STGB3NB60SDT4 [STMICROELECTRONICS]

N-CHANNEL 3A - 600V D2PAK POWERMESH IGBT ; N沟道3A - 600V D2PAK的PowerMESH IGBT\n
STGB3NB60SDT4
型号: STGB3NB60SDT4
厂家: ST    ST
描述:

N-CHANNEL 3A - 600V D2PAK POWERMESH IGBT
N沟道3A - 600V D2PAK的PowerMESH IGBT\n

晶体 晶体管 电动机控制 双极性晶体管 栅
文件: 总8页 (文件大小:339K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
STGB3NB60SD  
2
N-CHANNEL 3A - 600V D PAK  
Power MESH™ IGBT  
V
V
I
c
TYPE  
CES  
CE(sat)  
STGB3NB60SD  
600 V  
<1.5 V  
3 A  
HIGH INPUT IMPEDANCE  
(VOLTAGE DRIVEN)  
VERY LOW ON-VOLTAGE DROP (V  
)
cesat  
HIGH CURRENT CAPABILITY  
3
1
OFF LOSSES INCLUDE TAIL CURRENT  
INTEGRATED FREEWHEELING DIODE  
SURFACE-MOUNTING D2PAK (TO-263)  
POWER PACKAGE IN TAPE & REEL  
(SUFFIX “T4”)  
2
D PAK  
TO-263  
(suffix“T4”)  
DESCRIPTION  
Using the latest high voltage technology based on a  
patented strip layout, STMicroelectronics has designed  
an advanced family of IGBTs, the PowerMESH™ IGBTs,  
with outstanding perfomances. The suffix “S” identifies a  
family optimized to achieve minimum on-voltage drop for  
low frequency applications (<1kHz).  
INTERNAL SCHEMATIC DIAGRAM  
APPLICATIONS  
GAS DISCHARGE LAMP  
STATIC RELAYS  
MOTOR CONTROL  
ABSOLUTE MAXIMUM RATINGS  
Symbol  
Parameter  
Value  
Unit  
V
V
CES  
Collector-Emitter Voltage (V = 0)  
600  
GS  
V
GE  
Gate-Emitter Voltage  
± 20  
V
I
Collector Current (continuos) at T =25°C  
6
A
C
C
c
I
Collector Current (continuos)at T =100°C  
3
25  
A
c
I
()  
Collector Current (pulsed)  
A
CM  
P
Total Dissipation at T = 25°C  
70  
W
tot  
c
Derating Factor  
0.46  
W/°C  
°C  
°C  
T
stg  
Storage Temperature  
–60 to 175  
175  
T
Max. Operating Junction Temperature  
j
()Pulse width limited by safe operating area.  
November 2000  
1/8  
STGB3NB60SD  
THERMAL DATA  
R
Thermal Resistance Junction-case  
Thermal Resistance Junction-ambient  
Thermal Resistance Case-sink  
Max  
Max  
Typ  
2.14  
62.5  
0.5  
°C/W  
°C/W  
°C/W  
thj-case  
R
thj-amb  
thc-sink  
R
ELECTRICAL CHARACTERISTICS (T  
= 25 °C unless otherwise specified)  
case  
OFF  
Symbol  
Parameter  
Collector-Emitter  
Test Conditions  
= 250 µA = 0  
Min.  
Typ.  
Max.  
Unit  
V
I
V
GE  
600  
BR(CES)  
D
V
Breakdown Voltage  
I
Collector cut-off (V = 0)  
V
V
= Max Rating T = 25 °C  
j
10  
100  
µA  
µA  
CES  
GE  
CE  
= Max Rating T = 125 °C  
CE  
j
I
Gate-body Leakage  
V
GS  
= ± 20V  
V
= 0  
CE  
±100  
nA  
GSS  
Current (V = 0)  
DS  
(*)  
ON  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
V
GE(th)  
V
= V  
I = 250 µA  
C
Gate Threshold Voltage  
2.5  
5
V
CE  
GE  
V
V
V
V
= 15 V  
= 15 V  
I
I
= 1.5 A  
= 3 A  
1
1.2  
1.1  
V
V
V
CE(SAT)  
GE  
GE  
GE  
C
C
Collector-Emitter Saturation  
Voltage  
1.5  
= 15 V I = 3 A T = 125 °C  
D
j
DYNAMIC  
Symbol  
Parameter  
Forward Transconductance  
Input Capacitance  
Test Conditions  
= 25 V  
Min.  
Typ.  
2.5  
255  
30  
Max.  
Unit  
S
g
V
V
I = 3 A  
C
1.7  
fs  
CE  
C
ies  
= 25V f = 1 MHz V = 0  
330  
40  
7
pF  
pF  
pF  
CE  
GE  
C
Output Capacitance  
oes  
C
Reverse Transfer Capacitanc-  
es  
5.6  
res  
Q
Total Gate Charge  
Gate-Emitter Charge  
Gate-Collector Charge  
Latching Current  
V
V
=480V I =3 A V =15 V  
18  
5.4  
5.5  
nC  
nC  
nC  
A
G
GE  
GC  
CL  
CE  
C
GE  
Q
Q
I
= 480 V  
R = 1 KΩ  
G
12  
clamp  
T =150 °C  
j
SWITCHING ON  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
t
DelayTime  
Rise Time  
V
V
= 480 V  
= 15 V  
I = 3 A  
C
125  
150  
ns  
ns  
d(on)  
CC  
R
= 1 kΩ  
t
r
GE  
G
(di/dt)  
Turn-on Current Slope  
Turn-on Switching Losses  
V
V
= 480 V  
= 15 V  
I = 3 A  
C
50  
1100  
A/µs  
µJ  
on  
CC  
E
R
= 1 kΩ  
on  
GE  
G
T =125 °C  
j
2/8  
STGB3NB60SD  
ELECTRICAL CHARACTERISTICS (continued)  
SWITCHING OFF  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
t
Cross-Over Time  
Off Voltage Rise Time  
Delay Time  
Fall Time  
Turn-off Switching Loss  
V
R
= 480 V  
= 1 kΩ  
I = 3 A  
C
1.8  
1.0  
3.4  
0.72  
1.15  
µs  
µs  
µs  
µs  
mJ  
c
CC  
t (  
)
)
V
= 15 V  
r Voff  
t (  
d Voff  
GE  
GE  
t
f
E
( )  
off **  
t
Cross-Over Time  
Off Voltage Rise Time  
Delay Time  
Fall Time  
Turn-off Switching Loss  
V
R
= 480 V  
= 1 kΩ  
I
= 3 A  
C
= 15 V  
2.8  
1.45  
3.6  
1.2  
1.8  
µs  
µs  
µs  
µs  
mJ  
c
CC  
t (  
t (  
)
)
V
r Voff  
GE  
GE  
d Voff  
t
off **  
T = 125 °C  
j
f
E
( )  
COLLECTOR-EMITTER DIODE  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
I
Forward Current  
3
25  
A
A
f
Forward Current pulsed  
Forward On-Voltage  
I
fm  
I = 3 A  
I = 1 A  
f
1.55  
1.15  
1.9  
V
V
f
V
f
t
Q
Reverse Recovery Time  
Reverse Recovery Charge  
Reverse Recovery Current  
I = 3 A  
di/dt = 100 A/µs  
V = 200 V  
R
T = 125 °C  
j
1700  
4500  
9.5  
ns  
nC  
A
rr  
f
rr  
I
rrm  
()Pulse width limited by max. junction temperature  
(*)Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %.  
(
)Losses Include Also The Tail (Jedec Standardization)  
Thermal Impedance  
3/8  
STGB3NB60SD  
Output Characteristics  
Transfer Characteristics  
Transconductance  
Collector-Emitter on Voltage vs Temperature  
Collector-Emiter on Voltage vs Collector Current  
Gate Threshold vs Temperature  
4/8  
STGB3NB60SD  
Normalized Breakdown Voltage vs Temperature  
Gate charge Gate-Emitter Voltage  
Off Switching Losses vs Tj  
Capacitance Variations  
Off Switching Losses vs Ic  
Swittching Off Safe Operating Area  
5/8  
STGB3NB60SD  
Diode Forward vs Tj  
Diode Forward Voltage  
Fig. 1: Gate Charge test Circuit  
Fig. 2 Test Circuit For Inductive Load Switching  
Fig. 3: Switching Waveforms  
6/8  
STGB3NB60SD  
2
D PAK MECHANICAL DATA  
mm.  
inch  
TYP.  
DIM.  
MIN.  
4.4  
TYP  
MAX.  
4.6  
MIN.  
0.173  
0.098  
0.001  
0.027  
0.044  
0.017  
0.048  
0.352  
MAX.  
0.181  
0.106  
0.009  
0.036  
0.067  
0.023  
0.053  
0.368  
A
A1  
A2  
B
2.49  
0.03  
0.7  
2.69  
0.23  
0.93  
1.7  
B2  
C
1.14  
0.45  
1.23  
8.95  
0.6  
C2  
D
1.36  
9.35  
D1  
E
8
0.315  
0.334  
10  
10.4  
0.393  
E1  
G
8.5  
4.88  
15  
5.28  
15.85  
1.4  
0.192  
0.590  
0.050  
0.055  
0.094  
0.208  
0.625  
0.055  
0.068  
0.126  
L
L2  
L3  
M
1.27  
1.4  
1.75  
3.2  
2.4  
R
0.4  
0.015  
V2  
0º  
8º  
7/8  
STGB3NB60SD  
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences  
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted  
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject  
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not  
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.  
The ST logo is registered trademark of STMicroelectronics  
© 2000 STMicroelectronics - All Rights Reserved  
All other names are the property of their respective owners.  
STMicroelectronics GROUP OF COMPANIES  
Australia - Brazil - China - Finland - France - Germany - Hong Kong - India - Italy - Japan - Malaysia - Malta - Morocco -  
Singapore - Spain - Sweden - Switzerland - United Kingdom - U.S.A.  
http://www.st.com  
8/8  

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