DS42MB100TSQ/NOPB [TI]

具有发送预加重和接收均衡功能的 4.25Gbps 2:1/1:2 CML 多路复用器/缓冲器 | NJK | 36 | -40 to 85;
DS42MB100TSQ/NOPB
型号: DS42MB100TSQ/NOPB
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

具有发送预加重和接收均衡功能的 4.25Gbps 2:1/1:2 CML 多路复用器/缓冲器 | NJK | 36 | -40 to 85

逻辑集成电路 复用器
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DS42MB100  
SNLS244H SEPTEMBER 2006REVISED JANUARY 2016  
DS42MB100 4.25-Gbps 2:1/1:2 CML MUX/Buffer  
With Transmit Pre-Emphasis and Receive Equalization  
1 Features  
3 Description  
The DS42MB100 device is a signal conditioning 2:1  
1
2:1 Multiplexer and 1:2 Buffer  
multiplexer and 1:2 fan-out buffer designed for use in  
backplane-redundancy or cable driving applications.  
Signal conditioning features include continuous time  
linear equalization (CTLE) and programmable output  
pre-emphasis that enable data communication in FR4  
backplane up to 4.25 Gbps. Each input stage has a  
fixed equalizer to reduce ISI distortion from board  
traces.  
0.25-Gbps to 4.25-Gbps Fully Differential Data  
Paths  
Fixed Input Equalization  
Programmable Output Pre-Emphasis  
Independent Pre-Emphasis Controls  
Programmable Loopback Modes  
On-Chip Terminations  
All output drivers have four selectable levels of pre-  
emphasis to compensate for transmission losses from  
long FR4 backplane or cable attenuation reducing  
deterministic jitter. The pre-emphasis levels can be  
independently controlled for the line-side and switch-  
side drivers. The internal loopback paths from switch-  
side input to switch-side output enable at-speed  
system testing. All receiver inputs are internally  
terminated with 100-Ω differential terminating  
resistors. All driver outputs are internally terminated  
ESD Rating of 6-kV HBM  
3.3-V Supply  
Lead-Less WQFN-36 Package  
–40°C to +85°C Operating Temperature Range  
2 Applications  
Backplane Drivers or Cable Drivers  
Redundancy and Signal Conditioning Applications  
CPRI/OBSAI  
with 50-Ω terminating resistors to VCC  
.
Device Information(1)  
PART NUMBER  
PACKAGE  
WQFN (36)  
BODY SIZE (NOM)  
6.00 mm × 6.00 mm  
DS42MB100  
(1) For all available packages, see the orderable addendum at  
the end of the data sheet.  
Simplified Block Diagram  
Switch Side  
Line Side  
EQ  
IN0 +-  
EQS  
OUT+-  
DE_L  
EQ  
IN1 +-  
LB0  
MUX  
OUT0 +-  
DE_S  
DE_S  
OUT1 +-  
LB1  
IN+-  
EQL  
EQ  
DEL_0  
DEL_1  
VCC  
GND  
RSV  
DE _L  
DE_S  
Pre-emphasis  
Control  
DES_0  
DES_1  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
 
 
 
 
DS42MB100  
SNLS244H SEPTEMBER 2006REVISED JANUARY 2016  
www.ti.com  
Table of Contents  
8.2 Functional Block Diagram ......................................... 9  
8.3 Feature Description................................................... 9  
Application and Implementation ........................ 12  
9.1 Application Information............................................ 12  
9.2 Typical Application ................................................. 12  
1
2
3
4
5
6
Features.................................................................. 1  
Applications ........................................................... 1  
Description ............................................................. 1  
Revision History..................................................... 2  
Pin Configuration and Functions......................... 3  
Specifications......................................................... 4  
6.1 Absolute Maximum Ratings ...................................... 4  
6.2 ESD Ratings.............................................................. 4  
6.3 Recommended Operating Ratings............................ 5  
6.4 Thermal Information.................................................. 5  
6.5 Electrical Characteristics........................................... 5  
6.6 Switching Characteristics.......................................... 7  
6.7 Typical Characteristics.............................................. 8  
Parameter Measurement Information .................. 8  
Detailed Description .............................................. 9  
8.1 Overview ................................................................... 9  
9
10 Power Supply Recommendations ..................... 17  
11 Layout................................................................... 17  
11.1 Layout Guidelines ................................................. 17  
11.2 Layout Example .................................................... 17  
12 Device and Documentation Support ................. 19  
12.1 Documentation Support ........................................ 19  
12.2 Community Resources.......................................... 19  
12.3 Trademarks........................................................... 19  
12.4 Electrostatic Discharge Caution............................ 19  
12.5 Glossary................................................................ 19  
7
8
13 Mechanical, Packaging, and Orderable  
Information ........................................................... 19  
4 Revision History  
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.  
Changes from Revision G (April 2013) to Revision H  
Page  
Added Pin Configuration and Functions section, Storage Conditions table, ESD Ratings table, Thermal Information  
table, Parameter Measurement Information section, Feature Description section, Application and Implementation  
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and  
Mechanical, Packaging, and Orderable Information section ................................................................................................. 1  
Changed thermal information per latest modeling results...................................................................................................... 5  
Changed board trace attenuation estimate, per recent measurement ................................................................................ 14  
Changes from Revision F (April 2013) to Revision G  
Page  
Changed layout of National Data Sheet to TI format ........................................................................................................... 12  
2
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DS42MB100  
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SNLS244H SEPTEMBER 2006REVISED JANUARY 2016  
5 Pin Configuration and Functions  
NJK Package  
36-Pin WQFN  
Top View  
36 35 34 33 32 31 30 29 28  
DES_1  
GND  
1
2
3
4
5
6
7
8
9
27  
26  
25  
24  
23  
22  
21  
20  
19  
DEL_1  
LB1  
OUT0+  
IN1+  
OUT0-  
VCC  
IN1-  
WQFN- 36  
DAP= GND  
VCC  
IN0+  
IN0-  
GND  
OUT1+  
OUT1-  
GND  
Top View Shown  
MUX  
GND  
10 11 12 13 14 15 16 17 18  
Pin Functions  
PIN  
I/O  
DESCRIPTION  
NAME  
LINE SIDE HIGH SPEED DIFFERENTIAL I/Os  
NO.  
IN+  
IN  
33  
34  
Inverting and non-inverting differential inputs at the line side. IN+ and INhave an internal 50 Ω  
connected to an internal reference voltage. See Figure 8.  
I
OUT+  
OUT−  
30  
31  
Inverting and non-inverting differential outputs at the line side. OUT+ and OUThave an internal  
50 Ω connected to VCC.  
O
SWITCH SIDE HIGH SPEED DIFFERENTIAL I/Os  
IN0+  
IN0−  
6
7
Inverting and non-inverting differential inputs to the MUX at the switch side. IN0+ and IN0have  
an internal 50 Ω connected to an internal reference voltage. See Figure 8.  
I
IN1+  
IN1−  
25  
24  
Inverting and non-inverting differential inputs to the MUX at the switch side. IN1+ and IN1have  
an internal 50 Ω connected to an internal reference voltage. See Figure 8.  
I
OUT0+  
OUT0−  
3
4
Inverting and non-inverting differential outputs at the switch side. OUT0+ and OUT0have an  
O
O
internal 50 Ω connected to VCC  
Inverting and non-inverting differential outputs at the switch side. OUT1+ and OUT1have an  
internal 50 Ω connected to VCC  
.
OUT1+  
OUT1−  
22  
21  
.
CONTROL (3.3-V LVCMOS)  
DEL_0  
DEL_1  
18  
27  
DEL_0 and DEL_1 select the output pre-emphasis of the line side drivers (OUT±).  
DEL_0 and DEL_1 are internally pulled high.  
I
I
I
I
I
DES_0  
DES_1  
10  
1
DES_0 and DES_1 select the output pre-emphasis of the switch side drivers (OUT0±, OUT1±).  
DES_0 and DES_1 are internally pulled high.  
A logic low enables the input equalizer on the line side. EQL is internally pulled high. Default is  
with EQ disabled.  
EQL  
EQS  
LB0  
11  
36  
28  
A logic low enables the input equalizer on the switch side. EQS is internally pulled high. Default  
is with EQ disabled.  
A logic low at LB0 enables the internal loopback path from IN0± to OUT0±. LB0 is internally  
pulled high.  
A logic low at LB1 enables the internal loopback path from IN1± to OUT1±. LB1 is internally  
pulled high.  
LB1  
26  
19  
I
I
MUX  
A logic low at MUX selects IN1±. MUX is internally pulled high. Default state for MUX is IN0±.  
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SNLS244H SEPTEMBER 2006REVISED JANUARY 2016  
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Pin Functions (continued)  
PIN  
I/O  
DESCRIPTION  
NAME  
RSV  
NO.  
Reserve pin to support factory testing. This pin can be left open, or tied to GND, or tied to GND  
through an external pull-down resistor.  
17  
I
POWER  
2, 8, 9, 12,  
14, 16, 20,  
29, 35  
Ground reference. Each ground pin should be connected to the ground plane through a low  
inductance path, typically with a via located as close as possible to the landing pad of the GND  
pin.  
GND  
GND  
P
P
DAP is the metal contact at the bottom side, located at the center of the WQFN package. It  
should be connected to the GND plane with at least 16 via to lower the ground impedance and  
improve the thermal performance of the package.  
DAP  
VCC = 3.3 V ± 5%.  
Each VCC pin should be connected to the VCC plane through a low inductance path, typically with  
a via located as close as possible to the landing pad of the VCC pin.  
It is recommended to have a 0.01 μF or 0.1 μF, X7R, size-0402 bypass capacitor from each VCC  
pin to ground plane.  
5, 13, 15,  
23, 32  
VCC  
P
6 Specifications  
6.1 Absolute Maximum Ratings  
see(1)(2)  
MIN  
–0.3  
–0.3  
–0.3  
MAX  
4
UNIT  
V
Supply voltage (VCC  
)
CMOS/TTL input voltage  
VCC + 0.3  
VCC + 0.3  
150  
V
CML input/output voltage  
Junction temperature  
V
°C  
°C  
°C  
Lead temperature (soldering, 4 seconds)  
Storage temperature, Tstg  
260  
–65  
150  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended  
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) If Military/Aerospace specified devices are required, please contact the TI Sales Office/Distributors for availability and specifications.  
6.2 ESD Ratings  
VALUE  
UNIT  
Human-body model (HBM), 1.5 kΩ, 100 pF, per ANSI/ESDA/JEDEC JS-  
±6000  
001(1)  
V(ESD)  
Electrostatic discharge  
V
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)  
±1250  
±350  
Machine model  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
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SNLS244H SEPTEMBER 2006REVISED JANUARY 2016  
6.3 Recommended Operating Ratings  
MIN  
NOM  
MAX UNIT  
3.465  
100 mVPP  
Supply voltage (VCC – GND)  
Supply noise amplitude (10 Hz to 2 GHz)  
Ambient temperature  
3.135  
3.3  
V
–40  
85  
°C  
°C  
Case temperature  
100  
6.4 Thermal Information  
DS42MB100  
THERMAL METRIC(1)  
NJK (WQFN)  
36 PINS  
32.8  
UNIT  
RθJA  
Junction-to-ambient thermal resistance(2)  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
14.3  
6.2  
ψJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
0.2  
ψJB  
6.1  
RθJC(bot)  
1.9  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report, SPRA953.  
(2) Thermal resistances are based on having 16 thermal relief vias on the DAP pad under the 0 airflow condition.  
6.5 Electrical Characteristics  
Over recommended operating supply and temperature ranges unless otherwise specified.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP(1)  
MAX UNIT  
LVCMOS DC SPECIFICATIONS  
VIH  
VIL  
IIH  
High level input voltage  
Low level input voltage  
High level input current  
Low level input current  
Pull-high resistance  
2
–0.3  
–10  
75  
VCC + 0.3  
V
0.8  
10  
V
VIN = VCC  
µA  
µA  
kΩ  
IIL  
VIN = GND  
94  
35  
124  
RPU  
RECEIVER SPECIFICATIONS  
AC coupled differential Below 1.25 Gbps  
100  
100  
100  
1750  
1560  
1200  
Differential input voltage signal.  
Between 1.25 Gbps–3.125 Gbps  
Above 3.125 Gbps  
VID  
mVP-P  
range(2)  
This parameter is not  
tested at production.  
Common-mode voltage  
at receiver inputs  
VICM  
RITD  
Measured at receiver inputs reference to ground.  
1.3  
V
Input differential  
termination(3)  
On-chip differential termination between IN+ or IN.  
84  
100  
116  
Ω
(1) Typical parameters measured at VCC = 3.3 V, TA = 25°C, and represent most likely parametric norms at the time of product  
characterization. The typical specifications are not ensured.  
(2) This parameter is specified by design and/or characterization. It is not tested in production.  
(3) IN+ and INare generic names refer to one of the many pairs of complimentary inputs of the DS42MB100. OUT+ and OUTare  
generic names refer to one of the many pairs of the complimentary outputs of the DS42MB100. Differential input voltage VID is defined  
as |IN+–IN|. Differential output voltage VOD is defined as |OUT+–OUT|.  
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Electrical Characteristics (continued)  
Over recommended operating supply and temperature ranges unless otherwise specified.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP(1)  
MAX UNIT  
DRIVER SPECIFICATIONS  
RL = 100 Ω ±1%  
DES_1 = DES_0 = 0  
DEL_1 = DEL_0 = 0  
Driver pre-emphasis disabled.  
Running K28.7 pattern at 4.25 Gbps.  
See Figure 6 for test circuit.  
Output differential  
VODB  
voltage swing without  
1100  
1300  
1500 mVP-P  
pre-emphasis(4)  
RL = 100 Ω ±1%  
Running K28.7 pattern  
at  
DEx_[1:0] = 00  
0
–3  
–6  
DEx_[1:0] = 01  
DEx_[1:0] = 10  
4.25 Gbps  
Output pre-emphasis  
voltage ratio  
20 × log (VODPE /  
VODB)  
x = S for switch side  
pre-emphasis control  
x = L for line side pre-  
emphasis control  
See Figure 9 on  
waveform.  
VPE  
dB  
DEx_[1:0] = 11  
–9  
See Figure 6 for test  
circuit.  
Tested at 9-dB pre-emphasis level, DEx[1:0] = 11  
x = S for switch side pre-emphasis control  
x = L for line side pre-emphasis control  
TPE  
Pre-emphasis width  
125  
42  
188  
250  
58  
ps  
See Figure 3 on measurement condition.  
ROTSE Output termination(3)  
On-chip termination from OUT+ or OUTto VCC  
50  
Ω
Ω
Output differential  
ROTD  
On-chip differential termination between OUT+ and OUT−  
100  
termination  
ΔROTS Mismatch in output  
Mismatch in output terminations at OUT+ and OUT−  
5%  
termination resistors  
E
Output common mode  
voltage  
VOCM  
2.7  
V
POWER DISSIPATION  
VDD = 3.3 V at 25°C  
All outputs terminated by 100 Ω ±1%.  
DEL_[1:0] = 0, DES_[1:0] = 0  
PD  
Power dissipation  
0.45  
W
Running PRBS 27– 1 pattern at 4.25 Gbps  
AC CHARACTERISTICS  
See Figure 6 for test  
circuit.  
Alternating 1-0 pattern.  
EQ and pre-emphasis  
disabled.  
At 0.25 Gbps  
At 1.25 Gbps  
2
2
RJ  
Device random jitter(5)  
psrms  
At 4.25 Gbps  
2
See Figure 6 for test  
circuit.  
EQ and pre-emphasis  
disabled  
Between 0.25 and  
4.25 Gbps with PRBS7 pattern for  
DS42MB100 at –40°C to 85°C  
Device deterministic  
jitter(6)  
DJ  
35 psp-p  
DR  
Data rate(2)  
Tested with alternating 1-0 pattern  
0.25  
4.25 Gbps  
(4) K28.7 pattern is a 10-bit repeating pattern of K28.7 code group {001111 1000} K28.5 pattern is a 20-bit repeating pattern of +K28.5 and  
K28.5 code groups {110000 0101 001111 1010}  
(5) Device output random jitter is a measurement of the random jitter contribution from the device. It is derived by the equation  
sqrt(RJOUT2 – RJIN2), where RJOUT is the total random jitter measured at the output of the device in psrms, RJIN is the random jitter of the  
pattern generator driving the device.  
(6) Device output deterministic jitter is a measurement of the deterministic jitter contribution from the device. It is derived by the equation  
(DJOUT – DJIN), where DJOUT is the total peak-to-peak deterministic jitter measured at the output of the device in psp-p, DJIN is the peak-  
to-peak deterministic jitter of the pattern generator driving the device.  
6
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6.6 Switching Characteristics  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
Measured with a clock-like pattern at 4.25  
Gbps, between 20% and 80% of the differential  
output voltage. Pre-emphasis disabled.  
Transition time is measured with fixture as  
shown in Figure 6, adjusted to reflect the  
transition time at the output pins.  
Differential low to high transition  
time  
tR  
85  
ps  
Differential high to low transition  
time  
tF  
85  
ps  
Differential low to high propagation  
delay  
Measured at 50% differential voltage from input  
to output.  
tPLH  
1
ns  
Differential high to low propagation  
delay  
tPHL  
tSKP  
tSKO  
1
20  
ns  
ps  
ps  
Pulse skew  
|tPHL – tPLH|  
Difference in propagation delay among data  
paths in the same device.  
Output skew(1)  
100  
Difference in propagation delay between the  
same output from devices operating under  
identical condition.  
tSKPP  
Part-to-part skew  
MUX switch time  
100  
6
ps  
ns  
Measured from VIH or VIL of the MUX-control or  
loopback control to 50% of the valid differential  
output.  
tSM  
1.8  
(1) tSKO is the magnitude difference in the propagation delays among data paths. An example is the output skew among data paths from  
IN0± to OUT± and IN1± to OUT±.. Another example is the output skew among data paths from IN± to OUT0± and IN± to OUT1±. tSKO  
also refers to the delay skew of the loopback paths of the same port and between similar data paths. An example is the output skew  
among data paths IN0± to OUT0± and IN1± to OUT1±.  
80%  
80%  
0V  
VODB  
20%  
20%  
tR  
tF  
Figure 1. Driver Output Transition Time  
Lb  
50% ëLꢀ  
tPHL  
tPLH  
hÜÇ  
50% ëhꢀ  
Figure 2. Propagation Delay From Input To Output  
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1-bit  
tPE  
1 to N bits  
1-bit  
1 to N bits  
20%  
-9 dB  
80%  
0V  
Figure 3. Test Condition For Output Pre-Emphasis Duration  
6.7 Typical Characteristics  
42 ps/div  
50 ps/div  
Figure 4. PRBS-7, Pre-Emphasis = 0 dB at 4 Gbps  
Figure 5. PRBS-7, Pre-Emphasis = –9 dB at 4 Gbps  
7 Parameter Measurement Information  
Oscilloscope or  
Jitter Measurement  
Instrument  
DS42MB100 Test Fixture  
DC  
Block  
DC  
Pattern  
Block  
V
CC  
50W TL  
Generator  
DS42MB100  
Coax  
Coax  
Coax  
50+-1%  
50 +-1%  
D+  
D-  
INPUT  
25-inch  
TLine  
IN+  
IN-  
OUT+  
OUT-  
M
U
X
R
< 2"  
EQ  
D
Coax  
1000 mVpp  
Differential  
GND  
50W TL  
Figure 6. AC Test Circuit  
8
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8 Detailed Description  
8.1 Overview  
The DS42MB100 is a signal conditioning 2:1 multiplexer and a 1:2 buffer designed to support port redundancy  
with encoded or scrambled data rates between 0.25 and 4.25 Gbps. The DS42MB100 provides fixed  
equalization at the receive input and pre-emphasis control on the output in order to support signal reach  
extension.  
8.2 Functional Block Diagram  
DS42MB100  
1.5V  
50  
50  
VCC  
IN0+  
IN0-  
50  
50  
Input stage  
+ EQ  
M
U
X
OUT+  
OUT-  
CML  
driver  
IN1+  
IN1-  
Input stage  
+ EQ  
DE_L  
50  
50  
1.5V  
MUX  
LB0  
LB1  
VCC  
DE_S  
50  
50  
2
2
OUT0+  
M
U
X
IN+  
IN-  
CML  
driver  
OUT0-  
Input stage  
+EQ  
OUT1+  
2
2
M
U
X
50  
50  
CML  
1.5V  
driver  
OUT1-  
50  
EQ_L  
50  
DE_S  
DEL_0  
DE_L  
DE_S  
DEL_1  
VCC  
Pre-emphasis  
Control  
DES_0  
DES_1  
Figure 7. Simplified Block Diagram  
8.3 Feature Description  
The DS42MB100 MUX buffer consists of several key blocks:  
CML Inputs and EQ  
Multiplexer and Loopback Control  
CML Drivers and Pre-Emphasis Control  
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Feature Description (continued)  
8.3.1 CML inputs and EQ  
The high speed inputs are self-biased to about 1.3 V at IN+ and IN- and are designed for AC coupling, allowing  
the DS42MB100 to be inserted directly into the datapath without any limitation. See Figure 8 for details about the  
internal receiver input termination and bias circuit.  
VCC  
5k  
IN+  
50  
1.5V  
EQ  
50  
IN -  
3.9k  
180 pF  
Figure 8. Receiver Input Termination and Bias Circuit  
The inputs are compatible to most AC coupling differential signals such as LVDS, LVPECL, and CML. The ideal  
AC coupling capacitor value is often based on the lowest frequency component embedded within the serial link.  
A typical AC coupling capacitor value ranges between 100 and 1000 nF. Some specifications with scrambled  
data may require a larger coupling capacitor for optimal performance. To reduce unwanted parasitics around and  
within the AC coupling capacitor, a body size of 0402 is recommended. Figure 6 shows the AC coupling  
capacitor placement in an AC test circuit.  
Each input stage has a fixed equalizer that provides equalization to compensate about 5 dB (at 2 GHz) of  
transmission loss from a short backplane trace (about 10 inches backplane). EQ can be enabled or disabled with  
the EQL and EQS pins.  
Table 1. EQ Controls for Line and Switch Inputs  
PIN  
PIN VALUE  
EQUALIZER FUNCTION  
0
Enable equalization.  
Normal mode. Equalization disabled.  
EQL, EQS  
1 (default)  
8.3.2 Multiplexer and Loopback Control  
Table 2 and Table 3 provide details about how to configure the DS42MB100 multiplexer and loopback settings.  
Table 2. Logic Table for Multiplex Controls  
PIN  
PIN VALUE  
MUX FUNCTION  
0
MUX select switch input IN1±.  
MUX select switch input IN0±.  
MUX  
1 (default)  
Table 3. Logic Table for Loopback Controls  
PIN  
PIN VALUE  
LOOPBACK FUNCTION  
Enable loopback from IN0± to OUT0±.  
0
LB0  
1 (default)  
0
Normal mode. Loopback disabled.  
Enable loopback from IN1± to OUT1±.  
Normal mode. Loopback disabled.  
LB1  
1 (default)  
10  
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8.3.3 CML Drivers and Pre-Emphasis Control  
The output driver has pre-emphasis (driver-side equalization) to compensate the transmission loss of the  
backplane that it is driving. The driver conditions the output signal such that the lower frequency and higher  
frequency pulses reach approximately the same amplitude at the end of the backplane and minimize the  
deterministic jitter caused by the amplitude disparity. The DS42MB100 provides four steps of user-selectable pre-  
emphasis ranging from 0, –3, –6 and –9 dB to handle different lengths of backplane. Figure 9 shows a driver pre-  
emphasis waveform. The pre-emphasis duration is 188 ps nominal, corresponding to 0.8 unit intervals (UI) at  
4.25 Gbps. The pre-emphasis levels of switch-side and line-side can be individually programmed.  
1-bit  
1 to N bits  
1-bit  
1 to N bits  
0 dB  
- 3dB  
- 6dB  
- 9dB  
0V  
Figure 9. Driver Pre-Emphasis Differential Waveform (Showing All 4 Pre-Emphasis Steps)  
Table 4. Line-Side Pre-Emphasis Controls  
PRE-EMPHASIS LEVEL IN  
PRE-EMPHASIS LEVEL IN  
PRE-EMPHASIS IN dB  
(VODPE/VODB)  
TYPICAL FR4  
BOARD TRACE  
DEL_[1:0]  
mVPP  
(VODB)  
mVPP  
(VODPE)  
0 0  
0 1  
1 0  
1300  
1300  
1300  
1300  
920  
0
10 inches  
20 inches  
30 inches  
3  
6  
650  
1 1  
(default)  
1300  
461  
9  
40 inches  
Table 5. Switch-Side Pre-Emphasis Controls  
PRE-EMPHASIS LEVEL IN  
PRE-EMPHASIS LEVEL IN  
PRE-EMPHASIS IN dB  
(VODPE/VODB)  
TYPICAL FR4  
BOARD TRACE  
DES_[1:0]  
mVPP  
(VODB)  
mVPP  
(VODPE)  
0 0  
0 1  
1 0  
1300  
1300  
1300  
1300  
920  
0
10 inches  
20 inches  
30 inches  
3  
6  
650  
1 1  
(default)  
1300  
461  
9  
40 inches  
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9 Application and Implementation  
NOTE  
Information in the following applications sections is not part of the TI component  
specification, and TI does not warrant its accuracy or completeness. TI’s customers are  
responsible for determining suitability of components for their purposes. Customers should  
validate and test their design implementation to confirm system functionality.  
9.1 Application Information  
The DS42MB100 is a 2:1 MUX and 1:2 buffer that equalizes input data up to 4.25 Gbps and provides transmit  
pre-emphasis controls to improve overall signal reach. As a MUX buffer, the DS42MB100 is ideal for designs  
where there is a need for port sharing or redundancy as well as on-the-fly reorganization of routes and data  
connections.  
9.2 Typical Application  
A typical application for the DS42MB100 is shown in Figure 10 and Figure 11.  
Passive Backplane  
Line Cards  
SerDes  
DS42MB100  
SOA  
SOB  
SIA  
LI  
HT  
HR  
TD  
T_CLK  
PHY  
ASIC  
RD  
LO  
R_CLK  
SIB  
REFCLK  
Mux/Buf  
Clock  
Distribution  
mC  
ASIC or FPGA with integrated SerDes  
Switch Card 2  
Switch Card 1  
SerDes  
HT  
TD  
Switch  
ASIC  
T_CLK  
RD  
HR  
R_CLK  
REFCLK  
Clock  
Distribution  
ASIC or FPGA with integrated SerDes  
Figure 10. Network Switch System With Redundancy  
12  
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Typical Application (continued)  
DS42MB100  
1.5V  
50  
50  
2 x 0.01 mF  
VCC  
0402 -size  
IN0+  
From  
downstream  
transmitter  
50  
50  
Input stage  
+ EQ  
IN0-  
M
U
X
OUT+  
OUT-  
CML  
To Upstream  
receiver  
driver  
IN1+  
From  
downstream  
transmitter  
Input stage  
+ EQ  
IN1-  
DE_L  
2 x 0.01 mF  
0402 -size  
50  
50  
1.5V  
Control  
MUX  
LB0  
LB1  
VCC  
DE_S  
50  
50  
2
2
OUT0+  
OUT0-  
M
U
X
To  
IN+  
IN-  
CML  
driver  
downstream  
receiver  
From  
Upstream  
transmitter  
Input stage  
+EQ  
2 x 0.01 mF  
0402 -size  
2
2
OUT1+  
M
U
X
To  
50  
50  
CML  
downstream  
1.5V  
driver  
OUT1- receiver  
50  
DE_S  
50  
Control  
DEL_0  
DEL_1  
DE_L  
DE_S  
VCC  
Pre-emphasis  
Control  
DES_0  
DES_1  
GND pins  
and DAP  
VCC pins  
RSV  
3.3V  
4 x 0.01 mF  
X7R  
0402 -size  
Figure 11. DS42MB100 Connection Block Diagram  
9.2.1 Design Requirements  
In a typical design, the DS42MB100 equalizes a short backplane trace on its input, followed by a longer trace at  
the DS42MB100 output. In this application example, a 25-inch FR4 coupled micro-strip board trace is used in  
place of the short backplane link. A block diagram of this example is shown in Figure 12.  
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Typical Application (continued)  
(!)  
(.)  
(/)  
(5)  
Pattern  
Generator, 4 Gb/s  
DS42MB100  
Pre-Emph  
D
M
U
X
D+  
IN+  
IN-  
OUT+  
OUT-  
25-inch FR4  
board trace  
40-inch  
FR4 trace  
R
EQ  
D-  
7
2 -1 pattern  
Figure 12. Block Diagram of DS42MB100 Application Example  
The 25-inch microstrip board trace has approximately 6 dB of attenuation between 375 MHz and 1.875 GHz,  
representing closely the transmission loss of the short backplane transmission line. The 25-inch microstrip is  
connected between the pattern generator and the differential inputs of the DS42MB100 for AC measurements.  
Table 6. Input Trace Parameters  
FINISHED TRACE  
WIDTH W  
SEPARATION  
BETWEEN TRACES  
DIELECTRIC  
HEIGHT H  
DIELECTRIC  
CONSTANT εR  
TRACE LENGTH  
LOSS TANGENT  
25 inches  
8.5 mil  
11.5 mil  
6 mil  
3.8  
0.022  
The length of the output trace may vary based on system requirements. In this example, a 40-inch FR4 trace  
with similar trace width, separation, and dielectric characteristics, is placed at the DS42MB100 output.  
As with any high speed design, there are many factors which influence the overall performance. Following is a  
list of critical areas for consideration and study during design.  
Use 100-Ω impedance traces. Generally these are very loosely coupled to ease routing length differences.  
Place AC-coupling capacitors near to the receiver end of each channel segment to minimize reflections.  
The maximum body size for AC-coupling capacitors is 0402.  
Back-drill connector vias and signal vias to minimize stub length.  
Use reference plane vias to ensure a low inductance path for the return current.  
9.2.2 Detailed Design Procedure  
For optimal design, the DS42MB100 must be configured to route incoming data correctly as well as provide the  
best signal quality. The following design procedures should be observed:  
1. The DS42MB100 should be configured to provide the correct MUX and buffer routes in order to satisfy  
system requirements. In order to set the appropriate MUX control settings, refer to Table 2. To configure the  
buffer control settings, refer to Table 3. For example, consider the case where the designer wishes to route  
the input from Switch Card 0 (IN0±) to the output for the line card (OUT±). To accomplish this, set MUX = 1  
(select IN0±). For the other direction from line card output to switch card, set LB0 = 1 and LB1 = 1 so that the  
input from the line card is buffered to both Switch Card 0 (OUT0±) and Switch Card 1 (OUT1±).  
2. The DS42MB100 is designed to be placed at an offset location with respect to the overall channel  
attenuation. To optimize performance, determine whether input and output equalization is required. Set EQL  
= 0 and EQS = 0 to enable input equalization. The MUX buffer transmit pre-emphasis can be tuned to extend  
the trace length reach while also recovering a solid eye opening. To tune transmit pre-emphasis on either the  
line card side or switch card side, refer to Table 4 and Table 5 for recommended pre-emphasis control  
settings according to the length of FR4 board trace connected at the DS42MB100 output. For example, if 40  
inches of FR4 trace is connected to the switch card output, set DES_[1:0] = (1, 1) for VOD = 1200 mVpp and  
–9 dB of transmit pre-emphasis.  
14  
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9.2.3 Application Curves  
Figure 13 through Figure 18 show how the signal integrity varies at different places in the data path. These  
measured locations can be referenced back to the labeled points provided in Figure 12.  
Point (A): Output signal of source pattern generator  
Point (B): Input to DS42MB100 after 25 inches of FR4 trace from source  
Point (C): Output of DS42MB100 driver  
Point (D): Signal after 40 inches of FR4 trace from DS42MB100 driver  
The source signal is a PRBS-7 pattern at 4 Gbps. For the long output traces, the eye after 40 inches of output  
FR4 trace is significantly improved by adding –9 dB of pre-emphasis.  
50 ps/ꢀLë  
50 ps/ꢀLë  
Figure 14. Eye Measured at Point (B)  
Figure 13. Eye Measured at Point (A)  
50 ps/DIV  
50 ps/ꢀLë  
Figure 15. Eye Measured at Point (C),  
Pre-Emphasis = 0 dB  
Figure 16. Eye Measured at Point (D),  
Pre-Emphasis = 0 dB  
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50 ps/DIV  
50 ps/ꢀLë  
Figure 17. Eye Measured at Point (C),  
Pre-Emphasis = –9 dB  
Figure 18. Eye Measured at Point (D),  
Pre-Emphasis = –9 dB  
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10 Power Supply Recommendations  
The supply (VCC) and ground (GND) pins should be connected to power planes routed on adjacent layers of the  
printed circuit board. The layer thickness of the dielectric should be minimized so that the VCC and GND planes  
create a low inductance supply with distributed capacitance. Careful attention to supply bypassing through the  
proper use of bypass capacitors is required. A 0.01-μF or 0.1-μF bypass capacitor should be connected to each  
VCC pin such that the capacitor is placed as close as possible to the VCC pins. Smaller body size capacitors, such  
as 0402 body size, can help facilitate proper component placement. Refer to the VCC pin connections in  
Figure 11 for further details.  
11 Layout  
11.1 Layout Guidelines  
Use at least a four layer board with a power and ground plane. Closely-coupled differential lines of 100 Ω are  
typically recommended for differential interconnect. The closely coupled lines help to ensure that coupled noise  
will appear as common-mode and thus will be rejected by the receivers. Information on the WQFN style package  
is provided in AN-1187 Leadless Leadframe Package (LLP), SNOA401.  
11.2 Layout Example  
Stencil parameters such as aperture area ratio and the fabrication process have a significant impact on paste  
deposition. Inspection of the stencil prior to placement of the WQFN package is highly recommended to improve  
board assembly yields. If the via and aperture openings are not carefully monitored, the solder may flow  
unevenly through the DAP. Stencil parameters for aperture opening and via locations are shown in Figure 19. A  
layout example for the DS42MB100 is shown in Figure 20, where 16 stencil openings are used for the DAP  
alongside nine vias to GND.  
Figure 19. No Pullback WQFN, Single Row Reference Diagram  
Table 7. No Pullback WQFN Stencil Aperture Summary for DS42MB100  
NUMBER  
OF DAP  
APERTURE  
OPENINGS  
PCB I/O  
PAD SIZE  
(mm)  
PCB  
PITCH  
(mm)  
STENCIL I/O  
APERTURE  
(mm)  
STENCIL DAP  
APERTURE  
(mm)  
GAP BETWEEN  
DAP APERTURE  
(Dim A mm)  
PIN  
COUNT  
MKT  
DWG  
PCB DAP  
SIZE (mm)  
DEVICE  
DS42MB100  
36  
SQA36A  
0.25 × 0.6  
0.5  
4.6 × 4.6  
0.25 × 0.7  
1.0 × 1.0  
16  
0.2  
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Figure 20. 36-Pin WQFN Stencil Example of Via and Opening Placement  
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12 Device and Documentation Support  
12.1 Documentation Support  
12.1.1 Related Documentation  
For related documentation see the following:  
AN-1187 Leadless Leadframe Package (LLP), SNOA401  
12.2 Community Resources  
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective  
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of  
Use.  
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration  
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help  
solve problems with fellow engineers.  
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and  
contact information for technical support.  
12.3 Trademarks  
E2E is a trademark of Texas Instruments.  
All other trademarks are the property of their respective owners.  
12.4 Electrostatic Discharge Caution  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
12.5 Glossary  
SLYZ022 TI Glossary.  
This glossary lists and explains terms, acronyms, and definitions.  
13 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
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PACKAGE OPTION ADDENDUM  
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10-Dec-2020  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
DS42MB100TSQ/NOPB  
ACTIVE  
WQFN  
NJK  
36  
250  
RoHS & Green  
SN  
Level-3-260C-168 HR  
-40 to 85  
42MB100  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
9-Aug-2022  
TAPE AND REEL INFORMATION  
REEL DIMENSIONS  
TAPE DIMENSIONS  
K0  
P1  
W
B0  
Reel  
Diameter  
Cavity  
A0  
A0 Dimension designed to accommodate the component width  
B0 Dimension designed to accommodate the component length  
K0 Dimension designed to accommodate the component thickness  
Overall width of the carrier tape  
W
P1 Pitch between successive cavity centers  
Reel Width (W1)  
QUADRANT ASSIGNMENTS FOR PIN 1 ORIENTATION IN TAPE  
Sprocket Holes  
Q1 Q2  
Q3 Q4  
Q1 Q2  
Q3 Q4  
User Direction of Feed  
Pocket Quadrants  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
DS42MB100TSQ/NOPB WQFN  
NJK  
36  
250  
178.0  
16.4  
6.3  
6.3  
1.5  
12.0  
16.0  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
9-Aug-2022  
TAPE AND REEL BOX DIMENSIONS  
Width (mm)  
H
W
L
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
WQFN NJK 36  
SPQ  
Length (mm) Width (mm) Height (mm)  
208.0 191.0 35.0  
DS42MB100TSQ/NOPB  
250  
Pack Materials-Page 2  
MECHANICAL DATA  
NJK0036A  
SQA36A (Rev A)  
www.ti.com  
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