BUK9E3R2-40B,127 [NXP]
N-channel TrenchMOS logic level FET TO-262 3-Pin;型号: | BUK9E3R2-40B,127 |
厂家: | NXP |
描述: | N-channel TrenchMOS logic level FET TO-262 3-Pin 开关 脉冲 晶体管 |
文件: | 总13页 (文件大小:249K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
K
A
P
2
I
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
13 March 2014
Product data sheet
1. General description
Logic level N-channel enhancement mode Field-Effect Transistor (FET) in a plastic
package using TrenchMOS technology. This product has been designed and qualified to
the appropriate AEC standard for use in automotive critical applications.
2. Features and benefits
AEC Q101 compliant
Low conduction losses due to low on-state resistance
Suitable for logic level gate drive sources
•
•
•
•
Suitable for thermally demanding environments due to 175 °C rating
3. Applications
12 V loads
Automotive systems
General purpose power switching
Motors, lamps and solenoids
•
•
•
•
4. Quick reference data
Table 1.
Symbol
Quick reference data
Parameter
Conditions
Min
Typ
Max
40
Unit
V
VDS
ID
drain-source voltage
drain current
Tj ≥ 25 °C; Tj ≤ 175 °C
VGS = 5 V; Tmb = 25 °C; Fig. 3; Fig. 2
-
-
-
-
-
-
[1]
100
300
A
Ptot
total power dissipation Tmb = 25 °C; Fig. 1
W
Static characteristics
RDSon drain-source on-state
resistance
VGS = 10 V; ID = 25 A; Tj = 25 °C
-
-
2.4
2.7
2.8
3.2
mΩ
mΩ
VGS = 5 V; ID = 25 A; Tj = 25 °C;
Fig. 11; Fig. 12
Dynamic characteristics
QGD gate-drain charge
VGS = 5 V; ID = 25 A; VDS = 32 V;
Tj = 25 °C; Fig. 13
-
37
-
nC
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
Symbol
Avalanche ruugedness
EDS(AL)S non-repetitive drain-
Parameter
Conditions
Min
Typ
Max
Unit
ID = 100 A; Vsup ≤ 40 V; RGS = 50 Ω;
VGS = 5 V; Tj(init) = 25 °C; unclamped
-
-
1.2
J
source avalanche
energy
[1] All individual parts of device must be ≤ 175 °C to achieve maximum current rating.
5. Pinning information
Table 2.
Pin
Pinning information
Symbol Description
Simplified outline
Graphic symbol
mb
D
S
1
G
D
S
D
gate
2
drain
source
G
3
mbb076
mb
mounting base; connected to
drain
1
2 3
I2PAK (SOT226)
6. Ordering information
Table 3.
Ordering information
Type number
Package
Name
Description
Version
BUK9E3R2-40B
I2PAK
plastic single-ended package (I2PAK); TO-262
SOT226
7. Marking
Table 4.
Marking codes
Type number
Marking code
BUK9E3R2-40B
BUK9E3R2-40B
8. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
VDS
Parameter
Conditions
Min
Max
40
Unit
drain-source voltage
drain-gate voltage
Tj ≥ 25 °C; Tj ≤ 175 °C
RGS = 20 kΩ
-
-
V
V
VDGR
40
BUK9E3R2-40B
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Product data sheet
13 March 2014
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
Symbol
VGS
Ptot
Parameter
Conditions
Min
Max
15
Unit
V
gate-source voltage
total power dissipation
drain current
-15
Tmb = 25 °C; Fig. 1
-
300
222
100
100
888
175
175
W
A
ID
Tmb = 25 °C; VGS = 5 V; Fig. 2; Fig. 3
Tmb = 100 °C; VGS = 5 V; Fig. 2
Tmb = 25 °C; VGS = 5 V; Fig. 3; Fig. 2
Tmb = 25 °C; pulsed; tp ≤ 10 µs; Fig. 3
[1]
[2]
[2]
-
-
A
-
A
IDM
Tstg
Tj
peak drain current
storage temperature
junction temperature
-
A
-55
-55
°C
°C
Source-drain diode
IS
source current
Tmb = 25 °C
[1]
[2]
-
-
-
222
100
888
A
A
A
ISM
peak source current
pulsed; tp ≤ 10 µs; Tmb = 25 °C
Avalanche ruugedness
EDS(AL)S non-repetitive drain-source
avalanche energy
ID = 100 A; Vsup ≤ 40 V; RGS = 50 Ω;
VGS = 5 V; Tj(init) = 25 °C; unclamped
-
1.2
J
[1] Current is limited by power dissipation chip rating.
[2] All individual parts of device must be ≤ 175 °C to achieve maximum current rating.
03na19
03nh38
120
250
I
D
(A)
P
der
(%)
200
80
150
100
50
40
Capped at 100 A due to package
0
0
0
50
100
150
200
0
50
100
150
200
T
(°C)
T
(°C)
mb
mb
Fig. 1. Normalized total power dissipation as a
function of mounting base temperature
Fig. 2. Continuous drain current as a function of
mounting base temperature
BUK9E3R2-40B
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Product data sheet
13 March 2014
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
03nh36
4
10
I
D
(A)
3
10
Limit R
= V / I
DS D
DSon
t
p
= 10 µs
100 µs
1 ms
2
10
Capped at 100 A due to package
DC
10 ms
10
1
100 ms
- 1
2
10
1
10
10
V
(V)
DS
Fig. 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage
9. Thermal characteristics
Table 6.
Symbol
Thermal characteristics
Parameter
Conditions
Min
Typ
Max
Unit
Rth(j-mb)
thermal resistance
from junction to
mounting base
Fig. 4
-
-
0.5
K/W
Rth(j-a)
thermal resistance
from junction to
ambient
vertical in still air
-
60
-
K/W
03nh37
1
Z
th(j-mb)
δ = 0.5
0.2
(K/W)
- 1
10
10
10
0.1
0.05
0.02
t
p
P
- 2
δ =
T
t
single shot
- 6
t
p
T
- 3
- 5
- 4
- 3
- 2
- 1
10
10
10
10
10
10
1
t
(s)
p
Fig. 4. Transient thermal impedance from junction to mounting base as a function of pulse duration
BUK9E3R2-40B
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Product data sheet
13 March 2014
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
10. Characteristics
Table 7.
Symbol
Characteristics
Parameter
Conditions
Min
Typ
Max
Unit
Static characteristics
V(BR)DSS drain-source
breakdown voltage
ID = 0.25 mA; VGS = 0 V; Tj = -55 °C
ID = 0.25 mA; VGS = 0 V; Tj = 25 °C
36
40
1.1
-
-
V
V
V
-
-
VGS(th)
gate-source threshold ID = 1 mA; VDS = VGS; Tj = 25 °C;
1.5
2
voltage
Fig. 10
ID = 1 mA; VDS = VGS; Tj = 175 °C;
Fig. 10
0.5
-
-
-
-
V
V
ID = 1 mA; VDS = VGS; Tj = -55 °C;
Fig. 10
2.3
IDSS
drain leakage current
gate leakage current
VDS = 40 V; VGS = 0 V; Tj = 25 °C
VDS = 40 V; VGS = 0 V; Tj = 175 °C
VGS = 15 V; VDS = 0 V; Tj = 25 °C
VGS = -15 V; VDS = 0 V; Tj = 25 °C
VGS = 10 V; ID = 25 A; Tj = 25 °C
VGS = 4.5 V; ID = 25 A; Tj = 25 °C
-
-
-
-
-
-
-
0.02
1
µA
-
500
100
100
2.8
3.5
6
µA
IGSS
2
2
2.4
-
nA
nA
RDSon
drain-source on-state
resistance
mΩ
mΩ
mΩ
VGS = 5 V; ID = 25 A; Tj = 175 °C;
Fig. 11; Fig. 12
-
VGS = 5 V; ID = 25 A; Tj = 25 °C;
Fig. 11; Fig. 12
-
2.7
3.2
mΩ
Dynamic characteristics
QG(tot)
QGS
QGD
Ciss
total gate charge
ID = 25 A; VDS = 32 V; VGS = 5 V;
Tj = 25 °C; Fig. 13
-
-
-
-
-
-
94
17
37
-
-
-
nC
nC
nC
gate-source charge
gate-drain charge
input capacitance
output capacitance
VGS = 0 V; VDS = 25 V; f = 1 MHz;
Tj = 25 °C; Fig. 14
7877 10502 pF
1397 1676 pF
Coss
Crss
reverse transfer
capacitance
608
833
pF
td(on)
tr
td(off)
tf
turn-on delay time
rise time
VDS = 30 V; RL = 1.2 Ω; VGS = 5 V;
RG(ext) = 10 Ω; Tj = 25 °C
-
-
-
-
-
68
-
-
-
-
-
ns
ns
ns
ns
nH
268
257
192
4.5
turn-off delay time
fall time
LD
internal drain
inductance
from drain lead 6 mm from package to
center of die; Tj = 25 °C
BUK9E3R2-40B
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Product data sheet
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
from upper edge of drain mounting
base to center of die; Tj = 25 °C
-
2.5
-
nH
LS
internal source
inductance
from source lead to source bond pad;
Tj = 25 °C
-
7.5
-
nH
Source-drain diode
VSD source-drain voltage
trr
IS = 40 A; VGS = 0 V; Tj = 25 °C; Fig. 15
-
-
-
0.85
70
1.2
V
reverse recovery time IS = 20 A; dIS/dt = -100 A/µs;
-
-
ns
nC
VGS = -10 V; VDS = 20 V; Tj = 25 °C
Qr
recovered charge
127
03nh55
03nh56
350
5
10
5
4
Label is V (V)
GS
I
D
(A)
3.8
R
DSon
(mΩ)
280
3.6
3.4
4
3
2
210
140
70
3.2
3
2.8
2.6
2.4
2.2
0
3
7
11
15
0
2
4
6
8
10
V
(V)
V
DS
(V)
GS
Fig. 5. Output characteristics: drain current as a
function of drain-source voltage; typical values
Fig. 6. Drain-source on-state resistance as a function
of gate-source voltage; typical values
BUK9E3R2-40B
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Product data sheet
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
03ng53
03nh53
- 1
10
200
fs
I
D
g
(A)
(S)
- 2
- 3
- 4
- 5
- 6
10
150
min
typ
max
10
10
10
10
100
50
0
0
20
40
60
0
1
2
3
I
(A)
V
(V)
D
GS
Fig. 7. Sub-threshold drain current as a function of
gate-source voltage
Fig. 8. Forward transconductance as a function of
drain current; typical values
03ng52
03nh54
100
2.5
V
GS(th)
(V)
I
D
(A)
2.0
1.5
1.0
0.5
0
max
75
50
25
0
typ
min
T = 175 °C
j
T = 25 °C
j
0
1
2
3
- 60
0
60
120
180
V
(V)
T (°C)
j
GS
Fig. 9. Transfer characteristics: drain current as a
function of gate-source voltage; typical values
Fig. 10. Gate-source threshold voltage as a function of
junction temperature
BUK9E3R2-40B
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Product data sheet
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BUK9E3R2-40B
N-channel TrenchMOS logic level FET
03nh57
03aa27
8
2
2.8
3
Label is V (V)
GS
a
R
DSon
(mΩ)
3.2
1.5
3.4
6
4
2
3.6
1
3.8
4
5
0.5
0
10
0
70
140
210
280
350
- 60
0
60
120
180
T ( C)
°
j
I
(A)
D
Fig. 11. Drain-source on-state resistance as a function
of drain current; typical values
Fig. 12. Normalized drain-source on-state resistance
factor as a function of junction temperature
03nh58
03nh52
12000
5
V
GS
(V)
C
C
iss
C
(pF)
4
3
2
1
0
V
= 14 V
DD
8000
4000
0
V
= 32 V
DD
oss
C
rss
- 1
10
2
0
25
50
75
100
1
10
10
V
(V)
Q
G
(nC)
DS
Fig. 14. Input, output and reverse transfer capacitances
as a function of drain-source voltage; typical
values
Fig. 13. Gate-source voltage as a function of gate
charge; typical values
BUK9E3R2-40B
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Product data sheet
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
03nh51
100
I
S
(A)
75
50
25
0
T = 175 °C
j
T = 25 °C
j
0.0
0.2
0.4
0.6
0.8
V
1.0
(V)
SD
Fig. 15. Source current as a function of source-drain voltage; typical values
BUK9E3R2-40B
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BUK9E3R2-40B
N-channel TrenchMOS logic level FET
11. Package outline
Plastic single-ended package (I2PAK); low-profile 3-lead TO-262
SOT226
A
A
E
1
D
1
mounting
base
D
L
1
Q
b
1
L
1
e
2
3
b
c
e
0
5
10 mm
scale
DIMENSIONS (mm are the original dimensions)
D
max
D
1
c
A
1
E
UNIT
A
b
b
1
e
L
L
Q
1
4.5
4.1
1.40
1.27
0.85
0.60
1.3
1.0
0.7
0.4
1.6
1.2
10.3
9.7
15.0
13.5
3.30
2.79
2.6
2.2
mm
11
2.54
REFERENCES
EUROPEAN
PROJECTION
OUTLINE
VERSION
ISSUE DATE
IEC
JEDEC
JEITA
06-02-14
09-08-25
SOT226
TO-262
Fig. 16. Package outline I2PAK (SOT226)
BUK9E3R2-40B
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Product data sheet
13 March 2014
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation -
lost profits, lost savings, business interruption, costs related to the removal
or replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
12. Legal information
12.1 Data sheet status
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Document
Product
Definition
status [1][2] status [3]
Objective
[short] data
sheet
Development This document contains data from
the objective specification for product
development.
Right to make changes — NXP Semiconductors reserves the right to
make changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Preliminary
[short] data
sheet
Qualification This document contains data from the
preliminary specification.
Suitability for use in automotive applications — This NXP
Semiconductors product has been qualified for use in automotive
applications. Unless otherwise agreed in writing, the product is not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconductors products in such equipment or
applications and therefore such inclusion and/or use is at the customer's own
risk.
Product
[short] data
sheet
Production
This document contains the product
specification.
[1] Please consult the most recently issued document before initiating or
completing a design.
[2] The term 'short data sheet' is explained in section "Definitions".
[3] The product status of device(s) described in this document may have
changed since this document was published and may differ in case of
multiple devices. The latest product status information is available on
the Internet at URL http://www.nxp.com.
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
12.2 Definitions
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Preview — The document is a preview version only. The document is still
subject to formal approval, which may result in modifications or additions.
NXP Semiconductors does not give any representations or warranties as to
the accuracy or completeness of information included herein and shall have
no liability for the consequences of use of such information.
Customers are responsible for the design and operation of their
applications and products using NXP Semiconductors products, and NXP
Semiconductors accepts no liability for any assistance with applications or
customer product design. It is customer’s sole responsibility to determine
whether the NXP Semiconductors product is suitable and fit for the
customer’s applications and products planned, as well as for the planned
application and use of customer’s third party customer(s). Customers should
provide appropriate design and operating safeguards to minimize the risks
associated with their applications and products.
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences
of use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is
intended for quick reference only and should not be relied upon to contain
detailed and full information. For detailed and full information see the
relevant full data sheet, which is available on request via the local NXP
Semiconductors sales office. In case of any inconsistency or conflict with the
short data sheet, the full data sheet shall prevail.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default
in the customer’s applications or products, or the application or use by
customer’s third party customer(s). Customer is responsible for doing all
necessary testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications
and the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product
is deemed to offer functions and qualities beyond those described in the
Product data sheet.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those
given in the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
12.3 Disclaimers
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
Limited warranty and liability — Information in this document is believed
to be accurate and reliable. However, NXP Semiconductors does not give
any representations or warranties, expressed or implied, as to the accuracy
or completeness of such information and shall have no liability for the
consequences of use of such information. NXP Semiconductors takes no
responsibility for the content in this document if provided by an information
source outside of NXP Semiconductors.
BUK9E3R2-40B
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Product data sheet
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
No offer to sell or license — Nothing in this document may be interpreted
or construed as an offer to sell products that is open for acceptance or the
grant, conveyance or implication of any license under any copyrights, patents
or other industrial or intellectual property rights.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
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Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
12.4 Trademarks
Notice: All referenced brands, product names, service names and
trademarks are the property of their respective owners.
Adelante, Bitport, Bitsound, CoolFlux, CoReUse, DESFire, EZ-HV,
FabKey, GreenChip, HiPerSmart, HITAG, I²C-bus logo, ICODE, I-
CODE, ITEC, Labelution, MIFARE, MIFARE Plus, MIFARE Ultralight,
MoReUse, QLPAK, Silicon Tuner, SiliconMAX, SmartXA, STARplug,
TOPFET, TrenchMOS, TriMedia and UCODE — are trademarks of NXP
Semiconductors N.V.
HD Radio and HD Radio logo — are trademarks of iBiquity Digital
Corporation.
BUK9E3R2-40B
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Product data sheet
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NXP Semiconductors
BUK9E3R2-40B
N-channel TrenchMOS logic level FET
13. Contents
1
General description ............................................... 1
Features and benefits ............................................1
Applications ........................................................... 1
Quick reference data ............................................. 1
Pinning information ...............................................2
Ordering information .............................................2
Marking ...................................................................2
Limiting values .......................................................2
Thermal characteristics .........................................4
Characteristics .......................................................5
Package outline ................................................... 10
2
3
4
5
6
7
8
9
10
11
12
Legal information .................................................11
Data sheet status ............................................... 11
Definitions ...........................................................11
Disclaimers .........................................................11
Trademarks ........................................................ 12
12.1
12.2
12.3
12.4
© NXP Semiconductors N.V. 2014. All rights reserved
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 13 March 2014
BUK9E3R2-40B
All information provided in this document is subject to legal disclaimers.
© NXP Semiconductors N.V. 2014. All rights reserved
Product data sheet
13 March 2014
13 / 13
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