74ACTQ245FC [TI]
ACT SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, CDFP20, CERPACK-20;
| 型号： | 74ACTQ245FC |
| 厂家： | 
TEXAS INSTRUMENTS |
| 描述： | ACT SERIES, 8-BIT TRANSCEIVER, TRUE OUTPUT, CDFP20, CERPACK-20 CD 输出元件 逻辑集成电路 |
| 文件： | 总10页 (文件大小：207K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
March 1993
54ACQ/74ACQ245 54ACTQ/74ACTQ245
#
Quiet Series Octal Bidirectional Transceiver
with TRI-STATE Inputs/Outputs
É
General Description
Features
Y
CC
I
and I
reduced by 50%
OZ
The ’ACQ/’ACTQ245 contains eight non-inverting bidirec-
tional buffers with TRI-STATE outputs and is intended for
bus-oriented applications. Current sinking capability is
24 mA at both the A and B ports. The Transmit/Receive
(T/R) input determines the direction of data flow through
the bidirectional transceiver. Transmit (active-HIGH) en-
ables data from A ports to B ports; Receive (active-LOW)
enables data from B ports to A ports. The Output Enable
input, when HIGH, disables both A and B ports by placing
them in a HIGH Z condition.
Y
Guaranteed simultaneous switching noise level and
dynamic threshold performance
Y
Y
Y
Guaranteed pin-to-pin skew AC performance
Improved latch-up immunity
TRI-STATE outputs drive bus lines or buffer memory
address registers
Y
Y
Y
Y
Outputs source/sink 24 mA
Faster prop delays than the standard ’ACT245
4 kV minimum ESD immunity (‘ACQ)
Standard Military Drawing (SMD)
Ð ’ACTQ245: 5962-8766303
The ’ACQ/’ACTQ utilizes NSC Quiet Series technology to
guarantee quiet output switching and improve dynamic
threshold performance. FACT Quiet SeriesTM features
GTOTM output control and undershoot corrector in addition
to a split ground bus for superior performance.
Ð ’ACQ245: 5962-92177
Logic Symbols
Connection Diagrams
Pin Assignment
for DIP, Flatpak, QSOP and SOIC
IEEE/IEC
TL/F/10236–1
Pin
Description
Names
OE
Output Enable Input
Transmit/Receive Input
Side A TRI-STATE
Inputs or TRI-STATE
Outputs
T/R
A –A
0
7
7
TL/F/10236–3
TL/F/10236–2
B –B
0
Side B TRI-STATE
Inputs or TRI-STATE
Outputs
Pin Assignment
for LCC
Truth Table
Inputs
Outputs
OE
T/R
L
L
L
H
X
Bus B Data to Bus A
Bus A Data to Bus B
HIGH-Z State
H
e
e
e
H
L
HIGH Voltage Level
LOW Voltage Level
Immaterial
TL/F/10236–4
X
TRI-STATEÉ is a registered trademark of National Semiconductor Corporation.
FACTTM, FACT Quiet SeriesTM, and GTOTM are trademarks of National Semiconductor Corporation.
C
1995 National Semiconductor Corporation
TL/F/10236
RRD-B30M75/Printed in U. S. A.
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Recommended Operating
Conditions
Supply Voltage (V
’ACQ
’ACTQ
)
CC
2.0V to 6.0V
4.5V to 5.5V
b
a
0.5V to 7.0V
Supply Voltage (V
)
CC
DC Input Diode Current (I
)
IK
Input Voltage (V )
I
0V to V
0V to V
CC
e b
b
a
V
I
V
I
0.5V
a
20 mA
20 mA
Output Voltage (V
)
O
CC
e
V
CC
0.5V
Operating Temperature (T )
A
74ACQ/ACTQ
54ACQ/ACTQ
b
b
a
0.5V
DC Input Voltage (V )
I
0.5V to V
0.5V to V
CC
b
b
a
40 C to 85 C
§
§
DC Output Diode Current (I
)
a
OK
55 C to 125 C
§
§
125 mV/ ns
125 mV/ns
e b
b
a
V
V
0.5V
a
20 mA
20 mA
O
O
Minimum Input Edge Rate DV/Dt
’ACQ Devices
e
V
CC
0.5V
a
DC Output Voltage (V
DC Output Source
)
O
0.5V
50 mA
50 mA
CC
V
V
from 30% to 70% of V
@
IN
CC
3.0V, 4.5V, 5.5V
CC
g
g
or Sink Current (I
)
O
Minimum Input Edge Rate DV/Dt
’ACTQ Devices
DC V
or Ground Current
CC
per Output Pin (I or I
CC
)
V
V
from 0.8V to 2.0V
@
GND
)
IN
4.5V, 5.5V
b
a
65 C to 150 C
CC
Storage Temperature (T
§
§
STG
Note: All commercial packaging is not recommended for applications requir-
a
ing greater than 2000 temperature cycles from 40 C to 125 C.
DC Latch-Up Source or
Sink Current
b
§
§
g
300 mA
Junction Temperature (T )
J
CDIP
PDIP
175 C
§
140 C
§
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACT circuits outside databook specifications.
DC Characteristics for ’ACQ Family Devices
74ACQ
54ACQ
74ACQ
e
a
e
T
A
V
CC
(V)
T
A
55 C to 125 C
e a
Symbol
Parameter
T
25 C
§
Units
Conditions
A
b
b a
40 C to 85 C
§
§
Guaranteed Limits
§
§
Typ
e
0.1V
V
V
V
Minimum High Level
Input Voltage
3.0
4.5
5.5
1.5
2.1
2.1
2.1
V
IH
OUT
b
2.25
2.75
3.15
3.85
3.15
3.85
3.15
3.85
V
V
V
or V
CC
0.1V
e
Maximum Low Level
Input Voltage
3.0
4.5
5.5
1.5
0.9
0.9
0.9
V
OUT
0.1V
IL
b
2.25
2.75
1.35
1.65
1.35
1.65
1.35
1.65
or V
CC
0.1V
e b
OUT
Minimum High Level
Output Voltage
3.0
4.5
5.5
2.99
4.49
5.49
2.9
4.4
5.4
2.9
4.4
5.4
2.9
4.4
5.4
I
50 mA
OH
e
*V
IN
V
or V
IH
12 mA
IL
b
b
b
3.0
4.5
5.5
2.56
3.86
4.86
2.4
3.7
4.7
2.46
3.76
4.76
V
V
I
24 mA
24 mA
OH
e
e
V
OL
Maximum Low Level
Output Voltage
3.0
4.5
5.5
0.002
0.001
0.001
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
I
50 mA
OUT
*V
IN
V
or V
IL IH
12 mA
3.0
4.5
5.5
0.36
0.36
0.36
0.50
0.50
0.50
0.44
0.44
0.44
V
I
24 mA
24 mA
OL
e
(Note 1)
I
Maximum Input
Leakage Current
V
V
, GND
IN
I
CC
g
g
g
1.0
5.5
0.1
1.0
mA
*All outputs loaded; thresholds on input associated with output under test.
2
DC Characteristics for ’ACQ Family Devices (Continued)
74ACQ
54ACQ
74ACQ
e
e
T
A
V
T
CC
A
e a
Symbol
Parameter
T
25 C
§
Units
Conditions
A
b
a
55 C to 125 C
b a
40 C to 85 C
(V)
§
§
§
§
Typ
Guaranteed Limits
e
²
I
I
I
Minimum Dynamic
5.5
5.5
50
75
mA
mA
V
V
V
1.65V Max
OLD
OHD
CC
OLD
Output Current
b
b
e
3.85V Min
OHD
50
75
e
Maximum Quiescent
Supply Current
V
CC
IN
5.5
5.5
4.0
80.0
40.0
mA
mA
or GND (Note 1)
e
I
Maximum I/O
V (OE)
I
V , V
IL IH
OZT
e
e
g
g
g
3.0
Leakage Current
0.3
5.5
V
V
V
CC
, GND
I
V
CC
, GND
O
V
OLP
V
OLV
V
IHD
V
ILD
Quiet Output
Figures 2-12,13
(Notes 2, 3)
5.0
5.0
5.0
5.0
1.1
1.5
V
V
V
V
Maximum Dynamic V
OL
Quiet Output
Figures 2-12,13
(Notes 2,3)
b
b
0.6
1.2
Minimum Dynamic V
OL
minimum High Level
(Notes 2, 4)
3.1
3.5
Dynamic Input Voltage
Maximum Low Level
(Notes 2, 4)
1.9
1.5
Dynamic Input Voltage
²
Maximum test duration 2.0 ms, one output loaded at a time.
@
@
@
for 54ACQ 25 C is identical to 74ACQ 25 C.
@
Note 1: I and I
IN
3.0V are guaranteed to be less than or equal to the respective limit 5.5V V . I
CC CC
§
§
CC
Note 2: Plastic DIP package.
Note 3: Max number of outputs defined as (n). Data Inputs are driven 0V to 5V; one output GND.
@
b
Note 4: Max number of Data Inputs (n) switching. (n 1) Inputs switching 0V to 5V (’ACQ). Input-under-test switching: 5V to threshold (V ), 0V to threshold (V ),
ILD
IHD
e
f
1 MHz.
DC Characteristics for ’ACTQ Family Devices
74ACTQ
54ACTQ
74ACTQ
e
e
T
A
V
T
CC
A
e a
Symbol
Parameter
T
25 C
§
Units
Conditions
A
b
a
55 C to 125 C
b a
40 C to 85 C
(V)
§
§
§
§
Typ
Guaranteed Limits
e
0.1V
V
V
V
Minimum High Level
Input Voltage
4.5
5.5
1.5
1.5
2.0
2.0
2.0
2.0
2.0
2.0
V
IH
OUT
V
V
V
b
or V
CC
0.1V
e
Maximum Low Level
Input Voltage
4.5
5.5
1.5
1.5
0.8
0.8
0.8
0.8
0.8
0.8
V
OUT
0.1V
IL
b
or V
CC
0.1V
e b
OUT
Minimum High Level
Output Voltage
4.5
5.5
4.49
5.49
4.4
5.4
4.4
5.4
4.4
5.4
I
50 mA
OH
e
*V
IN
V
IL
or V
IH
b
b
4.5
5.5
3.86
4.86
3.70
4.70
3.76
4.76
24 mA
V
V
I
OH
24 mA
e
e
V
OL
Maximum Low Level
Output Voltage
4.5
5.5
0.001
0.001
0.1
0.1
0.1
0.1
0.1
0.1
I
50 mA
OUT
*V
IN
V or V
IL IH
4.5
5.5
0.36
0.36
0.50
0.50
0.44
0.44
24 mA
V
I
OL
24 mA
e
I
IN
Maximum Input
Leakage Current
V
V , GND
CC
I
g
g
g
1.0
5.5
0.1
1.0
mA
*All outputs loaded; thresholds on input associated with output under test.
3
DC Characteristics for ’ACTQ Family Devices (Continued)
74ACTQ
54ACTQ
74ACTQ
e
e
T
A
V
CC
(V)
T
A
55 C to 125 C
e a
Symbol
Parameter
T
25 C
§
Units
Conditions
A
b
a
b a
40 C to 85 C
§
§
§
Guaranteed Limits
§
Typ
e
I
I
I
Maximum TRI-STATE
Leakage Current
V
V
V
V
, V
OZT
CCT
IL IH
g
g
g
5.5
5.5
0.3
5.5
1.6
50
3.0
1.5
75
mA
e
, GND
CC
O
e
b
2.1V
Maximum
/Input
V
I
V
CC
0.6
mA
I
CC
e
²
I
I
I
Minimum Dynamic
Output Current
5.5
5.5
mA
mA
V
V
V
1.65V Max
e
3.85V Min
OLD
OHD
CC
OLD
b
b
50
75
OHD
e
Maximum Quiescent
Supply Current
V
CC
IN
5.5
5.0
5.0
5.0
5.0
4.0
1.5
80.0
40.0
mA
V
or GND (Note 1)
V
V
V
V
Quiet Output
Figures 2-12,13
(Notes 2, 3)
OLP
OLV
IHD
ILD
1.1
Maximum Dynamic V
OL
OL
Quiet Output
Minimum Dynamic V
Figures 2-12,13
(Notes 2, 3)
b
b
1.2
0.6
1.9
1.2
V
Minimum High Level
Dynamic Input Voltage
(Notes 2, 4)
2.2
0.8
V
Maximum Low Level
Dynamic Input Voltage
(Notes 2, 4)
V
²
Maximum test duration 2.0 ms, one output loaded at a time.
@ @
for 54ACTQ 25 C is identical to 74ACTQ 25 C.
§ §
Note 1: I
CC
Note 2: Plastic DIP package.
Note 3: Max number of outputs defined as (n). n 1 Data Inputs are driven 0V to 3V; one output GND.
@
b
b
Note 4: Max number of Data Inputs (n) switching. (n 1) Inputs switching 0V to 3V (’ACTQ). Input-under-test switching: 3V to threshold (V ), 0V to threshold
ILD
e
(V ) f
IHD
1 MHz.
AC Electrical Characteristics
74ACQ
54ACQ
e b
74ACQ
e b
40 C
T
55 C
T
§
to 125 C
§
A
A
e a
A
V *
CC
(V)
T
25 C
§
50 pF
a
e
a
e
Symbol
Parameter
to 85 C
Units
§
50 pF
§
50 pF
e
C
L
C
C
L
L
Min
Typ
Max
Min
Max
Min
Max
t
t
t
, t
PHL PLH
Propagation Delay
Data to Output
3.3
5.0
2.0
1.5
7.5
5.0
10.0
6.5
1.0
1.0
11.5
8.5
2.0
1.5
10.5
7.0
ns
ns
ns
ns
, t
PZL PZH
Output Enable Time
3.3
5.0
3.0
2.0
8.5
6.0
13.0
8.5
1.0
1.0
13.0
10.0
3.0
2.0
13.5
9.0
, t
PHZ PLZ
Output Disable Time
3.3
5.0
1.0
1.0
8.5
7.5
14.5
9.5
1.0
1.0
13.0
10.0
1.0
1.0
15.0
10.0
t
t
,
Output to Output
Skew**
Data to Output
3.3
5.0
1.0
0.5
1.5
1.0
1.5
1.0
OSHL
OSLH
g
*Voltage Range 5.0 is 5.0V 0.5V
g
Voltage Range 3.3 is 3.3V 0.3V
**Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification
applies to any outputs switching in the same direction, either HIGH to LOW (t ) or LOW to HIGH (t ). Parameter guaranteed by design.
OSHL
OSLH
4
AC Electrical Characteristics
74ACTQ
54ACTQ
e b
74ACTQ
e b
40 C
T
55 C
T
§
to 125 C
§
A
A
e a
A
V *
CC
(V)
T
25 C
§
50 pF
a
e
a
e
Symbol
Parameter
to 85 C
Units
§
50 pF
§
50 pF
e
C
L
C
C
L
L
Min
Typ
Max
Min
Max
Min
Max
t , t
PHL PLH
Propagation Delay
Data to Output
1.5
9.0
5.0
1.5
5.5
7.0
1.5
7.5
ns
t
, t
PZL PZH
Output Enable Time
Output Disable Time
5.0
5.0
2.0
1.0
7.0
8.0
9.0
1.5
1.0
12.0
11.5
2.0
1.0
9.5
ns
ns
t , t
PHZ PLZ
10.0
10.5
t
t
Output to Output
Skew**
Data to Output
OSHL,
OSLH
5.0
0.5
1.0
1.0
ns
g
*Voltage Range 5.0 is 5.0V 0.5V
**Skew is defined as the absolute value of the difference between the actual propagation delay for any two separate outputs of the same device. The specification
applies to any outputs switching in the same direction, either HIGH to LOW (t
) or LOW to HIGH (t
). Parameter guaranteed by design.
OSLH
OSHL
Capacitance
Symbol
Parameter
Typ
Units
Conditions
e
e
C
C
Input Capacitance
4.5
pF
V
OPEN
5.0V
IN
CC
CC
Input/Output
Capacitance
I/O
15
pF
pF
V
C
PD
Power Dissipation
Capacitance
e
80.0
V
CC
5.0V
5
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical
to the accuracy and repeatability of the tests. The following
is a brief description of the setup used to measure the noise
characteristics of FACT.
6. Set the word generator input levels at 0V LOW and 3V
HIGH for ACT devices and 0V LOW and 5V HIGH for AC
devices. Verify levels with a digital volt meter.
V /V
OLP OLV
and V
/V :
OHP OHV
Equipment:
Determine the quiet output pin that demonstrates the
greatest noise levels. The worst case pin will usually be
the furthest from the ground pin. Monitor the output volt-
ages using a 50X coaxial cable plugged into a standard
SMB type connector on the test fixture. Do not use an
active FET probe.
#
Hewlett Packard Model 8180A Word Generator
PC-163A Test Fixture
Tektronics Model 7854 Oscilloscope
Procedure:
1. Verify Test Fixture Loading: Standard Load 50 pF, 500X.
Measure V
and V
OLV
on the quiet output during the
and V on the quiet out-
#
#
OLP
HL transition. Measure V
2. Deskew the word generator so that no two channels have
greater than 150 ps skew between them. This requires
that the oscilloscope be deskewed first. Swap out the
channels that have more than 150 ps of skew until all
channels being used are within 150 ps. It is important to
deskew the word generator channels before testing. This
will ensure that the outputs switch simultaneously.
OHP
put during the LH transition.
OHV
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
V
and V
:
IHD
ILD
3. Terminate all inputs and outputs to ensure proper loading
of the outputs and that the input levels are at the correct
voltage.
Monitor one of the switching outputs using a 50X coaxial
cable plugged into a standard SMB type connector on
the test fixture. Do not use an active FET probe.
#
4. Set V
to 5.0V.
First increase the input LOW voltage level, V , until the
IL
output begins to oscillate. Oscillation is defined as noise
#
#
#
CC
5. Set the word generator to toggle all but one output at a
frequency of 1 MHz. Greater frequencies will increase
DUT heating and affect the results of the measurement.
on the output LOW level that exceeds V limits, or on
IL
output HIGH levels that exceed V limits. The input
IH
LOW voltage level at which oscillation occurs is defined
as V
.
ILD
Next increase the input HIGH voltage level on the word
generator, V until the output begins to oscillate. Oscilla-
IH
tion is defined as noise on the output LOW level that
exceeds V limits, or on output HIGH levels that exceed
IL
V
limits. The input HIGH voltage level at which oscilla-
.
IH
tion occurs is defined as V
IHD
Verify that the GND reference recorded on the oscillo-
scope has not drifted to ensure the accuracy and repeat-
ability of the measurements.
TL/F/10236–5
FIGURE 8. Quiet Output Noise Voltage Waveforms
Note A. V
and V
are measured with respect to ground reference.
OLP
OHV
e
e
Note B. Input pulses have the following characteristics: f
k
150 ps.
1 MHz, t
r
e
3 ns, t
3 ns, skew
f
TL/F/10236–6
FIGURE 9. Simultaneous Switching Test Circuit
6
Ordering Information
The device number is used to form part of a simplified purchasing code where the package type and temperature range are
defined as follows:
74ACTQ 245
P
C
QR
Temperature Range Family
Special Variations
e
e
e
e
74ACQ
54ACQ
Commercial
Military
X
QR
Device shipped in 13 reels
×
Commercial grade device
with burn-in
e
74ACTQ Commercial TTL-Compatible
e
54ACTQ Military TTL-Compatible
e
QB
Military grade device with
environmental and burn-in
processing shipped in
tubes
Device Type
Package Code
e
e
e
e
e
e
P
D
F
L
S
QS
Plastic DIP
Ceramic DIP
Flatpak
Leadless Ceramic Chip Carrier (LCC)
Small Outline Package (SOIC)
Quarter Size Outline Package (QSOP)
Temperature Range
e
b a
C
Commercial ( 40 C to 85 C)
§
§
e
b a
Military ( 55 C to 125 C)
M
§
§
Physical Dimensions inches (millimeters)
20-Terminal Ceramic Leadless Chip Carrier (L)
NS Package Number E20A
7
Physical Dimensions inches (millimeters) (Continued)
20-Lead Ceramic Dual-In-Line Package (D)
NS Package Number J20A
20-Lead Small Outline Integrated Circuit (S)
NS Package Number M20B
8
Physical Dimensions inches (millimeters) (Continued)
20-Lead Quarter Size Outline Package (QS)
NS Package Number MQA20
NS Package Number N20B
9
Ý
Lit. 114675
Physical Dimensions inches (millimeters) (Continued)
20-Lead Ceramic Flatpak (F)
NS Package Number W20A
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NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and whose
failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
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