CD74HC86M [TI]

High Speed CMOS Logic Quad 2-Input EXCLUSIVE OR Gate; 高速CMOS逻辑四路2输入异或门
CD74HC86M
型号: CD74HC86M
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

High Speed CMOS Logic Quad 2-Input EXCLUSIVE OR Gate
高速CMOS逻辑四路2输入异或门

栅极
文件: 总6页 (文件大小:47K)
中文:  中文翻译
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CD74HC86,  
CD74HCT86  
Data sheet acquired from Harris Semiconductor  
SCHS137  
High Speed CMOS Logic  
August 1997  
Quad 2-Input EXCLUSIVE OR Gate  
Features  
Description  
• Typical Propagation Delay: 9ns at V  
o
= 5V,  
The Harris CD74HC86, CD74HCT86 contain four  
independent EXCLUSIVE OR gates in one package. They  
CC  
C = 15pF, T = 25 C  
L
A
[ /Title  
(CD74  
HC86,  
CD74  
HCT86  
)
provide the system designer with  
a
means for  
• Fanout (Over Temperature Range)  
- Standard Outputs. . . . . . . . . . . . . . . 10 LSTTL Loads  
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads  
implementation of the EXCLUSIVE OR function. Logic gates  
utilize silicon gate CMOS technology to achieve operating  
speeds similar to LSTTL gates with the low power  
consumption of standard CMOS integrated circuits. All  
devices have the ability to drive 10 LSTTL loads. The 74HCT  
logic family is functionally pin compatible with the standard  
74LS logic family.  
o
o
• Wide Operating Temperature Range . . . -55 C to 125 C  
• Balanced Propagation Delay and Transition Times  
• Significant Power Reduction Compared to LSTTL  
Logic ICs  
/Sub-  
ject  
Ordering Information  
• HC Types  
(High  
Speed  
CMOS  
Logic  
Quad  
2-Input  
EXCL  
USIVE  
OR  
- 2V to 6V Operation  
TEMP. RANGE  
PKG.  
NO.  
- High Noise Immunity: N = 30%, N = 30% of V  
IL IH CC  
o
PART NUMBER  
CD74HC86E  
( C)  
PACKAGE  
14 Ld PDIP  
14 Ld PDIP  
14 Ld SOIC  
14 Ld SOIC  
Wafer  
at V  
= 5V  
CC  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
E14.3  
• HCT Types  
- 4.5V to 5.5V Operation  
- Direct LSTTL Input Logic Compatibility,  
CD74HCT86E  
CD74HC86M  
CD74HCT86M  
CD54HC86W  
CD54HCT86W  
CD54HC86H  
E14.3  
M14.15  
M14.15  
V = 0.8V (Max), V = 2V (Min)  
IL IH  
- CMOS Input Compatibility, I 1µA at V , V  
OL OH  
l
Applications  
Wafer  
• Logical Comparators  
Die  
• Parity Generators and Checkers  
• Adders and Subtractors  
NOTE: When ordering, use the entire part number. Add the suffix 96  
to obtain the variant in the tape and reel.  
Pinout  
CD74HC86, CD74HCT86  
(PDIP, SOIC)  
TOP VIEW  
1A  
1B  
1
2
3
4
5
6
7
14 V  
CC  
13 4B  
12 4A  
11 4Y  
10 3B  
1Y  
2A  
2B  
2Y  
9
8
3A  
3Y  
GND  
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.  
File Number 1644.1  
Copyright © Harris Corporation 1997  
1
CD74HC86, CD74HCT86  
Functional Diagram  
14  
13  
12  
11  
10  
9
1
2
3
4
5
6
7
V
1A  
1B  
CC  
4B  
4A  
4Y  
3B  
3A  
3Y  
1Y  
2A  
2B  
2Y  
8
GND  
TRUTH TABLE  
INPUTS  
OUTPUT  
nA  
L
nB  
L
nY  
L
L
H
L
H
H
L
H
H
H
NOTE: H = High Voltage Level, L = Low Voltage Level  
Logic Symbol  
nA  
nB  
nY  
2
CD74HC86, CD74HCT86  
Absolute Maximum Ratings  
Thermal Information  
o
DC Supply Voltage, V  
. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V  
Thermal Resistance (Typical, Note 1)  
θ
( C/W)  
CC  
DC Input Diode Current, I  
For V < -0.5V or V > V  
JA  
IK  
PDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
SOIC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
100  
180  
+ 0.5V. . . . . . . . . . . . . . . . . . . . . .±20mA  
OK  
For V < -0.5V or V > V  
I
I
CC  
o
DC Output Diode Current, I  
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150 C  
Maximum Storage Temperature Range . . . . . . . . . .-65 C to 150 C  
Maximum Lead Temperature (Soldering 10s). . . . . . . . . . . . . 300 C  
o
o
+ 0.5V . . . . . . . . . . . . . . . . . . . .±20mA  
O
O
CC  
o
DC Output Source or Sink Current per Output Pin, I  
O
For V > -0.5V or V < V  
+ 0.5V . . . . . . . . . . . . . . . . . . . .±25mA  
O
O
CC  
(SOIC - Lead Tips Only)  
DC V  
or Ground Current, I  
I
. . . . . . . . . . . . . . . . . .±50mA  
CC  
CC or GND  
Operating Conditions  
o
o
Temperature Range (T ) . . . . . . . . . . . . . . . . . . . . . -55 C to 125 C  
A
Supply Voltage Range, V  
CC  
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V  
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V  
DC Input or Output Voltage, V , V . . . . . . . . . . . . . . . . . 0V to V  
I
O
CC  
Input Rise and Fall Time  
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)  
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)  
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)  
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation  
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTE:  
1. θ is measured with the component mounted on an evaluation PC board in free air.  
JA  
DC Electrical Specifications  
TEST  
CONDITIONS  
o
o
o
o
o
25 C  
-40 C TO +85 C -55 C TO 125 C  
PARAMETER  
HC TYPES  
SYMBOL V (V)  
I
(mA)  
V
(V) MIN TYP MAX  
MIN  
MAX  
MIN  
MAX  
UNITS  
I
O
CC  
High Level Input  
Voltage  
V
-
-
-
2
1.5  
3.15  
4.2  
-
-
-
-
-
-
-
-
-
-
-
-
-
1.5  
3.15  
4.2  
-
-
1.5  
3.15  
4.2  
-
-
V
V
V
V
V
V
V
V
V
V
V
IH  
4.5  
-
-
-
6
2
-
-
-
Low Level Input  
Voltage  
V
-
0.5  
0.5  
0.5  
IL  
4.5  
6
-
1.35  
-
1.35  
-
1.35  
-
1.8  
-
1.8  
-
1.8  
High Level Output  
Voltage  
CMOS Loads  
V
V
or  
-0.02  
2
1.9  
4.4  
5.9  
3.98  
5.48  
-
-
-
-
-
1.9  
4.4  
5.9  
3.84  
5.34  
-
-
-
-
-
1.9  
4.4  
5.9  
3.7  
5.2  
-
-
-
-
-
OH  
IH  
V
IL  
-0.02  
-0.02  
-4  
4.5  
6
High Level Output  
Voltage  
TTL Loads  
4.5  
6
-5.2  
Low Level Output  
Voltage  
CMOS Loads  
V
V
V
or  
0.02  
0.02  
0.02  
4
2
4.5  
6
-
-
-
-
-
-
-
-
-
-
0.1  
0.1  
-
-
-
-
-
0.1  
0.1  
-
-
-
-
-
0.1  
0.1  
0.1  
0.4  
0.4  
V
V
V
V
V
OL  
IH  
IL  
0.1  
0.1  
Low Level Output  
Voltage  
TTL Loads  
4.5  
6
0.26  
0.26  
0.33  
0.33  
5.2  
Input Leakage  
Current  
I
V
or  
-
6
6
-
-
-
-
±0.1  
-
-
±1  
-
-
±1  
µA  
µA  
I
CC  
GND  
Quiescent Device  
Current  
I
V
or  
0
2
20  
40  
CC  
CC  
GND  
3
CD74HC86, CD74HCT86  
DC Electrical Specifications (Continued)  
TEST  
o
o
o
o
o
CONDITIONS  
25 C  
-40 C TO +85 C -55 C TO 125 C  
PARAMETER  
HCT TYPES  
SYMBOL V (V)  
I
(mA)  
V (V) MIN TYP MAX  
CC  
MIN  
MAX  
MIN  
MAX  
UNITS  
I
O
High Level Input  
Voltage  
V
-
-
-
-
4.5 to  
5.5  
2
-
-
-
-
-
0.8  
-
2
-
-
0.8  
-
2
-
-
0.8  
-
V
V
V
IH  
Low Level Input  
Voltage  
V
4.5 to  
5.5  
IL  
High Level Output  
Voltage  
CMOS Loads  
V
V
V
or  
-0.02  
4.5  
4.5  
4.5  
4.5  
5.5  
5.5  
4.4  
4.4  
4.4  
OH  
IH  
V
IL  
High Level Output  
Voltage  
TTL Loads  
-4  
3.98  
-
-
-
-
3.84  
-
3.7  
-
V
V
Low Level Output  
Voltage  
CMOS Loads  
V
or  
-0.02  
-
-
-
0.1  
-
-
-
0.1  
0.33  
±1  
-
-
-
0.1  
0.4  
±1  
OL  
IH  
V
IL  
Low Level Output  
Voltage  
TTL Loads  
4
0
0.26  
±0.1  
V
Input Leakage  
Current  
I
V
µA  
I
CC  
and  
GND  
Quiescent Device  
Current  
I
V
or  
0
-
-
-
-
2
-
-
20  
-
-
40  
µA  
µA  
CC  
CC  
GND  
Additional Quiescent  
Device Current Per  
Input Pin: 1 Unit Load  
(Note 2)  
I  
CC  
V
4.5 to  
5.5  
100  
360  
450  
490  
CC  
-2.1  
NOTE:  
2. For dual-supply systems theorectical worst case (V = 2.4V, V  
I
= 5.5V) specification is 1.8mA.  
CC  
HCT Input Loading Table  
INPUT  
All  
UNIT LOADS  
1
NOTE: Unit Load is I  
Specifications table, e.g. 360µA max at 25 C.  
limit specified in DC Electrical  
o
CC  
Switching Specifications Input t , t = 6ns  
r
f
o
o
o
o
o
25 C  
-40 C TO 85 C -55 C TO 125 C  
TEST  
V
CC  
PARAMETER  
HC TYPES  
SYMBOL CONDITIONS (V)  
MIN TYP MAX  
MIN  
MAX  
MIN  
MAX  
UNITS  
Propagation Delay,Input to  
Output (Figure 1)  
t
, t  
PLH PHL  
C = 50pF  
2
4.5  
6
-
-
-
-
-
-
120  
24  
20  
-
-
-
-
-
150  
30  
26  
-
-
-
-
-
180  
36  
31  
-
ns  
ns  
ns  
ns  
L
-
Propagation Delay, Data Input to  
Output Y  
t , t  
PLH PHL  
C = 15pF  
5
9
L
Transition Times (Figure 1)  
t
, t  
TLH THL  
C = 50pF  
2
4.5  
6
-
-
-
-
-
-
75  
15  
13  
-
-
-
95  
19  
16  
-
-
-
110  
22  
ns  
ns  
ns  
L
19  
4
CD74HC86, CD74HCT86  
Switching Specifications Input t , t = 6ns (Continued)  
r
f
o
o
o
o
o
25 C  
-40 C TO 85 C -55 C TO 125 C  
TEST  
V
CC  
PARAMETER  
Input Capacitance  
SYMBOL CONDITIONS (V)  
MIN TYP MAX  
MIN  
MAX  
10  
-
MIN  
MAX  
10  
-
UNITS  
pF  
C
-
-
-
-
-
-
10  
-
-
-
-
-
I
Power Dissipation Capacitance  
(Notes 3, 4)  
C
5
22  
pF  
PD  
HCT TYPES  
Propagation Delay, Input to  
Output (Figure 2)  
t
, t  
PLH PHL  
C = 50pF  
4.5  
5
-
-
-
32  
-
-
-
40  
-
-
-
48  
-
ns  
ns  
L
Propagation Delay, Data Input to  
Output Y  
t , t  
PLH PHL  
C = 15pF  
13  
L
Transition Times (Figure 2)  
Input Capacitance  
t
, t  
TLH THL  
C = 50pF  
L
4.5  
-
-
-
-
-
-
15  
10  
-
-
-
-
19  
10  
-
-
-
-
22  
10  
-
ns  
pF  
pF  
C
-
-
I
Power Dissipation Capacitance  
(Notes 3, 4)  
C
5
27  
PD  
NOTES:  
3. C  
is used to determine the dynamic power consumption, per gate.  
2
PD  
4. P = V  
f (C  
PD  
+ C ) where f = input frequency, C = output load capacitance, V = supply voltage.  
CC  
D
CC  
i
L
i
L
Test Circuits and Waveforms  
t = 6ns  
t = 6ns  
f
t = 6ns  
f
t = 6ns  
r
r
V
3V  
CC  
90%  
50%  
10%  
2.7V  
1.3V  
0.3V  
INPUT  
INPUT  
t
GND  
GND  
t
t
TLH  
t
THL  
THL  
TLH  
90%  
50%  
10%  
90%  
1.3V  
INVERTING  
OUTPUT  
INVERTING  
OUTPUT  
10%  
t
t
PLH  
t
t
PHL  
PLH  
PHL  
FIGURE 1. HC AND HCU TRANSITION TIMES AND PROPAGA-  
TION DELAY TIMES, COMBINATION LOGIC  
FIGURE 2. HCT TRANSITION TIMES AND PROPAGATION  
DELAY TIMES, COMBINATION LOGIC  
5
IMPORTANT NOTICE  
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any product or service without notice, and advise customers to obtain the latest version of relevant information  
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pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
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safeguards must be provided by the customer to minimize inherent or procedural hazards.  
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Copyright 1998, Texas Instruments Incorporated  

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