TN2106 [SUPERTEX]

N-Channel Enhancement-Mode Vertical DMOS FETs; N沟道增强型垂直DMOS场效应管
TN2106
型号: TN2106
厂家: Supertex, Inc    Supertex, Inc
描述:

N-Channel Enhancement-Mode Vertical DMOS FETs
N沟道增强型垂直DMOS场效应管

文件: 总4页 (文件大小:31K)
中文:  中文翻译
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TN2106  
Low Threshold  
N-Channel Enhancement-Mode  
Vertical DMOS FETs  
Ordering Information  
Order Number / Package  
Product marking for SOT-23:  
N1L  
BVDSS  
/
RDS(ON)  
VGS(th)  
BVDGS  
(max)  
(max)  
TO-236AB*  
TO-92  
Die  
60V  
2.5  
2.0V  
TN2106K1  
TN2106N3  
TN2106ND  
where = 2-week alpha date code  
*Same as SOT-23. All units shipped on 3,000 piece carrier tape reels.  
Features  
Advanced DMOS Technology  
These enhancement-mode (normally-off) transistors utilize a  
vertical DMOS structure and Supertex’s well-proven silicon-gate  
manufacturing process. This combination produces devices with  
the power handling capabilities of bipolar transistors and with the  
high input impedance and positive temperature coefficient inher-  
ent in MOS devices. Characteristic of all MOS structures, these  
devices are free from thermal runaway and thermally-induced  
secondary breakdown.  
Free from secondary breakdown  
Low power drive requirement  
Ease of paralleling  
Low CISS and fast switching speeds  
Excellent thermal stability  
Integral Source-Drain diode  
Supertex’s vertical DMOS FETs are ideally suited to a wide range  
of switching and amplifying applications where high breakdown  
voltage, high input impedance, low input capacitance, and fast  
switching speeds are desired.  
High input impedance and high gain  
Complementary N- and P-channel devices  
Applications  
Package Options  
Logic level interfaces – ideal for TTL and CMOS  
Solid state relays  
Battery operated systems  
Photo voltaic drives  
Analog switches  
Drain  
General purpose line drivers  
Telecom switches  
Absolute Maximum Ratings  
Drain-to-Source Voltage  
Drain-to-Gate Voltage  
Gate-to-Source Voltage  
BVDSS  
Gate  
Source  
S G D  
BVDGS  
TO-92  
TO-236AB  
± 20V  
(SOT-23)  
top view  
Operating and Storage Temperature  
-55°C to +150°C  
300°C  
Soldering Temperature*  
* Distance of 1.6 mm from case for 10 seconds.  
Note: See Package Outline section for dimensions.  
7-71  
TN2106  
Thermal Characteristics  
Package  
ID (continuous)*  
ID (pulsed)  
Power Dissipation  
θjc  
θja  
IDR  
*
IDRM  
@ TA = 25°C  
°C/W  
°C/W  
TO-236AB  
TO-92  
0.28A  
0.30A  
0.8A  
1.0A  
0.36W  
0.74W  
200  
125  
350  
170  
0.28A  
0.30A  
0.8A  
1.0A  
* ID (continuous) is limited by max rated Tj.  
Electrical Characteristics (@ 25°C unless otherwise specified)  
Symbol  
BVDSS  
VGS(th)  
VGS(th)  
IGSS  
Parameter  
Drain-to-Source Breakdown Voltage  
Gate Threshold Voltage  
Min  
Typ  
Max  
Unit  
Conditions  
60  
V
ID = 1mA, VGS = 0V  
VGS = VDS, ID = 1mA  
ID = 1mA, VGS = VDS  
VGS = ±20V, VDS = 0V  
0.6  
2.0  
-5.5  
100  
1
V
Change in VGS(th) with Temperature  
Gate Body Leakage  
-3.8  
0.1  
mV/°C  
nA  
IDSS  
Zero Gate Voltage Drain Current  
µA  
VGS = 0V, VDS = Max Rating  
100  
µA  
VGS = 0V, VDS = 0.8 Max Rating  
TA = 125°C  
ID(ON)  
ON-State Drain Current  
0.6  
A
VGS = 10V, VDS = 25V  
VGS = 4.5V, ID = 200mA  
RDS(ON)  
5.0  
2.5  
1.0  
Static Drain-to-Source  
ON-State Resistance  
VGS = 10V, ID = 500mA  
RDS(ON)  
GFS  
CISS  
COSS  
CRSS  
td(ON)  
tr  
Change in RDS(ON) with Temperature  
Forward Transconductance  
Input Capacitance  
0.70  
400  
35  
17  
7
%/°C  
VGS = 10V, ID = 500mA  
VDS = 25V, ID = 500mA  
150  
m
50  
25  
8
Common Source Output Capacitance  
Reverse Transfer Capacitance  
Turn-ON Delay Time  
pF  
ns  
VGS = 0V, VDS = 25V, f = 1MHz  
3
5
VDD = 25V  
ID = 0.5A  
Rise Time  
5
8
td(OFF)  
tf  
Turn-OFF Delay Time  
Fall Time  
6
9
RGEN = 25Ω  
5
8
VSD  
trr  
Diode Forward Voltage Drop  
Reverse Recovery Time  
1.2  
400  
1.8  
V
ISD = 0.5A, VGS = 0V  
ISD = 0.5A, VGS = 0V  
ns  
Notes:  
1. All D.C. parameters 100% tested at 25°C unless otherwise stated. (Pulse test: 300µs pulse, 2% duty cycle.)  
2. All A.C. parameters sample tested.  
Switching Waveforms and Test Circuit  
VDD  
RL  
10V  
90%  
PULSE  
GENERATOR  
INPUT  
OUTPUT  
10%  
0V  
Rgen  
t(ON)  
td(ON)  
t(OFF)  
td(OFF)  
tr  
tF  
D.U.T.  
VDD  
0V  
INPUT  
10%  
10%  
OUTPUT  
90%  
90%  
7-72  
TN2106  
Typical Performance Curves  
Output Characteristics  
Saturation Characteristics  
2.5  
2.5  
2.0  
1.5  
1.0  
0.5  
0
VGS  
=
VGS =  
10V  
10V  
2.0  
1.5  
1.0  
0.5  
0
8V  
6V  
8V  
6V  
4V  
3V  
4V  
3V  
0
2
4
6
8
10  
0
10  
20  
30  
40  
50  
VDS (volts)  
VDS (volts)  
Transconductance vs. Drain Current  
Power Dissipation vs. Temperature  
0.5  
0.4  
0.3  
0.2  
0.1  
0
1.0  
0.8  
0.6  
0.4  
0.2  
0
V
= 25V  
DS  
TO-92  
T
= -55°C  
25°C  
A
SOT-23  
125°C  
0.6  
0.8  
1.0  
0
25  
50  
75  
100  
125  
150  
0
0.2  
0.4  
ID (amperes)  
TA (°C)  
Maximum Rated Safe Operating Area  
Thermal Response Characteristics  
1.0  
0.8  
0.6  
0.4  
0.2  
0
1.0  
0.1  
SOT-23 (pulsed)  
TO-236AB  
T
= 25°C  
A
SOT-23 (DC)  
P
= 0.36W  
D
TO-92  
= 25°C  
T
C
P
= 1W  
D
0.01  
T
= 25°C  
A
0.001  
0.1  
1
10  
100  
0.001  
0.01  
0.1  
1.0  
10  
VDS (volts)  
tp(seconds)  
7-73  
TN2106  
Typical Performance Curves  
BVDSS Variation with Temperature  
On-Resistance vs. Drain Current  
10  
8
1.1  
V
= 4.5V  
GS  
V
= 10V  
GS  
6
1.0  
0.9  
4
2
0
-50  
0
50  
100  
150  
0
0.5  
1.0  
1.5  
2.0  
2.5  
I
(amperes)  
T (°C)  
j
D
Transfer Characteristics  
= 25V  
VGS(th) and RDS(ON  
)
Variation with Temperature  
1.0  
0.8  
0.6  
0.4  
0.2  
0
2.0  
1.2  
V
DS  
R
@ 10V, 0.5A  
DS(ON)  
1.6  
T
= -55°C  
A
1.0  
0.8  
0.6  
0.4  
1.2  
0.8  
0.4  
0
25°C  
V
@ 1mA  
GS(th)  
125°C  
0
2
4
6
8
10  
-50  
0
50  
100  
150  
VGS (volts)  
T (°C)  
j
Capacitance vs. Drain-to-Source Voltage  
f = 1MHz  
Gate Drive Dynamic Characteristics  
100  
10  
8
V
= 10V  
75  
50  
DS  
6
4
V
= 20V  
DS  
92 pF  
CISS  
25  
0
COSS  
2
0
CRSS  
38 pF  
0.2  
0.6  
0
10  
20  
30  
40  
0
0.4  
0.8  
1.0  
QG (nanocoulombs)  
VDS (volts)  
7-74  

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