SFH4850E7800 [OSRAM]

IR-Lumineszenzdiode (850 nm) mit hoher Ausgangsleistung High Power Infrared Emitter (850 nm) Lead (Pb) Free Product - RoHS Compliant; IR- Lumineszenzdiode ( 850纳米),麻省理工学院达赫Ausgangsleistung高功率红外发射器( 850纳米),铅(Pb )免费产品 - 符合RoHS
SFH4850E7800
型号: SFH4850E7800
厂家: OSRAM GMBH    OSRAM GMBH
描述:

IR-Lumineszenzdiode (850 nm) mit hoher Ausgangsleistung High Power Infrared Emitter (850 nm) Lead (Pb) Free Product - RoHS Compliant
IR- Lumineszenzdiode ( 850纳米),麻省理工学院达赫Ausgangsleistung高功率红外发射器( 850纳米),铅(Pb )免费产品 - 符合RoHS

文件: 总7页 (文件大小:219K)
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IR-Lumineszenzdiode (850 nm) mit hoher Ausgangsleistung  
High Power Infrared Emitter (850 nm)  
Lead (Pb) Free Product - RoHS Compliant  
SFH 4850 E7800  
Vorläufige Daten / Preliminary Data  
Features  
Wesentliche Merkmale  
• High Power Infrared LED  
• Anode is electrically connected to the case  
• Peak wavelength typ. 850 nm  
• Very high radiance  
• DIN humidity category in acc. with  
DIN 40 040 GQG  
• Infrarot LED mit hoher Ausgangsleistung  
• Anode galvanisch mit dem Gehäuseboden  
verbunden  
• Emissionswellenlänge typ. 850 nm  
• Sehr hohe Strahldichte  
• Anwendungsklasse nach DIN 40 040 GQG  
Applications  
Anwendungen  
• Sensor technology  
• Light curtains  
• Sensorik  
• Lichtgitter  
Safety Advices  
Sicherheitshinweise  
Depending on the mode of operation, these  
devices emit highly concentrated non visible  
infrared light which can be hazardous to the  
human eye. Products which incorporate these  
devices have to follow the safety precautions  
given in IEC 60825-1 and IEC 62471.  
Je nach Betriebsart emittieren diese Bauteile  
hochkonzentrierte, nicht sichtbare Infrarot-  
Strahlung, die gefährlich für das menschliche  
Auge sein kann. Produkte, die diese Bauteile  
enthalten, müssen gemäß den Sicherheits-  
richtlinien der IEC-Normen 60825-1 und 62471  
behandelt werden.  
Typ  
Type  
Bestellnummer  
Ordering Code  
Strahlstärkegruppierung1) (IF = 100 mA, tp = 20 ms)  
Radiant Intensity Grouping1)  
Ie (mW/sr)  
SFH 4850 E7800  
Q65110A2093  
4 (typ. 7)  
1) gemessen bei einem Raumwinkel = 0.01 sr / measured at a solid angle of = 0.01 sr  
ATTENTION - Observe Precautions For Handling - Electrostatic Sensitive Device  
2007-12-07  
1
SFH 4850 E7800  
Grenzwerte (TC = 25 °C)  
Maximum Ratings  
Bezeichnung  
Parameter  
Symbol  
Symbol  
Wert  
Value  
Einheit  
Unit  
Betriebs- und Lagertemperatur  
Top , Tstg  
– 40 + 80  
°C  
Operating and storage temperature range  
Sperrspannung  
Reverse voltage  
VR  
5
V
Vorwärtsgleichstrom  
Forward current  
IF  
200  
1
mA  
A
Stoßstrom, tp = 10 µs, D = 0  
Surge current  
IFSM  
Ptot  
Verlustleistung  
470  
mW  
Power dissipation  
Wärmewiderstand Sperrschicht - Umgebung  
Thermal resistance junction - ambient  
Wärmewiderstand Sperrschicht - Gehäuse  
Thermal resistance junction - case  
RthJA  
RthJC  
450  
160  
K/W  
K/W  
Kennwerte (TA = 25 °C)  
Characteristics  
Bezeichnung  
Parameter  
Symbol  
Symbol  
Wert  
Value  
Einheit  
Unit  
Wellenlänge der Strahlung  
Wavelength at peak emission  
IF = 100 mA  
λpeak  
850  
nm  
Spektrale Bandbreite bei 50% von Imax  
Spectral bandwidth at 50% of Imax  
IF = 100 mA  
∆λ  
35  
nm  
Abstrahlwinkel  
Half angle  
ϕ
± 23  
Grad  
deg.  
Aktive Chipfläche  
Active chip area  
0.09  
mm2  
mm²  
ns  
A
Abmessungen der aktiven Chipfläche  
Dimension of the active chip area  
L × B  
L × W  
0.3 × 0.3  
12  
Schaltzeiten, Ie von 10% auf 90% und von 90% tr, tf  
auf 10%, bei IF = 100 mA, RL = 50 Ω  
Switching times, Ιe from 10% to 90% and from  
90% to 10%, IF = 100 mA, RL = 50 Ω  
2007-12-07  
2
SFH 4850 E7800  
Kennwerte (TA = 25 °C)  
Characteristics (cont’d)  
Bezeichnung  
Parameter  
Symbol  
Symbol  
Wert  
Value  
Einheit  
Unit  
Durchlassspannung  
Forward voltage  
IF = 100 mA, tp = 20 ms  
IF = 1 A, tp = 100 µs  
VF  
VF  
1.5 (< 1.8)  
2.4 (< 3.0)  
V
V
Sperrstrom  
Reverse current  
VR = 5 V  
IR  
not designed for µA  
reverse  
operation  
Gesamtstrahlungsfluss  
Total radiant flux  
IF = 100 mA, tp = 20 ms  
Φe typ  
TCI  
50  
mW  
Temperaturkoeffizient von Ie bzw. Φe,  
IF = 100 mA  
– 0.5  
%/K  
Temperature coefficient of Ie or Φe, IF = 100 mA  
Temperaturkoeffizient von VF, IF = 100 mA  
Temperature coefficient of VF, IF = 100 mA  
TCV  
TCλ  
– 0.7  
+ 0.2  
mV/K  
nm/K  
Temperaturkoeffizient von λ, IF = 100 mA  
Temperature coefficient of λ, IF = 100 mA  
2007-12-07  
3
SFH 4850 E7800  
Strahlstärke Ie in Achsrichtung1)  
gemessen bei einem Raumwinkel = 0.01 sr  
Radiant Intensity Ie in Axial Direction  
at a solid angle of = 0.01 sr  
Bezeichnung  
Parameter  
Symbol  
Werte  
Values  
Einheit  
Unit  
SFH 4850 E7800 -P  
SFH 4850 E7800 -Q  
Strahlstärke  
Radiant intensity  
IF = 100 mA, tp = 20 ms  
Ie min  
Ie max  
4
8
6.3  
12.5  
mW/sr  
mW/sr  
Strahlstärke  
Ie typ  
45  
55  
mW/sr  
Radiant intensity  
IF = 1 A, tp = 100 µs  
1) Nur eine Gruppe in einer Verpackungseinheit (Streuung kleiner 2:1)  
Die Messung der Strahlstärke und des Halbwinkels erfolgt mit einer Lochblende vor dem Bauteil (Durchmesser  
der Lochblende: 1.1 mm; Abstand Lochblende zu Gehäuserückseite: 4,0 mm). Dadurch wird sichergestellt, dass  
bei der Strahlstärkemessung nur diejenige Strahlung in Achsrichtung bewertet wird, die direkt von der  
Chipoberfläche austritt. Von der Bodenplatte reflektierte Strahlung (vagabundierende Strahlung) wird dagegen  
nicht bewertet. Diese Reflexionen sind besonders bei Abbildungen der Chipoberfläche über Zusatzoptiken  
störend (z.B. Lichtschranken großer Reichweite). In der Anwendung werden im allgemeinen diese Reflexionen  
ebenfalls durch Blenden unterdrückt. Durch dieses der Anwendung entsprechende Messverfahren ergibt sich für  
die Anwender eine besser verwertbare Größe. Diese Lochblendenmessung ist gekennzeichnet durch den Eintrag  
„E 7800“, der an die Typenbezeichnung angehängt ist.  
1)  
Only one group in one packing unit, (variation lower 2:1)  
An aperture is used in front of the component for measurement of the radiant intensity and the half angle (diameter  
of the aperture: 1.1 mm; distance of aperture to case back side: 4.0 mm). This ensures that solely the radiation  
in axial direction emitting directly from the chip surface will be evaluated during measurement of the radiant  
intensity. Radiation reflected by the bottom plate (stray radiation) will not be evaluated. These reflections impair  
the projection of the chip surface by additional optics (e.g. long-range light reflection switches). In respect of the  
application of the component, these reflections are generally suppressed by apertures as well. This measuring  
procedure corresponding with the application provides more useful values. This aperture measurement is denoted  
by ’E 7800’ added to the type designation.  
2007-12-07  
4
SFH 4850 E7800  
Ie  
= f (IF)  
Relative Spectral Emission  
Irel = f (λ)  
Radiant Intensity  
Max. Permissible Forward Current  
IF = f (TA)  
Ie 100 mA  
Single pulse, tp = 20 µs  
OHF02644  
OHL01714  
OHL01715  
100  
%
101  
250  
Ie  
mA  
IF  
Ie (100 mA)  
Irel  
80  
60  
40  
20  
0
200  
100  
5
RthJC = 160 K/W  
150  
100  
50  
10-1  
5
RthJA = 450 K/W  
10-2  
5
10-3  
100  
5
101  
5
102  
103  
mA  
IF  
700  
750  
800  
850  
nm 950  
0
λ
0
20  
40  
60  
80 ˚C 100  
T
Forward Current IF = f (VF)  
Single pulse, tp = 20 µs  
Permissible Pulse Handling  
Capability IF = f (τ), TC = 25 °C,  
duty cycle D = parameter  
OHF02645  
104  
mA  
tP  
OHL01713  
100  
tP  
IF  
IF  
D
= T  
A
IF  
T
D
=
10-1  
5
0.005  
0.01  
0.02  
0.05  
103  
102  
101  
0.1  
0.2  
10-2  
5
0.5  
1
10-3  
5
10-4  
0
0.5  
1
1.5  
2
2.5 V 3  
VF  
10-5 10-4 10-3 10-2 10-1 100 101 s 102  
tp  
2007-12-07  
5
SFH 4850 E7800  
Maßzeichnung  
Package Outlines  
Chip position  
2.7 (0.106)  
1.1 (0.043)  
0.9 (0.035)  
ø0.45 (0.018)  
1.1 (0.043)  
0.9 (0.035)  
1
2
14.5 (0.571)  
12.5 (0.492)  
3.6 (0.142)  
3.0 (0.118)  
ø5.5 (0.217)  
ø5.2 (0.205)  
GETY6625  
Maße in mm (inch) / Dimensions in mm (inch).  
Gehäuse / Package  
18 A3 DIN 41870 (TO-18), Bodenplatte, klares Epoxy-Gießharz, Anschlüsse im  
2.54-mm-Raster (1/10“)  
18 A3 DIN 41870 (TO-18), clear epoxy resin,  
lead spacing 2.54-mm(1/10“)  
Anschlussbelegung  
Pin configuration  
1 = Kathode / cathode  
2 = Anode / anode  
Abstrahlcharakteristik  
Radiation Characteristics Irel = f (ϕ)  
40  
30  
20  
10  
0
OHR01457  
1.0  
0.8  
0.6  
0.4  
0.2  
0
50  
60  
70  
80  
90  
100  
1.0  
0.8  
0.6  
0.4  
0
20  
40  
60  
80  
100  
120  
2007-12-07  
6
SFH 4850 E7800  
Lötbedingungen  
Soldering Conditions  
Wellenlöten (TTW)  
TTW Soldering  
(nach CECC 00802)  
(acc. to CECC 00802)  
OHLY0598  
300  
C
10 s  
Normalkurve  
standard curve  
250  
200  
150  
100  
50  
T
235 C ... 260 C  
Grenzkurven  
limit curves  
2. Welle  
2. wave  
1. Welle  
1. wave  
ca 200 K/s  
2 K/s  
5 K/s  
100 C ... 130 C  
Zwangskühlung  
forced cooling  
2 K/s  
0
0
50  
100  
150  
200  
s
250  
t
Published by  
OSRAM Opto Semiconductors GmbH  
Wernerwerkstrasse 2, D-93049 Regensburg  
www.osram-os.com  
© All Rights Reserved.  
The information describes the type of component and shall not be considered as assured characteristics.  
Terms of delivery and rights to change design reserved. Due to technical requirements components may contain  
dangerous substances. For information on the types in question please contact our Sales Organization.  
Packing  
Please use the recycling operators known to you. We can also help you – get in touch with your nearest sales office.  
By agreement we will take packing material back, if it is sorted. You must bear the costs of transport. For packing  
material that is returned to us unsorted or which we are not obliged to accept, we shall have to invoice you for any costs  
incurred.  
Components used in life-support devices or systems must be expressly authorized for such purpose! Critical  
components 1 , may only be used in life-support devices or systems 2 with the express written approval of OSRAM OS.  
1 A critical component is a component usedin a life-support device or system whose failure can reasonably be expected  
to cause the failure of that life-support device or system, or to affect its safety or effectiveness of that device or system.  
2 Life support devices or systems are intended (a) to be implanted in the human body, or (b) to support and/or maintain  
and sustain human life. If they fail, it is reasonable to assume that the health of the user may be endangered.  
2007-12-07  
7

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