SL3S1205FUD2/HAP [NXP]
UCODE 8/8m;型号: | SL3S1205FUD2/HAP |
厂家: | NXP |
描述: | UCODE 8/8m |
文件: | 总38页 (文件大小:389K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
SL3S1205_15
UCODE 8/8m
Rev. 3.5 — 1 April 2021
398435
Product data sheet
COMPANY PUBLIC
1 General description
The UCODE 8 and UCODE 8m ICs are the latest NXP products of the UCODE family.
UCODE 8/8m offers high performance and features for use in the most demanding RFID
tagging applications.
Particularly well suited for inventory management applications, like e.g Retail and
Fashion, with its great RF performance for any given form factor, UCODE 8/8m
enables long read distance and fast inventory of dense RFID tag population. With its
broadband design, it offers the possibility to manufacture true global RFID label with
great performance over worldwide regulations.
The device also provides a Self Adjust Feature, a Product Status Flag for Electronic
Article Surveillance (EAS) application, pre-serialized 96-bit EPC, Brand Identifier and the
EPC Gen2v2 compliant Untraceable command.
NXP Semiconductors
SL3S1205_15
UCODE 8/8m
2 Features and benefits
2.1 Key features
• Read sensitivity -23 dBm
• Write sensitivity -18 dBm
• Innovative functionality
– Self Adjust
– Memory Safeguard
– Brand Identifier
– Untraceable
– Pre-serialization for 96-bit EPC
– Integrated Product Status Flag (PSF)
• Compatible with single-slit antenna
• Up to 128-bit EPC
• 96-bit Unique Tag Identifier (TID) factory locked, including 48-bit unique serial number
• EPC Gen2v2
2.1.1 Memory
• 128-bit/96-bit (UCODE 8/UCODE 8m) of EPC memory
• Supports pre-serialization for 96-bit EPC
• 96-bit Tag IDentifier (TID) factory locked
• 48-bit unique serial number factory-encoded into TID
• 0-bit/32-bit (UCODE 8/UCODE 8m) User Memory
• 32-bit kill password to permanently disable the tag
• 32-bit access password
• Wide operating temperature range: -40 °C up to +85 °C
• Minimum 100k write cycle endurance
SL3S1205_15
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UCODE 8/8m
2.2 Supported features
• All mandatory commands of EPC global specification V.2.0.1 are implemented
including:
– Lock or permalock
– Kill Command
• The following optional commands are implemented in conformance with the EPC
specification:
– Access
– BlockWrite (2 words, 32-bit)
– Untraceable
• Product Status Flag bit: enables the UHF RFID tag to be used as EAS (Electronic
Article Surveillance) tag without the need for a back-end database.
• Self Adjust for automated tag performance optimization
• Memory Safeguard: enables countermeasures, like parity and margin checks as well as
automated error correction, to ensure integrity of customer data.
• Brand Identifier: enables product authentication verification
All supported features of UCODE 8/8m can be activated using standard EPCglobal
READ / WRITE / ACCESS / SELECT commands. No custom commands are needed to
take advantage of all the features.
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UCODE 8/8m
3 Applications
3.1 Target market
• Retail
– Brick and mortar
– e-commerce
– omnichannel
• Supply chain management
• Shipping services
• Airline luggage tracking
• Laundry services
3.2 Applications
• High accurate and fast inventory management, enabling omnichannel retail processes
• Tracking along the supply chain from source to store
• High-speed store checkout process, bringing convenience to the customer
• Loss prevention
• Brand Protection
• After sales operations: Return and Warranty management
Outside the applications mentioned above, please contact NXP Semiconductors for
support.
SL3S1205_15
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UCODE 8/8m
4 Ordering information
Table 1.ꢀOrdering information
Type number
Package
Name
IC type
Description
Version
SL3S1205FUD/HA
SL3S1215FUD/HA
SL3S1205FUD2/HA
Wafer
UCODE 8
Die on sawn 8" 120 μm wafer 10 μm Polyimide spacer not applicable
with Large Pads, Stealth Dicing
Wafer
Wafer
UCODE 8m Die on sawn 8" 120 μm wafer 10 μm Polyimide spacer not applicable
with Large Pads, Stealth Dicing
UCODE 8
Die on sawn 12" 120 μm wafer 10 μm Polyimide
spacer
not applicable
not applicable
not applicable
not applicable
with Large Pads, Conventional Dicing
SL3S1215FUD2/HA
Wafer
UCODE 8m Die on sawn 12" 120 μm wafer 10 μm Polyimide
spacer
with Large Pads, Conventional Dicing
SL3S1205FUD2/HAP Wafer
SL3S1215FUD2/HAP Wafer
UCODE 8
Die on sawn 12" 120 μm wafer 10 μm Polyimide
spacer
with Large Pads, Plasma Dicing
UCODE 8m Die on sawn 12" 120 μm wafer 10 μm Polyimide
spacer
with Large Pads, Plasma Dicing
SL3S1205_15
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UCODE 8/8m
5 Block diagram
The UCODE 8/8m IC consists of three major blocks:
• Analog Interface
• Digital Control
• EEPROM
The analog part provides stable supply voltage and demodulates data received from the
reader which is then processed by the digital part. Further, the modulation transistor of
the analog part transmits data back to the reader.
The digital section includes the state machines, processes the protocol and handles
communication with the EEPROM, which contains the EPC and the user data.
ANALOG
RF INTERFACE
DIGITAL CONTROL
ANTICOLLISION
EEPROM
VREG
VDD
RF1
READWRITE
CONTROL
DEMOD
data
in
RECT
RF2
ACCESS CONTROL
MEMORY
antenna
EEPROM INTERFACE
CONTROL
MOD
data
out
R/W
Memory Safeguard
CONTROL
Adjust
RF INTERFACE
CONTROL
SEQUENCER
CHARGE PUMP
aaa-027138
Figure 1.ꢀBlock diagram of UCODE 8/8m IC
SL3S1205_15
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UCODE 8/8m
6 Pinning information
SL312x5 trademark
RF2
RF1
TP1
TP2
aaa-027143
Figure 2.ꢀPinning bare die, Large Pads
6.1 Pin description
Table 2.ꢀPin description bare die
Symbol
TP1
Description
test pad 1
RF1
antenna connector 1
test pad 2
TP2
RF2
antenna connector 2
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SL3S1205_15
UCODE 8/8m
7 Wafer layout
(12)
(1)
RF2
RF1
(9)
(3)
(8)
(5)
(7)
TP1
TP2
(2)
(6)
Y
(11)
(10)
(13)
X
(4)
not to scale!
aaa-027144
1. Die to Die distance (metal sealring - metal sealring) 19 μm, (X-scribe line width: 15 μm)
2. Die to Die distance (metal sealring - metal sealring) 19 μm, (Y-scribe line width: 15 μm)
3. Chip step, Y-length: 490 μm
4. Chip step, X-length: 480 μm
5. Bump to bump distance X (RF1 - RF2): 115 μm
6. Distance bump to metal sealring Y: 21.5 μm
7. Bump size (TP1, TP2) Y: 100 μm
8. Bump to bump distance Y (RF1 - TP2, RF2 - TP1): 50 μm
9. Bump size (RF1, RF2) Y: 278 μm
10. Distance bump to metal sealring X: 21.5 μm
11. Bump size (TP1, TP2) X: 134.2 μm
12. Bump size (RF1, RF2) X: 151.5 μm
13. Distance bump to metal sealring X: 441.5 μm
Remark: TP1 and TP2 are electrically disconnected after dicing
Figure 3.ꢀUCODE 8/8m, 8" wafer layout, Large Pads, stealth dicing
SL3S1205_15
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UCODE 8/8m
(12)
(1)
RF2
RF1
(9)
(3)
(8)
(5)
(7)
TP1
TP2
(2)
(6)
Y
(11)
(10)
(13)
X
(4)
not to scale!
aaa-027144
1. Die to Die distance (metal sealring - metal sealring) 39 μm, (X-scribe line width: 35 μm)
2. Die to Die distance (metal sealring - metal sealring) 39 μm, (Y-scribe line width: 35 μm)
3. Chip step, Y-length: 510 μm
4. Chip step, X-length: 500 μm
5. Bump to bump distance X (RF1 - RF2): 115 μm
6. Distance bump to metal sealring Y: 21.5 μm
7. Bump size (TP1, TP2) Y: 100 μm
8. Bump to bump distance Y (RF1 - TP2, RF2 - TP1): 50 μm
9. Bump size (RF1, RF2) Y: 278 μm
10. Distance bump to metal sealring X: 21.5 μm
11. Bump size (TP1, TP2) X: 134.2 μm
12. Bump size (RF1, RF2) X: 151.5 μm
13. Distance bump to metal sealring X: 441.5 μm
Remark: TP1 and TP2 are electrically disconnected after dicing
Figure 4.ꢀ UCODE 8/8m, 12" wafer layout, Large Pads, conventional dicing
SL3S1205_15
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UCODE 8/8m
(12)
(1)
RF2
RF1
(9)
(3)
(8)
(5)
(7)
TP1
TP2
(2)
(6)
Y
(11)
(10)
(13)
X
(4)
not to scale!
aaa-027144
1. X-scribe line width not expanded: 6.6 μm (Expanded, typically 15 μm)
2. Y-scribe line width not expanded: 6.6 μm (Expanded, typically 15 μm)
3. Chip step, Y-length: 477.6 μm
4. Chip step, X-length: 467.6 μm
5. Bump to bump distance X (RF1 - RF2): 115 μm
6. Distance bump to metal sealring Y: 17.5 μm
7. Bump size (TP1, TP2) Y: 100 μm
8. Bump to bump distance Y (RF1 - TP2, RF2 - TP1): 50 μm
9. Bump size (RF1, RF2) Y: 278 μm
10. Distance bump to metal sealring X: 17.5 μm
11. Bump size (TP1, TP2) X: 134.2 μm
12. Bump size (RF1, RF2) X: 151.5 μm
13. Distance bump to metal sealring X: 435.5 μm
Remark: TP1 and TP2 are electrically disconnected after dicing
Figure 5.ꢀ UCODE 8/8m, 12" wafer layout, Large Pads, plasma dicing
SL3S1205_15
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UCODE 8/8m
8 Mechanical specification
The UCODE 8 wafers are available in 120 μm thickness. For Large Gold Pads the 120
μm thick wafer is enhanced with 10 μm Polyimide spacer resulting in less coupling
between the antenna and the active circuit, leaving a larger process window for
assembly.
8.1 Wafer specification
8.1.1 8 inch Wafer with Large Pads, stealth dicing
See "Data sheet - Delivery type description – General specification for 8" wafer on UV-
tape with electronic fail die marking, BU-S&C document number: 1093**"
Table 3.ꢀ8 inch specification with Large Pads, stealth dicing
Wafer
Designation
each wafer is scribed with batch number and
wafer number
Diameter
200 mm (8") unsawn- 205 mm typical sawn
on foil
Thickness
120 μm ± 15 μm
Number of pads
Pad location
4
non-diagonal / placed in chip corners
Process
CMOS 0.14 μm
25 wafers
Batch size
Net printed dies per wafer
Wafer backside
Material
120794
Si
Treatment
ground and stress release
Ra max. 0.5 μm, Rt max. 5 μm
Roughness
Chip dimensions
Die size excluding scribe
Scribe line width:
0.465 mm × 0.475 mm = 0.22 mm2
x-dimension = 15 μm
y-dimension = 15 μm
Passivation on front
Type
Sandwich structure
Material
PE-Nitride (on top)
Thickness
1.75 μm total thickness of passivation
10 μm ± 2 μm
Polyimide spacer
Au pads
Pad material
Pad hardness
> 99.9 % pure Au
35 – 80 HV 0.005
SL3S1205_15
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UCODE 8/8m
Table 3.ꢀ8 inch specification with Large Pads, stealth dicing...continued
Pad shear strength
> 70 MPa
3 μm
Pad height
Pad height uniformity
– within a die
max. 2 μm
max. 4 μm
max. 3 μm
– within a wafer
Pad flatness
Pad size
– RF1, RF2 (max. details see wafer layout)
– TP1, TP2 (max. details see wafer layout)
Pad size variation
151.5 μm × 278 μm
134.2 μm × 100 μm
± 5 μm
8.1.2 12 inch Wafer with Large Pads
See "Data sheet - Delivery type description – General specification for 12" wafer on UV-
tape with electronic fail die marking, BU-S&C document number: 1862**"
Table 4.ꢀ12 inch specification with Large Pads, conventional dicing
Wafer
Designation
each wafer is scribed with batch number and
wafer number
Diameter
300 mm (12") unsawn
Thickness
120 μm ± 15 μm
Number of pads
Pad location
4
non-diagonal / placed in chip corners
Process
CMOS 0.14 μm
25 wafers
Batch size
Net printed dies per wafer
Wafer backside
Material
258934
Si
Treatment
ground and stress release
Ra max. 0.5 μm, Rt max. 5 μm
Roughness
Chip dimensions
Die size excluding scribe
Scribe line width:
0.465 mm × 0.475 mm = 0.22 mm2
x-dimension = 35 μm
y-dimension = 35 μm
Passivation on front
Type
Sandwich structure
Material
PE-Nitride (on top)
Thickness
1.75 μm total thickness of passivation
10 μm ± 2 μm
Polyimide spacer
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UCODE 8/8m
Table 4.ꢀ12 inch specification with Large Pads, conventional dicing ...continued
Au pads
Pad material
> 99.9 % pure Au
35 – 80 HV 0.005
> 70 MPa
Pad hardness
Pad shear strength
Pad height
3 μm
Pad height uniformity
– within a die
max. 2 μm
max. 4 μm
max. 3 μm
– within a wafer
Pad flatness
Pad size
– RF1, RF2 (max. details see wafer layout)
– TP1, TP2 (max. details see wafer layout)
Pad size variation
151.5 μm × 278 μm
134.2 μm × 100 μm
± 5 μm
Table 5.ꢀ12 inch specification with Large Pads, plasma dicing
Wafer
Designation
each wafer is scribed with batch number and
wafer number
Diameter
300 mm (12") unsawn
Thickness
120 μm ± 15 μm
Number of pads
Pad location
4
non-diagonal / placed in chip corners
Process
CMOS 0.14 μm
25 wafers
Batch size
Net printed dies per wafer
Wafer backside
Material
296307
Si
Treatment
ground and stress release
Ra max. 0.5 μm, Rt max. 5 μm
Roughness
Chip dimensions
Die size excluding scribe
Scribe line width:
0.461 mm × 0.471 mm = 0.22 mm2
x-dimension = 6.6 μm
y-dimension = 6.6 μm
Passivation on front
Type
Sandwich structure
Material
PE-Oxide (on top)
Thickness
2.25 μm total thickness of passivation
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UCODE 8/8m
Table 5.ꢀ12 inch specification with Large Pads, plasma dicing ...continued
Polyimide spacer 10 μm ± 2 μm
Au pads
Pad material
> 99.9 % pure Au
35 – 80 HV 0.005
> 70 MPa
Pad hardness
Pad shear strength
Pad height
3 μm
Pad height uniformity
– within a die
max. 2 μm
max. 4 μm
max. 3 μm
– within a wafer
Pad flatness
Pad size
– RF1, RF2 (max. details see wafer layout)
– TP1, TP2 (max. details see wafer layout)
Pad size variation
151.5 μm × 278 μm
134.2 μm × 100 μm
± 5 μm
8.1.3 Fail die identification
No ink dots are applied to the wafer.
Electronic wafer mapping (SECS II format) covers the electrical test results and
additionally the results of mechanical/visual inspection.
See "Data sheet - Delivery type description – General specification for 8" wafer on UV-
tape with electronic fail die marking, BU-S&C document number: 1093**"
See "Data sheet - Delivery type description – General specification for 12" wafer on UV-
tape with electronic fail die marking, BU-S&C document number: 1862**"
8.1.4 Map file distribution
See "Data sheet - Delivery type description – General specification for 8" wafer on UV-
tape with electronic fail die marking, BU-S&C document number: 1093**"
See "Data sheet - Delivery type description – General specification for 12" wafer on UV-
tape with electronic fail die marking, BU-S&C document number: 1862**"
SL3S1205_15
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UCODE 8/8m
9 Functional description
9.1 Air interface standards
The UCODE 8/8m fully supports all parts of the "EPCTM Radio-Frequency Identity
Protocols Generation-2 UHF RFID, Specification for RFID Air Interface, Protocol for
Communications at 860 MHz to 960 MHz, Version 2.0.1".
9.2 Power transfer
The interrogator provides an RF field that powers the tag, equipped with a UCODE 8/8m.
The antenna transforms the impedance of free space to the chip input impedance in
order to get the maximum power for the UCODE 8/8m on the tag.
The RF field, which is oscillating on the operating frequency provided by the interrogator,
is rectified to provide a smoothed DC voltage to the analog and digital modules of the IC.
The antenna that is attached to the chip may use a DC connection between the two
antenna pads. Therefore the UCODE 8/8m also enables loop antenna design.
9.3 Data transfer
9.3.1 Interrogator to tag Link
An interrogator transmits information to the UCODE 8/8m by modulating an UHF RF
signal. The UCODE 8/8m receives both information and operating energy from this RF
signal. Tags are passive, meaning that they receive all of their operating energy from the
interrogator's RF waveform.
An interrogator is using a fixed modulation and data rate for the duration of at least one
inventory round. It communicates to the UCODE 8/8m by modulating an RF carrier.
For further details, refer to "Interrogator-to-tag (R=>T) communications"
9.3.2 Tag to interrogator Link
Upon transmitting a valid command, an interrogator receives information from a UCODE
8/8m tag by transmitting an unmodulated RF carrier and listening for a backscattered
reply. The UCODE 8/8m backscatters by switching the reflection coefficient of its antenna
between two states in accordance with the data being sent. For further details, refer to
"Tag-to-Interrogator (T=>R) communications"
The UCODE 8/8m communicates information by backscatter-modulating the amplitude
and/or phase of the RF carrier. Interrogators shall be capable of demodulating either
demodulation type.
The encoding format, selected in response to interrogator commands, is either FM0
baseband or Miller-modulated subcarrier.
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UCODE 8/8m
9.4 Supported commands
The UCODE 8/8m supports all mandatory EPCglobal V2.0.1 commands including
• KILL command
• PERMALOCK or LOCK command
In addition the UCODE8/8m supports the following optional commands:
• ACCESS
• Block Write (32 bit) on even addresses
• Untraceable
9.5 UCODE 8/8m memory
The UCODE 8/8m memory is implemented according to EPCglobal V2.0.1:
Table 6.ꢀUCODE 8 memory sections
Name
Size
Bank
00b
01b
01b
10b
Reserved memory (32-bit Access and 32 bit Kill password)
EPC (excluding 16 bit CRC-16 and 16-bit PC)
UCODE 8 Configuration Word
64 bit
128 bit
16 bit
96 bit
TID (including permalocked unique 48-bit serial number)
Table 7.ꢀUCODE 8m memory sections
Name
Size
Bank
00b
01b
01b
10b
11b
Reserved memory (32-bit Access and 32 bit Kill password)
EPC (excluding 16 bit CRC-16 and 16-bit PC)
UCODE 8 Configuration Word
64 bit
96 bit
16 bit
96 bit
32 bit
TID (including permalocked unique 48-bit serial number)
User Memory
The logical address of all memory banks begins at zero (00h).
In addition to the four memory banks, one configuration word to handle the UCODE 8/8m
specific features is available at EPC bank 01 address bit-200h. The configuration word is
described in detail in Section 9.6.1
The TID complies to the GS1 EPC Tag Data Standard. See "EPC Tag Data Standard,
Release 1.10"
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UCODE 8/8m
9.5.1 UCODE 8/8m overall memory map
Table 8.ꢀUCODE 8 overall memory map
Bank
Address
Type
Content
Initial
all 00h
all 00h
Remark
Bank 00
00h to 1Fh
20h to 3Fh
00h to 0Fh
reserved
reserved
EPC
Kill password
Access password
unlocked memory
unlocked memory
Bank 01
EPC
CRC-16: refer to "EPC
Global Gen2v2"
memory mapped
calculated CRC
10h to 14h
15h
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
TID
EPC length
UMI
00110b
0b
unlocked memory
hardwired to 0
hardwired to 0
unlocked memory
unlocked memory
indicator bit
16h
XPC indicator
0b
17h to 1Fh
20h to 9Fh
200h
numbering system indicator 00h
[1]
EPC
Bank 01
EPC check
EPC correction
EPC NOK
0b
Config Word
201h
0b
indicator bit
202h
0b
indicator bit
action bit[2]
action bit[2]
203h
EPC+TID
0b
204h
Brand Identifier
Self Adjust Cap 1
Self Adjust Cap 0
Self Adjust disable
RFU
0b
205h
0b
indicator bit
206h
0b
indicator bit
207h
0b
permanent bit[3]
locked memory
permanent bit[3]
locked memory
locked memory
locked memory
locked memory
locked memory
permanent bit[3]
locked memory
locked memory
locked memory
locked memory
locked memory
locked memory
208h
0b
209h
max. backscatter strength
RFU
1b
20Ah
0b
20Bh
RFU
0b
20Ch
RFU
0b
20Dh
RFU
0b
20Eh
RFU
0b
20Fh
PSF flag
0b
Bank 10
TID
00h to 07h
08h to 13h
14h
allocation class identifier
1110 0010b
TID
tag mask designer identifier 1000 0000 0110b
TID
config word indicator
tag model number
XTID header
1b[4]
15h to 1Fh
20h to 2Fh
30h to 5Fh
TID
TMNR[5]
2000h
SNR
TID
TID
serial number
[1] HEX E280 6894 0000 nnnn nnnn nnnn 0000 0000where nare the nibbles of the SNR from the TID
[2] Action bits: meant to trigger a feature upon a SELECT command on the related bit ref feature control mechanism, see Section 9.6.1
[3] Permanent bit: permanently stored bits in the memory; Read/Writeable according to EPC bank lock status, see Section 9.6.1
[4] Indicates the existence of a Configuration Word at the end of the EPC number
[5] See Figure 6
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UCODE 8/8m
Table 9.ꢀUCODE 8m overall memory map
Bank
Address
Type
Content
Initial
all 00h
all 00h
Remark
Bank 00
00h to 1Fh
20h to 3Fh
00h to 0Fh
reserved
reserved
EPC
Kill password
Access password
unlocked memory
unlocked memory
Bank 01
EPC
CRC-16: refer to "EPC
Global Gen2v2"
memory mapped
calculated CRC
10h to 14h
15h
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
EPC
TID
EPC length
UMI
00110b
1b
unlocked memory
hardwired to 1
hardwired to 0
unlocked memory
unlocked memory
indicator bit
16h
XPC indicator
0b
17h to 1Fh
20h to 7Fh
200h
numbering system indicator 00h
[1]
EPC
Bank 01
EPC check
0b
Config Word
201h
EPC correction
EPC NOK
0b
indicator bit
202h
0b
indicator bit
action bit[2]
action bit[2]
203h
EPC+TID
0b
204h
Brand Identifier
Self Adjust Cap 1
Self Adjust Cap 0
Self Adjust disable
RFU
0b
205h
0b
indicator bit
206h
0b
indicator bit
207h
0b
permanent bit[3]
locked memory
permanent bit[3]
locked memory
locked memory
indicator bit
208h
0b
209h
max. backscatter strength
RFU
1b
20Ah
0b
20Bh
RFU
0b
20Ch
User Memory check
User Memory correction
User Memory NOK
PSF flag
0b
20Dh
0b
indicator bit
20Eh
0b
indicator bit
20Fh
0b
permanent bit[3]
locked memory
locked memory
locked memory
locked memory
locked memory
locked memory
unlocked memory
Bank 10
TID
00h to 07h
08h to 13h
14h
allocation class identifier
1110 0010b
TID
tag mask designer identifier 1000 0000 0110b
TID
config word indicator
tag model number
XTID header
1b[4]
15h to 1Fh
20h to 2Fh
30h to 5Fh
00h to 1Fh
TID
TMNR[5]
2000h
SNR
TID
TID
serial number
Bank 11
UM
User Memory
all 00h
User Memory
[1] HEX E280 6994 0000 nnnn nnnn nnnnwhere nare the nibbles of the SNR from the TID
[2] Action bits: meant to trigger a feature upon a SELECT command on the related bit ref feature control mechanism, see Section 9.6.1
[3] Permanent bit: permanently stored bits in the memory; Read/Writeable according to EPC bank lock status, see Section 9.6.1
[4] Indicates the existence of a Configuration Word at the end of the EPC number
[5] See Figure 6
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UCODE 8/8m
9.5.2 UCODE 8/8m TID memory details
Model Number
Sub
Mask
Designer
ID
First 48 bit of TID
memory
Config
Word
Indicator
Class ID
Version
XTID
Header
Version Nr. (Silicon) Nr.
UCODE 8
E28068942000
E2h
E2h
806h
806h
1b
1b
0001b
0011b
0010100b
0010100b
2000h
2000h
UCODE 8m E28069942000
Addresses 00h
5Fh
TID
MS Byte
LS Byte
MSBit
MSBit
00h
LSBit
LSBit
Bit
Address
07h 08h
13h 14h
1Fh 20h
2Fh 30h
5Fh
Class Identifier
Mask-Designer Identifier
11
(NXP; with XTID)
Model Number
XTID
Serial Number
11
15
Bits
7
0
0
0
0 47
894h
(UCODE 8)
994h
0
E2h
806h
2000h
(indication of 48bit
unique SNR)
000000000000h to FFFFFFFFFFFFh
(EAN.UCC)
(UCODE 8m)
18h 19h
1Fh
Address 14h
C.
W.
I.
Sub Version Number
Model Number
Bits
0
3
6
0
0
1b
0001b
0011b
0010100b
(UCODE 8)
0010100b
1b
aaa-027137
(UCODE 8m)
Figure 6.ꢀUCODE 8/8m TID memory structure
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UCODE 8/8m
9.6 Supported features
The UCODE 8/8m is equipped with a number of additional features. They are
implemented in such a way that standard EPCglobal READ / WRITE / ACCESS /
SELECT commands can be used to operate these features.
The Configuration Word, as mentioned in the memory map, describes the additional
features at address 200h of the EPC memory.
Bit 14h of the TID indicates the existence of a Configuration Word. This flag enables the
selection of configuration word enhanced transponders in mixed tag populations.
9.6.1 UCODE 8/8m features control mechanism
The different features of the UCODE 8/8m can be activated / de-activated by addressing
or changing the content of the corresponding bit in the configuration word at address
200h in the EPC memory bank (see Table 10). The de-activation of the action bit features
will only happen after chip reset.
Table 10.ꢀConfiguration word UCODE 8/8m
Indicator bit
Action bit
EPC+TID
Indicator bit
Permanent bit
EPC
EPC
EPC
NOK
Brand
Self Adjust
Cap 1
Self Adjust
Cap 0
Self Adjust
disable
Check Corr
Identifier
0
1
2
3
4
5
6
7
Table 11.ꢀConfiguration word UCODE 8/8m ... continued
Locked Permanent
memory bit
Locked memory
Indicator bit
Permanent bit
RFU
max.backsca RFU
RFU
User Memory User Memory User Memory PSF bit
tter
Check
Corr
NOK
strength
8
9
10
11
12
13
14
15
The configuration word contains 3 different type of bits:
• Action bits: meant to trigger a feature upon a SELECT command on the related bit:
EPC+TID
Brand Identifier
• Permanent bits: permanently stored bits in the memory
Self Adjust disable
Max. Backscatter Strength
PSF Alarm bit
• Indicator bits: cannot be changed by command
EPC Check/Corr/NOK
User Memory Check/Corr/NOK
Self Adjust Cap0/Cap1
The activation or the de-activation of the feature behind the permanent bits happens only
when attempting to write a "1" value to the related bit (value toggling) - writing "0" value
has no effect. If the feature is activated, the related bit will be read with a "1" value and, if
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UCODE 8/8m
de-activated, with a "0" value. The permanent bits can only be toggled by using standard
EPC WRITE (not a BlockWrite) if the EPC bank is unlocked or within the SECURED state
if the EPC is locked. If the EPC is permalocked, they cannot be changed.
Action bits will trigger a certain action only if the pointer of the SELECT command exactly
matches the action-bit address (i.e. 203h or 204h), if the length=1 and if mask=1b (no
multiple triggers of actions possible within one single SELECT command).
If the truncate bit in the SELECT command is set to "1", the SELECT will be ignored. A
SELECT on action bits will not change the digital state of the chip.
The action bits can be triggered regardless if the EPC memory is unlocked, locked or
permalocked.
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UCODE 8/8m
9.6.2 Memory Safeguard
9.6.2.1 Description
The Memory Safeguard of UCODE 8/8m consist of three different countermeasures
which ensure integrity of the stored data:
ECC (Error correction code):
The implemented ECC is applied on the EPC- and User-Memory. With this feature, a
single bit failure in the memory is detected and corrected automatically. In case of 2 bit
fail, an indication is given.
EPC Memory:
The config word bit 200h (EPC check) indicates, if the EPC check is active ("1"). In case
a single bit was corrected this will be indicated by the bit 201h (EPC Corr). Should a 2-bit
failure occur bit 202h (EPC NOK) will be activated ("1"). In this case, no error correction
will be applied and the EPC memory content readout will provide the actual content.
User Memory:
The config word bit 20Ch (User Memory check) indicates if the User Memory check
is active ("1"). In case a single bit was corrected this will be indicated by the bit 20Dh
(User Memory Corr). Should a 2-bit failure occur, bit 20Eh (User Memory NOK) will be
activated ("1"). In this case, no error correction will be applied and the User Memory
content readout will provide the actual content.
This feature will be activated in case a Lock operation is applied on the according
memory bank. If there is a password lock and a change of the memory content in the
secured state, the ECC will be not re-calculated and the feature is disabled. To re-enable
the ECC functionality also in this condition, an unlock and re-lock is required.
Parity check:
A parity check on the TID is implemented to offer the possibility to identify a change in
the TID. The parity bit (Even parity) will be calculated and locked in the manufacturing
process. For a check, the TID content needs to be read out and parity checked.
Margin Check
The implemented margin check is acting on the EPC-, Reserved- and User-Memory.
During performing a Lock operation on the targeted memory bank the IC checks for
sufficient programming margin of the memory cell and only responds after a successful
check. In case of insufficient margin an error code will be responded and the Lock not
completed. A re-check on already locked memory banks requires an unlock and re-lock
command.
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UCODE 8/8m
9.6.3 Self Adjust
9.6.3.1 Description
The UCODE 8/8m has an automatic mechanism implemented which adjusts the chip
sensitivity to a maximum in the operated environment. This adjustment will be performed
at startup and selects between three different input capacitance values. The feature is
enabled by default, but can also be deactivated by the config word bit 207h (Self Adjust
disable). In case of deactivation, the center capacitance is used.
The indicator bits 205h (Self Adjust Cap 1) and 206h (Self Adjust Cap 0) give information
which capacitor is active ("1"). The startup is performed with the lowest value which is
center capacitance minus Cap 0 (60 fF) and is then adjusted up to center capacitance
plus Cap 1 (100 fF).
9.6.4 Brand Identifier
9.6.4.1 Description
This new feature allows brand owners to implement a product originality check option
for their products. The customer dedicated unique 16-bit brand identifier is programmed
during manufacturing process by NXP and therefore unalterable stored in the memory.
A SELECT command on bit 204h (Brand identifier) in the configuration word triggers the
UCODE8/8m to respond in the inventory round with PC + EPC + Brand Identifier + CRC.
In order to prevent manipulation, the Brand Identifier is scrambled with the RN16 and
not sent in plain. The implemented scrambling is performed by bitwise XOR operation
of the 16-bit Brand Identifier and the RN16. At the reader, the Brand identifier can be
descrambled and the originality check completed.
The PC value is adjusted accordingly for UCODE 8/8m. A SELECT on the Brand
Identifier bit always gives a Tag matching.
The usage of this feature requires an update on the reader firmware with the Brand
Identifier check routine.
Default value of the UCODE 8/8m Brand Identifier is "AAAAh". Customer-specific Brand
Identifiers can be requested by a dedicated product ordering code. For details, contact
your NXP sales representative.
The Brand Identifier feature cannot be used in combination with the EPC+TID feature.
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UCODE 8/8m
9.6.5 EPC+TID
9.6.5.1 Description
This feature enables the read out the EPC+TID memory content in a faster way
compared to a standard readout sequence.
A SELECT on the config word bit 203h (EPC+TID) will trigger the UCODE 8/8m to reply
with the EPC+TID after receiving the ACK command during the inventory round.
In case only the TID should be replied by this feature, the EPC length in the PC needs to
be set to "0".
9.6.6 Product Status Flag (PSF)
9.6.6.1 Description
The PSF bit can be used for easy EAS (Electronic Article Surveillance) implementations
or as general-purpose check flag.
In order to detect tags with activated PSF, a SELECT command on bit 20Fh (PSF Bit)
in the configuration word is required. In the following inventory round, only PSF enabled
chips reply their EPC number.
9.6.7 Backscatter strength reduction
The UCODE 8/8m features two levels of backscatter strengths. Per default, maximum
backscatter is enabled in order to enable maximum read rates. A deactivation of this
feature can be done by clearing bit 209h (max. backscatter strength) in the configuration
word, which reduces the backscatter strength if needed.
9.6.8 Pre-serialization of the 96-bit EPC
9.6.8.1 Description
UCODE 8/8m are delivered with a pre-serialized content of the 96-bit EPC, which is the
initial EPC length settings of UCODE 8/8m.
The EPC content is identical to the TID content except of the 16-bit XTID content which is
set to 16-bit 0's.
TID
Class Identifier
Mask-Designer Identifier
Model Number
XTID
Serial Number
Bits
7
0
11
0
11
0
15
0
0
47
47
0
Class Identifier
Mask-Designer Identifier
Model Number
0000 0000 0000 0000
Serial Number
serialized EPC
Bits
7
0
11
0
11
0
15
0
aaa-027142
Figure 7.ꢀPre-serialization of 96-bit EPC
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UCODE 8/8m
9.6.9 Single-slit antenna solution
9.6.9.1 Description
In UCODE 8/8m, the test pads TP1 and TP2 are electrically disconnected and therefore
can be safely short-circuited to the RF pads (RF1, RF2) (see figure below).
Single-slit antenna enables easier assembly and antenna design. In addition to the
standard antenna assembly, the related increased input capacitance (see Table 15) can
be used for optimization for different antenna design.
standard assembly
RF2
TP1
RF1
TP2
supporting pads
aaa-027139
Figure 8.ꢀStandard antenna design versus single-slit antenna
single-slit assembly
RF2
TP1
RF1
TP2
aaa-027351
Figure 9.ꢀSingle-slit assembly
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UCODE 8/8m
9.6.10 Large Pads
9.6.10.1 Description
The large gold pads introduced in UCODE 8/8m enable more robust and reliable
assembly. The new pad design allows not only more freedom in the placement accuracy
(see "Rotation tolerant pad design" ). It also brings advantages in high-speed assembly
due to the dual axis glue spacer (see "Dual axis glue spacer" ).
RF2
TP1
RF1
TP2
aaa-027141
Figure 10.ꢀRotation tolerant pad design
RF2
RF1
TP1
TP2
aaa-027140
Figure 11.ꢀDual axis glue spacer
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UCODE 8/8m
9.6.11 Custom commands
The Untraceable function allows the UCODE 8/8m to hide the complete or parts of
the EPC, TID and/or user memory. In addition, the read range can be completely or
temporarily reduced. This command can only be executed from the secured state.
Memory parts which are set untraceable are acting as non-existing in the Open state.
EPC-field: Specifies the number of words of the EPC memory which the UCODE 8/8m
back scatters. A change of this field therefore also changes the L bit in the Protocol
Control (PC) word.
TID-field: Hide some ("01") hides the TID memory from address 20h (included) onwards.
Range-field: In case of activated range toggling, the read range reduction toggles from
the actual value to the second (e.g. when actual state is normal it toggles to reduced). In
case of power loss the chip reverts to its prior state.
UCODE 8/8m does not support the U bit and therefore ignores this value.
Table 12.ꢀUntraceable command
Command RFU U
EPC
TID
User
Range
RN
CRC
No. of bits 16
2
1
6
2
1
2
16
16
Description 1110 0010 00
0000 0000
do
not
MSB:"0": show
memory above
"00": hide none "0":
"00": normal handle CRC-16
"01": toggle
view
"01": hide some
"10": hide all
"11": RFU
care EPC
"1": hide
"10":
reduced
"1": hide memory
above
EPC
"11": RFU
5 LSBs: new EPC
length
Table 13.ꢀUntraceable command-response table
Starting State
Condition
Response
Next State
ready
ready
all
all
-
-
arbitrate, reply,
acknowledged
arbitrate
open
all
-
open
secured
killed
executable
all
backscatter header when done secured
killed
-
In case of access to the memory that is set to untraceable, the error condition "memory
overrun" is returned.
For further details, refer to "EPC Global Gen2v2"
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UCODE 8/8m
10 Limiting values
Table 14.ꢀLimiting values
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to
RFN. [1] [2]
Symbol
Parameter
Conditions
Min
Max
Unit
Bare die limitations
Tstg
storage temperature
-55
-40
-
+125
+85
± 2
°C
°C
kV
Tamb
VESD
ambient temperature
[3] [4]
electrostatic discharge
voltage
Human body model
maximum power
Pad limitations
Pi input power
-
100
mW
dissipation, RF1/RF2
pad
[1] Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any conditions other than those described in the
Operating Conditions and Electrical Characteristics section of this specification is not implied.
[2] This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of
excessive static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater
than the rated maxima.
[3] For ESD measurement, the die chip has been mounted into a CDIP20 package.
[4] HBM: ANSI/ESDA/JEDEC JS-001
CAUTION
This device is sensitive to ElectroStatic Discharge (ESD). Observe
precautions for handling electrostatic sensitive devices.
Such precautions are described in the ANSI/ESD S20.20, IEC/ST 61340-5,
JESD625-A or equivalent standards.
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UCODE 8/8m
11 Characteristics
11.1 UCODE 8/8m bare die characteristics
Table 15.ꢀUCODE 8/8m RF interface characteristics (RF1, RF2)
Symbol
fi
Parameter
Conditions
Min
Typ
-
Max
Unit
MHz
dBm
dBm
input frequency
minimum input power
840
960
[1] [2] [3]
[4]
Pi(min)
READ sensitivity
-
-
- 22.9
+ 1
-
-
reduced operating
range
[4]
Pi(min)
t 16bit
minimum input power
encoding speed
WRITE sensitivity
16-bit
-
-
-
-
-
-
-
-
-17.8
-
-
-
-
-
-
-
dBm
ms
ms
pF
Ω
[5]
0.7
[5]
32-bit (block write)
1.2
[2] [6] [7]
[2] [6] [7]
[2] [6] [7]
[2] [6] [7]
[8] [9] [7]
Ci
Z
chip input capacitance, Large Pads parallel
0.69
chip impedance, Large Pads
866 MHz
915 MHz
953 MHz
915 MHz
15-j265
14-j252
13-j242
19-j234
Ω
Ω
Z
Z
typical assembled impedance,
Large Pads (see Figure 8)
Ω
[8] [10]
[7]
typical assembled impedance in
915 MHz
13-j191
-
Ω
case of single-slit antenna
assembly, Large Pads (see
Figure 9)
[1] Power to process a QUERY command
[2] Measured with a 50 Ω source impedance directly on the chip
[3] Results in approximately -23 dBm tag sensitivity with a 2.15 dBi gain antenna
[4] Tag sensitivity on a 2.15 dBi gain antenna
[5] When the memory content is "0000...".
[6] At minimum operating power
[7] at center capacitor of Self Adjust
[8] The antenna shall be matched to this impedance
[9] Assuming 50ff additional assembly capacitance
[10] Assuming 220ff additional assembly+test pad capacitance
Table 16.ꢀUCODE 8/8m memory characteristics
Symbol
Parameter
Conditions
Min
Typ
Max Unit
EEPROM characteristics
tret
retention time
Tamb ≤ 55 °C
20
-
-
-
-
year
Nendu(W)
write endurance
100k
cycle
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UCODE 8/8m
12 Packing information
12.1 Wafer
See "Data sheet - Delivery type description – General specification for 8" wafer on UV-
tape with electronic fail die marking, BU-S&C document number: 1093**"
See "Data sheet - Delivery type description – General specification for 12" wafer on UV-
tape with electronic fail die marking, BU-S&C document number: 1862**"
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UCODE 8/8m
13 Abbreviations
Table 17.ꢀAbbreviations
Acronym
CRC
Description
Cyclic Redundancy Check
Continuous Wave
CW
DSB-ASK
DC
Double Side Band-Amplitude Shift Keying
Direct Current
EAS
Electronic Article Surveillance
EEPROM
EPC
Electrically Erasable Programmable Read Only Memory
Electronic Product Code (containing Header, Domain Manager, Object Class
and Serial Number)
FM0
G2
Bi phase space modulation
Generation 2
IC
Integrated Circuit
PIE
PSF
RF
Pulse Interval Encoding
Product Status Flag
Radio Frequency
UHF
SECS
TID
Ultra High Frequency
Semi Equipment Communication Standard
Tag IDentifier
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UCODE 8/8m
14 References
1. EPCglobal: EPC Radio-Frequency Identity Protocols Class-1 Generation-2 UHF RFID
Protocol for Communications at 860 MHz – 960 MHz, Version 2.0.1 (April 2015)
2. EPCglobal: EPC Tag Data Standard, Release 1.10 (March 2017)
3. Data sheet - Delivery type description – General specification for 8" wafer on UV-tape
with electronic fail die marking, BU-S&C document number: 1093**
4. Data sheet - Delivery type description – General specification for 12" wafer on UV-
tape with electronic fail die marking, BU-S&C document number: 1862** 1
1 ** ... document version number
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UCODE 8/8m
15 Revision history
Table 18.ꢀRevision history
Document ID
Release date
20210401
Data sheet status
Change notice Supersedes
- SL3S1205_15 v. 3.4
SL3S1205_15 v. 3.5
Modifications:
Product data sheet
• Table 1 "Ordering information": Ordering information with UCODE 8, 12 inch plasma dicing
updated
• Section 7 "Wafer layout": Titles in wafer layout with stealth dicing and conventional dicing
updated
• Figure 5 " UCODE 8/8m, 12" wafer layout, Large Pads, plasma dicing": inserted
• Table 5 "12 inch specification with Large Pads, plasma dicing ": inserted
• Delivery form of UCODE 8/8m, 12 inch FC Bumps (SL3S1205FUD2/KP and
SL3S1215FUD2/KP) discontinued
• Related information removed
SL3S1205_15 v. 3.4
Modifications:
20200131
• Introduction of 12 inch FC Bumps
20191028 Product data sheet
Product data sheet
-
-
SL3S1205_15 v. 3.3
SL3S1205_15 v. 3.2
SL3S1205_15 v. 3.3
Modifications:
• Section 8.1.2 "12 inch Wafer with Large Pads": number of PGDW changed into 258934
20181119 Product data sheet SL3S1205_15 v. 3.1
• Introduction of 12 inch wafer delivery
SL3S1205_15 v. 3.2
Modifications:
-
• Figure 3 "UCODE 8/8m, 8" wafer layout, Large Pads, stealth dicing" updated
• Editorial changes in Table 8 "UCODE 8 overall memory map"
• Editorial changes in Table 9 "UCODE 8m overall memory map"
• Section 9.6.4 "Brand Identifier" updated
SL3S1205_15 v. 3.1
Modifications:
SL3S1205_15 v. 3.0
398420
20170630
Product data sheet
-
SL3S1205_15 v. 3.0
• Wording: "Auto Adjust" replaced with "Self Adjust"
20170703
20170531
20160919
Product data sheet
Preliminary data sheet
Objective data sheet
-
-
-
398420
398410
-
398410
SL3S1205_15
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NXP Semiconductors
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UCODE 8/8m
16 Legal information
16.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product
development.
Preliminary [short] data sheet
Product [short] data sheet
Qualification
Production
This document contains data from the preliminary specification.
This document contains the product specification.
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term 'short data sheet' is explained in section "Definitions".
[3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple
devices. The latest product status information is available on the Internet at URL http://www.nxp.com.
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
16.2 Definitions
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconductors products in such equipment or
applications and therefore such inclusion and/or use is at the customer’s own
risk.
Draft — A draft status on a document indicates that the content is still
under internal review and subject to formal approval, which may result
in modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included in a draft version of a document and shall have no
liability for the consequences of use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is
intended for quick reference only and should not be relied upon to contain
detailed and full information. For detailed and full information see the
relevant full data sheet, which is available on request via the local NXP
Semiconductors sales office. In case of any inconsistency or conflict with the
short data sheet, the full data sheet shall prevail.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes
no representation or warranty that such applications will be suitable
for the specified use without further testing or modification. Customers
are responsible for the design and operation of their applications and
products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications
and products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with
their applications and products. NXP Semiconductors does not accept any
liability related to any default, damage, costs or problem which is based
on any weakness or default in the customer’s applications or products, or
the application or use by customer’s third party customer(s). Customer is
responsible for doing all necessary testing for the customer’s applications
and products using NXP Semiconductors products in order to avoid a
default of the applications and the products or of the application or use by
customer’s third party customer(s). NXP does not accept any liability in this
respect.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product
is deemed to offer functions and qualities beyond those described in the
Product data sheet.
16.3 Disclaimers
Limited warranty and liability — Information in this document is believed
to be accurate and reliable. However, NXP Semiconductors does not
give any representations or warranties, expressed or implied, as to the
accuracy or completeness of such information and shall have no liability
for the consequences of use of such information. NXP Semiconductors
takes no responsibility for the content in this document if provided by an
information source outside of NXP Semiconductors. In no event shall NXP
Semiconductors be liable for any indirect, incidental, punitive, special or
consequential damages (including - without limitation - lost profits, lost
savings, business interruption, costs related to the removal or replacement
of any products or rework charges) whether or not such damages are based
on tort (including negligence), warranty, breach of contract or any other
legal theory. Notwithstanding any damages that customer might incur for
any reason whatsoever, NXP Semiconductors’ aggregate and cumulative
liability towards customer for the products described herein shall be limited
in accordance with the Terms and conditions of commercial sale of NXP
Semiconductors.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those
given in the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
Right to make changes — NXP Semiconductors reserves the right to
make changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
SL3S1205_15
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© NXP B.V. 2021. All rights reserved.
Product data sheet
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NXP Semiconductors
SL3S1205_15
UCODE 8/8m
No offer to sell or license — Nothing in this document may be interpreted
or construed as an offer to sell products that is open for acceptance or
the grant, conveyance or implication of any license under any copyrights,
patents or other industrial or intellectual property rights.
Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
Security — Customer understands that all NXP products may be subject
to unidentified or documented vulnerabilities. Customer is responsible
for the design and operation of its applications and products throughout
their lifecycles to reduce the effect of these vulnerabilities on customer’s
applications and products. Customer’s responsibility also extends to other
open and/or proprietary technologies supported by NXP products for use
in customer’s applications. NXP accepts no liability for any vulnerability.
Customer should regularly check security updates from NXP and follow up
appropriately. Customer shall select products with security features that best
meet rules, regulations, and standards of the intended application and make
the ultimate design decisions regarding its products and is solely responsible
for compliance with all legal, regulatory, and security related requirements
concerning its products, regardless of any information or support that may
be provided by NXP. NXP has a Product Security Incident Response Team
(PSIRT) (reachable at PSIRT@nxp.com) that manages the investigation,
reporting, and solution release to security vulnerabilities of NXP products.
Quick reference data — The Quick reference data is an extract of the
product data given in the Limiting values and Characteristics sections of this
document, and as such is not complete, exhaustive or legally binding.
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It is neither qualified nor
tested in accordance with automotive testing or application requirements.
NXP Semiconductors accepts no liability for inclusion and/or use of non-
automotive qualified products in automotive equipment or applications. In
the event that customer uses the product for design-in and use in automotive
applications to automotive specifications and standards, customer (a) shall
use the product without NXP Semiconductors’ warranty of the product for
such automotive applications, use and specifications, and (b) whenever
customer uses the product for automotive applications beyond NXP
Semiconductors’ specifications such use shall be solely at customer’s own
risk, and (c) customer fully indemnifies NXP Semiconductors for any liability,
damages or failed product claims resulting from customer design and use
of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specifications.
16.4 Trademarks
Notice: All referenced brands, product names, service names and
trademarks are the property of their respective owners.
UCODE — is a trademark of NXP B.V.
NXP — wordmark and logo are trademarks of NXP B.V.
SL3S1205_15
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© NXP B.V. 2021. All rights reserved.
Product data sheet
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Rev. 3.5 — 1 April 2021
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NXP Semiconductors
SL3S1205_15
UCODE 8/8m
Tables
Tab. 1.
Tab. 2.
Tab. 3.
Ordering information ..........................................5
Pin description bare die .................................... 7
8 inch specification with Large Pads,
Tab. 10. Configuration word UCODE 8/8m ................... 20
Tab. 11. Configuration word UCODE 8/8m ...
continued .........................................................20
stealth dicing ................................................... 11
12 inch specification with Large Pads,
conventional dicing ..........................................12
12 inch specification with Large Pads,
plasma dicing .................................................. 13
UCODE 8 memory sections ............................16
UCODE 8m memory sections .........................16
UCODE 8 overall memory map .......................17
UCODE 8m overall memory map ....................18
Tab. 12. Untraceable command .................................... 27
Tab. 13. Untraceable command-response table ............27
Tab. 14. Limiting values ................................................ 28
Tab. 15. UCODE 8/8m RF interface characteristics
(RF1, RF2) ...................................................... 29
Tab. 16. UCODE 8/8m memory characteristics .............29
Tab. 17. Abbreviations ...................................................31
Tab. 18. Revision history ...............................................33
Tab. 4.
Tab. 5.
Tab. 6.
Tab. 7.
Tab. 8.
Tab. 9.
SL3S1205_15
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© NXP B.V. 2021. All rights reserved.
Product data sheet
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Rev. 3.5 — 1 April 2021
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NXP Semiconductors
SL3S1205_15
UCODE 8/8m
Figures
Fig. 1.
Fig. 2.
Fig. 3.
Block diagram of UCODE 8/8m IC ....................6
Fig. 6.
Fig. 7.
Fig. 8.
UCODE 8/8m TID memory structure ...............19
Pre-serialization of 96-bit EPC ........................ 24
Standard antenna design versus single-slit
antenna ............................................................25
Single-slit assembly .........................................25
Pinning bare die, Large Pads ............................7
UCODE 8/8m, 8" wafer layout, Large Pads,
stealth dicing ..................................................... 8
UCODE 8/8m, 12" wafer layout, Large
Pads, conventional dicing ................................. 9
UCODE 8/8m, 12" wafer layout, Large
Fig. 4.
Fig. 5.
Fig. 9.
Fig. 10. Rotation tolerant pad design ........................... 26
Fig. 11. Dual axis glue spacer ..................................... 26
Pads, plasma dicing ........................................10
SL3S1205_15
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© NXP B.V. 2021. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.5 — 1 April 2021
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NXP Semiconductors
SL3S1205_15
UCODE 8/8m
Contents
1
2
2.1
2.1.1
2.2
3
3.1
3.2
4
5
6
6.1
7
8
8.1
8.1.1
8.1.2
8.1.3
8.1.4
9
9.1
9.2
9.3
General description ............................................ 1
12.1
13
14
15
16
Wafer ............................................................... 30
Abbreviations .................................................... 31
References .........................................................32
Revision history ................................................ 33
Legal information ..............................................34
Features and benefits .........................................2
Key features ...................................................... 2
Memory ..............................................................2
Supported features ............................................ 3
Applications .........................................................4
Target market .....................................................4
Applications ........................................................4
Ordering information .......................................... 5
Block diagram ..................................................... 6
Pinning information ............................................ 7
Pin description ...................................................7
Wafer layout .........................................................8
Mechanical specification ..................................11
Wafer specification .......................................... 11
8 inch Wafer with Large Pads, stealth dicing ... 11
12 inch Wafer with Large Pads ........................12
Fail die identification ........................................14
Map file distribution ......................................... 14
Functional description ......................................15
Air interface standards .....................................15
Power transfer ................................................. 15
Data transfer ....................................................15
Interrogator to tag Link .................................... 15
Tag to interrogator Link ....................................15
Supported commands ......................................16
UCODE 8/8m memory .....................................16
UCODE 8/8m overall memory map ................. 17
UCODE 8/8m TID memory details ...................19
Supported features .......................................... 20
UCODE 8/8m features control mechanism ......20
Memory Safeguard .......................................... 22
Description .......................................................22
Self Adjust ....................................................... 23
Description .......................................................23
Brand Identifier ................................................ 23
Description .......................................................23
EPC+TID ..........................................................24
Description .......................................................24
Product Status Flag (PSF) ...............................24
Description .......................................................24
Backscatter strength reduction ........................ 24
Pre-serialization of the 96-bit EPC ...................24
Description .......................................................24
Single-slit antenna solution ..............................25
Description .......................................................25
Large Pads ...................................................... 26
9.3.1
9.3.2
9.4
9.5
9.5.1
9.5.2
9.6
9.6.1
9.6.2
9.6.2.1
9.6.3
9.6.3.1
9.6.4
9.6.4.1
9.6.5
9.6.5.1
9.6.6
9.6.6.1
9.6.7
9.6.8
9.6.8.1
9.6.9
9.6.9.1
9.6.10
9.6.10.1 Description .......................................................26
9.6.11
10
11
11.1
12
Custom commands ..........................................27
Limiting values ..................................................28
Characteristics .................................................. 29
UCODE 8/8m bare die characteristics .............29
Packing information ..........................................30
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section 'Legal information'.
© NXP B.V. 2021.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 1 April 2021
Document number: 398435
相关型号:
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