SMG2321P [SECOS]

P-Channel Enhancement MOSFET; P沟道增强型MOSFET
SMG2321P
型号: SMG2321P
厂家: SECOS HALBLEITERTECHNOLOGIE GMBH    SECOS HALBLEITERTECHNOLOGIE GMBH
描述:

P-Channel Enhancement MOSFET
P沟道增强型MOSFET

文件: 总4页 (文件大小:548K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SMG2321P  
-4.1A , -20V , RDS(ON) 79 m  
P-Channel Enhancement MOSFET  
Elektronische Bauelemente  
RoHS Compliant Product  
A suffix of “-C” specifies halogen & lead-free  
SC-59  
DESCRIPTION  
The miniature surface mount MOSFETs utilize  
A
high cell density process. Low RDS(on) assures minimal  
power loss and conserves energy, making this device  
ideal for use in power management circuitry.  
L
3
3
Top View  
C B  
1
1
2
2
K
F
E
FEATURES  
D
Low RDS(on) provides higher efficiency and extends  
battery life.  
H
J
G
Miniature SC-59 surface mount package saves  
board space.  
Millimeter  
Min. Max.  
Millimeter  
Min. Max.  
0.10 REF.  
0.40 REF.  
REF.  
REF.  
Fast switching speed.  
High performance trench technology.  
Low gate charge 7.2Nc.  
A
B
C
D
2.70  
2.25  
1.30  
1.00  
3.10  
3.00  
1.70  
1.40  
G
H
J
0.10  
0.20  
K
0.45  
0.55  
E
F
1.70  
0.35  
2.30  
0.50  
L
0.85  
1.15  
APPLICATION  
DC-DC converters, power management in  
portable and battery-powered products such as  
computers, printers, PCMCIA cards, cellular and  
cordless telephones.  
  
PACKAGE INFORMATION  
Package  
MPQ  
Leader Size  
SC-59  
3K  
7’ inch  
ABSOLUTE MAXIMUM RATINGS (TA=25°C unless otherwise specified)  
Parameter  
Symbol  
Ratings  
Unit  
Drain-Source Voltage  
Gate-Source Voltage  
VDS  
VGS  
-20  
±8  
V
V
TA=25°C  
TA=70°C  
-4.1  
Continuous Drain Current 1  
ID  
A
-3.3  
Pulsed Drain Current 2  
Continuous Source Current (Diode Conduction) 1  
IDM  
IS  
±10  
A
A
±0.46  
1.25  
0.8  
TA=25°C  
TA=70°C  
Power Dissipation 1  
PD  
W
Operating Junction and Storage Temperature Range  
TJ, TSTG  
-55 ~ 150  
°C  
Thermal Resistance Ratings  
t5 sec  
RθJA  
100  
150  
Maximum Junction to Ambient 1  
Notes:  
°C/W  
Steady-State  
1
2
Surface Mounted on 1” x 1” FR4 Board.  
Pulse width limited by maximum junction temperature.  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
12-Apr-2011 Rev. B  
Page 1 of 4  
SMG2321P  
-4.1A , -20V , RDS(ON) 79 m  
P-Channel Enhancement MOSFET  
Elektronische Bauelemente  
ELECTRICAL CHARACTERISTICS (TA=25°C unless otherwise specified)  
Parameter  
Symbol  
Min. Typ. Max. Unit  
Static  
Test Conditions  
Gate-Threshold Voltage  
VGS(th)  
IGSS  
-0.4  
-
-
±100  
-1  
V
VDS=VGS, ID = -250μA  
VDS=0, VGS= ±8V  
Gate-Body Leakage  
-
-
-
nA  
-
VDS= -16V, VGS=0  
Zero Gate Voltage Drain Current  
On-State Drain Current 1  
Drain-Source On-Resistance 1  
IDSS  
ID(ON)  
μA  
A
-
-
-10  
-
VDS= -16V, VGS=0, TJ=55°C  
VDS= -5V, VGS= -4.5V  
VGS= -4.5V, ID= -4.1A  
VGS= -2.5V, ID= -3.2A  
VDS= -5V,,ID= -1.25A  
IS= -0.46A, VGS=0  
-5  
-
-
-
0.079  
0.110  
-
RDS(ON)  
-
-
9
Forward Transconductance 1  
Diode Forward Voltage  
gFS  
-
S
V
VSD  
-
-0.65  
-
Dynamic 2  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Turn-On Delay Time  
Rise Time  
Qg  
Qgs  
-
-
-
-
-
-
-
-
-
-
7.2  
-
-
-
-
-
-
-
-
-
-
ID= -4.1A  
nC  
pF  
V
V
DS= -10V  
GS= -4.5V  
1.7  
1.5  
520  
130  
70  
Qgd  
CISS  
COSS  
CRSS  
Td(ON)  
Tr  
VDS=15V,  
GS=0V,  
V
f=1MHz  
8
VDD= -10V  
18  
VGEN= -4.5V  
nS  
RG=6Ω  
IL= -1A  
Turn-Off Delay Time  
Td(OFF)  
Tf  
52  
Fall Time  
Notes:  
39  
1
2
Pulse testPW 300 us duty cycle 2%.  
Guaranteed by design, not subject to production testing.  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
12-Apr-2011 Rev. B  
Page 2 of 4  
SMG2321P  
-4.1A , -20V , RDS(ON) 79 m  
P-Channel Enhancement MOSFET  
Elektronische Bauelemente  
CHARACTERISTIC CURVE  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
12-Apr-2011 Rev. B  
Page 3 of 4  
SMG2321P  
-4.1A , -20V , RDS(ON) 79 m  
P-Channel Enhancement MOSFET  
Elektronische Bauelemente  
CHARACTERISTIC CURVE  
http://www.SeCoSGmbH.com/  
Any changes of specification will not be informed individually.  
12-Apr-2011 Rev. B  
Page 4 of 4  

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