VNP10N07-E [STMICROELECTRONICS]

OMNIFET :FULLY AUTOPROTECTED POWER MOSFET;
VNP10N07-E
型号: VNP10N07-E
厂家: ST    ST
描述:

OMNIFET :FULLY AUTOPROTECTED POWER MOSFET

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VNP10N07  
”OMNIFET”:  
FULLY AUTOPROTECTED POWER MOSFET  
TYPE  
Vclamp  
RDS(on)  
Ilim  
VNP10N07  
70 V  
0.1  
10 A  
LINEAR CURRENT LIMITATION  
THERMAL SHUT DOWN  
SHORT CIRCUIT PROTECTION  
INTEGRATED CLAMP  
LOW CURRENT DRAWN FROM INPUT PIN  
DIAGNOSTIC FEEDBACK THROUGH INPUT  
PIN  
3
2
1
ESD PROTECTION  
DIRECT ACCESS TO THE GATE OF THE  
POWER MOSFET (ANALOG DRIVING)  
COMPATIBLE WITH STANDARD POWER  
MOSFET  
TO-220  
STANDARD TO-220 PACKAGE  
DESCRIPTION  
current limitation and overvoltage clamp protect  
the chip in harsh enviroments.  
Fault feedback can be detected by monitoring the  
voltage at the input pin.  
The VNP10N07 is a monolithic device made  
using SGS-THOMSON Vertical Intelligent Power  
M0 Technology, intended for replacement of  
standard power MOSFETS in DC to 50 KHz  
applications. Built-in thermal shut-down, linear  
BLOCK DIAGRAM  
1/11  
April 1996  
VNP10N07  
ABSOLUTE MAXIMUM RATING  
Symbol  
VDS  
Vin  
Parameter  
Value  
Internally Clamped  
18  
Unit  
V
Drain-source Voltage (Vin = 0)  
Input Voltage  
V
ID  
Drain Current  
Internally Limited  
-14  
A
IR  
Reverse DC Output Current  
Electrostatic Discharge (C= 100 pF, R=1.5 K)  
Total Dissipation at Tc = 25 oC  
Operating Junction Temperature  
Case Operating Temperature  
Storage Temperature  
A
Vesd  
Ptot  
Tj  
2000  
V
50  
W
oC  
oC  
oC  
Internally Limited  
Internally Limited  
-55 to 150  
Tc  
Tst g  
THERMAL DATA  
Rthj-case Thermal Resistance Junction-case  
Rthj-amb Thermal Resistance Junction-ambient  
Max  
Max  
2.5  
62.5  
oC/W  
oC/W  
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)  
OFF  
Symbol  
Parameter  
Test Conditions  
ID = 200 mA Vin = 0  
Min.  
Typ.  
Max.  
Unit  
VCLAMP  
Drain-source Clamp  
Voltage  
60  
70  
80  
V
VCLTH  
VINCL  
IDSS  
Drain-source Clamp  
Threshold Voltage  
ID = 2 mA Vin = 0  
Iin = -1 mA  
55  
-1  
V
V
Input-Source Reverse  
Clamp Voltage  
-0.3  
Zero Input Voltage  
Drain Current (Vin = 0) VDS = 25 V Vin = 0  
VDS = 13 V Vin = 0  
50  
200  
µA  
µA  
IISS  
Supply Current from  
Input Pin  
VDS = 0 V Vin = 10 V  
250  
500  
µA  
ON ( )  
Symbol  
Parameter  
Test Conditions  
VDS = Vin ID + Iin = 1 mA  
Min.  
Typ.  
Max.  
Unit  
VIN(th)  
Input Threshold  
Voltage  
0.8  
3
V
RDS(on)  
Static Drain-source On Vin = 10 V ID = 5 A  
0.1  
0.14  
Resistance  
Vin = 5 V  
ID = 5 A  
DYNAMIC  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
gfs ( )  
Forward  
VDS = 13 V  
ID = 5 A  
6
8
S
Transconductance  
Coss  
Output Capacitance  
VDS = 13 V f = 1 MHz Vin = 0  
350  
500  
pF  
2/11  
VNP10N07  
ELECTRICAL CHARACTERISTICS (continued)  
SWITCHING (  
)
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
td(on)  
tr  
td(off)  
tf  
Turn-on Delay Time  
Rise Time  
Turn-off Delay Time  
Fall Time  
VDD = 15 V  
Vgen = 10 V  
(see figure 3)  
Id = 5 A  
Rgen = 10 Ω  
50  
80  
230  
100  
100  
160  
400  
180  
ns  
ns  
ns  
ns  
td(on)  
tr  
td(off)  
tf  
Turn-on Delay Time  
Rise Time  
Turn-off Delay Time  
Fall Time  
VDD = 15 V  
Vgen = 10 V  
(see figure 3)  
Id = 5 A  
Rgen = 1000 Ω  
600  
0.9  
3.8  
1.7  
900  
2
6
ns  
µs  
µs  
µs  
2.5  
(di/dt)on Turn-on Current Slope VDD = 15 V  
Vin = 10 V  
ID = 5 A  
Rgen = 10 Ω  
60  
A/µs  
Qi  
Total Input Charge  
VDD = 12 V ID = 5 A Vin = 10 V  
30  
nC  
SOURCE DRAIN DIODE  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
V
VSD ( ) Forward On Voltage  
ISD = 5 A Vin = 0  
1.6  
trr  
(
)
Reverse Recovery  
Time  
Reverse Recovery  
Charge  
Reverse Recovery  
Current  
ISD = 5 A  
VDD = 30 V  
(see test circuit, figure 5)  
di/dt = 100 A/µs  
125  
0.3  
4.8  
ns  
Tj = 25 oC  
Qrr  
(
)
µC  
IRRM  
(
)
A
PROTECTION  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
Ilim  
Drain Current Limit  
Vin = 10 V VDS = 13 V  
7
7
10  
10  
14  
14  
A
A
Vin = 5 V  
VDS = 13 V  
tdlim  
(
(
)
)
Step Response  
Current Limit  
Vin = 10 V  
Vin = 5 V  
20  
50  
30  
80  
µs  
µs  
oC  
Tjsh  
Overtemperature  
Shutdown  
150  
135  
Tjrs  
Igf  
(
)
Overtemperature Reset  
Fault Sink Current  
oC  
(
)
Vin = 10 V VDS = 13 V  
Vin = 5 V VDS = 13 V  
50  
20  
mA  
mA  
Eas  
(
)
Single Pulse  
Avalanche Energy  
starting Tj = 25 oC  
VDD = 20 V  
Vin = 10 V Rgen = 1 KL = 10 mH  
0.4  
J
( ) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %  
) Parameters guaranteed by design/characterization  
(
3/11  
VNP10N07  
PROTECTION FEATURES  
During normal operation, the Input pin is  
electrically connected to the gate of the internal  
power MOSFET. The device then behaves like a  
standard power MOSFET and can be used as a  
switch from DC to 50 KHz. The only difference  
from the user’s standpoint is that a small DC  
current (Iiss) flows into the Input pin in order to  
supply the internal circuitry.  
- OVERTEMPERATURE AND SHORT CIRCUIT  
PROTECTION: these are based on sensing  
the chip temperatureand are not dependent on  
the input voltage. The location of the sensing  
element on the chip in the power stage area  
ensures fast, accurate detection of the junction  
temperature. Overtemperature cutout occurs at  
minimum 150oC. The device is automatically  
restarted when the chip temperature falls  
below 135oC.  
The device integrates:  
- OVERVOLTAGE CLAMP PROTECTION:  
internally set at 70V, along with the rugged  
avalanche characteristics of the Power  
MOSFET stage give this device unrivalled  
ruggedness and energy handling capability.  
This feature is mainly important when driving  
inductiveloads.  
- STATUS FEEDBACK: In the case of an  
overtemperature fault condition,  
a Status  
Feedback is provided through the Input pin.  
The internal protection circuit disconnects the  
input from the gate and connects it instead to  
ground via an equivalent resistance of 100 .  
The failure can be detected by monitoring the  
voltage at the Input pin, which will be close to  
ground potential.  
- LINEAR CURRENT LIMITER CIRCUIT: limits  
the drain current Id to Ilim whatever the Input  
pin voltage. When the current limiter is active,  
the device operates in the linear region, so  
power dissipation may exceed the capability of  
the heatsink. Both case and junction  
temperatures increase, and if this phase lasts  
long enough, junction temperature may reach  
Additional features of this device are ESD  
protection according to the Human Body model  
and the ability to be driven from a TTL Logic  
circuit (with a small increase in RDS(on)).  
the overtemperaturethreshold Tjsh  
.
4/11  
VNP10N07  
Thermal Impedance  
Derating Curve  
Output Characteristics  
Transconductance  
Static Drain-Source On Resistance vs Input  
Voltage  
Static Drain-Source On Resistance  
5/11  
VNP10N07  
Static Drain-Source On Resistance  
Input Charge vs Input Voltage  
Capacitance Variations  
Normalized Input Threshold Voltage vs  
Temperature  
Normalized On Resistance vs Temperature  
Normalized On Resistance vs Temperature  
6/11  
VNP10N07  
Turn-on Current Slope  
Turn-on Current Slope  
Turn-off Drain-Source Voltage Slope  
Turn-off Drain-Source Voltage Slope  
Switching Time Resistive Load  
Switching Time Resistive Load  
7/11  
VNP10N07  
Switching Time Resistive Load  
Current Limit vs Junction Temperature  
Step Response Current Limit  
Source Drain Diode Forward Characteristics  
8/11  
VNP10N07  
Fig. 1: Unclamped Inductive Load Test Circuits  
Fig. 2: Unclamped Inductive Waveforms  
Fig. 3: Switching Times Test Circuits For  
Fig. 4: Input Charge Test Circuit  
Resistive Load  
Fig. 5: Test Circuit For Inductive Load Switching  
Fig. 6: Waveforms  
And Diode Recovery Times  
9/11  
VNP10N07  
TO-220 MECHANICAL DATA  
mm  
inch  
TYP.  
DIM.  
MIN.  
4.40  
1.23  
2.40  
TYP.  
MAX.  
4.60  
1.32  
2.72  
MIN.  
0.173  
0.048  
0.094  
MAX.  
0.181  
0.051  
0.107  
A
C
D
D1  
E
1.27  
0.050  
0.49  
0.61  
1.14  
1.14  
4.95  
2.4  
0.70  
0.88  
1.70  
1.70  
5.15  
2.7  
0.019  
0.024  
0.044  
0.044  
0.194  
0.094  
0.393  
0.027  
0.034  
0.067  
0.067  
0.203  
0.106  
0.409  
F
F1  
F2  
G
G1  
H2  
L2  
L4  
L5  
L6  
L7  
L9  
DIA.  
10.0  
10.40  
16.4  
0.645  
13.0  
2.65  
15.25  
6.2  
14.0  
2.95  
15.75  
6.6  
0.511  
0.104  
0.600  
0.244  
0.137  
0.147  
0.551  
0.116  
0.620  
0.260  
0.154  
0.151  
3.5  
3.93  
3.85  
3.75  
L2  
Dia.  
L5  
L9  
L7  
L6  
L4  
P011C  
10/11  
VNP10N07  
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the  
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No  
license is granted by implication or otherwise underany patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned  
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.  
SGS-THOMSON Microelectronics productsare notauthorized for use as criticalcomponents in life supportdevices or systems withoutexpress  
written approval of SGS-THOMSON Microelectonics.  
1996 SGS-THOMSON Microelectronics - Printedin Italy - All Rights Reserved  
SGS-THOMSON Microelectronics GROUP OF COMPANIES  
Australia- Brazil - Canada - China - France - Germany - Hong Kong - Italy- Japan- Korea - Malaysia- Malta- Morocco - TheNetherlands -  
Singapore - Spain- Sweden- Switzerland - Taiwan - Thailand - United Kingdom - U.S.A  
.
11/11  

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