SN65LVPE502RGET [TI]

Dual Channel USB3.0 Redriver/Equalizer; 双通道USB3.0转接驱动器/均衡器
SN65LVPE502RGET
型号: SN65LVPE502RGET
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

Dual Channel USB3.0 Redriver/Equalizer
双通道USB3.0转接驱动器/均衡器

驱动器
文件: 总24页 (文件大小:1343K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
SN65LVPE502  
www.ti.com  
SLLSE29 APRIL 2010  
Dual Channel USB3.0 Redriver/Equalizer  
Check for Samples: SN65LVPE502  
1
FEATURES  
Excellent Jitter and Loss Compensation  
Capability: to 24"  
Single Lane USB 3.0 Equalizer/Redriver  
24" of 6 mil Stripline on FR4  
Selectable Equalization, De-emphasis and  
Output Swing Control  
12" on Input and 4m, 26AWG USB 3.0 Cable  
on Output  
Integrated Termination  
Hot-Plug Capable  
Receiver Detect  
Low Power:  
Small foot print – 24 Pin (4mm × 4mm) QFN  
Package  
High Protection Against ESD Transient  
HBM: 5,000 V  
CDM: 1,500 V  
MM: 200 V  
315mW(TYP), VCC = 3.3V  
Auto Low Power Modes:  
5mW (TYP) When no Connection Detected  
70mW (TYP) When in U2/U3 Mode  
APPLICATIONS  
Notebooks, Desktops, Docking Stations,  
Backplane and Cabled Application  
DESCRIPTION  
The SN65LVPE502 is a dual channel, single lane USB 3.0 redriver and signal conditioner supporting data rates  
of 5.0Gbps. The device complies with USB 3.0 spec revision 1.0, supporting electrical idle condition and low  
frequency periodic signals (LFPS) for USB 3.0 power management modes.  
Programmable EQ, De-Emphasis and Amplitude Swing  
The SN65LVPE502 is designed to minimize signal degradation effects such as crosstalk and inter-symbol  
interference (ISI) that limits the interconnect distance between two devices. The input stage of each channel  
offers selectable equalization settings that can be programmed to match loss in the channel. The differential  
outputs provide selectable de-emphasis to compensate for the anticipated distortion USB 3.0 signal will  
experience. Level of de-emphasis will depend on the length of interconnect and its characteristics. The  
SN65LVPE502 provides a unique way to tailor output de-emphasis on a per channel basis with use of DE and  
OS pins. All Rx and Tx equalization settings supported by the device are programmed by six 3-state pins as  
shown in Table 2.  
Low Power Modes  
The device supports three low power modes as described below.  
1. Sleep Mode  
Initiated anytime EN_RXD undergoes a high to low transition or when device powers up with EN_RXD set  
low. In sleep mode both input and output terminations are held at HiZ and device ceases operation to  
conserve power. Sleep mode max power consumption is 1mW, entry time is 2µs, device exits sleep mode to  
Rx.Detect mode after EN_RXD is driven to VCC, exit time is 100µs max.  
2. RX Detect Mode – When no remote device is connected  
Anytime SN65LVPE502 detects a break in link (i.e., when upstream device is disconnected) or after powerup  
fails to find a remote device, SN65LVPE502 goes to Rx Detect mode and conserves power by shutting down  
majority of the internal circuitry. In this mode, input termination for both channels are driven to Hi-Z. In Rx  
Detect mode device power is <10mW(TYP) or less than 5% of its normal operating power This feature is  
useful in saving system power in mobile applications like notebook PC where battery life is critical.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2010, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
SN65LVPE502  
SLLSE29 APRIL 2010  
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Anytime an upstream device gets reconnected the redriver automatically senses the connection and goes to  
normal operating mode. This operation requires no setting to the device.  
3. U2/U3 Mode  
With the help of internal timers the device tracks when link enters USB 3.0 low power modes U2 and U3, in  
these modes link is in electrical idle state. SN65LVPE502 will selectively turn-off internal circuitry to save on  
power. Typical power saving is about 75% lower than normal operating mode. The device will automatically  
revert to active mode when signaling activity (LFPS) is detected.  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
DESCRIPTION CONTINUED  
Receiver Detection  
RX.Detect cycle is performed by first setting Rx termination for each channel to Hi-Z, device then starts sensing  
for receiver termination that may be attached at the other end of each TX.  
If receiver is detected on both channel:  
The TX and RX terminations are switched to ZDIFF-TX, ZDIFF-RX, respectively  
If no receiver is detected on one or both channels:  
The transmitter is pulled to Hi-Z  
The channel is put in low power mode  
Device attempts to detect Rx termination in 12 ms (TYP) interval until termination is found or the device is put  
in sleep mode.  
USB Compliance Mode  
The device enters USB compliance mode when both EN_RXD and CM pins are set H. This mode is used to test  
the transmitter for compliance to voltage and timing specifications per USB 3.0 compliance specs. In this mode  
each channel will maintain its low-impedance termination RDC-RX, while auto Rx detect operation in the device is  
disabled.  
Electrical Idle Support  
The electrical idle support is needed for low frequency periodic signaling (LFPS) used in USB 3.0 side band  
communication. A link is in an electrical idle state when the TX± voltage is held at a steady constant value like  
the common mode voltage. SN65LVPE502 detects an electrical idle state when RX± voltage at the device pin  
falls below VRX_IDLE_DIFFpp min. After detection of an idle state in a given channel the device asserts electrical idle  
state in its corresponding TX. When RX± voltage exceeds VRX_IDLE_DIFFpp max normal operation is restored and  
output start passing input signal. The electrical idle exit and entry time is specified at 6 ns.  
2
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SLLSE29 APRIL 2010  
Main PCB  
Redriver  
USB  
Connector  
USB Host  
20"  
Main PCB  
Redriver  
Device PCB  
Device  
Connector  
USB Host  
Cable  
20"  
1"-6"  
Figure 1. Typical Application  
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CM/EN_RXD  
Detect  
RX1+  
TX1+  
Receiver/  
Equalizer  
CHANNEL 1  
Driver  
RX1-  
TX1-  
EQ1  
EQ2  
EQ  
V
CNTRL  
TX_CM_DC  
DE1  
DE2  
DEMP  
CNTRL  
TX2+  
RX2+  
RX2-  
Receiver/  
Equalizer  
CHANNEL 2  
Driver  
TX2-  
V
TX_CM_DC  
OS  
Detect  
.
Cntrl  
CM/EN_RXD  
OS1  
OS2  
Figure 2. Data FLow Block Diagram  
4
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BOTTOM VIEW  
EQ1 DE1  
EN_RXD  
VCC  
1
OS1  
GND  
6
SN65LVPE502  
NC  
NC 24  
TX1-  
7
RX1-  
CH1  
RX1+  
TX1+  
Thermal Pad  
(must be soldered to  
GND plane)  
GND  
GND  
RX2-  
TX2-  
CH2  
TX2+  
12  
19  
RX2+  
13  
18  
GND EQ2  
DE2 OS2  
TOP VIEW  
VCC  
CM  
GND EN_RXD OS1  
6
DE1 EQ1  
VCC  
1
SN65LVPE502  
NC  
24  
NC  
7
TX1-  
TX1+  
GND  
RX2-  
RX2+  
RX1-  
CH1  
RX1+  
Thermal Pad  
(must be soldered to  
GND plane)  
GND  
TX2-  
CH2  
TX2+  
12  
19  
18  
13  
VCC  
OS2 DE2 EQ2  
GND  
CM  
Figure 3. Flow-Through Pin-Out  
Table 1. Pin Description  
PIN  
NUMBER  
NAME  
I/O TYPE  
DESCRIPTION  
HIGH SPEED DIFFERENTIAL I/O PINS  
8
RX1–  
RX1+  
RX2–  
RX2+  
TX1–  
TX1+  
TX2–  
TX2+  
I, CML  
I, CML  
I, CML  
I, CML  
O, CML  
O, CML  
O, CML  
O, CML  
9
Non-inverting and inverting CML differential input for CH 1 and CH 2. These pins are tied to  
an internal voltage bias by dual termination resistor circuit  
20  
19  
23  
22  
11  
12  
Non-inverting and inverting CML differential output for CH 1 and CH 2. These pins are  
internally tied to voltage bias by termination resistors  
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Table 1. Pin Description (continued)  
PIN  
DEVICE CONTROL PIN  
5
EN_RXD  
CM  
I, LVCMOS Sets device operation modes per Table 2. Internally pulled to VCC  
I, LVCMOS Sets device in compliance mode when pulled to VCC, internally pulled to GND  
Pads not internally connected  
14  
7,24  
NC  
EQ CONTROL PINS(1)  
3,16  
2,17  
DE1, DE2  
I, LVCMOS Selects de-emphasis settings for CH 1 and CH 2 per Table 2. Internally tied to VCC/2  
I, LVCMOS Selects equalization settings for CH 1 and CH 2 per Table 2. Internally tied to VCC/2  
I, LVCMOS Selects output amplitude for CH 1 and CH 2 per Table 2. Internally tied to VCC/2  
EQ1, EQ2  
OS1, OS2  
4, 15  
POWER PINS  
1,13  
VCC  
GND  
Power  
Power  
Positive supply should be 3.3V ± 10%  
Supply ground  
6,10,18,21  
(1) Internally biased to VCC/2 with >200kΩ pull-up/pull-down. When pins are left as NC board leakage at this pin pad must be < 1 µA  
otherwise drive to VCC/2 to assert mid-level state.  
Table 2. Signal Control Pin Setting  
TRANSITION BIT AMPLITUDE  
OSx(1)  
(TYP mVpp)  
NC (default)  
1000  
870  
0
1
1085  
EQx(1)  
EQUALIZATION dB  
NC (default)  
0
7
0
1
15  
DEx(1)  
OSx(1) = NC  
OSx(1) = 0  
OSx(1) = 1  
–4.4 dB  
–6.0 dB  
–7.6 dB  
NC  
0
–3.5 dB  
–6.0 dB  
–8.5 dB  
–2.2 dB  
–5.2 dB  
–8.9 dB  
1
EN_RXD  
1 (default)  
0
DEVICE FUNCTION  
Normal operating mode  
Sleep mode  
CM  
0 (default)  
1
DEVICE FUNCTION  
Normal Mode  
Compliance mode  
(1) Applies to Channel 1 and Channel 2 at 2.5 GHz.  
USB Device  
USB Host  
Device PCB  
Up to 3m  
(30AWG)  
8"-20"  
1"-6"  
2"-6"  
Figure 4. Redriver Placement Example  
6
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ORDERING INFORMATION(1)  
PART MARKING  
LVPE502  
PART NUMBER  
SN65LVPE502RGER  
SN65LVPE502RGET  
PCAKAGE  
24-pin RGE Reel (large)  
24-pin RGE Reel (small)  
LVPE502  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range (unless otherwise noted)(1)  
UNITS / VALUES  
Supply Voltage Range(2)  
Voltage Range  
VCC  
–0.5 V to 4 V  
–0.5 V to 4 V  
Differential I/O  
Control I/O  
–0.5 V to VCC + 0.5V  
±5000V  
Human Body Model(3)  
Charged Device Model(4)  
Machine Model(5)  
Electrostatic discharge  
±1500V  
±200V  
Continuous power dissipation  
See Dissipation Rating Table  
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings  
only and functional operation of the device at these or any conditions beyond those indicated under recommended operating conditions  
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) All voltage values, except differential voltages, are with respect to network ground terminal.  
(3) Tested in accordance with JEDEC Standard 22, Test Method A114-B.  
(4) Tested in accordance with JEDEC Standard 22, Test Method C101-A.  
(5) Tested in accordance with JEDEC Standard 22, Test Method A115-A.  
PACKAGE CHARACTERIZATION  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP MAX UNIT  
CM, EN_RXD, EQ cntrl pins = NC, K28.5 pattern at 5 Gbps,  
VID = 1000 mVpp  
PD  
Device power dissipation  
330 450 mW  
Device power dissipation under low  
power mode  
PSD  
EN_RXD= GND  
0.3  
1
mW  
THERMAL INFORMATION  
SN65LVPE502  
THERMAL METRIC(1)  
RGE  
UNITS  
24 PINS  
qJA  
Junction-to-ambient thermal resistance(2)  
Junction-to-case(top) thermal resistance  
46  
42  
13  
0.5  
9
(3)  
qJC(TOP)  
qJB  
(4)  
Junction-to-board thermal resistance  
°C/W  
(5)  
yJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
(6)  
(7)  
yJB  
qJC(BOTTOM)  
Junction-to-case(bottom) thermal resistance  
4
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.  
(2) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as  
specified in JESD51-7, in an environment described in JESD51-2a.  
(3) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific  
JEDEC-standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.  
(4) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB  
temperature, as described in JESD51-8.  
(5) The junction-to-top characterization parameter, yJT, estimates the junction temperature of a device in a real system and is extracted  
from the simulation data for obtaining qJA, using a procedure described in JESD51-2a (sections 6 and 7).  
(6) The junction-to-board characterization parameter, yJB, estimates the junction temperature of a device in a real system and is extracted  
from the simulation data for obtaining qJA , using a procedure described in JESD51-2a (sections 6 and 7).  
(7) The junction-to-case (bottom) thermal resistance is obtained by simulating a cold plate test on the exposed (power) pad. No specific  
JEDEC standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.  
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MAX UNIT  
RECOMMENDED OPERATING CONDITIONS  
over operating free-air temperature range (unless otherwise noted)  
MIN  
3
TYP  
VCC  
Supply Voltage  
3.3  
3.6  
200  
85  
V
CCOUPLING  
AC Coupling Capacitor  
Operating free-air temperature  
75  
0
nF  
°C  
DEVICE POWER  
The SN65LVPE502 is designed to operate from a single 3.3 V supply.  
ELECTRICAL CHARACTERISTICS  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
DEVICE PARAMETERS  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
EN_RXD, CM, EQ cntrl = NC,  
K28.5 pattern at 5 Gbps, VID = 1000 mVpp  
ICC  
100  
2
120  
ICCRx.Detect  
ICCsleep  
In Rx.Detect mode  
5
Supply Current  
mA  
EN_RXD = GND  
0.1  
ICCU2-U3  
Link in USB low power state  
21  
Maximum Data Rate  
Device Enable Time  
5
Gbps  
µs  
Sleep mode exit time EN_RXD LH With  
Rx termination present  
tENB  
100  
tDIS  
Device Disable Time  
Rx.Detect Start Event  
Sleep mode entry time EN_RXD HL  
2
µs  
µs  
TRX.DETECT  
Power-up time  
100  
CONTROL LOGIC (under recommended operating conditions)  
VIH  
High level Input Voltage  
Low Level Input Voltage  
Input Hysteresis  
1.4  
VCC  
0.5  
V
V
VIL  
–0.3  
VHYS  
150  
mV  
OSx, EQx, DEx = VCC  
EN_RXD = VCC  
CM = VCC  
30  
1
IIH  
High Level Input Current  
Low Level Input Current  
µA  
µA  
30  
OSx, EQx, DEx = GND  
EN_RXD = GND  
CM = GND  
–30  
–30  
–1  
IIL  
RECEIVER AC/DC  
Vindiff_pp  
AC coupled differential RX peak to peak  
signal  
RX1, RX2 Input Voltage Swing  
100  
1200 mVpp  
V
VCM_RX  
RX1, RX2 Common Mode Voltage  
3.3  
RX1, RX2 AC Peak common mode  
voltage  
Measured at Rx pins with termination  
enabled  
VinCOM_P  
150 mVP  
ZDC_RX  
Zdiff_RX  
DC common mode impedance  
DC differential input impedance  
18  
72  
26  
80  
30  
Ω
Ω
120  
Device in sleep mode Rx termination not  
powered. Measured with respect to GND  
over 500mV max  
ZRX_High_IMP+  
DC Input High Impedance  
50  
85  
kΩ  
Measured at receiver pin, below minimum  
output is squelched, above max input signal  
is passed to output  
Low Voltage Periodic Signaling (LFPS)  
Detect Threshold  
VRX-LFPS-DETpp  
100  
300 mVpp  
50 MHz – 1.25 GHz  
1.25 GHz – 2.5 GHz  
50 MHz – 2.5 GHz  
10  
6
11  
7
RLRX-DIFF  
RLRX-CM  
Differential Return Loss  
dB  
dB  
Common Mode Return Loss  
11  
13  
8
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ELECTRICAL CHARACTERISTICS (continued)  
over operating free-air temperature range (unless otherwise noted)  
PARAMETER  
TRANSMITTER AC/DC  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
RL =100+1%, DEx, OSx = NC, Transition  
Bit  
800  
1000  
870  
1200  
RL =100+1%, DEx, OSx = GND  
Transition Bit  
VTXDIFF_TB_PP  
RL =100+1%, DEx, OSx = VCC  
Transition Bit  
1085  
665  
Differential peak-to-peak Output  
Voltage  
(VID = 800, 1200 mVpp, 5Gbps)  
mV  
RL =100+1%, DEx=NC,  
OSx = 0,1,NC Non-Transition Bit  
RL =100+1%, DEx=0,  
OSx = 0,1,NC Non-Transition Bit  
VTXDIFF_NTB_PP  
510  
RL =100+1%, DEx=1  
OSx = 0,1,NC Non-Transition Bit  
375  
–3.0  
–3.5  
–6.0  
–8.5  
0.85  
90  
–4.0  
dB  
OS1,2 = NC (for OS1,2 = 1 and 0 see  
Table 2)  
De-Emphasis Level  
TDE  
De-Emphasis Width  
UI  
Zdiff_TX  
ZCM_TX  
DC Differential Impedance  
DC Common Mode Impedance  
72  
18  
9
120  
30  
Measured w.r.t to AC ground over 0-500mV  
f = 50 MHz – 1.25 GHz  
23  
10  
RLdiff_TX  
Differential Return Loss  
dB  
f = 1.25 GHz – 2.5 GHz  
6
7
RLCM_TX  
Common Mode Return Loss  
f = 50 MHz – 2.5 GHz  
11  
12  
dB  
mA  
V
ITX_SC  
TX short circuit current  
TX± shorted to GND  
60  
VTX_CM_DC  
VTX_CM_AC_Active  
Transmitter DC common-mode voltage  
TX AC common mode voltage active  
2.0  
0
2.6  
30  
3.0  
100 mVpp  
Electrical idle differential peak to peak  
output voltage  
VTX_idle_diff-AC-pp  
VTX_CM_DeltaU1-U0  
VTX_idle_diff-DC  
Vdetect  
HPF to remove DC  
10  
200  
10  
mV  
mV  
mV  
mV  
Absolute delta of DC CM voltage  
during active and idle states  
35  
DC Electrical idle differential output  
voltage  
Voltage must be low pass filtered to remove  
any AC component  
0
Voltage change to allow receiver  
detect  
Positive voltage to sense receiver  
termination  
600  
tR,tF  
Output Rise/Fall time  
30  
50  
ps  
ps  
20%-80% of differential voltage measure 1"  
from the output pin  
tRF_MM  
Output Rise/Fall time mismatch  
20  
350  
6
De-Emphasis = –3.5dB (CH 0 and CH 1).  
Propagation delay between 50% level at  
input and output See Figure 5  
Tdiff_LH, Tdiff_HL  
Differential Propagation Delay  
290  
ps  
tidleEntry tidleExit  
CTX  
Idle entry and exit times  
See Figure 6  
At 2.5 GHz  
4
ns  
Tx input capacitance to GND  
1.25  
pF  
EQUALIZATION  
(1)(2)  
TTX-EYE  
Total Jitter (Tj) at point A  
Deterministic Jitter (Dj)  
Random Jitter (Rj)  
0.14  
0.06  
0.08  
0.14  
0.06  
0.08  
0.5  
0.3 UIpp(3)  
(2)  
DJTX  
Device setting: OS1 = L, DE1 = H, EQ1 = L  
Device setting: OS2 = H, DE2 = H, EQ2 = L  
(2)(4)  
RJTX  
0.2  
(1) (2)  
TTX-EYE  
Total Jitter (Tj) at point B  
Deterministic Jitter (Dj)  
Random Jitter (Rj)  
0.5  
0.3 UIpp(3)  
(2)  
DJTX  
(2)(4)  
RJTX  
0.2  
(1) Includes Rj at 10-12  
(2) Measured at the end of reference channel in Figure 8 with K28.5 pattern, VID=1000mVpp, 5Gbps, –3.5dB DE from source.  
(3) UI = 200ps  
(4) Rj calculated as 14.069 times the RMS random jitter for 10-12 BER  
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IN  
T
T
diff_HL  
diff_LH  
OUT  
Figure 5. Propagation Delay  
vertical spacer  
vertical spacer  
IN+  
V
V
EID_TH  
CM  
IN-  
t
idleExit  
t
idleEntry  
OUT+  
V
CM  
OUT-  
Figure 6. Electrical Idle Mode Exit and Entry Delay  
vertical spacer  
vertical spacer  
80 %  
20 %  
t
t
r
f
Figure 7. Output RIse and Fall Times  
10  
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Jitter  
Measurement  
CH1  
SN65LVPE502  
A
1
2
AWG*  
CH1  
Up to 3m  
(30AWG)  
1"-6"  
20"  
4"  
B
AWG*  
CH2  
*Source Jitter Measurements  
Total Jitter  
(ps)  
21pp  
Deterministic Jitter  
Random Jitter  
8pp  
Jitter  
Measurement  
CH2  
0.95 rms  
Figure 8. Jitter Measurement Setup  
vertical spacer  
vertical spacer  
1-bit  
tDE  
1 to N bits  
1 to N bits  
1-bit  
EQx = NC  
-3.5dB  
-6dB  
EQx = 0  
-8.5dB  
EQx = 1  
V
CM  
VTXDIFF_NTB_PP  
VTXDIFF_TB_PP  
tDE  
Figure 9. Output De-Emphasis Levels OSx = NC  
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Typical Eye Diagram and Performance Curves  
Input Signal Characteristics: Data Rate = 5 Gbps, VID = 1000 mVpp, DE = -3.5 dB, Pattern = K28.5 Device  
Operating Conditions: VCC = 3.3 V, Temp = 25°C  
Input Trace Length Held Constant and Output Cable Length Varied  
Figure 10. Input Trace = 12 Inches, 6 mil and Output USB 3 Cable Length = 1 M  
vertical spacer  
vertical spacer  
Figure 11. Input Trace = 12 Inches, 6 mil and Output USB 3 Cable Length = 2 M  
12  
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Figure 12. Input Trace = 12 Inches, 6 mil and Output USB 3 Cable Length = 3 M  
vertical spacer  
vertical spacer  
Figure 13. Input Trace = 12 Inches, 6 mil and Output USB 3 Cable Length = 4 M  
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25  
20  
15  
10  
5
Output Deterministic Jitter vs  
Output USB3.0 Cable Length With Fixed 12” Input Trace  
0
1
1.5  
2
2.5  
3
3.5  
4
Output USB Cable Length - m  
Figure 14. Jitter Performance Over Different Cable Lengths  
Input Trace Length Held Constant and Output Trace Varied  
Figure 15. Input Trace = 4 Inches, 6 mil and Output Trace = 4 Inches, 6 mil  
14  
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Figure 16. Input Trace = 4 Inches, 6 mil and Output Trace = 8 Inches, 6 mil  
vertical spacer  
vertical spacer  
Figure 17. Input Trace = 4 Inches, 6 mil and Output Trace = 12 Inches, 6 mil  
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Figure 18. Input Trace = 4 Inches, 6 mil and Output Trace = 16 Inches, 6 mil  
vertical spacer  
vertical spacer  
Figure 19. Input Trace = 4 Inches, 6 mil and Output Trace = 20 Inches, 6 mil  
16  
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10  
9
8
7
6
5
4
3
2
1
0
Output Deterministic Jitter vs  
Output Trace Length With Fixed 4” Input Trace  
4
6
8
10  
12  
14  
16  
18  
20  
6 mil Output Trace Length - Inches  
Figure 20. Jitter Performance Over Different Output Trace Lengths  
vertical spacer  
vertical spacer  
Output Trace Length Held Constant and Input Trace Length Varied  
Figure 21. Input Trace = 4 Inches, 6 mil and Output Trace = 4 Inches, 6 mil  
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Figure 22. Input Trace = 8 Inches, 6 mil and Output Trace = 4 Inches, 6 mil  
vertical spacer  
vertical spacer  
Figure 23. Input Trace = 12 Inches, 6 mil and Output Trace = 4 Inches, 6 mil  
18  
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Figure 24. Input Trace = 16 Inches, 6 mil and Output Trace = 4 Inches, 6 mil  
vertical spacer  
vertical spacer  
Figure 25. Input Trace = 20 Inches, 6 mil and Output Trace = 4 Inches, 6 mil  
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Figure 26. Input Trace = 28 Inches, 6 mil and Output Trace = 4 Inches, 6 mil  
vertical spacer  
vertical spacer  
Figure 27. Input Trace = 32 Inches, 6 mil and Output Trace = 4 Inches, 6 mil  
20  
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14  
12  
10  
8
6
4
2
Output Deterministic Jitter vs  
Input Trace Length With Fixed 4” Output Trace  
0
4
9
14  
19  
6 mil Input Trace Length - Inches  
24  
29  
Figure 28. Jitter Performance Over Different Input Trace Lengths  
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PACKAGE OPTION ADDENDUM  
www.ti.com  
26-Apr-2010  
PACKAGING INFORMATION  
Orderable Device  
SN65LVPE502RGER  
SN65LVPE502RGET  
Status (1)  
ACTIVE  
ACTIVE  
Package Package  
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)  
Qty  
Type  
Drawing  
VQFN  
RGE  
24  
3000 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR  
no Sb/Br)  
VQFN  
RGE  
24  
250 Green (RoHS & CU NIPDAU Level-2-260C-1 YEAR  
no Sb/Br)  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in  
a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2)  
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check  
http://www.ti.com/productcontent for the latest availability information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements  
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered  
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and  
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS  
compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame  
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)  
(3)  
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder  
temperature.  
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