BUK9E3R2-40B,127 [NXP]

N-channel TrenchMOS logic level FET TO-262 3-Pin;
BUK9E3R2-40B,127
型号: BUK9E3R2-40B,127
厂家: NXP    NXP
描述:

N-channel TrenchMOS logic level FET TO-262 3-Pin

开关 脉冲 晶体管
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中文:  中文翻译
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K
A
P
2
I
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
13 March 2014  
Product data sheet  
1. General description  
Logic level N-channel enhancement mode Field-Effect Transistor (FET) in a plastic  
package using TrenchMOS technology. This product has been designed and qualified to  
the appropriate AEC standard for use in automotive critical applications.  
2. Features and benefits  
AEC Q101 compliant  
Low conduction losses due to low on-state resistance  
Suitable for logic level gate drive sources  
Suitable for thermally demanding environments due to 175 °C rating  
3. Applications  
12 V loads  
Automotive systems  
General purpose power switching  
Motors, lamps and solenoids  
4. Quick reference data  
Table 1.  
Symbol  
Quick reference data  
Parameter  
Conditions  
Min  
Typ  
Max  
40  
Unit  
V
VDS  
ID  
drain-source voltage  
drain current  
Tj ≥ 25 °C; Tj ≤ 175 °C  
VGS = 5 V; Tmb = 25 °C; Fig. 3; Fig. 2  
-
-
-
-
-
-
[1]  
100  
300  
A
Ptot  
total power dissipation Tmb = 25 °C; Fig. 1  
W
Static characteristics  
RDSon drain-source on-state  
resistance  
VGS = 10 V; ID = 25 A; Tj = 25 °C  
-
-
2.4  
2.7  
2.8  
3.2  
mΩ  
mΩ  
VGS = 5 V; ID = 25 A; Tj = 25 °C;  
Fig. 11; Fig. 12  
Dynamic characteristics  
QGD gate-drain charge  
VGS = 5 V; ID = 25 A; VDS = 32 V;  
Tj = 25 °C; Fig. 13  
-
37  
-
nC  
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NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
Symbol  
Avalanche ruugedness  
EDS(AL)S non-repetitive drain-  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
ID = 100 A; Vsup ≤ 40 V; RGS = 50 Ω;  
VGS = 5 V; Tj(init) = 25 °C; unclamped  
-
-
1.2  
J
source avalanche  
energy  
[1] All individual parts of device must be ≤ 175 °C to achieve maximum current rating.  
5. Pinning information  
Table 2.  
Pin  
Pinning information  
Symbol Description  
Simplified outline  
Graphic symbol  
mb  
D
S
1
G
D
S
D
gate  
2
drain  
source  
G
3
mbb076  
mb  
mounting base; connected to  
drain  
1
2 3  
I2PAK (SOT226)  
6. Ordering information  
Table 3.  
Ordering information  
Type number  
Package  
Name  
Description  
Version  
BUK9E3R2-40B  
I2PAK  
plastic single-ended package (I2PAK); TO-262  
SOT226  
7. Marking  
Table 4.  
Marking codes  
Type number  
Marking code  
BUK9E3R2-40B  
BUK9E3R2-40B  
8. Limiting values  
Table 5.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDS  
Parameter  
Conditions  
Min  
Max  
40  
Unit  
drain-source voltage  
drain-gate voltage  
Tj ≥ 25 °C; Tj ≤ 175 °C  
RGS = 20 kΩ  
-
-
V
V
VDGR  
40  
BUK9E3R2-40B  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
2 / 13  
 
 
 
 
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
Symbol  
VGS  
Ptot  
Parameter  
Conditions  
Min  
Max  
15  
Unit  
V
gate-source voltage  
total power dissipation  
drain current  
-15  
Tmb = 25 °C; Fig. 1  
-
300  
222  
100  
100  
888  
175  
175  
W
A
ID  
Tmb = 25 °C; VGS = 5 V; Fig. 2; Fig. 3  
Tmb = 100 °C; VGS = 5 V; Fig. 2  
Tmb = 25 °C; VGS = 5 V; Fig. 3; Fig. 2  
Tmb = 25 °C; pulsed; tp ≤ 10 µs; Fig. 3  
[1]  
[2]  
[2]  
-
-
A
-
A
IDM  
Tstg  
Tj  
peak drain current  
storage temperature  
junction temperature  
-
A
-55  
-55  
°C  
°C  
Source-drain diode  
IS  
source current  
Tmb = 25 °C  
[1]  
[2]  
-
-
-
222  
100  
888  
A
A
A
ISM  
peak source current  
pulsed; tp ≤ 10 µs; Tmb = 25 °C  
Avalanche ruugedness  
EDS(AL)S non-repetitive drain-source  
avalanche energy  
ID = 100 A; Vsup ≤ 40 V; RGS = 50 Ω;  
VGS = 5 V; Tj(init) = 25 °C; unclamped  
-
1.2  
J
[1] Current is limited by power dissipation chip rating.  
[2] All individual parts of device must be ≤ 175 °C to achieve maximum current rating.  
03na19  
03nh38  
120  
250  
I
D
(A)  
P
der  
(%)  
200  
80  
150  
100  
50  
40  
Capped at 100 A due to package  
0
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T
(°C)  
T
(°C)  
mb  
mb  
Fig. 1. Normalized total power dissipation as a  
function of mounting base temperature  
Fig. 2. Continuous drain current as a function of  
mounting base temperature  
BUK9E3R2-40B  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
3 / 13  
 
 
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
03nh36  
4
10  
I
D
(A)  
3
10  
Limit R  
= V / I  
DS D  
DSon  
t
p
= 10 µs  
100 µs  
1 ms  
2
10  
Capped at 100 A due to package  
DC  
10 ms  
10  
1
100 ms  
- 1  
2
10  
1
10  
10  
V
(V)  
DS  
Fig. 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage  
9. Thermal characteristics  
Table 6.  
Symbol  
Thermal characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Rth(j-mb)  
thermal resistance  
from junction to  
mounting base  
Fig. 4  
-
-
0.5  
K/W  
Rth(j-a)  
thermal resistance  
from junction to  
ambient  
vertical in still air  
-
60  
-
K/W  
03nh37  
1
Z
th(j-mb)  
δ = 0.5  
0.2  
(K/W)  
- 1  
10  
10  
10  
0.1  
0.05  
0.02  
t
p
P
- 2  
δ =  
T
t
single shot  
- 6  
t
p
T
- 3  
- 5  
- 4  
- 3  
- 2  
- 1  
10  
10  
10  
10  
10  
10  
1
t
(s)  
p
Fig. 4. Transient thermal impedance from junction to mounting base as a function of pulse duration  
BUK9E3R2-40B  
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© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
4 / 13  
 
 
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
10. Characteristics  
Table 7.  
Symbol  
Characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Static characteristics  
V(BR)DSS drain-source  
breakdown voltage  
ID = 0.25 mA; VGS = 0 V; Tj = -55 °C  
ID = 0.25 mA; VGS = 0 V; Tj = 25 °C  
36  
40  
1.1  
-
-
V
V
V
-
-
VGS(th)  
gate-source threshold ID = 1 mA; VDS = VGS; Tj = 25 °C;  
1.5  
2
voltage  
Fig. 10  
ID = 1 mA; VDS = VGS; Tj = 175 °C;  
Fig. 10  
0.5  
-
-
-
-
V
V
ID = 1 mA; VDS = VGS; Tj = -55 °C;  
Fig. 10  
2.3  
IDSS  
drain leakage current  
gate leakage current  
VDS = 40 V; VGS = 0 V; Tj = 25 °C  
VDS = 40 V; VGS = 0 V; Tj = 175 °C  
VGS = 15 V; VDS = 0 V; Tj = 25 °C  
VGS = -15 V; VDS = 0 V; Tj = 25 °C  
VGS = 10 V; ID = 25 A; Tj = 25 °C  
VGS = 4.5 V; ID = 25 A; Tj = 25 °C  
-
-
-
-
-
-
-
0.02  
1
µA  
-
500  
100  
100  
2.8  
3.5  
6
µA  
IGSS  
2
2
2.4  
-
nA  
nA  
RDSon  
drain-source on-state  
resistance  
mΩ  
mΩ  
mΩ  
VGS = 5 V; ID = 25 A; Tj = 175 °C;  
Fig. 11; Fig. 12  
-
VGS = 5 V; ID = 25 A; Tj = 25 °C;  
Fig. 11; Fig. 12  
-
2.7  
3.2  
mΩ  
Dynamic characteristics  
QG(tot)  
QGS  
QGD  
Ciss  
total gate charge  
ID = 25 A; VDS = 32 V; VGS = 5 V;  
Tj = 25 °C; Fig. 13  
-
-
-
-
-
-
94  
17  
37  
-
-
-
nC  
nC  
nC  
gate-source charge  
gate-drain charge  
input capacitance  
output capacitance  
VGS = 0 V; VDS = 25 V; f = 1 MHz;  
Tj = 25 °C; Fig. 14  
7877 10502 pF  
1397 1676 pF  
Coss  
Crss  
reverse transfer  
capacitance  
608  
833  
pF  
td(on)  
tr  
td(off)  
tf  
turn-on delay time  
rise time  
VDS = 30 V; RL = 1.2 Ω; VGS = 5 V;  
RG(ext) = 10 Ω; Tj = 25 °C  
-
-
-
-
-
68  
-
-
-
-
-
ns  
ns  
ns  
ns  
nH  
268  
257  
192  
4.5  
turn-off delay time  
fall time  
LD  
internal drain  
inductance  
from drain lead 6 mm from package to  
center of die; Tj = 25 °C  
BUK9E3R2-40B  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
5 / 13  
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
from upper edge of drain mounting  
base to center of die; Tj = 25 °C  
-
2.5  
-
nH  
LS  
internal source  
inductance  
from source lead to source bond pad;  
Tj = 25 °C  
-
7.5  
-
nH  
Source-drain diode  
VSD source-drain voltage  
trr  
IS = 40 A; VGS = 0 V; Tj = 25 °C; Fig. 15  
-
-
-
0.85  
70  
1.2  
V
reverse recovery time IS = 20 A; dIS/dt = -100 A/µs;  
-
-
ns  
nC  
VGS = -10 V; VDS = 20 V; Tj = 25 °C  
Qr  
recovered charge  
127  
03nh55  
03nh56  
350  
5
10  
5
4
Label is V (V)  
GS  
I
D
(A)  
3.8  
R
DSon  
(mΩ)  
280  
3.6  
3.4  
4
3
2
210  
140  
70  
3.2  
3
2.8  
2.6  
2.4  
2.2  
0
3
7
11  
15  
0
2
4
6
8
10  
V
(V)  
V
DS  
(V)  
GS  
Fig. 5. Output characteristics: drain current as a  
function of drain-source voltage; typical values  
Fig. 6. Drain-source on-state resistance as a function  
of gate-source voltage; typical values  
BUK9E3R2-40B  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
6 / 13  
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
03ng53  
03nh53  
- 1  
10  
200  
fs  
I
D
g
(A)  
(S)  
- 2  
- 3  
- 4  
- 5  
- 6  
10  
150  
min  
typ  
max  
10  
10  
10  
10  
100  
50  
0
0
20  
40  
60  
0
1
2
3
I
(A)  
V
(V)  
D
GS  
Fig. 7. Sub-threshold drain current as a function of  
gate-source voltage  
Fig. 8. Forward transconductance as a function of  
drain current; typical values  
03ng52  
03nh54  
100  
2.5  
V
GS(th)  
(V)  
I
D
(A)  
2.0  
1.5  
1.0  
0.5  
0
max  
75  
50  
25  
0
typ  
min  
T = 175 °C  
j
T = 25 °C  
j
0
1
2
3
- 60  
0
60  
120  
180  
V
(V)  
T (°C)  
j
GS  
Fig. 9. Transfer characteristics: drain current as a  
function of gate-source voltage; typical values  
Fig. 10. Gate-source threshold voltage as a function of  
junction temperature  
BUK9E3R2-40B  
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© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
7 / 13  
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
03nh57  
03aa27  
8
2
2.8  
3
Label is V (V)  
GS  
a
R
DSon  
(mΩ)  
3.2  
1.5  
3.4  
6
4
2
3.6  
1
3.8  
4
5
0.5  
0
10  
0
70  
140  
210  
280  
350  
- 60  
0
60  
120  
180  
T ( C)  
°
j
I
(A)  
D
Fig. 11. Drain-source on-state resistance as a function  
of drain current; typical values  
Fig. 12. Normalized drain-source on-state resistance  
factor as a function of junction temperature  
03nh58  
03nh52  
12000  
5
V
GS  
(V)  
C
C
iss  
C
(pF)  
4
3
2
1
0
V
= 14 V  
DD  
8000  
4000  
0
V
= 32 V  
DD  
oss  
C
rss  
- 1  
10  
2
0
25  
50  
75  
100  
1
10  
10  
V
(V)  
Q
G
(nC)  
DS  
Fig. 14. Input, output and reverse transfer capacitances  
as a function of drain-source voltage; typical  
values  
Fig. 13. Gate-source voltage as a function of gate  
charge; typical values  
BUK9E3R2-40B  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
8 / 13  
 
 
 
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
03nh51  
100  
I
S
(A)  
75  
50  
25  
0
T = 175 °C  
j
T = 25 °C  
j
0.0  
0.2  
0.4  
0.6  
0.8  
V
1.0  
(V)  
SD  
Fig. 15. Source current as a function of source-drain voltage; typical values  
BUK9E3R2-40B  
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© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
9 / 13  
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
11. Package outline  
Plastic single-ended package (I2PAK); low-profile 3-lead TO-262  
SOT226  
A
A
E
1
D
1
mounting  
base  
D
L
1
Q
b
1
L
1
e
2
3
b
c
e
0
5
10 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
D
max  
D
1
c
A
1
E
UNIT  
A
b
b
1
e
L
L
Q
1
4.5  
4.1  
1.40  
1.27  
0.85  
0.60  
1.3  
1.0  
0.7  
0.4  
1.6  
1.2  
10.3  
9.7  
15.0  
13.5  
3.30  
2.79  
2.6  
2.2  
mm  
11  
2.54  
REFERENCES  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
JEDEC  
JEITA  
06-02-14  
09-08-25  
SOT226  
TO-262  
Fig. 16. Package outline I2PAK (SOT226)  
BUK9E3R2-40B  
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© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
10 / 13  
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
In no event shall NXP Semiconductors be liable for any indirect, incidental,  
punitive, special or consequential damages (including - without limitation -  
lost profits, lost savings, business interruption, costs related to the removal  
or replacement of any products or rework charges) whether or not such  
damages are based on tort (including negligence), warranty, breach of  
contract or any other legal theory.  
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Notwithstanding any damages that customer might incur for any reason  
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards  
customer for the products described herein shall be limited in accordance  
with the Terms and conditions of commercial sale of NXP Semiconductors.  
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Product  
Definition  
status [1][2] status [3]  
Objective  
[short] data  
sheet  
Development This document contains data from  
the objective specification for product  
development.  
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limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
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Preliminary  
[short] data  
sheet  
Qualification This document contains data from the  
preliminary specification.  
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[short] data  
sheet  
Production  
This document contains the product  
specification.  
[1] Please consult the most recently issued document before initiating or  
completing a design.  
[2] The term 'short data sheet' is explained in section "Definitions".  
[3] The product status of device(s) described in this document may have  
changed since this document was published and may differ in case of  
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Quick reference data — The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
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Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) will cause permanent  
damage to the device. Limiting values are stress ratings only and (proper)  
operation of the device at these or any other conditions above those  
given in the Recommended operating conditions section (if present) or the  
Characteristics sections of this document is not warranted. Constant or  
repeated exposure to limiting values will permanently and irreversibly affect  
the quality and reliability of the device.  
12.3 Disclaimers  
Terms and conditions of commercial sale — NXP Semiconductors  
products are sold subject to the general terms and conditions of commercial  
sale, as published at http://www.nxp.com/profile/terms, unless otherwise  
agreed in a valid written individual agreement. In case an individual  
agreement is concluded only the terms and conditions of the respective  
agreement shall apply. NXP Semiconductors hereby expressly objects to  
applying the customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
Limited warranty and liability — Information in this document is believed  
to be accurate and reliable. However, NXP Semiconductors does not give  
any representations or warranties, expressed or implied, as to the accuracy  
or completeness of such information and shall have no liability for the  
consequences of use of such information. NXP Semiconductors takes no  
responsibility for the content in this document if provided by an information  
source outside of NXP Semiconductors.  
BUK9E3R2-40B  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
11 / 13  
 
 
 
 
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
No offer to sell or license — Nothing in this document may be interpreted  
or construed as an offer to sell products that is open for acceptance or the  
grant, conveyance or implication of any license under any copyrights, patents  
or other industrial or intellectual property rights.  
Export control — This document as well as the item(s) described herein  
may be subject to export control regulations. Export might require a prior  
authorization from competent authorities.  
Translations — A non-English (translated) version of a document is for  
reference only. The English version shall prevail in case of any discrepancy  
between the translated and English versions.  
12.4 Trademarks  
Notice: All referenced brands, product names, service names and  
trademarks are the property of their respective owners.  
Adelante, Bitport, Bitsound, CoolFlux, CoReUse, DESFire, EZ-HV,  
FabKey, GreenChip, HiPerSmart, HITAG, I²C-bus logo, ICODE, I-  
CODE, ITEC, Labelution, MIFARE, MIFARE Plus, MIFARE Ultralight,  
MoReUse, QLPAK, Silicon Tuner, SiliconMAX, SmartXA, STARplug,  
TOPFET, TrenchMOS, TriMedia and UCODE — are trademarks of NXP  
Semiconductors N.V.  
HD Radio and HD Radio logo — are trademarks of iBiquity Digital  
Corporation.  
BUK9E3R2-40B  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
12 / 13  
 
NXP Semiconductors  
BUK9E3R2-40B  
N-channel TrenchMOS logic level FET  
13. Contents  
1
General description ............................................... 1  
Features and benefits ............................................1  
Applications ........................................................... 1  
Quick reference data ............................................. 1  
Pinning information ...............................................2  
Ordering information .............................................2  
Marking ...................................................................2  
Limiting values .......................................................2  
Thermal characteristics .........................................4  
Characteristics .......................................................5  
Package outline ................................................... 10  
2
3
4
5
6
7
8
9
10  
11  
12  
Legal information .................................................11  
Data sheet status ............................................... 11  
Definitions ...........................................................11  
Disclaimers .........................................................11  
Trademarks ........................................................ 12  
12.1  
12.2  
12.3  
12.4  
© NXP Semiconductors N.V. 2014. All rights reserved  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 13 March 2014  
BUK9E3R2-40B  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.V. 2014. All rights reserved  
Product data sheet  
13 March 2014  
13 / 13  

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