SL3S1205FUD2/HAP [NXP]

UCODE 8/8m;
SL3S1205FUD2/HAP
型号: SL3S1205FUD2/HAP
厂家: NXP    NXP
描述:

UCODE 8/8m

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SL3S1205_15  
UCODE 8/8m  
Rev. 3.5 — 1 April 2021  
398435  
Product data sheet  
COMPANY PUBLIC  
1 General description  
The UCODE 8 and UCODE 8m ICs are the latest NXP products of the UCODE family.  
UCODE 8/8m offers high performance and features for use in the most demanding RFID  
tagging applications.  
Particularly well suited for inventory management applications, like e.g Retail and  
Fashion, with its great RF performance for any given form factor, UCODE 8/8m  
enables long read distance and fast inventory of dense RFID tag population. With its  
broadband design, it offers the possibility to manufacture true global RFID label with  
great performance over worldwide regulations.  
The device also provides a Self Adjust Feature, a Product Status Flag for Electronic  
Article Surveillance (EAS) application, pre-serialized 96-bit EPC, Brand Identifier and the  
EPC Gen2v2 compliant Untraceable command.  
 
NXP Semiconductors  
SL3S1205_15  
UCODE 8/8m  
2 Features and benefits  
2.1 Key features  
Read sensitivity -23 dBm  
Write sensitivity -18 dBm  
Innovative functionality  
Self Adjust  
Memory Safeguard  
Brand Identifier  
Untraceable  
Pre-serialization for 96-bit EPC  
Integrated Product Status Flag (PSF)  
Compatible with single-slit antenna  
Up to 128-bit EPC  
96-bit Unique Tag Identifier (TID) factory locked, including 48-bit unique serial number  
EPC Gen2v2  
2.1.1 Memory  
128-bit/96-bit (UCODE 8/UCODE 8m) of EPC memory  
Supports pre-serialization for 96-bit EPC  
96-bit Tag IDentifier (TID) factory locked  
48-bit unique serial number factory-encoded into TID  
0-bit/32-bit (UCODE 8/UCODE 8m) User Memory  
32-bit kill password to permanently disable the tag  
32-bit access password  
Wide operating temperature range: -40 °C up to +85 °C  
Minimum 100k write cycle endurance  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
2.2 Supported features  
All mandatory commands of EPC global specification V.2.0.1 are implemented  
including:  
Lock or permalock  
Kill Command  
The following optional commands are implemented in conformance with the EPC  
specification:  
Access  
BlockWrite (2 words, 32-bit)  
Untraceable  
Product Status Flag bit: enables the UHF RFID tag to be used as EAS (Electronic  
Article Surveillance) tag without the need for a back-end database.  
Self Adjust for automated tag performance optimization  
Memory Safeguard: enables countermeasures, like parity and margin checks as well as  
automated error correction, to ensure integrity of customer data.  
Brand Identifier: enables product authentication verification  
All supported features of UCODE 8/8m can be activated using standard EPCglobal  
READ / WRITE / ACCESS / SELECT commands. No custom commands are needed to  
take advantage of all the features.  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
3 Applications  
3.1 Target market  
Retail  
Brick and mortar  
e-commerce  
omnichannel  
Supply chain management  
Shipping services  
Airline luggage tracking  
Laundry services  
3.2 Applications  
High accurate and fast inventory management, enabling omnichannel retail processes  
Tracking along the supply chain from source to store  
High-speed store checkout process, bringing convenience to the customer  
Loss prevention  
Brand Protection  
After sales operations: Return and Warranty management  
Outside the applications mentioned above, please contact NXP Semiconductors for  
support.  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
4 Ordering information  
Table 1.ꢀOrdering information  
Type number  
Package  
Name  
IC type  
Description  
Version  
SL3S1205FUD/HA  
SL3S1215FUD/HA  
SL3S1205FUD2/HA  
Wafer  
UCODE 8  
Die on sawn 8" 120 μm wafer 10 μm Polyimide spacer not applicable  
with Large Pads, Stealth Dicing  
Wafer  
Wafer  
UCODE 8m Die on sawn 8" 120 μm wafer 10 μm Polyimide spacer not applicable  
with Large Pads, Stealth Dicing  
UCODE 8  
Die on sawn 12" 120 μm wafer 10 μm Polyimide  
spacer  
not applicable  
not applicable  
not applicable  
not applicable  
with Large Pads, Conventional Dicing  
SL3S1215FUD2/HA  
Wafer  
UCODE 8m Die on sawn 12" 120 μm wafer 10 μm Polyimide  
spacer  
with Large Pads, Conventional Dicing  
SL3S1205FUD2/HAP Wafer  
SL3S1215FUD2/HAP Wafer  
UCODE 8  
Die on sawn 12" 120 μm wafer 10 μm Polyimide  
spacer  
with Large Pads, Plasma Dicing  
UCODE 8m Die on sawn 12" 120 μm wafer 10 μm Polyimide  
spacer  
with Large Pads, Plasma Dicing  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
5 Block diagram  
The UCODE 8/8m IC consists of three major blocks:  
Analog Interface  
Digital Control  
EEPROM  
The analog part provides stable supply voltage and demodulates data received from the  
reader which is then processed by the digital part. Further, the modulation transistor of  
the analog part transmits data back to the reader.  
The digital section includes the state machines, processes the protocol and handles  
communication with the EEPROM, which contains the EPC and the user data.  
ANALOG  
RF INTERFACE  
DIGITAL CONTROL  
ANTICOLLISION  
EEPROM  
VREG  
VDD  
RF1  
READWRITE  
CONTROL  
DEMOD  
data  
in  
RECT  
RF2  
ACCESS CONTROL  
MEMORY  
antenna  
EEPROM INTERFACE  
CONTROL  
MOD  
data  
out  
R/W  
Memory Safeguard  
CONTROL  
Adjust  
RF INTERFACE  
CONTROL  
SEQUENCER  
CHARGE PUMP  
aaa-027138  
Figure 1.ꢀBlock diagram of UCODE 8/8m IC  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
6 Pinning information  
SL312x5 trademark  
RF2  
RF1  
TP1  
TP2  
aaa-027143  
Figure 2.ꢀPinning bare die, Large Pads  
6.1 Pin description  
Table 2.ꢀPin description bare die  
Symbol  
TP1  
Description  
test pad 1  
RF1  
antenna connector 1  
test pad 2  
TP2  
RF2  
antenna connector 2  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
7 Wafer layout  
(12)  
(1)  
RF2  
RF1  
(9)  
(3)  
(8)  
(5)  
(7)  
TP1  
TP2  
(2)  
(6)  
Y
(11)  
(10)  
(13)  
X
(4)  
not to scale!  
aaa-027144  
1. Die to Die distance (metal sealring - metal sealring) 19 μm, (X-scribe line width: 15 μm)  
2. Die to Die distance (metal sealring - metal sealring) 19 μm, (Y-scribe line width: 15 μm)  
3. Chip step, Y-length: 490 μm  
4. Chip step, X-length: 480 μm  
5. Bump to bump distance X (RF1 - RF2): 115 μm  
6. Distance bump to metal sealring Y: 21.5 μm  
7. Bump size (TP1, TP2) Y: 100 μm  
8. Bump to bump distance Y (RF1 - TP2, RF2 - TP1): 50 μm  
9. Bump size (RF1, RF2) Y: 278 μm  
10. Distance bump to metal sealring X: 21.5 μm  
11. Bump size (TP1, TP2) X: 134.2 μm  
12. Bump size (RF1, RF2) X: 151.5 μm  
13. Distance bump to metal sealring X: 441.5 μm  
Remark: TP1 and TP2 are electrically disconnected after dicing  
Figure 3.ꢀUCODE 8/8m, 8" wafer layout, Large Pads, stealth dicing  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
(12)  
(1)  
RF2  
RF1  
(9)  
(3)  
(8)  
(5)  
(7)  
TP1  
TP2  
(2)  
(6)  
Y
(11)  
(10)  
(13)  
X
(4)  
not to scale!  
aaa-027144  
1. Die to Die distance (metal sealring - metal sealring) 39 μm, (X-scribe line width: 35 μm)  
2. Die to Die distance (metal sealring - metal sealring) 39 μm, (Y-scribe line width: 35 μm)  
3. Chip step, Y-length: 510 μm  
4. Chip step, X-length: 500 μm  
5. Bump to bump distance X (RF1 - RF2): 115 μm  
6. Distance bump to metal sealring Y: 21.5 μm  
7. Bump size (TP1, TP2) Y: 100 μm  
8. Bump to bump distance Y (RF1 - TP2, RF2 - TP1): 50 μm  
9. Bump size (RF1, RF2) Y: 278 μm  
10. Distance bump to metal sealring X: 21.5 μm  
11. Bump size (TP1, TP2) X: 134.2 μm  
12. Bump size (RF1, RF2) X: 151.5 μm  
13. Distance bump to metal sealring X: 441.5 μm  
Remark: TP1 and TP2 are electrically disconnected after dicing  
Figure 4.ꢀ UCODE 8/8m, 12" wafer layout, Large Pads, conventional dicing  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
(12)  
(1)  
RF2  
RF1  
(9)  
(3)  
(8)  
(5)  
(7)  
TP1  
TP2  
(2)  
(6)  
Y
(11)  
(10)  
(13)  
X
(4)  
not to scale!  
aaa-027144  
1. X-scribe line width not expanded: 6.6 μm (Expanded, typically 15 μm)  
2. Y-scribe line width not expanded: 6.6 μm (Expanded, typically 15 μm)  
3. Chip step, Y-length: 477.6 μm  
4. Chip step, X-length: 467.6 μm  
5. Bump to bump distance X (RF1 - RF2): 115 μm  
6. Distance bump to metal sealring Y: 17.5 μm  
7. Bump size (TP1, TP2) Y: 100 μm  
8. Bump to bump distance Y (RF1 - TP2, RF2 - TP1): 50 μm  
9. Bump size (RF1, RF2) Y: 278 μm  
10. Distance bump to metal sealring X: 17.5 μm  
11. Bump size (TP1, TP2) X: 134.2 μm  
12. Bump size (RF1, RF2) X: 151.5 μm  
13. Distance bump to metal sealring X: 435.5 μm  
Remark: TP1 and TP2 are electrically disconnected after dicing  
Figure 5.ꢀ UCODE 8/8m, 12" wafer layout, Large Pads, plasma dicing  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
8 Mechanical specification  
The UCODE 8 wafers are available in 120 μm thickness. For Large Gold Pads the 120  
μm thick wafer is enhanced with 10 μm Polyimide spacer resulting in less coupling  
between the antenna and the active circuit, leaving a larger process window for  
assembly.  
8.1 Wafer specification  
8.1.1 8 inch Wafer with Large Pads, stealth dicing  
See "Data sheet - Delivery type description – General specification for 8" wafer on UV-  
tape with electronic fail die marking, BU-S&C document number: 1093**"  
Table 3.ꢀ8 inch specification with Large Pads, stealth dicing  
Wafer  
Designation  
each wafer is scribed with batch number and  
wafer number  
Diameter  
200 mm (8") unsawn- 205 mm typical sawn  
on foil  
Thickness  
120 μm ± 15 μm  
Number of pads  
Pad location  
4
non-diagonal / placed in chip corners  
Process  
CMOS 0.14 μm  
25 wafers  
Batch size  
Net printed dies per wafer  
Wafer backside  
Material  
120794  
Si  
Treatment  
ground and stress release  
Ra max. 0.5 μm, Rt max. 5 μm  
Roughness  
Chip dimensions  
Die size excluding scribe  
Scribe line width:  
0.465 mm × 0.475 mm = 0.22 mm2  
x-dimension = 15 μm  
y-dimension = 15 μm  
Passivation on front  
Type  
Sandwich structure  
Material  
PE-Nitride (on top)  
Thickness  
1.75 μm total thickness of passivation  
10 μm ± 2 μm  
Polyimide spacer  
Au pads  
Pad material  
Pad hardness  
> 99.9 % pure Au  
35 – 80 HV 0.005  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
Table 3.ꢀ8 inch specification with Large Pads, stealth dicing...continued  
Pad shear strength  
> 70 MPa  
3 μm  
Pad height  
Pad height uniformity  
– within a die  
max. 2 μm  
max. 4 μm  
max. 3 μm  
– within a wafer  
Pad flatness  
Pad size  
– RF1, RF2 (max. details see wafer layout)  
– TP1, TP2 (max. details see wafer layout)  
Pad size variation  
151.5 μm × 278 μm  
134.2 μm × 100 μm  
± 5 μm  
8.1.2 12 inch Wafer with Large Pads  
See "Data sheet - Delivery type description – General specification for 12" wafer on UV-  
tape with electronic fail die marking, BU-S&C document number: 1862**"  
Table 4.ꢀ12 inch specification with Large Pads, conventional dicing  
Wafer  
Designation  
each wafer is scribed with batch number and  
wafer number  
Diameter  
300 mm (12") unsawn  
Thickness  
120 μm ± 15 μm  
Number of pads  
Pad location  
4
non-diagonal / placed in chip corners  
Process  
CMOS 0.14 μm  
25 wafers  
Batch size  
Net printed dies per wafer  
Wafer backside  
Material  
258934  
Si  
Treatment  
ground and stress release  
Ra max. 0.5 μm, Rt max. 5 μm  
Roughness  
Chip dimensions  
Die size excluding scribe  
Scribe line width:  
0.465 mm × 0.475 mm = 0.22 mm2  
x-dimension = 35 μm  
y-dimension = 35 μm  
Passivation on front  
Type  
Sandwich structure  
Material  
PE-Nitride (on top)  
Thickness  
1.75 μm total thickness of passivation  
10 μm ± 2 μm  
Polyimide spacer  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
Table 4.ꢀ12 inch specification with Large Pads, conventional dicing ...continued  
Au pads  
Pad material  
> 99.9 % pure Au  
35 – 80 HV 0.005  
> 70 MPa  
Pad hardness  
Pad shear strength  
Pad height  
3 μm  
Pad height uniformity  
– within a die  
max. 2 μm  
max. 4 μm  
max. 3 μm  
– within a wafer  
Pad flatness  
Pad size  
– RF1, RF2 (max. details see wafer layout)  
– TP1, TP2 (max. details see wafer layout)  
Pad size variation  
151.5 μm × 278 μm  
134.2 μm × 100 μm  
± 5 μm  
Table 5.ꢀ12 inch specification with Large Pads, plasma dicing  
Wafer  
Designation  
each wafer is scribed with batch number and  
wafer number  
Diameter  
300 mm (12") unsawn  
Thickness  
120 μm ± 15 μm  
Number of pads  
Pad location  
4
non-diagonal / placed in chip corners  
Process  
CMOS 0.14 μm  
25 wafers  
Batch size  
Net printed dies per wafer  
Wafer backside  
Material  
296307  
Si  
Treatment  
ground and stress release  
Ra max. 0.5 μm, Rt max. 5 μm  
Roughness  
Chip dimensions  
Die size excluding scribe  
Scribe line width:  
0.461 mm × 0.471 mm = 0.22 mm2  
x-dimension = 6.6 μm  
y-dimension = 6.6 μm  
Passivation on front  
Type  
Sandwich structure  
Material  
PE-Oxide (on top)  
Thickness  
2.25 μm total thickness of passivation  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
Table 5.ꢀ12 inch specification with Large Pads, plasma dicing ...continued  
Polyimide spacer 10 μm ± 2 μm  
Au pads  
Pad material  
> 99.9 % pure Au  
35 – 80 HV 0.005  
> 70 MPa  
Pad hardness  
Pad shear strength  
Pad height  
3 μm  
Pad height uniformity  
– within a die  
max. 2 μm  
max. 4 μm  
max. 3 μm  
– within a wafer  
Pad flatness  
Pad size  
– RF1, RF2 (max. details see wafer layout)  
– TP1, TP2 (max. details see wafer layout)  
Pad size variation  
151.5 μm × 278 μm  
134.2 μm × 100 μm  
± 5 μm  
8.1.3 Fail die identification  
No ink dots are applied to the wafer.  
Electronic wafer mapping (SECS II format) covers the electrical test results and  
additionally the results of mechanical/visual inspection.  
See "Data sheet - Delivery type description – General specification for 8" wafer on UV-  
tape with electronic fail die marking, BU-S&C document number: 1093**"  
See "Data sheet - Delivery type description – General specification for 12" wafer on UV-  
tape with electronic fail die marking, BU-S&C document number: 1862**"  
8.1.4 Map file distribution  
See "Data sheet - Delivery type description – General specification for 8" wafer on UV-  
tape with electronic fail die marking, BU-S&C document number: 1093**"  
See "Data sheet - Delivery type description – General specification for 12" wafer on UV-  
tape with electronic fail die marking, BU-S&C document number: 1862**"  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
9 Functional description  
9.1 Air interface standards  
The UCODE 8/8m fully supports all parts of the "EPCTM Radio-Frequency Identity  
Protocols Generation-2 UHF RFID, Specification for RFID Air Interface, Protocol for  
Communications at 860 MHz to 960 MHz, Version 2.0.1".  
9.2 Power transfer  
The interrogator provides an RF field that powers the tag, equipped with a UCODE 8/8m.  
The antenna transforms the impedance of free space to the chip input impedance in  
order to get the maximum power for the UCODE 8/8m on the tag.  
The RF field, which is oscillating on the operating frequency provided by the interrogator,  
is rectified to provide a smoothed DC voltage to the analog and digital modules of the IC.  
The antenna that is attached to the chip may use a DC connection between the two  
antenna pads. Therefore the UCODE 8/8m also enables loop antenna design.  
9.3 Data transfer  
9.3.1 Interrogator to tag Link  
An interrogator transmits information to the UCODE 8/8m by modulating an UHF RF  
signal. The UCODE 8/8m receives both information and operating energy from this RF  
signal. Tags are passive, meaning that they receive all of their operating energy from the  
interrogator's RF waveform.  
An interrogator is using a fixed modulation and data rate for the duration of at least one  
inventory round. It communicates to the UCODE 8/8m by modulating an RF carrier.  
For further details, refer to "Interrogator-to-tag (R=>T) communications"  
9.3.2 Tag to interrogator Link  
Upon transmitting a valid command, an interrogator receives information from a UCODE  
8/8m tag by transmitting an unmodulated RF carrier and listening for a backscattered  
reply. The UCODE 8/8m backscatters by switching the reflection coefficient of its antenna  
between two states in accordance with the data being sent. For further details, refer to  
"Tag-to-Interrogator (T=>R) communications"  
The UCODE 8/8m communicates information by backscatter-modulating the amplitude  
and/or phase of the RF carrier. Interrogators shall be capable of demodulating either  
demodulation type.  
The encoding format, selected in response to interrogator commands, is either FM0  
baseband or Miller-modulated subcarrier.  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
9.4 Supported commands  
The UCODE 8/8m supports all mandatory EPCglobal V2.0.1 commands including  
KILL command  
PERMALOCK or LOCK command  
In addition the UCODE8/8m supports the following optional commands:  
ACCESS  
Block Write (32 bit) on even addresses  
Untraceable  
9.5 UCODE 8/8m memory  
The UCODE 8/8m memory is implemented according to EPCglobal V2.0.1:  
Table 6.ꢀUCODE 8 memory sections  
Name  
Size  
Bank  
00b  
01b  
01b  
10b  
Reserved memory (32-bit Access and 32 bit Kill password)  
EPC (excluding 16 bit CRC-16 and 16-bit PC)  
UCODE 8 Configuration Word  
64 bit  
128 bit  
16 bit  
96 bit  
TID (including permalocked unique 48-bit serial number)  
Table 7.ꢀUCODE 8m memory sections  
Name  
Size  
Bank  
00b  
01b  
01b  
10b  
11b  
Reserved memory (32-bit Access and 32 bit Kill password)  
EPC (excluding 16 bit CRC-16 and 16-bit PC)  
UCODE 8 Configuration Word  
64 bit  
96 bit  
16 bit  
96 bit  
32 bit  
TID (including permalocked unique 48-bit serial number)  
User Memory  
The logical address of all memory banks begins at zero (00h).  
In addition to the four memory banks, one configuration word to handle the UCODE 8/8m  
specific features is available at EPC bank 01 address bit-200h. The configuration word is  
described in detail in Section 9.6.1  
The TID complies to the GS1 EPC Tag Data Standard. See "EPC Tag Data Standard,  
Release 1.10"  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
9.5.1 UCODE 8/8m overall memory map  
Table 8.ꢀUCODE 8 overall memory map  
Bank  
Address  
Type  
Content  
Initial  
all 00h  
all 00h  
Remark  
Bank 00  
00h to 1Fh  
20h to 3Fh  
00h to 0Fh  
reserved  
reserved  
EPC  
Kill password  
Access password  
unlocked memory  
unlocked memory  
Bank 01  
EPC  
CRC-16: refer to "EPC  
Global Gen2v2"  
memory mapped  
calculated CRC  
10h to 14h  
15h  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
TID  
EPC length  
UMI  
00110b  
0b  
unlocked memory  
hardwired to 0  
hardwired to 0  
unlocked memory  
unlocked memory  
indicator bit  
16h  
XPC indicator  
0b  
17h to 1Fh  
20h to 9Fh  
200h  
numbering system indicator 00h  
[1]  
EPC  
Bank 01  
EPC check  
EPC correction  
EPC NOK  
0b  
Config Word  
201h  
0b  
indicator bit  
202h  
0b  
indicator bit  
action bit[2]  
action bit[2]  
203h  
EPC+TID  
0b  
204h  
Brand Identifier  
Self Adjust Cap 1  
Self Adjust Cap 0  
Self Adjust disable  
RFU  
0b  
205h  
0b  
indicator bit  
206h  
0b  
indicator bit  
207h  
0b  
permanent bit[3]  
locked memory  
permanent bit[3]  
locked memory  
locked memory  
locked memory  
locked memory  
locked memory  
permanent bit[3]  
locked memory  
locked memory  
locked memory  
locked memory  
locked memory  
locked memory  
208h  
0b  
209h  
max. backscatter strength  
RFU  
1b  
20Ah  
0b  
20Bh  
RFU  
0b  
20Ch  
RFU  
0b  
20Dh  
RFU  
0b  
20Eh  
RFU  
0b  
20Fh  
PSF flag  
0b  
Bank 10  
TID  
00h to 07h  
08h to 13h  
14h  
allocation class identifier  
1110 0010b  
TID  
tag mask designer identifier 1000 0000 0110b  
TID  
config word indicator  
tag model number  
XTID header  
1b[4]  
15h to 1Fh  
20h to 2Fh  
30h to 5Fh  
TID  
TMNR[5]  
2000h  
SNR  
TID  
TID  
serial number  
[1] HEX E280 6894 0000 nnnn nnnn nnnn 0000 0000where nare the nibbles of the SNR from the TID  
[2] Action bits: meant to trigger a feature upon a SELECT command on the related bit ref feature control mechanism, see Section 9.6.1  
[3] Permanent bit: permanently stored bits in the memory; Read/Writeable according to EPC bank lock status, see Section 9.6.1  
[4] Indicates the existence of a Configuration Word at the end of the EPC number  
[5] See Figure 6  
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UCODE 8/8m  
Table 9.ꢀUCODE 8m overall memory map  
Bank  
Address  
Type  
Content  
Initial  
all 00h  
all 00h  
Remark  
Bank 00  
00h to 1Fh  
20h to 3Fh  
00h to 0Fh  
reserved  
reserved  
EPC  
Kill password  
Access password  
unlocked memory  
unlocked memory  
Bank 01  
EPC  
CRC-16: refer to "EPC  
Global Gen2v2"  
memory mapped  
calculated CRC  
10h to 14h  
15h  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
EPC  
TID  
EPC length  
UMI  
00110b  
1b  
unlocked memory  
hardwired to 1  
hardwired to 0  
unlocked memory  
unlocked memory  
indicator bit  
16h  
XPC indicator  
0b  
17h to 1Fh  
20h to 7Fh  
200h  
numbering system indicator 00h  
[1]  
EPC  
Bank 01  
EPC check  
0b  
Config Word  
201h  
EPC correction  
EPC NOK  
0b  
indicator bit  
202h  
0b  
indicator bit  
action bit[2]  
action bit[2]  
203h  
EPC+TID  
0b  
204h  
Brand Identifier  
Self Adjust Cap 1  
Self Adjust Cap 0  
Self Adjust disable  
RFU  
0b  
205h  
0b  
indicator bit  
206h  
0b  
indicator bit  
207h  
0b  
permanent bit[3]  
locked memory  
permanent bit[3]  
locked memory  
locked memory  
indicator bit  
208h  
0b  
209h  
max. backscatter strength  
RFU  
1b  
20Ah  
0b  
20Bh  
RFU  
0b  
20Ch  
User Memory check  
User Memory correction  
User Memory NOK  
PSF flag  
0b  
20Dh  
0b  
indicator bit  
20Eh  
0b  
indicator bit  
20Fh  
0b  
permanent bit[3]  
locked memory  
locked memory  
locked memory  
locked memory  
locked memory  
locked memory  
unlocked memory  
Bank 10  
TID  
00h to 07h  
08h to 13h  
14h  
allocation class identifier  
1110 0010b  
TID  
tag mask designer identifier 1000 0000 0110b  
TID  
config word indicator  
tag model number  
XTID header  
1b[4]  
15h to 1Fh  
20h to 2Fh  
30h to 5Fh  
00h to 1Fh  
TID  
TMNR[5]  
2000h  
SNR  
TID  
TID  
serial number  
Bank 11  
UM  
User Memory  
all 00h  
User Memory  
[1] HEX E280 6994 0000 nnnn nnnn nnnnwhere nare the nibbles of the SNR from the TID  
[2] Action bits: meant to trigger a feature upon a SELECT command on the related bit ref feature control mechanism, see Section 9.6.1  
[3] Permanent bit: permanently stored bits in the memory; Read/Writeable according to EPC bank lock status, see Section 9.6.1  
[4] Indicates the existence of a Configuration Word at the end of the EPC number  
[5] See Figure 6  
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UCODE 8/8m  
9.5.2 UCODE 8/8m TID memory details  
Model Number  
Sub  
Mask  
Designer  
ID  
First 48 bit of TID  
memory  
Config  
Word  
Indicator  
Class ID  
Version  
XTID  
Header  
Version Nr. (Silicon) Nr.  
UCODE 8  
E28068942000  
E2h  
E2h  
806h  
806h  
1b  
1b  
0001b  
0011b  
0010100b  
0010100b  
2000h  
2000h  
UCODE 8m E28069942000  
Addresses 00h  
5Fh  
TID  
MS Byte  
LS Byte  
MSBit  
MSBit  
00h  
LSBit  
LSBit  
Bit  
Address  
07h 08h  
13h 14h  
1Fh 20h  
2Fh 30h  
5Fh  
Class Identifier  
Mask-Designer Identifier  
11  
(NXP; with XTID)  
Model Number  
XTID  
Serial Number  
11  
15  
Bits  
7
0
0
0
0 47  
894h  
(UCODE 8)  
994h  
0
E2h  
806h  
2000h  
(indication of 48bit  
unique SNR)  
000000000000h to FFFFFFFFFFFFh  
(EAN.UCC)  
(UCODE 8m)  
18h 19h  
1Fh  
Address 14h  
C.  
W.  
I.  
Sub Version Number  
Model Number  
Bits  
0
3
6
0
0
1b  
0001b  
0011b  
0010100b  
(UCODE 8)  
0010100b  
1b  
aaa-027137  
(UCODE 8m)  
Figure 6.ꢀUCODE 8/8m TID memory structure  
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UCODE 8/8m  
9.6 Supported features  
The UCODE 8/8m is equipped with a number of additional features. They are  
implemented in such a way that standard EPCglobal READ / WRITE / ACCESS /  
SELECT commands can be used to operate these features.  
The Configuration Word, as mentioned in the memory map, describes the additional  
features at address 200h of the EPC memory.  
Bit 14h of the TID indicates the existence of a Configuration Word. This flag enables the  
selection of configuration word enhanced transponders in mixed tag populations.  
9.6.1 UCODE 8/8m features control mechanism  
The different features of the UCODE 8/8m can be activated / de-activated by addressing  
or changing the content of the corresponding bit in the configuration word at address  
200h in the EPC memory bank (see Table 10). The de-activation of the action bit features  
will only happen after chip reset.  
Table 10.ꢀConfiguration word UCODE 8/8m  
Indicator bit  
Action bit  
EPC+TID  
Indicator bit  
Permanent bit  
EPC  
EPC  
EPC  
NOK  
Brand  
Self Adjust  
Cap 1  
Self Adjust  
Cap 0  
Self Adjust  
disable  
Check Corr  
Identifier  
0
1
2
3
4
5
6
7
Table 11.ꢀConfiguration word UCODE 8/8m ... continued  
Locked Permanent  
memory bit  
Locked memory  
Indicator bit  
Permanent bit  
RFU  
max.backsca RFU  
RFU  
User Memory User Memory User Memory PSF bit  
tter  
Check  
Corr  
NOK  
strength  
8
9
10  
11  
12  
13  
14  
15  
The configuration word contains 3 different type of bits:  
• Action bits: meant to trigger a feature upon a SELECT command on the related bit:  
EPC+TID  
Brand Identifier  
• Permanent bits: permanently stored bits in the memory  
Self Adjust disable  
Max. Backscatter Strength  
PSF Alarm bit  
• Indicator bits: cannot be changed by command  
EPC Check/Corr/NOK  
User Memory Check/Corr/NOK  
Self Adjust Cap0/Cap1  
The activation or the de-activation of the feature behind the permanent bits happens only  
when attempting to write a "1" value to the related bit (value toggling) - writing "0" value  
has no effect. If the feature is activated, the related bit will be read with a "1" value and, if  
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de-activated, with a "0" value. The permanent bits can only be toggled by using standard  
EPC WRITE (not a BlockWrite) if the EPC bank is unlocked or within the SECURED state  
if the EPC is locked. If the EPC is permalocked, they cannot be changed.  
Action bits will trigger a certain action only if the pointer of the SELECT command exactly  
matches the action-bit address (i.e. 203h or 204h), if the length=1 and if mask=1b (no  
multiple triggers of actions possible within one single SELECT command).  
If the truncate bit in the SELECT command is set to "1", the SELECT will be ignored. A  
SELECT on action bits will not change the digital state of the chip.  
The action bits can be triggered regardless if the EPC memory is unlocked, locked or  
permalocked.  
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UCODE 8/8m  
9.6.2 Memory Safeguard  
9.6.2.1 Description  
The Memory Safeguard of UCODE 8/8m consist of three different countermeasures  
which ensure integrity of the stored data:  
ECC (Error correction code):  
The implemented ECC is applied on the EPC- and User-Memory. With this feature, a  
single bit failure in the memory is detected and corrected automatically. In case of 2 bit  
fail, an indication is given.  
EPC Memory:  
The config word bit 200h (EPC check) indicates, if the EPC check is active ("1"). In case  
a single bit was corrected this will be indicated by the bit 201h (EPC Corr). Should a 2-bit  
failure occur bit 202h (EPC NOK) will be activated ("1"). In this case, no error correction  
will be applied and the EPC memory content readout will provide the actual content.  
User Memory:  
The config word bit 20Ch (User Memory check) indicates if the User Memory check  
is active ("1"). In case a single bit was corrected this will be indicated by the bit 20Dh  
(User Memory Corr). Should a 2-bit failure occur, bit 20Eh (User Memory NOK) will be  
activated ("1"). In this case, no error correction will be applied and the User Memory  
content readout will provide the actual content.  
This feature will be activated in case a Lock operation is applied on the according  
memory bank. If there is a password lock and a change of the memory content in the  
secured state, the ECC will be not re-calculated and the feature is disabled. To re-enable  
the ECC functionality also in this condition, an unlock and re-lock is required.  
Parity check:  
A parity check on the TID is implemented to offer the possibility to identify a change in  
the TID. The parity bit (Even parity) will be calculated and locked in the manufacturing  
process. For a check, the TID content needs to be read out and parity checked.  
Margin Check  
The implemented margin check is acting on the EPC-, Reserved- and User-Memory.  
During performing a Lock operation on the targeted memory bank the IC checks for  
sufficient programming margin of the memory cell and only responds after a successful  
check. In case of insufficient margin an error code will be responded and the Lock not  
completed. A re-check on already locked memory banks requires an unlock and re-lock  
command.  
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UCODE 8/8m  
9.6.3 Self Adjust  
9.6.3.1 Description  
The UCODE 8/8m has an automatic mechanism implemented which adjusts the chip  
sensitivity to a maximum in the operated environment. This adjustment will be performed  
at startup and selects between three different input capacitance values. The feature is  
enabled by default, but can also be deactivated by the config word bit 207h (Self Adjust  
disable). In case of deactivation, the center capacitance is used.  
The indicator bits 205h (Self Adjust Cap 1) and 206h (Self Adjust Cap 0) give information  
which capacitor is active ("1"). The startup is performed with the lowest value which is  
center capacitance minus Cap 0 (60 fF) and is then adjusted up to center capacitance  
plus Cap 1 (100 fF).  
9.6.4 Brand Identifier  
9.6.4.1 Description  
This new feature allows brand owners to implement a product originality check option  
for their products. The customer dedicated unique 16-bit brand identifier is programmed  
during manufacturing process by NXP and therefore unalterable stored in the memory.  
A SELECT command on bit 204h (Brand identifier) in the configuration word triggers the  
UCODE8/8m to respond in the inventory round with PC + EPC + Brand Identifier + CRC.  
In order to prevent manipulation, the Brand Identifier is scrambled with the RN16 and  
not sent in plain. The implemented scrambling is performed by bitwise XOR operation  
of the 16-bit Brand Identifier and the RN16. At the reader, the Brand identifier can be  
descrambled and the originality check completed.  
The PC value is adjusted accordingly for UCODE 8/8m. A SELECT on the Brand  
Identifier bit always gives a Tag matching.  
The usage of this feature requires an update on the reader firmware with the Brand  
Identifier check routine.  
Default value of the UCODE 8/8m Brand Identifier is "AAAAh". Customer-specific Brand  
Identifiers can be requested by a dedicated product ordering code. For details, contact  
your NXP sales representative.  
The Brand Identifier feature cannot be used in combination with the EPC+TID feature.  
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UCODE 8/8m  
9.6.5 EPC+TID  
9.6.5.1 Description  
This feature enables the read out the EPC+TID memory content in a faster way  
compared to a standard readout sequence.  
A SELECT on the config word bit 203h (EPC+TID) will trigger the UCODE 8/8m to reply  
with the EPC+TID after receiving the ACK command during the inventory round.  
In case only the TID should be replied by this feature, the EPC length in the PC needs to  
be set to "0".  
9.6.6 Product Status Flag (PSF)  
9.6.6.1 Description  
The PSF bit can be used for easy EAS (Electronic Article Surveillance) implementations  
or as general-purpose check flag.  
In order to detect tags with activated PSF, a SELECT command on bit 20Fh (PSF Bit)  
in the configuration word is required. In the following inventory round, only PSF enabled  
chips reply their EPC number.  
9.6.7 Backscatter strength reduction  
The UCODE 8/8m features two levels of backscatter strengths. Per default, maximum  
backscatter is enabled in order to enable maximum read rates. A deactivation of this  
feature can be done by clearing bit 209h (max. backscatter strength) in the configuration  
word, which reduces the backscatter strength if needed.  
9.6.8 Pre-serialization of the 96-bit EPC  
9.6.8.1 Description  
UCODE 8/8m are delivered with a pre-serialized content of the 96-bit EPC, which is the  
initial EPC length settings of UCODE 8/8m.  
The EPC content is identical to the TID content except of the 16-bit XTID content which is  
set to 16-bit 0's.  
TID  
Class Identifier  
Mask-Designer Identifier  
Model Number  
XTID  
Serial Number  
Bits  
7
0
11  
0
11  
0
15  
0
0
47  
47  
0
Class Identifier  
Mask-Designer Identifier  
Model Number  
0000 0000 0000 0000  
Serial Number  
serialized EPC  
Bits  
7
0
11  
0
11  
0
15  
0
aaa-027142  
Figure 7.ꢀPre-serialization of 96-bit EPC  
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UCODE 8/8m  
9.6.9 Single-slit antenna solution  
9.6.9.1 Description  
In UCODE 8/8m, the test pads TP1 and TP2 are electrically disconnected and therefore  
can be safely short-circuited to the RF pads (RF1, RF2) (see figure below).  
Single-slit antenna enables easier assembly and antenna design. In addition to the  
standard antenna assembly, the related increased input capacitance (see Table 15) can  
be used for optimization for different antenna design.  
standard assembly  
RF2  
TP1  
RF1  
TP2  
supporting pads  
aaa-027139  
Figure 8.ꢀStandard antenna design versus single-slit antenna  
single-slit assembly  
RF2  
TP1  
RF1  
TP2  
aaa-027351  
Figure 9.ꢀSingle-slit assembly  
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UCODE 8/8m  
9.6.10 Large Pads  
9.6.10.1 Description  
The large gold pads introduced in UCODE 8/8m enable more robust and reliable  
assembly. The new pad design allows not only more freedom in the placement accuracy  
(see "Rotation tolerant pad design" ). It also brings advantages in high-speed assembly  
due to the dual axis glue spacer (see "Dual axis glue spacer" ).  
RF2  
TP1  
RF1  
TP2  
aaa-027141  
Figure 10.ꢀRotation tolerant pad design  
RF2  
RF1  
TP1  
TP2  
aaa-027140  
Figure 11.ꢀDual axis glue spacer  
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UCODE 8/8m  
9.6.11 Custom commands  
The Untraceable function allows the UCODE 8/8m to hide the complete or parts of  
the EPC, TID and/or user memory. In addition, the read range can be completely or  
temporarily reduced. This command can only be executed from the secured state.  
Memory parts which are set untraceable are acting as non-existing in the Open state.  
EPC-field: Specifies the number of words of the EPC memory which the UCODE 8/8m  
back scatters. A change of this field therefore also changes the L bit in the Protocol  
Control (PC) word.  
TID-field: Hide some ("01") hides the TID memory from address 20h (included) onwards.  
Range-field: In case of activated range toggling, the read range reduction toggles from  
the actual value to the second (e.g. when actual state is normal it toggles to reduced). In  
case of power loss the chip reverts to its prior state.  
UCODE 8/8m does not support the U bit and therefore ignores this value.  
Table 12.ꢀUntraceable command  
Command RFU U  
EPC  
TID  
User  
Range  
RN  
CRC  
No. of bits 16  
2
1
6
2
1
2
16  
16  
Description 1110 0010 00  
0000 0000  
do  
not  
MSB:"0": show  
memory above  
"00": hide none "0":  
"00": normal handle CRC-16  
"01": toggle  
view  
"01": hide some  
"10": hide all  
"11": RFU  
care EPC  
"1": hide  
"10":  
reduced  
"1": hide memory  
above  
EPC  
"11": RFU  
5 LSBs: new EPC  
length  
Table 13.ꢀUntraceable command-response table  
Starting State  
Condition  
Response  
Next State  
ready  
ready  
all  
all  
-
-
arbitrate, reply,  
acknowledged  
arbitrate  
open  
all  
-
open  
secured  
killed  
executable  
all  
backscatter header when done secured  
killed  
-
In case of access to the memory that is set to untraceable, the error condition "memory  
overrun" is returned.  
For further details, refer to "EPC Global Gen2v2"  
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UCODE 8/8m  
10 Limiting values  
Table 14.ꢀLimiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134). Voltages are referenced to  
RFN. [1] [2]  
Symbol  
Parameter  
Conditions  
Min  
Max  
Unit  
Bare die limitations  
Tstg  
storage temperature  
-55  
-40  
-
+125  
+85  
± 2  
°C  
°C  
kV  
Tamb  
VESD  
ambient temperature  
[3] [4]  
electrostatic discharge  
voltage  
Human body model  
maximum power  
Pad limitations  
Pi input power  
-
100  
mW  
dissipation, RF1/RF2  
pad  
[1] Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a  
stress rating only and functional operation of the device at these or any conditions other than those described in the  
Operating Conditions and Electrical Characteristics section of this specification is not implied.  
[2] This product includes circuitry specifically designed for the protection of its internal devices from the damaging effects of  
excessive static charge. Nonetheless, it is suggested that conventional precautions be taken to avoid applying greater  
than the rated maxima.  
[3] For ESD measurement, the die chip has been mounted into a CDIP20 package.  
[4] HBM: ANSI/ESDA/JEDEC JS-001  
CAUTION  
This device is sensitive to ElectroStatic Discharge (ESD). Observe  
precautions for handling electrostatic sensitive devices.  
Such precautions are described in the ANSI/ESD S20.20, IEC/ST 61340-5,  
JESD625-A or equivalent standards.  
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SL3S1205_15  
UCODE 8/8m  
11 Characteristics  
11.1 UCODE 8/8m bare die characteristics  
Table 15.ꢀUCODE 8/8m RF interface characteristics (RF1, RF2)  
Symbol  
fi  
Parameter  
Conditions  
Min  
Typ  
-
Max  
Unit  
MHz  
dBm  
dBm  
input frequency  
minimum input power  
840  
960  
[1] [2] [3]  
[4]  
Pi(min)  
READ sensitivity  
-
-
- 22.9  
+ 1  
-
-
reduced operating  
range  
[4]  
Pi(min)  
t 16bit  
minimum input power  
encoding speed  
WRITE sensitivity  
16-bit  
-
-
-
-
-
-
-
-
-17.8  
-
-
-
-
-
-
-
dBm  
ms  
ms  
pF  
Ω
[5]  
0.7  
[5]  
32-bit (block write)  
1.2  
[2] [6] [7]  
[2] [6] [7]  
[2] [6] [7]  
[2] [6] [7]  
[8] [9] [7]  
Ci  
Z
chip input capacitance, Large Pads parallel  
0.69  
chip impedance, Large Pads  
866 MHz  
915 MHz  
953 MHz  
915 MHz  
15-j265  
14-j252  
13-j242  
19-j234  
Ω
Ω
Z
Z
typical assembled impedance,  
Large Pads (see Figure 8)  
Ω
[8] [10]  
[7]  
typical assembled impedance in  
915 MHz  
13-j191  
-
Ω
case of single-slit antenna  
assembly, Large Pads (see  
Figure 9)  
[1] Power to process a QUERY command  
[2] Measured with a 50 Ω source impedance directly on the chip  
[3] Results in approximately -23 dBm tag sensitivity with a 2.15 dBi gain antenna  
[4] Tag sensitivity on a 2.15 dBi gain antenna  
[5] When the memory content is "0000...".  
[6] At minimum operating power  
[7] at center capacitor of Self Adjust  
[8] The antenna shall be matched to this impedance  
[9] Assuming 50ff additional assembly capacitance  
[10] Assuming 220ff additional assembly+test pad capacitance  
Table 16.ꢀUCODE 8/8m memory characteristics  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Unit  
EEPROM characteristics  
tret  
retention time  
Tamb ≤ 55 °C  
20  
-
-
-
-
year  
Nendu(W)  
write endurance  
100k  
cycle  
SL3S1205_15  
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UCODE 8/8m  
12 Packing information  
12.1 Wafer  
See "Data sheet - Delivery type description – General specification for 8" wafer on UV-  
tape with electronic fail die marking, BU-S&C document number: 1093**"  
See "Data sheet - Delivery type description – General specification for 12" wafer on UV-  
tape with electronic fail die marking, BU-S&C document number: 1862**"  
SL3S1205_15  
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UCODE 8/8m  
13 Abbreviations  
Table 17.ꢀAbbreviations  
Acronym  
CRC  
Description  
Cyclic Redundancy Check  
Continuous Wave  
CW  
DSB-ASK  
DC  
Double Side Band-Amplitude Shift Keying  
Direct Current  
EAS  
Electronic Article Surveillance  
EEPROM  
EPC  
Electrically Erasable Programmable Read Only Memory  
Electronic Product Code (containing Header, Domain Manager, Object Class  
and Serial Number)  
FM0  
G2  
Bi phase space modulation  
Generation 2  
IC  
Integrated Circuit  
PIE  
PSF  
RF  
Pulse Interval Encoding  
Product Status Flag  
Radio Frequency  
UHF  
SECS  
TID  
Ultra High Frequency  
Semi Equipment Communication Standard  
Tag IDentifier  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
14 References  
1. EPCglobal: EPC Radio-Frequency Identity Protocols Class-1 Generation-2 UHF RFID  
Protocol for Communications at 860 MHz – 960 MHz, Version 2.0.1 (April 2015)  
2. EPCglobal: EPC Tag Data Standard, Release 1.10 (March 2017)  
3. Data sheet - Delivery type description – General specification for 8" wafer on UV-tape  
with electronic fail die marking, BU-S&C document number: 1093**  
4. Data sheet - Delivery type description – General specification for 12" wafer on UV-  
tape with electronic fail die marking, BU-S&C document number: 1862** 1  
1 ** ... document version number  
SL3S1205_15  
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UCODE 8/8m  
15 Revision history  
Table 18.ꢀRevision history  
Document ID  
Release date  
20210401  
Data sheet status  
Change notice Supersedes  
- SL3S1205_15 v. 3.4  
SL3S1205_15 v. 3.5  
Modifications:  
Product data sheet  
Table 1 "Ordering information": Ordering information with UCODE 8, 12 inch plasma dicing  
updated  
Section 7 "Wafer layout": Titles in wafer layout with stealth dicing and conventional dicing  
updated  
Figure 5 " UCODE 8/8m, 12" wafer layout, Large Pads, plasma dicing": inserted  
Table 5 "12 inch specification with Large Pads, plasma dicing ": inserted  
Delivery form of UCODE 8/8m, 12 inch FC Bumps (SL3S1205FUD2/KP and  
SL3S1215FUD2/KP) discontinued  
Related information removed  
SL3S1205_15 v. 3.4  
Modifications:  
20200131  
Introduction of 12 inch FC Bumps  
20191028 Product data sheet  
Product data sheet  
-
-
SL3S1205_15 v. 3.3  
SL3S1205_15 v. 3.2  
SL3S1205_15 v. 3.3  
Modifications:  
Section 8.1.2 "12 inch Wafer with Large Pads": number of PGDW changed into 258934  
20181119 Product data sheet SL3S1205_15 v. 3.1  
Introduction of 12 inch wafer delivery  
SL3S1205_15 v. 3.2  
Modifications:  
-
Figure 3 "UCODE 8/8m, 8" wafer layout, Large Pads, stealth dicing" updated  
Editorial changes in Table 8 "UCODE 8 overall memory map"  
Editorial changes in Table 9 "UCODE 8m overall memory map"  
Section 9.6.4 "Brand Identifier" updated  
SL3S1205_15 v. 3.1  
Modifications:  
SL3S1205_15 v. 3.0  
398420  
20170630  
Product data sheet  
-
SL3S1205_15 v. 3.0  
Wording: "Auto Adjust" replaced with "Self Adjust"  
20170703  
20170531  
20160919  
Product data sheet  
Preliminary data sheet  
Objective data sheet  
-
-
-
398420  
398410  
-
398410  
SL3S1205_15  
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UCODE 8/8m  
16 Legal information  
16.1 Data sheet status  
Document status[1][2]  
Product status[3]  
Definition  
Objective [short] data sheet  
Development  
This document contains data from the objective specification for product  
development.  
Preliminary [short] data sheet  
Product [short] data sheet  
Qualification  
Production  
This document contains data from the preliminary specification.  
This document contains the product specification.  
[1] Please consult the most recently issued document before initiating or completing a design.  
[2] The term 'short data sheet' is explained in section "Definitions".  
[3] The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple  
devices. The latest product status information is available on the Internet at URL http://www.nxp.com.  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
16.2 Definitions  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in life support, life-critical or  
safety-critical systems or equipment, nor in applications where failure or  
malfunction of an NXP Semiconductors product can reasonably be expected  
to result in personal injury, death or severe property or environmental  
damage. NXP Semiconductors and its suppliers accept no liability for  
inclusion and/or use of NXP Semiconductors products in such equipment or  
applications and therefore such inclusion and/or use is at the customer’s own  
risk.  
Draft — A draft status on a document indicates that the content is still  
under internal review and subject to formal approval, which may result  
in modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included in a draft version of a document and shall have no  
liability for the consequences of use of such information.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is  
intended for quick reference only and should not be relied upon to contain  
detailed and full information. For detailed and full information see the  
relevant full data sheet, which is available on request via the local NXP  
Semiconductors sales office. In case of any inconsistency or conflict with the  
short data sheet, the full data sheet shall prevail.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes  
no representation or warranty that such applications will be suitable  
for the specified use without further testing or modification. Customers  
are responsible for the design and operation of their applications and  
products using NXP Semiconductors products, and NXP Semiconductors  
accepts no liability for any assistance with applications or customer product  
design. It is customer’s sole responsibility to determine whether the NXP  
Semiconductors product is suitable and fit for the customer’s applications  
and products planned, as well as for the planned application and use of  
customer’s third party customer(s). Customers should provide appropriate  
design and operating safeguards to minimize the risks associated with  
their applications and products. NXP Semiconductors does not accept any  
liability related to any default, damage, costs or problem which is based  
on any weakness or default in the customer’s applications or products, or  
the application or use by customer’s third party customer(s). Customer is  
responsible for doing all necessary testing for the customer’s applications  
and products using NXP Semiconductors products in order to avoid a  
default of the applications and the products or of the application or use by  
customer’s third party customer(s). NXP does not accept any liability in this  
respect.  
Product specification — The information and data provided in a Product  
data sheet shall define the specification of the product as agreed between  
NXP Semiconductors and its customer, unless NXP Semiconductors and  
customer have explicitly agreed otherwise in writing. In no event however,  
shall an agreement be valid in which the NXP Semiconductors product  
is deemed to offer functions and qualities beyond those described in the  
Product data sheet.  
16.3 Disclaimers  
Limited warranty and liability — Information in this document is believed  
to be accurate and reliable. However, NXP Semiconductors does not  
give any representations or warranties, expressed or implied, as to the  
accuracy or completeness of such information and shall have no liability  
for the consequences of use of such information. NXP Semiconductors  
takes no responsibility for the content in this document if provided by an  
information source outside of NXP Semiconductors. In no event shall NXP  
Semiconductors be liable for any indirect, incidental, punitive, special or  
consequential damages (including - without limitation - lost profits, lost  
savings, business interruption, costs related to the removal or replacement  
of any products or rework charges) whether or not such damages are based  
on tort (including negligence), warranty, breach of contract or any other  
legal theory. Notwithstanding any damages that customer might incur for  
any reason whatsoever, NXP Semiconductors’ aggregate and cumulative  
liability towards customer for the products described herein shall be limited  
in accordance with the Terms and conditions of commercial sale of NXP  
Semiconductors.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) will cause permanent  
damage to the device. Limiting values are stress ratings only and (proper)  
operation of the device at these or any other conditions above those  
given in the Recommended operating conditions section (if present) or the  
Characteristics sections of this document is not warranted. Constant or  
repeated exposure to limiting values will permanently and irreversibly affect  
the quality and reliability of the device.  
Terms and conditions of commercial sale — NXP Semiconductors  
products are sold subject to the general terms and conditions of commercial  
sale, as published at http://www.nxp.com/profile/terms, unless otherwise  
agreed in a valid written individual agreement. In case an individual  
agreement is concluded only the terms and conditions of the respective  
agreement shall apply. NXP Semiconductors hereby expressly objects to  
applying the customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
Right to make changes — NXP Semiconductors reserves the right to  
make changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
SL3S1205_15  
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UCODE 8/8m  
No offer to sell or license — Nothing in this document may be interpreted  
or construed as an offer to sell products that is open for acceptance or  
the grant, conveyance or implication of any license under any copyrights,  
patents or other industrial or intellectual property rights.  
Translations — A non-English (translated) version of a document is for  
reference only. The English version shall prevail in case of any discrepancy  
between the translated and English versions.  
Security — Customer understands that all NXP products may be subject  
to unidentified or documented vulnerabilities. Customer is responsible  
for the design and operation of its applications and products throughout  
their lifecycles to reduce the effect of these vulnerabilities on customer’s  
applications and products. Customer’s responsibility also extends to other  
open and/or proprietary technologies supported by NXP products for use  
in customer’s applications. NXP accepts no liability for any vulnerability.  
Customer should regularly check security updates from NXP and follow up  
appropriately. Customer shall select products with security features that best  
meet rules, regulations, and standards of the intended application and make  
the ultimate design decisions regarding its products and is solely responsible  
for compliance with all legal, regulatory, and security related requirements  
concerning its products, regardless of any information or support that may  
be provided by NXP. NXP has a Product Security Incident Response Team  
(PSIRT) (reachable at PSIRT@nxp.com) that manages the investigation,  
reporting, and solution release to security vulnerabilities of NXP products.  
Quick reference data — The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
Export control — This document as well as the item(s) described herein  
may be subject to export control regulations. Export might require a prior  
authorization from competent authorities.  
Non-automotive qualified products — Unless this data sheet expressly  
states that this specific NXP Semiconductors product is automotive qualified,  
the product is not suitable for automotive use. It is neither qualified nor  
tested in accordance with automotive testing or application requirements.  
NXP Semiconductors accepts no liability for inclusion and/or use of non-  
automotive qualified products in automotive equipment or applications. In  
the event that customer uses the product for design-in and use in automotive  
applications to automotive specifications and standards, customer (a) shall  
use the product without NXP Semiconductors’ warranty of the product for  
such automotive applications, use and specifications, and (b) whenever  
customer uses the product for automotive applications beyond NXP  
Semiconductors’ specifications such use shall be solely at customer’s own  
risk, and (c) customer fully indemnifies NXP Semiconductors for any liability,  
damages or failed product claims resulting from customer design and use  
of the product for automotive applications beyond NXP Semiconductors’  
standard warranty and NXP Semiconductors’ product specifications.  
16.4 Trademarks  
Notice: All referenced brands, product names, service names and  
trademarks are the property of their respective owners.  
UCODE — is a trademark of NXP B.V.  
NXP — wordmark and logo are trademarks of NXP B.V.  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
Tables  
Tab. 1.  
Tab. 2.  
Tab. 3.  
Ordering information ..........................................5  
Pin description bare die .................................... 7  
8 inch specification with Large Pads,  
Tab. 10. Configuration word UCODE 8/8m ................... 20  
Tab. 11. Configuration word UCODE 8/8m ...  
continued .........................................................20  
stealth dicing ................................................... 11  
12 inch specification with Large Pads,  
conventional dicing ..........................................12  
12 inch specification with Large Pads,  
plasma dicing .................................................. 13  
UCODE 8 memory sections ............................16  
UCODE 8m memory sections .........................16  
UCODE 8 overall memory map .......................17  
UCODE 8m overall memory map ....................18  
Tab. 12. Untraceable command .................................... 27  
Tab. 13. Untraceable command-response table ............27  
Tab. 14. Limiting values ................................................ 28  
Tab. 15. UCODE 8/8m RF interface characteristics  
(RF1, RF2) ...................................................... 29  
Tab. 16. UCODE 8/8m memory characteristics .............29  
Tab. 17. Abbreviations ...................................................31  
Tab. 18. Revision history ...............................................33  
Tab. 4.  
Tab. 5.  
Tab. 6.  
Tab. 7.  
Tab. 8.  
Tab. 9.  
SL3S1205_15  
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SL3S1205_15  
UCODE 8/8m  
Figures  
Fig. 1.  
Fig. 2.  
Fig. 3.  
Block diagram of UCODE 8/8m IC ....................6  
Fig. 6.  
Fig. 7.  
Fig. 8.  
UCODE 8/8m TID memory structure ...............19  
Pre-serialization of 96-bit EPC ........................ 24  
Standard antenna design versus single-slit  
antenna ............................................................25  
Single-slit assembly .........................................25  
Pinning bare die, Large Pads ............................7  
UCODE 8/8m, 8" wafer layout, Large Pads,  
stealth dicing ..................................................... 8  
UCODE 8/8m, 12" wafer layout, Large  
Pads, conventional dicing ................................. 9  
UCODE 8/8m, 12" wafer layout, Large  
Fig. 4.  
Fig. 5.  
Fig. 9.  
Fig. 10. Rotation tolerant pad design ........................... 26  
Fig. 11. Dual axis glue spacer ..................................... 26  
Pads, plasma dicing ........................................10  
SL3S1205_15  
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NXP Semiconductors  
SL3S1205_15  
UCODE 8/8m  
Contents  
1
2
2.1  
2.1.1  
2.2  
3
3.1  
3.2  
4
5
6
6.1  
7
8
8.1  
8.1.1  
8.1.2  
8.1.3  
8.1.4  
9
9.1  
9.2  
9.3  
General description ............................................ 1  
12.1  
13  
14  
15  
16  
Wafer ............................................................... 30  
Abbreviations .................................................... 31  
References .........................................................32  
Revision history ................................................ 33  
Legal information ..............................................34  
Features and benefits .........................................2  
Key features ...................................................... 2  
Memory ..............................................................2  
Supported features ............................................ 3  
Applications .........................................................4  
Target market .....................................................4  
Applications ........................................................4  
Ordering information .......................................... 5  
Block diagram ..................................................... 6  
Pinning information ............................................ 7  
Pin description ...................................................7  
Wafer layout .........................................................8  
Mechanical specification ..................................11  
Wafer specification .......................................... 11  
8 inch Wafer with Large Pads, stealth dicing ... 11  
12 inch Wafer with Large Pads ........................12  
Fail die identification ........................................14  
Map file distribution ......................................... 14  
Functional description ......................................15  
Air interface standards .....................................15  
Power transfer ................................................. 15  
Data transfer ....................................................15  
Interrogator to tag Link .................................... 15  
Tag to interrogator Link ....................................15  
Supported commands ......................................16  
UCODE 8/8m memory .....................................16  
UCODE 8/8m overall memory map ................. 17  
UCODE 8/8m TID memory details ...................19  
Supported features .......................................... 20  
UCODE 8/8m features control mechanism ......20  
Memory Safeguard .......................................... 22  
Description .......................................................22  
Self Adjust ....................................................... 23  
Description .......................................................23  
Brand Identifier ................................................ 23  
Description .......................................................23  
EPC+TID ..........................................................24  
Description .......................................................24  
Product Status Flag (PSF) ...............................24  
Description .......................................................24  
Backscatter strength reduction ........................ 24  
Pre-serialization of the 96-bit EPC ...................24  
Description .......................................................24  
Single-slit antenna solution ..............................25  
Description .......................................................25  
Large Pads ...................................................... 26  
9.3.1  
9.3.2  
9.4  
9.5  
9.5.1  
9.5.2  
9.6  
9.6.1  
9.6.2  
9.6.2.1  
9.6.3  
9.6.3.1  
9.6.4  
9.6.4.1  
9.6.5  
9.6.5.1  
9.6.6  
9.6.6.1  
9.6.7  
9.6.8  
9.6.8.1  
9.6.9  
9.6.9.1  
9.6.10  
9.6.10.1 Description .......................................................26  
9.6.11  
10  
11  
11.1  
12  
Custom commands ..........................................27  
Limiting values ..................................................28  
Characteristics .................................................. 29  
UCODE 8/8m bare die characteristics .............29  
Packing information ..........................................30  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section 'Legal information'.  
© NXP B.V. 2021.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 1 April 2021  
Document number: 398435  

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