SMJ320C50AHFG50 [TI]
16-BIT, 50MHz, OTHER DSP, CQFP132, CERAMIC, QFP-132;型号: | SMJ320C50AHFG50 |
厂家: | TEXAS INSTRUMENTS |
描述: | 16-BIT, 50MHz, OTHER DSP, CQFP132, CERAMIC, QFP-132 时钟 外围集成电路 |
文件: | 总37页 (文件大小:959K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
HFG PACKAGE
(TOP VIEW)
D Military Operating Temperature Range:
-- 5 5 °C to 125°C
D Processed to MIL-PRF-38535
D Fast Instruction Cycle Time (30 ns and
40 ns)
1
99
67
D Source-Code Compatible With All C1x
and C2x Devices
D RAM-Based Operation
-- 9 K × 16-Bit Single-Cycle On-Chip
Program/Data RAM
-- 1056 × 16-Bit Dual-Access On-Chip
Data RAM
33
D 2K × 16-Bit On-Chip Boot ROM
D 224K × 16-Bit Maximum Addressable
External Memory Space (64K Program,
64K Data, 64K I/O, and 32K Global)
GFA PACKAGE
(TOP VIEW)
D 32-Bit Arithmetic Logic Unit (ALU)
-- 32-bit Accumulator (ACC)
A
C
B
-- 32-Bit Accumulator Buffer (ACCB)
D
F
E
G
J
D 16-Bit Parallel Logic Unit (PLU)
D 16 × 16-Bit Multiplier, 32-Bit Product
D 11 Context-Switch Registers
H
K
L
M
P
T
D Two Buffers for Circular Addressing
D Full-Duplex Synchronous Serial Port
D Time-Division Multiplexed Serial Port (TDM)
D Timer With Control and Counter Registers
N
R
U
W
V
2
4
6
8 10 12 14 16 18
7 9 11 13 15 17 19
1
3
5
D 16 Software Programmable Wait-State
Generators
PQ PACKAGE
(TOP VIEW)
D Divide-by-One Clock Option
D IEEE 1149.1† Boundary Scan Logic
D Operations Are Fully Static
1 132
117
17
18
116
D Enhanced Performance Implanted CMOS
(EPIC™) Technology Fabricated by Texas
Instruments
D Packaging
-- 141-Pin Ceramic Grid Array (GFA Suffix)
-- 132-Lead Ceramic Quad Flat Package
(HFG Suffix)
-- 132-Lead Plastic Quad Flat Package
(PQ Suffix)
84
50
51
83
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
†
IEEE Standard 1149.1-1990 Standard-Test-Access Port and Boundary Scan Architecture
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright © 1998, Texas Instruments Incorporated
On products compliant to MIL-STD-883, Class B, all parameters are
tested unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
1
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
description
The SMJ320C50 digital signal processor (DSP) is a high-performance, 16-bit, fixed-point processor
manufactured in 0.72-μm double-level metal CMOS technology. The SMJ320C50 is the first DSP from TI
designed as a fully static device. Full-static CMOS design contributes to low power consumption while
maintaining high performance, making it ideal for applications such as battery-operated communications
systems, satellite systems, and advanced control algorithms.
A number of enhancements to the basic SMJ320C2x architecture give the C50 a minimum 2× performance over
the previous generation. A four-deep instruction pipeline, that incorporates delayed branching, delayed call to
subroutine, and delayed return from subroutine, allows the C50 to perform instructions in fewer cycles. The
addition of a parallel logic unit (PLU) gives the C50 a method for manipulating bits in data memory without using
the accumulator and ALU. The C50 has additional shifting and scaling capability for proper alignment of
multiplicands or storage of values to data memory.
The C50 achieves its low-power consumption through the IDLE2 instruction. IDLE2 removes the functional
clock from the internal hardware of the C50, which puts it into a total-sleep mode that uses only 7 μA. A low-logic
level on an external interrupt with a duration of at least five clock cycles ends the IDLE2 mode.
The C50 is available with two clock speeds. The clock frequencies are 50 MHz, providing a 40-ns cycle time,
and 66 MHz, providing a 30-ns cycle time. The available options are listed in Table 1.
Table 1. Available Options
SUPPLY
PART NUMBER
SPEED
VOLTAGE
PACKAGE
TOLERANCE
SMJ320C50GFAM66
SMJ320C50HFGM66
SMJ320C50GFAM50
SMJ320C50HFGM50
30-ns cycle time
30-ns cycle time
40 ns cycle time
40 ns cycle time
30 ns cycle time
±5%
±5%
±5%
±5%
±5%
Pin grid array
Quad flat package
Pin grid array
Quad flat package
Plastic Quad flat package
†
SMQ320C50PQM66
†
When ordering, use DESC P/N 5962-9455804NZD
2
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
functional block diagram
Program Bus (Address)
Program Bus (Data)
IPTR INT#
INTM
IMR
IFR
BMAR
MUX
PASR
BRAF
PC(16)
MP/MC
CNF
RAM
Compare
PAER
Program Memory
Stack
(8 × 16)
BRCR
Data Bus (Data)
TRM
MUX
TREG2
TREG1
TREG0
Multiplier
MUX
PREG(32)
PM
MUX
COUNT
Prescaler
P-Scaler
MUX
OVM
SXM
ALU(32)
ACC(32)
ACCB(32)
Post-Scaler
OV
TC
C
DBMR
MUX
BIM
PLU(16)
Data Bus (Data)
MUX
ARP
CBER
INDX
MUX
ARCR
NDX
CBSR
AUXREGS
(8 × 16)
DP(9)
dma(7)
CBCR
MUX
ARB
MUX
XF
ARAU(16)
Data Bus (Address)
Data Memory
GREG
BR
CNF
OVLY
3
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
terminal assignments
NAME
PQ PKG
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
HFG PKG
1
GFA PKG
NAME
A2
PQ PKG
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
79
80
81
82
83
84
85
86
87
88
89
90
91
92
93
94
95
HFG PKG
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
73
74
75
76
77
78
GFA PKG
W3
U7
†
NC
†
NC
2
A3
VSS3
3
D8
A4
V6
VSS4
4
D10
A5
W5
U9
†
NC
5
A6
D7
D6
6
E3
D2
C1
G3
F2
A7
V8
7
A8
W7
W9
E9
D5
8
A9
D4
9
VDD7
VDD8
TDI
D3
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
E11
V10
K4
D2
E1
J3
D1
VSS9
VSS10
D0(LSB)
TMS
VDD3
VDD4
TCK
VSS5
VSS6
H2
G1
C3
D4
J1
M4
†
NC
CLKMD1
A10
W11
W13
V12
U11
W15
V14
U13
A11
D12
F4
A12
A13
†
NC
A14
INT1
INT2
INT3
INT4
NMI
L1
N1
M2
L3
A15(MSB)
†
NC
†
NC
VDD9
VDD10
RD
E13
G5
R1
P2
N3
T2
R3
E5
E7
DR
V16
U15
TDR
FSR
WE
†
NC
†
CLKR
VDD5
VDD6
NC
VSS11
VSS12
P4
T4
†
†
NC
NC
†
NC
DS
IS
R17
T18
U19
N17
P18
R19
L17
†
NC
†
NC
PS
VSS7
VSS8
A0
H4
K2
U5
V4
R/W
STRB
BR
A1
CLKIN2
†
NC = No internal connection
GFA Package additional connections:
V
V
: R11, E15, G15, J15, L15, N15, R13, R15, T16, U17, V18, W17, W19
: T14, U1, U3, V2, W1, C17, C19, D14, D16, D18, F16, H16, K16, M16, P16
DD
SS
4
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
terminal assignments (continued)
NAME
X2/CLKIN
X1
PQ PKG
96
HFG PKG
79
GFA PKG
M18
N19
J5
NAME
TCLKX
CLKX
TFSR/TADD
TCLKR
RS
PQ PKG
123
124
125
126
127
128
129
130
131
132
1
HFG PKG
106
107
108
109
110
111
GFA PKG
B16
A17
C13
B14
A15
C11
B12
A13
R7
97
80
VDD11
VDD12
TDO
98
81
99
82
L5
100
101
102
103
104
105
106
107
108
109
110
111
112
113
114
115
116
117
118
119
120
121
122
83
L19
T6
VSS13
VSS14
CLKMD2
FSX
84
READY
HOLD
BIO
85
T8
112
113
114
115
116
117
118
119
120
121
122
123
124
125
126
127
128
129
130
131
132
86
K18
J19
87
VDD15
VDD16
IAQ
TFSX/TFRM
DX
88
G19
H18
J17
R9
89
A11
A9
TDX
90
TRST
VSS1
VSS2
MP/MC
D15(MSB)
D14
2
HOLDA
XF
91
E19
F18
G17
3
B10
D6
92
4
CLKOUT1
93
5
A7
†
NC
94
6
B8
IACK
95
E17
N5
7
C9
VDD13
VDD14
96
D13
8
A5
97
R5
D12
9
B6
†
NC
98
D11
10
C7
†
NC
99
D10
11
A3
†
NC
100
101
102
103
104
105
D9
12
B4
EMU0
EMU1/OFF
VSS15
B18
A19
T10
T12
C15
D8
13
C5
VDD1
14
A1
VDD2
15
B2
†
VSS16
NC
16
†
TOUT
NC
17
†
NC = No internal connection
GFA Package additional connections:
V
V
: R11, E15, G15, J15, L15, N15, R13, R15, T16, U17, V18, W17, W19
: T14, U1, U3, V2, W1, C17, C19, D14, D16, D18, F16, H16, K16, M16, P16
DD
SS
5
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
Terminal Functions
TERMINAL
DESCRIPTION
†
NAME
TYPE
ADDRESS AND DATA BUSES
A15 (MSB)
A14
A13
A12
A11
A10
A9
A8
A7
A6
Parallel address bus. Multiplexed to address external data, program memory, or I/O. A0--A15 are in the
high-impedance state in hold mode and when OFF is active (low). These signals are used as inputs for external DMA
access of the on-chip single-access RAM. They become inputs while HOLDA is active (low) if BR is driven low
externally.
I/O/Z
A5
A4
A3
A2
A1
A0 (LSB)
D15 (MSB)
D14
D13
D12
D11
D10
D9
D8
D7
D6
Parallel data bus. Multiplexed to transfer data between the core CPU and external data, program memory, or I/O
devices. D0--D15 are in the high-impedance state when not outputting data, when RS or HOLD is asserted, or when
OFF is active (low). These signals also are used in external DMA access of the on-chip single-access RAM.
I/O/Z
D5
D4
D3
D2
D1
D0 (LSB)
MEMORY CONTROL SIGNALS
DS
PS
IS
Data, program, and I/O space select signals. Always high unless asserted for communicating to a particular external
space. DS, PS, and IS are in the high-impedance state in hold mode or when OFF is active (low).
O/Z
I
Data ready input. Indicates that an external device is prepared for the bus transaction to be completed. If the device
is not ready (READY is low), the processor waits one cycle and checks READY again. READY also indicates a bus
grant to an external device after a BR (bus request) signal.
READY
Read/write. R/W indicates transfer direction during communication to an external device and is normally in read
mode (high) unless asserted for performing a write operation. R/W is in the high-impedance state in hold mode or
when OFF is active (low). Used in external DMA access of the 9K RAM cell, this signal indicates the direction of the
data bus for DMA reads (high) and writes (low) when HOLDA and IAQ are active (low).
R/W
I/O/Z
Strobe. Always high unless asserted to indicate an external bus cycle, STRB is in the high-impedance state in the
hold mode or when OFF is active (low). Used in external DMA access of the on-chip single-access RAM and while
HOLDA and IAQ are active (low), STRB is used to select the memory access.
STRB
RD
I/O/Z
O/Z
Read select. RD indicates an active external read cycle and can connect directly to the output enable (OE) of external
devices. This signal is active on all external program, data, and I/O reads. RD is in the high-impedance state in hold
mode or when OFF is active (low).
†
I = Input, O = Output, Z = High-Impedance
NOTE: All input pins that are unused should be connected to V or an external pullup resistor. The BR pin has an internal pullup for performing
DD
DMA to the on-chip RAM. For emulation, TRST has an internal pulldown, and TMS, TCK, and TDI have internal pullups. EMU0 and EMU1
require external pullups to support emulation.
6
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
Terminal Functions (Continued)
TERMINAL
NAME TYPE
DESCRIPTION
†
MEMORY CONTROL SIGNALS (CONTINUED)
Write enable. The falling edge indicates that the device is driving the external data bus (D15--D0). Data can be
latched by an external device on the rising edge of WE. This signal is active on all external program, data, and I/O
writes. WE is in the high-impedance state in hold mode or when OFF is active (low).
WE
O/Z
MULTIPROCESSING SIGNALS
Hold. HOLD is asserted to request control of the address, data, and control lines. When acknowledged by the C50,
these lines go to the high-impedance state.
HOLD
I
Hold acknowledge. HOLDA indicates to the external circuitry that the processor is in a hold state and that the
address, data, and memory control lines are in the high-impedance state so that they are available to the external
circuitry for access to local memory. This signal also goes to the high-impedance state when OFF is active (low).
HOLDA
O/Z
Bus request. BR is asserted during access of external global data memory space. READY is asserted when the
global data memory is available for the bus transaction. BR can be used to extend the data memory address space
by up to 32K words. BR goes to the high-impedance state when OFF is active low. BR is used in external DMA access
of the on-chip single-access RAM. While HOLDA is active (low), BR is externally driven (low) to request access to
the on-chip single-access RAM.
BR
I/O/Z
O/Z
Instruction acquisition. Asserted (active) when there is an instruction address on the address bus; goes into the
high-impedance state when OFF is active (low). IAQ is also used in external DMA access of the on-chip
single-access RAM. While HOLDA is active (low), IAQ acknowledges the BR request for access of the on-chip
single-access RAM and stops indicating instruction acquisition.
IAQ
Branch control. BIO samples as the BIO condition and, if it is low, causes the device to execute the conditional
instruction. BIO must be active during the fetch of the conditional instruction.
BIO
XF
I
External flag (latched software-programmable signal). Set high or low by a specific instruction or by loading status
register 1 (ST1). Used for signaling other processors in multiprocessor configurations or as a general-purpose
output. XF goes to the high-impedance state when OFF is active (low) and is set high at reset.
O/Z
O/Z
Interrupt acknowledge. Indicates receipt of an interrupt and that the program counter is fetching the interrupt vector
location designated by A15--A0. IACK goes to the high-impedance state when OFF is active (low).
IACK
INITIALIZATION, INTERRUPT, AND RESET OPERATIONS
INT4
INT3
INT2
INT1
External interrupts. INT1-- I N T 4 are prioritized and maskable by the interrupt mask register (IMR) and interrupt mode
bit (INTM, bit 9 of status register 0). These signals can be polled and reset by using the interrupt flag register.
I
Nonmaskable interrupt. NMI is the external interrupt that cannot be masked via INTM or IMR. When NMI is activated,
the processor traps to the appropriate vector location.
NMI
RS
I
I
Reset. RS causes the device to terminate execution and forces the program counter to zero. When RS is brought
to a high level, execution begins at location zero of program memory.
Microprocessor/microcomputer select. If active (low) at reset (microcomputer mode), the signal causes the internal
program ROM to be mapped into program memory space. In the microprocessor mode, all program memory is
mapped externally. This signal is sampled only during reset, and the mode that is set at reset can be overridden via
the software control bit MP/MC in the PMST register.
MP/MC
I
OSCILLATOR/TIMER SIGNALS
Master clock (or CLKIN2 frequency). CLKOUT1 cycles at the machine-cycle rate of the CPU. The internal machine
CLKOUT1
O/Z
cycle is bounded by the rising edges of this signal. This signal goes to the high-impedance state when OFF is active
(low).
†
I = Input, O = Output, Z = High-Impedance
7
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
Terminal Functions (Continued)
TERMINAL
DESCRIPTION
†
NAME
TYPE
OSCILLATOR/TIMER SIGNALS (CONTINUED)
CLKMD1 CLKMD2
Clock mode
0
0
External clock with divide-by-two option. Input clock is provided to X2/CLKIN1. Internal
oscillator and PLL are disabled.
CLKMD1
CLKMD2
0
1
1
0
Reserved for test purposes
External divide-by-one option. Input clock is provided to CLKIN2. Internal oscillator is
disabled and internal PLL is enabled.
Internal or external divide-by-two option. Input clock is provided to X2/CLKIN1. Internal
oscillator is enabled and internal PLL is disabled.
I
I
1
1
Input to the internal oscillator from the crystal. If the internal oscillator is not being used, a clock can be input to the
device on X2/CLKIN. The internal machine cycle is half this clock rate.
X2/CLKIN
Output from the internal oscillator for the crystal. If the internal oscillator is not used, X1 must be left unconnected.
This signal does not go to the high-impedance state when OFF is active (low).
X1
O
I
CLKIN2
TOUT
Divide-by-one input clock for driving the internal machine rate.
Timer output. TOUT signals a pulse when the on-chip timer counts down past zero. The pulse is a CLKOUT1 cycle
wide.
O
SUPPLY PINS
V
V
V
V
DD1
DD2
DD3
DD4
I
Power supply for data bus
V
V
DD5
DD6
I
I
I
I
I
I
I
Power supply for address bus
V
V
DD7
DD8
Power supply for inputs and internal logic
Power supply for address bus
V
V
DD9
DD10
V
V
DD11
DD12
Power supply for memory control signals
Power supply for inputs and internal logic
Power supply for memory control signals
Ground for memory control signals
V
V
DD13
DD14
V
V
DD15
DD16
V
V
SS1
SS2
V
V
V
V
SS3
SS4
SS5
SS6
I
I
Ground for data bus
V
V
V
V
SS7
SS8
SS9
SS10
Ground for address bus
V
V
SS11
SS12
I
I
Ground for memory control signals
Ground for inputs and internal logic
V
V
V
V
SS13
SS14
SS15
SS16
†
I = Input, O = Output, Z = High-Impedance
8
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
Terminal Functions (Continued)
TERMINAL
NAME TYPE
DESCRIPTION
SERIAL PORT SIGNALS
†
Receive clock. External clock signal for clocking data from DR (data receive) or TDR (TDM data receive) into the
RSR (serial port receive shift register). Must be present during serial port transfers. If the serial port is not being used,
these signals can be sampled as an input via the IN0 bit of the serial port control (SPC) or TDR serial port control
(TSPC) registers.
CLKR
TCLKR
I
Transmit clock. Clock signal for clocking data from the DR or TDR to the DX (data transmit) or TDX (TDM data
transmit pins). CLKX can be an input if the MCM bit in the serial port control register is set to 0. It can also be driven
by the device at 1/4 the CLKOUT1 frequency when the MCM bit is set to 1. If the serial port is not being used, this
pin can be sampled as an input via the IN1 bit of the SPC or TSPC register. This signal goes into the high-impedance
state when OFF is active (low).
CLKX
TCLKX
I/O/Z
DR
TDR
I
Serial data receive. Serial data is received in the RSR (serial port receive shift register) via DR or TDR.
DX
TDX
Serial port transmit. Serial data transmitted from XSR (serial port transmit shift register) via DX or TDX. This signal
is in the high-impedance state when not transmitting and when OFF is active (low).
O/Z
Frame synchronization pulse for receive. The falling edge of FSR or TFSR initiates the data receive process, which
begins the clocking of the RSR. TFSR becomes an input/output (TADD) pin when the serial port is operating in the
TDM mode (TDM bit = 1). In TDM mode, this pin is used to input/output the address of the port. This signal goes
into the high-impedance state when OFF is active (low).
FSR
TFSR/TADD
I
I/O/Z
Frame synchronization pulse for transmit. The falling edge of FSX/TFSX initiates the data transmit process, which
begins the clocking of the XSR. Following reset, the default operating condition of FSX/TFSX is an input. This pin
may be selected by software to be an output when the TXM bit in the serial control register is set to 1. This signal
goes to the high-impedance state when OFF is active (low). When operating in TDM mode (TDM bit = 1), TFSX
becomes TFRM, the TDM frame-synchronization pulse.
FSX
TFSX/TFRM
I/O/Z
TEST SIGNALS
Boundary scan test clock. This is normally a free-running clock with a 50% duty cycle. The changes of TAP (test
access port) input signals (TMS and TDI) are clocked into the TAP controller, instruction register, or selected test
data register on the rising edge of TCK. Changes at the TAP output signal (TDO) occur on the falling edge of TCK.
TCK
TDI
I
I
Boundary scan test data input. TDI is clocked into the selected register (instruction or data) on a rising edge of TCK.
Boundary scan test data output. The contents of the selected register (instruction or data) is shifted out of TDO on
the falling edge of TCK. TDO is in the high-impedance state except when scanning of data is in progress. This signal
also goes to the high-impedance state when OFF is active (low).
TDO
O/Z
Boundary scan test mode select. This serial control input is clocked into the test access port (TAP) controller on the
rising edge of TCK.
TMS
I
I
Boundary scan test reset. Asserting this signal gives the JTAG scan system control of the operations of the device.
If this signal is not connected or is driven low, the device operates in its functional mode and the boundary scan
signals are ignored.
TRST
Emulator 0. When TRST is driven low, EMU0 must be high for activation of the OFF condition (see EMU1/OFF).
When TRST is driven high, EMU0 is used as an interruptto orfrom theemulator system and is defined as input/output
put via boundary scan.
EMU0
I/O/Z
Emulator 1/OFF. When TRST is driven high, EMU1/OFF is used as an interrupt to or from the emulator system and
is defined as input/output via boundary scan. When TRST is driven low, EMU1/OFF is configured as OFF. When
the OFF signal is active (low), all output drivers are in the high-impedance state. OFF is used exclusively for testing
and emulation purposes (not for multiprocessing applications). For the OFF condition, the following conditions apply:
EMU1/OFF
I/O/Z
N/C
•
•
•
TRST = Low
EMU0 = High
EMU1/OFF = Low
‡
RESERVED
Reserved. This pin must be left unconnected.
†
‡
I = Input, O = Output, Z = High-Impedance
Quad flat pack only
9
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
absolute maximum ratings over operating case temperature range (unless otherwise noted)†
Supply voltage range, VDD (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -- 0.3 V to 7 V
Input voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -- 0.3 V to 7 V
Output voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -- 0.3 V to 7 V
Operating case temperature range, TC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -- 5 5 °C to 125°C
Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -- 6 5 °C to 150°C
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: All voltage values are with respect to V
.
SS
recommended operating conditions
MIN NOM
MAX
UNIT
V
V
V
Supply voltage
Supply voltage
4.75
5
0
5.25
DD
SS
V
CLKIN, CLKIN2
3.0
2.5
V
V
V
V
DD + 0.3
DD + 0.3
CLKX, CLKR, TCLKX, TCLKR
All others
V
V
V
High-level input voltage
IH
IL
2.2
V
DD + 0.3
Low-level input voltage
-- 0 . 3
0.6
V
‡
I
I
High-level output current
-- 300
μA
mA
°C
OH
OL
Low-level output current
2
T
Operating case temperature (see Note 2)
-- 5 5
125
C
‡
This I
can be exceeded when using a 1-KΩ pulldown resistor on the TDM serial port TADD output; however, this output still meets V
OH
OH
specifications under these conditions.
NOTE 2: MAX at maximum rated operating conditions at any point on case. T MIN at initial (time zero) power up.
T
C
C
electrical characteristics over recommended ranges of supply voltage and operating case
temperature (unless otherwise noted)
§
¶
PARAMETER
TEST CONDITIONS
MIN TYP
MAX
UNIT
V
#
V
V
High-level output voltage
I
I
= MAX
= MAX
2.4
3
OH
OL
OH
OL
¶
Low-level output voltage
0.3
||
0.6
30
V
BR (with internal pullup)
All others
-- 500
-- 3 0
-- 3 0
-- 500
-- 5 0
-- 3 0
High-impedance output
I
μA
OZ
||
||
||
||
||
current (V = MAX)
DD
30
TRST (with internal pulldown)
TMS, TCK, TDI (with internal pullups)
X2/CLKIN
800
30
μA
Input current
I
I
(V = V to V
)
I
SS
DD
50
All other inputs
30
μA
mA
mA
mA
μA
pF
I
I
Supply current, core CPU
Supply current, pins
Operating,
T
= 25°C,
= 25°C,
= 125°C,
V
V
V
= 5.25 V, f = 50 MHz
60
40
225
225
30
DDC
DDP
A
DD
DD
DD
x
Operating,
T
= 5.25 V, f = 50 MHz
x
A
IDLE instruction,
T
= 5.25 V, f = 50 MHz
x
C
I
Supply current, standby
DD
IDLE2 instruction, Clocks shut off, T =125°C,
V
=5.25 V
DD
7
C
C
C
Input capacitance
Output capacitance
15
15
40
i
40
pF
o
§
¶
#
For conditions shown as MIN/MAX, use the appropriate value specified under recommended operating conditions.
All typical or nominal values are at V = 5 V, T (ambient air temperature)= 25°C.
All input and output voltage levels are TTL-compatible. Figure 1 shows the test load circuit; Figure 2 and Figure 3 show the voltage reference
DD
A
levels.
||
These values are not specified pending detailed characterization.
10
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
PARAMETER MEASUREMENT INFORMATION
I
OL
Tester Pin
Electronics
Output
Under
Test
50 Ω
V
LOAD
C
T
I
OH
Where:
I
I
V
=
=
=
=
2.0 mA (all outputs)
300 μA (all outputs)
1.5 V
OL
OH
LOAD
C
80 pF typical load circuit capacitance
T
Figure 1. Test Load Circuit
signal transition levels
Transistor-to-transistor logic (TTL) output levels are driven to a minimum logic-high level of 2.4 V and to a
maximum logic-low level of 0.6 V. Figure 2 shows the TTL-level outputs.
2.4 V
2 V
1 V
0.6 V
Figure 2. TTL-Level Outputs
TTL-output transition times are specified as follows:
D
For a high-to-low transition, the level at which the output is said to be no longer high is 2 V, and the level
at which the output is said to be low is 1 V.
D
For a low-to-high transition, the level at which the output is said to be no longer low is 1 V, and the level
at which the output is said to be high is 2 V.
Figure 3 shows the TTL-level inputs.
2.2 V
0.6 V
Figure 3. TTL-Level Inputs
TTL-compatible input transition times are specified as follows:
D
For a high-to-low transition on an input signal, the level at which the input is said to be no longer high
is 2 V, and the level at which the input is said to be low is 0.8 V.
D
For a low to high transisiton on an input signal, the level at which the input is said to be no longer low
is 0.8 V, and the level at which the input is said to be high is 2 V.
11
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
CLOCK CHARACTERISTICS AND TIMING
The C50 can use either its internal oscillator or an external frequency source for a clock. The clock mode is
determined by the CLKMD1 and CLKMD2 pins. Table 2 outlines the selection of the clock mode by these pins.
Table 2. Clock Mode Selection
CLKMD1
CLKMD2
CLOCK SOURCE
External divide-by-one clock option
1
0
0
1
Reserved for test purposes
External divide-by-two option or internal divide-by-two clock option
with an external crystal
1
0
1
0
External divide-by-two option with the internal oscillator disabled
internal divide-by-two clock option with external crystal
The internal oscillator is enabled by connecting a crystal across X1 and X2/CLKIN. The frequency of CLKOUT1
is one-half the crystal’s oscillating frequency. The crystal should be in either fundamental or overtone operation
and parallel resonant, with an effective series resistance of 30 Ω and a power dissipation of 1 mW; it should be
specified at a load capacitance of 20 pF. Overtone crystals require an additional tuned LC circuit. Figure 4 shows
an external crystal (fundamental frequency) connected to the on-chip oscillator.
recommended operating conditions for internal divide-by-two clock option
’320C50-50
’320C50-66
UNIT
MIN NOM
MAX
MIN NOM
MAX
†
†
f
Input clock frequency
0
50
0
66
MHz
pF
x
C1, C2 Load capacitance
10
10
†
This device uses a fully static design and, therefore, can operate with t
approaching ∞. The device is characterized at frequencies
c(CI)
approaching 0 Hz but is tested at a minimum of 3.3 MHz to meet device test time requirements.
X1
X2/CLKIN
Crystal
C1
C2
Figure 4. Internal Clock Option
12
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
external divide-by-two clock option
An external frequency source can be used by injecting the frequency directly into X2/CLKIN with X1 left
unconnected, CLKMD1 set high, and CLKMD2 set high. The external frequency is divided by two to generate
the internal machine cycle. The external frequency injected must conform to specifications listed in the timing
requirements table.
switching characteristics over recommended operating conditions [H = 0.5 tc(CO)
]
’320C50-50
TYP
’320C50-66
TYP
PARAMETER
UNIT
MIN
40
3
MAX
MIN
30
3
MAX
†
†
t
t
t
t
t
t
Cycle time, CLKOUT1
2t
2t
ns
ns
ns
ns
ns
ns
c(CO)
c(CI)
11
c(CI)
11
Delay time, X2/CLKIN high to CLKOUT1 high/low
Fall time, CLKOUT1
20
20
d(CIH-COH/L)
f(CO)
5
5
5
5
Rise time, CLKOUT1
r(CO)
Pulse duration, CLKOUT1 low
Pulse duration, CLKOUT1 high
H -- 3
H -- 3
H
H
H + 2 H -- 3
H + 2 H -- 3
H
H
H + 2
H + 2
w(COL)
w(COH)
†
This device uses a fully static design and, therefore, can operate with t
approaching ∞. The device is characterized at frequencies
c(CI)
approaching 0 Hz, but is tested at a minimum of 6.7 MHz to meet device test time requirements.
timing requirements
’320C50-50
’320C50-66
UNIT
MIN
MAX
MIN
MAX
†
†
t
t
t
t
t
Cycle time, X2/CLKIN
20
15
ns
ns
ns
ns
ns
c(CI)
Fall time, X2/CLKIN
5*
5*
f(CI)
Rise time, X2/CLKIN
5*
†
5*
†
r(CI)
Pulse duration, X2/CLKIN low
Pulse duration, X2/CLKIN high
8
8
7
7
w(CIL)
w(CIH)
†
†
†
This device uses a fully static design and, therefore, can operate with t
approaching ∞. The device is characterized at frequencies
c(CI)
approaching 0 Hz, but is tested at a minimum of 6.7 MHz to meet device test time requirements.
This parameter is not production tested.
*
t
r(CI)
t
t
f(CI)
w(CIH)
t
w(CIL)
t
c(CI)
CLKIN
t
f(CO)
t
c(CO)
d(CIH-COH/L)
t
r(CO)
t
t
w(COL)
t
w(COH)
CLKOUT1
Figure 5. External Divide-by-Two Clock Timing
13
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
external divide-by-one clock option
An external frequency source can be used by injecting the frequency directly into CLKIN2 with X1 left
unconnected and X2 connected to VDD. This external frequency is divided by one to generate the internal
machine cycle. The divide-by-one option is used when CLKMD1 is strapped high and CLKMD2 is strapped low.
The external frequency injected must conform to specifications listed in the timing requirements table (see
Figure 6 for more details).
switching characteristics over recommended operating conditions [H = 0.5 tc(CO)
]
’320C50-50
TYP
’320C50-66
TYP
PARAMETER
UNIT
MIN
40
2
MAX
75*
16
MIN
30
2
MAX
75*
16
t
t
t
t
t
t
Cycle time, CLKOUT1
t
t
ns
ns
ns
ns
ns
ns
c(CO)
c(CI)
9
c(CI)
9
Delay time, CLKIN2 high to CLKOUT1 high
Fall time, CLKOUT1
d(C2H-COH)
f(CO)
5
5
5
5
Rise time, CLKOUT1
r(CO)
Pulse duration, CLKOUT1 low
Pulse duration, CLKOUT1 high
H -- 3*
H -- 3*
H
H
H + 2*
H + 2*
H -- 3*
H -- 3*
H
H
H + 2*
H + 2*
w(COL)
w(COH)
Delay time, transitory phase--PLL
synchronized after CLKIN2 supplied
t
1000t
1000t
c(C2)*
ns
d(TP)
c(C2)*
*
This parameter is not production tested.
timing requirements over recommended ranges of supply voltage and operating case temperature
’320C50-50
’320C50-66
UNIT
UNIT
ns
MIN
MAX
MIN
MAX
†
†
t
t
t
t
t
Cycle time, CLKIN2
40
75
30
75
c(C2)
Fall time, CLKIN2
5*
5*
5*
5*
ns
f(C2)
Rise time, CLKIN2
ns
r(C2)
Pulse duration, CLKIN2 low
Pulse duration, CLKIN2 high
11
11
t
t
9
9
t
t
ns
w(C2L)
w(C2H)
c(C2)--11
c(C2)--11
c(C2)--9
c(C2)--9
ns
*
This parameter is not production tested.
Clocks can be stopped only while the device executes IDLE2 when using the external divide-by-one clock option. Note that tp (the transitory
phase) occurs when restarting clock from IDLE2 in this mode.
†
t
w(C2L)
t
f(C2)
t
w(C2H)
t
r(C2)
t
c(C2)
CLKIN2
t
w(COH)
t
d(C2H-COH)
t
f(CO)
t
t
r(CO)
c(CO)
t
w(COL)
t
d(TP)
Unstable
CLKOUT1
Figure 6. External Divide-by-One Clock Timing
14
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
MEMORY AND PARALLEL I/O INTERFACE READ
Memory and parallel I/O interface read timings are illustrated in Figure 7.
switching characteristics over recommended operating conditions [H = 0.5tc(CO)
]
PARAMETER
Setup time, address valid before RD low
MIN
MAX
UNIT
ns
†‡
t
t
t
t
t
H--10
su(AV-RDL)
h(RDH-AV)
w(RDL)
†‡
§*
Hold time, address valid after RD high
Pulse duration, RD low
0
ns
H--2
H--2
ns
§*
Pulse duration, RD high
ns
w(RDH)
Delay time, RD high to WE low
2H--5
ns
d(RDH-WEL)
†
‡
§
A15--A0, PS, DS, IS, R/W, and BR timings are all included in timings referenced as address.
See Figure 8 for address-bus timing variation with load capacitance.
STRB and RD timing is -- 3/+5 ns from CLKOUT1 timing on read cycles, following the first cycle after reset, which is always a seven wait-state cycle.
This parameter is not production tested.
*
timing requirements
MIN
MAX
UNIT
ns
‡
t
t
t
t
Access time, read data valid from address valid
Access time, read data valid after RD low
Setup time, read data valid before RD high
Hold time, read data valid after RD high
2H--15
a(RDAV)
H--10
ns
a(RDL-RD)
su(RD-RDH)
h(RDH-RD)
10
0
ns
ns
‡
See Figure 8 for address-bus timing variation with load capacitance.
15
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
MEMORY AND PARALLEL I/O INTERFACE WRITE
Memory and parallel I/O interface read timings are illustrated in Figure 7.
switching characteristics over recommended operating conditions [H = 0.5tc(CO)
]
PARAMETER
Setup time, address valid before WE low
Hold time, address valid after WE high
Pulse duration, WE low
MIN
MAX
UNIT
ns
†‡
†‡
§*
t
t
t
t
t
t
t
t
H -- 5
su(AV-WEL)
h(WEH-AV)
w(WEL)
H -- 10
ns
§*
2H -- 4
2H -- 2
2H + 2
ns
§
Pulse duration, WE high
ns
w(WEH)
Delay time, WE high to RD low
3H -- 10
ns
d(WEH-RDL)
su(WDV-WEH)
h(WEH-WDV)
en(WE-BUd)
§*
§¶*
§*
Setup time, write data valid before WE high
Hold time, write data valid after WE high
Enable time, WE to data bus driven
2H -- 20
2H
ns
§*
H -- 5
H+10
ns
-- 5 *
ns
†
‡
§
A15--A0,PS, DS, IS, R/W, and BR timings are all included in timings referenced as address.
See Figure 8 for address bus timing variation with load capacitance.
STRB and WE edges are 0--4 ns from CLKOUT1 edges on writes. Rising and falling edges of these signals track each other; tolerance of resulting
pulse durations is ± 2 ns, not ± 4 ns.
This value holds true for zero or one wait state only.
This parameter is not production tested.
¶
*
ADDRESS
t
h(WEH-AV)
t
su(AV-WEL)
t
a(RDAV)
R/W
t
h(RDH-RD)
t
t
a(RDL-RD)
en(WE-BUd)
t
su(RD-RDH)
t
h(WEH-WDV)
DATA
RD
t
t
su(WDV-WEH)
t
t
su(AV-RDL)
h(RDH-AV)
t
d(WEH-RDL)
t
d(RDH-WEL)
t
w(RDH)
t
w(WEL)
w(RDL)
WE
t
w(WEH)
STRB
NOTE A: All timings are for 0 wait states. However, external writes always require two cycles to prevent external bus conflicts. The above diagram
illustrates a one-cycle read and a two-cycle write and is not drawn to scale. All external writes immediately preceded by an external
read or immediately followed by an external read require three machine cycles.
Figure 7. Memory and Parallel I/O Interface Read and Write Timing
16
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
MEMORY AND PARALLEL I/O INTERFACE WRITE (CONTINUED)
2
1.75
1.50
1.25
1
0.75
0.50
0.25
10 15 20 25
30 35 40
45 50 55
60 65 70 75
80 85 90
95
Change in Load Capacitance -- pF
Figure 8. Address Bus Timing Variation With Load Capacitance
17
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
READY TIMING FOR EXTERNALLY GENERATED WAIT STATES
timing requirements
MIN
10
MAX
UNIT
ns
t
t
t
t
t
t
Setup time, READY before CLKOUT1 rises
Hold time, READY after CLKOUT1 rises
Setup time, READY before RD falls
Hold time, READY after RD falls
su(RY-COH)
h(CO-RYH)
su(RY-RDL)
h(RDL-RY)
v(WEL-RY)
h(WEL-RY)
0
ns
10
ns
0
ns
Valid time, READY after WE falls
Hold time, READY after WE falls
H -- 15
H + 5
ns
ns
CLKOUT1
t
su(RY-COH)
ADDRESS
t
h(CO-RYH)
READY
Wait State
Generated
by READY
t
su(RY-RDL)
Wait State
Generated
Internally
t
h(RDL-RY)
RD
Figure 9. Ready Timing for Externally Generated Wait States During an External Read Cycle
CLKOUT1
t
h(CO-RYH)
ADDRESS
READY
t
su(RY-COH)
t
v(WEL-RY)
t
h(WEL-RY)
WE
Wait State Generated by READY
Figure 10. Ready Timing for Externally Generated Wait States During an External Write Cycle
19
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
RESET, INTERRUPT, AND BIO
timing requirements
MIN
15
0
MAX
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
†
t
t
t
t
t
t
t
t
t
t
t
t
t
Setup time, INT1-- I N T 4 , NMI, before CLKOUT1 low
su(IN-COL)
h(COL-IN)
w(INL)SYN
w(INH)SYN
w(INL)ASY
w(INH)ASY
su(RS-X2L)
w(RSL)
†
Hold time, INT1-- I N T 4 , NMI, after CLKOUT1 low
‡
Pulse duration, INT1-- I N T 4 , NMI low, synchronous
Pulse duration, INT1-- I N T 4 , NMI high, synchronous
Pulse duration, INT1-- I N T 4 , NMI low, asynchronous
4H+15
‡*
2H+15
‡*
6H+15
‡*
Pulse duration, INT1-- I N T 4 , NMI high, asynchronous
Setup time, RS before X2/CLKIN low
Pulse duration, RS low
4H+15
10
12H
34H
15
Delay time, RS high to reset vector fetch
Pulse duration, BIO low, synchronous
Pulse duration, BIO low, asynchronous
Setup time, BIO before CLKOUT1 low
Hold time, BIO after CLKOUT1 low
d(RSH)
w(BIL)SYN
w(BIL)ASY
su(BI-COL)
h(COL-BI)
H+15*
15
0
†
‡
These parameters must be met to use the synchronous timings. Both reset and the interrupts can operate asynchronously. The pulse durations
require an extra half-cycle to assure internal synchronization.
If in IDLE2, add 4H to these timings.
*This parameter is not production tested.
X2/CLKIN
t
t
d(RSH)
su(RS-X2L)
t
w(RSL)
RS
t
t
su(BI-COL)
su(IN-COL)
CLKOUT1
t
w(BIL)SYN
t
h(COL-BI)
BIO
A15--A0
INT4--
INT1
t
t
h(COL-IN)
su(IN-COL)
t
su(IN-COL)
t
w(INL)SYN
t
w(INH)SYN
Figure 11. Reset, Interrupt, and BIO Timings
20
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
INSTRUCTION ACQUISITION (IAQ), INTERRUPT ACKNOWLEDGE (IACK),
EXTERNAL FLAG (XF), AND TOUT
switching characteristics over recommended operating conditions [H = 0.5tc(CO)
]
PARAMETER
MIN
MAX
UNIT
ns
†
‡
t
t
t
t
t
t
t
t
t
Setup time, address valid before IAQ low
H--12
su(AV-IQL)
h(IQL-AV)
w(IQL)
‡
Hold time, address valid after IAQ low
Pulse duration, IAQ low
H--10
ns
‡
H--10
ns
Delay time, CLKOUT1 falling to TOUT
Setup time, address valid before IACK low
-- 6
‡
6
ns
d(CO-TU)
su(AV-IKL)
h(IKH-AV)
w(IKL)
§
H--12
ns
§
‡
Hold time, address valid after IACK high
H--10
ns
‡
Pulse duration, IACK low
H--10
ns
Pulse duration, TOUT high
Delay time, XF valid after CLKOUT1
2H--12
0
ns
w(TUH)
12
ns
d(CO-XFV)
†
IAQ goes low during an instruction acquisition. It goes low only on the first cycle of the read when wait states are used. The falling edge should
be used to latch the valid address. The AVIS bit in the PMST register must be set to zero for the address to be valid when the instruction being
addressed resides in on-chip memory.
Valid only if the external address reflects the current instruction activity (that is, code is executing on chip with no external bus cycles and AVIS
is on, or code is executing off-chip)
IACK goes low during the fetch of the first word of the interrupt vector. It goes low only on the first cycle of the read when wait states are used.
Address pins A1 -- A4 can be decoded at the falling edge to identify the interrupt being acknowledged. The AVIS bit in the PMST register must
be set to zero for the address to be valid when the vectors reside in on-chip memory.
‡
§
t
h(IQL-AV)
ADDRESS
t
su(AV-IQL)
t
w(IQL)
IAQ
t
h(IKH-AV)
t
su(AV-IKL)
IACK
t
w(IKL)
STRB
CLKOUT1
t
d(CO-XFV)
t
d(CO-TU)
t
d(CO-TU)
XF
TOUT
t
w(TUH)
NOTE: IAQ and IACK are not affected by wait states.
Figure 12. IAQ, IACK, and XF Timings Example With Two External Wait States
21
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
EXTERNAL DMA TIMING
switching characteristics over recommended operating conditions [H = 0.5tc(CO)] (see Note 3)
PARAMETER
MIN
MAX
UNIT
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
†
t
t
t
t
t
t
t
t
t
t
t
t
Delay time, HOLD low to HOLDA low
4H
d(HOL-HAL)
d(HOH-HAH)
dis(AZ-HAL)
en(HAH-Ad)
d(XBL-IQL)
d(XBH-IQH)
d(XSL-RDV)
h(XSH-RD)
en(IQL-RDd)
dis(W)
Delay time, HOLD high before HOLDA high
Disable time, address in the high-impedance state before HOLDA low
Enable time, HOLDA high to address driven
Delay time, XBR low to IAQ low
2H
‡*
H--15
*
*
*
H--5
4H
*
6H
*
Delay time, XBR high to IAQ high
2H
4H
Delay time, read data valid after XSTRB low
Hold time, read data after XSTRB high
40
0
*§
*
Enable time, IAQ low to read data driven
0
2H
*
*
Disable time, XR/W low to data in the high-impedance state
Disable time, IAQ high to data in the high-impedance state
Enable time, data from XR/W going high
0
15
*
H
dis(I-D)
*
4
en(D-XRH)
†
‡
§
HOLD is not acknowledged until current external access request is complete.
This parameter includes all memory control lines.
This parameter refers to the delay between the time the condition (IAQ = 0 and XR/W = 1) is satisfied and the time that the SMJ320C50x data
lines become valid.
* This parameter is not production tested.
NOTE 3: X preceding a name refers to the external drive of the signal.
timing requirements
MIN
MAX
UNIT
ns
¶
t
t
t
t
t
t
t
t
t
t
Delay time, HOLDA low to XBR low
Delay time, IAQ low to XSTRB low
0
d(HAL-XBL)
d(IQL-XSL)
su(AV-XSL)
su(DV-XSL)
h(XSL-D)
¶
0
ns
Setup time, Xaddress valid before XSTRB low
Setup time, Xdata valid before XSTRB low
Hold time, Xdata hold after XSTRB low
Hold time, write Xaddress hold after XSTRB low
Pulse duration, XSTRB low
15
15
15
15
45
45
20
0
ns
ns
ns
ns
h(XSL-WA)
w(XSL)
ns
Pulse duration, XSTRB high
ns
w(XSH)
Setup time, R/W valid before XSTRB low
Hold time, read Xaddress after XSTRB high
ns
su(RW-XSL)
h(XSH-RA)
ns
¶
XBR, XR/W, and XSTRB lines should be pulled up with a 10-kΩ resistor to assure that they are in an inactive (high) state during the transition
period between the SMJ320C50x driving them and the external circuit driving them.
NOTE 3. X preceding a name refers to the external drive of the signal.
22
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
EXTERNAL DMA TIMING (CONTINUED)
HOLD
t
d(HOH-HAH)
t
d(HOL-HAL)
HOLDA
t
en(HAH-Ad)
t
dis(AZ-HAL)
Address
Bus/
Control
†
Signals
t
en(I-B)
t
d(HAL-XBL)
XBR
IAQ
t
d(XBL-IQL)
t
d(XBH-IQH)
t
d(IQL-XSL)
t
su(RW-XSL)
XSTRB
XR/W
t
w(XSH)
t
w(XSL)
t
dis(W)
t
su(AV-XSL)
t
h(XSH-RD)
t
h(XSH-RA)
t
en(IQL-RDd)
XADDRESS
t
d(XSL-RDV)
t
su(AV-XSL)
t
h(XSL-WA)
t
dis(I-D)
DATA(RD)
t
en(IQL-RDd)
t
t
en(D-XRH)
h(XSL-D)
t
su(DV-XSL)
XDATA(WR)
†
A15--A0, PS, DS, IS, R/W, and BR timings are all included in timings referenced as address bus/control signals.
Figure 13. External DMA Timing
23
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
SERIAL-PORT RECEIVE
timing requirements
MIN
MAX
UNIT
ns
†
t
t
t
t
t
t
t
t
Cycle time, serial-port clock
Fall time, serial-port clock
Rise time, serial-port clock
5.2H
c(SCK)
8*
8*
ns
f(SCK)
ns
r(SCK)
Pulse duration, serial-port clock low/high
Setup time, FSR before CLKR falling edge
Hold time, FSR after CLKR falling edge
Setup time, DR before CLKR falling edge
Hold time, DR after CLKR falling edge
2.1H
10
ns
w(SCK)
ns
su(FS-CK)
h(CK-FS)
su(DR-CK)
h(CK-DR)
10
ns
10
ns
10
ns
†
The serial-port design is fully static and, therefore, can operate with t
of 0 Hz but tested at a much higher frequency to minimize test time.
approaching ∞. It is characterized approaching an input frequency
c(SCK)
* This parameter is not production tested.
t
c(SCK)
t
f(SCK)
t
w(SCK)
CLKR
t
t
r(SCK)
h(CK-FS)
t
w(SCK)
t
su(FS-CK)
t
su(DR-CK)
FSR
t
h(CK-DR)
DR
Bit
1
2
7 or 15
(see Note A)
8 or 16
(see Note A)
NOTE A: Depending on whether information is sent in an 8-bit or 16-bit packet.
Figure 14. Serial-Port Receive Timing
24
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
SERIAL-PORT TRANSMIT, EXTERNAL CLOCKS AND EXTERNAL FRAMES
switching characteristics over recommended operating conditions (see Note 4)
PARAMETER
MIN
MAX
UNIT
ns
t
t
t
Delay time, DX valid after CLKX high
Disable time, DX valid after CLKX high
Hold time, DX valid after CLKX high
25
d(CXH-DXV)
dis(CXH-DX)
h(CXH-DXV)
*
40
ns
-- 5
ns
* This parameter is not production tested.
timing requirements
MIN
MAX
UNIT
ns
†
t
t
t
t
t
t
t
Cycle time, serial-port clock
5.2H
c(SCK)
*
Fall time, serial-port clock
8
ns
f(SCK)
*
Rise time, serial-port clock
8
ns
r(SCK)
Pulse duration, serial-port clock low/high
Delay time, FSX after CLKX high edge
Hold time, FSX after CLKX falling edge
Hold time, FSX after CLKX high edge
2.1H
10
ns
w(SCK)
2H--8
ns
d(CXH-FXH)
h(CXL-FXL)
h(CXH-FXL)
ns
‡*
2H--8
ns
†
‡
The serial-port design is fully static and therefore can operate with t
0 Hz but tested at a much higher frequency to minimize test time.
If the FSX pulse does not meet this specification, the first bit of serial data is driven on the DX pin until the falling edge of FSX. After the falling
edge of FSX, data is shifted out on the DX pin. The transmit-buffer-empty interrupt is generated when the t specification is met.
approaching ∞. It is characterized approaching an input frequency of
c(SCK)
t
h(FS) and h(FS)H
NOTE 4: Internal clock with external FSX and vice versa are also allowable. However, FSX timings to CLKX are always defined depending on
the source of FSX, and CLKX timings are always dependent upon the source of CLKX. Specifically, the relationship of FSX to CLKX
is independent of the source of CLKX.
* This parameter is not production tested.
t
c(SCK)
t
f(SCK)
t
w(SCK)
CLKX
t
t
r(SCK)
d(CXH-FXH))
t
h(CXH-FXL)
t
h(CXL-FXL)
t
w(SCK)
FSX
t
d(CXH-DXV)
t
dis(CXH-DX)
t
h(CXH-DXV)
DX Bit
1
2
7 or 15
(see Note A)
8 or 16
(see Note A)
NOTE A: Depending on whether information is sent in an 8-bit or 16-bit packet
Figure 15. Serial-Port Transmit Timing of External Clocks and External Frames
25
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
SERIAL-PORT TRANSMIT, INTERNAL CLOCKS AND INTERNAL FRAMES
switching characteristics over recommended operating conditions [H = 0.5tc(CO)] (see Note 4)
PARAMETER
Delay time, CLKX rising to FSX
MIN
TYP
MAX
25
UNIT
ns
t
t
t
t
t
t
t
t
d(CX-FX)
d(CX-DX)
dis(CX-DX)
c(SCK)
Delay time, CLKX rising to DX
Disable time, CLKX rising to DX
Cycle time, serial-port clock
25
ns
*
40
ns
8H
5
ns
Fall time, serial-port clock
ns
f(SCK)
Rise time, serial-port clock
5
ns
r(SCK)
Pulse duration, serial-port clock low/high
Hold time, DX valid after CLKX high
4H -- 20
-- 6
ns
w(SCK)
ns
h(CXH-DXV)
* This parameter is not production tested.
NOTE 4: Internal clock with external FSX and vice versa are also allowable. However, FSX timings to CLKX are always defined depending on
the source of FSX, and CLKX timings are always dependent upon the source of CLKX. Specifically, the relationship of FSX to CLKX
is independent of the source of CLKX.
t
)
c(SCK
t
f(SCK)
t
w(SCK)
CLKX
FSX
t
d(CX-FX)
t
w(SCK)
t
r(SCK)
t
d(CX-FX)
t
d(CX-DX)
t
dis(CX-DX)
t
h(CXH-DXV)
DX
Bit
1
2
7 or 15
(see Note A)
8 or 16
(see Note A)
NOTE A: Depending on whether information is sent in an 8-bit or 16-bit packet
Figure 16. Serial-Port Transmit Timing of Internal Clocks and Internal Frames
26
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
SERIAL-PORT RECEIVE TIMING IN TDM MODE
timing requirements
MIN
MAX
UNIT
ns
†
t
t
t
t
t
t
t
t
t
t
Cycle time, serial-port clock
5.2H
c(SCK)
*
Fall time, serial-port clock
8
ns
f(SCK)
*
Rise time, serial-port clock
8
ns
r(SCK)
Pulse duration, serial-port clock low/high
Setup time, TDAT/TADD before TCLK rising
Hold time, TDAT/TADD after TCLK rising
Setup time, TDAT/TADD before TCLK rising
2.1H
30
ns
w(SCK)
ns
su(TD-TCH)
h(TCH-TD)
su(TA-TCH)
h(TCH-TA)
su(TF-TCH)
h(TCH-TF)
-- 3
ns
‡
20
ns
‡
Hold time, TDAT/TADD after TCLK rising
-- 3
10
ns
§
Setup time, TRFM before TCLK rising edge
ns
§
Hold time, TRFM after TCLK rising edge
10
ns
†
The serial-port design is fully static and therefore can operate with t
0 Hz but tested at a much higher frequency to minimize test time.
These parameters apply only to the first bits in the serial bit string.
TFRM timing and waveforms shown in Figure 17 are for external TFRM. TFRM also can be configured as internal. The TFRM internal case is
illustrated in the transmit timing diagram in Figure 18.
approaching ∞. It is characterized approaching an input frequency of
c(SCK)
‡
§
* This parameter is not production tested.
t
t
f(SCK)
w(SCK)
t
t
w(SCK)
r(SCK)
TCLK
TDAT
t
t
su(TD-TCH)
c(SCK)
t
h(TCH-TD)
B15
B1
B0
B0
B14
B13
B12
A3
B8
A7
B7
B2
t
t
h(TCH-TA)
h(TCH-TA)
t
t
su(TA-TCH)
su(TF-TCH)
TADD
TFRM
A0
A1
A2
t
h(TCH-TF)
Figure 17. Serial-Port Receive Timing in TDM Mode
27
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
SERIAL-PORT TRANSMIT TIMING IN TDM MODE
switching characteristics over recommended operating conditions [H = 0.5tc(CO)
]
PARAMETER
MIN
0
MAX
UNIT
ns
t
t
t
Hold time, TDAT/TADD valid after TCLK rising
h(TCH-TDV)
d(TCH-TFV)
d(TC-TDV)
†
Delay time, TFRM valid after TCLK rising
H
3H+10
20
ns
Delay time, TCLK to valid TDAT/TADD
ns
†
TFRM timing and waveforms shown in Figure 18 are for internal TFRM. TFRM can also be configured as external, and the TFRM external case
is illustrated in the receive timing diagram in Figure 17.
timing requirements
MIN
TYP
MAX
UNIT
ns
‡
§
t
t
t
t
Cycle time, serial-port clock
Fall time, serial-port clock
5.2H
8H
c(SCK)
f(SCK)
r(SCK)
w(SCK)
*
8
ns
*
Rise time, serial-port clock
8
ns
Pulse duration, serial-port clock low/high
2.1H
ns
‡
§
When SCK is generated internally.
The serial-port design is fully static and therefore can operate with t
0 Hz but tested at a much higher frequency to minimize test time.
approaching ∞. It is characterized approaching an input frequency of
c(SCK)
* This parameter is not production tested.
t
f(SCK)
t
w(SCK)
t
w(SCK)
t
r(SCK)
TCLK
t
c(SCK)
t
d(TCV-TDV)
B15
TDAT
TADD
B0
B14
B13
A2
B12
A3
B8 B7
A7
B2
B1
B0
t
h(TCH-TDV)
t
h(TCH-TDV)
t
d(TC-TDV)
A1
t
d(TCH-TFV)
A0
t
d(TCH-TFV)
TFRM
Figure 18. Serial-Port Transmit Timing in TDM Mode
28
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
MECHANICAL DATA
HFG (S-CQFP-F132)
CERAMIC QUAD FLATPACK WITH TIE-BAR
0.960 (24,38)
0.945 (24,00)
TYP SQ
0.800 (20,32) TYP SQ
”A”
0.225 (5,72)
0.175 (4,45)
Tie Bar Width
33
1
34
2.025 (51,44) MAX
66
132
1.210 (30,73)
TYP
2.015 (51,18)
1.990 (50,55)
100
67
99
“C”
“B”
0.061 (1,55)
0.059 (1,50)
DIA TYP
0.013 (0,33)
0.006 (0,15)
132 ¢
Braze
0.014 (0,36)
0.002 (0,05)
0.040 (1,02)
0.030 (0,76)
0.010 (0,25)
0.005 (0,12)
0.020 (0,51) MAX
0.025 (0,64)
DETAIL “A”
0.116 (2,95) MAX
4040231-8/F 04/96
DETAIL “B”
DETAIL “C”
NOTES: B. All linear dimensions are in inches (millimeters)..
C. This drawing is subject to change without notice.
D. Ceramic quad flatpack with flat leads brazed to non-conductive tie bar carrier.
E. This package can be hermetically sealed with a metal lid.
F. The terminals will be gold plated.
29
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
MECHANICAL DATA
GFA (S-CPGA-P141)
CERAMIC PIN GRID ARRAY PACKAGE
1.080 (27,43)
SQ
0.900 (22,86) TYP
0.100 (2,54) TYP
1.040 (26,42)
0.050 (1,27) TYP
W
V
U
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
2
4
6
8
10 12 14 16 18
9 11 13 15 17 19
1
3
5
7
0.026 (0,66)
0.006 (0,15)
0.145 (3,68)
0.105 (2,67)
0.034 (0,86) TYP
0.140 (3,56)
0.022 (0,56)
DIA TYP
0.120 (3,05)
0.016 (0,41)
0.048 (1,22) DIA TYP
4 Places
4040133/D 04/96
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Falls within JEDEC MO-128
30
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
SMJ320C50/SMQ320C50
DIGITAL SIGNAL PROCESSOR
SGUS020B -- JUNE 1996 -- REVISED SEPTEMBER 2001
MECHANICAL DATA
PQ (S-PQFP-G***)
PLASTIC QUAD FLATPACK
100 LEAD SHOWN
13
1 100
89
14
88
0.012 (0,30)
0.008 (0,20)
0.006 (0,15)
M
”D3” SQ
0.025 (0,635)
0.006 (0,16) NOM
64
38
0.150 (3,81)
0.130 (3,30)
39
63
Gage Plane
”D1” SQ
”D” SQ
0.010 (0,25)
0.020 (0,51) MIN
Seating Plane
”D2” SQ
0°-- 8 °
0.046 (1,17)
0.036 (0,91)
0.004 (0,10)
0.180 (4,57) MAX
LEADS ***
100
132
DIM
MAX
MIN
0.890 (22,61)
0.870 (22,10)
0.766 (19,46)
0.734 (18,64)
0.912 (23,16)
0.888 (22,56)
0.600 (15,24)
1.090 (27,69)
1.070 (27,18)
0.966 (24,54)
0.934 (23,72)
1.112 (28,25)
1.088 (27,64)
0.800 (20,32)
”D”
MAX
MIN
”D1”
MAX
MIN
”D2”
”D3”
NOM
4040045/C 11/95
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Falls within JEDEC MO-069
31
POST OFFICE BOX 1443 • HOUSTON, TEXAS 77251--1443
PACKAGE OPTION ADDENDUM
www.ti.com
9-May-2012
PACKAGING INFORMATION
Status (1)
Eco Plan (2)
MSL Peak Temp (3)
Samples
Orderable Device
Package Type Package
Drawing
Pins
Package Qty
Lead/
Ball Finish
(Requires Login)
5962-9455803QXA
5962-9455803QYA
5962-9455804NZB
NRND
NRND
NRND
CPGA
CFP
GFA
HFG
PQ
141
132
132
1
1
1
TBD
TBD
Call TI
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BQFP
Green (RoHS
& no Sb/Br)
CU NIPDAU Level-4-260C-72 HR
5962-9455804QXA
5962-9455804QYA
SM320C50GFAM50
SM320C50GFAM66
SM320C50HFGM50
SMJ320C50GFAM50
SMJ320C50GFAM66
SMJ320C50HFGM50
SMJ320C50HFGM66
NRND
NRND
NRND
NRND
NRND
NRND
NRND
NRND
NRND
CPGA
CFP
GFA
HFG
GFA
GFA
HFG
GFA
GFA
HFG
HFG
141
132
141
141
132
141
141
132
132
1
1
1
1
1
1
1
1
1
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
TBD
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CPGA
CPGA
CFP
N / A for Pkg Type
N / A for Pkg Type
N / A for Pkg Type
N / A for Pkg Type
N / A for Pkg Type
N / A for Pkg Type
N / A for Pkg Type
CPGA
CPGA
CFP
CFP
(1) The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability
information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight
in homogeneous material)
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.
Addendum-Page 1
PACKAGE OPTION ADDENDUM
www.ti.com
9-May-2012
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF SM320C50, SMJ320C50 :
Catalog: TMS320C50, TMS320C50
•
Enhanced Product: SM320C50-EP
•
Military: SMJ320C50
•
NOTE: Qualified Version Definitions:
Catalog - TI's standard catalog product
•
Enhanced Product - Supports Defense, Aerospace and Medical Applications
•
Military - QML certified for Military and Defense Applications
•
Addendum-Page 2
MECHANICAL DATA
MBQF001A – NOVEMBER 1995
PQ (S-PQFP-G***)
PLASTIC QUAD FLATPACK
100 LEAD SHOWN
13
1 100
89
14
88
0.012 (0,30)
0.008 (0,20)
0.006 (0,15)
M
”D3” SQ
0.025 (0,635)
0.006 (0,16) NOM
64
38
0.150 (3,81)
0.130 (3,30)
39
63
Gage Plane
”D1” SQ
”D” SQ
0.010 (0,25)
0.020 (0,51) MIN
Seating Plane
”D2” SQ
0°–8°
0.046 (1,17)
0.036 (0,91)
0.004 (0,10)
0.180 (4,57) MAX
LEADS ***
100
132
DIM
MAX
MIN
0.890 (22,61)
0.870 (22,10)
0.766 (19,46)
0.734 (18,64)
0.912 (23,16)
0.888 (22,56)
0.600 (15,24)
1.090 (27,69)
1.070 (27,18)
0.966 (24,54)
0.934 (23,72)
1.112 (28,25)
1.088 (27,64)
0.800 (20,32)
”D”
MAX
MIN
”D1”
MAX
MIN
”D2”
”D3”
NOM
4040045/C 11/95
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Falls within JEDEC MO-069
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
MECHANICAL DATA
MCPG015B – FEBRUARY 1996 – REVISED DECEMBER 2001
GFA (S-CPGA-P141)
CERAMIC PIN GRID ARRAY
1.080 (27,43)
1.040 (26,42)
SQ
0.900 (22,86) TYP
0.100 (2,54) TYP
0.050 (1,27) TYP
W
U
R
N
L
V
T
P
M
K
H
F
J
G
E
C
A
D
B
A1 Corner
1
3
5
7
9
11 13 15 17 19
10 12 14 16 18
2
4
6
8
0.026 (0,66)
0.006 (0,15)
0.145 (3,68)
0.105 (2,67)
Bottom View
0.034 (0,86) TYP
0.140 (3,56)
0.120 (3,05)
0.022 (0,56)
0.016 (0,41)
DIA TYP
0.048 (1,22) DIA TYP
4 Places
4040133/E 11/01
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Index mark can appear on top or bottom, depending on package vendor.
D. Pins are located within 0.010 (0,25) diameter of true position relative to
each other at maximum material condition and within 0.030 (0,76) diameter
relative to the edge of the ceramic.
E. This package can be hermetically sealed with metal lids or with ceramic lids using glass frit.
F. The pins can be gold-plated or solder-dipped.
G. Falls within JEDEC MO-128AB
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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