STK14CC8-RF25 [SIMTEK]

Non-Volatile SRAM, 512KX8, 25ns, CMOS, PDSO48, 0.300 INCH, ROHS COMPLIANT, PLASTIC, SSOP-48;
STK14CC8-RF25
型号: STK14CC8-RF25
厂家: SIMTEK CORPORATION    SIMTEK CORPORATION
描述:

Non-Volatile SRAM, 512KX8, 25ns, CMOS, PDSO48, 0.300 INCH, ROHS COMPLIANT, PLASTIC, SSOP-48

静态存储器 光电二极管 内存集成电路
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中文:  中文翻译
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STK14CC8  
512K x 8 AutoStoreTM nvSRAM  
QuantumTrapTM CMOS  
Nonvolatile Static RAM  
Advanced Information  
FEATURES  
DESCRIPTION  
25ns Time  
The Simtek STK14CC8 is a fast static RAM with a  
nonvolatile element in each memory cell. The  
embedded nonvolatile elements incorporate  
“Hands-off” Automatic STORE on Power Down  
with only a small capacitor  
Simtek’s QuantumTrapTM technology producing the  
world’s most reliable nonvolatile memory. The  
SRAM provides unlimited read and write cycles,  
while independent, nonvolatile data resides in the  
highly reliable QuantumTrapTM cell. Data transfers  
from the SRAM to the nonvolatile elements (the  
STORE operation) takes place automatically at  
power down. On power up, data is restored to the  
SRAM (the RECALL operation) from the nonvolatile  
memory. Both the STORE and RECALL operations  
are also available under software control.  
STORE to QuantumTrap™ Nonvolatile  
Elements is Initiated by Software , device pin  
or AutoStore™ on Power Down  
RECALL to SRAM Initiated by Software or  
Power Up  
Unlimited READ, WRITE and RECALL Cycles  
10mA Typical ICC at 200ns Cycle Time  
500,000 STORE Cycles to QuantumTrap™  
100-Year Data Retention to QuantumTrap™  
Single 3V +20%, -10% Operation  
Commercial and Industrial Temperatures  
SSOP package  
RoHS Compliance  
BLOCK DIAGRAM  
VCC  
VCAP  
Quantum Trap  
2048 X 2048  
A8  
A9  
POWER  
A10  
A11  
A12  
A13  
A14  
A15  
A16  
A17  
A18  
CONTROL  
STORE  
RECALL  
STORE/  
RECALL  
CONTROL  
STATIC RAM  
ARRAY  
2048 X 2048  
HSB  
SOFTWARE  
DETECT  
A18 – A0  
DQ0  
DQ1  
DQ2  
DQ3  
DQ4  
DQ5  
DQ6  
DQ7  
COLUMN I/O  
COLUMN DEC  
A0 A1 A2 A3 A4 A5 A6 A7  
G
E
W
Figure 1. Block Diagram  
September 2005  
1
Document Control #ML0034 rev 0.0  
STK14CC8  
PACKAGES  
VCAP  
A16  
A14  
1
2
3
4
5
6
VCC  
A15  
HSB  
48  
47  
46  
45  
44  
43  
A12  
A7  
A6  
W
A13  
A8  
A5  
7
8
9
10  
11  
12  
13  
14  
15  
16  
A9  
42  
41  
40  
39  
38  
37  
36  
35  
34  
33  
A4  
A11  
A18  
A17  
VSS  
VSS  
DQ0  
A3  
A2  
A1  
A0  
DQ6  
G
A10  
E
DQ7  
17  
18  
32  
31  
30  
29  
28  
27  
26  
25  
19  
20  
21  
22  
23  
24  
DQ1  
DQ2  
DQ5  
DQ4  
DQ3  
VCC  
48 Pin SSOP  
Relative PCB area usage.  
See website for detailed  
package size specifications.  
PIN DESCRIPTIONS  
Pin Name  
I/O  
Description  
A18 – A0  
Input  
Address: The 19 address inputs select one of 524,288 bytes in the nvSRAM array.  
Data: Bi-directional 8-bit data bus for accessing the nvSRAM.  
DQ7 –DQ0  
E
I/O  
Input  
Chip Enable: The active low  
Write Enable: The active low  
E
input selects the device.  
W
enables data on the DQ pins to be written to the address location latched by  
W
Input  
the falling edge of E  
.
Output Enable: The active low  
G
input enables the data output buffers during read cycles. De-asserting G  
G
Input  
high causes the DQ pins to tri-state.  
VCC  
Power Supply  
Power 3.0V +20%, -10%  
Hardware Store Busy: When low this output indicates a Hardware Store is in progress. When pulled low external  
HSB  
I/O  
to the chip it will initiate a nonvolatile STORE operation. A weak internal pull up resistor keeps this pin high if not  
connected. (Connection Optional)  
Autostore Capacitor: Supplies power to nvSRAM during power loss to store data from SRAM to nonvolatile  
VCAP  
Power Supply  
elements.  
VSS  
Power Supply  
No Connect  
Ground  
(Blank)  
Unlabeled pins have no internal connection.  
September 2005  
2
Document Control #ML0034 rev 0.0  
STK14CC8  
ABSOLUTE MAXIMUM RATINGSa  
Notes  
-0.5V to +4.1V  
Power Supply Voltage  
Voltage on Input Relative to VSS  
Voltage on Outputs  
a: Stresses greater than those listed under “Absolute Maximum  
Ratings” may cause permanent damage to the device. This is a  
stress rating only, and functional operation of the device at con-  
ditions above those indicated in the operational sections of this  
specification is not implied. Exposure to absolute maximum rat-  
ing conditions for extended periods may affect reliability.  
-0.5V to (VCC + 0.5V)  
-0.5V to (VCC + 0.5V)  
–55°C to 125°C  
–55°C to 140°C  
–65°C to 150°C  
1W  
Temperature under Bias  
Junction Temperature  
Storage Temperature  
Power Dissipation  
DC Output Current (1 output at a time, 1s duration)  
15mA  
Package Thermal Characteristics see website: http://www.simtek.com/  
DC CHARACTERISTICS  
Commercial  
Industrial  
Symbol  
Parameter  
Units  
mA  
mA  
mA  
Notes  
MIN  
MAX  
45  
35  
30  
MIN  
MAX  
50  
40  
35  
tAVAV = 25ns  
tAVAV = 35ns  
tAVAV = 45ns  
Average VCC Current  
ICC1  
Dependent on output loading and cycle  
rate. Values obtained without output loads.  
All Inputs Don’t Care, VCC = max  
Average current for duration of STORE  
cycle (tSTORE).  
Average VCC Current during STORE  
Average VCC Current at tAVAV = 200ns  
3V, 25°C, Typical  
ICC2  
ICC3  
ICC4  
ISB  
2
2
mA  
W
(VCC – 0.2V)  
All Others Inputs Cycling, at CMOS Levels.  
Dependent on output loading and cycle  
rate. Values obtained without output loads.  
All Inputs Don’t Care  
Average current for duration of STORE  
cycle (tSTORE).  
10  
2
10  
2
mA  
mA  
Average VCAP Current during  
AutoStore™ Cycle  
VCC Standby Current  
E
(VCC – 0.2V)  
All Others VIN 0.2V or (VCC – 0.2V)  
Standby current level after nonvolatile  
cycle is complete.  
(Standby, Stable CMOS Input Levels)  
3
3
mA  
µA  
VCC = max  
Input Leakage Current  
IILK  
±1  
±1  
±1  
VIN = VSS to VCC  
VCC = max  
Off-State Output Leakage Current  
IOLK  
VIN = VSS to VCC, E or G VIH  
±1  
VCC + 0.3  
0.8  
µA  
V
Input Logic “1” Voltage  
Input Logic “0” Voltage  
Output Logic “1” Voltage  
Output Logic “0” Voltage  
Operating Temperature  
Operating Voltage  
VIH  
VIL  
2.0  
V
CC + 0.3  
0.8  
2.0  
VSS – 0.5  
2.4  
All Inputs  
All Inputs  
V
SS – 0.5  
2.4  
V
VOH  
VOL  
TA  
V
IOUT = –2mA  
0.4  
70  
0.4  
85  
V
IOUT = 4mA  
0
–40  
2.7  
44  
oC  
VCC  
VCAP  
2.7  
44  
3.6  
100  
3.6  
100  
V
3.0V +20%, -10%  
Between Vcap pin and Vss, 5V rated.  
Storage Capacitor  
µF  
September 2005  
3
Document Control #ML0034 rev 0.0  
STK14CC8  
AC TEST CONDITIONS  
0V to 3V  
Input Pulse Levels  
Input Rise and Fall Times  
Input and Output Timing Reference Levels  
5ns  
1.5V  
Output Load  
See Figure 2 and Figure 3  
CAPACITANCEb  
(TA = 25°C, f = 1.0MHz)  
SYMBOL  
PARAMETER  
MAX  
UNITS  
pF  
CONDITIONS  
V = 0 to 3V  
V = 0 to 3V  
CIN  
Input Capacitance  
Output Capacitance  
7
7
COUT  
pF  
Notes  
b: These parameters are guaranteed but not tested  
3.0V  
3.0V  
577 Ohms  
577 Ohms  
OUTPUT  
OUTPUT  
5 pF  
30 pF  
INCLUDING  
SCOPE AND  
FIXTURE  
789 Ohms  
789 Ohms  
INCLUDING  
SCOPE AND  
FIXTURE  
Figure 2. AC Output Loading  
Figure 3. AC Output Loading,  
for tristate specs (  
tHZ, tLZ, tWLQZ, tWHQZ  
tGLQX, tGHQZ  
,
)
September 2005  
4
Document Control #ML0034 rev 0.0  
STK14CC8  
SRAM READ CYCLES #1 & #2  
SYMBOLS  
STK14CC8-25  
NO.  
PARAMETER  
UNITS  
#1  
#2  
Alt.  
tACS  
MIN  
MAX  
tELQV  
1
2
Chip Enable Access Time  
Read Cycle Time  
25  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
c
c
tAVAV  
tAVAV  
tRC  
tAA  
tOE  
tOH  
tLZ  
25  
d
tAVQV  
3
Address Access Time  
25  
12  
tGLQV  
4
Output Enable to Data Valid  
Output Hold after Address Change  
Chip Enable to Output Active  
Chip Disable to Output Inactive  
Output Enable to Output Active  
Output Disable to Output Inactive  
Chip Enable to Power Active  
Chip Disable to Power Standby  
d
tAXQX  
5
3
3
tELQX  
tEHQZ  
tGLQX  
6
e
tHZ  
tOLZ  
tOHZ  
tPA  
tPS  
7
10  
10  
25  
8
0
0
e
tGHQZ  
9
b
tELICC  
10  
b
tEHICC  
11  
Notes  
c:  
W
must be high during SRAM READ cycles  
and  
d: Device is continuously selected with  
E
G
both low  
e: Measured ± 200mV from steady state output voltage  
f: HSB must remain high during READ and WRITE cycles.  
SRAM READ CYCLE #1: Address Controlledc,d,f  
2
tAVAV  
ADDRESS  
3
tAVQV  
5
tAXQX  
DATA VALID  
DQ (DATA OUT)  
SRAM READ CYCLE #2: E Controlledc,f  
2
tAVAV  
ADDRESS  
1
tELQV  
11  
tEHICCL  
6
tELQX  
E
7
tEHQZ  
G
9
tGHQZ  
4
tGLQV  
8
tGLQX  
DQ (DATA OUT)  
DATA VALID  
10  
tELICCH  
ACTIVE  
STANDBY  
ICC  
September 2005  
5
Document Control #ML0034 rev 0.0  
STK14CC8  
SRAM WRITE CYCLES #1 & #2  
SYMBOLS  
NO.  
STK14CC8-25 UNITS  
PARAMETER  
#1  
#2  
Alt.  
tWC  
tWP  
tCW  
tDW  
tDH  
MIN  
25  
20  
20  
10  
0
MAX  
Write Cycle Time  
12  
13  
14  
15  
16  
17  
18  
19  
20  
21  
tAVAV  
tWLWH  
tELWH  
tDVWH  
tWHDX  
tAVWH  
tAVWL  
tWHAX  
tAVAV  
tWLEH  
tELEH  
tDVEH  
tEHDX  
tAVEH  
tAVEL  
tEHAX  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Write Pulse Width  
Chip Enable to End of Write  
Data Set-up to End of Write  
Data Hold after End of Write  
Address Set-up to End of Write  
Address Set-up to Start of Write  
Address Hold after End of Write  
Write Enable to Output Disable  
Output Active after End of Write  
tAW  
tAS  
20  
0
tWR  
tWZ  
tOW  
0
e,g  
tWLQZ  
10  
tWHQX  
3
Notes  
g: If  
h:  
W
is low when E goes low, the outputs remain in the high-impedance state.  
E
or  
W
must be VIH during address transitions.  
SRAM WRITE CYCLE #1: W Controlledh,f  
12  
tAVAV  
ADDRESS  
19  
tWHAX  
14  
tELWH  
E
17  
tAVWH  
18  
13  
tWLWH  
tAVWL  
W
15  
16  
tDVWH  
tWHDX  
DATA VALID  
DATA IN  
20  
tWLQZ  
21  
tWHQX  
HIGH IMPEDANCE  
PREVIOUS DATA  
DATA OUT  
SRAM WRITE CYCLE #2: E Controlledh,f  
12  
tAVAV  
ADDRESS  
September 2005  
6
Document Control #ML0034 rev 0.0  
STK14CC8  
AutoStore™ /POWER-UP RECALL  
SYMBOLS  
NO.  
PARAMETER  
STK14CC8  
UNITS  
NOTES  
Standard  
Alternate  
MIN  
MAX  
22  
23  
24  
25  
tHRECALL  
20  
ms  
ms  
V
i
Power-up RECALL Duration  
tSTORE  
tHLHZ  
12.5  
2.65  
j,k  
STORE Cycle Duration  
VSWITCH  
tVCCRISE  
2.55  
150  
Low Voltage Trigger Level  
µs  
V
CC Rise Time  
Notes  
i: tHRECALL starts from the time VCC rises above VSWITCH  
j: If an SRAM WRITE has not taken place since the last nonvolatile cycle, no STORE will take place  
k: Industrial Grade Devices require 15ms MAX.  
STORE occurs only if a  
SRAM write has  
happened.  
No STORE occurs  
without at least one  
SRAM write.  
AutoStore™/POWER-UP RECALL  
VCC  
24  
VSWITCH  
25  
tVCCRISE  
AutoStoreTM  
23  
tSTORE  
23  
tSTORE  
POWER-UP RECALL  
22  
tHRECALL  
22  
tHRECALL  
Read & Write Inhibited  
POWER DOWN  
BROWN OUT  
POWER-UP  
RECALL  
POWER-UP  
RECALL  
AutoStoreTM  
AutoStoreTM  
Note: Read and Write cycles will be ignored during STORE, RECALL and while VCC is below VSWITCH  
September 2005  
7
Document Control #ML0034 rev 0.0  
STK14CC8  
SOFTWARE-CONTROLLED STORE/RECALL CYCLEl,m  
SYMBOLS  
STK14CC8-25  
NO.  
PARAMETER  
UNITS  
NOTES  
m
E
G
Alt.  
tRC  
MIN  
MAX  
cont  
cont  
26  
27  
tAVAV  
tAVAV  
25  
0
ns  
ns  
ns  
ns  
µs  
STORE/RECALL Initiation Cycle Time  
Address Set-up Time  
Clock Pulse Width  
tAVEL  
tAVGL  
tAS  
28  
tELEH  
tELAX  
tGLGH  
tGLAX  
tCW  
20  
20  
29  
Address Hold Time  
30  
tRECALL  
tRECALL  
50  
RECALL Duration  
Notes  
l: The software sequence is clocked with  
E
controlled READs or G controlled READs.  
m: The six consecutive addresses must be read in the order listed in the Mode Selection Table.  
W
must be high during all six consecutive cycles.  
SOFTWARE STORE/RECALL CYCLE: E Controlledm  
26  
tAVAV  
26  
tAVAV  
ADDRESS #1  
ADDRESS #6  
ADDRESS  
E
27  
tAVEL  
28  
tELEH  
29  
tELAX  
G
23  
30  
/
tSTORE tRECALL  
HIGH IMPEDENCE  
DATA VALID  
DATA VALID  
DQ (DATA)  
SOFTWARE STORE/RECALL CYCLE: G Controlledm  
26  
26  
tAVAV  
tAVAV  
ADDRESS #1  
ADDRESS #6  
ADDRESS  
E
28  
tGLGH  
27  
tAVGL  
G
30  
tRECALL  
23  
tSTORE  
/
29  
tGLAX  
HIGH IMPEDENCE  
DATA VALID  
DATA VALID  
DQ (DATA)  
September 2005  
8
Document Control #ML0000 0.0  
STK14CC8  
HARDWARE STORE CYCLE  
SYMBOLS  
NO.  
STK14CC8  
PARAMETER  
UNITS  
NOTES  
Standard  
tDELAY  
tHLHX  
tHLBL  
Alternate  
MIN  
MAX  
tHLQZ  
31  
32  
33  
Time Allowed to Complete SRAM Cycle  
Hardware STORE Pulse Width  
1
µs  
ns  
ns  
p
15  
Hardware STORE Low to STORE Busy  
300  
Notes  
n: Read and Write cycles in progress before HSB is asserted are given this amount of time to complete.  
HARDWARE STORE CYCLE  
32  
tHLHX  
HSB (IN)  
23  
tSTORE  
33  
tHLBL  
HSB (OUT)  
HIGH IMPEDENCE  
DATA VALID  
HIGH IMPEDENCE  
31  
tDELAY  
DQ (DATA OUT)  
DATA VALID  
September 2005  
9
Document Control #ML0034 rev 0.0  
STK14CC8  
ORDERING INFORMATION  
STK14CC8 – R F 25 I  
Temperature Range  
Blank = Commercial (0 to 70ºC)  
I = Industrial (-40 to 85ºC)  
Access Time  
25 = 25ns  
Lead Finish  
F = 100% Sn (Matte Tin) RoHS Compliant  
Package  
R = Plastic 48-pin 300 mil SSOP (25 mil pitch)  
September 2005  
10  
Document Control #ML0034 rev 0.0  
STK14CC8  
Document Revision History  
Summary  
Revision  
Date  
Advanced Information  
0.0  
January 2005  
SIMTEK STK14CC8 Data Sheet, September 2005  
Copyright 2005, Simtek Corporation. All rights reserved.  
This datasheet may only be printed for the express use of Simtek Customers. No part of this datasheet may be reproduced in any  
other form or means without express written permission from Simtek Corporation. The information contained in this publication is  
believed to be accurate, but changes may be made without notice. Simtek does not assume responsibility for, or grant or imply any  
warranty, including MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE regarding this information, the product or its  
use. Nothing herein constitutes a license, grant or transfer of any rights to any Simtek patent, copyright, trademark or other proprietary  
right.  
September 2005  
11  
Document Control #ML0034 rev 0.0  

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