FDD6N50TM-WS [ONSEMI]

功率 MOSFET,N 沟道,UniFETTM,500 V,6 A,900 mΩ,DPAK;
FDD6N50TM-WS
型号: FDD6N50TM-WS
厂家: ONSEMI    ONSEMI
描述:

功率 MOSFET,N 沟道,UniFETTM,500 V,6 A,900 mΩ,DPAK

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Is Now  
To learn more about onsemi™, please visit our website at  
www.onsemi.com  
onsemi andꢀꢀꢀꢀꢀꢀꢀand other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or  
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FDD6N50 / FDU6N50  
TM  
N-Channel UniFET MOSFET  
500 V, 6 A, 900 mΩ  
Description  
UniFETTM MOSFET is ON Semiconductor’s high voltage  
MOSFET family based on planar stripe and DMOS technology.  
This MOSFET is tailored to reduce on-state resistance, and to  
provide better switching performance and higher avalanche  
energy strength. This device family is suitable for switching  
power converter applications such as power factor correction  
(PFC), flat panel display (FPD) TV power, ATX and electronic  
lamp ballasts.  
Features  
RDS(on) = 900 m(Max.) @ VGS = 10 V, ID = 3 A  
Low Gate Charge (Typ. 12.8 nC)  
Low Crss (Typ. 9 pF)  
100% Avalanche Tested  
Improved dv/dt Capability  
Applications  
LCD/LED/PDP TV  
Lighting  
Uninterruptible Power Supply  
AC-DC Power Supply  
D
D
G
S
I-PAK  
G
D-PAK  
G
D
S
S
Absolute Maximum Ratings TC = 25oC unless otherwise noted.  
FDD6N50TM /  
FDD6N50TM-WS /  
FDU6N50TU  
Symbol  
VDSS  
Parameter  
Unit  
Drain-Source Voltage  
Drain Current  
500  
V
ID  
- Continuous (TC = 25°C)  
- Continuous (TC = 100°C)  
6
3.8  
A
A
(Note 1)  
IDM  
Drain Current  
- Pulsed  
24  
±30  
270  
6
A
V
VGSS  
EAS  
IAR  
Gate-Source voltage  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
Single Pulsed Avalanche Energy  
Avalanche Current  
mJ  
A
EAR  
dv/dt  
PD  
Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
8.9  
4.5  
mJ  
V/ns  
Power Dissipation  
(TC = 25°C)  
- Derate Above 25°C  
89  
0.71  
W
W/°C  
TJ, TSTG  
TL  
Operating and Storage Temperature Range  
-55 to +150  
°C  
Maximum Lead Temperature for Soldering, 1/8” from Case for  
5 Seconds  
300  
°C  
Thermal Characteristics  
FDD6N50TM /  
FDD6N50TM-WS /  
FDU6N50TU  
Symbol  
Parameter  
Unit  
RθJC  
RθJA  
Thermal Resistance, Junction-to-Case, Max.  
Thermal Resistance, Junction-to-Ambient, Max.  
1.4  
83  
°C/W  
©2006 Semiconductor Components Industries, LLC.  
October-2017,Rev. 3  
Publication Order Number:  
FDU6N50/D  
Package Marking and Ordering Information  
Part Number  
FDD6N50TM  
Top Mark  
FDD6N50  
FDD6N50S  
FDU6N50  
Package  
DPAK  
DPAK  
IPAK  
Packing Method  
Tape and Reel  
Tape and Reel  
Tube  
Reel Size  
330 mm  
330 mm  
N/A  
Tape Width  
16 mm  
16 mm  
N/A  
Quantity  
2500 units  
2500 units  
75 units  
FDD6N50TM-WS  
FDU6N50TU  
Electrical Characteristics TC = 25°C unless otherwise noted.  
Symbol  
Parameter  
Conditions  
Min.  
Typ.  
Max  
Unit  
Off Characteristics  
BVDSS  
Drain-Source Breakdown Voltage  
VGS = 0 V, ID = 250 µA  
D = 250 µA, Referenced to 25°C  
500  
--  
--  
--  
--  
V
BVDSS  
/ TJ  
Breakdown Voltage Temperature  
Coefficient  
I
0.5  
V/°C  
IDSS  
Zero Gate Voltage Drain Current  
VDS = 500 V, VGS = 0 V  
VDS = 400 V, TC = 125°C  
--  
--  
--  
--  
1
10  
µA  
µA  
IGSSF  
IGSSR  
Gate-Body Leakage Current, Forward  
Gate-Body Leakage Current, Reverse  
VGS = 30 V, VDS = 0 V  
VGS = -30 V, VDS = 0 V  
--  
--  
--  
--  
100  
nA  
nA  
-100  
On Characteristics  
VGS(th) Gate Threshold Voltage  
RDS(on)  
VDS = VGS, ID = 250 µA  
VGS = 10 V, ID = 3 A  
VDS = 40 V, ID = 3 A  
3.0  
--  
--  
5.0  
0.9  
--  
V
S
Static Drain-Source  
On-Resistance  
0.76  
2.5  
gFS  
Forward Transconductance  
--  
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Input Capacitance  
VDS = 25 V, VGS = 0 V,  
f = 1.0 MHz  
--  
--  
--  
720  
95  
9
940  
190  
13.5  
pF  
pF  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics  
td(on) Turn-On Delay Time  
tr  
td(off)  
tf  
VDD = 250 V, ID = 6 A,  
--  
--  
--  
--  
--  
--  
--  
6
55  
20  
120  
60  
ns  
ns  
V
GS = 10 V, RG = 25 Ω  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
25  
ns  
(Note 4)  
(Note 4)  
35  
80  
ns  
Qg  
VDS = 400 V, ID = 6 A,  
VGS = 10 V  
12.8  
3.7  
5.8  
16.6  
--  
nC  
nC  
nC  
Qgs  
Qgd  
--  
Drain-Source Diode Characteristics and Maximum Ratings  
IS  
Maximum Continuous Drain-Source Diode Forward Current  
Maximum Pulsed Drain-Source Diode Forward Current  
--  
--  
--  
--  
--  
--  
--  
6
24  
1.4  
--  
A
A
ISM  
VSD  
trr  
Drain-Source Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0 V, IS = 6 A  
--  
V
VGS = 0 V, IS = 6 A,  
275  
1.7  
ns  
µC  
dIF/dt =100 A/µs  
Qrr  
Reverse Recovery Charge  
--  
Notes:  
1. Repetitive rating: pulse-width limited by maximum junction temperature.  
2. I = 6 A, V = 50 V, L=13.5 mH, R = 25 , starting T = 25°C.  
AS  
DD  
G
J
3. I 6 A, di/dt 200 A/µs, V BV  
, starting T = 25°C.  
SD  
DD  
DSS  
J
4. Essentially independent of operating temperature typical characteristics.  
www.onsemi.com  
2
Typical Performance Characteristics  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
20  
VGS  
Top :  
10.0 V  
8.0V  
101  
7.5 V  
7.0 V  
6.5 V  
6.0 V  
5.5 V  
15  
10  
5
150  
25℃  
Bottom : 5.0 V  
100  
10-1  
10-2  
-55℃  
Notes :  
1. 250μ s Pulse Test  
2. TC = 25℃  
Note  
1. VDS = 40V  
2. 250μ s Pulse Test  
0
0
10  
20  
30  
40  
50  
2
4
6
8
10  
VDS, Drain-Source Voltage [V]  
VGS , Gate-Source Voltage [V]  
Figure 3. On-Resistance Variation vs.  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current  
and Temperature  
Drain Current and Gate Voltage  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
101  
100  
10-1  
VGS = 10V  
VGS = 20V  
150  
25℃  
Notes :  
1. VGS = 0V  
2. 250μ s Pulse Test  
Note : TJ = 25℃  
0
5
10  
15  
20  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
1.6  
1.8  
VSD , Source-Drain Voltage [V]  
ID, Drain Current [A]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
12  
10  
8
Ciss = Cgs + Cgd (Cds = shorted)  
VDS = 100V  
VDS = 250V  
Coss = Cds + Cgd  
Crss = Cgd  
1000  
100  
10  
VDS = 400V  
C
iss  
Coss  
6
Crss  
4
Notes :  
1. VGS = 0 V  
2. f = 1 MHz  
2
Note : ID = 6A  
0
100  
101  
0
5
10  
15  
QG, Total Gate Charge [nC]  
VDS, Drain-Source Voltage [V]  
www.onsemi.com  
3
Typical Performance Characteristics (Continued)  
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. On-Resistance Variation  
vs. Temperature  
3.0  
1.2  
1.1  
1.0  
0.9  
0.8  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
Notes :  
1. VGS = 0 V  
Notes :  
1. VGS = 10 V  
2. ID = 3 A  
2. ID = 250 µA  
-100  
-50  
0
50  
100  
150  
200  
-100  
-50  
0
50  
100  
150  
200  
TJ, Junction Temperature [oC]  
TJ, Junction Temperature [oC]  
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs. Case Temperature  
8
6
4
2
0
102  
Operation in This Area  
is Limited by R DS(on)  
10 us  
101  
100 us  
1 ms  
10 ms  
100  
DC  
Notes :  
10-1  
1. TC = 25 o  
2. TJ = 150 o  
3. Single Pulse  
C
C
10-2  
100  
101  
102  
103  
25  
50  
75  
100  
125  
150  
VDS, Drain-Source Voltage [V]  
TC, Case Temperature []  
Figure 11. Transient Thermal Response Curve  
100  
10-1  
10-2  
D=0.5  
0.2  
0.1  
Notes :  
1. Zθ (t) = 1.4 /W M ax.  
JC  
2. Duty Factor, D=t1/t2  
3. TJM - TC  
=
PDM * Zθ (t)  
JC  
0.05  
0.02  
0.01  
PDM  
t1  
t2  
single pulse  
10-4  
10-5  
10-3  
10-2  
10-1  
100  
101  
t1, Square W ave Pulse Duration [sec]  
www.onsemi.com  
4
VGS  
Same Type  
as DUT  
50KΩ  
Qg  
12V  
200nF  
300nF  
VDS  
VGS  
Qgs  
Qgd  
DUT  
IG = const.  
Charge  
Figure 12. Gate Charge Test Circuit & Waveform  
RL  
VDS  
90%  
VDS  
VDD  
VGS  
RG  
10%  
VGS  
DUT  
V
GS  
td(on)  
tr  
td(off)  
tf  
t on  
t off  
Figure 13. Resistive Switching Test Circuit & Waveforms  
BVDSS  
--------------------  
BVDSS - VDD  
L
1
2
2
----  
EAS  
=
L IAS  
VDS  
I D  
BVDSS  
IAS  
RG  
VDD  
ID (t)  
V
VDS (t)  
VDD  
DUT  
GS  
t p  
t p  
Time  
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms  
www.onsemi.com  
5
+
DUT  
VDS  
_
I SD  
L
Driver  
RG  
Same Type  
as DUT  
VDD  
VGS  
• dv/dt controlled by RG  
• ISD controlled by pulse period  
Gate Pulse Width  
--------------------------  
VGS  
D =  
Gate Pulse Period  
10V  
( Driver )  
IFM , Body Diode Forward Current  
I SD  
di/dt  
( DUT )  
IRM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
VSD  
VDS  
( DUT )  
VDD  
Body Diode  
Forward Voltage Drop  
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms  
www.onsemi.com  
6
Mechanical Dimensions  
Figure 16. TO252 (D-PAK), Molded, 3-Lead, Option AA&AB  
Package drawings are provided as a service to customers considering ON Semiconductor components. Drawings may change in  
any manner without notice. Please note the revision and/or date on the drawing and contact a ON Semiconductor representative to  
verify or obtain the most recent revision. Package specifications do not expand the terms of ON Semiconductor’s worldwide terms and  
conditions, specif-ically the warranty therein, which covers ON Semiconductor products.  
www.onsemi.com  
7
Mechanical Dimensions  
Figure 17. TO-251 (I-PAK), Molded, 3-Lead, Option AA  
Package drawings are provided as a service to customers considering ON Semiconductor components. Drawings may change in  
any manner without notice. Please note the revision and/or date on the drawing and contact a ON Semiconductor representative to  
verify or obtain the most recent revision. Package specifications do not expand the terms of ON Semiconductor’s worldwide terms and  
conditions, specif-ically the warranty therein, which covers ON Semiconductor products.  
www.onsemi.com  
8
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
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