ADS5444-EP_13 [TI]

13-BIT 250-MSPS ANALOG-TO-DIGITAL CONVERTER;
ADS5444-EP_13
型号: ADS5444-EP_13
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

13-BIT 250-MSPS ANALOG-TO-DIGITAL CONVERTER

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ADS5444-EP  
www.ti.com  
SGLS360AUGUST 2006  
13-BIT 250-MSPS ANALOG-TO-DIGITAL CONVERTER  
FEATURES  
TQFP-80 PowerPAD™ Package  
Controlled Baseline  
Pin Compatible With the ADS5440  
– One Assembly  
Military Temperature Range = –55°C to 125°C  
(1)  
– One Test Site  
Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
electromigration, bond intermetallic life, and mold compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
– One Fabrication Site  
Extended Temperature Performance of –55°C  
to 125°C  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Enhanced Product-Change Notification  
Qualification Pedigree(1)  
APPLICATIONS  
Test and Measurement  
Software-Defined Radio  
Multichannel Base Station Receivers  
Base Station Tx Digital Predistortion  
Communications Instrumentation  
13-Bit Resolution  
250-MSPS Sample Rate  
SNR = 69 dBc at 100-MHz IF and 250 MSPS  
SFDR = 76 dBc at 100-MHz IF and 250 MSPS  
SNR = 67.7 dBc at 230-MHz IF and 250 MSPS  
SFDR = 77 dBc at 230-MHz IF and 250 MSPS  
2.2-VPP Differential Input Voltage  
Fully Buffered Analog Inputs  
RELATED PRODUCTS  
ADS5424 - 14-Bit, 105 MSPS ADC  
ADS5423 - 14-Bit, 80 MSPS ADC  
ADS5440 - 13-Bit, 210 MSPS ADC  
5-V Analog Supply Voltage  
LVDS Compatible Outputs  
Total Power Dissipation: 2 W  
Offset Binary Output Format  
DESCRIPTION  
The ADS5444 is a 13-bit 250-MSPS analog-to-digital converter (ADC) that operates from a 5-V supply, while  
providing LVDS-compatible digital outputs from a 3.3-V supply. The ADS5444 input buffer isolates the internal  
switching of the onboard track and hold (T&H) from disturbing the signal source. An internal reference generator  
is also provided to further simplify the system design. The ADS5444 has outstanding low noise and linearity over  
input frequency.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PowerPAD is a trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2006, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
ADS5444-EP  
www.ti.com  
SGLS360AUGUST 2006  
AV  
DD  
DV  
DD  
AIN  
AIN  
+
+
Σ
Σ
A1  
TH1  
TH2  
A2  
TH3  
A3  
ADC3  
ADC1  
DAC1  
ADC2  
DAC2  
VREF  
Reference  
5
5
5
Digital Error Correction  
CLK  
CLK  
Timing  
OVR  
OVR  
DRY  
DRY  
D[12:0]  
GND  
B0061-01  
The ADS5444 is available in an 80-pin TQFP PowerPAD™ package. The ADS5444 is built on a state-of-the-art  
Texas Instruments complementary bipolar process (BiCom3X) and is specified over the full military temperature  
range (–55°C to 125°C).  
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be  
more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
PACKAGING/ORDERING INFORMATION(1)  
Product  
Package-  
Lead  
Package  
Designator  
Specified  
Temperature  
Range  
Package  
Marking  
Ordering  
Number  
Transport  
Media,  
Quantity  
(1)  
HTQFP-80(2)  
PowerPAD  
ADS5444  
PFP  
–55°C to 125°C  
ADS5444M-EP  
ADS5444MPFPEP  
Tray, 96  
(1) For the most current product and ordering information, see the Package Option Addendum located at the end of this document, or see  
the TI website at www.ti.com.  
(2) Thermal pad size: 7,5 mm x 7,5 mm (typ)  
ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range (unless otherwise noted)(1)  
VALUE / UNIT  
AVDD to GND  
6 V  
5 V  
Supply voltage  
DRVDD to GND  
Analog input to GND  
Clock input to GND  
CLK to CLK  
–0.3 V to AVDD + 0.3 V  
–0.3 V to AVDD + 0.3 V  
±2.5 V  
Digital data output to GND  
–0.3 V to DRVDD + 0.3 V  
–55°C to 125°C  
150°C  
Operating temperature range  
Maximum junction temperature  
Storage temperature range  
ESD Human Body Model (HBM)  
–65°C to 150°C  
2.5 kV  
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may  
degrade device reliability. These are stress ratings only and functional operation of the device at these or any other conditions beyond  
those specified is not implied.  
THERMAL CHARACTERISTICS(1)  
PARAMETER  
TEST CONDITIONS  
TYP  
21.7  
15.4  
50  
UNIT  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
Soldered slug, no airflow  
Soldered slug, 250-LFPM airflow  
Unsoldered slug, no airflow  
Unsoldered slug, 250-LFPM airflow  
Bottom of package (heatslug)  
θJA  
43.4  
2.99  
θJC  
(1) Using 36 thermal vias (6 x 6 array). See the Application Section.  
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SGLS360AUGUST 2006  
1000  
100  
10  
Wirebond Voiding Fail Mode  
Electromigration Fail Mode  
1
0.1  
120  
130  
140  
150  
160  
170  
180  
Continuous TJ 5C  
Figure 1. ADS5444MPFPEP Operating Life Derating Chart  
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RECOMMENDED OPERATING CONDITIONS  
MIN  
NOM  
MAX  
UNIT  
SUPPLIES  
AVDD  
Analog supply voltage  
4.75  
3
5
5.25  
3.6  
V
V
DRVDD  
Output driver supply voltage  
3.3  
ANALOG INPUT  
Differential input range  
Input common mode  
CLOCK INPUT  
1/tC ADCLK input sample rate (sine wave)  
2.2  
2.4  
VPP  
V
VCM  
10  
250 MSPS  
VPP  
Clock amplitude, differential sine wave  
Clock duty cycle  
3
50%  
TA  
Open free-air temperature  
–55  
125  
°C  
ELECTRICAL CHARACTERISTICS  
Min, Typ, and Max values at TA = 25°C, full temperature range is TMIN = –55°C to TMAX = 125°C, sampling rate = 250 MSPS,  
50% clock duty cycle, AVDD = 5 V, DRVDD = 3.3 V, –1-dBFS differential input, and 3-VPP differential clock (unless otherwise  
noted)  
PARAMETER  
Resolution  
ANALOG INPUTS  
Differential input range  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
13  
Bits  
2.2  
1
Vpp  
kΩ  
Differential input resistance (DC)  
Differential input capacitance  
1.5  
800  
pF  
Analog input bandwidth  
MHz  
INTERNAL REFERENCE VOLTAGE  
VREF  
Reference voltage  
2.4  
V
DYNAMIC ACCURACY  
No missing codes  
DNL  
Assured  
±0.4  
fIN = 10 MHz  
fIN = 10 MHz  
TA = 25°C  
–1  
–1  
1
Differential linearity error  
LSB  
2
Full temp range  
TA = 25°C  
±0.4  
INL  
–2.2  
–4.3  
–11  
±0.9  
2.2  
Integral linearity error  
LSB  
4.3  
Full temp range  
±2.7  
Offset error  
11  
5
mV  
Offset temperature coefficient  
Gain error  
0.0005  
mV/°C  
%FS  
–5  
Gain temperature coefficient  
PSRR  
–0.02  
1
%/°C  
mV/V  
fIN = 100 MHz  
POWER SUPPLY  
IAVDD  
Analog supply current  
340  
80  
2
430  
100  
mA  
mA  
W
VIN = full scale, fIN = 100 MHz, FS = 250  
MSPS  
IDRVDD Output buffer supply current  
Power dissipation  
2.37  
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ELECTRICAL CHARACTERISTICS (continued)  
Min, Typ, and Max values at TA = 25°C, full temperature range is TMIN = –55°C to TMAX = 125°C, sampling rate = 250 MSPS,  
50% clock duty cycle, AVDD = 5 V, DRVDD = 3.3 V, –1-dBFS differential input, and 3-VPP differential clock (unless otherwise  
noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
DYNAMIC AC CHARACTERISTICS  
fIN = 10 MHz  
fIN = 70 MHz  
69.3  
69  
69  
69  
68.3  
67.7  
67  
66  
85  
77  
77  
77  
74  
77  
70  
64  
87  
77  
80  
74  
78  
70  
64  
86  
82  
79  
80  
91  
80  
69  
90  
95  
82  
80  
83  
86  
85  
fIN = 100 MHz  
TA = 25°C  
67  
Full temp range  
64.25  
SNR  
Signal-to-noise ratio  
dBc  
fIN = 170 MHz  
fIN = 230 MHz  
fIN = 300 MHz  
fIN = 400 MHz  
fIN = 10 MHz  
fIN = 70 MHz  
TA = 25°C  
70  
64  
fIN = 100 MHz  
Full temp range  
SFDR  
Spurious free dynamic range  
dBc  
fIN = 170 MHz  
fIN = 230 MHz  
fIN = 300 MHz  
fIN = 400 MHz  
fIN = 10 MHz  
fIN = 70 MHz  
fIN = 100 MHz  
fIN = 170 MHz  
fIN = 230 MHz  
fIN = 300 MHz  
fIN = 400 MHz  
fIN = 10 MHz  
fIN = 70 MHz  
fIN = 100 MHz  
fIN = 170 MHz  
fIN = 230 MHz  
fIN = 300 MHz  
fIN = 400 MHz  
fIN = 10 MHz  
fIN = 70 MHz  
fIN = 100 MHz  
fIN = 170 MHz  
fIN = 230 MHz  
fIN = 300 MHz  
fIN = 400 MHz  
HD2  
Second harmonic  
dBc  
dBc  
dBc  
HD3  
Third harmonic  
Worst other harmonic/spur (other than  
HD2 and HD3)  
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ELECTRICAL CHARACTERISTICS (continued)  
Min, Typ, and Max values at TA = 25°C, full temperature range is TMIN = –55°C to TMAX = 125°C, sampling rate = 250 MSPS,  
50% clock duty cycle, AVDD = 5 V, DRVDD = 3.3 V, –1-dBFS differential input, and 3-VPP differential clock (unless otherwise  
noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
69  
MAX UNIT  
fIN = 10 MHz  
fIN = 70 MHz  
68  
fIN = 100 MHz  
67.6  
66.5  
67  
SINAD  
fIN = 170 MHz  
dBc  
fIN = 230 MHz  
fIN = 300 MHz  
65  
fIN = 400 MHz  
61  
ENOB  
Effective number of bits  
RMS idle channel noise  
fIN = 10 MHz  
11.2  
0.4  
Bits  
Inputs tied to common-mode  
LSB  
DIGITAL CHARACTERISTICS – LVDS DIGITAL OUTPUTS  
Differential output voltage  
0.247  
1.125  
0.452  
1.25 1.375  
V
V
Output offset voltage  
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TIMING CHARACTERISTICS  
t
A
N+3  
N
AIN  
N+1  
N+2  
N+4  
t
t
t
CLKL  
CLK  
CLKH  
CLK, CLK  
N + 1  
N + 2  
N + 3  
N + 4  
N
t
t
t
h_c  
C_DR  
su_c  
D[12:0],  
OVR, OVR  
N−3  
N−2  
N−1  
t
N
t
f
t
t
r
h_DR  
su_DR  
DRY, DRY  
t
DR  
T0073-01  
Figure 2. Timing Diagram  
TIMING CHARACTERISTICS  
Min, Typ, Max over full temperature range, 50% clock duty cycle, sampling rate = 250 MSPS, AVDD = 5 V, DRVDD = 3.3 V  
PARAMETER  
Aperture delay  
TEST CONDITIONS  
MIN  
TYP  
500  
200  
4
MAX UNIT  
ps  
tA  
tJ  
Clock slope independent aperture uncertainty (jitter)  
Latency  
fs RMS  
cycles  
Clock Input  
tCLK  
Clock period  
4
2
2
ns  
ns  
ns  
tCLKH  
Clock pulse width high  
Clock pulse width low  
tCLKL  
Clock to DataReady (DRY)  
tDR  
Clock rising to DataReady falling  
Clock rising to DataReady rising  
1.1  
3.1  
ns  
(1)  
tC_DR  
Clock duty cycle = 50%  
2.7  
3.5  
ns  
Clock to DATA, OVR(2)  
tr  
Data rise time (20% to 80%)  
0.6  
0.6  
3.1  
0.2  
ns  
ns  
ns  
ns  
tf  
Data fall time(80% to 20%)  
tsu_c  
th_c  
Data valid to clock (setup time)  
Clock to invalid Data (hold time)  
DataReady (DRY)/DATA, OVR(2)  
tsu(DR)  
th(DR)  
Data valid to DRY  
DRY to invalid Data  
1.7  
0.9  
2
ns  
ns  
1.3  
(1) tC_DR = tDR + tCLKH for clock duty cycles other than 50%  
(2) Data is updated with clock falling edge or DRY rising edge.  
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DEVICE INFORMATION  
PFP PACKAGE  
(TOP VIEW)  
D4  
D4  
DVDD  
GND  
AVDD  
NC  
D3  
D3  
D2  
NC  
D2  
D1  
VREF  
GND  
AVDD  
GND  
CLK  
D1  
GND  
DVDD  
D0  
GND  
CLK  
D0  
GND  
AVDD  
AVDD  
GND  
AIN  
NC  
NC  
NC  
NC  
NC  
NC  
OVR  
OVR  
AIN  
GND  
AVDD  
GND  
P0027-01  
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DEVICE INFORMATION (continued)  
TERMINAL FUNCTIONS  
TERMINAL  
DESCRIPTION  
NAME  
AVDD  
DVDD  
GND  
NO.  
3, 8, 13, 14, 19, 21,  
23, 25, 27, 31, 35, 37, Analog power supply  
39  
1, 51, 66  
Output driver power supply  
2, 7, 9, 12, 15, 18, 20,  
22, 24, 26, 28, 30, 32, Ground  
34, 36, 38, 40, 52, 65  
VREF  
CLK  
CLK  
AIN  
6
Reference voltage  
10  
11  
16  
17  
Differential input clock (positive). Conversion initiated on rising edge.  
Differential input clock (negative)  
Differential input signal (positive)  
AIN  
Differential input signal (negative)  
Over range indicator LVDS output. A logic high signals an analog input in excess of the  
full-scale range.  
OVR, OVR  
42, 41  
D0, D0  
50, 49  
53–64  
67–76  
78, 77  
80, 79  
LVDS digital output pair, least-significant bit (LSB)  
LVDS digital output pairs  
D1–D6, D1–D6  
D7–D11, D7–D11  
D12, D12  
LVDS digital output pairs  
LVDS digital output pair, most-significant bit (MSB)  
Data ready LVDS output pair  
DRY, DRY  
NC  
4, 5, 29, 33, 43–48 No connect  
DEFINITION OF SPECIFICATIONS  
Analog BandwidthThe analog input frequency at which the power of the fundamental is reduced by 3 dB with respect to the  
low frequency value.  
Aperture DelayThe delay in time between the rising edge of the input sampling clock and the actual time at which the  
sampling occurs.  
Aperture Uncertainty (Jitter)The sample-to-sample variation in aperture delay.  
Clock Pulse Width/Duty CycleThe duty cycle of a clock signal is the ratio of the time the clock signal remains at a logic  
high (clock pulse width) to the period of the clock signal. Duty cycle is typically expressed as a percentage. A  
perfect differential sine wave clock results in a 50% duty cycle.  
Maximum Conversion RateThe maximum sampling rate at which certified operation is given. All parametric testing is  
performed at this sampling rate unless otherwise noted.  
Minimum Conversion RateThe minimum sampling rate at which the ADC functions.  
Differential Nonlinearity (DNL)An ideal ADC exhibits code transitions at analog input values spaced exactly 1 LSB apart.  
The DNL is the deviation of any single step from this ideal value, measured in units of LSB.  
Integral Nonlinearity (INL)The INL is the deviation of the ADCs transfer function from a best fit line determined by a least  
squares curve fit of that transfer function. The INL at each analog input value is the difference between the  
actual transfer function and this best fit line, measured in units of LSB.  
Gain Error  
The gain error is the deviation of the ADCs actual input full-scale range from its ideal value. The gain error is  
given as a percentage of the ideal input full-scale range.  
Offset Error Offset error is the deviation of output code from mid-code when both inputs are tied to common-mode.  
Temperature DriftTemperature drift (with respect to gain error and offset error) specifies the change from the value at the  
nominal temperature to the value at TMIN or TMAX. It is computed as the maximum variation the parameters  
over the whole temperature range divided by TMIN – TMAX  
.
Signal-to-Noise Ratio (SNR)SNR is the ratio of the power of the fundamental (PS) to the noise floor power (PN), excluding  
the power at dc and the first five harmonics.  
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DEFINITION OF SPECIFICATIONS (continued)  
P
P
S
N
SNR + 10log  
10  
(1)  
SNR is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as the  
reference, or dBFS (dB to full scale) when the power of the fundamental is extrapolated to the converter’s  
full-scale range.  
Signal-to-Noise and Distortion (SINAD)SINAD is the ratio of the power of the fundamental (PS) to the power of all the  
other spectral components including noise (PN) and distortion (PD), but excluding dc.  
P
S
SINAD + 10log  
10  
P
) P  
N
D
(2)  
SINAD is either given in units of dBc (dB to carrier) when the absolute power of the fundamental is used as  
the reference, or dBFS (dB to full scale) when the power of the fundamental is extrapolated to the converter’s  
full-scale range.  
Effective Resolution BandwidthThe highest input frequency where the SNR (dB) is dropped by 3 dB for a full-scale input  
amplitude.  
Total Harmonic Distortion (THD)THD is the ratio of the power of the fundamental (PS) to the power of the first five  
harmonics (PD).  
P
S
THD + 10log  
10  
P
D
(3)  
THD is typically given in units of dBc (dB to carrier).  
Two-Tone Intermodulation DistortionIMD3 is the ratio of the power of the fundamental (at frequencies f1, f2) to the power  
of the worst spectral component at either frequency 2f1– f2 or 2f2– f1). IMD3 is either given in units of dBc (dB  
to carrier) when the absolute power of the fundamental is used as the reference or dBFS (dB to full scale)  
when the power of the fundamental is extrapolated to the converter’s full-scale range.  
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TYPICAL CHARACTERISTICS  
Spectral Performance  
(FFT For 10 MHz Input Signal)  
Spectral Performance  
(FFT For 100 MHz Input Signal)  
0
−20  
0
−20  
SFDR = 86.8 dBc  
SFDR = 76.1 dBc  
SNR = 69 dBc  
THD = 72.6 dBc  
SINAD = 67.4 dBc  
SNR = 68.7 dBc  
THD = 82.3 dBc  
SINAD = 68.5 dBc  
−40  
−40  
−60  
−60  
−80  
−80  
−100  
−120  
−100  
−120  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
G001  
G002  
Figure 3.  
Figure 4.  
Spectral Performance  
(FFT For 170 MHz Input Signal)  
Spectral Performance  
(FFT For 230 MHz Input Signal)  
0
−20  
0
−20  
SFDR = 77 dBc  
SNR = 67.3 dBc  
THD = 75.6 dBc  
SINAD = 66.7 dBc  
SFDR = 74.6 dBc  
SNR = 68.4 dBc  
THD = 72.5 dBc  
SINAD = 67 dBc  
−40  
−40  
−60  
−60  
−80  
−80  
−100  
−120  
−100  
−120  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
G004  
G003  
Figure 5.  
Figure 6.  
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TYPICAL CHARACTERISTICS (continued)  
Spectral Performance  
(FFT For 300 MHz Input Signal)  
Spectral Performance  
(FFT For 400 MHz Input Signal)  
0
−20  
0
−20  
SFDR = 70.2 dBc  
SFDR = 62.5 dBc  
SNR = 67 dBc  
THD = 69.5 dBc  
SINAD = 65 dBc  
SNR = 66.2 dBc  
THD = 61.8 dBc  
SINAD = 60.4 dBc  
−40  
−40  
−60  
−60  
−80  
−80  
−100  
−120  
−100  
−120  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
G005  
G006  
Figure 7.  
Figure 8.  
Two-Tone Intermodulation Distortion  
(FFT For 51.5 MHz and 52.5 MHz Input Signals)  
Two-Tone Intermodulation Distortion  
(FFT For 51.5 MHz and 52.5 MHz Input Signals)  
0
−20  
0
−20  
F
F
= 51.5 MHz, −7 dBFS  
= 52.5 MHz, −7 dBFS  
F
F
= 51.5 MHz, −16 dBFS  
= 52.5 MHz, −16 dBFS  
IN1  
IN1  
IN2  
IN2  
IMD3 = 100.6 dBFS  
IMD3 = 99.6 dBFS  
−40  
−40  
−60  
−60  
−80  
−80  
−100  
−120  
−100  
−120  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
G007  
G008  
Figure 9.  
Figure 10.  
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TYPICAL CHARACTERISTICS (continued)  
Two-Tone Intermodulation Distortion  
(FFT For 151 MHz and 152 MHz Input Signals)  
Two-Tone Intermodulation Distortion  
(FFT For 151 MHz and 152 MHz Input Signals)  
0
−20  
0
−20  
F
F
= 151 MHz, −7 dBFS  
= 152 MHz, −7 dBFS  
F
F
= 151 MHz, −16 dBFS  
= 152 MHz, −16 dBFS  
IN1  
IN2  
IN1  
IN2  
IMD3 = 89.4 dBFS  
IMD3 = 92.5 dBFS  
−40  
−40  
−60  
−60  
−80  
−80  
−100  
−120  
−100  
−120  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
G009  
G010  
Figure 11.  
Figure 12.  
Two-Tone Intermodulation Distortion  
(FFT For 229 MHz and 230 MHz Input Signals)  
Two-Tone Intermodulation Distortion  
(FFT For 229 MHz and 230 MHz Input Signals)  
0
−20  
0
−20  
F
F
= 229 MHz, −7 dBFS  
= 230 MHz, −7 dBFS  
F
F
= 229 MHz, −16 dBFS  
= 230 MHz, −16 dBFS  
IN1  
IN2  
IN1  
IN2  
IMD3 = 85.8 dBFS  
IMD3 = 101.4 dBFS  
−40  
−40  
−60  
−60  
−80  
−80  
−100  
−120  
−100  
−120  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
G011  
G012  
Figure 13.  
Figure 14.  
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TYPICAL CHARACTERISTICS (continued)  
Two-Tone Intermodulation Distortion  
(FFT For 300 MHz and 301 MHz Input Signals)  
Two-Tone Intermodulation Distortion  
(FFT For 300 MHz and 301 MHz Input Signals)  
0
−20  
0
−20  
F
F
= 300 MHz, −7 dBFS  
= 301 MHz, −7 dBFS  
F
F
= 300 MHz, −16 dBFS  
= 301 MHz, −16 dBFS  
IN1  
IN2  
IN1  
IN2  
IMD3 = 83.3 dBFS  
IMD3 = 101.9 dBFS  
−40  
−40  
−60  
−60  
−80  
−80  
−100  
−120  
−100  
−120  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
0
10 20 30 40 50 60 70 80 90 100 110 120  
Frequency − MHz  
G013  
G014  
Figure 15.  
Figure 16.  
Input Bandwidth  
Differential Nonlinearity  
1
0
0.4  
0.2  
f
f
= 250 MSPS  
= 10 MHz  
S
IN  
−1  
−2  
−3  
−4  
−5  
−6  
−7  
−8  
−9  
−10  
0.0  
−0.2  
−0.4  
f
A
= 250 MSPS  
S
= −1 dBFS  
IN  
50 1050 2050 3050 4050 5050 6050 7050 8050  
Code  
1
10  
100  
1k  
f
IN  
− Input Frequency − MHz  
G017  
G018  
Figure 17.  
Figure 18.  
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TYPICAL CHARACTERISTICS (continued)  
Integral Nonlinearity  
Noise Histogram With Inputs Shorted  
2.0  
1.5  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
f
= 250 MSPS  
S
1.0  
0.5  
0.0  
−0.5  
−1.0  
−1.5  
f
f
= 250 MSPS  
= 10 MHz  
S
IN  
−2.0  
0
0
1000 2000 3000 4000 5000 6000 7000 8000  
Code  
4109 4110 4111 4112 4113 4114 4115 4116  
Code Number  
G019  
G020  
Figure 19.  
Figure 20.  
AC Performance  
vs  
Input Amplitude  
AC Performance  
vs  
Input Amplitude  
120  
100  
80  
120  
100  
80  
SFDR (dBFS)  
SFDR (dBFS)  
SNR (dBFS)  
SNR (dBFS)  
60  
60  
SFDR (dBc)  
SFDR (dBc)  
40  
40  
20  
20  
SNR (dBc)  
SNR (dBc)  
0
0
−20  
−40  
−20  
−40  
f
f
= 250 MSPS  
= 100 MHz  
f
f
= 250 MSPS  
= 230 MHz  
S
S
IN  
IN  
−100 −90 −80 −70 −60 −50 −40 −30 −20 −10  
0
−100 −90 −80 −70 −60 −50 −40 −30 −20 −10  
0
Input Amplitude − dBFS  
Input Amplitude − dBFS  
G021  
G022  
Figure 21.  
Figure 22.  
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TYPICAL CHARACTERISTICS (continued)  
Two-Tone Spurious Free Dynamic Range  
Spurious Free Dynamic Range  
vs  
vs  
Input Amplitude  
Clock Duty Cycle  
120  
100  
80  
80.0  
77.5  
75.0  
72.5  
70.0  
67.5  
65.0  
62.5  
60.0  
f
S
= 250 MSPS  
SFDR (dBFS)  
f
IN  
= 230 MHz  
60  
SFDR (dBc)  
40  
f
IN  
= 100 MHz  
90 dBFS Line  
20  
0
f
f
= 250 MSPS  
= 100 MHz  
S
IN  
−20  
−110100 −90 −80 −70 −60 −50 −40 −30 −20 −10  
0
0
20  
40  
60  
80  
100  
Input Amplitude − dBFS  
Duty Cycle − %  
G023  
G024  
Figure 23.  
Figure 24.  
Spurious Free Dynamic Range  
Signal-to-Noise Ratio  
vs  
vs  
Clock Level  
Clock Level  
70  
69  
68  
67  
66  
65  
64  
63  
62  
61  
60  
78  
f
= 100 MHz  
IN  
76  
74  
72  
70  
68  
66  
64  
62  
60  
f
= 230 MHz  
IN  
f
= 230 MHz  
IN  
f
= 100 MHz  
IN  
f
S
= 250 MSPS  
f
= 250 MSPS  
S
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
Clock Amplitude − V  
Clock Amplitude − V  
P−P  
P−P  
G026  
G025  
Figure 25.  
Figure 26.  
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TYPICAL CHARACTERISTICS (continued)  
Performance  
Spurious Free Dynamic Range  
vs  
AVDD Across Temperature  
vs  
Clock Common Mode Level  
80  
74  
73  
72  
71  
70  
69  
68  
f
S
= 250 MSPS  
T
A
= 65°C  
75  
70  
65  
60  
55  
50  
SFDR  
SNR  
T = −40°C  
A
T
A
= 25°C  
T
A
= 0°C  
T
A
= 85°C  
f
f
= 250 MSPS  
= 100 MHz  
S
IN  
0
1
2
3
4
5
4.65 4.75 4.85 4.95 5.05 5.15 5.25 5.35  
Clock Common-Mode Voltage − V  
AV − Supply Voltage − V  
DD  
G027  
G028  
Figure 27.  
Figure 28.  
Signal-to-Noise Ratio  
vs  
AVDD Across Temperature  
Spurious Free Dynamic Range  
vs  
DRVDD Across Temperature  
72.5  
72.0  
71.5  
71.0  
70.5  
70.0  
69.5  
69.0  
70.0  
69.5  
69.0  
68.5  
68.0  
67.5  
67.0  
T = −40°C  
f
= 250 MSPS  
= 100 MHz  
A
S
f
IN  
T = 65°C  
A
T = 25°C  
A
T = −40°C  
A
T = 0°C  
A
T = 0°C  
A
T = 25°C  
A
T = 85°C  
A
T = 65°C  
A
f
f
= 250 MSPS  
= 100 MHz  
S
T = 85°C  
A
IN  
2.9  
3.1  
3.3  
3.5  
3.7  
4.65 4.75 4.85 4.95 5.05 5.15 5.25 5.35  
DRV − Supply Voltage − V  
DD  
AV − Supply Voltage − V  
DD  
G030  
G029  
Figure 29.  
Figure 30.  
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TYPICAL CHARACTERISTICS (continued)  
Signal-to-Noise Ratio  
vs  
DRVDD Across Temperature  
69.0  
f
f
= 250 MSPS  
= 100 MHz  
S
T
A
= 25°C  
IN  
T
A
= 65°C  
68.9  
68.8  
68.7  
68.6  
68.5  
68.4  
T
A
= 85°C  
T
= 0°C  
A
T
A
= −40°C  
2.9  
3.0  
3.1  
3.2  
3.3  
3.4  
3.5  
3.6  
3.7  
DRV − Supply Voltage − V  
DD  
G031  
Figure 31.  
SNR  
vs  
Input Frequency and Sampling Frequency  
300  
250  
200  
69.5  
69  
150  
100  
50  
68.5  
68  
67.5  
67  
66.5  
66  
65.5  
50  
100  
150  
200  
250  
300  
350  
400  
fIN - Input Frequency - MHz  
63  
64  
65  
66  
67  
68  
69  
SNR - dBc  
M0048-05  
Figure 32.  
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TYPICAL CHARACTERISTICS (continued)  
SFDR  
vs  
Input Frequency and Sampling Frequency  
300  
68  
65  
71  
68  
68  
74  
71  
74  
250  
200  
150  
100  
50  
80  
86  
83  
77  
77  
80  
68  
77  
80  
83  
71  
74  
89  
83  
86  
83  
77  
89  
86  
80  
68  
89  
71  
74  
300  
50  
100  
150  
200  
250  
350  
400  
fIN - Input Frequency - MHz  
75  
65  
70  
80  
85  
SFDR - dBc  
M0048-06  
Figure 33.  
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APPLICATION INFORMATION  
Theory of Operation  
The ADS5444 is a 13-bit, 250-MSPS, monolithic pipeline analog-to-digital converter (ADC). Its bipolar analog  
core operates from a 5 V supply, while the output uses a 3.3-V supply to provide LVDS compatible outputs. The  
conversion process is initiated by the rising edge of the external input clock. At that instant, the differential input  
signal is captured by the input track and hold (T&H) and the input sample is sequentially converted by a series  
of small resolution stages, with the outputs combined in a digital correction logic block. Both the rising and the  
falling clock edges are used to propagate the sample through the pipeline every half clock cycle. This process  
results in a data latency of four clock cycles, after which the output data is available as a 13-bit parallel word,  
coded in offset binary format.  
Input Configuration  
The analog input for the ADS5444 consists of an analog differential buffer followed by a bipolar T&H. The  
analog buffer isolates the source driving the input of the ADC from any internal switching. The input common  
mode is set internally through a 500-resistor connected from 2.4 V to each of the inputs. This results in a  
differential input impedance of 1 k.  
For a full-scale differential input, each of the differential lines of the input signal (pins 16 and 17) swings  
symmetrically between 2.4 + 0.55 V and 2.4 – 0.55 V. This means that each input has a maximum signal swing  
of 1.1 VPP for a total differential input signal swing of 2.2 VPP. The maximum swing is determined by the internal  
reference voltage generator eliminating the need for any external circuitry for this purpose.  
The ADS5444 obtains optimum performance when the analog inputs are driven differentially. The circuit in  
Figure 34 shows one possible configuration using an RF transformer with termination either on the primary or on  
the secondary of the transformer. If voltage gain is required, a step up transformer can be used. For voltage  
gains that would require an impractical transformer turn ratio, a single-ended amplifier driving the transformer is  
shown in Figure 35).  
Z
50 W  
R
50 W  
0
0
AIN  
1 : 1  
R
50 W  
ADS5444  
AC Signal  
Source  
AIN  
ADT1-1WT  
Figure 34. Converting a Single-Ended Input to a Differential Signal Using RF Transformers  
5 V  
−5 V  
R
100  
S
0.1 µF  
+
V
IN  
R
R
1:1  
IN  
AIN  
ADS5444  
AIN  
OPA695  
R
100 Ω  
T
C
IN  
IN  
1000 µF  
R
1
400 Ω  
A
V
= 8V/V  
R
2
(18 dB)  
57.5 Ω  
Figure 35. Using the OPA695 With the ADS5444  
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Application Information (continued)  
V
IN  
From  
50  
Source  
100 Ω  
348 Ω  
+5V  
13-Bit  
250 MSPS  
78.9 Ω  
49.9 Ω  
49.9 Ω  
0.22 µF  
100 Ω  
A
IN  
18 pF  
ADS5444  
THS4509  
CM  
A
IN  
V
REF  
49.9 Ω  
78.9 Ω  
49.9 Ω  
0.22 µF  
0.22 µF  
0.1 µF  
0.1 µF  
348 Ω  
Figure 36. Using the THS4509 With the ADS5444  
Besides the OPA695, TI offers a wide selection of single-ended operational amplifiers that can be selected  
depending on the application. An RF gain block amplifier, such as the TI THS9001, can also be used with an RF  
transformer for high input frequency applications. For applications requiring dc-coupling with the signal source, a  
differential input/differential output amplifier like the THS4509 (see Figure 36) is a good solution, as it minimizes  
board space and reduces the number of components.  
In this configuration, the THS4509 amplifier circuit provides 10 dB of gain, converts the single-ended input to  
differential, and sets the proper input common-mode voltage to the ADS5444.  
The 50-resistors and 18-pF capacitor between the THS4509 outputs and ADS5444 inputs (along with the  
input capacitance of the ADC) limit the bandwidth of the signal to about 70 MHz (–3 dB).  
Input termination is accomplished via the 78.9-resistor and 0.22-µF capacitor to ground in conjunction with the  
input impedance of the amplifier circuit. A 0.22-µF capacitor and 49.9-resistor is inserted to ground across the  
78.9-resistor and 0.22-µF capacitor on the alternate input to balance the circuit.  
Gain is a function of the source impedance, termination, and 348-feedback resistor. See the THS4509 data  
sheet for further component values to set proper 50-termination for other common gains.  
Since the ADS5444 recommended input common-mode voltage is 2.4 V, the THS4509 is operated from a single  
power supply input with VS+ = 5 V and VS– = 0 V (ground). This maintains maximum headroom on the internal  
transistors of the THS4509.  
Clock Inputs  
The ADS5444 clock input can be driven with either a differential clock signal or a single-ended clock input, with  
little or no difference in performance between both configurations. In low input frequency applications, where  
jitter may not be a big concern, the use of single-ended clock (see Figure 37) could save some cost and board  
space without any trade-off in performance. When driven on this configuration, it is best to connect CLK to  
ground with a 0.01 µF capacitor, while CLK is ac-coupled with a 0.01-µF capacitor to the clock source, as shown  
in Figure 37.  
CLK  
Square Wave or  
Sine Wave  
0.01 µF  
0.01 µF  
ADS5444  
CLK  
Figure 37. Single-Ended Clock  
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Application Information (continued)  
0.1 µF  
1:4  
Clock  
Source  
CLK  
ADS5444  
CLK  
MA3X71600LCT−ND  
Figure 38. Differential Clock  
For jitter-sensitive applications, the use of a differential clock has some advantages (as with any other ADC) at  
the system level. The first advantage is that it allows for common-mode noise rejection at the PCB level.  
A differential clock also allows for the use of bigger clock amplitudes without exceeding the absolute maximum  
ratings. In the case of a sinusoidal clock, this results in higher slew rates and reduces the impact of clock noise  
on jitter. See Clocking High Speed Data Converters (SLYT075) for more details.  
Figure 38 shows this approach. The back-to-back Schottky diodes can be added to limit the clock amplitude in  
cases where this would exceed the absolute maximum ratings, even when using a differential clock.  
100 nF  
MC100EP16DT  
Q
100 nF  
100 nF  
CLK  
D
D
V
Q
ADS5444  
CLK  
BB  
100 nF  
499 W  
499 W  
50  
50 Ω  
100 nF  
113 Ω  
Figure 39. Differential Clock Using PECL Logic  
Another possibility is the use of a logic based clock, such as PECL. In this case, the slew rate of the edges will  
most likely be much higher than the one obtained for the same clock amplitude based on a sinusoidal clock.  
This solution would minimize the effect of the slope dependent ADC jitter. Using logic gates to square a  
sinusoidal clock may not produce the best results as logic gates may not have been optimized to act as  
comparators, adding too much jitter while squaring the inputs.  
The common-mode voltage of the clock inputs is set internally to 2.4 V using internal 1-kresistors. It is  
recommended to use ac coupling, but if this scheme is not possible due to, for instance, asynchronous clocking,  
the ADS5444 features good tolerance to clock common-mode variation.  
Additionally, the internal ADC core uses both edges of the clock for the conversion process. Ideally, a 50% duty  
cycle clock signal should be provided.  
Digital Outputs  
The ADC provides 13 data outputs (D12 to D0, with D12 being the MSB and D0 the LSB), a data-ready signal  
(DRY), and an over-range indicator (OVR) that equals a logic high when the output reaches the full-scale limits.  
The output format is offset binary. It is recommended to use the DRY signal to capture the output data of the  
ADS5444.  
The ADS5444 digital outputs are LVDS compatible.  
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Application Information (continued)  
Power Supplies  
The use of low noise power supplies with adequate decoupling is recommended. Linear supplies are the  
preferred choice versus switched ones, which tend to generate more noise components that can be coupled to  
the ADS5444.  
The ADS5444 uses two power supplies. For the analog portion of the design, a 5-V AVDD is used, while for the  
digital outputs supply (DRVDD) we recommend the use of 3.3 V. All the ground pins are marked as GND,  
although AGND pins and DRGND pins are not tied together inside the package.  
Layout Information  
The evaluation board represents a good guideline of how to layout the board to obtain the maximum  
performance out of the ADS5444. General design rules as the use of multilayer boards, single ground plane for  
ADC ground connections and local decoupling ceramic chip capacitors should be applied. The input traces  
should be isolated from any external source of interference or noise including the digital outputs, as well as the  
clock traces. The clock signal traces should also be isolated from other signals, especially in applications where  
low jitter is required as high IF sampling.  
Besides performance oriented rules, care has to be taken when considering the heat dissipation out of the  
device. The thermal heatsink should be soldered to the board as described in the PowerPad Package section.  
PowerPAD Package  
The PowerPAD package is a thermally-enhanced standard size IC package designed to eliminate the use of  
bulky heatsinks and slugs traditionally used in thermal packages. This package can be easily mounted using  
standard printed circuit board (PCB) assembly techniques, and can be removed and replaced using standard  
repair procedures.  
The PowerPAD package is designed so that the leadframe die pad (or thermal pad) is exposed on the bottom of  
the IC. This provides an extremely low thermal resistance path between the die and the exterior of the package.  
The thermal pad on the bottom of the IC can then be soldered directly to the PCB using the PCB as a heatsink.  
Assembly Process  
1. Prepare the PCB top-side etch pattern including etch for the leads, as well as the thermal pad as illustrated  
in the Mechanical Data section.  
2. Place a 6-by-6 array of thermal vias in the thermal pad area. These holes should be 13 mils in diameter.  
The small size prevents wicking of the solder through the holes.  
3. It is recommended to place a small number of 25-mil diameter holes under the package, but outside the  
thermal pad area to provide an additional heat path.  
4. Connect all holes (both those inside and outside the thermal pad area) to an internal copper plane (such as  
a ground plane).  
5. Do not use the typical web or spoke via connection pattern when connecting the thermal vias to the ground  
plane. The spoke pattern increases the thermal resistance to the ground plane.  
6. The top-side solder mask should leave exposed the terminals of the package and the thermal pad area.  
7. Cover the entire bottom side of the PowerPAD vias to prevent solder wicking.  
8. Apply solder paste to the exposed thermal pad area and all of the package terminals.  
For more detailed information regarding the PowerPAD package and its thermal properties, see either the  
SLMA004 application brief, PowerPAD Made Easy, or the technical brief, PowerPAD Thermally Enhanced  
Package (SLMA002).  
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PACKAGE OPTION ADDENDUM  
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PACKAGING INFORMATION  
Orderable Device  
ADS5444MPFPEP  
V62/06668-01XE  
Status (1)  
ACTIVE  
ACTIVE  
Package Package  
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)  
Qty  
Type  
Drawing  
HTQFP  
PFP  
80  
96 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
HTQFP  
PFP  
80  
96 Green (RoHS & CU NIPDAU Level-3-260C-168 HR  
no Sb/Br)  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in  
a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2)  
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check  
http://www.ti.com/productcontent for the latest availability information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements  
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered  
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and  
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS  
compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame  
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)  
(3)  
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder  
temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is  
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the  
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Catalog: ADS5444  
Space: ADS5444-SP  
NOTE: Qualified Version Definitions:  
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Space - Radiation tolerant, ceramic packaging and qualified for use in Space-based application  
Addendum-Page 1  
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