BUK9830-30 [NXP]

TrenchMOS transistor Logic level FET; 的TrenchMOS晶体管逻辑电平场效应管
BUK9830-30
型号: BUK9830-30
厂家: NXP    NXP
描述:

TrenchMOS transistor Logic level FET
的TrenchMOS晶体管逻辑电平场效应管

晶体 晶体管 功率场效应晶体管 开关 脉冲 光电二极管
文件: 总10页 (文件大小:59K)
中文:  中文翻译
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Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
GENERAL DESCRIPTION  
QUICK REFERENCE DATA  
N-channel enhancement mode logic  
level field-effect power transistor in a  
plastic envelope suitable for surface  
SYMBOL  
PARAMETER  
MAX.  
UNIT  
VDS  
ID  
Drain-source voltage  
30  
12.8  
5.9  
8.3  
150  
30  
V
A
A
W
˚C  
m  
mounting.  
Using  
trench’  
Drain current (DC) Tsp = 25 ˚C  
Drain current (DC) Tamb = 25 ˚C  
Total power dissipation  
Junction temperature  
Drain-source on-state  
resistance  
technology, the device features very  
low on-state resistance and has  
integral zener diodes giving ESD  
protection up to 2kV. It is intended for  
use in automotive and general  
purpose switching applications.  
Ptot  
Tj  
RDS(ON)  
VGS = 5 V  
PINNING - SOT223  
PIN CONFIGURATION  
SYMBOL  
PIN  
1
DESCRIPTION  
d
4
gate  
2
drain  
g
3
source  
4
drain (tab)  
s
2
3
1
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VDS  
VDGR  
±VGS  
ID  
Drain-source voltage  
-
-
-
-
-
-
-
-
-
30  
30  
10  
12.8  
5.9  
9
4.1  
51  
23.6  
8.3  
1.8  
150  
V
V
V
A
A
A
A
A
A
Drain-gate voltage  
Gate-source voltage  
Drain current (DC)  
RGS = 20 kΩ  
-
Tsp = 25 ˚C  
Tamb = 25 ˚C  
Tsp = 100 ˚C  
Tamb = 100 ˚C  
Tsp = 25 ˚C  
Tamb = 25 ˚C  
Tsp = 25 ˚C  
Tamb = 25 ˚C  
-
ID  
Drain current (DC)  
IDM  
Drain current (pulse peak value)  
Total power dissipation  
-
-
-
Ptot  
W
W
˚C  
Tstg, Tj  
Storage & operating temperature  
- 55  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
TYP.  
MAX.  
UNIT  
Rth j-sp  
Thermal resistance junction to  
solder point  
Mounted on any PCB  
12  
15  
K/W  
Rth j-amb  
Thermal resistance junction to  
ambient  
Mounted on PCB of Fig.19  
-
70  
K/W  
December 1997  
1
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
ESD LIMITING VALUE  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VC  
Electrostatic discharge capacitor  
voltage, all pins  
Human body model  
(100 pF, 1.5 k)  
-
2
kV  
STATIC CHARACTERISTICS  
Tj= 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
V(BR)DSS  
Drain-source breakdown  
voltage  
Gate threshold voltage  
VGS = 0 V; ID = 0.25 mA;  
30  
27  
1
0.5  
-
-
-
-
-
-
-
-
2
V
V
V
V
Tj = -55˚C  
-
1.5  
-
VGS(TO)  
VDS = VGS; ID = 1 mA  
Tj = 150˚C  
Tj = -55˚C  
-
-
2.3  
10  
500  
1
10  
-
IDSS  
Zero gate voltage drain current VDS = 30 V; VGS = 0 V;  
0.05  
-
0.02  
µA  
µA  
µA  
µA  
V
Tj = 150˚C  
Tj = 150˚C  
IGSS  
Gate source leakage current  
VGS = ±5 V; VDS = 0 V  
IG = ±1 mA;  
±V(BR)GSS  
RDS(ON)  
Gate-source breakdown  
voltage  
Drain-source on-state  
resistance  
10  
-
VGS = 5 V; ID = 3.2 A  
-
-
24  
-
30  
51  
mΩ  
mΩ  
Tj = 150˚C  
DYNAMIC CHARACTERISTICS  
Tsp = 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
gfs  
Forward transconductance  
VDS = 25 V; ID = 5.9 A  
7
14  
-
S
Qg(tot)  
Qgs  
Qgd  
Total gate charge  
Gate-source charge  
Gate-drain (Miller) charge  
ID = 5.9 A; VDD = 24 V; VGS = 5 V  
VGS = 0 V; VDS = 25 V; f = 1 MHz  
-
-
-
24  
3
11  
-
-
-
nC  
nC  
nC  
Ciss  
Coss  
Crss  
Input capacitance  
Output capacitance  
Feedback capacitance  
-
-
-
1050  
270  
140  
-
-
-
pF  
pF  
pF  
td on  
tr  
td off  
tf  
Turn-on delay time  
Turn-on rise time  
Turn-off delay time  
Turn-off fall time  
VDD = 15 V; ID = 5.9 A;  
VGS = 5 V; RG = 5 Ω  
Resistive load  
-
-
-
-
30  
80  
95  
40  
45  
130  
135  
55  
ns  
ns  
ns  
ns  
Ld  
Ld  
Ls  
Internal drain inductance  
Internal drain inductance  
Internal source inductance  
Measured from contact screw on  
tab to centre of die  
Measured from drain lead 6 mm  
from package to centre of die  
Measured from source lead 6 mm  
from package to source bond pad  
-
-
-
3.5  
4.5  
7.5  
-
-
-
nH  
nH  
nH  
December 1997  
2
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS  
Tj = 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IDR  
Continuous reverse drain  
current  
-
-
40  
A
IDRM  
VSD  
Pulsed reverse drain current  
Diode forward voltage  
-
-
-
-
160  
1.2  
-
A
V
IF = 3.2 A; VGS = 0 V  
IF = 5.9 A; VGS = 0 V  
0.75  
0.85  
trr  
Qrr  
Reverse recovery time  
Reverse recovery charge  
IF = 5.9 A; -dIF/dt = 100 A/µs;  
VGS = -10 V; VR = 25 V  
-
-
100  
0.4  
-
-
ns  
µC  
AVALANCHE LIMITING VALUE  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
WDSS  
Drain-source non-repetitive  
unclamped inductive turn-off  
energy  
ID = 5.9 A; VDD 25 V;  
-
-
60  
mJ  
VGS = 10 V; RGS = 50 ; Tsp = 25 ˚C  
December 1997  
3
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
Normalised Power Derating  
PD%  
Zth j-amb / (K/W)  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
1E+02  
1E+01  
1E+00  
1E-01  
1E-02  
D =  
0.5  
0.2  
0.1  
0.05  
0.02  
tp  
tp  
P
D =  
D
T
t
T
0
0
20  
40  
60  
80  
Tmb /  
100  
120  
140  
1E-07  
1E-05  
1E-03  
1E-01  
1E+01  
1E+03  
C
t / s  
Fig.1. Normalised power dissipation.  
PD% = 100 PD/PD 25 ˚C = f(Tmb)  
Fig.4. Transient thermal impedance.  
Zth j-mb = f(t); parameter D = tp/T  
Normalised Current Derating  
ID%  
ID / A  
4.5  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
60  
50  
40  
30  
20  
10  
0
10  
5
6
4
VGS / V =  
3.5  
3
2.5  
0
20  
40  
60  
80  
Tmb /  
100  
120  
140  
0
2
4
6
8
10  
VDS / V  
C
Fig.2. Normalised continuous drain current.  
ID% = 100 ID/ID 25 ˚C = f(Tmb); conditions: VGS 5 V  
Fig.5. Typical output characteristics, Tj = 25 ˚C.  
ID = f(VDS); parameter VGS  
ID / A  
RDS(ON) / mOhm  
4
100  
60  
50  
40  
30  
20  
10  
0
3
3.5  
10  
tp = 10 us  
4.5  
100 us  
5
1
1 ms  
DC  
10  
10 ms  
6
0.1  
100 ms  
VGS / V =  
40  
0.01  
0.1  
1
10  
VDS / V  
100  
1000  
0
10  
20  
30  
ID / A  
50  
60  
Fig.3. Safe operating area. Tmb = 25 ˚C  
ID & IDM = f(VDS); IDM single pulse; parameter tp  
Fig.6. Typical on-state resistance, Tj = 25 ˚C.  
RDS(ON) = f(ID); parameter VGS  
December 1997  
4
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
VGS(TO) / V  
max.  
ID / A  
60  
2.5  
2
50  
Tj / C = 25  
typ.  
40  
30  
20  
10  
0
1.5  
1
150  
min.  
0.5  
0
0
1
2
3
4
5
6
-100  
-50  
0
50  
Tj / C  
100  
150  
200  
VGS / V  
Fig.7. Typical transfer characteristics.  
ID = f(VGS) ; conditions: VDS = 25 V; parameter Tj  
Fig.10. Gate threshold voltage.  
GS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS  
V
Sub-Threshold Conduction  
gfs / S  
1E-01  
1E-02  
1E-03  
1E-04  
1E-05  
1E-05  
20  
10  
0
Tj / C = 25  
150  
2%  
typ  
98%  
0
10  
20  
30  
ID / A  
40  
50  
60  
0
0.5  
1
1.5  
2
2.5  
3
Fig.8. Typical transconductance, Tj = 25 ˚C.  
gfs = f(ID); conditions: VDS = 25 V  
Fig.11. Sub-threshold drain current.  
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS  
C / pF  
a
Normalised RDS(ON) = f(Tj)  
2
1.5  
1
10000  
Ciss  
1000  
0.5  
Coss  
Crss  
0
100  
0.1  
-50  
0
50  
Tj / C  
100  
150  
1
10  
100  
VDS / V  
Fig.9. Normalised drain-source on-state resistance.  
a = RDS(ON)/RDS(ON)25 ˚C = f(Tj); ID = 3.2 A; VGS = 5 V  
Fig.12. Typical capacitances, Ciss, Coss, Crss.  
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz  
December 1997  
5
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
WDSS%  
VGS / V  
5
24  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
VDS / V = 6  
4
3
2
1
0
20  
40  
60  
80  
100  
120  
140  
0
5
10  
15  
20  
25  
QG / nC  
Tmb /  
C
Fig.13. Typical turn-on gate-charge characteristics.  
VGS = f(QG); conditions: ID = 5.9 A; parameter VDS  
Fig.15. Normalised avalanche energy rating.  
WDSS% = f(Tmb); conditions: ID = 5.9 A  
IF / A  
60  
50  
40  
30  
20  
10  
0
VDD  
+
L
VDS  
-
VGS  
-ID/100  
Tj / C = 150  
25  
T.U.T.  
0
R 01  
RGS  
shunt  
0
0.5  
1
1.5  
2
VSDS / V  
Fig.16. Avalanche energy test circuit.  
WDSS = 0.5 LID2 BVDSS/(BVDSS VDD  
Fig.14. Typical reverse diode current.  
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj  
)
VDD  
+
-
RD  
VDS  
VGS  
0
RG  
T.U.T.  
Fig.17. Switching test circuit.  
December 1997  
6
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
MOUNTING INSTRUCTIONS  
Dimensions in mm.  
3.8  
min  
1.5  
min  
2.3  
6.3  
1.5  
min  
(3x)  
1.5  
min  
4.6  
Fig.18. soldering pattern for surface mounting SOT223.  
PRINTED CIRCUIT BOARD  
December 1997  
7
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
Dimensions in mm.  
36  
18  
60  
4.5  
4.6  
9
10  
7
15  
50  
Fig.19. PCB for thermal resistance and power rating for SOT223.  
PCB: FR4 epoxy glass (1.6 mm thick), copper laminate (35 µm thick).  
December 1997  
8
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
MECHANICAL DATA  
Dimensions in mm  
Net Mass: 0.11 g  
6.7  
6.3  
B
3.1  
2.9  
0.32  
0.24  
0.2  
M
A
A
4
0.10  
0.02  
7.3  
6.7  
3.7  
3.3  
16  
max  
13  
2
3
1
10  
max  
1.05  
0.85  
0.80  
0.60  
2.3  
1.8  
max  
M
0.1  
(4x)  
B
4.6  
Fig.20. SOT223 surface mounting package.  
Notes  
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent  
damage to MOS gate oxide.  
2. Refer to surface mounting instructions for SOT223 envelope.  
3. Epoxy meets UL94 V0 at 1/8".  
December 1997  
9
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Logic level FET  
BUK9830-30  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 1997  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
December 1997  
10  
Rev 1.100  

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