VPP  
ts  
0.01% Settling Time  
2 V Step, CL = 10 pF, COMP[2:0] = 011b  
µs  
RL = 2 kto V+/2  
VOUT  
Output Voltage Swing High  
52  
62  
RL = 10 kto V+/2  
RL > 1 Mto V+/2  
RL = 2 kto V+/2  
RL = 10 kto V+/2  
RL > 1 Mto V+/2  
VOUT tied to V+/2  
VOUT tied to V+/2  
22  
30  
mV from  
top rail  
12  
17  
Output Voltage Swing Low  
42  
55  
mV from  
bottom  
rail  
16  
22  
12  
17  
IOUT  
Output Current Sourcing  
Output Current Sinking  
Supply Current  
23  
16  
31  
41  
mA  
34  
30  
IS  
Fault detection off, VIN DIFF = 0V  
Fault detection on, VIN DIFF = 0V  
in Shutdown  
1.8  
1.9  
2.1  
2.2  
1
mA  
mA  
µA  
0.006  
85  
TSD_ON Turn-on time from Shutdown  
µs  
PSE  
Prescaler Error (Offset + Gain Error)  
Prescaler Gain Factor  
VCM = V+/2  
5
8
mV  
V/V  
0.02  
www.national.com  
6
Min  
Typ  
Max  
Symbol  
Parameter  
Conditions  
Units  
(Note 6) (Note 5) (Note 6)  
ITEST  
Fault Detection: Test Current  
Setting 1 (CUR[2:0] = 001b), VCM < V+ −  
2.25V  
10  
nA  
Setting 2 (CUR[2:0] = 010b), VCM < V+  
100  
1
nA  
µA  
µA  
µA  
2.25V  
Setting 3 (CUR[2:0] = 011b), VCM < V+ −  
2.25V  
Setting 4 (CUR[2:0] = 100b), VCM < V+  
10  
2.25V  
Setting 5 (CUR[2:0] = 101b), VCM < V+ −  
2.25V  
100  
Electrical Characteristics (Serial Interface)  
Unless otherwise specified, all limits guaranteed for TA = 25°C, V+ − V2.7V, V+ VHSER/VLPAR, VVLSER/VHPAR, VD =  
(VHSER/VLPAR) − (VLSER/VHPAR) 2.5V.  
Min  
(Note 6)  
Typ  
(Note 5)  
Max  
(Note 6)  
Symbol  
VIL  
Parameter  
Conditions  
Units  
Input Logic Low Threshold  
Input Logic High Threshold  
Output Logic Low Threshold  
Output Logic High Threshold  
Output Source Current, SDO  
0.3 × VD  
V
V
V
VIH  
0.7 × VD  
VOL  
VOH  
ISDO  
ISDO = 2mA  
ISDO = 2mA  
0.2  
VD − 0.2V  
−2  
VD = 3.3V or 5.0V,  
CSB = 0V, VOH = V+ – 0.7V  
mA  
µA  
Output Sink Current, SDO  
VD = 3.3V or 5.0V,  
2
CSB = 0V, VOL = 1.0V  
IOZ  
Output Tri-state Leakage Current, VD = 3.3V or 5.0V,  
±1  
SDO  
CSB = VD = 3.3V or 5V  
(Note 9)  
t1  
t2  
t3  
t4  
t5  
t6  
t7  
High Period, SCK  
100  
100  
50  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Low Period, SCK  
(Note 9)  
Set Up Time, CSB to SCK  
Set Up Time, SDI to SCK  
Hold Time, SCK to SDI  
Prop. Delay, SCK to SDO  
(Note 9)  
(Note 9)  
30  
(Note 9)  
10  
(Note 9)  
60  
Hold Time, SCK Transition to CSB (Note 9)  
Rising Edge  
50  
50  
t8  
CSB Inactive  
(Note 9)  
(Note 9)  
ns  
ns  
ns  
ns  
t9  
Prop. Delay, CSB to SDO Active  
50  
50  
t10  
t11  
Prop. Delay, CSB to SDO Inactive (Note 9)  
Hold Time, SCK Transition to CSB (Note 9)  
10  
Falling Edge  
tr/tf  
Signal Rise and Fall Times  
(Note 9)  
1.5  
5
ns  
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is  
intended to be functional, but for which specific performance is not guaranteed. For guaranteed specifications and the test conditions, see Electrical Characteristics.  
Note 2: Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22–A115–A (ESD MM std. of JEDEC). Field-  
Induced Charge-Device Model, applicable std. JESD22–C101–C (ESD FICDM std. of JEDEC).  
Note 3: The short circuit test is a momentary test which applies to both single-supply and split-supply operation. Continuous short circuit operation at elevated  
ambient temperature can exceed the maximum allowable junction temperature of 150°C.  
Note 4: The maximum power dissipation is a function of TJ(MAX), θJA. The maximum allowable power dissipation at any ambient temperature is  
PD = (TJ(MAX) – TA)/ θJA. All numbers apply for packages soldered directly onto a PC Board.  
Note 5: Typical Values indicate the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will  
also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material.  
Note 6: All limits are guaranteed by testing or statistical analysis.  
7
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Note 7: Slew rate is the average of the rising and falling slew rates.  
Note 8: The offset voltage average drift is determined by dividing the value of VOS at the temperature extremes by the total temperature change.  
Note 9: Load for these tests is shown in the Timing Diagram Test Circuit.  
Connection Diagram  
14-Pin SOIC/ 14-Pin TSSOP  
30045402  
Top View  
Pin Descriptions  
Pin Name  
Communication Mode  
Serial  
Parallel  
+IN  
−IN  
Positive Input  
Negative Input  
Reference Sense  
Reference Force  
Feedback  
REFS  
REFF  
FB  
OUT  
Output  
V+  
Positive Supply  
VHSER/VLPAR  
V−  
Set High  
Set Low  
Set High  
Negative Supply  
VLSER/VHPAR  
CSB/SHDN  
SCK/G2  
SDI/G1  
SDO/G0  
Set Low  
Chip Select  
Shutdown (Active High)  
Gain (MSB)  
Gain  
Serial Clock  
Serial Data In  
Serial Data Out  
Gain (LSB)  
Ordering Information  
Package  
Part Number  
LMP8358MA  
LMP8358MAX  
LMP8358MT  
LMP8358MTX  
Package Marking  
Transport Media  
NSC Drawing  
55 Units/Rail  
2.5k Units Tape and Reel  
94 Units/Rail  
14-Pin SOIC  
LMP8358MA  
LMP8358MT  
M14A  
14-Pin TSSOP  
MTC14  
2.5k Units Tape and Reel  
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8
Block Diagram  
30045406  
14-Pin SOIC/ 14-Pin TSSOP  
9
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Timing Diagrams  
30045403  
SPI Timing Diagram  
30045453  
Timing Diagram Test Circuit  
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10  
Typical Performance Characteristics V+ = 3.3V and TA = 25°C unless otherwise noted.  
Gain vs. Frequency for Various COMP Settings  
Gain vs. Frequency for Various COMP Settings  
300454c2  
300454c3  
Gain vs. Frequency for Various COMP Settings  
Gain vs. Frequency for Various Cap Loads  
300454c5  
300454c4  
Gain vs. Frequency for Various Cap Loads  
Gain Error vs. Common Mode Voltage, VS = 5V  
300454c6  
300454f4  
11  
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Gain Error vs. Common Mode Voltage, VS = 3.3V  
Gain Error Distribution, Gain = 10, VS = 3.3V  
300454g4  
300454f5  
Gain Error Distribution, Gain = 100, VS = 3.3V  
Gain Error Distribution, Gain = 1000, VS = 3.3V  
300454g5  
300454g6  
VOS Distribution, VS = 3.3V  
VOS Distribution, VS = 5.0V  
300454g2  
300454g3  
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12  
TCVOS Distribution, VS = 3.3V  
TCVOS Distribution, VS = 5V  
VOS vs. VCM, VS = 3.3V  
VOS vs. VCM, VS = 5.0V  
300454g7  
300454g8  
VOS vs. VCM, VS = 3.3V  
300454e6  
300454e5  
VOS vs. VCM, VS = 5.0V  
300454e7  
300454e8  
13  
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VOS vs. VREF, VS = 3.3V  
CMRR vs. Frequency  
Voltage Noise vs. Time  
CMRR vs. Frequency  
300454d3  
300454g9  
PSRR vs. Frequency  
300454d8  
300454d9  
Voltage Noise vs. Frequency  
300454d2  
300454c9  
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14  
Small Signal Step Response for Various COMP Settings  
Small Signal Step Response for Various COMP Settings  
300454d4  
300454d5  
Large Signal Step Response for Various COMP Settings  
Large Signal Step Response for Various COMP Settings  
300454d6  
300454d7  
Positive Overshoot vs. CLOAD  
Supply Current vs. Supply Voltage  
300454e3  
300454e9  
15  
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Input Bias Current vs. VCM, VS = 3.3V  
Input Bias Current vs. VCM, VS = 5.0V  
300454f1  
300454f0  
THD+N vs. Frequency  
THD+N vs. VOUT  
300454e0  
300454e2  
ITEST1 vs. VCM  
ITEST2 vs. VCM  
300454g0  
300454f9  
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16  
ITEST3 vs. VCM  
ITEST4 vs. VCM  
300454f8  
300454f7  
ITEST5 vs. VCM  
Output Swing High vs. Supply Voltage  
300454f2  
300454f6  
Output Swing Low vs. Supply Voltage  
EMIRR IN+ vs. Frequency  
300454f3  
300454e1  
17  
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auto-zeroed the other stage provides the path between the  
input pins and the output. The auto-zeroing decreases offset,  
offset drift, and 1/f noise while the ping-pong architecture pro-  
vides a continuous path between the input and the output. As  
with all devices that use auto-zeroing, care must be taken with  
the signal frequency used with the device. On-chip continu-  
ous auto-zero correction circuitry eliminates the 1/f noise and  
significantly reduces the offset voltage and offset voltage drift;  
all of which are very low-frequency events. For slow-changing  
sensor signals, below 2kHz, this correction is transparent.  
Higher-frequency signals as well as fast changing edges will  
show a settling and ramping time lasting about 1μs. Like all  
auto-zeroing devices, if the input frequency is above the auto-  
zero frequency, aliasing will occur. This can occur both at the  
auto-zeroing frequency of about 12kHz and the ping-pong  
frequency of about 50kHz. If needed, a low-pass filter should  
be placed on the output of the LMP8358 to filter out this dis-  
turbance.  
Application Information  
INTRODUCTION  
The LMP8358 is a precision programmable gain instrumen-  
tation amplifier. Its gain can be programmed to 10, 20, 50,  
100, 200, 500 or 1000 through an SPI-compatible serial in-  
terface or through a parallel interface. Alternatively, its gain  
can be set to an arbitrary value using external resistors. Note  
that at low gains the dynamic range is limited by the maximum  
input differential voltage of ±100mV. The LMP8358 uses  
patented techniques to measure and continuously correct its  
input offset voltage, eliminating offset drift over time and tem-  
perature, and the effect of 1/f noise. Its ground sensing CMOS  
input features a high CMRR and low input bias currents. It is  
capable of sensing differential input voltages in a common-  
mode range that extends from 100 mV below the negative  
supply to 1.4V below the positive supply, making it an ideal  
solution for interfacing with ground-referenced sensors, sup-  
ply-referenced sensor bridges, and any other application re-  
quiring precision and long term stability. Additionally, the  
LMP8358 includes fault detection circuitry, so open and short-  
ed inputs can be detected, as well a deteriorating connection  
to the signal source. Other features that make the LMP8358  
a versatile solution for many applications are: its rail-to-rail  
output, low input voltage noise and high gain-bandwidth prod-  
uct.  
COMMUNICATION WITH THE PART AND REGISTER  
DESCRIPTION  
The LMP8358 supports a serial and a parallel digital interface  
mode as shown in Figure 1.  
Parallel user mode Gain is set using G0, G1 and G2 pins.  
The shutdown mode can be activated by  
asserting SHDN. Fault detection fea-  
tures are unavailable.  
TRANSIENT RESPONSE TO FAST INPUTS  
Serial user mode  
The part is SPI-programmable through  
SDI, SCK, SDO and CSB. All features  
are available.  
The LMP8358 is a current-feedback instrumentation amplifier  
that consists of two auto-zeroed input stages. These two input  
stages are operated in a ping-pong fashion: as one stage is  
30045410  
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18  
300454a5  
FIGURE 1. (A) Communication with LMP8358 in Parallel Mode (B) Communication with LMP8358 in Serial Mode  
Communication Mode Selection  
Table 1. Function of Digital IO Pins, Parallel Mode  
The interface mode is determined by the two interface level  
pins VLSER/VHPAR and VHSER/VLPAR.  
Pin Name  
Description  
G0  
Gain setting (LSB)  
Gain setting  
VLSER/VHPAR < VHSER/  
VLPAR  
Serial Interface. VLSER=  
Logic low level, VHSER =  
Logic high level.  
G1  
G2  
Gain setting (MSB)  
Shutdown (Active High)  
Positive logic level  
Negative logic level  
VLSER/VHPAR > VHSER/  
VLPAR  
Parallel interface. VLPAR =  
Logic low level, VHPAR =  
Logic high level.  
SHDN  
VHPAR  
VLPAR  
The levels applied to the VLSER/VHPAR and VHSER/VL-  
PAR pins should be between the V+ and Vlevels as shown  
in Figure 2.  
Table 2. Pin Levels for Setting Gain, Parallel Mode  
G2 G1 G0 Gain Setting  
Bandwidth Compen-  
sation  
Setting  
(Auto-  
matically  
Set)  
0
0
0
10x (power-up  
default)  
930 kHz  
000b  
0
0
0
1
1
1
1
0
1
1
0
0
1
1
1
0
1
0
1
0
1
20x  
385 kHz  
460 kHz  
640 kHz  
195 kHz  
130 kHz  
89 kHz  
000b  
001b  
010b  
010b  
011b  
011b  
1xxb  
50x  
100x  
30045409  
200x  
FIGURE 2. Communication Mode Selection.  
500x  
1000x  
User defined  
PARALLEL CONTROL INTERFACE MODE  
800 kHz  
The LMP8358 is put into Parallel Mode by setting VLSER/  
VHPAR > VHSER/VLPAR. The register in the LMP8358 does  
not control the settings of the LMP8358 in this mode. Gain  
and shutdown are set by placing a high or low logic level on  
pins 11 (SHDN), 12 (G2), 13 (G1), and 14 (G0), as shown in  
Table 1. Function of Digital IO Pins, Parallel Mode and Table  
2. Pin Levels for Setting Gain, Parallel Mode. The logic high  
and low levels are defined by the voltages on the VLSER/  
VHPAR and VHSER/VLPAR pins. See the START UP AND  
POWER ON RESET section for power on requirements when  
using the parallel mode.  
SERIAL CONTROL INTERFACE MODE  
The LMP8358 is put into Serial Mode by setting VLSER/VH-  
PAR < VHSER/VLPAR. In the Serial Mode the LMP8358 can  
be programmed by using pins 11 – 14 as shown in Table 3.  
Function of Digital IO Pins, Serial Mode and the SPI Timing  
Diagram. The LMP8358 contains a 16 bit register which con-  
trols the performance of the part. These bits can be changed  
using the Serial Mode of communication. The register of the  
LMP8358 is shown in Table 4. LMP8358 Register Descrip-  
tion, Serial Mode. Immediately after power on the register  
should be written with the value needed for the application.  
See the START UP AND POWER ON RESET section.  
19  
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Table 3. Function of Digital IO Pins, Serial Mode  
Bit No Name  
Description  
Pin Name  
Description  
11  
12  
13  
14  
15  
PIN  
Fault detection pin selection  
Fault detection current setting (LSB)  
Fault detection current setting  
Fault detection current setting (MSB)  
Unused, set to 0  
SDO  
Serial Data Out  
Serial Data In  
Serial Clock  
CUR0  
CUR1  
CUR2  
N/A  
SDI  
SCK  
CSB  
Chip Select  
VLSER  
VHSER  
Negative Logic level  
Positive Logic Level  
Serial Control Interface Operation  
The LMP8358 gain, bandwidth compensation, shutdown, in-  
put options, and fault detection are controlled by an on board  
programmable register. Data to be written into the control  
register is first loaded into the LMP8358 via the serial inter-  
face. The serial interface employs an 16-bit double-buffered  
register for glitch-free transitions between settings. Data is  
loaded through the serial data input, SDI. Data passing  
through the shift register is output through the serial data out-  
put, SDO. The serial clock, SCK controls the serial loading  
process. All sixteen data bits are required to correctly program  
the amplifier. The falling edge of CSB enables the shift reg-  
ister to receive data. The SCK signal must be high during the  
falling and rising edge of CSB. Each data bit is clocked into  
the shift register on the rising edge of SCK. Data is transferred  
from the shift register to the holding register on the rising edge  
of CSB. Operation is shown in the SPI Timing Diagram.  
Table 4. LMP8358 Register Description, Serial Mode  
Bit No Name  
Description  
0
1
2
3
4
5
6
7
8
9
10  
G0  
G1  
G2  
Gain setting (LSB)  
Gain setting  
Gain setting (MSB)  
COMP0 Frequency compensation setting (LSB)  
COMP1 Frequency compensation setting  
COMP2 Frequency compensation setting (MSB)  
MUX0  
MUX1  
POL  
Input multiplexer selection (LSB)  
Input multiplexer selection (MSB)  
Input polarity switch  
SHDN  
FILT  
Shutdown Enable  
The serial control pins can be connected in one of two ways  
when two or more LMP8358s are used in an application.  
Enable filtering using external cap  
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20  
Star Configuration  
After the microcontroller writes, all registers will have the  
same value. Using multiple CSB lines as shown in Figure 4  
allows different values to be written into each register.  
The configuration shown in Figure 3 can be used if each  
LMP8358 will always have the same value in each register.  
300454a3  
FIGURE 3. Star Configuration for Writing the Same Value Into Each Register  
300454a4  
FIGURE 4. Star Configuration for Writing Different Values Into Each Register  
Daisy Chain Configuration  
tions are shown in Figure 5. In this configuration the SDO pin  
of each LMP8358 is connected to the SDI pin of the following  
LMP8358.  
This configuration can be used to program the same or dif-  
ferent values in the register of each LMP8358. The connec-  
300454a5  
FIGURE 5. Daisy Chain Configuration  
21  
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The following two examples show how the registers are writ-  
ten in the Daisy Chain Configuration.  
Tabel 5. If all three LMP8358s need a gain of 100 with a compensation level of 010. (0000 0000 0001 0011)  
Register of LMP8358 #1 Register of LMP8358 #2 Register of LMP8358 #3 Notes  
Power on  
0000 0000 0000 0000  
0000 0000 0000 0000  
0000 0000 0000 0000  
0000 0000 0000 0000  
0000 0000 0000 0000  
Default power on state  
After first two bytes are 0000 0000 0001 0011  
sent  
The data in the register of  
LMP8358 #1 is shifted  
into the register of  
LMP8358 #2, the data in  
the register of LMP8358  
#2 is shifted into the  
After second two bytes 0000 0000 0001 0011  
are sent  
0000 0000 0001 0011  
0000 0000 0001 0011  
0000 0000 0000 0000  
0000 0000 0001 0011  
After third two bytes  
are sent  
0000 0000 0001 0011  
register of LMP8358 #3.  
Table 6. If LMP8358 #1 needs a gain of 20 (0000 0000 0000 0001), LMP8358 #2 needs a gain of 1000 with a compensation  
level of 011 (0000 0000 0001 1110), and LMP8358 #3 needs a gain of 100 with a compenstation level of 010 (0000 0000 0001  
0011).  
Register of LMP8358 #1 Register of LMP8358 #2 Register of LMP8358 #3 Notes  
Power on  
0000 0000 0000 0000  
0000 0000 0000 0000  
0000 0000 0000 0000  
0000 0000 0000 0000  
0000 0000 0000 0000  
Default power on state  
After first two bytes are 0000 0000 0001 0011  
sent  
The data in the register of  
LMP8358 #1 is shifted  
into the register of  
LMP8358 #2, the data in  
the register of LMP8358  
#2 is shifted into the  
After second two bytes 0000 0000 0001 1110  
are sent  
0000 0000 0001 0011  
0000 0000 0001 1110  
0000 0000 0000 0000  
0000 0000 0001 0011  
After third two bytes  
are sent  
0000 0000 0000 0001  
register of LMP8358 #3  
LMP8358 SETTINGS  
Gain (Serial, Parallel)  
When G[2:0] = 111b in either serial or parallel mode switch  
S1 is open and S2 is closed and the LMP8358 gain is set by  
external resistors as shown in Figure 6. The gain is:  
When the LMP8358 is in Parallel Mode the gain can be set  
by applying a high or low level to pins 12 (G2), 13 (G1), and  
14 (G0), as shown in Table 2. Pin Levels for Setting Gain,  
Parallel Mode. The Frequency Compensation bits are auto-  
matically set as shown in Table 2. Pin Levels for Setting Gain,  
Parallel Mode to optimize the bandwidth. In Serial Mode the  
gain is determined by setting G[2:0] as shown in Table 7. Gain  
Setting (Register bits 2:0) and the bandwidth can be changed  
using the Frequency Compensation bits in the register.  
GAIN = 1 + (Z1/Z2)  
When the gain is set by external resistors and COMP[2:0] =  
1xxb, a capacitor can be used to implement a noise reduction  
low pass filter. See the Filter and External Filter Capacitor  
(Serial) section. R1and CFILTER are placed between the OUT  
and FB pins. R2 is placed between the FB and REFS pins.  
Table 7. Gain Setting (Register bits 2:0)  
G2  
0
G1  
0
G0  
0
Gain Setting  
10x (power-up default)  
0
0
1
20x  
0
1
0
50x  
0
1
1
100x  
1
0
0
200x  
1
0
1
500x  
300454a6  
1
1
0
1000x  
User Defined  
1
1
1
FIGURE 6. External Gain Set Resistors and Filter  
Capacitor  
When G[2:0] = 000b to 110b switch S1 is closed and switch  
S2 is open as shown in the Block Diagram.  
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22  
Frequency Compensation (Serial)  
at the selectable gain and compensation settings. Note that  
for gains 10X and 20X, the recommended compensation set-  
ting is 000b. For the gain setting 50X, compensation settings  
may be 000b and 001b. Gain settings 100X and 200X may  
use the three bandwidth compensation settings 000b, 001b,  
and 010b. At gains of 500X and 1000X, all bandwidth com-  
pensation ranges may be used. Note that for lower gains, it is  
possible to under compensate the amplifier into instability.  
The gain-bandwidth compensation is set to one of five levels  
under program control. The amount of compensation can be  
decreased to maximize the available bandwidth as the gain  
of the amplifier is increased. The compensation level is se-  
lected by setting bits COMP[2:0] of the control register with  
000b, 001b, 010b, 011b, or 1xxb. Table 8. Frequency Com-  
pensation (Register bits 5:3) shows the bandwidths achieved  
Table 8. Frequency Compensation (Register bits 5:3)  
Bandwidth  
000  
Gain\COMP [2:0]  
001  
010  
011  
1xx  
10  
930 kHz  
385 kHz  
160 kHz  
80 kHz  
38 kHz  
16 kHz  
8 kHz  
n/a  
n/a  
n/a  
74 kHz  
37 kHz  
16 kHz  
8 kHz  
20  
n/a  
n/a  
n/a  
50  
460 kHz  
225 kHz  
95 kHz  
40 kHz  
22 kHz  
n/a  
n/a  
100  
200  
500  
1000  
640 kHz  
195 kHz  
85 kHz  
50 kHz  
n/a  
n/a  
4 kHz  
130 kHz  
89 kHz  
1.5 kHz  
0.8 kHz  
User Defined Gain  
GBW Product  
> 10x  
8 MHz  
> 30x  
24 MHz  
> 100x  
80 MHz  
> 300x  
240 MHz  
> 1x  
0.8 MHz  
(For external filter cap)  
Input Multiplexer and Polarity Switch (Serial)  
states shown in Table 9. Input Multiplexer and Polarity (Reg-  
ister bits 8:6).  
The Input Multiplexer Selection bits MUX[1:0] and Polarity bit  
POL can be used to set the inputs of the LMP8358 to the  
Table 9. Input Multiplexer and Polarity (Register bits 8:6)  
MUX1  
MUX0  
Diff Input for POL = 0  
Diff Input for POL = 1  
0
0
0
1
1
0
1
1
Polarity Reversal  
for example, to compensate for thermocouple voltages, resid-  
ual offset of the LMP8358, or offsets of the sensor or ADC.  
When MUX[1:0] = 00b and POL = 0b the LMP8358 has the  
input of a normal instrumentation amplifier. The input for the  
LMP8358 is defined as Gain × (V+IN − V−IN). When POL = 1b,  
the input for the LMP8358 is defined as Gain × (V−IN – V+IN).  
Polarity reversal can be used to do system level calibration,  
Short Inputs  
When MUX[1:0] = 01b and POL = 0b both inputs are con-  
nected to the +IN pin of the LMP8358. The –IN pin is left  
23  
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floating. When MUX[1:0] = 01b and POL = 1b both inputs are  
connected to the -IN pin of the LMP8358. The +IN pin is left  
floating.  
Table 13. RFILTER Value  
RFILTER Value  
18.5 kΩ  
Gain  
10  
Compare Input to V-  
20  
112 kΩ  
When MUX[1:0] = 10b or 11b one external input of the  
LMP8358 is floating. The other external input is divided by 50  
as shown in Table 9. Input Multiplexer and Polarity (Register  
bits 8:6). The internal instrumentation amplifier input that is  
not connected to the external pin is connected to V. With a  
scale factor of 1/50 this gives an overall gain of 0.2x, 0.4x, 1x,  
2x, 4x, 10x, or 20x depending on what the gain is set to with  
G[2:0] bits as shown in Table 10. Overall Gain using G[2:0],  
MUX[1:0] and POL.  
50  
168 kΩ  
100  
200  
500  
1000  
187 kΩ  
1.12 MΩ  
1.68 MΩ  
1.87 MΩ  
External Resistor R1  
User-Defined Gain  
Table 10. Overall Gain using G[2:0], MUX[1:0] and POL  
The tolerance of the RFILTER value for the pre-defined gains  
is about ±3%. If an external filter cap is not used FILT should  
be set to 0b to prevent errors related to leakage currents on  
the FB pin.  
G[2:0]  
MUX[1:0]  
Overall System Gain  
POL = 0b  
POL = 1b  
000b  
001b  
010b  
011b  
100b  
101b  
110b  
10b or 11b  
10b or 11b  
10b or 11b  
10b or 11b  
10b or 11b  
10b or 11b  
10b or 11b  
0.2  
0.4  
1
−0.2  
−0.4  
−1  
Fault Detection Pin and Current Setting (Serial)  
The LMP8358 has an internal current source that can be used  
to detect faults in the overall system. See the FAULT DE-  
TECTION METHODS Section. When PIN = 0b this current  
source is connected to the +IN pin. When PIN = 1b the current  
source is connected to the −IN pin.  
2
−2  
4
−4  
10  
20  
−10  
−20  
Table 14. Pin Current Source (Register bit 11)  
PIN  
0
Current source is connected to  
Shutdown Enable (Serial, Parallel)  
+IN pin  
−IN pin  
When the SHDN bit of the LMP8358 register is set to 1b the  
part is put into shutdown mode. It will use less than 1μA in this  
state.  
1
The Fault Detection Current bit, CUR[2:0] controls the amount  
of current that sent to the input pin as shown in Table 15. Fault  
Detection Current Source (Register bits 14:12).  
Table 11. Shutdown (Register bit 9)  
SHDN  
Mode  
Table 15. Fault Detection Current Source (Register bits  
14:12)  
0
1
Active mode  
Shutdown mode  
CUR2 CUR1 CUR0  
Filter and External Filter Capacitor (Serial)  
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
disconnected and powered down *  
The FILT bit controls the state of switch S2 shown in the Block  
Diagram. When G[2:0] = 000b to 110b, switch S2 will be open  
if FILT = 0b and S2 will be closed if FILT = 1b. When G[2:0]  
= 111b switch S2 is always closed and does not depend on  
the value in the FILT bit.  
10 nA  
100 nA  
1 μA  
10 µA  
When FILT = 1b and COMP[2:0] = 1xxb the LMP8358 is unity-  
gain stable and an external filter cap can be applied as shown  
in Figure 6. The corner filter of the filter is:  
100 µA  
disconnected, but powered *  
Do Not Use  
F-3dB = 1/(2πRFILTERCFILTER  
)
* Leaving the fault detection current source powered allows it  
to switch between current levels faster, particularly when sup-  
plying currents less than 1 µA.  
RFILTER depends on the gain of the part and is shown inTable  
13. RFILTER Value.  
Table 12. Filter (Register bit 10)  
FILT  
Mode  
0
1
No external filter cap used  
External filter cap used  
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24  
FAULT DETECTION METHODS  
Figure 7 which shows a bridge sensor connected through  
some cabling to a supply and the LMP8358. The fault detec-  
tion methods are described below.  
Using the Multiplexer, Polarity, and Current features the end  
user can detect faults in the system between the sensor and  
the LMP8358. These examples will use the set up shown in  
300454b5  
FIGURE 7. Bridge Connected to the LMP8358 With No Problems  
Common Mode Out of Range  
mode voltage at the input pins, use the 1/50 feature by setting  
MUX[1:0] to 10b to test the +IN pin or to 11b to test the −IN  
pin, POL to 0b, and G[2:0] to 010b for a gain of 50 (0082x or  
00C2x). This will give an overall gain of 1 and the output will  
read 4V for either MUX setting.  
Figure 8 shows an example of a degraded connection be-  
tween the bottom of the bridge and ground. This fault is shown  
by the 1.5 kresistor placed between the bridge and ground.  
This will raise the common mode at the inputs of the LMP8358  
to 4V, which is out of the CMVR. To determine the common  
300454b6  
FIGURE 8. Degraded Connection Between the Bottom of the Bridge and Ground  
25  
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Open Input  
of 50, and inject 100µA current by setting CUR[2:0] = 101b  
(5082x or 58C2x). Since the input is open the input pin will be  
pulled to V+. With an overall gain of 1 the output will read 5V  
for open input.  
Figure 9 shows an example of an open input fault. To sense  
this type of fault use the 1/50 feature by setting MUX[1:0] to  
10b to test the +IN pin or to 11b to test the −IN pin, POL to  
0b, PIN to 1b to test the −IN pin, and G[2:0] to 010b for a gain  
300454b7  
FIGURE 9. Open Input  
Input Shorted to V+ or V−  
POL to 0b, and G[2:0] to 010b for a gain of 50 (0082x or  
00C2x). This will give an overall gain of 1 and the output will  
read either V+ or V− depending on whether the input pin is  
shorted to V+ or V−.  
Figure 10 shows an example of an input pin shorted to V+ or  
V−. To sense this fault, use the 1/50 feature by setting MUX  
[1:0] to 10b to test the +IN pin or to 11b to test the −IN pin,  
300454b8  
FIGURE 10. Input Shorted to V+ or V−  
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26  
Shorted Inputs  
cause of the voltage drop across the internal ESD resistor,  
which has a value between 60to 90. If the gain is set to  
100× with an injected current of 100µA the output will be about  
0.7V.  
Figure 11 shows the inputs of the LMP8358 shorted. To detect  
this fault set CUR[2:0] = 101b to inject a 100µA current and  
set the gain to 10× (5000x). The LMP8358 is set up with nor-  
mal differential inputs. The output will read about 0.07V be-  
300454b9  
FIGURE 11. Shorted Inputs  
Degraded Input Line  
to 010b for a gain of 50. This will give an overall gain of 1. Set  
CUR[2:0] = 101b to inject a 100µA current and read the output  
voltage (5082x). Next set MUX[1:0] to 11b and PIN to 1b to  
test the −IN pin as shown in Figure 13 and read the output  
(58C2x). If the voltages of these two measurements are dif-  
ferent a degraded input fault exists.  
Figure 12 shows an example of a degraded connection be-  
tween the bridge and the +IN pin of the LMP8358. This fault  
is shown by the 1 kresistor placed between the bridge and  
the LMP8358. To detect this fault use the 1/50 feature by set-  
ting MUX[1:0] to 10b to test the +IN pin, POL to 0b, and G[2:0]  
300454c0  
FIGURE 12. Degraded Input Line, Step 1  
300454c1  
FIGURE 13. Degraded Input Line, Step 2  
27  
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Fault Detection Example  
Matrix. If the circuit shown in Figure 7 is used the values  
shown in column 2 of Table 16. Fault Detection Matrix would  
show that the system is working correctly, the values in the  
columns under the Possible Faults heading would show that  
there is a potential problem and that operator attention is  
needed.  
Using the fault detection features of the LMP8358 an end  
product, such as a scale, can periodically test that no damage  
has occurred to the system. A routine can be written that  
could, for example, run on start up, that will step through the  
fault detection features shown above and compare the output  
voltage to a table like that shown in Table 16. Fault Detection  
Table 16. Fault Detection Matrix  
No Faults  
VOUT  
Possible Faults  
LMP8358  
Register  
VOUT  
Possible Cause VOUT  
Possible Cause  
VOUT  
Possible Cause  
00 82x  
2.5V  
2.5V  
VOUT < CMVR or  
VOUT > CMVR  
Input is out of  
CMVR  
V+  
V+  
+IN shorted to V+ 0V  
−IN shorted to V+ 0V  
+IN shorted to  
GND  
00 C2x  
VOUT < CMVR or  
VOUT > CMVR  
Input is out of  
CMVR  
−IN shorted to  
GND  
50 00x  
50 03x  
50 82x  
0.61V  
4.97V  
2.55V  
V+  
+IN Open  
−IN  
0.07V  
0.7V  
Inputs shorted  
Inputs shorted  
V+  
2.65V*  
Degraded +IN  
line  
58 C2x  
50 82x  
58 C2x  
2.55V  
2.55V  
2.55V  
2.55V*  
2.55V*  
2.65V*  
Degraded +IN  
line  
Degraded −IN  
line  
Degraded −IN  
line  
* The values shown for a degraded input line will vary de-  
pending on the resistance in the line. This table uses the value  
in Figure 12 and Figure 13, 1kΩ.  
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28  
START UP AND POWER ON RESET  
ration with the LMP7701 output connected to REFF, the  
negative input of the op amp connected to REFS, and the  
desired reference voltage connected to the positive input of  
the op amp as shown in Figure 14.  
During power on, 50µs after V+ − V> 1V the LMP8358 resets  
the internal register to 0000x. If the digital supplies and inputs  
are undefined after the Power On Reset transients could oc-  
cur which can cause erroneous data to be written over the  
default values in the register. The following should be done to  
prevent this from happening:  
DIFFERENTIAL BRIDGE SENSOR  
Non-amplified differential bridge sensors, which are used in  
a variety of applications, typically have a very small differential  
output signal. This small signal needs to be accurately am-  
plified before it can be used by an ADC.  
• Bring all supplies up at the same time. All power supplies,  
analog and digital, should be brought up together within 40µs  
so that the supplies are not undefined after the Power On  
Reset at 50µs. This is easiest done by tying the VHSER/VL-  
PAR and VLSER/VHPAR pins to the analog supplies. —  
Parallel Mode  
The high DC performance of the LMP8358 makes it a good  
choice for use with a differential bridge sensor. This perfor-  
mance includes low input offset voltage, low input offset volt-  
age drift, and high CMRR. The on chip EMI rejection filters  
available on the LMP8358 help remove the EMI interference  
introduced to the signal as shown in Figure 14 and improves  
the overall system performance.  
• Immediately after power on, write to the register the value  
needed for the application. (This is always recommended.) —  
Serial Mode  
LAYOUT  
The circuit in Figure 14 shows a signal path solution for a typ-  
ical bridge sensor using the LMP8358. The typical output  
voltage of a resistive load cell is 2mV/V. If the bridge sensor  
is using a 5V supply the maximum output voltage will be 2mV/  
V × 5V = 10mV. The bridge voltage in this example is the  
same as the LMP8358 and ADC161S626 supply voltage of  
+5V. This 10mV signal must be accurately amplified by the  
LMP8358 to best match the dynamic range of the ADC. This  
is done by setting the gain of the LMP8358 to 200 which will  
give an output from the LMP8358 of 2V. To use the complete  
range of the ADC161S626 the VREF of the ADC should be set  
to half of the input or 1V. This is done by the resistor divider  
on the VREF pin of the ADC161S626. The negative input of  
the ADC and the REFF and REFS pins of the LMP8358 can  
be set to +2.5V to set the signal at the center of the supply. A  
resistor divider supplies +2.5V to the positive input of an  
LMP7701 set up in a buffer configuration. The LMP7701 acts  
as a low impedance source for the REFF pin. The VIOand  
VHSER/VLPAR pins should all be set to the same voltage as  
the microcontroller, +3.3V in this example. The VLSER/VH-  
PAR pin should be connected to ground. The resistor and  
capacitor between the LMP8358 and the ADC161S626 serve  
a dual purpose. The capacitor is a charge reservoir for the  
sampling capacitor of the ADC. The resistor provides isolation  
for the LMP8358 from the capacitive load. The values listed  
in the ADC161S626 datasheet are 180for the resistor and  
the 470pF for the capacitor. These two components also form  
a low pass filter of about 1.9MHz. If a filter is needed to at-  
tenuate disturbance from the internal auto−zeroing at 12kHz  
and the ping−pong frequency at 50kHz of the LMP8358 these  
values could be changed to 7870and 0.01µF which will  
make a filter with a corner of about 2kHz.  
The LMP8358 is a precision device that contains both analog  
and digital sections as shown in the Block Diagram. The PCB  
should be carefully designed to minimize the interaction be-  
tween the analog and digital sections and to maximize the  
performance of the part. This should include the following:  
0.1µF ceramic capacitors should be placed as close as pos-  
sible to each supply pin. If a digital supply pin is tied to an  
analog pin only one 0.1µF capacitor is needed for both pins.  
A larger 1µF or 10µF capacitor should be located near the part  
for each supply.  
Digital and analog traces should be kept away from each oth-  
er. Analog and digital traces should not run next to each other,  
if they do the digital signal can couple onto the analog line.  
The LMP8358 pinout is set up to simplify layout by not having  
analog, power, and digital pins mixed together. Pins 1 — 6  
are the analog signals, pins 7 — 10 are the power pins, and  
pins 11 — 14 are the digital signals.  
Be aware of the signal and power return paths. The return  
paths of the analog, digital, and power sections should not  
cross each other and the return path should be underneath  
the respective signal or power path. The best PCB layout is if  
the bottom plane of the PCB is a solid plane.  
The REFF and REFS pins are connected to the bottom side  
of the gain resistors of the LMP8358 as shown in the Block  
Diagram. Any impedance on these pins will change the spec-  
ified gain. If the REFF and REFS pins are to be connected to  
ground they should be tied directly to the ground plane and  
not through thin traces that can add impedance. If the REFF  
and REFS pins are to be connected to a voltage, the voltage  
source must be low impedance. This can be done by adding  
an op amp, such as the LMP7701, set up in a buffer configu-  
29  
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30  
Physical Dimensions inches (millimeters) unless otherwise noted  
14-Pin SOIC  
NS Package Number M14A  
14–Pin TSSOP  
NS Package Number M14MT  
31  
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