DRV8316 [TI]

DRV8316 Three-Phase Integrated FET Motor Driver;
DRV8316
型号: DRV8316
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

DRV8316 Three-Phase Integrated FET Motor Driver

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DRV8316  
SLVSF16 – JANUARY 2021  
DRV8316 Three-Phase Integrated FET Motor Driver  
1 Features  
3 Description  
Three-phase PWM motor driver  
– 3-Phase Brushless-DC motors  
4.5-V to 35-V operating voltage  
– 40-V Absolute maximum voltage  
High output current capability  
– 8-A Peak current drive  
Low on-state resistance  
– 95-mΩ RDS(ON) (HS + LS) at TA = 25°C  
Low power sleep mode  
– 1.5-µA at VVM = 24-V, TA = 25°C  
Multiple control interface options  
– 6x PWM control interface  
The DRV8316 provides three half-H-bridge integrated  
MOSFET drivers for driving a three-phase Brushless-  
DC (BLDC) motor for 12-V/24-V DC rails or battery  
powered applications. These applications include  
field-oriented control (FOC), sinusoidal current  
control, and trapezoidal current control of BLDC  
motors. The device integrates three current-sense  
amplifiers (CSA) with built-in current sense for  
sensing the three phase currents of BLDC motors.  
Each output driver channel consists of N-channel  
power MOSFETs configured in  
a
half-bridge  
configuration. Various PWM control modes are  
supported for simple interfacing to control circuits that  
can be powered by the 30-mA, 3.3-V internal  
regulator (AVDD). The DRV8316R/T also supports a  
buck regulator which in conjunction can support 200-  
mA with programmable regulated supply. The device  
supports 200-kHz maximum PWM frequency.  
– 3x PWM control interface  
Supports 200-kHz PWM frequency  
Cycle by cycle current limit  
Built-in integrated current sense  
– No external resistor required  
SPI and Hardware device variants  
– 5-MHz, 16-Bit SPI communication  
Supports 1.8-V, 3.3-V, and 5-V logic inputs  
Built-in 3.3-V, 30-mA LDO regulator  
Built-in 3.3-V/5-V, 200-mA buck regulator  
Delay compensation to reduce duty cycle distortion  
Integrated protection features  
– VM undervoltage lockout (UVLO)  
– Charge pump undervoltage (CPUV)  
– Overcurrent protection (OCP)  
– Thermal warning and shutdown (OTW/OTSD)  
– Fault condition indication pin (nFAULT)  
Internal protection functions are provided for  
undervoltage lockout (UVLO), Overvoltage protection  
(OVP), charge pump undervoltage (CPUV),  
overcurrent protection (OCP), over-temperature  
warning (OTW) and over-temperature shutdown  
(OTSD). Fault conditions are indicated by the nFAULT  
pin.  
Device Information (1)  
PART NUMBER  
DRV8316R  
PACKAGE  
VQFN (40)  
VQFN (40)  
BODY SIZE (NOM)  
7.00 mm x 5.00 mm  
7.00 mm x 5.00 mm  
DRV8316T (2)  
(1) For all available packages, see the orderable addendum at  
the end of the data sheet.  
2 Applications  
(2) Device available for preview only.  
CPAP machines  
Printers  
Camera gimbals  
HVAC motors  
Office automation machines  
Factory automation and robotics  
4.5 V to 35 V  
DRV8316T/R  
OUTA  
nSLEEP  
Three Phase PWM  
Motor Driver  
PWM (6x/3x)  
M
HW / SPI  
Buck Regulator (R)  
3x Shunt Amplifier  
Built-In Protection  
OUTB  
CSA Output  
nFAULT  
OUTC  
Simplified Schematic  
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. ADVANCE INFORMATION for preproduction products; subject to change  
without notice.  
 
 
 
 
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Table of Contents  
1 Features............................................................................1  
2 Applications.....................................................................1  
3 Description.......................................................................1  
4 Revision History.............................................................. 2  
5 Device Comparison Table ..............................................3  
6 Pin Configuration and Functions...................................4  
Pin Functions.................................................................... 6  
7 Specifications.................................................................. 8  
7.1 Absolute Maximum Ratings ....................................... 8  
7.2 ESD Ratings .............................................................. 8  
7.3 Recommended Operating Conditions ........................8  
7.4 Thermal Information ...................................................9  
7.5 Electrical Characteristics ............................................9  
7.6 SPI Timing Requirements ........................................ 16  
7.7 SPI Slave Mode Timings...........................................16  
8 Detailed Description......................................................17  
8.1 Overview...................................................................17  
8.2 Functional Block Diagram.........................................18  
8.3 Feature Description...................................................20  
8.4 Device Functional Modes..........................................54  
8.5 SPI Communication.................................................. 55  
8.6 Register Map.............................................................56  
9 Application and Implementation..................................69  
9.1 Application Information............................................. 69  
9.2 Typical Applications.................................................. 70  
10 Power Supply Recommendations..............................75  
10.1 Bulk Capacitance....................................................75  
11 Layout...........................................................................76  
11.1 Layout Guidelines................................................... 76  
11.2 Layout Example...................................................... 77  
11.3 Thermal Considerations..........................................78  
12 Device and Documentation Support..........................79  
12.1 Support Resources................................................. 79  
12.2 Trademarks.............................................................79  
12.3 Electrostatic Discharge Caution..............................79  
12.4 Glossary..................................................................79  
13 Mechanical, Packaging, and Orderable  
Information.................................................................... 79  
4 Revision History  
DATE  
REVISION  
NOTES  
January 2021  
*
Initial release.  
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5 Device Comparison Table  
DEVICE  
PACKAGES  
40-pin VQFN (7x5 mm)  
INTERFACE  
SPI  
BUCK REGULATOR  
DRV8316R  
Yes  
DRV8316T(1)  
Hardware  
(1) Device available for preview only.  
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6 Pin Configuration and Functions  
1
2
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
INLC  
NC  
AGND  
FB_BK  
GND_BK  
SW_BK  
CPL  
INHC  
3
INLB  
4
INHB  
INLA  
5
6
INHA  
DRV8316R  
(PowerPAD)  
CPH  
7
AGND  
AVDD  
NC  
CP  
8
VM  
9
VM  
10  
11  
12  
nSLEEP  
nFAULT  
DRVOFF  
VM  
PGND  
Figure 6-1. DRV8316R 40-Pin VQFN With Exposed Thermal Pad Top View  
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NC  
AGND  
FB_BK  
GND_BK  
SW_BK  
CPL  
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
INLC  
1
2
INHC  
3
INLB  
4
INHB  
INLA  
5
6
INHA  
DRV8316T  
(PowerPAD)  
CPH  
7
AGND  
AVDD  
VSEL_BK  
nSLEEP  
nFAULT  
DRVOFF  
CP  
8
VM  
9
VM  
10  
11  
12  
VM  
PGND  
Figure 6-2. DRV8316T 40-Pin VQFN With Exposed Thermal Pad Top View  
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Pin Functions  
PIN  
40-pin Package  
TYPE  
DESCRIPTION  
NAME  
DRV8316R  
DRV8316T  
AGND  
2, 26  
2, 26  
PWR  
Device analog ground. Connect to system ground.  
3.3 internal regulator output. Connect a X5R or X7R, 1-µF, 6.3-V ceramic  
capacitor between the AVDD1 and AGND pins. This regulator can source up  
to 30 mA externally.  
AVDD  
25  
25  
PWR  
Charge pump output. Connect a X5R or X7R, 1-µF, 16-V ceramic capacitor  
between the CP and VM pins.  
CP  
8
7
6
8
7
6
PWR  
PWR  
PWR  
Charge pump switching node. Connect a X5R or X7R, 47-nF, VM-rated  
ceramic capacitor between the CPH and CPL pins.  
CPH  
CPL  
Charge pump switching node. Connect a X5R or X7R, 47-nF, VM-rated  
ceramic capacitor between the CPH and CPL pins.  
DRVOFF  
FB_BK  
21  
3
21  
3
I
Disables all six MOSFETs.  
PWR  
Feedback for buck regulator. Connect output of buck regulator to this pin.  
Amplifier gain setting. The pin is a 4 level input pin set by an external resistor  
(Hardware devices).  
GAIN  
4
36  
4
I
PWR  
I
GND_BK  
INHA  
Buck regulator ground. Connect to system ground.  
High-side driver control input for OUTA. This pin controls the output of the  
high-side MOSFET.  
27  
27  
High-side driver control input for OUTB. This pin controls the output of the  
high-side MOSFET.  
INHB  
INHC  
INLA  
INLB  
INLC  
29  
31  
28  
30  
32  
29  
31  
28  
30  
32  
I
I
I
I
I
High-side driver control input for OUTC. This pin controls the output of the  
high-side MOSFET.  
Low-side driver control input for OUTA. This pin controls the output of the low-  
side MOSFET.  
Low-side driver control input for OUTB. This pin controls the output of the low-  
side MOSFET.  
Low-side driver control input for OUTC. This pin controls the output of the low-  
side MOSFET.  
PWM input mode setting. This pin is a 2 level input pin set by an external  
resistor (Hardware devices).  
MODE  
NC  
1, 24  
22  
33  
1
I
O
No Connect.  
Fault indication pin. Pulled logic-low with fault condition; open-drain output  
requires an external pullup.  
nFAULT  
22  
Serial chip select. A logic low on this pin enables serial interface  
communication (SPI devices).  
nSCS  
nSLEEP  
OCP  
36  
23  
23  
35  
I
I
I
Driver nSLEEP. When this pin is logic low the device goes to a low-power  
sleep mode. An 20 to 40-µs low pulse can be used to reset fault conditions.  
OCP level setting. This pin is a 2 level input pin set by an external resistor  
(Hardware devices).  
OUTA  
OUTB  
OUTC  
PGND  
13, 14  
16, 17  
13, 14  
16, 17  
O
O
Half bridge output A  
Half bridge output B  
19, 20  
19, 20  
O
Half bridge output C  
12, 15, 18  
12, 15, 18  
PWR  
Device power ground. Connect to system ground.  
Serial clock input. Serial data is shifted out and captured on the corresponding  
rising and falling edge on this pin.(SPI devices).  
SCLK  
35  
I
Serial data input. Data is captured on the falling edge of the SCLK pin (SPI  
devices).  
SDI  
34  
33  
40  
34  
40  
I
SDO  
SLEW  
SOA  
O
I
Serial data output. Data is shifted out on the rising edge of the SCLK pin.  
Slew rate control setting. This pin is a 4 level input pin set by an external  
resistor (Hardware devices).  
O
Current sense amplifier output.  
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PIN  
NAME  
SOB  
40-pin Package  
TYPE  
DESCRIPTION  
DRV8316R  
DRV8316T  
39  
38  
5
39  
38  
5
O
O
Current sense amplifier output.  
Current sense amplifier output.  
SOC  
SW_BK  
PWR  
Buck switch node. Connect this pin to an inductor or resistor.  
Current sense amplifier power supply input and reference. Connect a X5R or  
X7R, 0.1-µF, 6.3-V ceramic capacitor between the VREF and AGND pins.  
VREF/ILIM  
VM  
37  
9, 10, 11  
37  
9, 10, 11  
24  
PWR/I  
PWR  
I
Power supply. Connect to motor supply voltage; bypass to GND with two 0.1-  
µF capacitors (for each pin) plus one bulk capacitor rated for VM  
Buck output voltage setting. This pin is a 4 level input pin set by an external  
resistor (Hardware devices).  
VSEL_BK  
Thermal  
pad  
PWR  
Must be connected to ground  
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7 Specifications  
7.1 Absolute Maximum Ratings  
over operating ambient temperature range (unless otherwise noted)(1)  
MIN  
MAX UNIT  
Power supply pin voltage (VM)  
–0.3  
40  
4
V
V/µs  
V
Power supply voltage ramp (VM)  
Voltage difference between ground pins (GND_BK, PGND, AGND)  
Charge pump voltage (CPH, CP)  
–0.3  
–0.3  
–0.3  
–0.3  
–0.3  
–0.3  
–0.3  
–0.3  
–1  
0.3  
VM + 6  
VM + 0.3  
5.75  
V
Charge pump negative switching pin voltage (CPL)  
Switching regulator pin voltage (FB_BK)  
Switching node pin voltage (SW_BK)  
Analog regulators pin voltage (AVDD)  
Logic pin input voltage (DRVOFF, INHx, INLx, nSCS, nSLEEP, SCLK, SDI)  
Logic pin output voltage (nFAULT, SDO)  
Output pin voltage (OUTA, OUTB, OUTC)  
Ambient temperature, TA  
V
V
VM + 0.3  
5.75  
V
V
5.75  
V
5.75  
V
VM + 1  
125  
V
–40  
–40  
–65  
°C  
°C  
°C  
Junction temperature, TJ  
150  
Storage tempertaure, Tstg  
150  
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under  
Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device  
reliability.  
7.2 ESD Ratings  
VALUE  
±2000  
±500  
UNIT  
Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)  
Electrostatic  
discharge  
V(ESD)  
V
Charged device model (CDM), per JEDEC specification JESD22-C101(2)  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
7.3 Recommended Operating Conditions  
over operating ambient temperature range (unless otherwise noted)  
MIN  
NOM  
MAX UNIT  
VVM  
fPWM  
IOUT  
Power supply voltage  
VVM  
4.5  
24  
35  
200  
8
V
kHz  
A
Output PWM frequency  
Peak output winding current  
OUTA, OUTB, OUTC  
OUTA, OUTB, OUTC  
(1)  
DRVOFF, INHx, INLx, nSCS, nSLEEP,  
SCLK, SDI  
VIN  
Logic input voltage  
–0.1  
5.5  
V
VOD  
Open drain pullup voltage  
Push-pull voltage  
nFAULT, SDO  
SDO  
–0.1  
2.2  
5.5  
5.5  
V
V
VSDO  
IOD  
VVREF  
TA  
Open drain output current  
Voltage reference pin voltage  
Operating ambient temperature  
Operating Junction temperature  
nFAULT, SDO  
VREF  
5
mA  
V
2.8  
–40  
–40  
AVDD  
125  
150  
°C  
°C  
TJ  
(1) Power dissipation and thermal limits must be observed  
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7.4 Thermal Information  
DRV8316T, DRV8316R  
THERMAL METRIC(1)  
VQFN (RGF)  
40 Pins  
25.7  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
15.2  
7.3  
ΨJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
0.2  
ΨJB  
7.2  
RθJC(bot)  
2.0  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
7.5 Electrical Characteristics  
TJ = –40°C to +150°C, VVM = 4.5 to 35 V (unless otherwise noted). Typical limits apply for TA = 25°C, VVM = 24 V  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
POWER SUPPLIES  
VVM > 6 V, nSLEEP = 0, TA = 25 °C  
nSLEEP = 0  
0.6  
0.5  
1.5  
2.5  
2.5  
5
µA  
µA  
IVMQ  
VM sleep mode current  
nSLEEP = 1, INHx = INLx = 0, SPI =  
'OFF', BUCK_DIS = 1;  
2
2
3
3
4
4
mA  
mA  
VM standby mode current  
(Buck regulator disabled)  
IVMS  
VVM > 6 V, nSLEEP = 1, INHx = INLx =  
0, SPI = 'OFF', TA = 25 °C, BUCK_DIS =  
1;  
VVM > 6 V, nSLEEP = 1, INHx = INLx =  
0, SPI = 'OFF', IBK = 0, TA = 25  
°C, BUCK_DIS = 0;  
3
4
5
5
mA  
mA  
VM standby mode current  
(Buck regulator enabled)  
IVMS  
nSLEEP = 1, INHx = INLx = 0, SPI =  
'OFF', IBK = 0, BUCK_DIS = 0;  
3
10  
13  
10  
13  
4
11.5  
17  
VVM > 6 V, nSLEEP = 1, fPWM = 25 kHz,  
TA = 25 °C, BUCK_DIS = 1  
13 mA  
21 mA  
13 mA  
21 mA  
VVM > 6 V, nSLEEP = 1, fPWM = 200 kHz,  
TA = 25 °C, BUCK_DIS = 1  
VM operating mode current  
(Buck regulator disabled)  
IVM  
nSLEEP =1, fPWM = 25 kHz, BUCK_DIS  
= 1  
11.5  
17  
nSLEEP =1, fPWM = 200 kHz,  
BUCK_DIS = 1  
VVM > 6 V, nSLEEP = 1, fPWM = 25 kHz,  
TA = 25 °C, BUCK_DIS =  
0; BUCK_PS_DIS = 0  
6
mA  
mA  
VM operating mode current  
(Buck regulator enabled)  
IVM  
VVM > 6 V, nSLEEP = 1, fPWM = 200 kHz,  
TA = 25 °C, BUCK_DIS =  
13  
0; BUCK_PS_DIS = 0  
0 mA ≤ IAVDD ≤ 30 mA; BUCK_PS_DIS =  
0
VAVDD  
Analog regulator voltage  
3.135  
3.3  
3.465  
V
IAVDD  
VVCP  
fCP  
External analog regulator load  
Charge pump regulator voltage  
Charge pump switching frequency  
30 mA  
VCP with respect to VM  
4.7  
V
400  
kHz  
VVM > VUVLO, nSLEEP = 1 to outputs  
ready and nFAULT released  
tWAKE  
Wakeup time  
1
ms  
tSLEEP  
tRST  
Sleep Pulse time  
Reset Pulse time  
nSLEEP = 0 period to enter sleep mode  
nSLEEP = 0 period to reset faults  
120  
20  
µs  
µs  
40  
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MAX UNIT  
SLVSF16 – JANUARY 2021  
TJ = –40°C to +150°C, VVM = 4.5 to 35 V (unless otherwise noted). Typical limits apply for TA = 25°C, VVM = 24 V  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
BUCK REGULATOR  
VVM > 6 V, 0 mA ≤ IBK ≤ 200 mA,  
BUCK_SEL = 00b  
3.1  
4.6  
3.7  
5.2  
3.3  
5.0  
4.0  
5.7  
3.5  
5.4  
4.3  
6.2  
V
V
V
V
VVM > 6 V, 0 mA ≤ IBK ≤ 200 mA,  
BUCK_SEL = 01b  
Buck regulator average voltage  
(LBK = 47 µH, CBK = 22 µF)  
(SPI Device)  
VVM > 6 V, 0 mA ≤ IBK ≤ 200 mA,  
BUCK_SEL = 10b  
VBK  
VBK  
VBK  
VVM > 6.7 V, 0 mA ≤ IBK ≤ 200 mA,  
BUCK_SEL = 11b  
VVM < 6.0 V (BUCK_SEL = 00b, 01b,  
10b) or VVM < 6.0 V (BUCK_SEL = 11b),  
0 mA ≤ IBK ≤ 200 mA  
VBK–  
IBK*(RLBK  
+2)  
V
VVM > 6 V, 0 mA ≤ IBK ≤ 50 mA,  
BUCK_SEL = 00b  
3.1  
4.6  
3.7  
5.2  
3.3  
5.0  
4.0  
5.7  
3.5  
5.4  
4.3  
6.2  
V
V
V
V
VVM > 6 V, 0 mA ≤ IBK ≤ 50 mA,  
BUCK_SEL = 01b  
Buck regulator average voltage  
(LBK = 22 µH, CBK = 22 µF)  
(SPI Device)  
VVM > 6 V, 0 mA ≤ IBK ≤ 50 mA,  
BUCK_SEL = 10b  
VVM > 6.7 V, 0 mA ≤ IBK ≤ 50 mA,  
BUCK_SEL = 11b  
VVM < 6.0 V (BUCK_SEL = 00b, 01b,  
10b) or VVM < 6.0 V (BUCK_SEL = 11b),  
0 mA ≤ IBK ≤ 50 mA  
VBK–  
IBK*(RLBK  
+2)  
V
VVM > 6 V, 0 mA ≤ IBK ≤ 40 mA,  
BUCK_SEL = 00b  
3.1  
4.6  
3.7  
5.2  
3.3  
5.0  
4.0  
5.7  
3.5  
5.4  
4.3  
6.2  
V
V
V
V
VVM > 6 V, 0 mA ≤ IBK ≤ 40 mA,  
BUCK_SEL = 01b  
Buck regulator average voltage  
(RBK = 22 Ω, CBK = 22 µF)  
(SPI Device)  
VVM > 6 V, 0 mA ≤ IBK ≤ 40 mA,  
BUCK_SEL = 10b  
VVM > 6.7 V, 0 mA ≤ IBK ≤ 40 mA,  
BUCK_SEL = 11b  
VVM < 6.0 V (BUCK_SEL = 00b, 01b,  
10b) or VVM < 6.0 V (BUCK_SEL = 11b),  
0 mA ≤ IBK ≤ 40 mA  
VBK–  
IBK*(RBK  
+2)  
V
V
VVM > 6 V, 0 mA ≤ IBK ≤ 200 mA,  
VSEL_BK pin tied to AGND  
3.1  
4.6  
3.3  
5.0  
3.5  
5.4  
VVM > 6 V, 0 mA ≤ IBK ≤ 200  
mA, VSEL_BK pin to Hi-Z  
VVM > 6 V, 0 mA ≤ IBK ≤ 200  
mA, VSEL_BK pin to 47 kΩ +/- 5% tied  
to AVDD  
Buck regulator average voltage  
(LBK = 47 µH, CBK = 22 µF)  
(HW Device)  
3.7  
5.2  
4.0  
5.7  
4.3  
6.2  
VBK  
VVM > 6.7 V, 0 mA ≤ IBK ≤ 200 mA,  
VSEL_BK pin to AGND  
VBK  
VVM < 6.0 V, 0 mA ≤ IBK ≤ 200 mA  
IBK*(RLBK  
+2)  
V
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TJ = –40°C to +150°C, VVM = 4.5 to 35 V (unless otherwise noted). Typical limits apply for TA = 25°C, VVM = 24 V  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
VVM > 6 V, 0 mA ≤ IBK ≤ 50 mA,  
VSEL_BK pin tied to AGND  
3.1  
3.3  
3.5  
5.4  
V
V
VVM > 6 V, 0 mA ≤ IBK ≤ 50  
mA, VSEL_BK pin to Hi-Z  
4.6  
3.7  
5.2  
5.0  
4.0  
5.7  
VVM > 6 V, 0 mA ≤ IBK ≤ 50  
mA, VSEL_BK pin to 47 kΩ +/- 5% tied  
to AVDD  
Buck regulator average voltage  
(LBK = 22 µH, CBK = 22 µF)  
(HW Device)  
4.3  
6.2  
V
V
V
VBK  
VVM > 6.7 V, 0 mA ≤ IBK ≤ 50 mA,  
VSEL_BK pin to AGND  
VBK  
VVM < 6.0 V, 0 mA ≤ IBK ≤ 50 mA  
IBK*(RLBK  
+2)  
VVM > 6 V, 0 mA ≤ IBK ≤ 40 mA,  
VSEL_BK pin tied to AGND  
3.1  
4.6  
3.3  
5.0  
3.5  
5.4  
V
V
VVM > 6 V, 0 mA ≤ IBK ≤ 40  
mA, VSEL_BK pin to Hi-Z  
VVM > 6 V, 0 mA ≤ IBK ≤ 40  
mA, VSEL_BK pin to 47 kΩ +/- 5% tied  
to AVDD  
Buck regulator average voltage  
(RBK = 22 Ω, CBK = 22 µF)  
(HW Device)  
3.7  
5.2  
4.0  
5.7  
4.3  
6.2  
V
V
V
VBK  
VVM > 6.7 V, 0 mA ≤ IBK ≤ 40 mA,  
VSEL_BK pin to AGND  
VBK  
VVM < 6.0 V, 0 mA ≤ IBK ≤ 40 mA  
IBK*(RBK  
+2)  
VVM > 6 V, 0 mA ≤ IBK ≤ 200 mA, Buck  
regulator with inductor, LBK = 47 uH, CBK  
= 22 µF  
–100  
–100  
–100  
100 mV  
100 mV  
VVM > 6 V, 0 mA ≤ IBK ≤ 50 mA, Buck  
regulator with inductor, LBK = 22 uH, CBK  
= 22 µF  
VBK_RIP  
Buck regulator ripple voltage  
VVM > 6 V, 0 mA ≤ IBK ≤ 50 mA, Buck  
regulator with resistor; RBK = 22 Ω, CBK  
= 22 µF  
100 mV  
200 mA  
LBK = 47 uH, CBK = 22 µF,  
BUCK_PS_DIS = 1b  
LBK = 47 uH, CBK = 22 µF,  
BUCK_PS_DIS = 0b  
200 –  
IAVDD  
mA  
LBK = 22 uH, CBK  
22 µF, BUCK_PS_DIS = 1b  
=
50 mA  
IBK  
External buck regulator load  
LBK = 22 uH, CBK = 22 µF,  
BUCK_PS_DIS = 0b  
50 –  
IAVDD  
mA  
RBK = 22 Ω, CBK  
22 µF, BUCK_PS_DIS = 1b  
=
40 mA  
RBK = 22 Ω, CBK = 22 µF,  
BUCK_PS_DIS = 0b  
40 –  
IAVDD  
mA  
Regulation Mode  
Linear Mode  
TBD  
0
535 kHz  
535 kHz  
fSW_BK  
Buck regulator switching frequency  
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MAX UNIT  
SLVSF16 – JANUARY 2021  
TJ = –40°C to +150°C, VVM = 4.5 to 35 V (unless otherwise noted). Typical limits apply for TA = 25°C, VVM = 24 V  
PARAMETER  
TEST CONDITIONS  
VBK rising, BUCK_SEL = 00b  
VBK falling, BUCK_SEL = 00b  
VBK rising, BUCK_SEL = 01b  
VBK falling, BUCK_SEL = 01b  
VBK rising, BUCK_SEL = 10b  
VBK falling, BUCK_SEL = 10b  
VBK rising, BUCK_SEL = 11b  
VBK falling, BUCK_SEL = 11b  
VBK rising, VSEL_BK pin tied to AGND  
VBK falling, VSEL_BK pin tied to AGND  
MIN  
2.7  
2.5  
4.3  
4.1  
2.7  
2.5  
4.3  
4.1  
2.7  
2.5  
TYP  
2.8  
2.6  
4.4  
4.2  
2.8  
2.6  
4.4  
4.2  
2.8  
2.6  
2.9  
2.7  
4.5  
4.3  
2.9  
2.7  
4.5  
4.3  
2.9  
2.7  
V
V
V
V
V
V
V
V
V
V
Buck regulator undervoltage lockout  
(SPI Device)  
VBK_UV  
VBK rising, VSEL_BK pin to 47 kΩ +/- 5%  
tied to AVDD  
4.3  
4.1  
4.4  
4.2  
4.5  
4.3  
V
V
VBK falling, VSEL_BK pin to 47 kΩ +/-  
5% tied to AVDD  
Buck regulator undervoltage lockout  
(HW Device)  
VBK_UV  
VBK rising, VSEL_BK pin to Hi-Z  
2.7  
2.5  
4.3  
4.1  
2.8  
2.6  
4.4  
4.2  
2.9  
2.7  
4.5  
4.3  
V
V
V
V
VBK falling, VSEL_BK pin to Hi-Z  
VBK rising, VSEL_BK pin tied to AVDD  
VBK falling, VSEL_BK pin tied to AVDD  
Buck regulator undervoltage lockout  
hysteresis  
VBK_UV_HYS  
Rising to falling threshold  
200  
mV  
BUCK_CL = 0b  
BUCK_CL = 1b  
600  
150  
mA  
mA  
Buck regulator Current limit threshold  
(SPI Device)  
IBK_CL  
Buck regulator Current limit threshold  
(HW Device)  
IBK_CL  
600  
mA  
Buck regulator Overcurrent protection  
trip point  
IBK_OCP  
2
3
1
4
A
tBK_RETRY  
Overcurrent protection retry time  
ms  
LOGIC-LEVEL INPUTS (DRVOFF, INHx, INLx, nSLEEP, SCLK, SDI)  
VIL  
Input logic low voltage  
0
1.5  
1.6  
180  
95  
0.6  
5.5  
5.5  
V
V
V
Other Pins  
VIH  
Input logic high voltage  
nSLEEP  
Other PIns  
300  
250  
420 mV  
420 mV  
VHYS  
IIL  
Input logic hysteresis  
Input logic low current  
Input logic high current  
nSLEEP  
VPIN (Pin Voltage) = 0 V  
nSLEEP, VPIN (Pin Voltage) = 5 V  
Other pins, VPIN (Pin Voltage) = 5 V  
nSLEEP  
–1  
1
30  
µA  
µA  
µA  
kΩ  
kΩ  
pF  
15  
IIH  
30  
75  
150  
70  
200  
100  
30  
300  
130  
RPD  
CID  
Input pulldown resistance  
Input capacitance  
Other pins  
LOGIC-LEVEL INPUTS (nSCS)  
VIL  
Input logic low voltage  
Input logic high voltage  
Input logic hysteresis  
Input logic low current  
Input logic high current  
Input pullup resistance  
Input capacitance  
0
1.5  
0.6  
5.5  
V
V
VIH  
VHYS  
IIL  
180  
300  
420 mV  
VPIN (Pin Voltage) = 0 V  
VPIN (Pin Voltage) = 5 V  
75  
25  
µA  
µA  
kΩ  
pF  
IIH  
–1  
80  
RPU  
CID  
100  
30  
130  
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TJ = –40°C to +150°C, VVM = 4.5 to 35 V (unless otherwise noted). Typical limits apply for TA = 25°C, VVM = 24 V  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
FOUR-LEVEL INPUTS (GAIN, MODE, SLEW, VSEL_BK)  
0.2*AVD  
VL1  
VL2  
VL3  
VL4  
Input mode 1 voltage  
Input mode 2 voltage  
Input mode 3 voltage  
Input mode 4 voltage  
Tied to AGND  
0
V
V
V
V
D
0.27*AV  
DD  
0.545*AV  
DD  
Hi-Z  
0.5*AVDD  
0.606*AV 0.757*AVD 0.909*AV  
47 kΩ +/- 5% tied to AVDD  
Tied to AVDD  
DD  
D
DD  
0.94*AV  
DD  
AVDD  
RPU  
RPD  
Input pullup resistance  
To AVDD  
To AGND  
70  
70  
100  
100  
130  
130  
kΩ  
kΩ  
Input pulldown resistance  
FOUR-LEVEL INPUTS ( OCP/SR)  
0.09*AV  
DD  
VL1  
VL2  
VL3  
VL4  
Input mode 1 voltage  
Input mode 2 voltage  
Input mode 3 voltage  
Input mode 3 voltage  
Tied to AGND  
22 kΩ ± 5% to AGND  
Hi-Z  
0
V
V
V
V
0.12*AV  
DD  
0.2*AVD  
D
0.15*AVDD  
0.5*AVDD  
0.45*AV  
DD  
0.55*AV  
DD  
0.94*AV  
DD  
Tied to AVDD  
AVDD  
RPU  
RPD  
Input pullup resistance  
To AVDD  
To AGND  
100  
100  
kΩ  
kΩ  
Input pulldown resistance  
OPEN-DRAIN OUTPUTS (nFAULT)  
VOL  
IOH  
Output logic low voltage  
Output logic high current  
Output capacitance  
IOD = 5 mA  
VOD = 5 V  
0.4  
1
V
–1  
µA  
pF  
COD  
30  
PUSH-PULL OUTPUTS (SDO)  
VOL  
VOH  
IOL  
Output logic low voltage  
IOP = 5 mA  
IOP = 5 mA  
VOP = 0 V  
VOP = 5 V  
0
2.2  
–1  
0.4  
5.5  
1
V
Output logic high voltage  
V
Output logic low leakage current  
Output logic high leakage current  
Output capacitance  
µA  
µA  
pF  
IOH  
–1  
1
COD  
30  
DRIVER OUTPUTS  
VVM > 6 V, IOUT = 1 A, TA = 25°C  
VVM < 6 V, IOUT = 1 A, TA = 25°C  
VVM > 6 V, IOUT = 1 A, TJ = 150 °C  
VVM < 6 V, IOUT = 1 A, TJ = 150 °C  
95  
100  
130  
130  
mΩ  
mΩ  
mΩ  
mΩ  
Total MOSFET on resistance (High-side  
+ Low-side)  
RDS(ON)  
VVM = 24 V, SLEW = 00b or SLEW pin  
tied to AGND  
25  
50  
V/us  
V/us  
V/us  
V/us  
VVM = 24 V, SLEW = 01b or SLEW pin to  
Hi-Z  
Phase pin slew rate switching low to high  
(Rising from 20 % to 80 %)  
SR  
VVM = 24 V, SLEW = 10b or SLEW pin to  
47 kΩ +/- 5% to AVDD  
125  
200  
VVM = 24 V, SLEW = 11b or SLEW pin  
tied to AVDD  
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TJ = –40°C to +150°C, VVM = 4.5 to 35 V (unless otherwise noted). Typical limits apply for TA = 25°C, VVM = 24 V  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
VVM = 24 V, SLEW = 00b or SLEW pin  
tied to AGND  
25  
V/us  
VVM = 24 V, SLEW = 01b or SLEW pin to  
Hi-Z  
50  
125  
200  
V/us  
V/us  
V/us  
Phase pin slew rate switching high to low  
(Falling from 80 % to 20 %  
SR  
VVM = 24 V, SLEW = 10b or SLEW pin to  
47 kΩ +/- 5% to AVDD  
VVM = 24 V, SLEW = 11b or SLEW pin  
tied to AVDD  
Leakage current on OUTx  
Leakage current on OUTx  
VOUTx = VVM, nSLEEP = 1  
VOUTx = 0 V, nSLEEP = 1  
5
1
mA  
µA  
ILEAK  
VVM = 24 V, SR = 25 V/µs, HS driver ON  
to LS driver OFF  
2500  
1200  
750  
3400  
1550  
1000  
750  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
VVM = 24 V, SR = 50 V/µs, HS driver ON  
to LS driver OFF  
Output dead time (high to low / low to  
high)  
tDEAD  
VVM = 24 V, SR = 125 V/µs, HS driver  
ON to LS driver OFF  
VVM = 24 V, SR = 200 V/µs, HS driver  
ON to LS driver OFF  
500  
VVM = 24 V, INHx = 1 to OUTx  
transisition, SR = 25 V/µs  
3000  
1300  
950  
3500  
1700  
1100  
900  
VVM = 24 V, INHx = 1 to OUTx  
transisition, SR = 50V/µs  
Propagation delay (high-side / low-side  
ON/OFF)  
tPD  
VVM = 24 V, INHx = 1 to OUTx  
transisition, SR = 125 V/µs  
VVM = 24 V, INHx = 1 to OUTx  
transisition, SR = 200 V/µs  
700  
ns  
ns  
tMIN_PULSE  
Minimum output pulse width  
SR = 200 V/µs  
600  
CURRENT SENSE AMPLIFIER  
CSA_GAIN = 00  
0.15  
0.3  
0.6  
1.2  
0.15  
0.3  
0.6  
1.2  
V/A  
V/A  
V/A  
V/A  
V/A  
V/A  
V/A  
V/A  
%
CSA_GAIN = 01  
GCSA  
Current sense gain (SPI Device)  
CSA_GAIN = 10  
CSA_GAIN = 11  
GAIN pin tied to AGND  
GAIN pin to Hi-Z  
GCSA  
Current sense gain (HW Device)  
Current sense gain error  
GAIN pin to 47 kΩ ± 5% to AVDD  
GAIN pin tied to AVDD  
TA = 25°C, IPHASE < 4A  
TA = 25°C, IPHASE > 4A  
IPHASE < 4 A  
–1.5  
–3  
1.5  
3
%
GCSA_ERR  
–2.5  
–5  
2.5  
5
%
IPHASE > 4 A  
%
TA = 25°C  
–3  
3
%
Current sense gain error matching  
between phases A, B and C  
IMATCH  
–5  
5
%
FSPOS  
FSNEG  
Full scale positive current measurement  
Full scale negative current measurement  
8
A
–8  
A
VVREF  
VLINEAR  
SOX output voltage linear range  
0.25  
V
0.25  
Phase current = 0 A, GCSA = 0.15 V/A  
Phase current = 0 A, GCSA = 0.3 V/A  
Phase current = 0 A, GCSA = 0.6 V/A  
Phase current = 0 A, GCSA = 1.2 V/A  
–50  
–50  
–50  
–50  
50 mA  
50 mA  
50 mA  
50 mA  
IOFFSET  
Current sense offset low side current in  
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TJ = –40°C to +150°C, VVM = 4.5 to 35 V (unless otherwise noted). Typical limits apply for TA = 25°C, VVM = 24 V  
PARAMETER  
TEST CONDITIONS  
Step on SOX = 1.2 V, GCSA = 0.15 V/A  
Step on SOX = 1.2 V, GCSA = 0.3 V/A  
Step on SOX = 1.2 V, GCSA = 0.6 V/A  
Step on SOX = 1.2 V, GCSA = 1.2 V/A  
Phase current = 0 A  
MIN  
TYP  
MAX UNIT  
1
1
1
1
μs  
μs  
μs  
μs  
tSET  
Settling time to ±1%, 30 pF  
VDRIFT  
IVREF  
Drift offset  
–80  
80 µA/  
VREF input current  
VREF = 3.0 V  
50  
75  
55  
20  
µA  
dB  
dB  
dB  
AVDD to SOx, DC  
60  
44  
10  
PSRR  
Power Supply Rejection Ratio  
AVDD to SOx, 10 kHz  
AVDD to SOx, 500 kHz  
Current limit corresponding to VLIM pin  
voltage range  
ILIMIT  
0
5
A
PROTECTION CIRCUITS  
VM rising  
VM falling  
4.3  
4.1  
140  
3
4.4  
4.2  
200  
5
4.5  
4.3  
V
V
VUVLO Supply undervoltage lockout (UVLO)  
VUVLO_HYS Supply undervoltage lockout hysteresis Rising to falling threshold  
350 mV  
tUVLO  
Supply undervoltage deglitch time  
7
µs  
V
Supply rising, OVP_EN = 1, OVP_SEL =  
0
32.5  
31.8  
20  
34  
33  
22  
21  
35  
Supply falling, OVP_EN = 1, OVP_SEL  
= 0  
34.3  
23  
V
V
V
Supply overvoltage protection (OVP)  
(SPI Device)  
VOVP  
Supply rising, OVP_EN = 1, OVP_SEL =  
1
Supply falling, OVP_EN = 1, OVP_SEL  
= 1  
19  
22  
Rising to falling threshold, OVP_SEL = 1  
Rising to falling threshold, OVP_SEL = 0  
0.9  
0.7  
1
0.8  
5
1.1  
0.9  
V
V
Supply overvoltage protection (OVP)  
(SPI Device)  
VOVP_HYS  
tOVP  
Supply overvoltage deglitch time  
µs  
V
Supply rising  
2.5  
2.4  
100  
2.85  
2.65  
Charge pump undervoltage lockout  
(above VM)  
VCPUV  
Supply falling  
V
VCPUV_HYS Charge pump UVLO hysteresis  
Rising to falling threshold  
Supply rising  
mV  
V
2.7  
2.5  
3
VAVDD_UV  
Analog regulator undervoltage lockout  
Supply falling  
2.8  
V
Analog regulator undervoltage lockout  
hysteresis  
VAVDD_ UV_HYS  
Rising to falling threshold  
200  
mV  
OCP_LVL = 0b  
10  
15  
10  
15  
16  
24  
20  
28  
A
A
Overcurrent protection trip point (SPI  
Device)  
OCP_LVL = 1b  
IOCP  
OCP pin tied to AGND  
OCP pin tied to AVDD  
OCP_DEG = 00b  
OCP_DEG = 01b  
OCP_DEG = 10b  
OCP_DEG = 11b  
16  
21.5  
31  
A
Overcurrent protection trip point (HW  
Device)  
24  
A
0.2  
0.6  
1.1  
1.6  
µs  
µs  
µs  
µs  
Overcurrent protection deglitch time  
(SPI Device)  
tOCP  
Overcurrent protection deglitch time  
(HW Device)  
0.2  
µs  
OCP_RETRY = 0  
OCP_RETRY = 1  
5
ms  
ms  
Overcurrent protection retry time  
(SPI Device)  
tRETRY  
500  
Overcurrent protection retry time  
(HW Device)  
tRETRY  
5
ms  
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MAX UNIT  
SLVSF16 – JANUARY 2021  
TJ = –40°C to +150°C, VVM = 4.5 to 35 V (unless otherwise noted). Typical limits apply for TA = 25°C, VVM = 24 V  
PARAMETER  
TEST CONDITIONS  
MIN  
135  
10  
TYP  
145  
15  
TOTW  
Thermal warning temperature  
Thermal warning hysteresis  
Thermal shutdown temperature  
Thermal shutdown hysteresis  
Die temperature (TJ)  
160  
20  
°C  
°C  
°C  
°C  
TOTW_HYS  
TTSD  
Die temperature (TJ)  
Die temperature (TJ)  
Die temperature (TJ)  
150  
10  
160  
15  
175  
20  
TTSD_HYS  
7.6 SPI Timing Requirements  
MIN  
NOM  
MAX UNIT  
tREADY  
SPI ready after power up  
nSCS minimum high time  
nSCS input setup time  
nSCS input hold time  
1
ms  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tHI_nSCS  
tSU_nSCS  
tHD_nSCS  
tSCLK  
300  
25  
25  
SCLK minimum period  
SCLK minimum high time  
SCLK minimum low time  
SDI input data setup time  
SDI input data hold time  
SDO output data delay time  
SDO enable delay time  
SDO disable delay time  
100  
50  
tSCLKH  
tSCLKL  
50  
tSU_SDI  
tHD_SDI  
tDLY_SDO  
tEN_SDO  
tDIS_SDO  
25  
25  
25  
50  
50  
7.7 SPI Slave Mode Timings  
tHD_nSCS  
tHI_nSCS  
tSU_nSCS  
tSCLK  
tSCLKH  
tSCLKL  
X
MSB  
LSB  
X
tDIS_SDO  
tDLY_SDO  
tSU_SDI  
tHD_SDI  
Z
MSB  
LSB  
Z
tEN_SDO  
Figure 7-1. SPI Slave Mode Timings  
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8 Detailed Description  
8.1 Overview  
The DRV8316 device is an integrated 95-mΩ (combined high-side and low-side MOSFET's on-state resistance)  
driver for 3-phase motor-drive applications. The device reduces system component count, cost, and complexity  
by integrating three half-bridge MOSFETs, gate drivers, charge pump, current sense amplifiers, linear regulator  
for the external load and buck regulator. A standard serial peripheral interface (SPI) provides a simple method  
for configuring the various device settings and reading fault diagnostic information through an external controller.  
Alternatively, a hardware interface (H/W) option allows for configuring the most commonly used settings through  
fixed external resistors.  
The architecture uses an internal state machine to protect against short-circuit events, and protect against dv/dt  
parasitic turnon of the internal power MOSFET.  
The DRV8316 device integrates three, bidirectional current-sense amplifiers for monitoring the current level  
through each of the half-bridges using a built-in current sense. The gain setting of the amplifier can be adjusted  
through the SPI or hardware interface.  
In addition to the high level of device integration, the DRV8316 device provides a wide range of integrated  
protection features. These features include power-supply undervoltage lockout (UVLO), charge-pump  
undervoltage lockout (CPUV), overcurrent protection (OCP), AVDD undervoltage lockout (AVDD_UV), buck  
regulator ULVO for DRV8316R/T and overtemperature shutdown (OTW and OTSD). Fault events are indicated  
by the nFAULT pin with detailed information available in the SPI registers on the SPI device version.  
The DRV8316T and DRV8316R device are available in 0.5-mm pin pitch, VQFN surface-mount packages. The  
VQFN package size is 7 mm × 5 mm.  
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8.2 Functional Block Diagram  
VVM  
+
CVM1  
CCP  
VM  
CVM2  
CFLY  
CPL  
CP  
CPH  
To AVDD and  
Buck Regulator  
Replace Inductor (LBK  
)
with Resistor (RBK) for  
larger external load  
or to reduce power  
dissipation  
Charge Pump  
Regulators  
I/O Control  
Ext.  
Load  
Protection  
AVDD  
AGND  
nSLEEP  
VVM  
CAVDD1  
AVDD Linear Regulator  
Overcurrent  
Protection  
DRVOFF  
INHA  
LBK  
Ext.  
Load  
SW_BK  
Thermal Warning  
Thermal Shutdown  
CBK  
RBK  
VVM  
GND_BK  
Buck Regulator  
INLA  
FB_BK  
Input  
Control  
INHB  
INLB  
Predriver Stage  
VCP  
Power Stage  
VM  
INHC  
HS Pre-  
driver  
INLC  
VDD  
OUTA  
VLS  
RnFAULT  
LS Pre-  
driver  
Digital Control  
Output  
Current  
Sense for  
Phase - A  
nFAULT  
PGND  
ISEN_A  
Predriver Stage  
VCP  
Power Stage  
VM  
Interface  
SCLK  
HS Pre-  
driver  
SPI  
OUTB  
SDI  
Current Limit  
AVDD  
VLS  
SOA  
SOB  
LS Pre-  
driver  
SDO  
Current  
Sense for  
Phase - B  
AVDD  
PGND  
SOC  
nSCS  
+
-
ILIM  
ISEN_B  
Predriver Stage  
VCP  
Power Stage  
VM  
Current Sense Amplifiers  
HS Pre-  
driver  
VREF/  
ILIM  
ISEN_A  
ISEN_B  
ISEN_C  
AV  
OUTC  
SOC  
SOB  
SOA  
VLS  
AV  
AV  
Output Offset  
Bias  
LS Pre-  
driver  
Current  
Sense for  
Phase - C  
PGND  
ISEN_C  
PGND  
PGND  
PGND  
TPAD  
Figure 8-1. DRV8316R Block Diagram  
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VVM  
+
CVM1  
CCP  
VM  
CVM2  
CFLY  
CPL  
CP  
CPH  
To AVDD and  
Buck Regulator  
Replace Inductor (LBK  
)
with Resistor (RBK) for  
larger external load  
or to reduce power  
dissipation  
Charge Pump  
Regulators  
I/O Control  
Ext.  
Load  
Protection  
AVDD  
AGND  
nSLEEP  
DRVOFF  
VVM  
CAVDD1  
AVDD Linear Regulator  
Overcurrent  
Protection  
LBK  
Ext.  
Load  
SW_BK  
Thermal Warning  
Thermal Shutdown  
CBK  
RBK  
GND_BK  
VVM  
INHA  
INLA  
INHB  
INLB  
INHC  
Buck Regulator  
FB_BK  
Predriver Stage  
VCP  
Power Stage  
VM  
HS Pre-  
driver  
Input  
Control  
OUTA  
INLC  
VLS  
LS Pre-  
driver  
Digital Control  
Current  
Sense for  
Phase - A  
MODE  
SLEW  
PGND  
ISEN_A  
Predriver Stage  
VCP  
Power Stage  
VM  
OCP/SR  
GAIN  
HS Pre-  
driver  
VSEL_BK  
OUTB  
Current Limit  
VLS  
SOA  
SOB  
VDD  
LS Pre-  
driver  
RnFAULT  
Current  
Sense for  
Phase - B  
Output  
PGND  
nFAULT  
SOC  
+
-
ILIM  
ISEN_B  
Predriver Stage  
VCP  
Power Stage  
VM  
Current Sense Amplifiers  
HS Pre-  
driver  
VREF/  
ILIM  
ISEN_A  
ISEN_B  
ISEN_C  
AV  
OUTC  
SOC  
SOB  
SOA  
VLS  
AV  
AV  
Output Offset  
Bias  
LS Pre-  
driver  
Current  
Sense for  
Phase - C  
PGND  
ISEN_C  
PGND  
PGND  
PGND  
TPAD  
Figure 8-2. DRV8316T Block Diagram  
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8.3 Feature Description  
Table 8-1 lists the recommended values of the external components for the driver.  
Table 8-1. DRV8316 External Components  
COMPONENTS  
CVM1  
PIN 1  
VM  
PIN 2  
PGND  
RECOMMENDED  
X5R or X7R, 0.1-µF, VM-rated capacitor  
≥ 10-µF, VM-rated capacitor  
CVM2  
VM  
PGND  
CCP  
CP  
VM  
X5R or X7R, 16-V, 1-µF capacitor  
X5R or X7R, 10-nF, VM-rated capacitor  
X5R or X7R, 1-µF, 6.3-V capacitor  
X5R or X7R, buck-output rated capacitor  
Output inductor  
CFLY  
CPH  
CPL  
CAVDD  
CBK  
AVDD  
SW_BK  
SW_BK  
VCC  
AGND  
GND_BK  
FB_BK  
LBK  
RnFAULT  
RMODE  
RSLEW  
ROCP  
nFAULT  
5.1-kΩ, Pullup resistor  
MODE  
SLEW  
OCP  
AGND or AVDD  
AGND or AVDD  
AGND or AVDD  
AGND or AVDD  
AGND or AVDD  
AGND  
DRV8316 hardware interface  
DRV8316 hardware interface  
DRV8316 hardware interface  
RGAIN  
GAIN  
DRV8316 hardware interface  
RVSEL_BK  
CVREF  
VSEL_BK  
VREF/ILIM  
DRV8316 hardware interface  
X5R or X7R, 0.1-µF, VREF-rated capacitor (Optional)  
Note  
TI recommends to connect pull up on nFAULT even if it is not used to avoid undesirable entry into  
internal test mode.  
8.3.1 Output Stage  
The DRV8316 device consists of an integrated 95-mΩ (combined high-side and low-side FET's on-state  
resistance) NMOS FETs connected in a three-phase bridge configuration. A doubler charge pump provides the  
proper gate-bias voltage to the high-side NMOS FET's across a wide operating-voltage range in addition to  
providing 100% duty-cycle support. An internal linear regulator provides the gate-bias voltage for the low-side  
MOSFETs. The device has three VM motor power-supply pins which are to be connected together to the motor-  
supply voltage.  
8.3.2 Control Modes  
The DRV8316 family of devices provides four different control modes to support various commutation and  
control methods. Table 8-2 shows the various modes of the DRV8316 device.  
Table 8-2. PWM Control Modes  
MODE Pin  
(Hardware  
Variant)  
PWM_MODE Bits  
(SPI Variant)  
MODE Type  
MODE  
Connected to  
AGND  
PWM_MODE =  
00b  
Mode 1  
Mode 2  
Mode 3  
Mode 4  
6x Mode  
PWM_MODE =  
01b  
Hi-Z  
6x Mode with Current Limit  
3x Mode  
Connected to  
AVDD with RMODE  
PWM_MODE =  
10b  
Connected to  
AVDD  
PWM_MODE = 11b  
3x Mode with Current Limit  
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Note  
Texas Instruments does not recommend changing the MODE pin or PWM_MODE register during  
operation of the power MOSFETs. Set all INHx and INLx pins to logic low before changing the MODE  
pin or PWM_MODE register.  
8.3.2.1 6x PWM Mode (MODE = 00b or MODE Pin Tied to AGND)  
In 6x PWM mode, each half-bridge supports three output states: low, high, or high-impedance (Hi-Z). The  
corresponding INHx and INLx signals control the output state as listed in Table 8-3.  
Table 8-3. 6x PWM Mode Truth Table  
INLx  
INHx  
PHASEx  
0
0
1
1
0
1
0
1
Hi-Z  
H
L
Hi-Z  
Figure 8-3 shows the application diagram of DRV8316 configured in 6x PWM mode.  
VM  
OUTA  
nSLEEP  
INHA  
INLA  
INHB  
VM  
Controller  
INLB  
INHC  
OUTB  
Gate  
Drive  
and  
Logic  
OCP  
BLDC  
Motor  
INLC  
VM  
MODE  
GND  
OUT3  
GND  
Figure 8-3. 6x PWM Mode  
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8.3.2.2 3x PWM Mode (MODE = 10b or MODE Pin is Connected to AGND with RMODE  
)
In 3x PWM mode, the INHx pin controls each half-bridge and supports two output states: low or high. The INLx  
pin is used to put the half bridge in the Hi-Z state. If the Hi-Z state is not required, tie all INLx pins to logic high.  
The corresponding INHx and INLx signals control the output state as listed in Table 8-4.  
Table 8-4. 3x PWM Mode Truth Table  
INLx  
INHx  
PHASEx  
0
1
1
X
0
1
Hi-Z  
L
H
Figure 8-4 shows the application diagram of DRV8316 configured in 3x PWM mode.  
VM  
OUTA  
nSLEEP  
INHA  
INHB  
INHC  
VM  
Controller  
INLA  
INLB  
OUTB  
Gate  
Drive  
and  
Logic  
OCP  
BLDC  
Motor  
INLC  
VM  
AVDD  
AVDD  
OUT3  
MODE  
GND  
Figure 8-4. 3x PWM Mode  
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8.3.2.3 Current Limit Mode (MODE = 01b / 11b or MODE Pin is Hi-Z or Connected to AVDD)  
Figure 8-5 shows the application diagram of DRV8316 configured in current limit mode. A current limit  
comparator is used for the current limiting which input is generated with the three current sense amplifier's  
outputs.  
VM  
OUTA  
nSLEEP  
Current  
Sense  
ISEN_A  
INHA  
VM  
INLA  
INHB  
INLB  
INHC  
Controller  
OUTB  
Gate  
Drive  
and  
Logic  
Current  
Sense  
OCP  
BLDC  
Motor  
ISEN_B  
INLC  
VM  
Hi-Z /  
Connected  
to AVDD  
MODE  
OUT3  
Current  
Sense  
ISEN_C  
GND  
Current Limit  
SOA  
SOB  
ILIM  
SOC  
-
+
PWM Current Limit  
Figure 8-5. Current Limit Mode  
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8.3.3 Device Interface Modes  
The DRV8316 family of devices supports two different interface modes (SPI and hardware) to let the end  
application design for either flexibility or simplicity. The two interface modes share the same four pins, allowing  
the different versions to be pin-to-pin compatible. This compatibility lets application designers evaluate with one  
interface version and potentially switch to another with minimal modifications to their design.  
8.3.3.1 Serial Peripheral Interface (SPI)  
The SPI devices support a serial communication bus that lets an external controller send and receive data with  
the DRV8316. This support lets the external controller configure device settings and read detailed fault  
information. The interface is a four wire interface using the SCLK, SDI, SDO, and nSCS pins which are  
described as follows:  
The SCLK pin is an input that accepts a clock signal to determine when data is captured and propagated on  
the SDI and SDO pins.  
The SDI pin is the data input.  
The SDO pin is the data output. The SDO pin uses an open-drain structure and requires an external pullup  
resistor.  
The nSCS pin is the chip select input. A logic low signal on this pin enables SPI communication with the  
DRV8316.  
For more information on the SPI, see the Section 8.5 section.  
8.3.3.2 Hardware Interface  
Hardware interface devices convert the four SPI pins into four resistor-configurable inputs which are GAIN,  
SLEW, MODE, and OCP.  
This conversion lets the application designer configure the most common device settings by tying the pin logic  
high or logic low, or with a simple pullup or pulldown resistor. This removes the requirement for an SPI bus from  
the external controller. General fault information can still be obtained through the nFAULT pin.  
The GAIN pin configures the gain of the current sense amplifier.  
The SLEW pin configures the slew rate of the output voltage.  
The MODE pin configures the PWM control mode.  
The OCP/SR pin is used to configures the OCP level and active demagnetization modes.  
For more information on the hardware interface, see the Section 8.3.10 section.  
AVDD  
RSLEW  
AVDD  
SLEW  
SCLK  
SDI  
AVDD  
AVDD  
MODE  
SPI  
Interface  
AVDD  
VCC  
RPU  
Hardware  
Interface  
OCP/SR  
GAIN  
SDO  
nSCS  
AVDD  
AVDD  
Figure 8-7. DRV8316T Hardware Interface  
Figure 8-6. DRV8316R SPI Interface  
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8.3.4 AVDD Linear Voltage Regulator  
A 3.3-V, linear regulator is integrated into the DRV8316 family of devices and is available for use by external  
circuitry. The AVDD regulator is used for powering up the internal digital circuitry of the DRV8316 device.  
Additionally, this regulator can also provide the supply voltage for a low-power MCU or other circuitry supporting  
low current (up to 30mA). The output of the AVDD regulator should be bypassed near the AVDD pin with an X5R  
or X7R, 1-µF, 6.3-V ceramic capacitor routed directly back to the adjacent AGND ground pin.  
The AVDD nominal, no-load output voltage is 3.3V.  
VM  
REF  
+
œ
AVDD  
AGND  
External Load  
CAVDD  
Figure 8-8. AVDD Linear Regulator Block Diagram  
Use Equation 1 to calculate the power dissipated in the device by the AVDD linear regulator.  
2 = (88/ F 8#8&&) × +#8&&  
(1)  
For example, at a VVM of 24 V, drawing 20 mA out of AVDD results in a power dissipation as shown in Equation  
2.  
P = 24 V - 3.3 V ì 20 mA = 414 mW  
(
)
(2)  
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8.3.5 Step-Down Buck Regulator )  
The DRV8316R and DRV8316T have an integrated buck regulator in conjunction with analog linear regulator to  
supply regulated 3.3/5V power for an external controller or system voltage rail. Additionally, the buck output can  
also be configured to 4/5.7V to support extra headroom for an external LDO generating a 3.3/5V supply. The  
output voltage of the buck is set by the VSEL_BK pin in the DRV8316T device (hardware variant) and  
BUCK_SEL bits in the DRV8316R device (SPI variant).  
The buck regulator has a very-low quiescent current during light loads to prolong battery life. The device  
improves performance during line and load transients by implementing a pulse-frequency current-mode control  
scheme which requires less output capacitance and simplifies frequency compensation design.  
8.3.5.1 Buck Inductor Mode  
The buck regulator in DRV8316 device is primarily designed to support low inductance of 47µH and 22µH  
inductors. The 47µH inductor allows the buck regulator to operate up to 200 mA load current support, whereas  
the 22µH inductor limits the load current to 50 mA.  
Figure 8-9 shows the connection of buck regulator in inductor mode.  
VM  
SW_BK  
Ext. Load  
VBK  
Control  
LBK  
CBK  
GND_BK  
FB_BK  
Figure 8-9. Buck (Inductor Mode)  
8.3.5.2 Buck Resistor mode  
If the external load requirement is less than 40 mA, the inductor can be replaced with a resistor. In resistor mode,  
power is dissipated from the external resistor and the efficiency is lower than inductor mode.  
Figure 8-10 shows the connection of buck regulator in resistor mode.  
VM  
SW_BK  
Ext. Load  
VBK  
Control  
RBK  
CBK  
GND_BK  
FB_BK  
Figure 8-10. Buck (Resistor Mode)  
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8.3.5.3 Buck Regulator with External LDO  
The buck regulator in the DRV8316 device also supports the voltage requirement to feed to an external LDO to  
generate the standard 3.3V/5V output rail. The buck output voltage is configured to 4V or 5.7V to provide an  
extra headroom to support the external LDO for generating a 3.3V or 5V rail as shown in Figure 8-11. This allows  
a lower-voltage LDO design to save cost and better thermal management due to low drop-out voltage.  
VM  
VLDO  
(3.3V / 5V)  
VBK  
SW_BK  
(4V / 5.7V)  
VIN  
VLDO  
Ext. Load  
CLDO  
Control  
LBK  
3.3V / 5V  
LDO  
CBK  
GND_BK  
FB_BK  
GND  
External LDO  
GND  
Figure 8-11. Buck Regulator with External LDO  
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8.3.5.4 LDO Power Sequencing on Buck Regulator  
The LDO of DRV8316R and DRV8316T devices has an option of accepting the power supply from buck  
regulator to reduce power dissipation. The power sequencing mode in the DRV8316R and DRV8316T device  
allows on-the-fly changeover of the LDO power supply from the DC mains (VM) to buck output (VBK) as shown  
in Figure 8-12. This sequencing automatically happens in the hardware device when the buck voltage is set to  
either 5V or 5.7V. For disabling the power sequencing in the SPI device, set the BUCK_PS_DIS bit to 1.  
VM  
SW_BK  
Ext. Load  
VBK  
Control  
LBK  
CBK  
GND_BK  
FB_BK  
AVDD_PS  
VBK  
VM  
REF  
+
œ
AVDD  
AGND  
External Load  
CAVDD  
Figure 8-12. LDO Power Sequencing on Buck Regulator  
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8.3.5.5 Buck Operation and Control  
The buck regulator in DRV8316R and DRV8316T implements a pulse frequency modulation (PFM) architecture  
with peak current mode control. The output voltage of the buck regulator is compared with the reference voltage  
(VBK_REF) which is internally generated depending on the buck-output voltage setting (VSEL_BK pin or  
BUCK_SEL bits) which constitutes an outer voltage control loop. Now, depending on the comparator output  
going high (VBK < VBK_REF) or low (VBK > VBK_REF), the high-side power FET of the buck turns on and off  
respectively. An independent current control loop monitors the current in the high-side power FET (IBK) and turns  
off the high-side FET when the current becomes higher than the buck current limit (IBK_CL). This implements a  
current limit control for the buck regulator. Figure 8-13 shows the architecture of the buck and various control/  
protection loops to avoid unwanted scenarios.  
Slew Rate  
Control  
SW_BK  
IBK  
Ext. Load  
VBK  
VM  
LBK  
PWM Control  
and Driver  
CBK  
GND_BK  
IBK  
+
Current Limit  
OC Protection  
UV Protection  
_
IBK_CL  
IBK  
+
_
IBK_OCP  
FB_BK  
VBK  
+
_
VBK_UVLO  
VBK  
+
_
Voltage Control  
VBK_REF  
VSEL_BK  
Buck  
(HW Device)  
Reference  
Voltage  
Generator  
Buck Control  
BUCK_SEL  
(SPI Device)  
Figure 8-13. Buck Operation and Control Loops  
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8.3.5.6 Buck Undervoltage Protection  
If at any time the input supply voltage on the FB_BK pin falls lower than the VBK_UVLO threshold, all of the both  
high-side and low-side MOSFETs of the buck regulator are disabled and the nFAULT pin is driven low. The  
FAULT, BK_FLT and BUCK_UV bits are also latched high in the registers on SPI devices. Normal operation  
starts again (buck operation and the nFAULT pin is released) when the VBK undervoltage condition clears. The  
BUCK_UV bit stays set until cleared through the CLR_FLT bit or an nSLEEP pin reset pulse (tRST).  
8.3.5.7 Buck Overcurrent Protection  
The overcurrent event is sensed by monitoring the current flowing through high-side MOSFET of the buck  
regulator. If the current across high-side MOSFET exceeds the IBK_OCP threshold for longer than the tOCP_DEG  
deglitch time, a buck OCP event is recognized and nFAULT pin is driven low. The FAULT, BK_FLT and BK_OCP  
bits are latched high in the SPI registers. Normal operation starts again automatically (buck operation and the  
nFAULT pin is released) after the tRETRY time elapses. The FAULT, BK_FLT and BK_OCP bits stay latched until  
the tRETRY period expires.  
On hardware interface devices, the IBK_OCP threshold is set to 600-mA, whereas on SPI devices, the IBK_OCP  
threshold is set through the BUCK_CL bit to either to 600-mA or 150-mA.  
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8.3.6 Charge Pump  
Because the output stages use N-channel FETs, the device requires a gate-drive voltage higher than the VM  
power supply to enhance the high-side FETs fully. The DRV8316 integrates a charge-pump circuit that generates  
a voltage above the VM supply for this purpose.  
The charge pump requires two external capacitors for operation. See the block diagram, pin descriptions and  
see section (Table 8-1 ) for details on these capacitors (value, connection, and so forth).  
The charge pump shuts down when nSLEEP is low.  
VM  
VM  
CCP  
CP  
CPH  
VM  
Charge  
Pump  
Control  
CFLY  
CPL  
Figure 8-14. DRV8316 Charge Pump  
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8.3.7 Slew Rate Control  
An adjustable gate-drive current control to the MOSFETs of half-bridges is implemented to achieve the slew rate  
control. The MOSFET VDS slew rates are a critical factor for optimizing radiated emissions, energy and duration  
of diode recovery spikes, and switching voltage transients related to parasitics. These slew rates are  
predominantly determined by the rate of gate charge to internal MOSFETs as shown in Figure 8-15.  
VM  
VCP (Internal)  
Slew Rate  
Control  
OUTx  
VCP (Internal)  
Slew Rate  
Control  
GND  
Figure 8-15. Slew Rate Circuit Implementation  
The slew rate of each half-bridge can be adjusted by the SLEW pin in hardware device variant or by using the  
SLEW bits in SPI device variant. Each half-bridge can be selected to either of a slew rate setting of 25-V/µs, 50-  
V/µs, 125-V/µs or 200-V/µs. The slew rate is calculated by the rise time and fall time of the voltage on OUTx pin  
as shown in Figure 8-16.  
VOUTx  
VM  
VM  
80%  
80%  
20%  
20%  
0
Time  
tfall  
trise  
Figure 8-16. Slew Rate Timings  
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8.3.8 Cross Conduction (Dead Time)  
The device is fully protected for any cross conduction of MOSFETs. In half-bridge configuration, the operation of  
high-side and low-side MOSFETs are ensured to avoid any shoot-through currents by inserting a dead time  
(tdead). This is implemented by sensing the gate-source voltage (VGS) of the high-side and low-side MOSFETs  
and ensuring that VGS of high-side MOSFET has reached below turn-off levels before switching on the low-side  
MOSFET of same half-bridge as shown in Figure 8-17 and Figure 8-18.  
VM  
Gate  
Control  
+
VGS  
HS  
LS  
œ
OUTx  
Gate  
Control  
+
GND  
VGS  
œ
Figure 8-17. Cross Conduction Protection  
OUTx HS  
OUTx  
Gate  
(VGS_HS)  
10%  
tDEAD  
OUTx  
Gate  
(VHS_LS)  
10%  
OUTx LS  
Time  
Figure 8-18. Dead Time  
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8.3.9 Propagation Delay  
The propagation delay time (tpd) is measured as the time between an input logic edge to change in gate driver  
voltage. This time has three parts consisting of the digital input deglitcher delay, analog driver, and comparator  
delay.  
The input deglitcher prevents high-frequency noise on the input pins from affecting the output state of the gate  
drivers. To support multiple control modes, a small digital delay is added as the input command propagates  
through the device.  
INx  
OUTx High  
tPD  
20%  
OUTx Low  
OUTx  
Time  
Figure 8-19. Propagation Delay Timing  
8.3.9.1 Driver Delay Compensation  
DRV8316 monitors the prorogation delay internally and adds a variable delay on top of it to provide fixed delay  
as shown in Figure 8-20 and Figure 8-21. Delay compensation feature reduces uncertainty caused in timing of  
current measurement and also reduces duty cycle distortion caused due to propagation delay.  
The fixed delay is summation of propagation delay (tPD) caused to internal driver delay and variable delay (tVAR  
)
added to compensate for uncertainty. The fixed delay can be configured through DLY_TARGET register. Refer  
Table 8-5 for recommendation on configuration for DLY_TARGET for different slew rate settings.  
Delay compensation is only available in SPI variant DRV8316R and can be enabled by configuring DLYCMP_EN  
and DLY_TARGET. It is disabled in hardware variant DRV8316T  
INLx  
INHx  
1V  
1V  
1V  
1V  
OUTx  
OUTx  
Time  
Time  
tVAR  
tVAR  
tPD  
tPD  
tVAR  
tVAR  
tPD  
tPD  
DLY_TARGET  
DLY_TARGET  
DLY_TARGET  
DLY_TARGET  
Figure 8-21. Delay Compensation with current  
flowing into the phase  
Figure 8-20. Delay Compensation with current  
flowing out of phase  
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Table 8-5. Delay Target Recommendation  
SLEW RATE  
200 V/μs  
125 V/μs  
50 V/μs  
DLY_TARGET  
DLY_TARGET = 0x5 (1.2 μs)  
DLY_TARGET = 0x8 (1.8 μs)  
DLY_TARGET = 0xB (2.4 μs)  
DLY_TARGET = 0xF (3.2 μs)  
25 V/μs  
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8.3.10 Pin Diagrams  
This section presents the I/O structure of all digital input and output pins.  
8.3.10.1 Logic Level Input Pin (Internal Pulldown)  
Figure 8-22 shows the input structure for the logic level pins, DRVOFF, INHx, INLx, nSLEEP, SCLK and SDI.  
The input can be with a voltage or external resistor. It is recommended to put these pins low in device sleep  
mode to reduce leakage current through internal pull-down resistors.  
AVDD  
STATE  
VIH  
CONNECTION  
Tied to AVDD  
Tied to GND  
INPUT  
Logic High  
Logic Low  
VIL  
RPD  
ESD  
Figure 8-22. Logic-Level Input Pin Structure  
8.3.10.2 Logic Level Input Pin (Internal Pullup)  
Figure 8-23 shows the input structure for the logic level pin, nSCS. The input can be driven with a voltage or  
external resistor.  
AVDD  
AVDD  
STATE  
VIH  
CONNECTION  
Tied to AVDD  
Tied to GND  
INPUT  
RPU  
Logic High  
Logic Low  
VIL  
ESD  
Figure 8-23. Logic nSCC  
8.3.10.3 Open Drain Pin  
Figure 8-24 shows the structure of the open-drain output pin, nFAULT. The open-drain output requires an  
external pullup resistor to function properly.  
AVDD  
STATE  
No Fault  
Fault  
STATUS  
Pulled-Up  
RPU  
OUTPUT  
Inactive  
Active  
Pulled-Down  
ESD  
Figure 8-24. Open Drain  
8.3.10.4 Push Pull Pin  
Figure 8-25 shows the structure of push-pull pin, SDO.  
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AVDD  
STATE  
VOH  
STATUS  
Pulled-Up  
OUTPUT  
Logic High  
Logic Low  
VOL  
Pulled-Down  
ESD  
Figure 8-25. Push Pull  
8.3.10.5 Four Level Input Pin  
Figure 8-26 shows the structure of the four level input pins, GAIN, MODE, SLEW, OCP/SR and VSEL_BK on  
hardware interface devices. The input can be set with an external resistor.  
CONTROL  
AVDD  
AVDD  
STATE  
VL1  
RESISTANCE  
Tied to AGND  
Setting-1  
Setting-2  
Setting-3  
Setting-4  
+
RPU  
œ
Hi-Z (>2000 kΩ to  
AGND)  
VL2  
VL3  
VL4  
+
RPD  
47 kΩ ±5%  
to AVDD  
œ
Tied to AVDD  
+
œ
Figure 8-26. Four Level Input Pin Structure  
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8.3.11 Current Sense Amplifiers  
The DRV8316 integrates three, high-performance low-side current sense amplifiers for current measurements  
using built-in current sensing. Low-side current measurements are commonly used to implement overcurrent  
protection, external torque control, or brushless-DC commutation with an external controller. All three amplifiers  
can be used to sense the current in each of the half-bridge legs (low-side FETs). The current sense amplifiers  
include features such as programmable gain and external reference is provided on a voltage reference pin  
(VREF).  
8.3.11.1 Current Sense Amplifier Operation  
The SOx pin on the DRV8316 outputs an analog voltage proportional to current flowing in the low side FETs  
multiplied by the gain setting (GCSA). The gain setting is adjustable between four different levels which can be  
set by the GAIN pin (in hardware device variant) or the GAIN bits (in SPI device variant).  
Figure 8-27 shows the internal architecture of the current sense amplifiers. The current sense is implemented  
with the sense FET on each low-side FET of the DRV8316 device. This current information is fed to the interal  
I/V converter, which generates the CSA output voltage on the SOX pin based on the voltage on VREF pin and  
the Gain setting. The CSA output voltage can be calculated as :  
8
4'(W  
51: = @  
A ± )#+0 × +176:  
2
(3)  
VM  
VREF  
OUTX  
Sense  
FET  
GAIN  
I/V Converter  
PGND  
SOX  
Figure 8-27. Integrated Current Sense Amplifier  
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Figure 8-28 and Figure 8-29 show the detail of the amplifier operational range. In bi-directional operation, the  
amplifier output for 0-V input is set at VREF / 2. Any change in the differential input results in a corresponding  
change in the output times the CSA_GAIN factor. The amplifier has a defined linear region in which it can  
maintain operation.  
SOX  
VREF  
V
VREF  
œ 0.25 V  
œIOUTx  
V
SO(rangeœ)  
V
SO(off)max  
/ 2  
V , V  
OFF DRIFT  
0 V  
V
VREF  
V
SO(off)min  
V
SO(range+)  
IOUTx  
0.25 V  
0 V  
Figure 8-28. Bidirectional Current Sense Output  
SOX (V)  
VREF  
VREF / 2  
VLINEAR  
IOUTx (A) (Current flowing into the FET)  
Figure 8-29. Bidirectional Current Sense Regions  
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8.3.12 Active Demagnetization  
DRV8316 family of devices has smart rectification features (actice demagnetization) which reduces power losses  
in device by reducing diode conduction losses. When this feature is enabled device automatically turns ON FET  
whenever it detects diode conduction. This feature can be configured with the OCP/SR pins in hardware  
variants. In SPI device variants this can be configured through EN_ASR and EN_AAR bits. The smart  
rectification is classified into two categories of automatic synchronous rectification (ASR) mode and automatic  
asynchronous rectification (AAR) mode which are described in sections below.  
Note  
In SPI device variants both bits, EN_ASR and EN_AAR needs to set to 1 to enable active  
demagnetization.  
The DRV8316 device includes a high-side (AD_HS) and low-side (AD_LS) comparator which detects the  
negative flow of current in the device on each half-bridge. The AD_HS comparator compares the sense-FET  
output with the supply voltage (VM) threshold, whereas the AD_LS compatator compares with the ground (0-V)  
threshold. Depending upon the flow of current from OUTx to VM or PGND to OUTx, the AD_HS or the AD_LS  
comparator trips. This comparator provides a reference point for the operation of active demagnetization feature.  
VM  
AD_HS  
Comparator  
+
-
Sense  
FET  
(To Digital)  
(To Digital)  
OUTX  
VM  
+
-
Sense  
FET  
AD_LS  
Comparator  
0V (GND)  
PGND  
VREF  
I/V Converter  
SOX  
GAIN  
Figure 8-30. Active Demagnetization Operation  
Table 8-6 shows the configuration of ASR and AAR mode in the DRV8316 device.  
Table 8-6. PWM_MODE Configuration  
OCP/SR Pin (Hardware  
MODE Type  
Mode 1  
SR Bits (SPI Variant)  
EN_ASR = 0, EN_AAR = 0  
EN_ASR = 0, EN_AAR = 0  
OCP Setting  
16 A  
ASR and AAR Mode  
ASR and AAR Disabled  
ASR and AAR Disabled  
Variant)  
Connected to AGND  
Connected to AGND with  
RMODE1  
Mode 2  
24 A  
Mode 3  
Mode 4  
Hi-Z  
EN_ASR = 1, EN_AAR = 1  
EN_ASR = 1, EN_AAR = 1  
16 A  
24 A  
ASR and AAR Enabled  
ASR and AAR Enabled  
Connected to AVDD  
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8.3.12.1 Automatic Synchronous Rectification Mode (ASR Mode)  
The automatic synchronous rectification (ASR) mode is divided into two categories of ASR during commutation  
and ASR during PWM mode.  
8.3.12.1.1 Automatic Synchronous Rectification in Commutation  
Figure 8-31 shows the operation of active demagnetization during the BLDC motor commutation. As shown in  
Figure 8-31 (a), the current is flowing from HA to LC in one commutation state. During the commutation  
changeover as shown in Figure 8-31 (b), the HC switch is turned on, whereas the commutation current (due to  
motor inductance) in OUTA flows through the body diode of LA. This incorporates a higher diode loss depending  
on the commutation current. This commutation loss is reduced by turning on the LA for the commutation time as  
shown in Figure 8-31 (c).  
Similarly the operation of high-side FET is realized in Figure 8-31 (d), (e) and (f).  
VM  
VM  
HB  
HC  
HA  
HB  
HC  
HA  
OUTA  
OUTA  
OUTB  
OUTB  
OUTC  
OUTC  
OUTC  
OUTC  
OUTC  
OUTC  
LA  
LB  
LC  
LA  
LB  
LC  
(a) Current flowing from HA to LC  
VM  
(d) Current flowing from HC to LA  
VM  
Decay Current  
Decay Current  
HB  
HC  
HB  
OUTA  
LB  
HC  
HA  
HA  
OUTA  
OUTB  
OUTB  
LA  
LB  
LC  
LA  
LC  
(e) Decay current with AD disabled  
VM  
(b) Decay current with AD disabled  
VM  
Decay Current  
Decay Current  
HB  
HC  
HB  
OUTA  
LB  
HC  
HA  
HA  
OUTA  
OUTB  
OUTB  
LA  
LB  
LC  
LA  
LC  
(c) Decay current with AD enabled  
(f) Decay current with AD enabled  
Figure 8-31. ASR in BLDC Motor Commutation  
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Figure 8-32 (a) shows the BLDC motor phase current waveforms for automatic synchronous rectification mode in  
BLDC motor operating with trapezoidal commutation. This figure shows the operation of various switches in a  
single commutation cycle.  
Figure 8-32 (b) shows the zoomed waveform of commutation cycle with details on the ASR mode start with  
margin time (tmargin) and ASR mode early stop due to active demag. comparator threshold and delays.  
Current Limit  
Phase ”A‘  
Current  
LA  
HA  
HA, LB  
HB, LC  
HB, LA  
HC, LA  
HC, LB  
HA, LC  
(a) Commutation current of Phase —A“  
tmargin  
tdead  
HA Conducts  
LA Body Diode  
Conducts  
HA Body Diode  
Conducts  
Phase ”A‘  
Current  
LA Conducts  
tdead  
HC, LA  
HC, LB  
HA, LC  
HB, LC  
(b) Zoomed waveform of Active Demagnetization  
Figure 8-32. Current Waveforms for ASR in BLDC Motor Commutation  
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8.3.12.1.2 Automatic Synchronous Rectification in PWM Mode  
Figure 8-33 shows the operation of ASR in PWM mode. As shown in this figure, a PWM is applied only on the  
high-side FET, whereas the low-side FET is always off. During the PWM off time, current decays from the low-  
side FET which results in higher power losses. Therefore, this mode supports turning on the low-side FET during  
the low-side diode conduction.  
PWM_HS  
(Applied)  
&t  
PWM_LS  
(Applied)  
&t  
PWM_HS  
(Actual)  
&t  
PWM_LS  
(Actual)  
&t  
Ia  
&t  
ASR Mode Disabled  
ASR Mode Enabled  
Figure 8-33. ASR in PWM Mode  
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8.3.12.2 Automatic Asynchronous Rectification Mode (AAR Mode)  
Figure 8-34 shows the operation of AAR in PWM mode. As shown in this figure, a PWM is applied in a  
synchronous rectification to the high-side and low-side FETs. During the low-side FET conduction, for lower  
inductance motors, the current can decay to zero and becomes negative since low side FET is in on-state. This  
creates a negative torque on the BLDC motor operation. When AAR mode is enabled, the current during the  
decay is monitored and the low-side FET is turned off as soon as the current reaches near to zero. This saves  
the negative current building in the BLDC motor which results in better noise performance and better thermal  
management.  
PWM_HS  
(Applied)  
&t  
PWM_LS  
(Applied)  
&t  
PWM_HS  
(Actual)  
&t  
PWM_LS  
(Actual)  
&t  
Ia  
&t  
AAR Mode Disabled  
AAR Mode Enabled  
Figure 8-34. AAR in PWM Mode  
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8.3.13 Cycle-by-Cycle Current Limit  
The current-limit circuit activates if the current flowing through the low-side MOSFET exceeds the ILIMIT current.  
This feature restricts motor current to less than the ILIMIT  
.
The current-limit circuitry utilizes the current sense amplifier output of the three phases compared with the  
voltage at ILIM pin. Figure 8-35 shows the implementation of current limit circuitry. As shown in this figure, the  
output of current sense amplifiers is combined with star connected resistive network. This measured voltage  
VMEAS is compared with the external reference voltage e VILIM pin to realize the current limit implementation. The  
relation between current sensed on OUTX pin and VMEAS threshold is given as:  
8
#8&&W  
: ;  
¤
A F k +176# + +176$ + +176% × )#+0 3o  
8/'#5 = @  
2
(4)  
where  
AVDD is 3.3-V LDO output  
OUTX is current flowing into the low-side MOSFET  
GAIN is the CSA gain setting  
The ILIMIT threshold can be adjusted by configuring ILIM pin between AVDD/2 to (AVDD/2 - 0.4) V. AVDD/2 is  
minimum value and when it is applied on ILIM pin cycle by cycle current limit is disabled, whereas maximum  
threshold of 8A can be configured by applying (AVDD/2 - 0.4) V on ILIM pin. The relation between current  
sensed on OUTX pin and ILIMIT threshold is given as:  
VM  
AVDD  
I/V Converter  
SOA  
OUTA  
Sense  
FET  
GAIN  
PGND  
SOB  
To PWM  
VMEAS  
VILIM  
Controller  
-
+
ILIM  
SOC  
Figure 8-35. Current Limit Implementation  
When then the current limit activates, the high-side FET is disabled until the beginning of the next PWM cycle as  
shown in Figure 8-36. The low-side FETs can operate in brake mode or high-Z mode by configuring the  
ILIM_RECIR bit in the SPI device variant.  
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PWM  
OUTx  
ILIMIT  
Bridge Operating in  
Brake Mode  
IBRIDGE  
Time  
Figure 8-36. Cycle-by-Cycle Current-Limit Operation  
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Figure 8-37 shows the operation of driver in brake mode, where the current recirculates through low-side FETs  
while the high-side FETs are disabled.  
Figure 8-38 shows the operation of driver in hi-Z mode, where the current recirculates through the body diodes  
of the low-side FETs while the high-side FETs are disabled.  
VM  
VM  
HB  
HC  
HA  
HB  
HC  
HA  
X
X
X
X
X
X
OUTA  
OUTA  
OUTB  
OUTB  
OUTC  
OUTC  
LA  
LB  
LC  
LA  
LB LC  
X X X  
Figure 8-37. Brake State  
Figure 8-38. Coast State  
Note  
The current-limit circuit is ignored immediately after the PWM signal goes active for a short blanking  
time to prevent false trips of the current-limit circuit.  
Note  
During the brake operation, a high-current can flow through the low-side FETs which can eventually  
trigger the over current protection circuit. This allows the body-diode of the high-side FET to conduct  
and pump brake energy to the VM supply rail.  
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8.3.13.1 Cycle by Cycle Current Limit with 100% Duty Cycle Input  
In case of 100% duty cycle applied on PWM input, there is no edge available to turn high-side FET back on. To  
overcome this problem, DRV8316 has built in internal PWM clock which is used to turn high-side FET back on  
once it is disabled after exceeding ILIMIT threshold. In SPI variant DRV8316R , this internal PWM clock can be  
configured to either 20 kHz or 40 kHz through PWM_100_DUTY_SEL. In H/W variant DRV8316T PWM internal  
clock is set to 20 kHz. Figure 8-39 shows operation with 100 % duty cycle.  
PWM  
Internal  
PWM  
OUTx  
ILIMIT  
Bridge Operating in  
Brake Mode  
Time  
Figure 8-39. Cycle-by-Cycle Current-Limit Operation with 100% PWM Duty Cycle  
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8.3.14 Protections  
The DRV8316 family of devices is protected against VM undervoltage, charge pump undervoltage, and  
overcurrent events. Table 8-7 summarizes various faults details.  
Table 8-7. Fault Action and Response (SPI Devices)  
FAULT  
CONDITION  
CONFIGURATION  
REPORT  
H-BRIDGE  
LOGIC  
RECOVERY  
Automatic:  
VVM > VUVLO_R  
CLR_FLT, nSLEEP Reset Pulse (NPOR  
bit)  
VM undervoltage  
(NPOR)  
VVM < VUVLO  
Hi-Z  
Disabled  
Automatic:  
VAVDD > VAVDD_UV_R  
CLR_FLT, nSLEEP Reset Pulse (NPOR  
bit)  
AVDD undervoltage  
(NPOR)  
VAVDD < VAVDD_UV  
VFB_BK < VBK_UV  
VCP < VCPUV  
nFAULT  
nFAULT  
nFAULT  
Hi-Z  
Active  
Hi-Z  
Disabled  
Active  
Automatic:  
VFB_BK > VBUCK_UV_R  
CLR_FLT, nSLEEP Reset Pulse  
(BUCK_UV bit)  
Buck undervoltage  
(BUCK_UV)  
Automatic:  
VVCP > VCPUV  
CLR_FLT, nSLEEP Reset Pulse  
(VCP_UV bit)  
Charge pump  
undervoltage  
(VCP_UV)  
Active  
OVP_EN = 0b  
OVP_EN = 1b  
None  
Active  
Hi-Z  
Active  
Active  
No action (OVP Disabled)  
OverVoltage  
Protection  
(OVP)  
Automatic:  
VVM < VOVP  
CLR_FLT, nSLEEP Reset Pulse (OVP bit)  
VVM > VOVP  
FAULT  
Latched:  
CLR_FLT, nSLEEP Reset Pulse (OCP  
bits)  
OCP_MODE = 00b  
OCP_MODE = 01b  
nFAULT  
nFAULT  
Hi-Z  
Hi-Z  
Active  
Active  
Retry:  
tRETRY  
Overcurrent  
Protection  
(OCP)  
IPHASE > IOCP  
Automatic:  
CLR_FLT, nSLEEP Reset Pulse (OCP  
bits)  
OCP_MODE = 10b  
OCP_MODE = 11b  
nFAULT  
None  
Active  
Active  
Active  
Active  
Active  
Active  
No action  
Buck Overcurrent  
Protection  
(BUCK_OCP)  
Retry:  
tRETRY  
IBK > IBK_OC  
nFAULT  
Automatic:  
CLR_FLT, nSLEEP Reset Pulse  
(SPI_FLT bit)  
SPI_FLT_REP = 0b  
nFAULT  
Active  
Active  
SPI Error  
(SPI_FLT)  
SCLK fault and ADDR  
fault  
SPI_FLT_REP = 1b  
None  
nFAULT  
None  
Active  
Hi-Z  
Active  
Active  
Active  
No action  
OTP Error  
(OTP_ERR)  
Latched:  
OTP reading is erroneous  
TJ > TOTW  
Power Cycle, nSLEEP Reset Pulse  
OTW_REP = 0b  
Active  
No action  
Thermal warning  
(OTW)  
Automatic:  
TJ < TOTW – THYS  
CLR_FLT, nSLEEP Pulse (OTW bit)  
OTW_REP = 1b  
nFAULT  
nFAULT  
Active  
Hi-Z  
Active  
Active  
Automatic:  
TJ < TOTSD – THYS  
CLR_FLT, nSLEEP Pulse (OTS bit)  
Thermal shutdown  
(OTSD)  
TJ > TOTSD  
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8.3.14.1 VM Supply Undervoltage Lockout (NPOR)  
If at any time the input supply voltage on the VM pin falls lower than the VUVLO threshold (VM UVLO falling  
threshold), all of the integrated FETs, driver charge-pump and digital logic controller are disabled as shown in  
Figure 8-40. Normal operation resumes (driver operation) when the VM undervoltage condition is removed. The  
NPOR bit is reset and latched low in the IC status (IC_STAT) register once the device presumes VM. The NPOR  
bit remains in reset condition until cleared through the CLR_FLT bit or an nSLEEP pin reset pulse (tRST).  
VUVLO (max) rising  
VUVLO (min) rising  
VUVLO (max) falling  
VUVLO (min) falling  
VVM  
DEVICE ON  
DEVICE OFF  
DEVICE ON  
Time  
Figure 8-40. VM Supply Undervoltage Lockout  
8.3.14.2 AVDD Undervoltage Lockout (AVDD_UV)  
If at any time the voltage on AVDD pin falls lower than the VAVDD_UV threshold, all of the integrated FETs, driver  
charge-pump and digital logic controller are disabled. Normal operation resumes (driver operation) when the  
AVDD undervoltage condition is removed. The NPOR bit is reset and latched low in the IC status (IC_STAT)  
register once the device presumes VM. The NPOR bit remains in reset condition until cleared through the  
CLR_FLT bit or an nSLEEP pin reset pulse (tRST).  
8.3.14.3 BUCK Undervoltage Lockout (BUCK_UV)  
If at any time the voltage on VFB_BK pin falls lower than the VBK_UV threshold, the integrated FETs of the buck  
regulator are disabled while the driver FETs, charge pump, and digital logic control continue to operate normally.  
The nFAULT pin is driven low in the event of a buck undervoltage fault, and the BK_FLT bit in IC_STAT register  
is set in SPI devices. The FAULT and BUCK_UV bits are also latched high in the registers on SPI devices.  
Normal operation starts again (buck regulator operation and the nFAULT pin is released) when the BUCK  
undervoltage condition clears. The BK_FLT and BUCK_UV bits stay set until cleared through the CLR_FLT bit or  
an nSLEEP pin reset pulse (tRST).  
8.3.14.4 VCP Charge Pump Undervoltage Lockout (CPUV)  
If at any time the voltage on the VCP pin (charge pump) falls lower than the VCPUV threshold voltage of the  
charge pump, all of the integrated FETs are disabled and the nFAULT pin is driven low. The FAULT and VCP_UV  
bits are also latched high in the registers on SPI devices. Normal operation starts again (driver operation and the  
nFAULT pin is released) when the VCP undervoltage condition clears. The CPUV bit stays set until cleared  
through the CLR_FLT bit or an nSLEEP pin reset pulse (tRST). The CPUV protection is always enabled in both  
hardware and SPI device varaints.  
8.3.14.5 Overvoltage Protections (OV)  
If at any time input supply voltage on the VM pins rises higher lower than the VOVP threshold voltage, all of the  
integrated FETs are disabled and the nFAULT pin is driven low. The FAULT and OVP bits are also latched high  
in the registers on SPI devices. Normal operation starts again (driver operation and the nFAULT pin is released)  
when the OVP condition clears. The OVP bit stays set until cleared through the CLR_FLT bit or an nSLEEP pin  
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reset pulse (tRST). Setting the OVP_EN bit high on the SPI devices enables this protection feature. On hardware  
interface devices, the OVP protection is always enabled and set to a 32-V threshold.  
The OVP threshold is also programmable on the SPI device variant. The OVP threshold can be set to 20-V or  
32-V based on the OVP_SEL bit.  
VVM  
VOVP (max) rising  
VOVP (min) rising  
VOVP (max) falling  
VOVP (min) falling  
DEVICE ON  
DEVICE OFF  
DEVICE ON  
nFAULT  
Time  
Figure 8-41. Over Voltage Protection  
8.3.14.6 Overcurrent Protection (OCP)  
A MOSFET overcurrent event is sensed by monitoring the current flowing through FETs. If the current across a  
FET exceeds the IOCP threshold for longer than the tOCP deglitch time, an OCP event is recognized and action is  
done according to the OCP_MODE bit. On hardware interface devices, the IOCP threshold is set via OCP/SR pin,  
the tOCP_DEG is fixed at 0.2-µs, and the OCP_MODE bit is configured for 5-ms automatic retry. On SPI devices,  
the IOCP threshold is set through the OCP_LVL SPI register, the tOCP_DEG is set through the OCP_DEG SPI  
register, and the OCP_MODE bit can operate in four different modes: OCP latched shutdown, OCP automatic  
retry, OCP report only, and OCP disabled.  
8.3.14.6.1 OCP Latched Shutdown (OCP_MODE = 00b)  
After a OCP event in this mode, all MOSFETs are disabled and the nFAULT pin is driven low. The FAULT, OCP,  
and corresponding FET's OCP bits are latched high in the SPI registers. Normal operation starts again (driver  
operation and the nFAULT pin is released) when the OCP condition clears and a clear faults command is issued  
either through the CLR_FLT bit or an nSLEEP reset pulse (tRST).  
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Peak Current due  
to deglitch time  
IOCP  
IOUTx  
tOCP  
nFAULT Released  
nFAULT Pulled High  
Fault Condition  
nFAULT  
Clear Fault  
Time  
Figure 8-42. Overcurrent Protection - Latched Shutdown Mode  
8.3.14.6.2 OCP Automatic Retry (OCP_MODE = 01b)  
After a OCP event in this mode, all the FETs are disabled and the nFAULT pin is driven low. The FAULT, OCP,  
and corresponding FET's OCP bits are latched high in the SPI registers. Normal operation starts again  
automatically (driver operation and the nFAULT pin is released) after the tRETRY time elapses. After the tRETRY  
time elapses, the FAULT, OCP, and corresponding FET's OCP bits stay latched until a clear faults command is  
issued either through the CLR_FLT bit or an nSLEEP reset pulse (tRST).  
Peak Current due  
to deglitch time  
IOCP  
IOUTx  
tRETRY  
tOCP  
nFAULT Released  
nFAULT Pulled High  
Fault Condition  
nFAULT  
Time  
Figure 8-43. Overcurrent Protection - Automatic Retry Mode  
8.3.14.6.3 OCP Report Only (OCP_MODE = 10b)  
No protective action occurs after a OCP event in this mode. The overcurrent event is reported by driving the  
nFAULT pin low and latching the FAULT, OCP, and corresponding FET's OCP bits high in the SPI registers. The  
DRV8316 continues to operate as usual. The external controller manages the overcurrent condition by acting  
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appropriately. The reporting clears (nFAULT pin is released) when the OCP condition clears and a clear faults  
command is issued either through the CLR_FLT bit or an nSLEEP reset pulse (tRST).  
8.3.14.6.4 OCP Disabled (OCP_MODE = 11b)  
No action occurs after a OCP event in this mode.  
8.3.14.7 Buck Overcurrent Protection  
A buck overcurrent event is sensed by monitoring the current flowing through buck regulator’s FETs. If the  
current across the buck regulator FET exceeds the IBK_OCP threshold for longer than the tBK_OCP deglitch time,  
an OCP event is recognized. The buck OCP mode is configured in automatic retry setting. In this setting, after a  
buck OCP event is detected, all the buck regulator’s FETs are disabled and the nFAULT pin is driven low. The  
FAULT, BK_FLT, and BUCK_OCP bits are latched high in the SPI registers. Normal operation starts again  
automatically (driver operation and the nFAULT pin is released) after the tBK_RETRY time elapses. The FAULT,  
BK_FLT, and BUCK_OCP bits stay latched until the tRETRY period expires.  
8.3.14.8 Thermal Warning (OTW)  
If the die temperature exceeds the trip point of the thermal warning (TOTW), the OT bit in the IC status (IC_STAT)  
register and OTW bit in the status register is set. The reporting of OTW on the nFAULT pin can be enabled by  
setting the over-temperature warning reporting (OTW_REP) bit in the configuration control register. The device  
performs no additional action and continues to function. In this case, the nFAULT pin releases when the die  
temperature decreases below the hysteresis point of the thermal warning (TOTW_HYS). The OTW bit remains set  
until cleared through the CLR_FLT bit or an nSLEEP reset pulse (tRST) and the die temperature is lower than  
thermal warning trip (TOTW).  
Note  
Over temperature warning is not reported on nFAULT pin by default.  
8.3.14.9 Thermal Shutdown (OTS)  
If the die temperature exceeds the trip point of the thermal shutdown limit (TOTS), all the FETs are disabled, the  
charge pump is shut down, and the nFAULT pin is driven low. In addition, the FAULT and OT bit in the IC status  
(IC_STAT) register and OTS bit in the status register is set. Normal operation starts again (driver operation and  
the nFAULT pin is released) when the overtemperature condition clears. The OTS bit stays latched high  
indicating that a thermal event occurred until a clear fault command is issued either through the CLR_FLT bit or  
an nSLEEP reset pulse (tRST). This protection feature cannot be disabled.  
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8.4 Device Functional Modes  
8.4.1 Functional Modes  
8.4.1.1 Sleep Mode  
The nSLEEP pin manages the state of the DRV8316 family of devices. When the nSLEEP pin is low, the device  
goes to a low-power sleep mode. In sleep mode, all FETs are disabled, sense amplifiers are disabled, buck  
regulator (if present) is disabled, the charge pump is disabled, the AVDD regulator is disabled, and the SPI bus  
is disabled. The tSLEEP time must elapse after a falling edge on the nSLEEP pin before the device goes to sleep  
mode. The device comes out of sleep mode automatically if the nSLEEP pin is pulled high. The tWAKE time must  
elapse before the device is ready for inputs.  
In sleep mode and when VVM < VUVLO, all MOSFETs are disabled.  
Note  
During power up and power down of the device through the nSLEEP pin, the nFAULT pin is held low  
as the internal regulators are enabled or disabled. After the regulators have enabled or disabled, the  
nFAULT pin is automatically released. The duration that the nFAULT pin is low does not exceed the  
tSLEEP or tWAKE time.  
8.4.1.2 Operating Mode  
When the nSLEEP pin is high and the VVM voltage is greater than the VUVLO voltage, the device goes to  
operating mode. The tWAKE time must elapse before the device is ready for inputs. In this mode the charge  
pump, AVDD regulator, buck regulator, and SPI bus are active.  
8.4.1.3 Fault Reset (CLR_FLT or nSLEEP Reset Pulse)  
In the case of device latched faults, the DRV8316 family of devices goes to a partial shutdown state to help  
protect the power MOSFETs and system.  
When the fault condition clears, the device can go to the operating state again by either setting the CLR_FLT  
SPI bit on SPI devices or issuing a reset pulse to the nSLEEP pin on either interface variant. The nSLEEP reset  
pulse (tRST) consists of a high-to-low-to-high transition on the nSLEEP pin. The low period of the sequence  
should fall with the tRST time window or else the device will start the complete shutdown sequence. The reset  
pulse has no effect on any of the regulators, device settings, or other functional blocks.  
8.4.2 DRVOFF functionality  
When DRVOFF pin is high, all six MOSFETs are disabled. If nSLEEP is high when the DRVOFF pin is high, the  
charge pump, AVDD regulator, buck regulator, and SPI bus are active and any driver-related faults such as OCP  
will be inactive.  
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8.5 SPI Communication  
8.5.1 Programming  
On DRV8316 SPI devices, an SPI bus is used to set device configurations, operating parameters, and read out  
diagnostic information. The SPI operates in slave mode and connects to a master controller. The SPI input data  
(SDI) word consists of a 16-bit word, with a 6-bit address and 8 bits of data. The SPI output consists of 16 bit  
word, with a 8 bits of status information (STAT register) and 8-bit register data.  
A valid frame must meet the following conditions:  
The SCLK pin should be low when the nSCS pin transitions from high to low and from low to high.  
The nSCS pin should be pulled high for at least 400 ns between words.  
When the nSCS pin is pulled high, any signals at the SCLK and SDI pins are ignored and the SDO pin is  
placed in the Hi-Z state.  
Data is captured on the falling edge of the SCLK pin and data is propagated on the rising edge of the SCLK  
pin.  
The most significant bit (MSB) is shifted in and out first.  
A full 16 SCLK cycles must occur for transaction to be valid.  
If the data word sent to the SDI pin is less than or more than 16 bits, a frame error occurs and the data word  
is ignored.  
For a write command, the existing data in the register being written to is shifted out on the SDO pin following  
the 8-bit status data.  
The SPI registers are reset to the default settings on power up and when the device is enters sleep mode  
8.5.1.1 SPI Format  
The SDI input data word is 16 bits long and consists of the following format:  
1 read or write bit, W (bit B15)  
6 address bits, A (bits B14 through B9)  
Parity bit, P (bit B8)  
8 data bits, D (bits B7 through B0)  
The SDO output data word is 16 bits long and the first 8 bits are status bits. The data word is the content of the  
register being accessed.  
For a write command (W0 = 0), the response word on the SDO pin is the data currently in the register being  
written to.  
For a read command (W0 = 1), the response word is the data currently in the register being read.  
nSCS  
A1  
S1  
D1  
R1  
SDI  
SDO  
Figure 8-44.  
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Master Controller  
Device  
MCLK  
MO  
MI  
SCLK  
SDI  
SPI  
Communication  
SDO  
SPI  
Communication  
nSCS  
CS  
Figure 8-45.  
Table 8-8. SDI Input Data Word Format  
R/W  
ADDRESS  
Parity  
DATA  
DATA  
B15  
W0  
B14  
A5  
B13  
A4  
B12  
A3  
B11  
A2  
B10  
A1  
B9  
A0  
B8  
P
B7  
D7  
B6  
D6  
B5  
D5  
B4  
D4  
B3  
D3  
B2  
D2  
B1  
D1  
B0  
D0  
Table 8-9. SDO Output Data Word Format  
STATUS  
B15  
S7  
B14  
S6  
B13  
S5  
B12  
S4  
B11  
S3  
B10  
S2  
B9  
S1  
B8  
S0  
B7  
D7  
B6  
D6  
B5  
D5  
B4  
D4  
B3  
D3  
B2  
D2  
B1  
D1  
B0  
D0  
nSCS  
SCLK  
SDI  
X
Z
MSB  
MSB  
LSB  
LSB  
X
Z
SDO  
Capture  
Point  
Propagate  
Point  
Figure 8-46. SPI Slave Timing Diagram  
8.6 Register Map  
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8.6.1 STATUS Registers  
Table 8-10 lists the STATUS registers. All register offset addresses not listed in Table 8-10 should be considered  
as reserved locations and the register contents should not be modified.  
Status Configuration  
Table 8-10. STATUS Registers  
Address  
0x0  
Acronym  
IC_Status_  
Status__1  
Status__2  
Register Name  
IC Status Register  
Status Register 1  
Status Register 2  
Section  
Go  
0x1  
Go  
0x2  
Go  
Complex bit access types are encoded to fit into small table cells. Table 8-11 shows the codes that are used for  
access types in this section.  
Table 8-11. STATUS Access Type Codes  
Access Type  
Code  
Description  
Read Type  
R
R
Read  
R-0  
R
Read  
-0  
Returns 0s  
Reset or Default Value  
- n  
Value after reset or the default value  
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8.6.1.1 IC_Status_ Register (Address = 0x0) [Reset = 0x0]  
IC_Status_ is shown in Table 8-12.  
Return to the Summary Table.  
Table 8-12. IC_Status_ Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
6
BK_FLT  
R
0x0  
Buck Fault Bit  
0x0 = No buck regulator fault condition is detected  
0x1 = Buck regulator fault condition is detected  
5
4
3
2
1
0
SPI_FLT  
OCP  
R
R
R
R
R
R
0x0  
0x0  
0x0  
0x0  
0x0  
0x0  
SPI Fault Bit  
0x0 = No SPI fault condition is detected  
0x1 = SPI Fault condition is detected  
Over Current Protection Status Bit  
0x0 = No overcurrent condition is detected  
0x1 = Overcurrent condition is detected  
NPOR  
OVP  
Supply Power On Reset Bit  
0x0 = Power on reset condition is detected on VM  
0x1 = No power-on-reset condition is detected on VM  
Supply Overvoltage Protection Status Bit  
0x0 = No overvoltage condition is detected on VM  
0x1 = Overvoltage condition is detected on VM  
OT  
Overtemperature Fault Status Bit  
0x0 = No overtemperature warning / shutdown is detected  
0x1 = Overtemperature warning / shutdown is detected  
FAULT  
Device Fault Bit  
0x0 = No fault condition is detected  
0x1 = Fault condition is detected  
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8.6.1.2 Status__1 Register (Address = 0x1) [Reset = 0x0]  
Status__1 is shown in Table 8-13.  
Return to the Summary Table.  
Table 8-13. Status__1 Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
7
OTW  
R
0x0  
Overtemperature Warning Status Bit  
0x0 = No overtemperature warning is detected  
0x1 = Overtemperature warning is detected  
6
5
4
3
2
1
0
OTS  
R
R
R
R
R
R
R
0x0  
0x0  
0x0  
0x0  
0x0  
0x0  
0x0  
Overtemperature Shutdown Status Bit  
0x0 = No overtemperature shutdown is detected  
0x1 = Overtemperature shutdown is detected  
OCP_HC  
OCL_LC  
OCP_HB  
OCP_LB  
OCP_HA  
OCP_LA  
Overcurrent Status on High-side switch of OUTC  
0x0 = No overcurrent detected on high-side switch of OUTC  
0x1 = Overcurrent detected on high-side switch of OUTC  
Overcurrent Status on Low-side switch of OUTC  
0x0 = No overcurrent detected on low-side switch of OUTC  
0x1 = Overcurrent detected on low-side switch of OUTC  
Overcurrent Status on High-side switch of OUTB  
0x0 = No overcurrent detected on high-side switch of OUTB  
0x1 = Overcurrent detected on high-side switch of OUTB  
Overcurrent Status on Low-side switch of OUTB  
0x0 = No overcurrent detected on low-side switch of OUTB  
0x1 = Overcurrent detected on low-side switch of OUTB  
Overcurrent Status on High-side switch of OUTA  
0x0 = No overcurrent detected on high-side switch of OUTA  
0x1 = Overcurrent detected on high-side switch of OUTA  
Overcurrent Status on Low-side switch of OUTA  
0x0 = No overcurrent detected on low-side switch of OUTA  
0x1 = Overcurrent detected on low-side switch of OUTA  
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8.6.1.3 Status__2 Register (Address = 0x2) [Reset = 0x0]  
Status__2 is shown in Table 8-14.  
Return to the Summary Table.  
Table 8-14. Status__2 Register Field Descriptions  
Bit  
7
Field  
Type  
Reset  
Description  
RESERVED  
OTP_ERR  
R
0x0  
Reserved  
6
R
0x0  
One Time Programmabilty Error  
0x0 = No OTP error is detected  
0x1 = OTP Error is detected  
5
4
3
2
1
0
BUCK_OCP  
BUCK_UV  
R
0x0  
0x0  
0x0  
0x0  
0x0  
0x0  
Buck Regulator Overcurrent Staus Bit  
0x0 = No buck regulator overcurrent is detected  
0x1 = Buck regulator overcurrent is detected  
R
Buck Regulator Undervoltage Staus Bit  
0x0 = No buck regulator undervoltage is detected  
0x1 = Buck regulator undervoltage is detected  
VCP_UV  
R
Charge Pump Undervoltage Status Bit  
0x0 = No charge pump undervoltage is detected  
0x1 = Charge pump undervoltage is detected  
SPI_PARITY  
SPI_SCLK_FLT  
SPI_ADDR_FLT  
R-0  
R
SPI Parity Error Bit  
0x0 = No SPI parity error is detected  
0x1 = SPI parity error is detected  
SPI Clock Framing Error Bit  
0x0 = No SPI clock framing error is detected  
0x1 = SPI clock framing error is detected  
R
SPI Address Error Bit  
0x0 = No SPI address fault is detected (due to accessing non-user  
register)  
0x1 = SPI address fault is detected  
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8.6.2 CONTROL Registers  
Table 8-15 lists the CONTROL registers. All register offset addresses not listed in Table 8-15 should be  
considered as reserved locations and the register contents should not be modified.  
Control Configuration  
Table 8-15. CONTROL Registers  
Address  
0x3  
Acronym  
Register Name  
Section  
Go  
Control__1  
Control__2  
Control__3  
Control__4  
Control__5  
Control__6  
Control__10  
Control Register 1  
Control Register 2  
Control Register 3  
Control Register 4  
Control Register 5  
Control Register 6  
Control Register 10  
0x4  
Go  
0x5  
Go  
0x6  
Go  
0x7  
Go  
0x8  
Go  
0xC  
Go  
Complex bit access types are encoded to fit into small table cells. Table 8-16 shows the codes that are used for  
access types in this section.  
Table 8-16. CONTROL Access Type Codes  
Access Type  
Read Type  
R
Code  
R
Description  
Read  
Write Type  
W
W
Write  
W1C  
W
Write  
1C  
1 to clear  
WAPU  
W
Write  
APU  
Atomic write with password unlock  
Reset or Default Value  
- n  
Value after reset or the default value  
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8.6.2.1 Control__1 Register (Address = 0x3) [Reset = 0x11]  
Control__1 is shown in Table 8-17.  
Return to the Summary Table.  
Table 8-17. Control__1 Register Field Descriptions  
Bit  
7-3  
2-0  
Field  
Type  
Reset  
Description  
RESERVED  
REG_LOCK  
R
0x2  
Reserved  
R/WAPU  
0x1  
Register Lock Bits  
0x0 = No effect unless locked or unlocked  
0x1 = No effect unless locked or unlocked  
0x2 = No effect unless locked or unlocked  
0x3 = Write 011b to this register to unlock all registers  
0x4 = No effect unless locked or unlocked  
0x5 = No effect unless locked or unlocked  
0x6 = Write 110b to lock the settings by ignoring further register  
writes except to these bits and address 0x03h bits 2-0.  
0x7 = No effect unless locked or unlocked  
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8.6.2.2 Control__2 Register (Address = 0x4) [Reset = 0x18]  
Control__2 is shown in Table 8-18.  
Return to the Summary Table.  
Table 8-18. Control__2 Register Field Descriptions  
Bit  
7-6  
5
Field  
Type  
Reset  
Description  
RESERVED  
SDO_MODE  
R
0x0  
Reserved  
R/W  
0x0  
SDO Mode Setting  
0x0 = SDO IO in Open Drain Mode  
0x1 = SDO IO in Push Pull Mode  
4-3  
2-1  
0
SLEW  
R/W  
R/W  
W1C  
0x3  
0x0  
0x0  
Slew Rate Settings  
0x0 = Slew rate is 25 V/µs  
0x1 = Slew rate is 50 V/µs  
0x2 = Slew rate is 150 V/µs  
0x3 = Slew rate is 200 V/µs  
PWM_MODE  
CLR_FLT  
Device Mode Selection  
0x0 = 6x mode  
0x1 = 6x mode with current limit  
0x2 = 3x mode  
0x3 = 3x mode with current limit  
Clear Fault  
0x0 = No clear fault command is issued  
0x1 = To clear the latched fault bits. This bit automatically resets after  
being written.  
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8.6.2.3 Control__3 Register (Address = 0x5) [Reset = 0x0]  
Control__3 is shown in Table 8-19.  
Return to the Summary Table.  
Table 8-19. Control__3 Register Field Descriptions  
Bit  
7
Field  
Type  
Reset  
Description  
Reserved  
Reserved  
Reserved  
RESERVED  
RESERVED  
RESERVED  
PWM_100_DUTY_SEL  
R
0x0  
6
R
0x0  
5
R
0x0  
4
R/W  
0x0  
Freqency of PWM at 100% Duty Cycle  
0x0 = 20KHz  
0x1 = 40KHz  
3
2
1
0
OVP_SEL  
OVP_EN  
R/W  
R/W  
R/W  
R/W  
0x0  
0x0  
0x0  
0x0  
Overvoltage Level Setting  
0x0 = VM overvoltage level is 32-V  
0x1 = VM overvoltage level is 20-V  
Overvoltage Enable Bit  
0x0 = Overvoltage protection is disabled  
0x1 = Overvoltage protection is enabled  
SPI_FLT_REP  
OTW_REP  
SPI Fault Reporting Disable Bit  
0x0 = SPI fault reporting on nFAULT pin is enabled  
0x1 = SPI fault reporting on nFAULT pin is disabled  
Overtemperature Warning Reporting Bit  
0x0 = Over temperature reporting on nFAULT is disabled  
0x1 = Over temperature reporting on nFAULT is enabled  
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8.6.2.4 Control__4 Register (Address = 0x6) [Reset = 0x1]  
Control__4 is shown in Table 8-20.  
Return to the Summary Table.  
Table 8-20. Control__4 Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
7
DRV_OFF  
R/W  
0x0  
Driver OFF Bit  
0x0 = No Action  
0x1 = Enter Low Power Standby Mode  
6
OCP_CBC  
OCP_DEG  
R/W  
R/W  
0x0  
0x0  
OCP PWM Cycle Operation Bit  
0x0 = OCP clearing in PWM input cycle change is disabled  
0x1 = OCP clearing in PWM input cycle change is enabled  
5-4  
OCP Deglitch Time Settings  
0x0 = OCP deglitch time is 0.2 µs  
0x1 = OCP deglitch time is 0.6 µs  
0x2 = OCP deglitch time is 1.1 µs  
0x3 = OCP deglitch time is 1.6 µs  
3
2
OCP_RETRY  
OCP_LVL  
R/W  
R/W  
R/W  
0x0  
0x0  
0x1  
OCP Retry Time Settings  
0x0 = OCP retry time is 5 ms  
0x1 = OCP retry time is 500 ms  
Overcurrent Level Setting  
0x0 = OCP level is 16 A  
0x1 = OCP level is 24 A  
1-0  
OCP_MODE  
OCP Fault Options  
0x0 = Overcurrent causes a latched fault  
0x1 = Overcurrent causes an automatic retrying fault  
0x2 = Overcurrent is report only but no action is taken  
0x3 = Overcurrent is not reported and no action is taken  
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8.6.2.5 Control__5 Register (Address = 0x7) [Reset = 0x0]  
Control__5 is shown in Table 8-21.  
Return to the Summary Table.  
Table 8-21. Control__5 Register Field Descriptions  
Bit  
7
Field  
Type  
Reset  
Description  
RESERVED  
ILIM_RECIR  
R
0x0  
Reserved  
6
R/W  
0x0  
Current Limit Recirculation Settings  
0x0 = Current recirculation through FETs (Brake Mode)  
0x1 = Current recirculation through diodes (Coast Mode)  
5
4
3
RESERVED  
RESERVED  
EN_AAR  
R
0x0  
0x0  
0x0  
Reserved  
Reserved  
R
R/W  
Active Asynshronous Rectification Enable Bit  
0x0 = AAR mode is disabled  
0x1 = AAR mode is enabled  
2
EN_ASR  
R/W  
R/W  
0x0  
0x0  
Active Synchronous Rectification Enable Bit  
0x0 = ASR mode is disabled  
0x1 = ASR mode is enabled  
1-0  
CSA_GAIN  
Current Sense Amplifier's Gain Settings  
0x0 = CSA gain is 0.15 V/A  
0x1 = CSA gain is 0.1875 V/A  
0x2 = CSA gain is 0.25 V/A  
0x3 = CSA gain is 0.375 V/A  
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8.6.2.6 Control__6 Register (Address = 0x8) [Reset = 0x0]  
Control__6 is shown in Table 8-22.  
Return to the Summary Table.  
Table 8-22. Control__6 Register Field Descriptions  
Bit  
7-6  
5
Field  
Type  
Reset  
Description  
Reserved  
Reserved  
RESERVED  
RESERVED  
BUCK_PS_DIS  
R
0x0  
R
0x0  
4
R/W  
0x0  
Buck Power Sequencing Disable Bit  
0x0 = Buck power sequencing is enabled  
0x1 = Buck power sequencing is disabled  
3
BUCK_CL  
R/W  
R/W  
0x0  
0x0  
Buck Current Limit Setting  
0x0 = Buck regulator current limit is set to 600 mA  
0x1 = Buck regulator current limit is set to 150 mA  
2-1  
BUCK_SEL  
Buck Voltage Selection  
0x0 = Buck voltage is 3.3 V  
0x1 = Buck voltage is 5.0 V  
0x2 = Buck voltage is 4.0 V  
0x3 = Buck voltage is 5.7 V  
0
BUCK_DIS  
R/W  
0x0  
Buck Disable Bit  
0x0 = Buck regulator is enabled  
0x1 = Buck regulator is disabled  
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8.6.2.7 Control__10 Register (Address = 0xC) [Reset = 0x0]  
Control__10 is shown in Table 8-23.  
Return to the Summary Table.  
Table 8-23. Control__10 Register Field Descriptions  
Bit  
7-5  
4
Field  
Type  
Reset  
Description  
RESERVED  
DLYCMP_EN  
R
0x0  
Reserved  
R/W  
0x0  
Driver Delay Compensation enable  
0x0 = Disable  
0x1 = Enable  
3-0  
DLY_TARGET  
R/W  
0x0  
Delay Target for Driver Delay Compensation  
0x0 = 0 us  
0x1 = 0.4 us  
0x2 = 0.6 us  
0x3 = 0.8 us  
0x4 = 1 us  
0x5 = 1.2 us  
0x6 = 1.4 us  
0x7 = 1.6 us  
0x8 = 1.8 us  
0x9 = 2 us  
0xA = 2.2 us  
0xB = 2.4 us  
0xC = 2.6 us  
0xD = 2.8 us  
0xE = 3 us  
0xF = 3.2 us  
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9 Application and Implementation  
Note  
Information in the following applications sections is not part of the TI component specification, and TI  
does not warrant its accuracy or completeness. TI’s customers are responsible for determining  
suitability of components for their purposes, as well as validating and testing their design  
implementation to confirm system functionality.  
9.1 Application Information  
The DRV8316 can be used to drive Brushless-DC motors. The following design procedure can be used to  
configure the DRV8316.  
VVM  
+
10 nF  
CPL  
1 µF  
VM  
0.1 µF  
10 µF  
0.1 µF  
CPH  
CP  
VCC  
Voltage  
Supervisor  
VREF  
AVDD  
Microcontroller  
CAVDD  
AGND  
ADC  
ADC  
SOC  
SOB  
SOA  
Replace Inductor (LBK) with Resistor  
(RBK) for larger external load or to  
reduce power dissipation  
Current  
Sensing  
CSA  
ADC  
ADC  
LBK  
External  
Load  
SW_BK  
RBK  
RPU1  
CBK  
DRV8316R  
GND_BK  
nFAULT  
GP-I  
FB_BK  
nSLEEP  
DRVOFF  
GP-O  
Driver  
Control  
GP-O  
INHA  
INLA  
INHB  
INLB  
INHC  
INLC  
GP-O  
GP-O  
PWM  
Control  
Module  
PWM  
Control  
Input  
Hall  
Sensors  
(Optional)  
OUTA  
OUTB  
GP-O  
GP-O  
GP-O  
GP-O  
A
B
B
SDO  
GP-I  
GP-O  
GP-O  
GP-O  
nSCS  
SCLK  
SPI  
SPI  
OUTC  
PGND  
SDI  
Hall Input  
GP-I  
GP-I  
GP-I  
Figure 9-1. Primary Application Schematics  
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9.2 Typical Applications  
9.2.1 Three-Phase Brushless-DC Motor Control  
In this application, the DRV8316 is used to drive a Brushless-DC motor  
9.2.1.1 Detailed Design Procedure  
Table 9-1lists the example input parameters for the system design.  
Table 9-1. Design Parameters  
DESIGN PARAMETERS  
Supply voltage  
REFERENCE  
EXAMPLE VALUE  
VVM  
IRMS  
IPEAK  
fPWM  
SR  
24 V  
3 A  
Motor RMS current  
Motor peak current  
8 A  
PWM Frequency  
50 kHz  
200 V/µs  
3.3 V  
Slew Rate Setting  
Buck regulator output voltage  
ADC reference voltage  
System ambient temperature  
VBK  
VVREF  
TA  
3.0 V  
–20°C to +105°C  
9.2.1.1.1 Motor Voltage  
Brushless-DC motors are typically rated for a certain voltage (for example 12 V and 24 V). Operating a motor at  
a higher voltage corresponds to a lower drive current to obtain the same motor power. A higher operating  
voltage also corresponds to a higher obtainable rpm. DRV8316 device allows for the use of higher operating  
voltage because of a maximum VM rating of 40 V.  
Operating at lower voltages generally allows for more accurate control of phase currents. The DRV8316  
functions down to a supply of 4.5V.  
9.2.1.2 Application Curves  
TBD  
Graph Placeholder  
Graph Placeholder  
C00  
C00  
Figure 9-2. App Curve-1  
Figure 9-3. App Curve-2  
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9.2.2 Three-Phase Brushless-DC Motor Control With Current Limit  
In this application, the DRV8316 is used to drive a brushless-DC motor with current limit.  
9.2.2.1 Detailed Design Procedure  
Table 9-1lists the example input parameters for the system design.  
Table 9-2. Design Parameters  
DESIGN PARAMETERS  
Supply voltage  
REFERENCE  
VVM  
EXAMPLE VALUE  
24 V  
5 A  
Motor RMS current  
Motor peak current  
Motor resistance  
IRMS  
IPEAK  
8 A  
RMOTOR  
LMOTOR  
fPWM  
Motor inductance  
PWM Frequency  
50 kHz  
Slew Rate Setting  
SR  
200 V/µs  
Rise and Fall Time  
tRISE, tFALL  
VBK  
VVREF  
TA  
Buck regulator output voltage  
ADC reference voltage  
System ambient temperature  
3.3 V  
3.0 V  
–20°C to +105°C  
9.2.2.1.1 Motor Voltage  
Brushless-DC motors are typically rated for a certain voltage (for example 12 V and 24 V). Operating a motor at  
a higher voltage corresponds to a lower drive current to obtain the same motor power. A higher operating  
voltage also corresponds to a higher obtainable rpm. DRV8316 device allows for the use of higher operating  
voltage because of a maximum VM rating of 40 V.  
Operating at lower voltages generally allows for more accurate control of phase currents. The DRV8316  
functions down to a supply of 4.5V.  
9.2.2.2 Application Curves  
TBD  
Graph Placeholder  
Graph Placeholder  
C00  
C00  
Figure 9-4. Device Powerup with VM  
Figure 9-5. Device Powerup with nSLEEP  
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Graph Placeholder  
Graph Placeholder  
C00  
C00  
Figure 9-6. Power Management  
Figure 9-7. Driver PWM Operation with Current  
Feedback  
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9.2.3 Brushed-DC and Solenoid Load  
9.2.3.1 Design Requirements  
Table 9-3 gives design input parameters for system design.  
Table 9-3. Design Parameters  
DESIGN PARAMETER  
REFERENCE  
EXAMPLE VALUE  
Brushed motor rms current  
IRMS, BDC  
1.0 A  
2.0 A  
0.5 A  
1.0 A  
Brushed motor peak current  
Solenoid rms current  
IPEAK, BDC  
IRMS, SOL  
Solenoid peak current  
IPEAK, SOL  
9.2.3.1.1 Detailed Design Procedure  
Table 9-4. Brushed-DC Control  
Function  
IN1  
EN1  
IN2  
EN2  
OUT1  
OUT2  
Forward  
Reverse  
1
0
1
1
0
1
1
1
H
L
L
H
L
Brake (low-side slow  
decay)  
0
1
0
1
L
High-side slow decay  
Coast  
1
1
0
1
1
0
H
Z
H
Z
X
X
Table 9-5. Solenoid Control (High-Side Load)  
Function  
IN3  
EN3  
OUT3  
Coast / Off  
On  
X
0
1
0
1
1
Z
L
Brake  
H
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9.2.4 Three Solenoid Loads  
9.2.4.1 Design Requirements  
Table 9-6 gives design input parameters for system design.  
Table 9-6. Design Parameters  
DESIGN PARAMETER  
REFERENCE  
EXAMPLE VALUE  
Solenoid rms current  
IRMS, SOL  
1.0 A  
1.5 A  
Solenoid peak current  
IPEAK, SOL  
9.2.4.1.1 Detailed Design Procedure  
Table 9-7. Solenoid Control (high-side load)  
Function  
IN2  
EN2  
OUT2  
Coast / Off  
On  
X
0
1
0
1
1
Z
L
Brake  
H
Table 9-8. Solenoid Control (low-side load)  
Function  
IN1  
EN1  
OUT1  
Coast / Off  
On  
X
1
0
0
1
1
Z
H
L
Brake  
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10 Power Supply Recommendations  
10.1 Bulk Capacitance  
Having an appropriate local bulk capacitance is an important factor in motor drive system design. It is generally  
beneficial to have more bulk capacitance, while the disadvantages are increased cost and physical size.  
The amount of local capacitance needed depends on a variety of factors, including:  
The highest current required by the motor system  
The capacitance and current capability of the power supply  
The amount of parasitic inductance between the power supply and motor system  
The acceptable voltage ripple  
The type of motor used (brushed dc, brushless DC, stepper)  
The motor braking method  
The inductance between the power supply and the motor drive system limits the rate current can change from  
the power supply. If the local bulk capacitance is too small, the system responds to excessive current demands  
or dumps from the motor with a change in voltage. When adequate bulk capacitance is used, the motor voltage  
remains stable and high current can be quickly supplied.  
The data sheet generally provides a recommended value, but system-level testing is required to determine the  
appropriate sized bulk capacitor.  
Parasitic Wire  
Inductance  
Motor Drive System  
Power Supply  
VM  
+
+
Motor Driver  
œ
GND  
Local  
Bulk Capacitor  
IC Bypass  
Capacitor  
Figure 10-1. Example Setup of Motor Drive System With External Power Supply  
The voltage rating for bulk capacitors should be higher than the operating voltage, to provide margin for cases  
when the motor transfers energy to the supply.  
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11 Layout  
11.1 Layout Guidelines  
The bulk capacitor should be placed to minimize the distance of the high-current path through the motor driver  
device. The connecting metal trace widths should be as wide as possible, and numerous vias should be used  
when connecting PCB layers. These practices minimize inductance and allow the bulk capacitor to deliver high  
current.  
Small-value capacitors such as the charge pump, AVDD, and VREF capacitors should be ceramic and placed  
closely to device pins.  
The high-current device outputs should use wide metal traces.  
To reduce noise coupling and EMI interference from large transient currents into small-current signal paths,  
grounding should be partitioned between PGND and AGND. TI recommends connecting all non-power stage  
circuitry (including the thermal pad) to AGND to reduce parasitic effects and improve power dissipation from the  
device. Optionally, GND_BK can be split. Ensure grounds are connected through net-ties or wide resistors to  
reduce voltage offsets and maintain gate driver performance.  
The device thermal pad should be soldered to the PCB top-layer ground plane. Multiple vias should be used to  
connect to a large bottom-layer ground plane. The use of large metal planes and multiple vias helps dissipate  
the I2 × RDS(on) heat that is generated in the device.  
To improve thermal performance, maximize the ground area that is connected to the thermal pad ground across  
all possible layers of the PCB. Using thick copper pours can lower the junction-to-air thermal resistance and  
improve theremal dissipation from the die surface.  
Separate the SW_BUCK and FB_BUCK traces with ground separation to reduce buck switching from coupling  
as noise into the buck outer feedback loop. Widen the FB_BUCK trace as much as possible to allow for faster  
load switching.  
Recommended Layout Example for VQFN Package shows a layout example for the DRV8316.  
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11.2 Layout Example  
Recommended Layout Example for VQFN Package  
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11.3 Thermal Considerations  
The DRV8316 has thermal shutdown (TSD) as previously described. A die temperature in excess of 150°C  
(minimally) disables the device until the temperature drops to a safe level.  
Any tendency of the device to enter thermal shutdown is an indication of excessive power dissipation, insufficient  
heatsinking, or too high an ambient temperature.  
11.3.1 Power Dissipation  
The power dissipated in the output FET resistance, or RDS(on) dominates power dissipation in the DRV8316. A  
rough estimate of average power dissipation of each half-H-bridge when running a static load is:  
At start-up and fault conditions, this current is much higher than normal running current; remember to take these  
peak currents and their duration into consideration.  
The total device dissipation is the power dissipated in each of the three half-H-bridges added together.  
The maximum amount of power that the device can dissipate depends on ambient temperature and heatsinking.  
Note that RDS(on) increases with temperature, so as the device heats, the power dissipation increases. Take this  
into consideration when sizing the heatsink.  
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12 Device and Documentation Support  
12.1 Support Resources  
TI E2Esupport forums are an engineer's go-to source for fast, verified answers and design help — straight  
from the experts. Search existing answers or ask your own question to get the quick design help you need.  
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do  
not necessarily reflect TI's views; see TI's Terms of Use.  
12.2 Trademarks  
TI E2Eis a trademark of Texas Instruments.  
All trademarks are the property of their respective owners.  
12.3 Electrostatic Discharge Caution  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled  
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may  
be more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
12.4 Glossary  
TI Glossary  
This glossary lists and explains terms, acronyms, and definitions.  
13 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most-  
current data available for the designated device. This data is subject to change without notice and without  
revision of this document. For browser-based versions of this data sheet, see the left-hand navigation pane.  
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PACKAGE OPTION ADDENDUM  
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3-Feb-2021  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
DRV8316RRGFR  
DRV8316TRGFR  
PDRV8316RRGFR  
PREVIEW  
PREVIEW  
ACTIVE  
VQFN  
VQFN  
VQFN  
RGF  
RGF  
RGF  
40  
40  
40  
3000  
3000  
3000  
TBD  
TBD  
TBD  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
Call TI  
-40 to 125  
-40 to 125  
-40 to 125  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
3-Feb-2021  
Addendum-Page 2  
IMPORTANT NOTICE AND DISCLAIMER  
TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE  
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”  
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY  
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD  
PARTY INTELLECTUAL PROPERTY RIGHTS.  
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate  
TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable  
standards, and any other safety, security, or other requirements. These resources are subject to change without notice. TI grants you  
permission to use these resources only for development of an application that uses the TI products described in the resource. Other  
reproduction and display of these resources is prohibited. No license is granted to any other TI intellectual property right or to any third party  
intellectual property right. TI disclaims responsibility for, and you will fully indemnify TI and its representatives against, any claims, damages,  
costs, losses, and liabilities arising out of your use of these resources.  
TI’s products are provided subject to TI’s Terms of Sale (https:www.ti.com/legal/termsofsale.html) or other applicable terms available either  
on ti.com or provided in conjunction with such TI products. TI’s provision of these resources does not expand or otherwise alter TI’s  
applicable warranties or warranty disclaimers for TI products.IMPORTANT NOTICE  
Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265  
Copyright © 2021, Texas Instruments Incorporated  

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TI

DRV8316CTRGFR

具有集成电流检测功能、最大电压为 40V、峰值电流为 8A 的三相电机驱动器 | RGF | 40 | -40 to 125
TI

DRV8316R

DRV8316 Three-Phase Integrated FET Motor Driver
TI

DRV8316R-Q1

DRV8316-Q1 Three-Phase Integrated FET Motor Driver
TI

DRV8316RQRGFRQ1

DRV8316-Q1 Three-Phase Integrated FET Motor Driver
TI

DRV8316RRGFR

DRV8316 Three-Phase Integrated FET Motor Driver
TI

DRV8316T

DRV8316 Three-Phase Integrated FET Motor Driver
TI