MR1A16ATS35C [NXP]

SPECIALTY MEMORY CIRCUIT, PDSO44, 0.400 MM, ROHS COMPLIANT, PLASTIC, TSOP2-44;
MR1A16ATS35C
型号: MR1A16ATS35C
厂家: NXP    NXP
描述:

SPECIALTY MEMORY CIRCUIT, PDSO44, 0.400 MM, ROHS COMPLIANT, PLASTIC, TSOP2-44

光电二极管 内存集成电路
文件: 总22页 (文件大小:243K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Document Number: MR2A16A  
Rev. 6, 11/2007  
Freescale Semiconductor  
Data Sheet  
256K x 16-Bit 3.3-V  
Asynchronous  
Magnetoresistive RAM  
MR2A16A  
44-TSOP  
Case 924A-02  
Introduction  
Features  
Single 3.3-V power supply  
The MR2A16A is a 4,194,304-bit magnetoresistive  
random access memory (MRAM) device  
Commercial temperature range (0°C to  
70°C), Industrial temperature range (-40°C  
to 85°C) and Extended temperature range  
(-40°C to 105°C)  
organized as 262,144 words of 16 bits. The  
MR2A16A is equipped with chip enable (E), write  
enable (W), and output enable (G) pins, allowing  
for significant system design flexibility without bus  
contention. Because the MR2A16A has separate  
byte-enable controls (LB and UB), individual bytes  
can be written and read.  
Symmetrical high-speed read and write with  
fast access time (35 ns)  
Flexible data bus control — 8 bit or 16 bit  
access  
MRAM is a nonvolatile memory technology that  
protects data in the event of power loss and does  
not require periodic refreshing. The MR2A16A is  
the ideal memory solution for applications that  
must permanently store and retrieve critical data  
quickly.  
Equal address and chip-enable access  
times  
Automatic data protection with low-voltage  
inhibit circuitry to prevent writes on power  
loss  
All inputs and outputs are  
The MR2A16A is available in a 400-mil, 44-lead  
plastic small-outline TSOP type-II package with an  
industry-standard center power and ground SRAM  
pinout.  
transistor-transistor logic (TTL) compatible  
Fully static operation  
Full nonvolatile operation with 20 years  
minimum data retention  
The MR2A16A is available in Commercial (0°C to  
70°C), Industrial (-40°C to 85°C) and Extended  
(-40°C to 105°C) ambient temperature ranges.  
© Freescale Semiconductor, Inc., 2004, 2005, 2006, 2007. All rights reserved.  
Device Pin Assignment  
OUTPUT  
ENABLE  
BUFFER  
G
UPPER BYTE OUTPUT ENABLE  
LOWER BYTE OUTPUT ENABLE  
8
A[17:0]  
18  
ADDRESS  
BUFFERS  
UPPER  
BYTE  
OUTPUT  
BUFFER  
10  
ROW  
DECODER  
COLUMN  
DECODER  
8
8
SENSE  
CHIP  
ENABLE  
BUFFER  
E
AMPS  
16  
8
LOWER  
BYTE  
8
256K x 16  
OUTPUT  
BUFFER  
BIT  
MEMORY  
ARRAY  
UPPER  
BYTE  
WRITE  
ENABLE  
BUFFER  
8
W
DQU[15:8]  
DQL[7:0]  
8
8
WRITE  
DRIVER  
16  
FINAL  
WRITE  
DRIVERS  
LOWER  
BYTE  
WRITE  
DRIVER  
8
UB  
LB  
UB  
LB  
UPPER BYTE WRITE ENABLE  
LOWER BYTE WRITE ENABLE  
BYTE  
ENABLE  
BUFFER  
Figure 1. Block Diagram  
Device Pin Assignment  
A0  
A1  
1
44  
43  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
A17  
A16  
A15  
G
2
A2  
3
Table 1. Pin Functions  
Signal Name Function  
Address input  
A3  
4
A4  
5
UB  
LB  
E
6
DQL0  
DQL1  
DQL2  
DQL3  
7
DQU15  
DQU14  
DQU13  
DQU12  
A
8
E
Chip enable  
9
10  
11  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
22  
W
Write enable  
V
V
SS  
DD  
G
Output enable  
Upper byte select  
Lower byte select  
V
VDD  
SS  
DQL4  
DQL5  
DQL6  
DQL7  
W
DQU11  
DQU10  
DQU9  
DQU8  
NC  
UB  
LB  
DQL  
DQU  
Data I/O, lower byte  
Data I/O, upper byte  
Power supply  
A5  
A14  
A6  
A13  
V
V
DD  
SS  
A7  
A12  
Ground  
A8  
A11  
NC  
Do not connect this pin  
A9  
A10  
Figure 2. MR2A16A in 44-Pin TSOP Type II Package  
MR2A16A Data Sheet, Rev. 6  
2
Freescale Semiconductor  
Electrical Specifications  
Table 2. Operating Modes  
V
1
1
1
1
1
2
2
DD  
E
G
W
LB  
UB  
Mode  
DQL[7:0]  
DQU[15:8]  
Current  
H
X
H
X
L
X
H
X
H
H
H
L
X
X
H
L
X
X
H
H
L
Not selected  
I
, I  
Hi-Z  
Hi-Z  
Hi-Z  
Hi-Z  
Hi-Z  
Hi-Z  
Hi-Z  
SB1 SB2  
L
L
L
L
L
L
L
L
Output disabled  
Output disabled  
Lower byte read  
Upper byte read  
Word read  
I
I
I
I
I
DDR  
DDR  
DDR  
DDR  
DDR  
D
Out  
L
H
L
Hi-Z  
D
D
Out  
Out  
L
L
D
Out  
X
X
X
L
H
L
Lower byte write  
Upper byte write  
Word write  
I
I
I
D
Hi-Z  
DDW  
DDW  
DDW  
In  
L
H
L
Hi-Z  
D
D
In  
In  
L
L
D
In  
NOTES:  
1
H = high, L = low, X = don’t care  
Hi-Z = high impedance  
2
Electrical Specifications  
Absolute Maximum Ratings  
This device contains circuitry to protect the inputs against damage caused by high static voltages or  
electric fields; however, it is advised that normal precautions be taken to avoid application of any voltage  
greater than maximum rated voltages to these high-impedance (Hi-Z) circuits.  
The device also contains protection against external magnetic fields. Precautions should be taken to  
avoid application of any magnetic field more intense than the maximum field intensity specified in the  
maximum ratings.  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
3
Electrical Specifications  
1
Table 3. Absolute Maximum Ratings  
Parameter  
Symbol  
Value  
Unit  
V
2
Supply voltage  
V
–0.5 to 4.0  
DD  
2
Voltage on any pin  
Output current per pin  
V
–0.5 to V + 0.5  
V
In  
DD  
I
20  
mA  
W
Out  
3
Package power dissipation  
P
0.600  
D
Temperature under bias  
MR2A16ATS35C (Commercial - Legacy)  
MR2A16AYS35 (Commercial - New)  
MR2A16ACYS35 (Industrial)  
–10 to 85  
–10 to 85  
–45 to 95  
–45 to 110  
T
°C  
Bias  
MR2A16AVYS35 (Extended)  
Storage temperature  
T
–55 to 150  
260  
°C  
°C  
stg  
Lead temperature during solder (3 minute max)  
T
Lead  
Maximum magnetic field during write  
MR2A16ATS35C (Commercial - Legacy)  
MR2A16AYS35 (Commercial - New)  
MR2A16ACYS35 (Industrial)  
15  
25  
25  
25  
H
Oe  
Oe  
max_write  
MR2A16AVYS35 (Extended)  
Maximum magnetic field during read or standby  
H
100  
max_read  
NOTES:  
1
Permanent device damage may occur if absolute maximum ratings are exceeded. Functional operation  
should be restricted to recommended operating conditions. Exposure to excessive voltages or magnetic fields  
could affect device reliability.  
2
3
All voltages are referenced to V  
.
SS  
Power dissipation capability depends on package characteristics and use environment.  
MR2A16A Data Sheet, Rev. 6  
4
Freescale Semiconductor  
Electrical Specifications  
Table 4. Operating Conditions  
Parameter  
Power supply voltage  
MR2A16ATS35C (Commercial - Legacy)  
MR2A16AYS35 (Commercial - New)  
MR2A16ACYS35 (Industrial)  
Symbol  
Min  
Typ  
Max  
Unit  
1
3.0  
3.0  
3.0  
3.3  
3.3  
3.3  
3.3  
3.6  
3.6  
3.6  
3.6  
2
V
V
DD  
2
2
MR2A16AVYS35 (Extended)  
3.0  
Write inhibit voltage  
1
MR2A16ATS35C (Commercial - Legacy)  
MR2A16AYS35 (Commercial - New)  
MR2A16ACYS35 (Industrial)  
MR2A16AVYS35 (Extended)  
2.5  
2.5  
2.5  
2.5  
2.7  
2.7  
2.7  
2.7  
3.0  
3.0  
3.0  
3.0  
2
V
V
WI  
2
2
V
0.3  
+
DD  
Input high voltage  
V
2.2  
V
V
3
IH  
4
Input low voltage  
V
–0.5  
0.8  
IL  
Operating temperature  
MR2A16ATS35C (Commercial - Legacy)  
MR2A16AYS35 (Commercial - New)  
MR2A16ACYS35 (Industrial)  
MR2A16AVYS35 (Extended)  
0
0
-40  
-40  
70  
70  
85  
T
°C  
A
105  
NOTES:  
1
After power up or if V  
falls below V , a waiting period of 2 μs must be observed, and E and W  
WI  
DD  
must remain high for 2 μs. Memory is designed to prevent writing for all input pin conditions if V  
DD  
falls below minimum V  
.
WI  
2
After power up or if V falls below V , a waiting period of 2 ms must be observed, and E and W  
DD  
WI  
must remain high for 2 ms. Memory is designed to prevent writing for all input pin conditions if V  
DD  
falls below minimum V  
.
WI  
3
4
V
V
(max) = V + 0.3 Vdc; V (max) = V + 2.0 Vac (pulse width 10 ns) for I 20.0 mA.  
(min) = –0.5 Vdc; V (min) = –2.0 Vac (pulse width 10 ns) for I 20.0 mA.  
IH  
IL  
DD IH DD  
IL  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
5
Electrical Specifications  
Direct Current (dc)  
Table 5. dc Characteristics  
Parameter  
Symbol  
Min  
Typ  
Max  
1
Unit  
μA  
Input leakage current  
Output leakage current  
Output low voltage  
I
lkg(I)  
I
1
μA  
lkg(O)  
(I = +4 mA)  
V
0. 4  
V
V
OL  
OL  
(I = +100 μA)  
V
+ 0.2  
OL  
SS  
Output high voltage  
(I  
(I  
= –4 mA)  
= –100 mA)  
V
2. 4  
OH  
OH  
OH  
V
– 0.2  
DD  
Table 6. Power Supply Characteristics  
Parameter Symbol Typ  
ac active supply current — read modes  
Max  
Unit  
1
1
I
55  
80  
mA  
DDR  
(I = 0 mA, V = max)  
Out  
DD  
ac active supply current — write modes  
(V = max)  
DD  
MR2A16ATS35C (Commercial - Legacy)  
MR2A16AYS35 (Commercial - New)  
MR2A16ACYS35 (Industrial)  
105  
105  
105  
105  
155  
155  
165  
165  
I
mA  
DDW  
MR2A16AVYS35 (Extended)  
ac standby current  
(V  
= max, E = V )  
I
18  
9
28  
12  
mA  
mA  
DD  
IH  
SB1  
(no other restrictions on other inputs)  
CMOS standby current  
(E V – 0.2 V and V V + 0.2 V or V – 0.2 V)  
(V  
I
DD  
In  
SS  
DD  
SB2  
= max, f = 0 MHz)  
DD  
NOTES:  
1
All active current measurements are measured with one address transition per cycle.  
1
Table 7. Capacitance  
Parameter  
Symbol  
Typ  
Max  
Unit  
Address input capacitance  
Control input capacitance  
Input/output capacitance  
C
C
6
6
8
pF  
pF  
pF  
In  
In  
C
I/O  
NOTES:  
1
f = 1.0 MHz, dV = 3.0 V, T = 25°C, periodically sampled rather than 100% tested.  
A
MR2A16A Data Sheet, Rev. 6  
6
Freescale Semiconductor  
Electrical Specifications  
Table 8. ac Measurement Conditions  
Parameter  
Value  
Logic input timing measurement reference level  
1.5 V  
1.5 V  
Logic output timing measurement reference level  
Logic input pulse levels  
0 or 3.0 V  
2 ns  
Input rise/fall time  
Output load for low and high impedance parameters  
Output load for all other timing parameters  
See Figure 3A  
See Figure 3B  
+3.3 V  
ZD = 50 Ω  
725 Ω  
OUTPUT  
OUTPUT  
600 Ω  
RL = 50 Ω  
5 pF  
V = 1.5 V  
L
A
B
Figure 3. Output Load for ac Test  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
7
Timing Specifications  
Timing Specifications  
Read Mode  
1, 2  
Table 9. Read Cycle Timing  
Symbol  
Parameter  
Min  
Max  
Unit  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Read cycle time  
t
35  
3
AVAV  
Address access time  
t
t
35  
35  
15  
15  
AVQV  
ELQV  
GLQV  
3
Enable access time  
Output enable access time  
Byte enable access time  
t
t
BLQV  
AXQX  
Output hold from address change  
t
4, 5  
Enable low to output active  
t
3
ELQX  
GLQX  
4, 5  
Output enable low to output active  
t
0
4, 5  
Byte enable low to output active  
t
0
BLQX  
EHQZ  
GHQZ  
4, 5  
Enable high to output Hi-Z  
t
0
15  
10  
10  
4, 5  
Output enable high to output Hi-Z  
t
0
4, 5  
Byte high to output Hi-Z  
t
0
BHQZ  
NOTES:  
1
W is high for read cycle.  
2
Due to product sensitivities to noise, power supplies must be properly grounded and  
decoupled, and bus contention conditions must be minimized or eliminated during read and  
write cycles.  
Addresses valid before or at the same time E goes low.  
This parameter is sampled and not 100% tested.  
3
4
5
Transition is measured 200 mV from steady-state voltage.  
MR2A16A Data Sheet, Rev. 6  
8
Freescale Semiconductor  
Timing Specifications  
tAVAV  
A (ADDRESS)  
Q (DATA OUT)  
tAXQX  
PREVIOUS DATA VALID  
DATA VALID  
tAVQV  
NOTES:  
Device is continuously selected (E V , G V ).  
IL  
IL  
Figure 4. Read Cycle 1  
tAVAV  
A (ADDRESS)  
tAVQV  
tELQV  
E (CHIP ENABLE)  
tEHQZ  
tELQX  
G (OUTPUT ENABLE)  
tGHQZ  
tGLQV  
tGLQX  
LB, UB (BYTE ENABLE)  
Q (DATA OUT)  
tBHQZ  
tBLQV  
tBLQX  
DATA VALID  
Figure 5. Read Cycle 2  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
9
Timing Specifications  
Write Mode  
1, 2, 3, 4, 5  
Table 10. Write Cycle Timing 1 (W Controlled)  
Parameter Symbol Min  
Max  
Unit  
ns  
6
Write cycle time  
t
35  
0
AVAV  
Address set-up time  
t
ns  
AVWL  
AVWH  
AVWH  
Address valid to end of write (G high)  
Address valid to end of write (G low)  
t
t
18  
20  
ns  
ns  
t
t
WLWH  
Write pulse width (G high)  
Write pulse width (G low)  
15  
15  
ns  
ns  
WLEH  
t
WLWH  
t
WLEH  
DVWH  
WHDX  
Data valid to end of write  
Data hold time  
t
t
10  
0
12  
ns  
ns  
ns  
ns  
ns  
7, 8, 9  
Write low to data Hi-Z  
t
0
WLQZ  
WHQX  
7, 8, 9  
Write high to output active  
t
3
Write recovery time  
NOTES:  
t
12  
WHAX  
1
A write occurs during the overlap of E low and W low.  
2
Due to product sensitivities to noise, power supplies must be properly grounded and decoupled and  
bus contention conditions must be minimized or eliminated during read and write cycles.  
If G goes low at the same time or after W goes low, the output will remain in a high-impedance state.  
After W, E, or UB/LB has been brought high, the signal must remain in steady-state high for a minimum  
of 2 ns.  
The minimum time between E being asserted low in one cycle to E being asserted low in a subsequent  
cycle is the same as the minimum cycle time allowed for the device.  
3
4
5
6
7
8
9
All write cycle timings are referenced from the last valid address to the first transition address.  
This parameter is sampled and not 100% tested.  
Transition is measured 200 mV from steady-state voltage.  
At any given voltage or temperature, t  
max < t  
min.  
WLQZ  
WHQX  
MR2A16A Data Sheet, Rev. 6  
10  
Freescale Semiconductor  
Timing Specifications  
tAVAV  
A (ADDRESS)  
tAVWH  
tWHAX  
E (CHIP ENABLE)  
tWLEH  
tWLWH  
W (WRITE ENABLE)  
tAVWL  
LB, UB (BYTE ENABLE)  
tDVWH  
tWHDX  
D (DATA IN)  
DATA VALID  
Hi-Z  
tWLQZ  
Hi-Z  
Q (DATA OUT)  
tWHQX  
Figure 6. Write Cycle 1 (W Controlled)  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
11  
Timing Specifications  
1, 2, 3, 4, 5  
Table 11. Write Cycle Timing 2 (E Controlled)  
Parameter Symbol  
Min  
35  
0
Max  
Unit  
ns  
6
Write cycle time  
t
t
AVAV  
AVEL  
AVEH  
AVEH  
ELEH  
Address set-up time  
ns  
Address valid to end of write (G high)  
Address valid to end of write (G low)  
t
t
t
18  
20  
ns  
ns  
Enable to end of write (G high)  
15  
15  
ns  
ns  
t
ELWH  
t
7, 8  
ELEH  
ELWH  
Enable to end of write (G low)  
t
t
t
Data valid to end of write  
Data hold time  
10  
0
ns  
ns  
ns  
DVEH  
EHDX  
Write recovery time  
NOTES:  
t
12  
EHAX  
1
A write occurs during the overlap of E low and W low.  
2
Due to product sensitivities to noise, power supplies must be properly grounded and decoupled  
and bus contention conditions must be minimized or eliminated during read and write cycles.  
3
4
5
If G goes low at the same time or after W goes low, the output will remain in a high-impedance  
state.  
After W, E, or UB/LB has been brought high, the signal must remain in steady-state high for a  
minimum of 2 ns.  
The minimum time between E being asserted low in one cycle to E being asserted low in a  
subsequent cycle is the same as the minimum cycle time allowed for the device.  
6
7
8
All write cycle timings are referenced from the last valid address to the first transition address.  
If E goes low at the same time or after W goes low, the output will remain in a high-impedance state.  
If E goes high at the same time or before W goes high, the output will remain in a high-impedance  
state.  
MR2A16A Data Sheet, Rev. 6  
12  
Freescale Semiconductor  
Timing Specifications  
tAVAV  
A (ADDRESS)  
tAVEH  
tEHAX  
tELEH  
E (CHIP ENABLE)  
tAVEL  
tELWH  
W (WRITE ENABLE)  
LB, UB (BYTE ENABLE)  
tDVEH  
tEHDX  
D (DATA IN)  
DATA VALID  
Hi-Z  
Q (DATA OUT)  
Figure 7. Write Cycle 2 (E Controlled)  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
13  
Timing Specifications  
1, 2, 3, 4, 5, 6  
Table 12. Write Cycle Timing 3 (LB/UB Controlled)  
Parameter Symbol Min  
Max  
Unit  
ns  
7
Write cycle time  
t
t
35  
0
AVAV  
AVBL  
Address set-up time  
ns  
Address valid to end of write (G high)  
Address valid to end of write (G low)  
t
t
t
18  
20  
ns  
AVBH  
AVBH  
ns  
BLEH  
BLWH  
Byte pulse width (G high)  
Byte pulse width (G low)  
15  
15  
ns  
ns  
t
t
BLEH  
BLWH  
t
t
t
Data valid to end of write  
Data hold time  
10  
0
ns  
ns  
ns  
DVBH  
BHDX  
Write recovery time  
NOTES:  
t
12  
BHAX  
1
A write occurs during the overlap of E low and W low.  
Due to product sensitivities to noise, power supplies must be properly grounded and decoupled and  
bus contention conditions must be minimized or eliminated during read and write cycles.  
If G goes low at the same time or after W goes low, the output will remain in a high-impedance state.  
After W, E, or UB/LB has been brought high, the signal must remain in steady-state high for a minimum  
of 2 ns.  
2
3
4
5
6
7
If both byte control signals are asserted, the two signals must have no more than 2 ns skew between  
them.  
The minimum time between E being asserted low in one cycle to E being asserted low in a subsequent  
cycle is the same as the minimum cycle time allowed for the device.  
All write cycle timings are referenced from the last valid address to the first transition address.  
MR2A16A Data Sheet, Rev. 6  
14  
Freescale Semiconductor  
Timing Specifications  
tAVAV  
A (ADDRESS)  
tAVBH  
tBHAX  
E (CHIP ENABLE)  
tAVBL  
tBLEH  
tBLWH  
LB, UB (BYTE ENABLE)  
W (WRITE ENABLE)  
tBHDX  
tDVBH  
DATA VALID  
D (DATA IN)  
Hi-Z  
Hi-Z  
Q (DATA OUT)  
Figure 8. Write Cycle 3 (LB/UB Controlled)  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
15  
Ordering Information  
Ordering Information  
This product is available in Commercial, Industrial, and Extended temperature versions.  
Freescale's semiconductor products can be classified into the following tiers: “Commercial”, “Industrial”  
and “Extended.” A product should only be used in applications appropriate to its tier as shown below. For  
questions, please contact a Freescale sales representative.  
Commercial — Typically 5 year applications - personal computers, PDA's, portable telecom  
products, consumer electronics, etc.  
Industrial, Extended — Typically 10 year applications - installed telecom equipment,  
workstations, servers, etc. These products can also be used in Commercial applications.  
Current Part Numbering System (New Commercial, Industrial and Extended devices)  
(Order by Full Part Number)  
MR  
2
A
16  
A
V
YS 35  
Timing Set (35 = 35 ns)  
Package Type (YS = TSOP II)  
Freescale MRAM Memory Prefix  
Operating Temperature Range  
(Missing = 0°C to 70°C,  
Density Code (0 = 1 Mb, 1 = 2 Mb,  
2 = 4 Mb, 4 = 16 Mb)  
C = -40°C to 85°C, V = -40°C to 105°C)  
Memory Type (A = async, S = sync)  
Revision (A = rev 1)  
I/O Configuration (08 = 8 bits, 16 = 16 bits)  
Legacy Part Numbering System (Legacy Commercial devices)  
(Order by Full Part Number)  
MR  
2
A
16  
A
TS  
35  
C
Operating Temperature Range (C = 0°C to 70°C)  
Timing Set (35 = 35 ns)  
Freescale MRAM Memory Prefix  
Package Type (TS = TSOP II)  
Revision (A = rev 1)  
Density Code (0 = 1 Mb, 1 = 2 Mb,  
2 = 4 Mb, 4 = 16 Mb)  
Memory Type (A = async, S = sync)  
I/O Configuration (08 = 8 bits, 16 = 16 bits)  
MR2A16A Data Sheet, Rev. 6  
16  
Freescale Semiconductor  
Package Information  
Package Information  
Table 13. Package Information  
Pin  
Count  
Package  
Type  
RoHS  
Compliant  
Device  
Designator  
Case No.  
Document No.  
TSOP  
Type II  
1
MR2A16A  
44  
TS/YS  
924A-02  
98ASS23673W  
True  
NOTES:  
1
TS and YS are both valid package codes for TSOP packages. The package is identical for both TS and YS  
codes.  
Revision History  
Revision History  
Description of Change  
Revision  
Date  
Added new Industrial and Extended temperature product information; updated part  
ordering information; changed to 2 ms delay after power up; power supply  
characteristics values updated to TBD for industrial and extended temperature  
devices.  
4
18 Jun 2007  
21 Sep 2007  
12 Nov 2007  
Changed MR2A16ATS35C product description to Legacy Commercial. Added the  
New Commercial temperature product (MR2A16AYS35) information.  
5
6
Table 3: MR2A16AYS35 H  
= 25 Oe.  
max_write  
Table 4: MR2A16AYS35 has a 2 ms power up waiting period.  
Table 6: Applied values to TBD’s in IDD specifications.  
Table 2: Changed IDDA to IDDR or IDDW.  
Table 13: Added note indicating that TS and YS are both valid package codes.  
Current Part Numbering System: Added commercial (missing letter) temperature  
range.  
Mechanical Drawing  
The following pages detail the package available to MR2A16A.  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
17  
Mechanical Drawing  
MR2A16A Data Sheet, Rev. 6  
18  
Freescale Semiconductor  
Mechanical Drawing  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
19  
Mechanical Drawing  
MR2A16A Data Sheet, Rev. 6  
20  
Freescale Semiconductor  
Mechanical Drawing  
MR2A16A Data Sheet, Rev. 6  
Freescale Semiconductor  
21  
Information in this document is provided solely to enable system and software implementers to use  
Freescale Semiconductor products. There are no express or implied copyright licenses granted  
hereunder to design or fabricate any integrated circuits or integrated circuits based on the information  
in this document.  
How to Reach Us:  
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© Freescale Semiconductor, Inc. 2004, 2005, 2006, 2007.  
MR2A16A  
Rev. 6, 11/2007  

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