FDMS3008SDC [ONSEMI]
N 沟道双 CoolTM 56 PowerTrench® SyncFETTM;型号: | FDMS3008SDC |
厂家: | ONSEMI |
描述: | N 沟道双 CoolTM 56 PowerTrench® SyncFETTM |
文件: | 总10页 (文件大小:377K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
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July 2015
FDMS3008SDC
N-Channel Dual CoolTM 56 PowerTrench® SyncFETTM
30 V, 65 A, 2.6 mΩ
Features
General Description
Dual CoolTM Top Side Cooling PQFN package
Max rDS(on) = 2.6 mΩ at VGS = 10 V, ID = 28 A
Max rDS(on) = 3.3 mΩ at VGS = 4.5 V, ID = 22 A
High performance technology for extremely low rDS(on)
SyncFET Schottky Body Diode
This N-Channel MOSFET is produced using Fairchild
Semiconductor’s
advanced
PowerTrench®
process.
Advancements in both silicon and Dual CoolTM package
technologies have been combined to offer the lowest rDS(on)
while maintaining excellent switching performance by extremely
low Junction-to-Ambient thermal resistance. This device has the
added benefit of an efficient monolithic Schottky body diode.
RoHS Compliant
Applications
Synchronous Rectifier for DC/DC Converters
Telecom Secondary Side Rectification
High End Server/Workstation Vcore Low Side
Pin 1
S
S
D
D
D
D
S
S
G
S
S
G
D
D
D
D
Top
Dual CoolTM 56
Bottom
MOSFET Maximum Ratings TA = 25°C unless otherwise noted
Symbol
VDS
VGS
Parameter
Ratings
Units
Drain to Source Voltage
Gate to Source Voltage
30
±20
V
V
(Note 4)
Drain Current -Continuous (Package limited)
-Continuous (Silicon limited)
-Continuous
TC = 25 °C
C = 25 °C
65
T
140
ID
A
TA = 25 °C
(Note 1a)
29
-Pulsed
200
EAS
Single Pulse Avalanche Energy
Peak Diode Recovery dv/dt
Power Dissipation
(Note 3)
(Note 5)
112
mJ
dv/dt
2.3
V/ns
TC = 25 °C
TA = 25 °C
78
PD
W
Power Dissipation
(Note 1a)
3.3
TJ, TSTG
Operating and Storage Junction Temperature Range
-55 to +150
°C
Thermal Characteristics
RθJC
RθJC
RθJA
RθJA
RθJA
RθJA
RθJA
Thermal Resistance, Junction to Case
(Top Source)
(Bottom Drain)
(Note 1a)
3.5
1.6
38
81
16
23
11
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
(Note 1b)
°C/W
(Note 1i)
(Note 1j)
(Note 1k)
Package Marking and Ordering Information
Device Marking
Device
Package
Dual CoolTM 56
Reel Size
Tape Width
12 mm
Quantity
3008S
FDMS3008SDC
13’’
3000 units
©2012 Fairchild Semiconductor Corporation
FDMS3008SDC Rev.1.3
www.fairchildsemi.com
1
Electrical Characteristics TJ = 25°C unless otherwise noted
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
BVDSS
Drain to Source Breakdown Voltage
ID = 1 mA, VGS = 0 V
30
V
ΔBVDSS
ΔTJ
Breakdown Voltage Temperature
Coefficient
I
D = 10 mA, referenced to 25°C
13
mV/°C
IDSS
IGSS
Zero Gate Voltage Drain Current
VDS = 24 V, VGS = 0 V
500
100
μA
Gate to Source Leakage Current, Forward VGS = 20 V, VDS = 0 V
nA
On Characteristics
VGS(th)
Gate to Source Threshold Voltage
VGS = VDS, ID = 1 mA
D = 10 mA, referenced to 25°C
GS = 10 V, ID = 28 A
1.2
1.9
-5
3.0
V
ΔVGS(th)
ΔTJ
Gate to Source Threshold Voltage
Temperature Coefficient
I
mV/°C
V
1.8
2.7
2.4
144
2.6
3.3
3.6
rDS(on)
gFS
Static Drain to Source On Resistance
Forward Transconductance
VGS = 4.5 V, ID = 22 A
mΩ
VGS = 10 V, ID = 28 A, TJ = 125°C
VDS = 5 V, ID = 28 A
S
Dynamic Characteristics
Ciss
Coss
Crss
Rg
Input Capacitance
3400
1115
80
4520
1485
120
pF
pF
pF
Ω
VDS = 15 V, VGS = 0 V,
f = 1MHz
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
0.7
Switching Characteristics
td(on)
tr
td(off)
tf
Turn-On Delay Time
Rise Time
15
4.7
33
3
27
10
53
10
64
29
ns
ns
VDD = 15 V, ID = 28 A,
V
GS = 10 V, RGEN = 6 Ω
Turn-Off Delay Time
Fall Time
ns
ns
Qg
Total Gate Charge
Total Gate Charge
Gate to Source Charge
Gate to Drain “Miller” Charge
VGS = 0 V to 10 V
VGS = 0 V to 4.5 V
46
21
9.6
4.3
nC
nC
nC
nC
Qg
VDD = 15 V,
D = 28 A
I
Qgs
Qgd
Drain-Source Diode Characteristics
V
GS = 0 V, IS = 2 A
(Note 2)
(Note 2)
0.4
0.8
32
0.8
1.2
51
VSD
Source-Drain Diode Forward Voltage
V
VGS = 0 V, IS = 28 A
trr
Reverse Recovery Time
ns
IF = 28 A, di/dt = 300 A/μs
Qrr
Reverse Recovery Charge
39
62
nC
©2012 Fairchild Semiconductor Corporation
FDMS3008SDC Rev.1.3
www.fairchildsemi.com
2
Thermal Characteristics
RθJC
RθJC
RθJA
RθJA
RθJA
RθJA
RθJA
RθJA
RθJA
RθJA
RθJA
RθJA
RθJA
RθJA
Thermal Resistance, Junction to Case
(Top Source)
(Bottom Drain)
(Note 1a)
(Note 1b)
(Note 1c)
(Note 1d)
(Note 1e)
(Note 1f)
3.5
1.6
38
81
27
34
16
19
26
61
16
23
11
Thermal Resistance, Junction to Case
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
Thermal Resistance, Junction to Ambient
°C/W
(Note 1g)
(Note 1h)
(Note 1i)
(Note 1j)
(Note 1k)
(Note 1l)
13
NOTES:
1. R
is determined with the device mounted on a FR-4 board using a specified pad of 2 oz copper as shown below. R
is guaranteed by design while R is determined
θCA
θJA
θJC
by the user's board design.
b. 81 °C/W when mounted on
a minimum pad of 2 oz copper
a. 38 °C/W when mounted on
a 1 in pad of 2 oz copper
2
2
c. Still air, 20.9x10.4x12.7mm Aluminum Heat Sink, 1 in pad of 2 oz copper
d. Still air, 20.9x10.4x12.7mm Aluminum Heat Sink, minimum pad of 2 oz copper
2
e. Still air, 45.2x41.4x11.7mm Aavid Thermalloy Part # 10-L41B-11 Heat Sink, 1 in pad of 2 oz copper
f. Still air, 45.2x41.4x11.7mm Aavid Thermalloy Part # 10-L41B-11 Heat Sink, minimum pad of 2 oz copper
2
g. 200FPM Airflow, No Heat Sink,1 in pad of 2 oz copper
h. 200FPM Airflow, No Heat Sink, minimum pad of 2 oz copper
2
i. 200FPM Airflow, 20.9x10.4x12.7mm Aluminum Heat Sink, 1 in pad of 2 oz copper
j. 200FPM Airflow, 20.9x10.4x12.7mm Aluminum Heat Sink, minimum pad of 2 oz copper
2
k. 200FPM Airflow, 45.2x41.4x11.7mm Aavid Thermalloy Part # 10-L41B-11 Heat Sink, 1 in pad of 2 oz copper
l. 200FPM Airflow, 45.2x41.4x11.7mm Aavid Thermalloy Part # 10-L41B-11 Heat Sink, minimum pad of 2 oz copper
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.
3. E of 112 mJ is based on starting T = 25 °C, L = 1 mH, I = 15 A, V = 27 V, V = 10 V. 100% test at L = 0.1 mH, I = 33.4 A.
AS
J
AS
DD
GS
AS
©2012 Fairchild Semiconductor Corporation
FDMS3008SDC Rev.1.3
www.fairchildsemi.com
3
Typical Characteristics TJ = 25°C unless otherwise noted
200
4
3
2
1
0
VGS = 10 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
VGS = 6 V
150
VGS = 3.5 V
VGS = 4.5 V
VGS = 4 V
VGS = 4 V
100
VGS = 4.5 V
50
VGS = 6 V
VGS = 10 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
VGS = 3.5 V
0.5
0
0.0
1.0
1.5
2.0
0
40
80
120
160
200
ID, DRAIN CURRENT (A)
VDS, DRAIN TO SOURCE VOLTAGE (V)
Figure 1. On Region Characteristics
Figure2. N o r m a l i z e d O n - R e s i s ta n c e
vs Drain Current and Gate Voltage
1.6
10
ID = 28 A
GS = 10 V
PULSE DURATION = 80 μs
DUTY CYCLE = 0.5% MAX
V
1.4
1.2
1.0
0.8
0.6
8
6
4
2
0
ID = 28 A
TJ = 125 o
C
TJ = 25 o
C
-75 -50 -25
0
25 50 75 100 125 150
2
4
6
8
10
TJ, JUNCTION TEMPERATURE (oC)
VGS, GATE TO SOURCE VOLTAGE (V)
Figure4. On-Resistance vs Gate to
Source Voltage
Figure 3. Normalized On Resistance
vs Junction Temperature
200
200
100
PULSE DURATION = 80 μs
VGS = 0 V
DUTY CYCLE = 0.5% MAX
10
150
100
50
TJ = 125 o
C
VDS = 5 V
TJ = 125 o
C
1
TJ = 25 o
C
TJ = 25 o
C
0.1
TJ = -55 o
C
0.01
0.001
TJ = -55 o
C
0
2.0
2.5
3.0
3.5
4.0
0.0
0.2
0.4
0.6
0.8
1.0
1.2
VGS, GATE TO SOURCE VOLTAGE (V)
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 5. Transfer Characteristics
Figure6. Source to Drain Diode
Forward Voltage vs Source Current
©2012 Fairchild Semiconductor Corporation
FDMS3008SDC Rev.1.3
www.fairchildsemi.com
4
Typical Characteristics TJ = 25°C unless otherwise noted
10
5000
1000
ID = 28 A
VDD = 15 V
Ciss
8
VDD = 10 V
Coss
6
VDD = 20 V
4
2
0
Crss
100
40
f = 1 MHz
= 0 V
V
GS
0
10
20
30
40
50
30
0.1
1
10
VDS, DRAIN TO SOURCE VOLTAGE (V)
Q , GATE CHARGE (nC)
g
Figure 7. Gate Charge Characteristics
Figure8. C a p a c i t a n c e v s D r a i n
to Source Voltage
40
160
120
80
40
0
R
θJC = 2 oC/W
VGS = 10 V
TJ = 25 oC
10
VGS = 4.5 V
TJ = 100 oC
TJ = 125 o
C
Limited by Package
1
0.01
0.1
1
10
100
25
50
75
100
125
150
TC, CASE TEMPERATURE (oC)
tAV, TIME IN AVALANCHE (ms)
Figure9. U n c l a m p e d I n d u c t i v e
Switching Capability
Figure10. Maximum Continuous Drain
Current vs Case Temperature
500
100
2000
1000
100
10
100 μs
10
1
1 ms
THIS AREA IS
10 ms
100 ms
1 s
LIMITED BY r
DS(on)
SINGLE PULSE
SINGLE PULSE
θJA = 81 oC/W
T
J = MAX RATED
θJA = 81 oC/W
A = 25 oC
10 s
DC
0.1
0.01
R
R
T
A = 25 oC
T
1
10-4
10-3
10-2
t, PULSE WIDTH (sec)
10-1
1
10
0.01
0.1
1
10
100200
100 1000
VDS, DRAIN to SOURCE VOLTAGE (V)
Figure 11. Forward Bias Safe
Operating Area
Figure12. Single Pulse Maximum
Power Dissipation
©2012 Fairchild Semiconductor Corporation
FDMS3008SDC Rev.1.3
www.fairchildsemi.com
5
Typical Characteristics TJ = 25°C unless otherwise noted
2
DUTY CYCLE-DESCENDING ORDER
1
D = 0.5
0.2
0.1
0.05
0.1
P
DM
0.02
0.01
t
1
0.01
t
2
SINGLE PULSE
NOTES:
DUTY FACTOR: D = t /t
R
θJA = 81 oC/W
1
2
PEAK T = P
J
x Z
x R
+ T
DM
θJA
θJA A
0.001
0.0005
10-4
10-3
10-2
10-1
t, RECTANGULAR PULSE DURATION (sec)
100
101
100
1000
Figure 13. Junction-to-Ambient Transient Thermal Response Curve
©2012 Fairchild Semiconductor Corporation
FDMS3008SDC Rev.1.3
www.fairchildsemi.com
6
Typical Characteristics (continued)
SyncFET Schottky body diode
Characteristics
Schottky barrier diodes exhibit significant leakage at high tem-
perature and high reverse voltage. This will increase the power
in the device.
Fairchild’s SyncFET process embeds a Schottky diode in parallel
with PowerTrench MOSFET. This diode exhibits similar
characteristics to a discrete external Schottky diode in parallel
with
a MOSFET. Figure 14 shows the reverse recovery
characteristic of the FDMS3008SDC.
0.01
30
25
20
TJ = 125 o
C
0.001
0.0001
TJ = 100 o
C
di/dt = 300 A/μs
15
10
5
0.00001
0.000001
TJ = 25 o
C
0
-5
0
5
10
15
20
25
0
50
100
150
200
250
300
VDS, REVERSE VOLTAGE (V)
TIME (ns)
Figure 15. SyncFET body diode reverses
leakage versus drain-source voltage
Figure 14. FDMS3008SDC SyncFET body
diode reverse recovery characteristic
©2012 Fairchild Semiconductor Corporation
FDMS3008SDC Rev.1.3
www.fairchildsemi.com
7
(2X)
A
.1 C
(2X)
4.90
A
5.10
3.91
(2.60)
.1 C
1.27
C
L
0.77
(0.90)
B
8
7
6
5
8
5
KEEP-
OUT
AREA
2.54
A
2.04
2.67
(3.30)
C
5.80
L
1.22
1.27
(2.08)
(0.82)
1
4
(1.05)
1
2
3
4
OPTIONAL PIN 1
INDICATOR
SEE
DETAIL A
0.61
1.27
3.81
LAND PATTERN
RECOMMENDATION
A
5.00
4.80
OPTIONAL DRAFT ANGLE
MAY APPEAR ON FOUR
SIDES OF THE PACKAGE
A
3.81
0.41
(8X)
0.31
1.27
0.50
0.40
(0.34)
(8X)
0.10
7°
1
2
3
4
C A B
(1.02)
0.71
0.44
A
(1.40)
(4X)
A
(0.50)
A
5.85
5.50
0.35
0.25
0.40
0.30
3.58
3.38
CHAMFER
CORNER
(0.20)
(8X)
AS PIN #1
IDENT MAY
APPEAR AS
OPTIONAL
8
7
6
5
0.65
0.45
3.86
3.61
NOTES:
(4X)
A) PACKAGE IS NOT FULLY COMPLIANT
TO JEDEC MO-240, VARIATION AA.
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS DO NOT INCLUDE BURRS
OR MOLD FLASH. MOLD FLASH OR
BURRS DOES NOT EXCEED 0.10MM.
D) DIMENSIONING AND TOLERANCING PER
ASME Y14.5M-2009.
0.1 MAX
0.10 C
E) IT IS RECOMMENDED TO HAVE NO TRACES
OR VIAS WITHIN THE KEEP OUT AREA.
F) DRAWING FILE NAME: PQFN08DREV4
0.08 C
0.30
0.20
0.05
0.00
C
1.05
0.95
SEATING
PLANE
SCALE: 2:1
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are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
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