PHKD3NQ10T [NXP]

Dual N-channel TrenchMOS transistor; 双N沟道晶体管的TrenchMOS
PHKD3NQ10T
型号: PHKD3NQ10T
厂家: NXP    NXP
描述:

Dual N-channel TrenchMOS transistor
双N沟道晶体管的TrenchMOS

晶体 晶体管 开关 脉冲 光电二极管
文件: 总7页 (文件大小:82K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Philips Semiconductors  
Product specification  
Dual N-channel TrenchMOSTM transistor  
PHKD3NQ10T  
FEATURES  
SYMBOL  
QUICK REFERENCE DATA  
• Dual device  
• Low on-state resistance  
• Fast switching  
• Low profile surface mount  
package  
d1  
d2  
s2  
VDS = 100 V  
ID = 3 A  
g1  
g2  
R
DS(ON) 90 m(VGS = 10 V)  
s1  
GENERAL DESCRIPTION  
PINNING  
SOT96-1  
8
7
6
5
Dual N-channel enhancement  
mode field-effect transistor in a  
plastic envelope using ’trench’  
technology.  
PIN  
DESCRIPTION  
source 1  
gate 1  
1
2
Applications:-  
• Motor and relay drivers  
• d.c. to d.c. converters  
3
source 2  
gate 2  
pin 1 index  
4
1
2
3
4
The PHKD3NQ10T is supplied in  
the SOT96-1 (SO8) surface  
mounting package.  
5,6  
7,8  
drain 2  
drain 1  
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VDS  
VDGR  
Continuous drain-source voltage  
Drain-gate voltage  
Tj = 25 ˚C to 150˚C  
Tj = 25 ˚C to 150˚C;  
RGS = 20 k  
-
-
100  
100  
V
V
VGS  
ID  
Gate-source voltage  
Drain current per MOSFET  
-
-
-
-
-
-
± 20  
3
2.4  
2.2  
1.7  
12  
V
A
A
A
A
A
Ta = 25 ˚C, t 10 s  
Ta = 70 ˚C, t 10 s  
Ta = 25 ˚C, t 10 s  
Ta = 70 ˚C, t 10 s  
ID  
Drain current per MOSFET (both  
MOSFETs conducting)  
Drain current (pulse peak value per Ta = 25 ˚C  
MOSFET)  
IDM  
Ptot  
Total power dissipation  
Ta = 25 ˚C, t 10 s  
Ta = 70 ˚C, t 10 s  
-
-
2
1.3  
150  
W
W
˚C  
Tstg, Tj  
Storage & operating temperature  
- 65  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
TYP.  
MAX.  
UNIT  
Rth j-a  
Thermal resistance junction Surface mounted on FR4 board, t 10  
to ambient sec; either or both MOSFETs conducting  
Thermal resistance junction Surface mounted on FR4 board; either or  
to ambient both MOSFETs conducting  
-
62.5  
K/W  
Rth j-a  
150  
-
K/W  
August 1999  
1
Rev 1.000  
Philips Semiconductors  
Product specification  
Dual N-channel TrenchMOSTM transistor  
PHKD3NQ10T  
ELECTRICAL CHARACTERISTICS  
Tj= 25˚C, per MOSFET unless otherwise specified  
SYMBOL PARAMETER  
V(BR)DSS Drain-source breakdown  
CONDITIONS  
MIN. TYP. MAX. UNIT  
VGS = 0 V; ID = 250 µA;  
100  
-
-
-
-
V
V
voltage  
Tj = -55˚C  
89  
VGS(TO)  
Gate threshold voltage  
VDS = VGS; ID = 1 mA  
2
1.1  
3
-
4
-
6
90  
216  
100  
10  
100  
V
V
V
mΩ  
mΩ  
nA  
µA  
µA  
Tj = 150˚C  
Tj = -55˚C  
-
-
-
-
-
-
RDS(ON)  
Drain-source on-state  
resistance  
Gate source leakage current VGS = ±20 V; VDS = 0 V  
Zero gate voltage drain  
current  
VGS = 10 V; ID = 1.5 A  
70  
-
10  
0.05  
-
Tj = 150˚C  
Tj = 150˚C  
IGSS  
IDSS  
VDS = 100 V; VGS = 0 V;  
Qg(tot)  
Qgs  
Qgd  
Total gate charge  
Gate-source charge  
Gate-drain (Miller) charge  
ID = 3 A; VDD = 80 V; VGS = 10 V  
-
-
-
21  
2.5  
8
-
-
-
nC  
nC  
nC  
td on  
tr  
td off  
tf  
Turn-on delay time  
Turn-on rise time  
Turn-off delay time  
Turn-off fall time  
VDD = 50 V; RD = 15 ;  
VGS = 10 V; RG = 5.6 Ω  
Resistive load  
-
-
-
-
6
-
-
-
-
ns  
ns  
ns  
ns  
12  
20  
10  
Ld  
Ls  
Internal drain inductance  
Internal source inductance  
Measured from drain lead to centre of die  
Measured from source lead to source  
bond pad  
-
-
2.5  
5
-
-
nH  
nH  
Ciss  
Coss  
Crss  
Input capacitance  
Output capacitance  
Feedback capacitance  
VGS = 0 V; VDS = 20 V; f = 1 MHz  
-
-
-
633  
103  
61  
-
-
-
pF  
pF  
pF  
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS  
Tj = 25˚C, per MOSFET unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IS  
Continuous source diode  
current  
Ta = 25 ˚C, t 10 s  
-
-
2
A
ISM  
VSD  
Pulsed source diode current  
Diode forward voltage  
-
-
-
12  
1.2  
A
V
IF = 2 A; VGS = 0 V  
0.8  
trr  
Qrr  
Reverse recovery time  
Reverse recovery charge  
IF = 2 A; -dIF/dt = 100 A/µs;  
VGS = 0 V; VR = 25 V  
-
-
55  
135  
-
-
ns  
nC  
August 1999  
2
Rev 1.000  
Philips Semiconductors  
Product specification  
Dual N-channel TrenchMOSTM transistor  
PHKD3NQ10T  
Transient thermal impedance, Zth j-a (K/W)  
Normalised Power Derating, PD (%)  
100  
100  
10  
D = 0.5  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
0.2  
0.1  
0.05  
0.02  
1
single pulse  
P
D = tp/T  
D
tp  
0.1  
T
0.01  
1E-06 1E-05 1E-04 1E-03 1E-02 1E-01 1E+00 1E+01  
Pulse width, tp (s)  
0
25  
50  
75  
100  
125  
150  
Ambient temperature, Ta (C)  
Fig.1. Normalised power dissipation.  
PD% = 100 PD/PD 25 ˚C = f(Ta)  
Fig.4. Transient thermal impedance.  
Zth j-a = f(t); parameter D = tp/T  
Drain Current, ID (A)  
6
5
4
3
2
1
0
Normalised Current Derating, ID (%)  
VGS = 10V  
8 V  
5.4 V  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
5.2 V  
Tj = 25 C  
5 V  
6 V  
4.8 V  
4.6 V  
4.4 V  
0
25  
50  
75  
100  
125  
150  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
1.6  
1.8  
2
Ambient temperature, Ta (C)  
Drain-Source Voltage, VDS (V)  
Fig.2. Normalised continuous drain current.  
Fig.5. Typical output characteristics, Tj = 25 ˚C.  
ID = f(VDS)  
ID% = 100 ID/ID 25 ˚C = f(Ta); VGS 10 V  
Peak Pulsed Drain Current, IDM (A)  
100  
10  
Drain-Source On Resistance, RDS(on) (Ohms)  
0.2  
4.6V  
4.8V  
5 V  
0.18  
0.16  
0.14  
0.12  
0.1  
RDS(on) = VDS/ ID  
tp = 10 us  
100 us  
1 ms  
5.2 V  
5.4 V  
6V  
1
10 ms  
0.08  
0.06  
0.04  
0.02  
0
8 V  
D.C.  
100 ms  
0.1  
0.01  
VGS = 10V  
Tj = 25 C  
1
0.1  
1
10  
100  
1000  
0
2
3
4
5
6
Drain-Source Voltage, VDS (V)  
Drain Current, ID (A)  
Fig.3. Safe operating area  
ID & IDM = f(VDS); IDM single pulse; parameter tp  
Fig.6. Typical on-state resistance, Tj = 25 ˚C.  
RDS(ON) = f(ID)  
August 1999  
3
Rev 1.000  
Philips Semiconductors  
Product specification  
Dual N-channel TrenchMOSTM transistor  
PHKD3NQ10T  
Threshold Voltage, VGS(TO) (V)  
Drain current, ID (A)  
4.5  
4
6
VDS > ID X RDS(ON)  
maximum  
5
4
3
3.5  
3
typical  
2.5  
2
minimum  
150 C  
1.5  
1
2
Tj = 25 C  
1
0
0.5  
0
0
1
2
3
4
5
6
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
Junction Temperature, Tj (C)  
Gate-source voltage, VGS (V)  
Fig.7. Typical transfer characteristics.  
ID = f(VGS)  
Fig.10. Gate threshold voltage.  
GS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS  
V
Transconductance, gfs (S)  
VDS > ID X RDS(ON)  
Drain current, ID (A)  
15  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
1.0E-06  
14  
13  
12  
11  
10  
9
8
7
6
5
Tj = 25 C  
minimum  
150 C  
typical  
maximum  
4
3
2
1
0
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
0
1
2
3
4
5
6
Gate-source voltage, VGS (V)  
Drain current, ID (A)  
Fig.8. Typical transconductance, Tj = 25 ˚C.  
gfs = f(ID)  
Fig.11. Sub-threshold drain current.  
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS  
Normalised On-state Resistance  
2.9  
2.7  
2.5  
2.3  
2.1  
1.9  
1.7  
1.5  
1.3  
1.1  
0.9  
0.7  
0.5  
Capacitances, Ciss, Coss, Crss (pF)  
10000  
Ciss  
1000  
100  
10  
Coss  
Crss  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
0.1  
1
10  
100  
Junction temperature, Tj (C)  
Drain-Source Voltage, VDS (V)  
Fig.9. Normalised drain-source on-state resistance.  
RDS(ON)/RDS(ON)25 ˚C = f(Tj)  
Fig.12. Typical capacitances, Ciss, Coss, Crss.  
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz  
August 1999  
4
Rev 1.000  
Philips Semiconductors  
Product specification  
Dual N-channel TrenchMOSTM transistor  
PHKD3NQ10T  
Source-Drain Diode Current, IF (A)  
VGS = 0 V  
6
5
4
3
2
1
0
Gate-source voltage, VGS (V)  
15  
ID = 3A  
14  
13  
12  
11  
10  
9
Tj = 25 C  
VDD = 20 V  
150 C  
8
7
6
5
4
3
2
1
VDD = 80 V  
Tj = 25 C  
0
0
2
4
6
8
10 12 14 16 18 20 22 24 26 28 30  
Gate charge, QG (nC)  
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9  
Source-Drain Voltage, VSDS (V)  
1
1.1 1.2  
Fig.13. Typical turn-on gate-charge characteristics.  
VGS = f(QG)  
Fig.14. Typical reverse diode current.  
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj  
August 1999  
5
Rev 1.000  
Philips Semiconductors  
Product specification  
Dual N-channel TrenchMOSTM transistor  
PHKD3NQ10T  
MECHANICAL DATA  
SO8: plastic small outline package; 8 leads; body width 3.9 mm  
SOT96-1  
D
E
A
X
v
c
y
H
M
A
E
Z
5
8
Q
A
2
A
(A  
)
3
A
1
pin 1 index  
θ
L
p
L
1
4
e
w
M
detail X  
b
p
0
2.5  
5 mm  
scale  
DIMENSIONS (inch dimensions are derived from the original mm dimensions)  
A
(1)  
(1)  
(2)  
UNIT  
A
A
A
b
c
D
E
e
H
L
L
p
Q
v
w
y
Z
θ
1
2
3
p
E
max.  
0.25  
0.10  
1.45  
1.25  
0.49  
0.36  
0.25  
0.19  
5.0  
4.8  
4.0  
3.8  
6.2  
5.8  
1.0  
0.4  
0.7  
0.6  
0.7  
0.3  
mm  
1.27  
0.050  
1.05  
0.041  
0.25  
0.01  
0.25  
0.1  
1.75  
0.25  
0.01  
8o  
0o  
0.010 0.057  
0.004 0.049  
0.019 0.0100 0.20  
0.014 0.0075 0.19  
0.16  
0.15  
0.244  
0.228  
0.039 0.028  
0.016 0.024  
0.028  
0.012  
inches 0.069  
0.01 0.004  
Notes  
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.  
2. Plastic or metal protrusions of 0.25 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
EIAJ  
95-02-04  
97-05-22  
SOT96-1  
076E03S  
MS-012AA  
Fig.15. SOT96 surface mounting package.  
Notes  
1. This product is supplied in anti-static packaging. The gate-source input must be protected against static  
discharge during transport or handling.  
2. Refer to Integrated Circuit Packages, Data Handbook IC26.  
3. Epoxy meets UL94 V0 at 1/8".  
August 1999  
6
Rev 1.000  
Philips Semiconductors  
Product specification  
Dual N-channel TrenchMOSTM transistor  
PHKD3NQ10T  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 1999  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
August 1999  
7
Rev 1.000  

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