NDC100170A [ONSEMI]

Silicon Carbide (SiC) Schottky Diode – EliteSiC, 100 A, 1700 V, Die;
NDC100170A
型号: NDC100170A
厂家: ONSEMI    ONSEMI
描述:

Silicon Carbide (SiC) Schottky Diode – EliteSiC, 100 A, 1700 V, Die

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DIE DATA SHEET  
www.onsemi.com  
Silicon Carbide (SiC)  
Schottky Diode – EliteSiC,  
100 A, 1700 V, D1, Die  
1. Cathode  
2. Anode  
Schottky Diode  
NDC100170A,  
NDCTR100170A  
Description  
Silicon Carbide (SiC) Schottky Diodes use a completely new  
technology that provides superior switching performance and higher  
reliability compared to Silicon. No reverse recovery current,  
temperature independent switching characteristics, and excellent  
thermal performance sets Silicon Carbide as the next generation of  
power semiconductor. System benefits include highest efficiency,  
faster operating frequency, increased power density, reduced EMI, and  
reduced system size and cost.  
Anode  
CROSS SECTION  
Features  
Max Junction Temperature 175C  
Avalanche Rated 2045 mJ  
High Surge Current Capacity  
Positive Temperature Coefficient  
Ease of Paralleling  
No Reverse Recovery / No Forward Recovery  
Applications  
Industrial Motor Loads, Wind Generation Inverter, Solar Inverter,  
UPS  
Power Switching Circuits  
Die Information  
Wafer Diameter: 6 inch  
Die Size: 6140 9500 mm  
(include Scribe Lane)  
Metallization:  
Top: Ti/TiN/AISiCu  
Back: Ti/NiV/Ag  
Die Thickness: Typ. 200 mm  
ORDERING INFORMATION  
See detailed ordering and shipping information on page 3 of  
this data sheet.  
Bonding Pad Size:  
Anode: 4260 7620 mm  
Recommended Wire Bond (Note 1)  
Anode: 20 mil 3  
NOTE:  
1. Based on TO247 package  
Semiconductor Components Industries, LLC, 2020  
1
Publication Order Number:  
January, 2023 Rev. 2  
NDC100170A/D  
 
NDC100170A, NDCTR100170A  
ABSOLUTE MAXIMUM RATINGS (T = 25C unless otherwise noted)  
J
Symbol  
Parameter  
Value  
1700  
Unit  
V
V
RRM  
Peak Repetitive Reverse Voltage  
E
Single Pulse Avalanche Energy (Notes 2 and 4)  
Continuous Rectified Forward Current @ T < 153C  
2025  
mJ  
A
AS  
I
100  
F
C
Continuous Rectified Forward Current @ T < 135C  
145  
C
I
Non-Repetitive Peak Forward Surge Current  
1435  
A
A
T
C
T
C
= 25C, 10 ms  
= 150C, 10 ms  
F, Max  
1428  
I
Non-Repetitive Forward Surge Current  
Power Dissipation  
Half-Sine Pulse, t = 8.3 ms  
574  
A
F,SM  
p
Ptot  
T
C
C
= 25C  
1666  
W
W
C  
T
= 150C  
277  
T , T  
J
Operating and Storage Temperature Range  
55 to +175  
STG  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
2. E of 2025 mJ is based on starting T = 25C, L = 0.5 mH, I = 90 A, V = 50 V.  
AS  
FMax  
J
AS  
3. I  
, and I  
AS  
surge test value are limited by measurement limitation, it’s not product capability  
FSM  
4. DC, E and Curve test result base on TO247 package  
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Thermal Resistance, Junction to Case, Max  
Value  
Unit  
R
0.09  
C/W  
q
JC  
ELECTRICAL CHARACTERISTICS (T = 25C unless otherwise noted)  
J
Symbol  
Parameter  
Forward Voltage  
Test Condition  
I = 100 A, T = 25C  
Min  
Typ  
1.6  
Max  
Unit  
V
F
V
F
J
I = 100 A, T = 125C  
2.16  
2.6  
F
J
I = 100 A, T = 175C  
F
J
I
Reverse Current  
V
V
V
= 1700 V, T = 25C  
0.15  
1.45  
12.3  
604  
7672  
539  
383  
40  
60  
100  
mA  
R
R
R
R
J
= 1700 V, T = 125C  
J
= 1700 V, T = 175C  
J
Q
Total Capacitive Charge  
Total Capacitance  
V = 800 V  
nC  
pF  
C
C
V
R
V
R
V
R
= 1 V, f = 100 kHz  
= 400 V, f = 100 kHz  
= 800 V, f = 100 kHz  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
www.onsemi.com  
2
 
NDC100170A, NDCTR100170A  
The Configuration of Chips  
(Based on 6 inch Wafer)  
chip  
chip  
PSPI Passivation Line  
Scribe Lane  
80.0 mm  
chip  
chip  
Sawnonfilm frame packing based on tested wafer  
ORDERING INFORMATION  
Part Number  
Die Size with SL (mm)  
6140*9500  
Package  
N/A  
Shipping  
Wafer Sales  
Tape & Reel  
NDC100170A  
NDCTR100170A  
6140*9500  
N/A  
www.onsemi.com  
3
NDC100170A, NDCTR100170A  
TYPICAL CHARACTERISTICS (T = 25C UNLESS OTHERWISE NOTED)  
J
100  
90  
1E03  
T = 55C  
J
T = 175C  
T = 25C  
J
J
1E04  
1E05  
1E06  
1E07  
80  
70  
60  
50  
40  
30  
20  
T = 175C  
J
T = 75C  
T = 125C  
J
J
T = 125C  
J
T = 75C  
J
1E08  
1E09  
10  
0
T = 25C  
J
T = 55C  
J
0
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
0
500  
1000  
1500  
2000  
175  
1K  
V , FORWARD VOLTAGE (V)  
F
V , REVERSE VOLTAGE (V)  
R
Figure 1. Forward Characteristics  
Figure 2. Reverse Characteristics  
1200  
1000  
800  
1800  
1500  
1200  
D = 0.1  
D = 0.2  
D = 0.3  
D = 0.5  
600  
900  
600  
400  
D = 1.0  
200  
0
300  
0
D = 0.7  
25  
50  
75  
100  
125  
150  
175  
25  
50  
75  
100  
125  
150  
T , CASE TEMPERATURE (C)  
C
T , CASE TEMPERATURE (C)  
C
Figure 3. Current Derating  
Figure 4. Power Derating  
700  
600  
500  
400  
300  
200  
30K  
10K  
1K  
100  
0
100  
0
100  
200  
300  
400 500  
600  
700 800  
0.1  
1
10  
100  
V , REVERSE VOLTAGE (V)  
R
V , REVERSE VOLTAGE (V)  
R
Figure 5. Capacitive Charge vs. Reverse  
Voltage  
Figure 6. Capacitance vs. Reverse Voltage  
www.onsemi.com  
4
NDC100170A, NDCTR100170A  
TYPICAL CHARACTERISTICS (T = 25C UNLESS OTHERWISE NOTED)  
J
180  
160  
140  
120  
100  
80  
60  
40  
20  
0
0
100  
200 300  
400 500  
600  
700  
800  
V , REVERSE VOLTAGE (V)  
R
Figure 7. Capacitance Stored Energy  
1
0.1  
Duty Cycle = 0.5  
0.2  
0.1  
0.05  
0.02  
0.01  
0.01  
0.001  
Single Pulse  
0.0001  
0.000001 0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
t, RECTANGULAR PULSE DURATION (sec)  
Figure 8. JunctiontoCase Transient Thermal Response  
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5
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provided by onsemi. “Typical” parameters which may be provided in onsemi data sheets and/or specifications can and do vary in different applications and actual performance may  
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