TFDS4500-TR3 [TEMIC]
Interface Circuit, STAGGERED, MODULE-8;型号: | TFDS4500-TR3 |
厂家: | TEMIC SEMICONDUCTORS |
描述: | Interface Circuit, STAGGERED, MODULE-8 |
文件: | 总7页 (文件大小:102K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
4500 Series
Integrated Infrared Transceiver Module IrDA (SIR)
Features
D Compliant to IrDA 1.0 Standard
D IrDA Data Rates Up to 115.2 kbps D Low Power Consumption
Baud Rate
D Two Package Options
D AGC for EMI Immunity
D 0- to 3.0-m Range
– S Option – Side View
– T Option – Top View
D Wide Supply Voltage Range (2.7 V – 5.5 V)
D Open Collector IRED Driver
D Low Profile
D Few External Components Required
Description
The TFDS4500 and TFDT4500 are infrared transceivers The internal IRED driver can be connected by an external
for data communication systems. The transceivers are current control resistor to an independent unregulated
compliant to the IrDA standard and allow data rates up to power supply, V . This adds circuit design flexibility
CC2
115 kbit/s. An internal AGC (Automatic Gain Control) and efficient serial drive capability for external IREDs for
ensures proper operation under adverse EMI conditions.
high power applications.
Pin Configurations
TFDT4500
TFDS4500
8
7
6
5
IRED
Anode
1
2
3
4
5
6
7
8
IRED Anode
IRED Cathode
Txd (Input)
Rxd (Output)
NC
1
IRED
Cathode
Txd
NC
2
3
Rxd
V
(Supply Voltage)
V
CC1
CC1
SC (Sensitivity Control)
GND
SC
GND
4
Functional Block Diagram
V
CC1
Driver
Rxd
Amplifier
Comparator
IRED Anode
AGC
Logic
SC
Txd
IRED Cathode
Open Collector Driver
GND
Updates to this data sheet may be obtained via facsimile by calling Siliconix FaxBack, 1-408-970-5600. Please request FaxBack document #70737.
TEMIC Semiconductors
1
S–51444—Rev. A, 14-Jul-97
Pre-Release Information
4500 Series
Absolute Maximum Ratings
Parameter
Symbol
Test Conditionsa
Minb Typc
Maxb
Unit
Supply Voltage Range
V
–0.5
–0.5
6
6
CC1
V
Voltage Range of IRED Drive Output
IRED anode pin, Txd LOW
All pins except IRED cathode pin and
IRED anode pin (See IRED Current)
Input Currents
10
mA
Output Sinking Current
Power Dissipation
25
200
125
70
P
(See Derating Curve)
mW
tot
Junction Temperature
T
J
Ambient Temperature Range (Operating)
Storage Temperature Range
Soldering Temperature
T
0
A
_C
T
stg
–25
215
85
t = 20 s
240
100
500
1
Average IRED Current
I
I
(DC)
(RP)
(PK)
IRED
mA
A
Repetitive Pulsed IRED Current
Peak IRED Current
I
t < 90 ms, Duty Cycle < 20%
t < 2 ms, Duty Cycle < 10%
IRED
IRED
IRED Anode Voltage
V
–0.5
–0.5
–0.5
6
IREDA
Transmitter Data Input Voltage
Receiver Data Output Voltage
Virtual source size
V
V
V
V
+ 0.5
V
Txd
CC
CC
+ 0.5
Rxd
d
Method: (1-1/e)
2.5
2.8
mm
Maximum Intensity for Class1
Operation of IEC 825 or EN60825
EN60825, 1.1.1.997
400
mW/sr
Notes
a. Reference point GND pin unless otherwise noted.
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
Current Derating
600
Maximum Duty Cycle 20%
400
200
Current derating as a
function of the maximum
forward current of IRED
and maximum duty cycle.
0
0
20
40
60
80
100
120
140
Ambient Temperature T (_C)
A
2
TEMIC Semiconductors
S–51444—Rev. A, 14-Jul-97
Pre-Release Information
4500 Series
Specifications
Parameter
Symbol
Test Conditionsa
Minb
Typc Maxb
Unit
Transceiver
Supported Data Rates
Supply Voltage Range
2.4
2.7
115.2
kBit/s
V
V
Reduced Function Down to 2.5 V
5
5.5
2.5
1.5
CCl
V
V
= 5.5 V
= 2.7 V
1.3
1.0
CC1
CC1
Supply Current, V
Pin
I
mA
CCl
S
Leakage Current of IR Emitter,
IRED Anode Pin
V
OFF, Txd LOW, V
T = –25 to 85_C
= 6 V
CC1
CC2
I
S
0.005
0.5
50
mA
ms
Transceiver Power On Settling Time
Receiver
T = "15_, SIR Mode, SC = LOW
T = "15_, SIR Mode, SC = HIGH
0.020
0.010
5000
0.035
0.015
Minimum Detection Threshold
Irradiance
E
emin
d
0.006
3300
8000
–2
T = "90_, V = 5 V, SIR Mode
Wm
Maximum Detection Threshold
CC
E
emax
d
Irradiance
T = "90_, V = 3 V, SIR Mode
15000
CC
Logic Low Receiver Input Irradiance
Output Voltage Rxd
E
SC = HIGH or LOW
0.004
0.8
emax(low)
V
Active, C = 15 pF, R = 2.2 kW
Non-Active, C = 15 pF, R = 2.2 kW
0.5
4
OL
V
V
V
– 0.5
CC
OH
Output Current
V
< 0.8 V
mA
ns
OL
Rise and Fall Time
t , t
r
C = 15 pF, R = 2.2 kW
20
200
20
f
2.4 kBits/s, Input Pulse Length
1.41
1.41
3
1.41 ms to / of Bit Length
16
Rxd Signal Electrical
Output Pulse Width
t
p
115.2 kBits/s, Input Pulse Length
8
2
3
1.41 ms to / of Bit Length
16
Output Level = 0.5 x V
@
CC1
t
t
1
ms
dl
2
e, f
E = 0.040 W/m
e
Output Delay Time (Rxd)
Output Level = 0.5 x V
6.5
2
dt
CC1
g
Jitter
t
j
Over a period of 10 bit, 115.2 kBIT/s
Recovery from last transmitted pulse to
1.1 x threshold sensitivity
Latency
t
100
0.3
800
L
Transmitter
Driver Current IRED
Current limiting resistor in series to IRED:
I
D
0.5
0.8
A
V
R
S
= 8.2 W, V
= 5 V
CC2
Logic Low Transmitter Input Voltage
Logic High Transmitter Input Voltage
V
(Txd)
(Txd)
0
IL
V
2.4
V
CC
IH
Current limiting resistor in series to IRED:
IeH
45
140
200
mW/sr
R
S
= 8.2 W @ 5 V
= 5 V, T = "15_
CC2
Output Radiant Intensity
IeL
Logic Low Level
0.04
mW/sr
Angle of Half Intensity
T
"24
_
Peak Wavelength of Emission
Halfwidth of Emission Spectrum
l
p
850
900
nm
60
115.2-kHz Square Wave Signal
Duty Cycle: 1.1
Optical Rise/Fall Time
Overshoot, Optical
t , t
200
600
25
ns
%
ms
R
F
Over a period of 10 bits, independent of
information content.
Rising Edge Peak-to-Peak Jitter
t
j
0.2
Notes
a. Unless otherwise specified T = 25_C, V = 5 V.
A
CC
b. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum.
c. Typical values are for DESIGN AID ONLY, not guaranteed nor subject to production testing.
–8
d. BER = 10 (IrDA Specification)
e.
t
dl
= delay of leading edge of output signal related to leading edge of optical input signal.
f.
t
= delay of trailing edge of output signal related to trailing edge of optical input signal.
dt
g. Leading edge of output signal.
TEMIC Semiconductors
3
S–51444—Rev. A, 14-Jul-97
Pre-Release Information
4500 Series
Pin Assignment and Description
Pin
“S”
“T”
Option Option
Pin Name
Description
I/O
O
Active
LOW
8
1
7
1
2
3
IRED Anode
IRED Anode
IRED Cathode IRED Cathode, internally connected to driver transistor
O
LOW
Txd
Rxd
NC
Transmitter Data Input
I
HIGH
Receiver Data Output, push-pull CMOS driver output capable of driving a standard
CMOS or TTL load. No external pull-up or pull-down resistor is required.
2
6
3
4
5
6
O
LOW
No connection
Supply voltage, 2.7 V to 5.5 V (Refer to 4000 Series Application Note for using
V
CC1
V
as shutdown pin)
CC1
5
4
7
8
SC
GND
Sensitivity control
I
HIGH
Ground
a
Guide Pins
“S” Option—Guide Pins (two), for surface mounting
“T” Option—Guide Pins (two), used only for through-hole mounting
–
–
b
Stand-off Pins
Note
a. Refer to application notes for connecting “S” option guide pins on PCB.
b. Refer to application notes for connecting “T” option as a side view, through-hole device for wave soldering application.
4
TEMIC Semiconductors
S–51444—Rev. A, 14-Jul-97
Pre-Release Information
4500 Series
TFDT, Top View Option
E
E
1
A
2
R
1
A
3
A
1
Millimeters
Inches
Tolerance
Tolerance
Typical
Typical
Dim
(")
(")
A
7.6
0.5
0.3
0.3
0.3
0.3
0.299
0.169
0.096
0.085
0.059
0.020
0.012
0.012
0.012
0.012
A
A
A
A
4.3
1
2
3
4
d (EJECTION MARKS
FRONT & BACKSIDE
2.45
2.15
1.5
θ
1
C
C
1
+0.1/
− 0.05
+0.004/
− 0.002
e
b
0.25
0.5
0.010
0.020
0.034
E
2
C
0.1
0.004
+0.14/
− 0.16
+0.0055/
− 0.0063
C
1
0.86
E
4
D
5.95
5.45
3.75
1.8
0.25
0.25
0.25
0.25
0.5
0.5
–
0.234
0.215
0.148
0.074
0.512
0.256
0.450
0.236
0.256
0.050
0.093
0.008
0.063
0.010
0.069
0.079
30_
0.010
0.010
0.010
0.010
0.020
0.020
–
E
3
D
1
2
D
d
E
13.0
6.5
E
1
2
3
4
E
E
E
11.43
6
0.5
0.5
–
0.02
0.02
–
R
4
R
3
θ
Tangential
6.5
3
e
1.27
2.35
0.2
D
e
e
0.15
0.2
–
0.006
0.008
–
1
2
D
1
R
R
R
R
θ
1.6
D
1
2
3
4
2
0.25
1.75
2
–
–
e
e
1
2
–
–
–
–
30_
5_
–
–
1
θ
θ
3_
5
5_
3_
2
5_
5_
5
3
A
b
A
4
R
2
θ
2
TEMIC Semiconductors
S–51444—Rev. A, 14-Jul-97
5
Pre-Release Information
4500 Series
TFDS, Side View Option
E
E
1
R
1
A
1
A
A
3
A
2
A
4
Millimeters
Tolerance
Inches
Tolerance
C
d (EJECTION MARKS
FRONT & BACKSIDE
Typical
Typical
Dim
(")
(")
C
2
C
e
1
C
3
A
5.3
4.3
0.3
0.3
0.3
0.3
–
0.209
0.169
0.112
0.124
0.059
0.012
0.012
0.012
0.012
–
q
1
A
A
A
A
1
2
3
4
E
E
2
q
2
2.85
3.15
1.5
3
E
5
+0.004/
-0.002
b
0.25
+0.1/-0.05
0.010
E
4
c
0.15
0.5
0.1
0.1
–
.0059
0.020
0.006
0.004
0.004
–
C
C
1
0.16
+0.012/
-0.008
C
C
0.58
0.86
+0.3/-0.2
0.023
0.034
2
+0.0055/
-0.0063
+0.14/-0.16
3
D
5.95
5.45
3.75
1.8
0.25
0.25
0.25
2.34
0.215
0.148
0.074
0.512
0.256
0.450
0.463
0.236
0.256
0.050
0.093
0.264
0.063
0.008
0.069
0.0787
30_
0.110
0.010
0.010
0.010
0.020
0.020
–
D
1
R
3
D2
d
q
4
Tangential
R
4
E
13.0
6.5
0.5
0.5
–
D
E
1
E
2
E
3
E
4
E
5
D
1
11.43
11.75
6
–
–
D
2
0.5
0.5
–
0.02
0.02
–
6.5
e
1.27
2.35
6.7
e
e
0.15
0.4
–
0.006
0.016
–
1
2
q
6
R
R
R
R
q
1.6
1
2
3
4
R
2
0.2
–
–
c
q
1.75
2.0
–
–
5
–
–
L
30_
15_
180_
5_
–
–
1
2
3
4
5
6
q
q
q
q
q
–
30_
–
–6_
5
180_
5_
–6_
5
q
3
b
e
1
5_
3_
2_
0.2
5_
3_
90_
0.6
90_
2_
e
2
L
0.024
–0.008
6
TEMIC Semiconductors
S–51444—Rev. A, 14-Jul-97
Pre-Release Information
4500 Series
Recommended SMD Pads for Transceiver
1.27
TFDT
0.7
1.4
1
2
3
4
5
6
7
8
8.89
TFDS
11.75
5.08
2.54
2.54
1.43
8
7
6
5
1.8
0.63
8.25
1
0.63
+0.1 (2x)
1
4.13
2.2
1
2
3
4
2.54
2.54
5.08
Dimensions in mm
Ordering Information
Order Part Number
Qty/Reel
TFDS4500-TR3
TFDT4500-TR3
750 Pieces
750 Pieces
All TEMIC transceivers are classified as IEC 825-1 Accessible Emission Limit (AEL) Class 1 based upon the current proposed draft scheduled to go
into effect on January 1, 1997. AEC Class 1 LED devices are considered eye safe.
TEMIC Semiconductors
7
S–51444—Rev. A, 14-Jul-97
Pre-Release Information
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