LM74700-Q1_V01 [TI]

LM74700-Q1 Low IQ Reverse Battery Protection Ideal Diode Controller;
LM74700-Q1_V01
型号: LM74700-Q1_V01
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
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LM74700-Q1 Low IQ Reverse Battery Protection Ideal Diode Controller

电池
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LM74700-Q1
SNOSD17G – OCTOBER 2017 – REVISED DECEMBER 2020  
LM74700-Q1 Low IQ Reverse Battery Protection Ideal Diode Controller  
1 Features  
3 Description  
AEC-Q100 qualified with the following results  
– Device temperature grade 1:  
–40°C to +125°C ambient operating  
temperature range  
– Device HBM ESD classification level 2  
– Device CDM ESD classification level C4B  
Functional Safety-Capable  
Documentation available to aid functional safety  
system design  
3.2-V to 65-V input range (3.9-V start up)  
–65-V reverse voltage rating  
The LM74700-Q1 is an automotive AEC Q100  
qualified ideal diode controller which operates in  
conjunction with an external N-channel MOSFET as  
an ideal diode rectifier for low loss reverse polarity  
protection with a 20-mV forward voltage drop. The  
wide supply input range of 3.2 V to 65 V allows control  
of many popular DC bus voltages such as 12-V, 24-V  
and 48-V automotive battery systems. The 3.2-V input  
voltage support is particularly well suited for severe  
cold crank requirements in automotive systems. The  
device can withstand and protect the loads from  
negative supply voltages down to –65 V.  
Charge pump for external N-Channel MOSFET  
20-mV ANODE to CATHODE forward voltage drop  
regulation  
The device controls the GATE of the MOSFET to  
regulate the forward voltage drop at 20 mV. The  
regulation scheme enables graceful turn off of the  
MOSFET during a reverse current event and ensures  
zero DC reverse current flow. Fast response (< 0.75  
µs) to Reverse Current Blocking makes the device  
suitable for systems with output voltage holdup  
requirements during ISO7637 pulse testing as well as  
power fail and input micro-short conditions.  
Enable pin feature  
1-µA shutdown current (EN=Low)  
80-µA operating quiescent current (EN=High)  
2.3-A peak gate turnoff current  
Fast response to reverse current blocking:  
< 0.75 µs  
Meets automotive ISO7637 transient requirements  
with a suitable TVS Diode  
Available in 6-pin and 8-pin SOT-23 Package 2.90  
mm × 1.60 mm  
The LM74700-Q1 controller provides a charge pump  
gate drive for an external N-channel MOSFET. The  
high voltage rating of LM74700-Q1 helps to simplify  
the system designs for automotive ISO7637  
protection. With the enable pin low, the controller is off  
and draws approximately 1 µA of current.  
2 Applications  
Automotive ADAS systems - camera  
Automotive infotainment systems - digital cluster,  
head unit  
Industrial factory automation - PLC  
Enterprise power supplies  
Device Information (1)  
PART NUMBER  
PACKAGE  
SOT-23 (6)  
SOT-23 (8)  
BODY SIZE (NOM)  
2.90 mm × 1.60 mm  
2.90 mm × 1.60 mm  
LM74700-Q1  
LM74700-Q1  
(1) For all available packages, see the orderable addendum at  
the end of the data sheet.  
Active ORing for redundant power  
VOUT  
VBATT  
TVS  
VOUT  
VGATE  
VBATT  
Voltage  
Regulator  
GATE CATHODE  
LM74700  
ANODE  
VCAP  
EN  
IBATT  
GND  
ON OFF  
Typical Application Schematic  
Reverse Current Blocking During Input Short  
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. UNLESS OTHERWISE NOTED, this document contains PRODUCTION  
DATA.  
 
 
 
LM74700-Q1  
SNOSD17G – OCTOBER 2017 – REVISED DECEMBER 2020  
www.ti.com  
Table of Contents  
1 Features............................................................................1  
2 Applications.....................................................................1  
3 Description.......................................................................1  
4 Revision History.............................................................. 2  
5 Pin Configuration and Functions...................................3  
6 Specifications.................................................................. 5  
6.1 Absolute Maximum Ratings........................................ 5  
6.2 ESD Ratings............................................................... 5  
6.3 Recommended Operating Conditions.........................5  
6.4 Thermal Information....................................................6  
6.5 Electrical Characteristics.............................................6  
6.6 Switching Characteristics............................................7  
7 Typical Characteristics................................................... 8  
8 Parameter Measurement Information.......................... 11  
9 Detailed Description......................................................12  
9.1 Overview...................................................................12  
9.2 Functional Block Diagram.........................................12  
9.3 Feature Description...................................................13  
9.4 Device Functional Modes..........................................15  
10 Application and Implementation................................16  
10.1 Application Information........................................... 16  
10.2 OR-ing Application Configuration............................22  
11 Power Supply Recommendations..............................22  
12 Layout...........................................................................23  
12.1 Layout Guidelines................................................... 23  
12.2 Layout Example...................................................... 24  
13 Device and Documentation Support..........................25  
13.1 Receiving Notification of Documentation Updates..25  
13.2 Support Resources................................................. 25  
13.3 Trademarks.............................................................25  
13.4 Electrostatic Discharge Caution..............................25  
13.5 Glossary..................................................................25  
14 Mechanical, Packaging, and Orderable  
Information.................................................................... 25  
4 Revision History  
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.  
Changes from Revision F (December 2019) to Revision G (December 2020)  
Page  
Updated the numbering format for tables, figures and cross-references throughout the document...................1  
Added DDF (SOT-23) package option to data sheet..........................................................................................1  
Relaxed VCAP specs in Electrical Characteristics table.................................................................................... 5  
Changes from Revision E (February 2019) to Revision F (December 2019)  
Page  
Added the Functional safety capable link to the Features section......................................................................1  
Changes from Revision D (January 2019) to Revision E (February 2019)  
Page  
Changed from Advance Information to Production Data ................................................................................... 1  
Changes from Revision C (November 2018) to Revision D (January 2019)  
Page  
Added Typical Characteristics section ...............................................................................................................8  
Added Parameter Measurement Information section .......................................................................................11  
Deleted Application Limitations section ........................................................................................................... 22  
Added Or-ing Application Configuration section ..............................................................................................22  
Changes from Revision B (October 2018) to Revision C (November 2018)  
Added footnotes to the Absolute Maximum Ratings and Recommended Operating Conditions tables in the  
Specifications section......................................................................................................................................... 5  
Page  
Changes from Revision A (March 2018) to Revision B (October 2018)  
Page  
Changes made in the Specifications and Application Limitations sections........................................................ 1  
Changes from Revision * (October 2017) to Revision A (March 2018)  
Page  
Multiple changes made throughout Data Sheet..................................................................................................1  
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SNOSD17G – OCTOBER 2017 – REVISED DECEMBER 2020  
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5 Pin Configuration and Functions  
VCAP  
GND  
EN  
ANODE  
1
2
3
6
5
4
GATE  
CATHODE  
Figure 5-1. DBV Package 6-Pin SOT-23 Top View  
Table 5-1. Pin Functions  
PIN  
I/O(1)  
DESCRIPTION  
NO.  
1
NAME  
VCAP  
GND  
O
G
I
Charge pump output. Connect to external charge pump capacitor  
Ground pin  
2
3
EN  
Enable pin. Can be connected to ANODE for always ON operation  
Cathode of the diode. Connect to the drain of the external N-channel MOSFET  
Gate drive output. Connect to gate of the external N-channel MOSFET  
4
CATHODE  
GATE  
I
5
O
Anode of the diode and input power. Connect to the source of the external N-channel  
MOSFET  
6
ANODE  
I
(1) I = Input, O = Output, G = GND  
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SNOSD17G – OCTOBER 2017 – REVISED DECEMBER 2020  
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EN  
CATHODE  
N.C  
1
2
3
4
8
7
GND  
N.C  
GATE  
6
5
ANODE  
VCAP  
Figure 5-2. DDF Package 8-Pin SOT-23 Top View  
Table 5-2. Pin Functions  
PIN  
I/O(1)  
DESCRIPTION  
NO.  
1
NAME  
EN  
I
Enable pin. Can be connected to ANODE for always ON operation  
2
GND  
N.C  
G
Ground pin  
3
No connection  
4
VCAP  
O
I
Charge pump output. Connect to external charge pump capacitor  
Anode of the diode and input power. Connect to the source of the external N-channel  
MOSFET  
5
ANODE  
6
7
8
GATE  
N.C  
O
Gate drive output. Connect to gate of the external N-channel MOSFET  
No connection  
CATHODE  
I
Cathode of the diode. Connect to the drain of the external N-channel MOSFET  
(1) I = Input, O = Output, G = GND  
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6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
–65  
MAX  
65  
UNIT  
ANODE to GND  
V
V
V
V
V
Input Pins  
EN to GND, V(ANODE) > 0 V  
EN to GND, V(ANODE) ≤ 0 V  
GATE to ANODE  
–0.3  
65  
V(ANODE)  
–0.3  
(65 + V(ANODE))  
15  
15  
Output Pins  
VCAP to ANODE  
–0.3  
Output to Input  
Pins  
CATHODE to ANODE  
–5  
75  
V
Operating junction temperature(2)  
–40  
–40  
150  
150  
°C  
°C  
Storage temperature, Tstg  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under  
Recommended Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device  
reliability.  
(2) High junction temperatures degrade operating lifetimes. Operating lifetime is de-rated for junction temperatures greater than 125°C.  
6.2 ESD Ratings  
VALUE  
UNIT  
Human body model (HBM), per AEC Q100-002(1)  
±2000  
Corner pins (VCAP, EN,  
ANODE, CATHODE)  
V(ESD)  
Electrostatic discharge  
±750  
±500  
V
Charged device model (CDM),  
per AEC Q100-011  
Other pins  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)(1)  
MIN  
NOM  
MAX  
60  
UNIT  
ANODE to GND  
CATHODE to GND  
EN to GND  
–60  
Input Pins  
60  
V
–60  
–70  
60  
Input to Output  
pins  
ANODE to CATHODE  
V
ANODE  
22  
nF  
µF  
External  
capacitance  
CATHODE, VCAP to ANODE  
0.1  
External  
MOSFET max GATE to ANODE  
VGS rating  
15  
V
TJ  
Operating junction temperature range(2)  
–40  
150  
°C  
(1) Recommended Operating Conditions are conditions under which the device is intended to be functional. For specifications and test  
conditions, see Electrical Characteristics.  
(2) High junction temperatures degrade operating lifetimes. Operating lifetime is de-rated for junction temperatures greater than 125°C.  
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6.4 Thermal Information  
LM74700-Q1  
DBV (SOT)  
6 PINS  
189.8  
LM74700-Q1  
DDF (SOT)  
8 PINS  
133.8  
THERMAL METRIC(1)  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
Junction-to-top characterization parameter  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
103.8  
72.6  
45.8  
54.5  
ΨJT  
19.4  
4.6  
Junction-to-board characterization  
parameter  
ΨJB  
45.5  
54.2  
°C/W  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report, SPRA953.  
6.5 Electrical Characteristics  
TJ = –40°C to +125°C; typical values at TJ = 25°C, V(ANODE) = 12 V, C(VCAP) = 0.1 µF, V(EN) = 3.3 V, over operating free-air  
temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
VANODE SUPPLY VOLTAGE  
V(ANODE)  
Operating input voltage  
4
60  
3.9  
V
V
VANODE POR Rising threshold  
VANODE POR Falling threshold  
V(ANODE POR)  
2.2  
2.8  
3.1  
V
V(ANODE POR(Hys)) VANODE POR Hysteresis  
0.44  
0.67  
1.5  
V
I(SHDN)  
Shutdown Supply Current  
V(EN) = 0 V  
0.9  
80  
µA  
µA  
I(Q)  
Operating Quiescent Current  
130  
ENABLE INPUT  
V(EN_IL)  
Enable input low threshold  
Enable input high threshold  
Enable Hysteresis  
0.5  
1.06  
0.52  
0.9  
2
1.22  
2.6  
1.35  
5
V
V(EN_IH)  
V(EN_Hys)  
I(EN)  
VANODE to VCATHODE  
V(AK REG)  
V
Enable sink current  
V(EN) = 12 V  
3
µA  
Regulated Forward V(AK) Threshold  
13  
34  
20  
50  
29  
57  
mV  
mV  
V(AK) threshold for full conduction  
mode  
V(AK)  
V(AK) threshold for reverse current  
blocking  
V(AK REV)  
–17  
–11  
–2  
mV  
Regulation Error AMP  
Transconductance(1)  
Gm  
1200  
1800  
3100 µA/V  
GATE DRIVE  
V(ANODE) – V(CATHODE) = 100 mV,  
V(GATE) – V(ANODE) = 5 V  
Peak source current  
3
11  
2370  
26  
mA  
mA  
µA  
V(ANODE) – V(CATHODE) = –20 mV,  
V(GATE) – V(ANODE) = 5 V  
I(GATE)  
Peak sink current  
V(ANODE) – V(CATHODE) = 0 V,  
V(GATE) – V(ANODE) = 5 V  
Regulation max sink current  
discharge switch RDSON  
6
V(ANODE) – V(CATHODE) = –20 mV,  
V(GATE) – V(ANODE) = 100 mV  
RDSON  
0.4  
2
CHARGE PUMP  
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6.5 Electrical Characteristics (continued)  
TJ = –40°C to +125°C; typical values at TJ = 25°C, V(ANODE) = 12 V, C(VCAP) = 0.1 µF, V(EN) = 3.3 V, over operating free-air  
temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
V(VCAP) – V(ANODE) = 7 V  
V(VCAP) – V(ANODE) = 14 V  
I(VCAP) ≤ 30 µA  
MIN  
TYP  
MAX UNIT  
Charge Pump source current (Charge  
pump on)  
162  
300  
600  
10  
µA  
µA  
V
I(VCAP)  
Charge Pump sink current (Charge  
pump off)  
5
Charge pump voltage at V(ANODE)  
3.2 V  
=
8
Charge pump turn on voltage  
Charge pump turn off voltage  
10.8  
11.6  
12.1  
13  
12.9  
13.9  
V
V
V(VCAP) – V(ANODE)  
Charge Pump Enable comparator  
Hysteresis  
0.54  
5.8  
0.9  
6.6  
1.36  
7.7  
6
V
V
V
V(VCAP) – V(ANODE) UV release at rising  
edge  
V(ANODE) – V(CATHODE) = 100 mV  
V(ANODE) – V(CATHODE) = 100 mV  
V(VCAP UVLO)  
V(VCAP) – V(ANODE) UV threshold at  
falling edge  
5.11  
5.68  
CATHODE  
V(ANODE) = 12 V, V(ANODE)  
V(CATHODE) = –100 mV  
1.7  
2
µA  
I(CATHODE)  
CATHODE sink current  
V(ANODE) – V(CATHODE) = –100 mV  
V(ANODE) = –12 V, V(CATHODE) = 12 V  
1.2  
2.2  
µA  
µA  
1.25  
2.06  
(1) Parameter guaranteed by design and characterization  
6.6 Switching Characteristics  
TJ = –40°C to +125°C; typical values at TJ = 25°C, V(ANODE) = 12 V, C(VCAP) = 0.1 µF, V(EN) = 3.3 V, over operating free-air  
temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
Enable (low to high) to Gate Turn On  
delay  
ENTDLY  
V(VCAP) > V(VCAP UVLOR)  
75  
110  
0.75  
2.6  
µs  
µs  
µs  
Reverse voltage detection to Gate Turn V(ANODE) – V(CATHODE) = 100 mV to –100  
Off delay mV  
tReverse delay  
tForward recovery  
0.45  
1.4  
Forward voltage detection to Gate Turn V(ANODE) – V(CATHODE) = –100 mV to 700  
On delay  
mV  
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7 Typical Characteristics  
6.5  
6
700  
650  
600  
550  
500  
450  
400  
350  
300  
250  
200  
150  
100  
50  
-40èC  
25èC  
5.5  
5
85èC  
125èC  
150èC  
4.5  
4
3.5  
3
2.5  
2
-40èC  
25èC  
1.5  
1
85èC  
125èC  
150èC  
0.5  
0
0
0
5
10 15 20 25 30 35 40 45 50 55 60 65  
VANODE (V)  
0
5
10 15 20 25 30 35 40 45 50 55 60 65  
VANODE (V)  
D001  
D005  
Figure 7-1. Shutdown Supply Current vs Supply Voltage  
Figure 7-2. Operating Quiescent Current vs Supply Voltage  
18  
16  
14  
12  
10  
8
1.8  
1.6  
1.4  
1.2  
1
0.8  
6
0.6  
-40èC  
-40èC  
25èC  
25èC  
4
2
0
0.4  
0.2  
0
85èC  
125èC  
150èC  
85èC  
125èC  
150èC  
0
10  
20  
30 40  
VANODE = VEN (V)  
50  
60  
70  
0
10  
20  
30 40  
VANODE (V)  
50  
60  
70  
D002  
D007  
Figure 7-3. Enable Sink Current vs Supply Voltage  
Figure 7-4. CATHODE Sink Current vs Supply Voltage  
350  
500  
-40èC  
450  
25èC  
300  
250  
200  
150  
85èC  
400  
125èC  
150èC  
350  
300  
250  
200  
150  
100  
50  
-40èC  
25èC  
100  
50  
0
85èC  
125èC  
150èC  
3
4.5  
6
7.5  
VANODE (V)  
9
10.5  
12  
0
2
4
6
VCAP (V)  
8
10  
12  
D012  
D013  
Figure 7-5. Charge Pump Current vs Supply Voltage at VCAP =  
6 V  
Figure 7-6. Charge Pump V-I Characteristics at VANODE > = 12  
V
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7 Typical Characteristics (continued)  
1.2  
1
225  
-40èC  
200  
175  
150  
125  
100  
75  
25èC  
85èC  
125èC  
150èC  
0.8  
0.6  
0.4  
0.2  
0
50  
25  
0
-50  
0
50  
100  
150  
200  
0
1
2
3
4 5  
VCAP (V)  
6
7
8
9
Temperature (èC)  
D014  
D025  
Figure 7-8. Enable Falling Threshold vs Temperature  
Figure 7-7. Charge Pump V-I Characteristics at VANODE = 3.2 V  
0.5  
2.06  
2.04  
2.02  
2
0.49  
0.48  
0.47  
0.46  
0.45  
0.44  
0.43  
1.98  
1.96  
1.94  
1.92  
1.9  
1.88  
1.86  
-50  
0
50  
100  
150  
200  
-50  
0
50  
100  
150  
200  
Temperature (èC)  
D015  
Temperature (èC)  
D024  
Figure 7-9. Reverse Current Blocking Delay vs Temperature  
Figure 7-10. Forward Recovery Delay vs Temperature  
90  
80  
70  
60  
50  
40  
30  
20  
13  
12.8  
12.6  
12.4  
12.2  
12  
11.8  
ENTDLY ON  
ENTDLY OFF  
VCAP OFF  
VCAP ON  
10  
0
11.6  
-50  
-50  
0
50  
100  
150  
200  
0
50  
100  
150 200  
Temperature (èC)  
Temperature (èC)  
D018  
D019  
Figure 7-11. Enable to Gate Delay vs Temperature  
Figure 7-12. Charge Pump ON/OFF Threshold vs Temperature  
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7 Typical Characteristics (continued)  
7
6.5  
6
3.5  
3
5.5  
5
2.5  
2
4.5  
4
3.5  
3
1.5  
1
2.5  
2
1.5  
1
0.5  
0
VCAP UVLOR  
VCAP UVLOF  
VANODE PORR  
VANODE PORF  
0.5  
0
-50 -25  
0
25  
50  
75 100 125 150 175 200  
-50  
0
50  
100  
150  
200  
Temperature (èC)  
Temperature (èC)  
D020  
D021  
Figure 7-13. Charge Pump UVLO Threshold vs Temperature  
Figure 7-14. VANODE POR Threshold vs Temperature  
100  
80  
60  
40  
20  
0
-20  
-40  
-60  
-80  
-100  
IGATE  
-20  
0
20  
VANODE-VCATHODE (mV)  
40  
60  
D022  
Figure 7-15. Gate Current vs Forward Voltage Drop  
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8 Parameter Measurement Information  
3.3 V  
0V  
VGATE  
90%  
0 V  
tENTDLY  
t
100 mV  
VANODE > VCATHODE  
0 mV  
VCATHODE > VANODE  
-100 mV  
VGATE  
10%  
0 V  
tTREVERSE DELAY  
t
700 mV  
VANODE > VCATHODE  
0 mV  
VCATHODE > VANODE  
-100 mV  
VGATE  
90%  
0 V  
tTFWD_RECOVERY  
t
Figure 8-1. Timing Waveforms  
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9 Detailed Description  
9.1 Overview  
The LM74700-Q1 ideal diode controller has all the features necessary to implement an efficient and fast reverse  
polarity protection circuit or be used in an ORing configuration while minimizing the number of external  
components. This easy to use ideal diode controller is paired with an external N-channel MOSFET to replace  
other reverse polarity schemes such as a P-channel MOSFET or a Schottky diode. An internal charge pump is  
used to drive the external N-Channel MOSFET to a maximum gate drive voltage of approximately 15 V. The  
voltage drop across the MOSFET is continuously monitored between the ANODE and CATHODE pins, and the  
GATE to ANODE voltage is adjusted as needed to regulate the forward voltage drop at 20 mV. This closed loop  
regulation scheme enables graceful turn off of the MOSFET during a reverse current event and ensures zero DC  
reverse current flow. A fast reverse current condition is detected when the voltage across ANODE and  
CATHODE pins reduces below –11 mV , resulting in the GATE pin being internally connected to the ANODE pin  
turning off the external N-channel MOSFET, and using the body diode to block any of the reverse current. An  
enable pin, EN is available to place the LM74700-Q1 in shutdown mode disabling the N-Channel MOSFET and  
minimizing the quiescent current.  
9.2 Functional Block Diagram  
CATHODE  
ANODE  
GATE  
VANODE  
VCAP  
COMPARATOR  
+
œ
Bias Rails  
VANODE  
+
50 mV  
œ
GM AMP  
+
œ
ENGATE  
VANODE  
VCAP_UV  
GATE DRIVER  
ENABLE  
LOGIC  
+
20 mV  
œ
VCAP_UV  
S
R
Q
Q
COMPARATOR  
+
œ
+
-11 mV  
œ
VANODE  
VANODE  
VCAP  
Charge Pump  
Enable Logic  
Charge  
Pump  
REVERSE  
PROTECTION  
LOGIC  
ENABLE LOGIC  
VCAP_UV  
VCAP  
VCAP  
EN  
GND  
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9.3 Feature Description  
9.3.1 Input Voltage  
The ANODE pin is used to power the LM74700-Q1's internal circuitry, typically drawing 80 µA when enabled and  
1 µA when disabled. If the ANODE pin voltage is greater than the POR Rising threshold, then LM74700-Q1  
operates in either shutdown mode or conduction mode in accordance with the EN pin voltage. The voltage from  
ANODE to GND is designed to vary from 65 V to –65 V, allowing the LM74700-Q1 to withstand negative voltage  
transients.  
9.3.2 Charge Pump  
The charge pump supplies the voltage necessary to drive the external N-channel MOSFET. An external charge  
pump capacitor is placed between VCAP and ANODE pins to provide energy to turn on the external MOSFET. In  
order for the charge pump to supply current to the external capacitor the EN pin voltage must be above the  
specified input high threshold, V(EN_IH). When enabled the charge pump sources a charging current of 300-µA  
typical. If EN pins is pulled low, then the charge pump remains disabled. To ensure that the external MOSFET  
can be driven above its specified threshold voltage, the VCAP to ANODE voltage must be above the  
undervoltage lockout threshold, typically 6.6 V, before the internal gate driver is enabled. Use Equation 1 to  
calculate the initial gate driver enable delay.  
V
(VCAP _UVLOR)  
T DRV _EN = 75ms + C(VCAP)  
x
(
)
300mA  
(1)  
where  
C(VCAP) is the charge pump capacitance connected across ANODE and VCAP pins  
V(VCAP_UVLOR) = 6.6 V (typical)  
. To remove any chatter on the gate drive approximately 900 mV of hysteresis is added to the VCAP  
undervoltage lockout. The charge pump remains enabled until the VCAP to ANODE voltage reaches 13 V,  
typically, at which point the charge pump is disabled decreasing the current draw on the ANODE pin. The charge  
pump remains disabled until the VCAP to ANODE voltage is below to 12.1 V typically at which point the charge  
pump is enabled. The voltage between VCAP and ANODE continue to charge and discharge between 12.1 V  
and 13 V as shown in Figure 9-1. By enabling and disabling the charge pump, the operating quiescent current of  
the LM74700-Q1 is reduced. When the charge pump is disabled it sinks 5-µA typical.  
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TON  
TDRV_EN  
TOFF  
VIN  
VANODE  
0V  
VEN  
13 V  
12.1 V  
VCAP-VANODE  
6.6 V  
V(VCAP UVLOR)  
GATE DRIVER  
ENABLE  
Figure 9-1. Charge Pump Operation  
9.3.3 Gate Driver  
The gate driver is used to control the external N-Channel MOSFET by setting the GATE to ANODE voltage to  
the corresponding mode of operation. There are three defined modes of operation that the gate driver operates  
under forward regulation, full conduction mode and reverse current protection, according to the ANODE to  
CATHODE voltage. Forward regulation mode, full conduction mode and reverse current protection mode are  
described in more detail in the Regulated conduction Mode, Full Conduction Mode and Reverse Current  
Production Mode sections. Figure 9-2 depicts how the modes of operation vary according to the ANODE to  
CATHODE voltage of the LM74700-Q1. The threshold between forward regulation mode and conduction mode is  
when the ANODE to CATHODE voltage is 50 mV. The threshold between forward regulation mode and reverse  
current protection mode is when the ANODE to CATHODE voltage is –11 mV.  
Reverse Current  
Protection Mode  
Full Conduction Mode  
Regulated Conduction Mode  
GATE connected  
to ANODE  
GATE connected  
to VCAP  
GATE to ANODE Voltage Regulated  
-11 mV  
0 mV  
20 mV  
50 mV  
VANODE œ VCATHODE  
Figure 9-2. Gate Driver Mode Transitions  
Before the gate driver is enabled following three conditions must be achieved:  
The EN pin voltage must be greater than the specified input high voltage.  
The VCAP to ANODE voltage must be greater than the undervoltage lockout voltage.  
The ANODE voltage must be greater than VANODE POR Rising threshold.  
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If the above conditions are not achieved, then the GATE pin is internally connected to the ANODE pin, assuring  
that the external MOSFET is disabled. Once these conditions are achieved the gate driver operates in the  
correct mode depending on the ANODE to CATHODE voltage.  
9.3.4 Enable  
The LM74700-Q1 has an enable pin, EN. The enable pin allows for the gate driver to be either enabled or  
disabled by an external signal. If the EN pin voltage is greater than the rising threshold, the gate driver and  
charge pump operates as described in Gate Driver and Charge Pump sections. If the enable pin voltage is less  
than the input low threshold, the charge pump and gate driver are disabled placing the LM74700-Q1 in shutdown  
mode. The EN pin can withstand a voltage as large as 65 V and as low as –65 V. This allows for the EN pin to  
be connected directly to the ANODE pin if enable functionality is not needed. In conditions where EN is left  
floating, the internal sink current of 3 uA pulls EN pin low and disables the device.  
9.4 Device Functional Modes  
9.4.1 Shutdown Mode  
The LM74700-Q1 enters shutdown mode when the EN pin voltage is below the specified input low threshold  
V(EN_IL). Both the gate driver and the charge pump are disabled in shutdown mode. During shutdown mode the  
LM74700-Q1 enters low IQ operation with the ANODE pin only sinking 1 µA. When the LM74700-Q1 is in  
shutdown mode, forward current flow through the external MOSFET is not interrupted but is conducted through  
the MOSFET's body diode.  
9.4.2 Conduction Mode  
Conduction mode occurs when the gate driver is enabled. There are three regions of operating during  
conduction mode based on the ANODE to CATHODE voltage of the LM74700-Q1. Each of the three modes is  
described in the Regulated Condution Mode, Full Conduction Mode and Reverse Current Protection Mode  
sections.  
9.4.2.1 Regulated Conduction Mode  
For the LM74700-Q1 to operate in regulated conduction mode, the gate driver must be enabled as described in  
the Gate Driver section and the current from source to drain of the external MOSFET must be within the range to  
result in an ANODE to CATHODE voltage drop of –11 mV to 50 mV. During forward regulation mode the ANODE  
to CATHODE voltage is regulated to 20 mV by adjusting the GATE to ANODE voltage. This closed loop  
regulation scheme enables graceful turn off of the MOSFET at very light loads and ensures zero DC reverse  
current flow.  
9.4.2.2 Full Conduction Mode  
For the LM74700-Q1 to operate in full conduction mode the gate driver must be enabled as described in the  
Gate Driver section and the current from source to drain of the external MOSFET must be large enough to result  
in an ANODE to CATHODE voltage drop of greater than 50-mV typical. If these conditions are achieved the  
GATE pin is internally connected to the VCAP pin resulting in the GATE to ANODE voltage being approximately  
the same as the VCAP to ANODE voltage. By connecting VCAP to GATE the external MOSFET's RDS(ON) is  
minimized reducing the power loss of the external MOSFET when forward currents are large.  
9.4.2.3 Reverse Current Protection Mode  
For the LM74700-Q1 to operate in reverse current protection mode, the gate driver must be enabled as  
described in the Gate Driver section and the current of the external MOSFET must be flowing from the drain to  
the source. When the ANODE to CATHODE voltage is typically less than –11 mV, reverse current protection  
mode is entered and the GATE pin is internally connected to the ANODE pin. The connection of the GATE to  
ANODE pin disables the external MOSFET. The body diode of the MOSFET blocks any reverse current from  
flowing from the drain to source.  
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10 Application and Implementation  
Note  
Information in the following applications sections is not part of the TI component specification, and TI  
does not warrant its accuracy or completeness. TI’s customers are responsible for determining  
suitability of components for their purposes, as well as validating and testing their design  
implementation to confirm system functionality.  
10.1 Application Information  
The LM74700-Q1 is used with N-Channel MOSFET controller in a typical reverse polarity protection application.  
The schematic for the 12-V battery protection application is shown in Figure 10-1 where the LM74700-Q1 is  
used in series with a battery to drive the MOSFET Q1. The TVS is not required for the LM74700-Q1 to operate,  
but they are used to clamp the positive and negative voltage surges. The output capacitor COUT is recommended  
to protect the immediate output voltage collapse as a result of line disturbance.  
10.1.1 Typical Application  
Q1  
Voltage  
Regulator  
COUT  
CIN  
VBAT  
GATE CATHODE  
LM74700  
EN  
TVS  
ANODE  
VCAP  
VCAP  
GND  
Figure 10-1. Typical Application Circuit  
10.1.1.1 Design Requirements  
A design example, with system design parameters listed in Table 10-1 is presented.  
Table 10-1. Design Parameters  
DESIGN PARAMETER  
EXAMPLE VALUE  
12-V Battery, 12-V Nominal with 3.2-V Cold Crank and 35-V Load  
Dump  
Input voltage range  
Output voltage  
Output current range  
3.2 V during Cold Crank to 35-V Load Dump  
3-A Nominal, 5-A Maximum  
Output capacitance  
1-µF Minimum, 47-µF Typical Hold Up Capacitance  
ISO 7637-2 and ISO 16750-2  
Automotive EMC Compliance  
10.1.1.2 Detailed Design Procedure  
10.1.1.2.1 Design Considerations  
Input operating voltage range, including cold crank and load dump conditions  
Nominal load current and maximum load current  
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10.1.1.2.2 MOSFET Selection  
The important MOSFET electrical parameters are the maximum continuous drain current ID, the maximum drain-  
to-source voltage VDS(MAX), the maximum source current through body diode and the drain-to-source On  
resistance RDSON  
.
The maximum continuous drain current, ID, rating must exceed the maximum continuous load current. The  
maximum drain-to-source voltage, VDS(MAX), must be high enough to withstand the highest differential voltage  
seen in the application. This would include any anticipated fault conditions. It is recommended to use MOSFETs  
with voltage rating up to 60-V maximum with the LM74700-Q1 because anode-cathode maximum voltage is 65  
V. The maximum VGS LM74700-Q1 can drive is 13 V, so a MOSFET with 15-V minimum VGS should be selected.  
If a MOSFET with < 15-V VGS rating is selected, a zener diode can be used to clamp VGS to safe level. During  
startup, inrush current flows through the body diode to charge the bulk hold-up capacitors at the output. The  
maximum source current through the body diode must be higher than the inrush current that can be seen in the  
application.  
To reduce the MOSFET conduction losses, lowest possible RDS(ON) is preferred, but selecting a MOSFET based  
on low RDS(ON) may not be beneficial always. Higher RDS(ON) will provide increased voltage information to  
LM74700-Q1's reverse comparator at a lower reverse current. Reverse current detection is better with increased  
RDS(ON). It is recommended to operate the MOSFET in regulated conduction mode during nominal load  
conditions and select RDS(ON) such that at nominal operating current, forward voltage drop VDS is close to 20-mV  
regulation point and not more than 50 mV.  
As a guideline, it is suggested to choose (20 mV / ILoad(Nominal)) ≤ RDS(ON) ≤ ( 50 mV / ILoad(Nominal)).  
MOSFET manufacturers usually specify RDS(ON) at 4.5-V VGS and 10-V VGS. RDS(ON) increases drastically below  
4.5-V VGS and RDS(ON) is highest when VGS is close to MOSFET Vth. For stable regulation at light load  
conditions, it is recommended to operate the MOSFET close to 4.5-V VGS, that is, much higher than MOSFET  
gate threshold voltage. It is recommended to choose MOSFET gate threshold voltage Vth of 2-V to 2.5-V  
maximum. Choosing a lower Vth MOSFET also reduces the turn ON time.  
Based on the design requirements, preferred MOSFET ratings are:  
60-V VDS(MAX) and ±20-V VGS(MAX)  
RDS(ON) at 3-A nominal current: (20 mV / 3A ) ≤ RDS(ON) ≤ ( 50 mV / 3A ) = 6.67 mΩ ≤ RDS(ON) ≤ 16.67 mΩ  
MOSFET gate threshold voltage Vth: 2V maximum  
DMT6007LFG MOSFET from Diodes Inc. is selected to meet this 12-V reverse battery protection design  
requirements and it is rated at:  
60-V VDS(MAX) and ±20-V VGS(MAX)  
RDS(ON) 6.5-mΩ typical and 8.5-mΩ maximum rated at 4.5-V VGS  
MOSFET Vth: 2-V maximum  
Thermal resistance of the MOSFET should be considered against the expected maximum power dissipation in  
the MOSFET to ensure that the junction temperature (TJ) is well controlled.  
10.1.1.2.3 Charge Pump VCAP, input and output capacitance  
Minimum required capacitance for charge pump VCAP and input/output capacitance are:  
VCAP: Minimum 0.1 µF is required; recommended value of VCAP (µF) ≥ 10 x CISS(MOSFET)(µF)  
CIN: minimum 22 nF of input capacitance  
COUT: minimum 100 nF of output capacitance  
10.1.1.3 Selection of TVS Diodes for 12-V Battery Protection Applications  
TVS diodes are used in automotive systems for protection against transients. In the 12-V battery protection  
application circuit shown in Figure 10-2, a bi-directional TVS diode is used to protect from positive and negative  
transient voltages that occur during normal operation of the car and these transient voltage levels and pulses are  
specified in ISO 7637-2 and ISO 16750-2 standards.  
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There are two important specifications are breakdown voltage and clamping voltage of the TVS. Breakdown  
voltage is the voltage at which the TVS diode goes into avalanche similar to a zener diode and is specified at a  
low current value typical 1 mA and the breakdown voltage should be higher than worst case steady state  
voltages seen in the system. The breakdown voltage of the TVS+ should be higher than 24-V jump start voltage  
and 35-V suppressed load dump voltage and less than the maximum ratings of LM74700-Q1 (65 V). The  
breakdown voltage of TVS- should be beyond than maximum reverse battery voltage –16 V, so that the TVS- is  
not damaged due to long time exposure to reverse connected battery.  
Clamping voltage is the voltage the TVS diode clamps in high current pulse situations and this voltage is much  
higher than the breakdown voltage. TVS diodes are meant to clamp transient pulses and should not interfere  
with steady state operation. In the case of an ISO 7637-2 pulse 1, the input voltage goes up to –150 V with a  
generator impedance of 10 Ω. This translates to 15 A flowing through the TVS - and the voltage across the TVS  
would be close to its clamping voltage.  
Q1  
Voltage  
Regulator  
COUT  
47 µF  
CIN  
22 nF  
VBAT  
GATE CATHODE  
LM74700  
EN  
TVS  
SMBJ33CA  
ANODE  
VCAP  
0.1 µF  
VCAP  
GND  
Figure 10-2. Typical 12-V Battery Protection with Single Bi-Directional TVS  
The next criterion is that the absolute maximum rating of Anode to Cathode reverse voltage of the LM74700-Q1  
(–75 V) and the maximum VDS rating MOSFET are not exceeded. In the design example, 60-V rated MOSFET is  
chosen and maximum limit on the cathode to anode voltage is 60 V.  
In case of ISO 7637-2 pulse 1, the anode of LM74700-Q1 is pulled down by the ISO pulse and clamped by  
TVS-. The MOSFET is turned off quickly to prevent reverse current from discharging the bulk output capacitors.  
When the MOSFET turns off, the cathode to anode voltage seen is equal to (TVS Clamping voltage + Output  
capacitor voltage). If the maximum voltage on output capacitor is 16 V (maximum battery voltage), then the  
clamping voltage of the TVS- should not exceed, (60 V – 16) V = –44 V.  
The SMBJ33CA TVS diode can be used for 12-V battery protection application. The breakdown voltage of 36.7  
V meets the jump start, load dump requirements on the positive side and 16-V reverse battery connection on the  
negative side. During ISO 7637-2 pulse 1 test, the SMBJ33CA clamps at –44 V with 15 A of peak surge current  
as shown in Figure 10-5 and it meets the clamping voltage ≤ 44 V.  
SMBJ series of TVS' are rated up to 600-W peak pulse power levels. This is sufficient for ISO 7637-2 pulses and  
suppressed load dump (ISO-16750-2 pulse B).  
10.1.1.4 Selection of TVS Diodes and MOSFET for 24-V Battery Protection Applications  
Typical 24-V battery protection application circuit shown in Figure 10-3 uses two uni-directional TVS diodes to  
protect from positive and negative transient voltages.  
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Q1  
TVS+  
SMBJ58A  
Voltage  
Regulator  
COUT  
47 µF  
CIN  
22 nF  
VBAT  
GATE CATHODE  
LM74700  
EN  
ANODE  
VCAP  
0.1 µF  
VCAP  
TVS-  
SMBJ26A  
GND  
Figure 10-3. Typical 24-V Battery Protection with Two Uni-Directional TVS  
The breakdown voltage of the TVS+ should be higher than 48-V jump start voltage, less than the absolute  
maximum ratings of anode and enable pin of LM74700-Q1 (65 V) and should withstand 65-V suppressed load  
dump. The breakdown voltage of TVS- should be lower than maximum reverse battery voltage –32 V, so that the  
TVS- is not damaged due to long time exposure to reverse connected battery.  
During ISO 7637-2 pulse 1, the input voltage goes up to –600 V with a generator impedance of 50 Ω. This  
translates to 12 A flowing through the TVS-. The clamping voltage of the TVS- cannot be same as that of 12-V  
battery protection circuit. Because during the ISO 7637-2 pulse, the Anode to Cathode voltage seen is equal to  
(-TVS Clamping voltage + Output capacitor voltage). For a 24-V battery application, the maximum battery  
voltage is 32 V, then the clamping voltage of the TVS- should not exceed, 75 V – 32 V = 43 V.  
Single bi-directional TVS cannot be used for 24-V battery protection because breakdown voltage for TVS+ ≥ 65  
V, maximum clamping voltage is ≤ 43 V and the clamping voltage cannot be less than the breakdown voltage.  
Two un-directional TVS connected back-back needs to be used at the input. For positive side TVS+, SMBJ58A  
with the breakdown voltage of 64.4 V (minimum), 67.8 (typical) is recommended. For the negative side TVS-,  
SMBJ26A with breakdown voltage close to 32 V (to withstand maximum reverse battery voltage –32 V) and  
maximum clamping voltage of 42.1 V is recommended.  
For 24-V battery protection, a 75-V rated MOSFET is recommended to be used along with SMBJ26A and  
SMBJ58A connected back-back at the input.  
10.1.1.5 Application Curves  
VOUT  
VGATE  
GATE TURNS OFF QUICKLY WITHIN1 s  
VIN  
TVS CLAMPING AT -42 V  
IIN  
Figure 10-4. ISO 7637-2 Pulse 1  
Time (5 ms/DIV)  
Figure 10-5. Response to ISO 7637-2 Pulse 1  
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VIN  
VIN  
VGS FOLLOWS VCAP-ANODE AT 5.8A  
VGS 4V: 3A LOAD CURRENT  
VOUT  
VOUT  
VGATE  
VGATE  
IIN  
IIN  
Time (2 ms/DIV)  
Time (2 ms/DIV)  
Figure 10-7. Startup with 5.8-A Load  
Figure 10-6. Startup with 3-A Load  
GATE TURNS ON AT VCAP-ANODE:  
6.6V  
VGS FOLLOWS VCAP-ANODE AT 5.8A  
VIN  
VIN  
VVCAP  
VVCAP  
VGATE  
IIN  
VGATE  
IIN  
Time (5 ms/DIV)  
Time (5 ms/DIV)  
Figure 10-9. VCAP During Startup at 5.8-A Load  
Figure 10-8. VCAP During Startup at 3-A Load  
VIN  
VIN  
ENABLE THRESHOLD: 2V  
VEN  
VEN  
ENABLE TURN ON DELAY  
VGATE  
VGATE  
IIN  
IIN  
Time (5 ms/DIV)  
Time (100 µs/DIV)  
Figure 10-10. Enable Threshold  
Figure 10-11. Enable Turn ON Delay  
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VIN1  
VIN1  
VOUT  
VOUT  
VOUT SWITCHES to VIN2 15V  
VOUT SWITCHES to VIN2 15 V  
VGATE1  
VGATE1  
IIN1  
IIN2  
VIN2 SUPPLIES LOAD CURRENT  
Time (5 ms/DIV)  
Time (5 ms/DIV)  
Figure 10-13. ORing VIN1 to VIN2 Switch Over  
Figure 10-12. ORing VIN1 to VIN2 Switch Over  
VIN1  
VIN1  
VOUT SWITCHES to VIN1: 12V  
VOUT  
VOUT SWITCHES to VIN1: 12V  
VOUT  
VGATE1  
VGATE1  
IIN2  
VIN1 SUPPLIES LOAD CURRENT  
IIN1  
Time (5 ms/DIV)  
Time (5 ms/DIV)  
Figure 10-15. ORing VIN2 to VIN1 Switch Over  
Figure 10-14. ORing VIN2 to VIN1 Switch Over  
VOUT  
VIN1  
VIN1  
VOUT  
VIN2  
VGATE1  
IIN1  
IIN2  
Time (10 ms/DIV)  
Time (5 ms/DIV)  
Figure 10-17. ORing - VIN2 Failure and Switch Over  
to VIN1  
Figure 10-16. ORing - VIN2 Failure and Switch Over  
to VIN1  
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10.2 OR-ing Application Configuration  
Basic redundant power architecture comprises of two or more voltage or power supply sources driving a single  
load. In its simplest form, the OR-ing solution for redundant power supplies consists of Schottky OR-ing diodes  
that protect the system against an input power supply fault condition. A diode OR-ing device provides effective  
and low cost solution with few components. However, the diodes forward voltage drops affects the efficiency of  
the system permanently, since each diode in an OR-ing application spends most of its time in forward conduction  
mode. These power losses increase the requirements for thermal management and allocated board space.  
The LM74700-Q1 ICs combined with external N-Channel MOSFETs can be used in OR-ing Solution as shown in  
Figure 10-18. The forward diode drop is reduced as the external N-Channel MOSFET is turned ON during  
normal operation. LM74700-Q1 quickly detects the reverse current, pulls down the MOSFET gate fast, leaving  
the body diode of the MOSFET to block the reverse current flow. An effective OR-ing solution needs to be  
extremely fast to limit the reverse current amount and duration. The LM74700-Q1 devices in OR-ing  
configuration constantly sense the voltage difference between Anode and Cathode pins, which are the voltage  
levels at the power sources (VIN1, VIN2) and the common load point respectively. The source to drain voltage  
VDS for each MOSFET is monitored by the Anode and Cathode pins of the LM74700-Q1. A fast comparator  
shuts down the Gate Drive through a fast Pull-Down within 0.45 μs (typical) as soon as V(IN) – V(OUT) falls below  
–11 mV. It turns on the Gate with 11-mA gate charge current once the differential forward voltage V(IN) – V(OUT)  
exceeds 50 mV.  
VIN1  
GATE CATHODE  
EN  
ANODE  
LM74700  
VOUT  
VCAP  
GND  
LOAD  
COUT  
VIN2  
GATE CATHODE  
EN  
ANODE  
LM74700  
VCAP  
GND  
Figure 10-18. Typical OR-ing Application  
Figure 10-12 to Figure 10-15 show the smooth switch over between two power supply rails VIN1 at 12 V and VIN2  
at 15 V. Figure 10-16 and Figure 10-17 illustrate the performance when VIN2 fails. LM74700-Q1 controlling VIN2  
power rail turns off quickly, so that the output remains uninterrupted and VIN1 is protected from VIN2 failure.  
11 Power Supply Recommendations  
The LM74700-Q1 Ideal Diode Controller designed for the supply voltage range of 3.2 V ≤ VANODE ≤ 65 V. If the  
input supply is located more than a few inches from the device, an input ceramic bypass capacitor higher than  
22 nF is recommended. To prevent LM74700-Q1 and surrounding components from damage under the  
conditions of a direct output short circuit, it is necessary to use a power supply having over load and short circuit  
protection.  
Copyright © 2020 Texas Instruments Incorporated  
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LM74700-Q1  
SNOSD17G – OCTOBER 2017 – REVISED DECEMBER 2020  
www.ti.com  
12 Layout  
12.1 Layout Guidelines  
Connect ANODE, GATE and CATHODE pins of LM74700-Q1 close to the MOSFET's SOURCE, GATE and  
DRAIN pins.  
The high current path of for this solution is through the MOSFET, therefore it is important to use thick traces  
for source and drain of the MOSFET to minimize resistive losses.  
The charge pump capacitor across VCAP and ANODE pins must be kept away from the MOSFET to lower  
the thermal effects on the capacitance value.  
The Gate pin of the LM74700-Q1 must be connected to the MOSFET gate with short trace. Avoid excessively  
thin and long trace to the Gate Drive.  
Keep the GATE pin close to the MOSFET to avoid increase in MOSFET turn-off delay due to trace  
resistance.  
Obtaining acceptable performance with alternate layout schemes is possible, however the layout shown in  
the Layout Example is intended as a guideline and to produce good results.  
Copyright © 2020 Texas Instruments Incorporated  
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Product Folder Links: LM74700-Q1  
 
 
LM74700-Q1  
SNOSD17G – OCTOBER 2017 – REVISED DECEMBER 2020  
www.ti.com  
12.2 Layout Example  
Signal VIA  
Thermal VIA  
Top Layer  
Input TVS  
CIN  
VIN Plane  
CVCAP  
VCAP  
ANODE  
GATE  
MOSFET SOURCE  
GND  
EN  
GND Plane  
CATHODE  
Enable  
Control  
COUT  
MOSFET DRAIN  
VOUT Plane  
Figure 12-1. LM74700-Q1 DBV Package Example Layout  
MOSFET DRAIN  
Signal Via  
Power Via  
Top layer  
MOSFET SOURCE  
VOUT PLANE  
VIN PLANE  
INPUT  
TVS  
COUT  
CIN  
CVCAP  
GND PLANE  
Figure 12-2. LM74700-Q1 DDF Package Example Layout  
Copyright © 2020 Texas Instruments Incorporated  
24  
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Product Folder Links: LM74700-Q1  
 
LM74700-Q1  
SNOSD17G – OCTOBER 2017 – REVISED DECEMBER 2020  
www.ti.com  
13 Device and Documentation Support  
13.1 Receiving Notification of Documentation Updates  
To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on  
Subscribe to updates to register and receive a weekly digest of any product information that has changed. For  
change details, review the revision history included in any revised document.  
13.2 Support Resources  
TI E2Esupport forums are an engineer's go-to source for fast, verified answers and design help — straight  
from the experts. Search existing answers or ask your own question to get the quick design help you need.  
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do  
not necessarily reflect TI's views; see TI's Terms of Use.  
13.3 Trademarks  
TI E2Eis a trademark of Texas Instruments.  
All trademarks are the property of their respective owners.  
13.4 Electrostatic Discharge Caution  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled  
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may  
be more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
13.5 Glossary  
TI Glossary  
This glossary lists and explains terms, acronyms, and definitions.  
14 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
Copyright © 2020 Texas Instruments Incorporated  
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PACKAGE OPTION ADDENDUM  
www.ti.com  
1-Jan-2021  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
LM74700QDBVRQ1  
LM74700QDBVTQ1  
LM74700QDDFRQ1  
ACTIVE  
ACTIVE  
SOT-23  
SOT-23  
DBV  
DBV  
DDF  
6
6
8
3000 RoHS & Green  
250 RoHS & Green  
3000 RoHS & Green  
NIPDAU  
Level-2-260C-1 YEAR  
Level-2-260C-1 YEAR  
Level-1-260C-UNLIM  
-40 to 125  
-40 to 125  
-40 to 125  
M747  
M747  
747F  
NIPDAU  
NIPDAU  
ACTIVE SOT-23-THIN  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
1-Jan-2021  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Jan-2021  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
LM74700QDBVRQ1  
LM74700QDBVTQ1  
LM74700QDDFRQ1  
SOT-23  
SOT-23  
DBV  
DBV  
DDF  
6
6
8
3000  
250  
180.0  
180.0  
180.0  
8.4  
8.4  
8.4  
3.2  
3.2  
3.2  
3.2  
3.2  
3.2  
1.4  
1.4  
1.4  
4.0  
4.0  
4.0  
8.0  
8.0  
8.0  
Q3  
Q3  
Q3  
SOT-  
3000  
23-THIN  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
5-Jan-2021  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
LM74700QDBVRQ1  
LM74700QDBVTQ1  
LM74700QDDFRQ1  
SOT-23  
SOT-23  
DBV  
DBV  
DDF  
6
6
8
3000  
250  
213.0  
213.0  
210.0  
191.0  
191.0  
185.0  
35.0  
35.0  
35.0  
SOT-23-THIN  
3000  
Pack Materials-Page 2  
PACKAGE OUTLINE  
DBV0006A  
SOT-23 - 1.45 mm max height  
S
C
A
L
E
4
.
0
0
0
SMALL OUTLINE TRANSISTOR  
C
3.0  
2.6  
0.1 C  
1.75  
1.45  
B
1.45 MAX  
A
PIN 1  
INDEX AREA  
1
2
6
5
2X 0.95  
1.9  
3.05  
2.75  
4
3
0.50  
6X  
0.25  
C A B  
0.15  
0.00  
0.2  
(1.1)  
TYP  
0.25  
GAGE PLANE  
0.22  
0.08  
TYP  
8
TYP  
0
0.6  
0.3  
TYP  
SEATING PLANE  
4214840/B 03/2018  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. Body dimensions do not include mold flash or protrusion. Mold flash and protrusion shall not exceed 0.15 per side.  
4. Leads 1,2,3 may be wider than leads 4,5,6 for package orientation.  
5. Refernce JEDEC MO-178.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
DBV0006A  
SOT-23 - 1.45 mm max height  
SMALL OUTLINE TRANSISTOR  
PKG  
6X (1.1)  
1
6X (0.6)  
6
SYMM  
5
2
3
2X (0.95)  
4
(R0.05) TYP  
(2.6)  
LAND PATTERN EXAMPLE  
EXPOSED METAL SHOWN  
SCALE:15X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL UNDER  
SOLDER MASK  
METAL  
EXPOSED METAL  
EXPOSED METAL  
0.07 MIN  
ARROUND  
0.07 MAX  
ARROUND  
NON SOLDER MASK  
DEFINED  
SOLDER MASK  
DEFINED  
(PREFERRED)  
SOLDER MASK DETAILS  
4214840/B 03/2018  
NOTES: (continued)  
6. Publication IPC-7351 may have alternate designs.  
7. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
DBV0006A  
SOT-23 - 1.45 mm max height  
SMALL OUTLINE TRANSISTOR  
PKG  
6X (1.1)  
1
6X (0.6)  
6
SYMM  
5
2
3
2X(0.95)  
4
(R0.05) TYP  
(2.6)  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
SCALE:15X  
4214840/B 03/2018  
NOTES: (continued)  
8. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
9. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
PACKAGE OUTLINE  
DDF0008A  
SOT-23 - 1.1 mm max height  
S
C
A
L
E
4
.
0
0
0
PLASTIC SMALL OUTLINE  
C
2.95  
2.65  
SEATING PLANE  
TYP  
PIN 1 ID  
AREA  
0.1 C  
A
6X 0.65  
8
1
2.95  
2.85  
NOTE 3  
2X  
1.95  
4
5
0.4  
0.2  
8X  
0.1  
C A  
B
1.65  
1.55  
B
1.1 MAX  
0.20  
0.08  
TYP  
SEE DETAIL A  
0.25  
GAGE PLANE  
0.1  
0.0  
0 - 8  
0.6  
0.3  
DETAIL A  
TYPICAL  
4222047/B 11/2015  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not  
exceed 0.15 mm per side.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
DDF0008A  
SOT-23 - 1.1 mm max height  
PLASTIC SMALL OUTLINE  
8X (1.05)  
SYMM  
1
8
8X (0.45)  
SYMM  
6X (0.65)  
5
4
(R0.05)  
TYP  
(2.6)  
LAND PATTERN EXAMPLE  
SCALE:15X  
SOLDER MASK  
OPENING  
SOLDER MASK  
OPENING  
METAL UNDER  
SOLDER MASK  
METAL  
SOLDER MASK  
DEFINED  
NON SOLDER MASK  
DEFINED  
SOLDER MASK DETAILS  
4222047/B 11/2015  
NOTES: (continued)  
4. Publication IPC-7351 may have alternate designs.  
5. Solder mask tolerances between and around signal pads can vary based on board fabrication site.  
www.ti.com  
EXAMPLE STENCIL DESIGN  
DDF0008A  
SOT-23 - 1.1 mm max height  
PLASTIC SMALL OUTLINE  
8X (1.05)  
SYMM  
(R0.05) TYP  
8
1
8X (0.45)  
SYMM  
6X (0.65)  
5
4
(2.6)  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
SCALE:15X  
4222047/B 11/2015  
NOTES: (continued)  
6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
7. Board assembly site may have different recommendations for stencil design.  
www.ti.com  
IMPORTANT NOTICE AND DISCLAIMER  
TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATASHEETS), DESIGN RESOURCES (INCLUDING REFERENCE  
DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”  
AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY  
IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD  
PARTY INTELLECTUAL PROPERTY RIGHTS.  
These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate  
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Copyright © 2021, Texas Instruments Incorporated  

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