BUT11APX-1200 [NXP]

Silicon Diffused Power Transistor; 硅扩散型功率晶体管
BUT11APX-1200
型号: BUT11APX-1200
厂家: NXP    NXP
描述:

Silicon Diffused Power Transistor
硅扩散型功率晶体管

晶体 晶体管
文件: 总7页 (文件大小:63K)
中文:  中文翻译
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Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT11APX-1200  
GENERAL DESCRIPTION  
Enhanced performance new generation,high voltage, high-speed switching npn transistor in a plastic full-pack  
envelope intended for use in horizontal deflection circuits of colour television receivers. Features exceptional  
tolerance to base drive and collector current load variations resulting in a very low worst case dissipation.  
QUICK REFERENCE DATA  
SYMBOL PARAMETER  
CONDITIONS  
TYP. MAX. UNIT  
VCESM  
VCBO  
VCEO  
IC  
Collector-emitter voltage peak value  
VBE = 0 V  
-
1200  
1200  
550  
6
V
V
V
A
A
W
V
Collector-Base voltage (open emitter)  
Collector-emitter voltage (open base)  
Collector current (DC)  
-
-
-
ICM  
Collector current peak value  
Total power dissipation  
-
10  
Ptot  
Ths 25 ˚C  
-
32  
VCEsat  
hFEsat  
tf  
Collector-emitter saturation voltage  
DC current gain  
IC = 2 A; IB = 0.4 A  
IC = 3 A; VCE = 5 V  
IC = 2.5 A; IB1 = 0.5 A  
0.15  
15.5  
170  
1.0  
-
Fall time  
300  
ns  
PINNING - SOT186A  
PIN CONFIGURATION  
SYMBOL  
PIN  
1
DESCRIPTION  
c
case  
base  
2
collector  
emitter  
b
3
case isolated  
1
2 3  
e
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum Rating System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN. MAX. UNIT  
VCESM  
VCEO  
VCBO  
IC  
Collector to emitter voltage  
VBE = 0 V  
-
1200  
550  
1200  
6
V
V
Collector to emitter voltage (open base)  
Collector to base voltage (open emitter)  
Collector current (DC)  
-
-
V
-
A
ICM  
Collector current peak value  
Base current (DC)  
Base current peak value  
Total power dissipation  
Storage temperature  
Junction temperature  
-
10  
A
IB  
IBM  
Ptot  
Tstg  
Tj  
-
3
A
-
-
5
A
Ths 25 ˚C  
32  
W
˚C  
˚C  
-65  
-
150  
150  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
TYP. MAX. UNIT  
Rth j-hs  
Rth j-a  
Junction to heatsink  
Junction to ambient  
with heatsink compound  
in free air  
-
3.95  
-
K/W  
K/W  
55  
April 1999  
1
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT11APX-1200  
ISOLATION LIMITING VALUE & CHARACTERISTIC  
Ths = 25 ˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
Visol  
Cisol  
R.M.S. isolation voltage from all f = 50-60 Hz; sinusoidal  
-
-
2500  
V
three terminals to external  
heatsink  
waveform;  
R.H. 65% ; clean and dustfree  
Capacitance from T2 to external f = 1 MHz  
heatsink  
-
10  
-
pF  
STATIC CHARACTERISTICS  
Ths = 25 ˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
ICES  
ICES  
Collector cut-off current 1  
VBE = 0 V; VCE = VCESMmax  
VBE = 0 V; VCE = VCESMmax  
Tj = 125 ˚C  
-
-
-
-
1.0  
2.0  
mA  
mA  
;
IEBO  
VCEOsust  
Emitter cut-off current  
VEB = 7 V; IC = 0 A  
-
-
-
0.1  
-
mA  
V
Collector-emitter sustaining voltage IB = 0 A; IC = 10 mA;  
L = 25 mH  
550  
VCEsat  
VBEsat  
hFE  
hFE  
hFEsat  
hFEsat  
Collector-emitter saturation voltage IC = 2.0 A; IB = 0.4 A  
-
-
13  
20  
13  
-
0.15  
0.91  
25  
30  
18.5  
15.5  
1.0  
1.5  
-
47  
25  
-
V
V
Base-emitter saturation voltage  
DC current gain  
IC = 2.0 A; IB = 0.4 A  
IC = 1 mA; VCE = 5 V  
IC = 500 mA; VCE = 5 V  
IC = 2 A; VCE = 5 V  
DC current gain  
IC = 3.0 A; VCE = 5 V  
DYNAMIC CHARACTERISTICS  
Ths = 25 ˚C unless otherwise specified8  
SYMBOL PARAMETER  
CONDITIONS  
TYP. MAX. UNIT  
Switching times (resistive load)  
ICon = 2.5 A; IBon = -IBoff = 0.5 A;  
RL = 75 ohms; VBB2 = 4 V;  
ton  
ts  
tf  
Turn-on time  
Turn-off storage time  
Turn-off fall time  
-
-
-
0.5  
3
0.3  
µs  
µs  
µs  
Switching times (inductive load)  
ICsat = 2.5 A; IB1 = 0.5 A; LB = 1 µH;  
-VBB = 5 V  
ts  
tf  
Turn-off storage time  
Turn-off fall time  
-
1.5  
300  
µs  
170  
ns  
Switching times (inductive load)  
ICsat = 2.5 A; IB1 = 0.5 A; LB = 1 µH;  
-VBB = 5 V; Tj = 100 ˚C  
ts  
tf  
Turn-off storage time  
Turn-off fall time  
-
-
1.8  
300  
µs  
ns  
1 Measured with half sine-wave voltage (curve tracer).  
April 1999  
2
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT11APX-1200  
ICsat  
90 %  
90 %  
+ 50v  
100-200R  
IC  
10 %  
ts  
Horizontal  
Oscilloscope  
Vertical  
tf  
ton  
toff  
IB1  
IB  
10 %  
1R  
300R  
tr 30ns  
6V  
30-60 Hz  
-IB2  
Fig.1. Test circuit for VCEOsust  
.
Fig.4. Switching times waveforms with resistive load.  
IC / mA  
VCC  
LC  
250  
200  
IBon  
LB  
100  
0
T.U.T.  
-VBB  
min  
VCE / V  
VCEOsust  
Fig.2. Oscilloscope display for VCEOsust  
.
Fig.5. Test circuit inductive load.  
VCC = 300 V; -VBE = 5 V; LC = 200 uH; LB = 1 uH  
ICsat  
90 %  
VCC  
IC  
R
L
10 %  
VIM  
R
tf  
B
t
0
T.U.T.  
ts  
IB  
IB1  
tp  
t
T
- IB2  
Fig.3. Test circuit resistive load. VIM = -6 to +8 V  
VCC = 250 V; tp = 20 µs; δ = tp / T = 0.01.  
Fig.6. Switching times waveforms with inductive load.  
RB and RL calculated from ICon and IBon requirements.  
April 1999  
3
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT11APX-1200  
Normalised Power Derating  
VBEsat/V  
PD%  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
0
20  
40  
60  
80  
Tmb /  
100  
120  
140  
0.1  
1
IC/A  
10  
C
Fig.7. Normalised power dissipation.  
PD% = 100PD/PD 25˚C = f (Ths)  
Fig.10. Base-Emitter saturation voltage.  
Solid lines = typ values, VBEsat = f(IC); at IC/IB =4.  
hFE  
VCEsat/V  
100  
10  
1
0.5  
5V  
0.4  
0.3  
0.2  
0.1  
0.0  
Tj = 25 C  
1V  
0.1  
1
10  
0.01  
0.1  
1
10  
IC/A  
IC / A  
Fig.8. Typical DC current gain. hFE = f(IC)  
parameter VCE  
Fig.11. Collector-Emitter saturation voltage.  
Solid lines = typ values, VCEsat = f(IC); at IC/IB =4.8  
Zth / (K/W)  
10  
1
VCEsat/V  
2.0  
0.5  
1.6  
0.2  
0.1  
IC=1A  
2A  
3A  
4A  
0.05  
1.2  
0.8  
0.4  
0.0  
0.1  
0.02  
tp  
t
p
P
D =  
D
T
0.01  
0.001  
D=0  
t
T
1u 10u 100u 1m 10m 100m  
t / s  
1
10 100  
0.01  
0.10  
1.00  
10.00  
IB/A  
Fig.9. Collector-Emitter saturation voltage.  
Solid lines = typ values, VCEsat = f(IB); Tj=25˚C.  
Fig.12. Transient thermal impedance.  
Zth j-hs = f(t); parameter D = tp/T  
April 1999  
4
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT11APX-1200  
IC (A)  
11  
VCC  
10  
9
8
7
6
5
4
3
2
1
0
LC  
VCL(RBSOAR)  
PROBE POINT  
IBon  
LB  
T.U.T.  
-VBB  
0
200  
400  
600 800  
VCEclamp (V)  
1,000  
1,200  
1,400  
Fig.13. Reverse bias safe operating area. Tj Tj max  
Fig.14. Test circuit for reverse bias safe operating  
area.  
Vcl 1200V; Vcc = 150V; VBB = -5V; LB = 1µH;Lc =  
200µH  
April 1999  
5
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT11APX-1200  
MECHANICAL DATA  
Dimensions in mm  
Net Mass: 2 g  
10.3  
max  
4.6  
max  
3.2  
3.0  
2.9 max  
2.8  
Recesses (2x)  
2.5  
6.4  
0.8 max. depth  
15.8  
max  
seating  
plane  
15.8  
max.  
19  
max.  
3 max.  
not tinned  
3
2.5  
13.5  
min.  
1
2
3
M
0.4  
1.0 (2x)  
0.6  
2.5  
0.9  
0.7  
2.54  
0.5  
5.08  
1.3  
Fig.15. SOT186A; The seating plane is electrically isolated from all terminals.  
Notes  
1. Refer to mounting instructions for F-pack envelopes.  
2. Epoxy meets UL94 V0 at 1/8".  
April 1999  
6
Rev 1.000  
Philips Semiconductors  
Product specification  
Silicon Diffused Power Transistor  
BUT11APX-1200  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 2001  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
April 1999  
7
Rev 1.000  

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